JPH0231138A - Method for measuring sharpness of coating surface - Google Patents
Method for measuring sharpness of coating surfaceInfo
- Publication number
- JPH0231138A JPH0231138A JP18083988A JP18083988A JPH0231138A JP H0231138 A JPH0231138 A JP H0231138A JP 18083988 A JP18083988 A JP 18083988A JP 18083988 A JP18083988 A JP 18083988A JP H0231138 A JPH0231138 A JP H0231138A
- Authority
- JP
- Japan
- Prior art keywords
- slit light
- image
- light
- reflected
- slit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 10
- 239000011248 coating agent Substances 0.000 title abstract 5
- 238000000576 coating method Methods 0.000 title abstract 5
- 238000011156 evaluation Methods 0.000 claims abstract description 9
- 238000001514 detection method Methods 0.000 claims abstract description 7
- 238000004804 winding Methods 0.000 abstract 2
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 9
- 239000002932 luster Substances 0.000 description 9
- 238000001228 spectrum Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 230000001419 dependent effect Effects 0.000 description 4
- 239000002131 composite material Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007591 painting process Methods 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、自動車の車体パネルに代表されるような塗装
面の表面の写像鮮映性を測定する方法に関する。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for measuring the image sharpness of a painted surface such as a vehicle body panel.
従来の技術
この種の鮮映性測定方法としては例えば特開昭６２−２
３３７１２号公報に示されているように、スリット光源
から被測定面に対し１条のスリット光を照射し、その反
射スリット光を該スリット光と検出ラインが直交するよ
うに間隔をおいて互いに平行に配置した２個のラインセ
ンサによって検出しながら前記被測定面との間で相対的
に平行移動させ、その間に前記２個のラインセンサによ
って検出される反射スリット光受光位置の差の変動量に
よって被測定面の鮮映性を示すデータを得るようにした
ものが知られている。Prior art This type of sharpness measurement method is, for example, disclosed in Japanese Patent Application Laid-open No. 62-2.
As shown in Publication No. 33712, a single slit light beam is irradiated from a slit light source to the surface to be measured, and the reflected slit light beams are parallel to each other at intervals so that the slit light and the detection line are perpendicular to each other. While being detected by two line sensors arranged at A device that obtains data indicating the sharpness of the surface to be measured is known.
この従来の測定方法は、被測定面にスリット光を照射す
ると、被測定面の細かい凹凸等によって反射スリット光
がスリット幅方法にうねりを生ずる性質を利用し、被測
定面と２個のラインセンサとを相対的に平行移動させる
と、各ラインセンサによって検出される反射スリット光
受光位置が上記のうねりによって変動し、その差も変動
することから、この変動量すなわち反射スリ・ット光の
うねりの幅を鮮映性を示すデータとして得るものである
。This conventional measurement method utilizes the property that when a slit light is irradiated onto the surface to be measured, the reflected slit light causes undulations in the slit width due to fine irregularities on the surface to be measured. When the slit light is relatively moved parallel to The width of the image is obtained as data indicating image clarity.
発明が解決しようとする課題
塗装面の鮮映性とは、塗装面の表面すなわち塗面に映る
物体像がぼけたり歪みを生ずることなく鮮明に目視観察
できるか否かを示す塗装面の性質で、一般的には塗面の
平滑性、肉持ち感、つや、光沢等に依存する。Problems to be Solved by the Invention Sharpness of a painted surface is a property of the painted surface that indicates whether the surface of the painted surface, that is, the image of an object reflected on the painted surface, can be clearly observed visually without blurring or distortion. Generally, it depends on the smoothness, texture, luster, gloss, etc. of the painted surface.
しかしながら従来の測定方法によれば、反射スリット光
のうねりの幅に対応する反射スリット光受光位置の差の
変動量を鮮映性を示すデータとしてとらえているため、
総合的な鮮映性の評価は可能であっても、その鮮映性の
値が塗面の平滑性、肉持ち感、つや、光沢等といった多
くの因子のうちどの因子に特に依存しているのか、鮮映
性の依存因子までは解析することができず、その鮮映性
の測定結果を塗装工程に有効にフィードバックすること
ができない。However, according to the conventional measurement method, the amount of variation in the difference in the receiving position of the reflected slit light corresponding to the width of the undulation of the reflected slit light is taken as data indicating image clarity.
Even if it is possible to evaluate overall sharpness, the value of sharpness depends particularly on which factor among many factors such as the smoothness of the painted surface, texture, luster, gloss, etc. However, it is not possible to analyze the dependent factors of image clarity, and the results of measurement of image clarity cannot be effectively fed back to the painting process.
本発明は、総合的な鮮映性の評価だけでなく、その鮮映
性の依存因子まで解析・評価できるようにした測定方法
を提供しようとするものである。The present invention aims to provide a measuring method that allows not only comprehensive evaluation of sharpness, but also analysis and evaluation of dependent factors of sharpness.
課題を解決するための手段
本発明の鮮映性測定方法においては、塗装が施された被
測定面に対してスリット光を照射し、その反射スリット
光もしくは反射スリット光を写真撮影して得られた画像
を、検出ラインが反射スリット光と直交するように配置
されたラインセンサによって反射スリット光の長手方向
に相対移動させながら撮像して反射スリット光の中心線
の座標データを求め、この反射スリット光の中心線の座
標データを周波数解析して鮮映性評価データを得ること
を特徴としている。Means for Solving the Problems In the sharpness measuring method of the present invention, slit light is irradiated onto a painted surface to be measured, and the reflected slit light or reflected slit light is obtained by photographing the surface. The image is captured by a line sensor arranged so that the detection line is perpendicular to the reflected slit light while moving relatively in the longitudinal direction of the reflected slit light, and the coordinate data of the center line of the reflected slit light is obtained. It is characterized by frequency-analyzing the coordinate data of the center line of light to obtain image clarity evaluation data.
作用
被測定面にスリット光を照射すると、塗面の平滑性や肉
持ち感、つや、光沢等の影響のために従来と同様に反射
スリット光がうねりを生ずる。Effect When the surface to be measured is irradiated with slit light, the reflected slit light causes undulations as in the past due to the effects of the smoothness, texture, gloss, gloss, etc. of the coated surface.
そこで、この反射スリット光を一旦写真撮影して得られ
た画像もしくは反射スリット光を、該反射スリット光と
検出ラインが直交するように配置されたラインセンサで
検出し、ラインセンサ上での反射スリット光の受光位置
データすなわち反射スリット光の幅方向での中心位置の
座標データを演算して求め記憶する。そして、このよう
な処理を行いながら反射スリット光の長手方向に沿って
反射スリット光とラインセンサとを相対移動させ、反射
スリット光を幅方向に二分する線分のデータすなわち反
射スリット光の中心線の座標データを求め、この反射ス
リット光の中心線の座標データを周波数解析して鮮映性
評価データを得る。具体的には、上記の中心線の座標デ
ータをフーリエ変換した上でパワースペクトルとして表
す。Therefore, an image obtained by photographing this reflected slit light or the reflected slit light is detected by a line sensor arranged so that the reflected slit light and the detection line are perpendicular to each other, and the reflected slit light on the line sensor is detected. The light reception position data, that is, the coordinate data of the center position in the width direction of the reflected slit light is calculated and stored. While performing such processing, the reflected slit light and the line sensor are moved relative to each other along the longitudinal direction of the reflected slit light, and the data of the line segment that bisects the reflected slit light in the width direction, that is, the center line of the reflected slit light, is obtained. The coordinate data of the center line of this reflected slit light is frequency-analyzed to obtain sharpness evaluation data. Specifically, the coordinate data of the center line is Fourier transformed and then expressed as a power spectrum.
この場合、塗面の断面についてみたとき、塗面の性状は
数種の波長をもつ合成波と考えることができ、塗面の平
滑性は長波長に、肉持ち感は中波長に、つや及び光沢は
短波長にそれぞれ対応する。In this case, when looking at the cross section of the painted surface, the properties of the painted surface can be thought of as a composite wave with several wavelengths, with the smoothness of the painted surface at long wavelengths, the texture at medium wavelengths, and the gloss and The gloss corresponds to each short wavelength.
したがって、前述した反射スリット光の中心線の形状は
上記合成波と相関をもつことになり、パワースペクトル
によって得られた各波長ごとの振幅を比較することによ
り、総合的な鮮映性評価はもちろん、塗面の平滑性や肉
持ち感、つや、光沢といった鮮映性の依存因子まで解析
・評価できる。Therefore, the shape of the center line of the reflected slit light mentioned above has a correlation with the above composite wave, and by comparing the amplitude of each wavelength obtained from the power spectrum, it is possible to evaluate not only the overall sharpness but also the shape of the center line of the reflected slit light. It is possible to analyze and evaluate the dependent factors of image clarity, such as the smoothness, texture, gloss, and luster of the painted surface.
実施例 第１図は本発明の一実施例を示す説明図である。Example FIG. 1 is an explanatory diagram showing one embodiment of the present invention.
試料となるパネル１には予め塗装が施されており、その
被測定面となる塗面１ａに対し、光源２からの光をスリ
ット板３とレンズ４を通してスリット光Ｓとした上で所
定の入射角のもとで照射する。そして、塗面１ａで反射
した反射スリット光Ｓａをカメラ５で撮影して印画紙に
焼き付けることで、前記反射スリット光Ｓａの画像を含
む写真６を得る。さらに、この写真６を第２図にも示す
ようにラインセンサ７を主体とするラインセンサカメラ
８で撮像し、写真６上での反射スリット光Ｓａを、画素
配列による検出ライン７ａが上記反射スリット光Ｓａと
直交するラインセンサ７によって検出して画像処理装置
９に入力する。上記のラインセンサ７としてはフォトダ
イオードアレイあるいはＣＯＤラインセンサ等を用いる
。A panel 1 as a sample is coated in advance, and light from a light source 2 is passed through a slit plate 3 and a lens 4 to form a slit light S, and then a predetermined incidence is applied to the coated surface 1a, which is the surface to be measured. Irradiate under the corner. Then, by photographing the reflected slit light Sa reflected by the painted surface 1a with a camera 5 and printing it on photographic paper, a photograph 6 including an image of the reflected slit light Sa is obtained. Furthermore, as shown in FIG. 2, this photograph 6 is imaged by a line sensor camera 8 mainly composed of a line sensor 7, and the reflected slit light Sa on the photograph 6 is detected by a detection line 7a formed by a pixel arrangement that corresponds to the reflected slit. It is detected by a line sensor 7 perpendicular to the light Sa and input to the image processing device 9. As the line sensor 7, a photodiode array, a COD line sensor, or the like is used.
ここで、上記のように塗面１ａに対しスリット光Ｓを照
射すると、塗面１ａの微小な凹凸すなわち塗面１ａの平
滑性や肉持ち感、つや、光沢等の影響のために反射スリ
ット光Ｓがスリット幅方向に振られてうねりを生じ、こ
のうねりはそのまま写真６上での反射スリット光Ｓａに
も表れる。第３図（Ａ）は反射スリット光Ｓａを含む写
真６の一例を示したものであるが、スリット光Ｓが一定
幅の直線状のものであっても、塗面１ａの平滑性等のた
めに反射スリット光Ｓａは局部的にうねりを生じて同図
（Ａ）に示すようにモザイク状のものとなり、このうね
りは塗面１ａの鮮映性が悪いほど太き（なる。Here, when the painted surface 1a is irradiated with the slit light S as described above, the reflected slit light is caused by minute irregularities on the painted surface 1a, that is, due to the influence of the smoothness, texture, luster, gloss, etc. of the painted surface 1a. S is swung in the slit width direction to generate undulations, and this undulations also appears as it is in the reflected slit light Sa on the photograph 6. FIG. 3(A) shows an example of photograph 6 including reflected slit light Sa, but even if the slit light S is linear with a constant width, due to the smoothness of the painted surface 1a, etc. The reflected slit light Sa locally undulates and becomes mosaic-like as shown in FIG.
そして、塗面１ａの断面についてみたとき、第４図に示
すように塗面１ａの性状は数種の波長をもつ合成波と考
えることができ、スリット光Ｓが照射された塗面１ａの
平滑性（２００〜４００μ）は長波長部による反射に対
応し、肉持ち感（４０〜２００μ）は中波長部による反
射に、つや及び光沢（１０〜４０μ）は短波長部による
反射にそれぞれ対応する。When looking at the cross section of the painted surface 1a, as shown in Figure 4, the properties of the painted surface 1a can be considered to be a composite wave with several wavelengths, and the smoothness of the painted surface 1a irradiated with the slit light S. The texture (200-400μ) corresponds to the reflection in the long wavelength region, the fleshiness (40-200μ) corresponds to the reflection in the middle wavelength region, and the luster and luster (10-40μ) corresponds to the reflection in the short wavelength region. .
したがって、第３図に示した写真６上での反射スリット
光Ｓａの中心線（曲線）Ｏｓを求めた上でパワースペク
トルとして表し、その振幅を比較することによって鮮映
性の良否はもちろん、その鮮映性が塗面の平滑性、肉持
ち感、つや、光沢といった多くの因子のうち特にどの因
子に依存しているのか特定できることになる。Therefore, by finding the center line (curve) Os of the reflected slit light Sa on the photograph 6 shown in Figure 3, and expressing it as a power spectrum, and comparing the amplitudes, you can determine not only the quality of the sharpness but also the quality of the image. This makes it possible to identify which factor the image sharpness depends on among many factors, such as the smoothness, texture, gloss, and luster of the painted surface.
そこで、この実施例では第３図（Ｂ）に示すように、写
真６上での反射スリット光Ｓａの像の基準中心線Ｏに対
して直角にａ、ｂ、ｃ・・・・・・ｎの断面をとり、各
断面での中心点Ｐａ、Ｐｂ、Ｐｃ・・・・・・Ｐｎの座
標データをプロットして、反射スリット光Ｓａを幅方向
に２分する中心線（曲線）Ｏｓを作成する。Therefore, in this embodiment, as shown in FIG. 3(B), a, b, c...n Take a cross section, plot the coordinate data of center points Pa, Pb, Pc...Pn in each cross section, and create a center line (curve) Os that bisects the reflected slit light Sa in the width direction. do.
より具体的には、第５図（Ａ）、（Ｂ）及び第７図に示
すようにラインセンサ７から順次出力されて画像処理装
置９に入力されるビデオ出力信号Ｖｓを２値化処理によ
って２値化ビデオ信号Ｄｓとし、この２値化ビデオ信号
Ｄｓの立ち上がりまでのビット数Ｔ１と立ち下がりまで
のビット数Ｔ。More specifically, as shown in FIGS. 5(A), (B) and FIG. 7, the video output signal Vs sequentially output from the line sensor 7 and input to the image processing device 9 is binarized. Assuming a binary video signal Ds, the number of bits T1 until the rising edge and the number T of bits until the falling edge of the binary video signal Ds.
をそれぞれカウントする。そして、Ｔ、とＴ、の値をも
とに（１）式の演算を行い、反射スリット光Ｓａの幅方
向での中心点（第３図のＰ□、Ｐｔ・・・・・・Ｐｎの
点）の座標データＸを求めて逐次記憶する。Count each. Then, calculate the equation (1) based on the values of T and T, and calculate the center point in the width direction of the reflected slit light Sa (P□, Pt...Pn in Fig. 3). (point) coordinate data X is determined and stored sequentially.
このような処理を行いながら、第２図に示したラインセ
ンサ７と写真６とを反射スリット光Ｓａの長手方向に相
対移動させて時系列のＸ、、ｘ、・・・・・・ｘｎの座
標データを求めると、データ全体として第３図及び第６
図に示すように反射スリット光Ｓａの中心線（曲線）Ｏ
ｓの座標データが求まる。While performing such processing, the line sensor 7 and the photograph 6 shown in FIG. 2 are moved relative to each other in the longitudinal direction of the reflected slit light Sa, and the time series of When determining the coordinate data, the data as a whole is shown in Figures 3 and 6.
As shown in the figure, the center line (curve) O of the reflected slit light Sa
The coordinate data of s is determined.
この中心線Ｏｓの座標データを、コンピュータを中心に
構成された演算処理装置１０に入力してフーリエ変換し
た上、中心線Ｏｓの鮮映性評価データをパワースペクト
ルとして表示し、その鮮映性を評価する。The coordinate data of the center line Os is input to the arithmetic processing unit 10 mainly composed of a computer, subjected to Fourier transformation, and the sharpness evaluation data of the center line Os is displayed as a power spectrum to evaluate the sharpness. evaluate.
第８図はパワースペクトルとして表示されたものの一例
を示したもので、縦軸のパワーＰは反射スリット光Ｓａ
の中心線Ｏｓに対応するところの曲線に含まれる各波長
毎の振幅の大きさの２乗に比例し、しかも先に述べたよ
うに塗面の平滑性は長波長に、肉持ち感は中波長に、っ
や及び光沢は短波長にそれぞれ対応することがら、第８
図の場合にはＭａのよりも直線に近いＮａのほうが鮮映
性が良いことがわかる。しかもＭａの場合には長波長に
なるほどパワーＰが大きくなっていることから、Ｍａの
鮮映性は特に塗面の平滑性と肉持ち感が悪いために全体
としての鮮映性評価が悪いものと判定できる。Figure 8 shows an example of what is displayed as a power spectrum, where the power P on the vertical axis is the reflected slit light Sa.
It is proportional to the square of the amplitude of each wavelength included in the curve corresponding to the center line Os of Regarding wavelength, since gloss and gloss correspond to short wavelengths, the 8th
In the case of the figure, it can be seen that Na, which is closer to a straight line, has better image clarity than Ma. Moreover, in the case of Ma, the power P increases as the wavelength becomes longer, so the sharpness of Ma is particularly poor in the smoothness and texture of the painted surface, so the overall sharpness evaluation is poor. It can be determined that
ここで、上記実施例では反射スリット光Ｓａを一旦写真
撮影し、その写真６上での反射スリット光Ｓａの像をラ
インセンサ７で検出するようにしているが、この方式に
代えて第９図に示すようにスリット光源１２とラインセ
ンサ１７とを所定の角度をなして配設し、塗面１ａから
の反射スリット光Ｓａを直接ラインセンサ１７で検出す
るようにしてもよい。Here, in the above embodiment, the reflected slit light Sa is once photographed, and the image of the reflected slit light Sa on the photograph 6 is detected by the line sensor 7, but instead of this method, as shown in FIG. As shown in the figure, the slit light source 12 and the line sensor 17 may be arranged at a predetermined angle, and the line sensor 17 may directly detect the reflected slit light Sa from the painted surface 1a.
ただし、前記写真撮影方式の場合には、第１図のカメラ
５と光源２等を１つの測定ユニ５．、トとすることで画
像処理装置９および演算処理装置１０から切り離すこと
が可能であり、しかも測定ユニットを複数製作すること
によって、画像処理装置９および演算処理装置１０が１
台でありながらも写真の授受だけで複数の場所での測定
が可能となる利点がある。However, in the case of the photographic method, the camera 5, light source 2, etc. shown in FIG. 1 are integrated into one measurement unit 5. , it is possible to separate the image processing device 9 and the arithmetic processing device 10, and by manufacturing a plurality of measurement units, the image processing device 9 and the arithmetic processing device 10 can be separated from the image processing device 9 and the arithmetic processing device 10.
Although it is a stand, it has the advantage of being able to take measurements at multiple locations just by sending and receiving photos.
発明の効果
以上のように本発明の鮮映性測定方法によれば、塗面の
反射スリット光もしくは反射スリット光を写真撮影して
得られた画像を、検出ラインが反射スリット光と直交す
るように配置されたラインセンサによって、反射スリッ
ト光の長手方向に相対移動させながら撮像して反射スリ
ット光の中心線の座標データを求め、この反射スリット
光の中心線の座標データを周波数解析して鮮映性評価デ
ータを得るようにしたことにより、塗面の鮮映性の総合
的な評価はもちろん、その鮮映性が塗面の平滑性、肉持
ち感、つや、光沢といった多くの因子のうちどの因子に
特に依存しているのか特定できるようになり、測定結果
の信頼性が大幅に向上する。Effects of the Invention As described above, according to the sharpness measuring method of the present invention, an image obtained by photographing the reflected slit light of the painted surface or the reflected slit light is set so that the detection line is perpendicular to the reflected slit light. A line sensor placed at the center takes an image of the reflected slit light while moving it relatively in the longitudinal direction to obtain the coordinate data of the center line of the reflected slit light.The coordinate data of the center line of the reflected slit light is frequency-analyzed and sharpened. By obtaining image quality evaluation data, we can not only comprehensively evaluate the image clarity of the painted surface, but also evaluate the image clarity among many factors such as the smoothness, texture, luster, and luster of the painted surface. It becomes possible to identify which factors are particularly dependent, greatly improving the reliability of measurement results.
第１図は本発明の測定方法の一実施例を示す説明図、第
２図は第１図の要部拡大説明図、第３図は反射スリット
光を写真撮影した画像の一例を示す説明図、第４図は塗
面の断面の性状と波長との関係を示す説明図、第５図は
ラインセンサの出力の波形図、第６図は反射スリット光
の中心線の座標データによって特定される曲線の説明図
、第７図は第１図のシステムの信号処理過程のフローチ
ャート、第８図はパワースペクトルの一例を示ス説明図
、第９図は本発明の他の実施例を示す説明図である。
■・・・パネル、１ａ・・・被測定面としての塗面、５
・・・カメラ、６・・・写真、７・・・ラインセンサ、
９・・・画像処理装置、１０・・・演算処理装置、Ｓ・
・・スリット移動距離
第７図
○力ＤFig. 1 is an explanatory diagram showing an example of the measuring method of the present invention, Fig. 2 is an enlarged explanatory diagram of the main part of Fig. 1, and Fig. 3 is an explanatory diagram showing an example of an image obtained by photographing reflected slit light. , Fig. 4 is an explanatory diagram showing the relationship between the properties of the cross section of the painted surface and the wavelength, Fig. 5 is a waveform diagram of the output of the line sensor, and Fig. 6 is specified by the coordinate data of the center line of the reflected slit light. An explanatory diagram of the curve; FIG. 7 is a flowchart of the signal processing process of the system in FIG. 1; FIG. 8 is an explanatory diagram showing an example of the power spectrum; FIG. 9 is an explanatory diagram showing another embodiment of the present invention. It is. ■...Panel, 1a...Painted surface as the surface to be measured, 5
...Camera, 6...Photo, 7...Line sensor,
9... Image processing device, 10... Arithmetic processing device, S.
...Slit movement distance Fig. 7 ○ Force D
Claims (1)
射し、 その反射スリット光もしくは反射スリット光を写真撮影
して得られた画像を、検出ラインが反射スリット光と直
交するように配置されたラインセンサによって反射スリ
ット光の長手方向に相対移動させながら撮像して反射ス
リット光の中心線の座標データを求め、 この反射スリット光の中心線の座標データを周波数解析
して鮮映性評価データを得ること、を特徴とする塗面の
鮮映性測定方法。(1) Irradiate the painted surface to be measured with a slit light, and take a photograph of the reflected slit light or the reflected slit light.The image obtained is taken so that the detection line is perpendicular to the reflected slit light. Coordinate data of the center line of the reflected slit light is obtained by capturing an image while moving the reflected slit light relatively in the longitudinal direction using the arranged line sensor, and frequency analysis of the coordinate data of the center line of the reflected slit light is performed to determine the sharpness of the image. A method for measuring sharpness of a painted surface, characterized by obtaining evaluation data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18083988A JPH0231138A (en) | 1988-07-20 | 1988-07-20 | Method for measuring sharpness of coating surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18083988A JPH0231138A (en) | 1988-07-20 | 1988-07-20 | Method for measuring sharpness of coating surface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0231138A true JPH0231138A (en) | 1990-02-01 |
Family
ID=16090259
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18083988A Pending JPH0231138A (en) | 1988-07-20 | 1988-07-20 | Method for measuring sharpness of coating surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0231138A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05322763A (en) * | 1991-12-26 | 1993-12-07 | Sumitomo Metal Ind Ltd | Gloss measuring method for steel plate surface |
| JPH06511427A (en) * | 1992-07-20 | 1994-12-22 | バイオエンジニアリング・アクチエンゲゼルシヤフト | Driving device for a tottering body |
-
1988
- 1988-07-20 JP JP18083988A patent/JPH0231138A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05322763A (en) * | 1991-12-26 | 1993-12-07 | Sumitomo Metal Ind Ltd | Gloss measuring method for steel plate surface |
| JPH06511427A (en) * | 1992-07-20 | 1994-12-22 | バイオエンジニアリング・アクチエンゲゼルシヤフト | Driving device for a tottering body |
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