JPH0250691B2 - - Google Patents
Info
- Publication number
- JPH0250691B2 JPH0250691B2 JP57176881A JP17688182A JPH0250691B2 JP H0250691 B2 JPH0250691 B2 JP H0250691B2 JP 57176881 A JP57176881 A JP 57176881A JP 17688182 A JP17688182 A JP 17688182A JP H0250691 B2 JPH0250691 B2 JP H0250691B2
- Authority
- JP
- Japan
- Prior art keywords
- thyristor
- circuit
- signal
- failure
- detection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 27
- 238000010304 firing Methods 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 8
- 238000005070 sampling Methods 0.000 claims description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
- H02M1/088—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
- H02M1/092—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices the control signals being transmitted optically
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Protection Of Static Devices (AREA)
- Power Conversion In General (AREA)
- Thyristor Switches And Gates (AREA)
- Electronic Switches (AREA)
Description
【発明の詳細な説明】
この発明は、直列サイリスタの故障検出装置に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a failure detection device for a series thyristor.
第１図に、この種の故障検出装置の従来例を示
す。図において、１，１，１は直列接続されたサ
イリスタであつて、各サイリスタ１のアノード・
カソード間には発光素子２が電流制限抵抗３を介
して挿入されている。この発光素子２はサイリス
タ１のアノード・カソード間に順電圧＋VA-Kが
現われている場合に導通して順電圧検出信号（光
信号）Ｏを出力する。この光信号Ｏはライトガイ
ドで構成された光伝送路４を通して受光素子５ま
で光伝達される。受光素子５は光信号Ｏを電気信
号の順方向検出信号Ｅに変換して平均値回路６に
入力する。この平均値回路６は入力を積分してサ
イリスタ１の印加電圧の周期より長い期間で平均
し、順電圧＋VA-Kの幅に対応したレベルの電圧
信号Ｕを出力する。７は故障計数回路であつて、
全平均値回路６，６，６が出力する電圧信号Ｕが
導かれる構成となつており、所定レベル以下の電
圧信号Ｕの数、即ち故障と見なされるサイリスタ
１の個数を計数する。なお、第２図ａ及びｂにサ
イリスタ１のアノード・カソード間に現われる電
圧VA-K（但し、６相整流回路のサイリスタの場
合）及び光信号Ｏの波形を示す。 FIG. 1 shows a conventional example of this type of failure detection device. In the figure, 1, 1, 1 are thyristors connected in series, and the anode and
A light emitting element 2 is inserted between the cathodes via a current limiting resistor 3. This light emitting element 2 becomes conductive when a forward voltage +V AK appears between the anode and cathode of the thyristor 1 and outputs a forward voltage detection signal (optical signal) O. This optical signal O is optically transmitted to a light receiving element 5 through an optical transmission line 4 constituted by a light guide. The light receiving element 5 converts the optical signal O into a forward direction detection signal E of an electric signal and inputs it to the average value circuit 6. This average value circuit 6 integrates the input and averages it over a period longer than the period of the voltage applied to the thyristor 1, and outputs a voltage signal U having a level corresponding to the width of the forward voltage +V AK . 7 is a failure counting circuit,
The voltage signal U output from the total average value circuits 6, 6, 6 is guided, and the number of voltage signals U below a predetermined level, that is, the number of thyristors 1 that are considered to be in failure is counted. Incidentally, FIGS. 2a and 2b show the voltage V AK appearing between the anode and cathode of the thyristor 1 (in the case of a thyristor of a six-phase rectifier circuit) and the waveform of the optical signal O.
このように、従来の装置では、受光素子５の出
力を平均値回路６で平均して故障計数回路７に入
力し、故障計数回路７では所定レベル以下の電圧
信号Ｕの数を計数する為、サイリスタ１の制御角
が変わり順電圧＋VA-Kの幅が変化すると、電圧
信号Ｕのレベルも変わるので故障サイリスタの数
が誤つて計数される恐れがある上、平均値回路６
による応答の時間遅れがあるという欠点があつ
た。 In this manner, in the conventional device, the output of the light receiving element 5 is averaged by the averaging circuit 6 and input to the failure counting circuit 7, and the failure counting circuit 7 counts the number of voltage signals U below a predetermined level. When the control angle of the thyristor 1 changes and the width of the forward voltage +V AK changes, the level of the voltage signal U also changes, which may cause the number of failed thyristors to be counted incorrectly, and the average value circuit 6
The disadvantage was that there was a delay in response time.
この発明は、上記した従来の欠点を除去する為
になされたもので、各受光素子が出力する順電圧
検出信号をサンプリングして記憶する記憶回路
と、サイリスタの点弧信号発生時に、これら記憶
回路の順電圧検出信号の記憶の有無から故障を検
出する検出回路とを設けることによつて、従来に
比して、正確で、応答の早い直列サイリスタの故
障検出装置を提供することを目的とする。 This invention was made in order to eliminate the above-mentioned conventional drawbacks, and includes a memory circuit that samples and stores the forward voltage detection signal output from each light receiving element, and a memory circuit that samples and stores the forward voltage detection signal outputted by each light receiving element, and a memory circuit that samples and stores the forward voltage detection signal output from each light receiving element. It is an object of the present invention to provide a failure detection device for a series thyristor that is more accurate and has a faster response than the conventional one by providing a detection circuit that detects a failure from the presence or absence of storage of a forward voltage detection signal. .
以下、この発明の一実施例を図について説明す
る。 An embodiment of the present invention will be described below with reference to the drawings.
第３図において、２１，２１及び２１は増幅回
路、２２，２２及び２２はフリツプフロツプで構
成された記憶回路である。各受光素子５の出力Ｅ
は増幅回路２１を通して対応する記憶回路２２の
セツト端子に入力される。この記憶回路２２のセ
ツト出力Ｑは検出回路２３に供給される。この検
出回路２３はこの実施例ではサイリスタ１の点弧
信号Ｐの立上りと同期して計数動作を開始する計
数回路で構成される第１図の故障計数回路７と同
様に、入力されなかつたセツト出力Ｑの数を故障
サイリスタの数として計数する。２４はクロツク
発生器、２５は論理反転素子、２６は論理積素子
である。論理積素子２６は論理反転素子２５で反
転された点弧信号Ｐとクロツク発生器２４が出力
するクロツク信号Ｓとを受け、点弧信号Ｐが発生
しない間、クロツク信号Ｓを各記憶回路２２のク
ロツク端子Ｃに入力し、点弧信号Ｐが発生すると
クロツク信号Ｓを阻止する。このクロツク信号Ｓ
の周期は順電圧検出信号Ｅの予め定められた最小
信号幅Ｗより小さく設定されている。なお、第４
図ａ〜ｅに、各部の信号波形を示す。 In FIG. 3, 21, 21, and 21 are amplifier circuits, and 22, 22, and 22 are storage circuits composed of flip-flops. Output E of each light receiving element 5
is inputted through the amplifier circuit 21 to the set terminal of the corresponding memory circuit 22. The set output Q of this memory circuit 22 is supplied to a detection circuit 23. In this embodiment, this detection circuit 23 is constructed of a counting circuit that starts counting operation in synchronization with the rise of the firing signal P of the thyristor 1. Similar to the failure counting circuit 7 shown in FIG. Count the number of outputs Q as the number of failed thyristors. 24 is a clock generator, 25 is a logic inversion element, and 26 is an AND element. The AND element 26 receives the firing signal P inverted by the logic inverting element 25 and the clock signal S output from the clock generator 24, and supplies the clock signal S to each memory circuit 22 while the firing signal P is not generated. It is input to the clock terminal C, and when the firing signal P is generated, the clock signal S is blocked. This clock signal S
The period is set smaller than a predetermined minimum signal width W of the forward voltage detection signal E. In addition, the fourth
Figures a to e show signal waveforms at each part.
この構成では、受光素子５が光信号Ｏを受光し
て順電圧検出信号Ｅを出力した場合、この出力期
間中に、必らず、１つのクロツク信号Ｓが記憶回
路２２に入力されるので、該記憶回路２２は、到
来している順電圧検出信号Ｅを、矢印で示すクロ
ツク信号Ｓに同期して取込み、セツト出力Ｑを送
出する。この状態で続いて点弧信号Ｐが発生する
ので、検出回路２３が、複数の記憶回路２２のセ
ツト出力Ｑの数に基いて故障したサイリスタ１の
数を計数する。 In this configuration, when the light receiving element 5 receives the optical signal O and outputs the forward voltage detection signal E, one clock signal S is necessarily input to the memory circuit 22 during this output period. The memory circuit 22 takes in the incoming forward voltage detection signal E in synchronization with the clock signal S shown by the arrow, and sends out a set output Q. Since the ignition signal P is subsequently generated in this state, the detection circuit 23 counts the number of failed thyristors 1 based on the number of set outputs Q of the plurality of memory circuits 22.
ところで、点弧信号を受けた時点（点弧タイミ
ング）まで、アノード・カソード間に順電圧が現
われているサイリスタが本当に健全なサイリスタ
である。本実施例では、極めて短いサンプリング
周期で各受光素子２１の出力のサンプリングを行
うので、点弧信号Ｐの発生直前のサイリスタ１の
状態を各記憶回路２２に記憶させることができ、
この記憶内容を点弧信号Ｐの発生時にチエツクす
るから、実質的には、常に点弧信号発生時のサイ
リスタ１の状態を検出するものと見ることがで
き、従つて、健全なサイリスタの全てを確実に、
かつ、速やかに検出することができる。 By the way, a thyristor in which a forward voltage appears between the anode and the cathode until it receives an ignition signal (ignition timing) is a truly healthy thyristor. In this embodiment, since the output of each light receiving element 21 is sampled at an extremely short sampling period, the state of the thyristor 1 immediately before the firing signal P is generated can be stored in each storage circuit 22.
Since this memory content is checked when the ignition signal P is generated, it can be seen as essentially always detecting the state of the thyristor 1 when the ignition signal is generated, and therefore all healthy thyristors are detected. surely,
Moreover, it can be detected quickly.
また、サイリスタの順電圧が立上るタイミング
には、逆電圧期間のバラツキに起因するバラツキ
があるが、本実施例では、上記のように、実質的
には点弧信号（各サイリスタに対して同時）を受
けた時点の状態を検出するから、サイリスタの点
弧位相遅れ角が小さい場合にも、上記バラツキに
原因する誤検出を確実に防止することができる。 In addition, the timing at which the forward voltage of the thyristor rises varies due to variation in the reverse voltage period, but in this embodiment, as described above, the firing signal (simultaneously for each thyristor) ) is detected, so even if the firing phase delay angle of the thyristor is small, erroneous detection caused by the above-mentioned variations can be reliably prevented.
なお、検出回路２３は表示回路等であつてもよ
い。 Note that the detection circuit 23 may be a display circuit or the like.
以上の如く、この発明によれば、受光素子が出
力する順電圧検出信号を夫々記憶回路にサンプリ
ングして記憶させ、サイリスタの点弧信号の発生
をまつて上記各記憶回路の記憶の有無をチエツク
して該記憶の有無により故障サイリスタの有無や
故障サイリスタの個数等を検出する構成としたこ
とによつて、常に、点弧信号発生直前のサイリス
タの状態を点弧信号発生時に知ることができるの
で、各サイリスタの順電圧の立上りにバラツキが
あつても、健全なサイリスタの全てを確実に検出
して故障サイリスタを有無を正確に、かつ、速や
かに検出することができ、従来に比し、信頼性を
高めることができる。 As described above, according to the present invention, the forward voltage detection signals output from the light receiving elements are sampled and stored in the respective storage circuits, and the presence or absence of the memory in each of the storage circuits is checked before the generation of the firing signal of the thyristor. By adopting a configuration that detects the presence or absence of a faulty thyristor, the number of faulty thyristors, etc. based on the presence or absence of the memory, it is possible to always know the state of the thyristor immediately before the ignition signal is generated when the ignition signal is generated. Even if there is variation in the rise of the forward voltage of each thyristor, all healthy thyristors can be reliably detected and the presence or absence of a faulty thyristor can be detected accurately and quickly, making it more reliable than before. You can increase your sexuality.
第１図は従来の直列サイリスタの故障検出装置
の回路図、第２図は波形図、第３図はこの発明に
よる直列サイリスタの故障検出装置の実施例の回
路図、第４図は上記実施例の動作を説明する為の
波形図である。
図において、１……サイリスタ、２……発光素
子、４……光伝送路、５……受光素子、２２……
記憶回路、２３……検出回路、２４……クロツク
発生器、２５……論理反転素子、２６……論理積
素子、なお、図中同一符号は同一又は相当部分を
示す。
Fig. 1 is a circuit diagram of a conventional series thyristor failure detection device, Fig. 2 is a waveform diagram, Fig. 3 is a circuit diagram of an embodiment of a series thyristor failure detection device according to the present invention, and Fig. 4 is the above-mentioned embodiment. FIG. 2 is a waveform diagram for explaining the operation of FIG. In the figure, 1... Thyristor, 2... Light emitting element, 4... Optical transmission line, 5... Light receiving element, 22...
Memory circuit, 23...detection circuit, 24...clock generator, 25...logic inverting element, 26... ANDing element, and the same reference numerals in the drawings indicate the same or corresponding parts.
Claims (1)
ド・カソード間に極性向きをサイリスタと同じ向
きにして挿入された発光素子、対応する発光素子
が出力する光信号を受光する複数の受光素子を具
えるサイリスタの故障検出装置において、上記各
受光素子が出力する電気信号をそれぞれ同一タイ
ミングでサンプリングして記憶する記憶回路と、
サイリスタの点弧信号発生時に上記各記憶回路の
記憶内容からサイリスタ故障を検出する検出回路
を有し、上記サンプリング周期がサイリスタに加
わる最小順電圧期間より大きくなく、上記記憶内
容が上記点弧信号発生時点に対して最新に記憶さ
れた内容であることを特徴とする直列サイリスタ
の故障検出装置。 ２ 検出回路がサイリスタの点弧信号を受けて計
数動作を開始する故障計数回路であることを特徴
とする特許請求の範囲第１項記載の直列サイタス
タの故障検出装置。[Claims] 1. A light emitting element inserted between the anodes and cathodes of a plurality of serially connected thyristors with the polarity facing the same as that of the thyristor, and a plurality of light emitting elements that receive optical signals output from the corresponding light emitting elements. A thyristor failure detection device including a light-receiving element, comprising: a memory circuit that samples and stores electrical signals output from each of the light-receiving elements at the same timing;
It has a detection circuit that detects a thyristor failure from the memory contents of each of the memory circuits when the thyristor firing signal is generated, and the sampling period is not larger than the minimum forward voltage period applied to the thyristor, and the stored contents are the same as the firing signal generation. A failure detection device for a series thyristor, characterized in that the content is the latest stored for a point in time. 2. The failure detection device for a series thyristor according to claim 1, wherein the detection circuit is a failure counting circuit that starts counting operation upon receiving a thyristor firing signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17688182A JPS5967867A (en) | 1982-10-07 | 1982-10-07 | Defect detector for series thyristors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17688182A JPS5967867A (en) | 1982-10-07 | 1982-10-07 | Defect detector for series thyristors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5967867A JPS5967867A (en) | 1984-04-17 |
| JPH0250691B2 true JPH0250691B2 (en) | 1990-11-05 |
Family
ID=16021398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17688182A Granted JPS5967867A (en) | 1982-10-07 | 1982-10-07 | Defect detector for series thyristors |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5967867A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05288799A (en) * | 1992-04-10 | 1993-11-02 | Tabai Espec Corp | Environment testing device with normal temperature chamber for installing driver |
| JP2006271084A (en) * | 2005-03-23 | 2006-10-05 | Toshiba Mitsubishi-Electric Industrial System Corp | Thyristor failure detection device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02116218A (en) * | 1988-10-26 | 1990-04-27 | Nichicon Corp | Transistor trouble detecting circuit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5532460A (en) * | 1978-08-30 | 1980-03-07 | Tokyo Shibaura Electric Co | Power converter element failure detector |
| JPS5556418A (en) * | 1978-10-20 | 1980-04-25 | Hitachi Ltd | Voltage detector trouble detecting circuit for converter |
-
1982
- 1982-10-07 JP JP17688182A patent/JPS5967867A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5532460A (en) * | 1978-08-30 | 1980-03-07 | Tokyo Shibaura Electric Co | Power converter element failure detector |
| JPS5556418A (en) * | 1978-10-20 | 1980-04-25 | Hitachi Ltd | Voltage detector trouble detecting circuit for converter |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05288799A (en) * | 1992-04-10 | 1993-11-02 | Tabai Espec Corp | Environment testing device with normal temperature chamber for installing driver |
| JP2006271084A (en) * | 2005-03-23 | 2006-10-05 | Toshiba Mitsubishi-Electric Industrial System Corp | Thyristor failure detection device |
| JP4579733B2 (en) * | 2005-03-23 | 2010-11-10 | 東芝三菱電機産業システム株式会社 | Thyristor failure detection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5967867A (en) | 1984-04-17 |
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