JPH0330876U - - Google Patents

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案の第１実施例を示す耐圧・絶縁
試験器の一部回路図、第２図は本考案の第２実施
例を示す耐圧・絶縁試験器の一部回路図、第３図
は本考案の第３実施例を示す耐圧・絶縁試験器の
一部回路図、第４図は本考案の第４実施例を示す
耐圧・絶縁試験器の一部回路図である。 １……電源回路、３，５，１１……変圧器、７
……第１検出回路、９……第２検出回路、２１，
２３……第１電圧印加端子、２５，２７……第１
出力端子、３１，３３……第２電圧印加端子、３
５，３７……第２出力端子、４１……対象物。 Fig. 1 is a partial circuit diagram of a withstand voltage/insulation tester showing a first embodiment of the present invention, Fig. 2 is a partial circuit diagram of a withstand voltage/insulation tester showing a second embodiment of the present invention, and Fig. 3 is a partial circuit diagram of a withstand voltage/insulation tester showing a second embodiment of the present invention. The figure is a partial circuit diagram of a withstand voltage/insulation tester showing a third embodiment of the present invention, and FIG. 4 is a partial circuit diagram of a withstand voltage/insulation tester showing a fourth embodiment of the present invention. 1... Power supply circuit, 3, 5, 11... Transformer, 7
...First detection circuit, 9...Second detection circuit, 21,
23...first voltage application terminal, 25, 27...first
Output terminal, 31, 33...Second voltage application terminal, 3
5, 37...second output terminal, 41...target object.

Claims (1)

【実用新案登録請求の範囲】 １ 電源回路を設け、この電源回路に変圧器を介
して第１検出回路、第２検出回路、試験電圧印加
回路を配置し、上記第１検出回路は一対の第１電
圧印加端子と一対の第１出力端子を備え、上記第
１出力端子を対象物に当接させ、上記第２検出回
路は一対の第２電圧印加端子と一対の第２出力端
子を備え、上記第２出力端子を対象物に当接させ
、上記第１検出回路および第２検出回路に電圧を
印加して、第１出力端子および第２出力端子の対
象物への接触・非接触を検出し、第１出力端子お
よび第２出力端子の両方が対象物に接触している
場合に、上記試験電圧印加回路を介して対象物に
試験電圧を印加するようにしたことを特徴とする
耐圧・絶縁試験器。 ２ 電源回路を設け、この電源回路に変圧器を介
して第１検出回路、第２検出回路、試験電圧印加
回路を配置し、上記第１検出回路は一対の第１電
圧印加端子と一対の第１出力端子を備え、上記第
１出力端子を対象物に当接させ、上記第２検出回
路は一対の第２電圧印加端子と一対の第２出力端
子を備え、上記第２出力端子を対象物に当接させ
、上記第１検出回路、第２検出回路、試験電圧印
加回路に電圧を印加し、第１出力端子および第２
出力端子の少なくとも一方が対象物に接触してい
ない場合に、上記試験電圧印加回路を介しての試
験電圧の印加を遮断するようにしたことを特徴と
する耐圧・絶縁試験器。[Claims for Utility Model Registration] 1. A power supply circuit is provided, and a first detection circuit, a second detection circuit, and a test voltage application circuit are arranged in this power supply circuit via a transformer, and the first detection circuit is connected to a pair of first detection circuits. The second detection circuit includes a first voltage application terminal and a pair of first output terminals, the first output terminal is brought into contact with an object, and the second detection circuit includes a pair of second voltage application terminals and a pair of second output terminals, The second output terminal is brought into contact with the object, voltage is applied to the first detection circuit and the second detection circuit, and contact/non-contact of the first output terminal and the second output terminal with the object is detected. and a test voltage is applied to the object via the test voltage application circuit when both the first output terminal and the second output terminal are in contact with the object. Insulation tester. 2. A power supply circuit is provided, and a first detection circuit, a second detection circuit, and a test voltage application circuit are arranged in this power supply circuit via a transformer, and the first detection circuit has a pair of first voltage application terminals and a pair of first voltage application terminals. The second detection circuit includes a pair of second voltage application terminals and a pair of second output terminals, and the second output terminal is brought into contact with the target object. and apply a voltage to the first detection circuit, the second detection circuit, and the test voltage application circuit, and the first output terminal and the second
A withstand voltage/insulation tester characterized in that application of a test voltage via the test voltage application circuit is cut off when at least one of the output terminals is not in contact with an object.