JPH02703Y2 - - Google Patents
Info
- Publication number
- JPH02703Y2 JPH02703Y2 JP13000482U JP13000482U JPH02703Y2 JP H02703 Y2 JPH02703 Y2 JP H02703Y2 JP 13000482 U JP13000482 U JP 13000482U JP 13000482 U JP13000482 U JP 13000482U JP H02703 Y2 JPH02703 Y2 JP H02703Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- continuity
- test
- contacts
- transformer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 13
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
Description
【考案の詳細な説明】
産業上の利用分野
本考案は、音響機器及び映像機器に使用されて
いる各種変成器の耐電圧試験装置に関する。[Detailed Description of the Invention] Industrial Application Field The present invention relates to a withstand voltage testing device for various transformers used in audio equipment and video equipment.
従来の構成とその問題点
従来の試験装置においては、第1図に示す様
に、試験装置本体5からリード線を介してテスト
棒又は治具などの一対の接触子6が導出されてお
り、供試変成器1の例えば一次コイル2と二次コ
イル3間の耐電圧試験を行なう場合には、接触子
6を一次コイル2及び二次コイル3に接触させ、
試験装置本体5から接触子6に所定の電圧を印加
していた。ところが、接触子6が接触していない
場合、不良品であつても良品と判断してしまうと
いう問題があつた。Conventional configuration and its problems In the conventional test device, as shown in FIG. 1, a pair of contacts 6 such as test rods or jigs are led out from the test device main body 5 via lead wires. When performing a withstand voltage test between, for example, the primary coil 2 and the secondary coil 3 of the transformer under test 1, the contactor 6 is brought into contact with the primary coil 2 and the secondary coil 3,
A predetermined voltage was applied from the test device main body 5 to the contact 6. However, when the contactor 6 is not in contact, there is a problem in that even if the product is defective, it is determined to be a good product.
考案の目的
本考案は、上記問題点に鑑み、接触子が接触し
ているか否かを検出できる様にした耐電圧試験装
置の提供を目的とする。Purpose of the invention In view of the above-mentioned problems, the present invention aims to provide a withstand voltage testing device that can detect whether or not the contacts are in contact.
考案の構成
本考案は、この目的を達成するため、試験電圧
を印加する第1の接触子と、該第1の接触子とは
別の第2の接触子を設け、これら両接触子間の導
通検出回路を設け、この導通検出回路にて前記第
1の接触子の接触状態を確認し、試験電圧が印加
されたか否かを判断できる様にした変成器の耐電
圧試験装置を提供する。Structure of the invention In order to achieve this objective, the invention provides a first contact for applying a test voltage and a second contact different from the first contact, and a gap between these two contactors. Provided is a withstand voltage testing device for a transformer, which is provided with a continuity detection circuit, and is capable of confirming the contact state of the first contact with the continuity detection circuit, and determining whether or not a test voltage is applied.
実施例の説明
以下、本考案の実施例を第2図乃至第4図によ
り説明する。なお、第1図で説明したものと実質
的に同一の構成要素については同一の参照番号を
付して説明を省略する。第2図は第1図と同様に
一次コイル2と二次コイル3間の耐電圧を試験し
ている状態を示している。7は、第1図における
接触子6と同様の試験用の所定の電圧を印加する
一対の第1の接触子であり、8はこの第1の接触
子7とは別に設けられた一対の第2の接触子であ
つて、それぞれ一次コイル2及び二次コイル3に
互いに離間して接触せしめられている。9はこれ
ら第1及び第2の接触子7,8間の導通状態を検
出する導通検出器であり、第1及び第2の接触子
7,8と導通検出器9により、被検出体である一
次コイル2又は二次コイル3との接触により閉じ
られる導通検出回路10が構成されている。な
お、導通検出器9としては、第4図に示す様な構
成のものを採用することができる。すなわち、第
4図において11は交流電源、12は導通試験用
電源トランス、13は導通電流検出トランス、1
4は導通電流検出トランジスタ、15は直流電
源、16は導通信号負荷であり、第1と第2の接
触子7,8間に電源トランス12にて導通試験電
圧を印加すると、導通している場合は導通検出回
路10が閉じてて電流が流れ、これにより検出ト
ランス13を介して検出トランジスタ14がオン
して導通信号負荷16が動作し、導通していない
場合は導通検出回路10が閉じないので動作しな
い。この導通検出回路9は、試験装置本体5内に
組込むことができる。4は変成器1の鉄芯であ
る。DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of the present invention will be described with reference to FIGS. 2 to 4. Components that are substantially the same as those described in FIG. 1 are designated by the same reference numerals and their description will be omitted. FIG. 2 shows a state where the withstand voltage between the primary coil 2 and the secondary coil 3 is being tested in the same way as FIG. 1. 7 is a pair of first contacts that apply a predetermined voltage for testing similar to the contact 6 in FIG. 1; 8 is a pair of first contacts provided separately from this first contact 7; There are two contacts, each of which is brought into contact with the primary coil 2 and secondary coil 3 at a distance from each other. 9 is a continuity detector that detects the continuity state between these first and second contacts 7 and 8; the first and second contacts 7 and 8 and continuity detector 9 detect the object to be detected. A continuity detection circuit 10 is configured that is closed by contact with the primary coil 2 or the secondary coil 3. Incidentally, as the continuity detector 9, one having a configuration as shown in FIG. 4 can be adopted. That is, in FIG. 4, 11 is an AC power supply, 12 is a power supply transformer for continuity testing, 13 is a continuity current detection transformer, 1
4 is a conduction current detection transistor, 15 is a DC power supply, and 16 is a conduction signal load. When a continuity test voltage is applied between the first and second contacts 7 and 8 by the power transformer 12, it is confirmed that there is continuity. When the continuity detection circuit 10 is closed, current flows, which turns on the detection transistor 14 via the detection transformer 13 and operates the continuity signal load 16. If there is no continuity, the continuity detection circuit 10 does not close. Do not work. This continuity detection circuit 9 can be incorporated into the test device main body 5. 4 is the iron core of the transformer 1.
以上の構成において、第1の接触子7及び第2
の接触子8を、耐電圧試験を行うべき一次コイル
2と二次コイル3の各々にそれぞれ接触せしめ、
試験装置本体5により第1の接触子7,7間に所
定の電圧を印加して一次コイル2と二次コイル3
間の耐圧試験を行なう。その際、第1の接触子7
及び第2の接触子8が接触しておれば、上述の通
り導通検出器9が動作して接触状態が確認され、
正常に耐圧試験が行なわれたことが確認される。
また接触不良のために試験装置本体5からの試験
電圧が印加されていないときは、導通検出器9が
動作しないので、そのことが判断できる。 In the above configuration, the first contactor 7 and the second
The contactor 8 is brought into contact with each of the primary coil 2 and the secondary coil 3 to be subjected to a withstand voltage test,
A predetermined voltage is applied between the first contacts 7 and 7 by the test device main body 5, and the primary coil 2 and the secondary coil 3 are
Perform a pressure test between At that time, the first contact 7
If the second contact 8 is in contact, the continuity detector 9 operates as described above to confirm the contact state,
It is confirmed that the pressure test was carried out normally.
Further, when the test voltage from the test device main body 5 is not applied due to poor contact, this can be determined because the continuity detector 9 does not operate.
第3図は、一次コイル2と鉄芯4間の耐圧試験
を行なつている状態を示しており、作用は第2図
における説明と同様である。 FIG. 3 shows a state in which a voltage resistance test is being performed between the primary coil 2 and the iron core 4, and the operation is the same as the explanation in FIG. 2.
考案の効果
本考案の耐電圧試験装置によれば、以上の説明
から明らかな様に、試験電圧を印加する第1の接
触子と、この第1の接触子とは別の第2の接触子
を設け、これら両接触子間の導通検出回路を設け
ているので、接触子が接触不良の場合は検出する
ことができ、接触不良によつて不良品を良品とし
て判断する様なことがなくなる。Effects of the Invention According to the withstand voltage testing device of the present invention, as is clear from the above description, the first contact to which the test voltage is applied and the second contact different from the first contact Since a continuity detection circuit is provided between the two contactors, it is possible to detect a contact failure between the contactors, and it is no longer possible to judge a defective product as a non-defective product due to a contact failure.
第1図は従来例の概略構成図、第2図及び第3
図は本考案の一実施例を示し、第2図は一次コイ
ルと二次コイル間の耐電圧試験を行なつている状
態の概略構成図、第3図はコイルと鉄芯間の耐電
圧試験を行なつている状態の概略構成図、第4図
は導通検出器の一例の回路図である。
1は変成器、2は一次コイル、3は二次コイ
ル、4は鉄芯、5は試験装置本体、7は第1の接
触子、8は第2の接触子、9は導通検出器、10
は導通検出回路。
Figure 1 is a schematic configuration diagram of a conventional example, Figures 2 and 3
The figure shows one embodiment of the present invention, Figure 2 is a schematic configuration diagram of a state in which a withstand voltage test is being performed between the primary coil and secondary coil, and Figure 3 is a withstand voltage test between the coil and the iron core. FIG. 4 is a circuit diagram of an example of a continuity detector. 1 is a transformer, 2 is a primary coil, 3 is a secondary coil, 4 is an iron core, 5 is a test device main body, 7 is a first contact, 8 is a second contact, 9 is a continuity detector, 10
is a continuity detection circuit.
Claims (1)
の接触子とは別の第2の接触子を設け、これら両
接触子間の導通検出回路を設けたことを特徴とす
る変成器の耐電圧試験装置。 a first contact for applying a test voltage;
1. A withstand voltage testing device for a transformer, characterized in that a second contact separate from the second contact is provided, and a continuity detection circuit between the two contacts is provided.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13000482U JPS5934370U (en) | 1982-08-27 | 1982-08-27 | Transformer withstand voltage test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13000482U JPS5934370U (en) | 1982-08-27 | 1982-08-27 | Transformer withstand voltage test equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5934370U JPS5934370U (en) | 1984-03-03 |
JPH02703Y2 true JPH02703Y2 (en) | 1990-01-09 |
Family
ID=30294388
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13000482U Granted JPS5934370U (en) | 1982-08-27 | 1982-08-27 | Transformer withstand voltage test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5934370U (en) |
-
1982
- 1982-08-27 JP JP13000482U patent/JPS5934370U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5934370U (en) | 1984-03-03 |
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