JPH0315181A - Socket with test terminals for electronic part - Google Patents

Socket with test terminals for electronic part

Info

Publication number
JPH0315181A
JPH0315181A JP1148354A JP14835489A JPH0315181A JP H0315181 A JPH0315181 A JP H0315181A JP 1148354 A JP1148354 A JP 1148354A JP 14835489 A JP14835489 A JP 14835489A JP H0315181 A JPH0315181 A JP H0315181A
Authority
JP
Japan
Prior art keywords
socket
lsi
terminals
socket body
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1148354A
Other languages
Japanese (ja)
Inventor
Yasuo Tezuka
康夫 手塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Information Technology Co Ltd
Original Assignee
Hitachi Communication Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Communication Systems Inc filed Critical Hitachi Communication Systems Inc
Priority to JP1148354A priority Critical patent/JPH0315181A/en
Publication of JPH0315181A publication Critical patent/JPH0315181A/en
Pending legal-status Critical Current

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  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To positively make an inspection on the side of a socket mounting surface in a substrate, and thereby improve an inspection efficiency by providing the surface with test terminals connected with a part in a socket for electronic parts, which houses electronic parts to be connected with internal terminals. CONSTITUTION:By the use of a socket 2 which is provided with test terminals 6 connected with respective internal terminals 5 around the opening section of a socket main body 3, when an LSI 7 is inspected from the inside of the socket 2, the LSI 7 is put first onto the socket 2 mounted on a substrate 1, and the respective internal terminals 5 within the socket 2 are connected with the respective terminal ends 8 of the LSI 7 by closing a cover 4 so that the respective terminals 8 are thereby connected with the test terminals 6 through the respective terminals 5. It is therefore, not required to turn over the substrate 1 every time when the conduction and the wave form of the LSI 7 are inspected. This thereby enables an inspection on the side of a socket 2 mounting face to be positively made. Moreover, this result in easy handling because the terminals 6 are disposed around the opening section of the socket main body 3.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、特にソケット本体に電子部品としてのLCC
型の集積回路を密閉状態で収納したとき、そのソケット
本体の外部から集積回路を検査するのに好適な電子部品
用テストターミナル付ソケットに関する。
[Detailed Description of the Invention] [Industrial Field of Application] The present invention particularly relates to an LCC as an electronic component in a socket body.
The present invention relates to a socket with a test terminal for electronic components suitable for testing the integrated circuit from the outside of the socket body when the integrated circuit is housed in a hermetically sealed state.

〔従来の技術〕[Conventional technology]

従来の電子部品用ソケットにあっては,ソケットに収納
された電子部品としての集積回路(以下,LSIと略称
す)を検査するには、まず基板の一方の面に搭載された
ソケット内に.LSIを収納するとともに、そのLSI
を密閉するためソケットを蓋等の密閉手段で塞いで、ソ
ケットとLSIを導通させ、その後、基板の他方の面か
らソケットのリードピンを導通させることにより、LS
Iの導通検査を行ったり、そのLSIが所定の機能であ
るか否かを確認するためオシロスコープ等で波形を見る
検査を行ったりしていた. 〔発明が解決しようとする課題〕 上記の如く、従来技術では、基板の一方の面上のソケッ
ト内にLSIを密閉状態で収納しているので、LSIの
導通検査や波形検査を行う場合には、基板のソケット搭
載面と反対側から検査せざるを得す、そのため、検査の
度にいちいち基板をひっくり返さなければならないので
,検査に手間がかかる問題がある。
In conventional sockets for electronic components, in order to test an integrated circuit (hereinafter abbreviated as LSI) as an electronic component housed in the socket, first insert the IC into the socket mounted on one side of the board. In addition to storing the LSI, the LSI
In order to seal the socket, the socket is closed with a sealing means such as a lid, the socket and the LSI are electrically connected, and then the lead pins of the socket are electrically connected from the other side of the board.
I conducted continuity tests on the I, and checked waveforms with an oscilloscope to check whether the LSI was functioning as expected. [Problems to be Solved by the Invention] As mentioned above, in the conventional technology, the LSI is sealed in a socket on one side of the board, so when performing continuity testing or waveform testing of the LSI, However, it is necessary to inspect the board from the side opposite to the socket mounting surface, and as a result, the board must be turned over each time it is inspected, making the inspection time-consuming.

本発明の目的は、上記従来技術の問題に鑑み、ソケット
外部からでもLSIの検査を簡単に行うことができる電
子部品用テストターミナル付ソケットを提供することに
ある. 〔課題を解決するための手段〕 上記目的を達成するため、本発明においては、内部に収
納された電子部品と接続するテストターミナルを表面に
配設していることに特徴を有している. 〔作 用〕 本発明では、前述の如く、表面に電子部品と接続するテ
ストターミナルを配設しているので、該テストターミナ
ルによってソケットの外部から電子部品の導通検査や波
形検査を行うことができる。
SUMMARY OF THE INVENTION In view of the problems of the prior art described above, an object of the present invention is to provide a socket with a test terminal for electronic components that allows an LSI to be easily tested even from outside the socket. [Means for Solving the Problems] In order to achieve the above object, the present invention is characterized in that a test terminal is provided on the surface to connect to electronic components housed inside. [Function] As described above, in the present invention, since the test terminal for connecting to the electronic component is provided on the surface, the continuity test and waveform test of the electronic component can be performed from outside the socket using the test terminal. .

従って、基板のソケット搭載面側と反対側の面で検査す
る従来例に比べると、基板をいちいちひっくり返すこと
が不要になり、基板上のソケット搭載面側で確実に検査
することができ、検査効率を高め得る. 〔実施例〕 以下,本発明の実施例を第1図乃至第5図により説明す
る。第1図は本発明の第一の実施例を示す説明用斜視図
、第2図はソケットにLSIを収納した状態を示す側面
図、第3図はソケットの密閉状態を示す側面図である。
Therefore, compared to the conventional method of inspecting the side of the board opposite to the side on which the socket is mounted, there is no need to turn the board over each time, and inspection can be performed reliably on the side on which the socket is mounted on the board, increasing inspection efficiency. It can increase [Embodiments] Hereinafter, embodiments of the present invention will be described with reference to FIGS. 1 to 5. FIG. 1 is an explanatory perspective view showing a first embodiment of the present invention, FIG. 2 is a side view showing a state in which an LSI is housed in a socket, and FIG. 3 is a side view showing a sealed state of the socket.

実施例では、基板工の一方の面に内部に集積回路(以下
、LSIと略称す)7を収納すべきソケット2が搭載さ
れている。LSI7は所謂リード無しのLCC型のもの
であって、第l図に示すように周囲に端子8を有してい
る。
In the embodiment, a socket 2 in which an integrated circuit (hereinafter abbreviated as LSI) 7 is to be housed is mounted on one side of the circuit board. The LSI 7 is of a so-called leadless LCC type, and has terminals 8 around it as shown in FIG.

そして、ソケット2は第1図に示すように、上方を開口
した箱形をなすソケット本体3と、そのソケット本体3
の上部の開口部を塞ぐための蓋4を有している。前記ソ
ケット本体3には内側の下部周囲に、LSI7を収納し
たときに該LSI7の各端子8と接続する端子5が複数
設けられている。そのため、各端子5はソケット2内に
端子8と接続できるよう該端子8と対応する位置に配置
されている。前記蓋4はソケット本体3の上部に板バネ
からなる蝶番等を介し開閉可能に取り付けられている。
As shown in FIG. 1, the socket 2 includes a box-shaped socket body 3 with an open top, and
It has a lid 4 for closing the opening at the top. A plurality of terminals 5 are provided around the inner lower part of the socket main body 3 to connect with each terminal 8 of the LSI 7 when the LSI 7 is stored. Therefore, each terminal 5 is arranged in the socket 2 at a position corresponding to the terminal 8 so that it can be connected to the terminal 8. The lid 4 is attached to the upper part of the socket body 3 via a hinge made of a plate spring or the like so that it can be opened and closed.

そして、ソケット本体3の表面には前記端子5と接続さ
れたテストターミナル6が配設されている。該テストタ
ーミナル6は第1図及び第2図に示すように、ソケット
本体3の上部開口部の周囲において各端子5と同様に適
宜の間隔をもって配置され,該各端子5と接続して取り
付けられている。このソケット2は内部にLSI7を入
れて蓋4を閉じたとき、LSI7を密閉状態でしかもL
SIの端子8と各端子5とが接続したままの状態で収納
するようにしている。
A test terminal 6 connected to the terminal 5 is provided on the surface of the socket body 3. As shown in FIGS. 1 and 2, the test terminals 6 are arranged at appropriate intervals around the upper opening of the socket body 3 in the same manner as the terminals 5, and are connected to and attached to the terminals 5. ing. This socket 2 holds the LSI 7 in a sealed state when the LSI 7 is placed inside and the lid 4 is closed.
The terminal 8 of the SI and each terminal 5 are stored in a connected state.

上記の如く、ソケット本体3の開口部の周四に各内部端
子5と接続されたテストターミナル6が設けられたソケ
ット2を用いると、ソケット2の外部からLSI7を検
査する場合には、まず基板1上に搭載されたソケット2
内にLSI7を入れて蓋4を閉じることによってソケッ
ト2内の各内部端子5とLSI7の各端子8とが接続さ
れるので,該端子8が各端子5を介しテストターミナル
6と接続することとなる。
As described above, when using the socket 2 in which the test terminals 6 connected to the internal terminals 5 are provided around the periphery of the opening of the socket body 3, when inspecting the LSI 7 from the outside of the socket 2, first Socket 2 mounted on 1
By inserting the LSI 7 into the socket and closing the lid 4, each internal terminal 5 inside the socket 2 and each terminal 8 of the LSI 7 are connected, so that the terminal 8 is connected to the test terminal 6 via each terminal 5. Become.

その結果,ソケット本体3のテストターミナル6によっ
てLSI7の導通や波形の検査を行うことができ、従っ
て、基板のソケソト搭載面側と反対側の面で検査する従
来例に比尺ると、基板↓をいちいちひっくり返すことが
不要になり、基板1上のソケット2搭載面側で確実に検
査することができる。しかも,ソケット本体3の開口部
の周囲にテストターミナル6が配設されているので、テ
?トターミナル6を設けているにも拘らず、ソケット本
体3の周囲に極端に出っ張るものがないので、取り扱い
も容易となる。
As a result, the continuity and waveform of the LSI 7 can be tested using the test terminal 6 of the socket body 3. Therefore, compared to the conventional method of testing on the side opposite to the socket mounting surface of the board, the board ↓ It becomes unnecessary to turn over each time, and the inspection can be performed reliably on the side where the socket 2 is mounted on the board 1. Moreover, since the test terminal 6 is arranged around the opening of the socket body 3, Even though the socket terminal 6 is provided, there is nothing extremely protruding around the socket main body 3, making it easy to handle.

第4図及び第5図は本発明の他の実施例を示している。4 and 5 show other embodiments of the invention.

この実施例では、ソケット本体3の開口部を塞ぐ蓋4が
、ソケット本体3と別体に形或されている。そして、蓋
4の表面にLSI7の端子8と接続し得るテストターミ
■ナル9が配設されている.即ち、この実施例のテスト
ターミナル9は、蓋4の外周側に貫通してビン状に形成
されており、ソケット本体3内にLSI7を収納しかつ
蓋4によってソケット本体3の開口部を塞いだとき、そ
の下端がソケット本体3の内部端子5と接触するととも
に,その下端部がLSI7の端子8の側部に接触するこ
とによって両者と接続するようにしている。そのため、
テストターミナル9はソケット本体3を閉じたとき,第
5図に示すように、LSI7の端子8及びソケット本体
3の内壁間に差し込まれ、その下端がソケット本体3の
内部端子5に達する長さに設定されている. 従って、この実施例によれば、LSI7が収納されたソ
ケット本体3を蓋4によって閉じると、該蓋4のテスト
ターミナル9の下端がソケット本体3の内部端子5及び
LSI7の端子8と接触することによって接続できるの
で,基板工のソケット搭載面側でLSI7の導通や波形
の検査を行うことができ、第一の実施例と同様の効果を
得ることができる他、ソケット本体3と蓋4とが別体に
形成されているので,蓋4がソケット本体3から外れた
りすると云う両者間のトラブルがない.なお,これまで
の実施例では、ソケット本体3の開口部の周囲にテスト
ターミナル6が、また蓋4の表面の外周側にテストター
ミナル9がそれぞれ配設された例を示したが,基板l上
に搭載されたソケット2においては、電子部品としての
LS工7と接続できれば、テストターミナル6,9をソ
ケット2の表面の何れに設けても同様の作用効果を奏す
ることができる。
In this embodiment, a lid 4 that closes the opening of the socket body 3 is formed separately from the socket body 3. A test terminal 9 connectable to the terminal 8 of the LSI 7 is provided on the surface of the lid 4. That is, the test terminal 9 of this embodiment is formed in a bottle shape by penetrating the outer circumferential side of the lid 4, and the LSI 7 is housed in the socket body 3, and the opening of the socket body 3 is closed by the lid 4. At this time, its lower end contacts the internal terminal 5 of the socket body 3, and its lower end contacts the side of the terminal 8 of the LSI 7, thereby connecting both. Therefore,
When the socket body 3 is closed, the test terminal 9 is inserted between the terminal 8 of the LSI 7 and the inner wall of the socket body 3, and its lower end reaches the internal terminal 5 of the socket body 3, as shown in FIG. It is set. Therefore, according to this embodiment, when the socket body 3 housing the LSI 7 is closed with the lid 4, the lower end of the test terminal 9 of the lid 4 comes into contact with the internal terminal 5 of the socket body 3 and the terminal 8 of the LSI 7. Since the connection can be made with Since they are formed separately, there is no problem between the two, such as the lid 4 coming off from the socket body 3. In the previous embodiments, the test terminal 6 was arranged around the opening of the socket body 3, and the test terminal 9 was arranged around the outer circumference of the surface of the lid 4. In the socket 2 mounted on the socket 2, the same effect can be achieved even if the test terminals 6 and 9 are provided on either surface of the socket 2, as long as the test terminals 6 and 9 can be connected to the LS workpiece 7 as an electronic component.

〔発明の効果〕〔Effect of the invention〕

以上述へたように、本発明の請求項1によれば、ソケッ
トの表面に配設したテストターミナルによってソケット
の外部から電子部品の導通検査や波形検査を行うことが
できるように構或したので、基板のソケット搭載面側と
反対側の面で検査することが不要になり、基板上のソケ
ット搭載面側で確実にそのまま検査することができる結
果、検査効率を高め得る効果がある。
As described above, according to claim 1 of the present invention, the structure is such that continuity testing and waveform testing of electronic components can be performed from outside the socket using the test terminal disposed on the surface of the socket. It is no longer necessary to inspect the surface of the board opposite to the socket mounting surface, and the test can be reliably performed directly on the socket mounting surface of the board, which has the effect of increasing inspection efficiency.

本発明の請求項2によれば、ソケノト本体の開口部の周
囲にテストターミナルを配設したので、請求項1と同様
の効果を得ることができる他、テスI〜ターミナルを設
けてあるにも拘らずソケット本体に出っ張るものがない
ので、取り扱いも容易となる効果等がある。
According to claim 2 of the present invention, since the test terminal is arranged around the opening of the socket main body, it is possible to obtain the same effect as in claim 1, and even when the test terminal is provided. However, since there is nothing protruding from the socket body, it has the advantage of being easier to handle.

本発明の請求項3によれば、蓋の表面の外周側にテスト
ターミナルを配設したので,請求項■と同様の効果を得
ることができる他、蓋がソケット本体と別体に形成した
ので、蓋とソケット本体間の両者間のトラブルがない等
の効果がある。
According to claim 3 of the present invention, since the test terminal is arranged on the outer periphery of the surface of the lid, the same effect as claimed in claim 2 can be obtained, and also because the lid is formed separately from the socket body. This has the advantage that there is no trouble between the lid and the socket body.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第一の実施例を示す説明用斜す側面図
,第4図は本発明の他の実施例を示す説明用斜視図,第
5図はソケットにLSIを収納した状態を示す側面図で
ある。 1・・・基板、2・・・ソケット、3・・・ソケット本
体、4・・・蓋、5・・・内部端子,6,9・・・テス
トターミナル、7・・・集積回路(LSI)、8・・・
集積回路の端子。
Fig. 1 is an explanatory oblique side view showing a first embodiment of the present invention, Fig. 4 is an explanatory perspective view showing another embodiment of the invention, and Fig. 5 is a state in which an LSI is housed in a socket. FIG. 1... Board, 2... Socket, 3... Socket body, 4... Lid, 5... Internal terminal, 6, 9... Test terminal, 7... Integrated circuit (LSI) , 8...
Integrated circuit terminals.

Claims (1)

【特許請求の範囲】 1、内部端子と接続される電子部品を収納する電子部品
用ソケットにおいて、前記電子部品と接続するテストタ
ーミナルを表面に配設していることを特徴とする電子部
品用テストターミナル付ソケット。 2、基板に搭載されかつ内部に内部端子と接続される電
子部品を収納し得るソケット本体と、該ソケット本体に
ソケット本体の開口部を塞ぐため開閉可能に取り付けた
蓋とを有し、ソケット本体の開口部の周囲に、ソケット
本体に収納された電子部品と接続するテストターミナル
を配設していることを特徴とする電子部品用テストター
ミナル付ソケット。 3、基板に搭載されかつ内部に内部端子と接続される電
子部品を収納し得るソケット本体と、該ソケット本体と
別体に形成されかつソケット本体の開口部を塞ぐ蓋とを
有し、該蓋の表面の外周側にソケット本体の開口部を閉
じた時点で電子部品と接続するピン状のテストターミナ
ルを配設していることを特徴とする電子部品用テストタ
ーミナル付ソケット。
[Claims] 1. A test for electronic components, characterized in that an electronic component socket for housing an electronic component connected to an internal terminal is provided with a test terminal connected to the electronic component on its surface. Socket with terminal. 2. A socket body which is mounted on a board and has a socket body capable of accommodating electronic components internally connected to internal terminals, and a lid attached to the socket body so as to be openable and closable to cover the opening of the socket body. A socket with a test terminal for electronic components, characterized in that a test terminal for connecting to an electronic component housed in the socket body is arranged around the opening of the socket. 3. A socket body that is mounted on a board and can house electronic components connected to internal terminals, and a lid that is formed separately from the socket body and closes an opening of the socket body, and the lid A socket with a test terminal for electronic components, characterized in that a pin-shaped test terminal is arranged on the outer circumferential side of the surface of the socket body to connect to the electronic component when the opening of the socket body is closed.
JP1148354A 1989-06-13 1989-06-13 Socket with test terminals for electronic part Pending JPH0315181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1148354A JPH0315181A (en) 1989-06-13 1989-06-13 Socket with test terminals for electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1148354A JPH0315181A (en) 1989-06-13 1989-06-13 Socket with test terminals for electronic part

Publications (1)

Publication Number Publication Date
JPH0315181A true JPH0315181A (en) 1991-01-23

Family

ID=15450884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1148354A Pending JPH0315181A (en) 1989-06-13 1989-06-13 Socket with test terminals for electronic part

Country Status (1)

Country Link
JP (1) JPH0315181A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019131164A1 (en) * 2017-12-25 2019-07-04 株式会社エンプラス Electric component socket

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019131164A1 (en) * 2017-12-25 2019-07-04 株式会社エンプラス Electric component socket
JP2019114481A (en) * 2017-12-25 2019-07-11 株式会社エンプラス Socket for electrical component
KR20200102430A (en) * 2017-12-25 2020-08-31 가부시키가이샤 엔프라스 Socket for electrical components

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