JPH0333019Y2 - - Google Patents
Info
- Publication number
- JPH0333019Y2 JPH0333019Y2 JP2609282U JP2609282U JPH0333019Y2 JP H0333019 Y2 JPH0333019 Y2 JP H0333019Y2 JP 2609282 U JP2609282 U JP 2609282U JP 2609282 U JP2609282 U JP 2609282U JP H0333019 Y2 JPH0333019 Y2 JP H0333019Y2
- Authority
- JP
- Japan
- Prior art keywords
- connector
- contact resistance
- measured
- scanners
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000005476 soldering Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Description
【考案の詳細な説明】
本考案は、プリント板用のコネクタの接触抵抗
を測定する接触抵抗測定装置の改良に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement of a contact resistance measuring device for measuring the contact resistance of a printed board connector.
従来、コネクタの接触抵抗を測定するために
は、コネクタに任意のプリント板を挿入するとと
もに、この時のプリント板側の接点パターンとコ
ネクタ側の端子との間の抵抗を各端子毎に測定
し、各端子の接触抵抗としていた。しかしなが
ら、このような測定方法においては、定電流源や
電圧計などの抵抗測定回路の配線における接触抵
抗の影響をなくすために、これらの配線は全てハ
ンダ付けにより行なわなければならず、１つ１つ
測定点を移動させてコネクタの全端子について測
定を行なうには非常に多くの工数を必要とした。 Conventionally, in order to measure the contact resistance of a connector, an arbitrary printed circuit board is inserted into the connector, and the resistance between the contact pattern on the printed board side and the terminals on the connector side is measured for each terminal. , as the contact resistance of each terminal. However, in this measurement method, in order to eliminate the influence of contact resistance in the wiring of resistance measurement circuits such as constant current sources and voltmeters, all these wirings must be soldered. It took an extremely large number of man-hours to move the measurement points and measure all the terminals of the connector.
本考案は、上記のような従来装置の欠点をなく
し、ハンダ付けにより１つ１つ測定点を移動させ
る必要がなく、全端子の接触抵抗を効率良く測定
することのできるコネクタの接触抵抗測定装置を
簡単な構成により実現することを目的としたもの
である。 The present invention eliminates the drawbacks of conventional devices as described above, and provides a contact resistance measuring device for connectors that can efficiently measure the contact resistance of all terminals without the need to move the measuring points one by one by soldering. The purpose is to realize this with a simple configuration.
本考案のコネクタの接触抵抗測定装置は、全て
の接点パターンが短絡されたプリント板を被測定
コネクタに挿入し、コネクタの全ての端子間で測
定した測定データを演算処理することにより各端
子における接触抵抗を知ることができるように構
成するとともに、測定する端子の選択を２つのス
キヤナを用いて自動的に行ない、接触抵抗の測定
をコネクタの端子側から効率良く行なうようにし
たものである。 The connector contact resistance measuring device of the present invention inserts a printed circuit board with all contact patterns short-circuited into the connector to be measured, and calculates the contact resistance at each terminal by processing the measurement data measured between all terminals of the connector. In addition to being configured so that the resistance can be determined, the terminal to be measured is automatically selected using two scanners, and the contact resistance can be efficiently measured from the terminal side of the connector.
以下、図面を用いて本考案のコネクタの接触抵
抗測定装置を説明する。 DESCRIPTION OF THE PREFERRED EMBODIMENTS A contact resistance measuring device for a connector according to the present invention will be described below with reference to the drawings.
第１図は本考案のコネクタの接触抵抗測定装置
に使用されるプリント板の一実施例を示す構成図
である。図において、PBはプリント板、t1〜toは
全て短絡された接点パターンである。CNは被測
定コネクタ、T1〜Toはその端子である。図のよ
うなプリント板PBをコネクタCNい挿入した場
合、各端子T1〜Toにおける接触抵抗は次のよう
にして求めることができる。いま、各端子T1〜
Toにおける接触抵抗をそれぞれr1〜roとすると、
電圧降下法で測定した端子T1，T2間の電圧降下
V12は次式のように表わされる。 FIG. 1 is a block diagram showing one embodiment of a printed board used in the connector contact resistance measuring device of the present invention. In the figure, PB is a printed board, and t 1 to t o are all short-circuited contact patterns. CN is the connector to be measured, and T 1 to T o are its terminals. When the printed board PB as shown in the figure is inserted into the connector CN, the contact resistance at each terminal T 1 to To can be determined as follows. Now, each terminal T 1 ~
Letting the contact resistance at T o be r 1 to r o , respectively,
Voltage drop between terminals T 1 and T 2 measured by voltage drop method
V 12 is expressed as follows.
V12＝（r1＋r2）I1 (1)
また、同様にして、端子T2，T3間、端子T3，T1
間では、
V23＝（r2＋r3）I2 (2)
V31＝（r3＋r1）I3 (3)
となる。ここで、電流I1〜I3を一定電流とすれ
ば、(1)式〜(3)式の連立方程式により、接触抵抗r1
〜r3の値を求めることができる。 V 12 = (r 1 + r 2 ) I 1 (1) Similarly, between terminals T 2 and T 3 , between terminals T 3 and T 1
In between, V 23 = (r 2 + r 3 ) I 2 (2) V 31 = (r 3 + r 1 ) I 3 (3). Here, if the currents I 1 to I 3 are constant currents, the contact resistance r 1
The value of ~r 3 can be found.
このようにして接触抵抗r1〜r3の値が求められ
れば、以下、既知の抵抗を含む端子間、例えば端
子T1，To間で測定を行なうことにより、簡単に
接触抵抗の値を求めることができる。 Once the values of the contact resistances r 1 to r 3 have been determined in this way, the values of the contact resistances can be easily determined by measuring between terminals with known resistances, for example between the terminals T 1 and T o . You can ask for it.
第２図は従来のコネクタの接触抵抗測定装置の
一実施例を示す構成図である。図において、プリ
ント板PBおよび被測定コネクタCNは等価回路で
示す。r1〜roはコネクタCNにおける端子T1〜To
の接触抵抗である。また、SC1，SC2はスキヤナ、
CCは定電流源、VMは高入力インピーダンスを
有する電圧計、CONはスキヤナSC1，SC2におけ
る接点の選択動作を制御する制御回路、CMPは
スキヤナSC1，SC2の選択状態に応じて電圧計
VMより得られる出力Voを演算処理してコネク
タCNにおける接触抵抗r1〜roの値を算出するデ
ータ処理回路である。定電流源CCおよび電圧計
VMのリード線はそれぞれスキヤナSC1，SC2を
介してコネクタCNの端子T1〜Toに接続されてお
り、電圧計VMの出力Voはデータ処理回路CMP
に印加されている。制御回路CONはスキヤナ
SC1，SC2にどの接点を選択接続すべきかの指令
を与えるとともに、スキヤナSC1，SC2がどの接
点を選択しているのかの情報をデータ処理回路
CMPに伝達する。 FIG. 2 is a block diagram showing an embodiment of a conventional connector contact resistance measuring device. In the figure, the printed circuit board PB and the connector to be measured CN are shown as equivalent circuits. r 1 ~ r o are terminals T 1 ~ T o in connector CN
is the contact resistance. Also, SC 1 and SC 2 are Sukiyana,
CC is a constant current source, VM is a voltmeter with high input impedance, CON is a control circuit that controls the selection operation of contacts in scanners SC 1 and SC 2 , and CMP is a voltage depending on the selection state of scanners SC 1 and SC 2 . total
This is a data processing circuit that calculates the values of the contact resistances r 1 to r o in the connector CN by calculating the output V o obtained from the VM. Constant current source CC and voltmeter
The lead wires of VM are connected to terminals T 1 to T o of connector CN via scanners SC 1 and SC 2 , respectively, and the output V o of voltmeter VM is connected to data processing circuit CMP.
is applied to. Control circuit CON is scanner
A command is given to SC 1 and SC 2 as to which contact should be selected and connected, and information on which contact is selected by scanner SC 1 and SC 2 is sent to the data processing circuit.
Communicate to CMP.
上記のように構成された本考案のコネクタの接
触抵抗測定装置において、例えば、スキヤナSC1
がコネクタCNの端子T1を選択し、スキヤナSC2
が端子T2を選択したとすると、電圧計VMの出
力Voは次式のように接触抵抗r1，r2に関するもの
となる。 In the connector contact resistance measuring device of the present invention configured as described above, for example, Scana SC 1
Select terminal T 1 of connector CN, Scanner SC 2
selects terminal T 2 , the output V o of the voltmeter VM is related to the contact resistances r 1 and r 2 as shown in the following equation.
Vo＝（r1＋r2）Io (4)
したがつて、スキヤナSC1，SC2の選択状態を
制御して、任意の端子間の電圧降下を測定するこ
とにより、前記第１図にもとづいて説明したよう
に、各接触抵抗r1〜roの値を求めることができ
る。なお、スキヤナSC1，SC2は同時に同じ端子
T1〜Toを選択することはない。また、スキヤナ
SC1，SC2における接点抵抗は電圧計VMの入力
インピーダンスが高いために、問題とはならな
い。 V o = (r 1 + r 2 ) I o (4) Therefore, by controlling the selection states of the scanners SC 1 and SC 2 and measuring the voltage drop between arbitrary terminals, the result shown in FIG. As explained above, the values of each contact resistance r 1 to r o can be determined. Note that Scanner SC 1 and SC 2 are connected to the same terminal at the same time.
There is no choice between T 1 and T o . Also, Sukiyana
The contact resistance at SC 1 and SC 2 is not a problem because the input impedance of the voltmeter VM is high.
このように、コネクタCNにおける端子T1〜To
の選択をスキヤナSC1，SC2を使用して行なうよ
うにすると、スキヤナSC1，SC2とコネクタCNの
端子T1〜Toとの間を全て最初から接続しておく
ことができ、測定中に配線を付け換える必要がな
くなるので、測定を効率良く行なうことができ
る。 In this way, terminals T 1 to T o in connector CN
If the selection is made using the scanners SC 1 and SC 2 , all connections between the scanners SC 1 and SC 2 and the terminals T 1 to T o of the connector CN can be made from the beginning, and the measurement Since there is no need to change the wiring inside, measurements can be carried out efficiently.
以上説明したように本考案のコネクタの接触抵
抗測定装置では、全ての接点パターンが短絡され
たプリント板を使用して、接触抵抗の測定をコネ
クタの端子側で行なえるように構成するととも
に、測定する端子の選択をスキヤナを使用して行
なうようにしているので、コネクタの端子に対す
る配線を全て事前に済ませておくことができ、ハ
ンダ付けにより１つ１つ測定点を移動させる必要
がなく、全端子の接触抵抗を効率良く測定するこ
とのできるコネクタの接触抵抗測定装置を簡単な
構成により実現することができる。 As explained above, the connector contact resistance measuring device of the present invention uses a printed circuit board with all contact patterns short-circuited, and is configured so that contact resistance can be measured on the terminal side of the connector. Since the terminals to be measured are selected using a scanner, all the wiring to the connector terminals can be completed in advance, and there is no need to move each measurement point one by one by soldering. A connector contact resistance measuring device capable of efficiently measuring the contact resistance of a terminal can be realized with a simple configuration.
第１図および第２図は本考案のコネクタの接触
抵抗測定装置の一実施例を示す構成図である。
PB……プリント板、CN……被測定コネクタ、
r1〜ro……接触抵抗、SC1，SC2……スキヤナ、
CC……定電流源、VM……電圧計、CON……制
御回路、CMP……データ処理回路。
FIGS. 1 and 2 are configuration diagrams showing an embodiment of the contact resistance measuring device for a connector according to the present invention. PB...Printed board, CN...Connector to be measured,
r 1 ~ r o ……contact resistance, SC 1 , SC 2 ……scanner,
CC... Constant current source, VM... Voltmeter, CON... Control circuit, CMP... Data processing circuit.
Claims (1)
点パターンが短絡されたプリント板と、定電流源
と、高入力インピーダンスを有する電圧計と、前
記定電流源と前記電圧計の一端および他端をそれ
ぞれ前記被測定コネクタの任意の端子に接続する
第１および第２のスキヤナと、前記第１および第
２のスキヤナの選択動作を制御する制御回路と、
前記第１および第２のスキヤナの選択状態に応じ
て得られる電圧計出力を演算処理して前記被測定
コネクタの各端子における接触抵抗の値を算出す
るデータ処理回路とを具備してなるコネクタの接
触抵抗測定装置。 A printed circuit board that is inserted into the connector to be measured and has all contact patterns shorted, a constant current source, a voltmeter having high input impedance, and one end and the other end of the constant current source and the voltmeter, respectively. first and second scanners connected to arbitrary terminals of the connector to be measured; a control circuit that controls selection operations of the first and second scanners;
and a data processing circuit that calculates a value of contact resistance at each terminal of the connector to be measured by calculating the voltmeter output obtained according to the selection state of the first and second scanners. Contact resistance measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2609282U JPS58129159U (en) | 1982-02-25 | 1982-02-25 | Connector contact resistance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2609282U JPS58129159U (en) | 1982-02-25 | 1982-02-25 | Connector contact resistance measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58129159U JPS58129159U (en) | 1983-09-01 |
| JPH0333019Y2 true JPH0333019Y2 (en) | 1991-07-12 |
Family
ID=30038045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2609282U Granted JPS58129159U (en) | 1982-02-25 | 1982-02-25 | Connector contact resistance measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58129159U (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6262008B2 (en) * | 2014-02-14 | 2018-01-17 | 株式会社富士通テレコムネットワークス福島 | Contact resistance measurement system |
-
1982
- 1982-02-25 JP JP2609282U patent/JPS58129159U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58129159U (en) | 1983-09-01 |
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