JPH02240558A - Defect inspecting device for glass fiber - Google Patents
Defect inspecting device for glass fiberInfo
- Publication number
- JPH02240558A JPH02240558A JP1061399A JP6139989A JPH02240558A JP H02240558 A JPH02240558 A JP H02240558A JP 1061399 A JP1061399 A JP 1061399A JP 6139989 A JP6139989 A JP 6139989A JP H02240558 A JPH02240558 A JP H02240558A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- glass fiber
- circuit
- defect
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003365 glass fiber Substances 0.000 title claims abstract description 48
- 230000007547 defect Effects 0.000 title claims abstract description 44
- 238000001514 detection method Methods 0.000 claims abstract description 45
- 239000003990 capacitor Substances 0.000 claims abstract description 40
- 230000010355 oscillation Effects 0.000 claims abstract description 29
- 238000007689 inspection Methods 0.000 claims description 14
- 238000006243 chemical reaction Methods 0.000 abstract description 14
- 239000011521 glass Substances 0.000 abstract description 6
- 239000002184 metal Substances 0.000 abstract description 5
- 229910052751 metal Inorganic materials 0.000 abstract description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 abstract description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052742 iron Inorganic materials 0.000 abstract description 2
- 150000002739 metals Chemical class 0.000 abstract description 2
- 229910052759 nickel Inorganic materials 0.000 abstract description 2
- 238000013459 approach Methods 0.000 abstract 1
- -1 iron and nickel Chemical class 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 14
- 238000010586 diagram Methods 0.000 description 6
- 239000004744 fabric Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
Description
【発明の詳細な説明】
［産業上の利用分野］
この発明は、ガラス繊維の欠陥検査装置に関し、特にガ
ラス繊維糸中に微小な金属片が含まれる欠陥を検出する
のに有用である。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a glass fiber defect inspection device, and is particularly useful for detecting defects containing minute metal pieces in glass fiber threads.
［従来の技術］
従来のこの種のガラス繊維の欠陥検査装置としては、例
えば特開昭６０−２０１３８号公報に開示のものや、特
開昭５９−２１４７４８号公報に・開示のものがある。[Prior Art] Conventional glass fiber defect inspection devices of this type include one disclosed in, for example, Japanese Patent Application Laid-Open No. 60-20138, and one disclosed in Japanese Patent Application Laid-Open No. 59-214748.
特開昭６０−２０１３８号公報に開示のものは、第７図
に示すように、ガラス繊維糸Ｇが通過する貫通孔５２を
穿設した導波管５３と、マイクロ波送信機５４と、マイ
クロ波受信機５５とを具備してなっており、ガラス繊維
糸中に異物が含まれているとき輪生じる受信マイクロ波
の波形変化を検知して欠陥を検出している。As shown in FIG. 7, the device disclosed in Japanese Patent Application Laid-Open No. 60-20138 includes a waveguide 53 having a through hole 52 through which the glass fiber thread G passes, a microwave transmitter 54, and a microwave transmitter 54. It is equipped with a wave receiver 55, and detects a defect by detecting a change in the waveform of the received microwave that occurs when a foreign substance is contained in the glass fiber yarn.
特開昭５９−２１４７４８号公報に開示のものは、第８
図に示すように、ガラス繊維糸Ｇに近接して設置された
電極６２．６２と、その電極６２゜６２間に高周波電界
を与える高周波電源６３と、光検出器６４とを具備して
なっており、ガラス繊維糸Ｇに導電性物質が含まれてい
るときに生じる高周波放電の発光を検知して欠陥を検出
している。The one disclosed in Japanese Patent Application Laid-open No. 59-214748 is
As shown in the figure, it is equipped with electrodes 62, 62 installed close to the glass fiber thread G, a high-frequency power source 63 that applies a high-frequency electric field between the electrodes 62, 62, and a photodetector 64. Defects are detected by detecting light emission of high-frequency discharge that occurs when the glass fiber thread G contains a conductive substance.
［発明が解決しようとする課題１
上記従来のガラス繊維の欠陥検査装置は、構成や取扱い
が複雑となる問題点がある。[Problem to be Solved by the Invention 1] The above-mentioned conventional glass fiber defect inspection apparatus has a problem that the structure and handling are complicated.
例えば第７図に示す装置５１では、数Ｇ１１ｚのマイク
ロ波を用いるため、構成要素が特殊なものとなる上に、
マイクロ波の漏洩防止なとの必要かある。For example, in the device 51 shown in FIG. 7, since microwaves of several G11z are used, the components are special, and
Is there a need to prevent microwave leakage?
また第８図に示す装置６１では、強い高周波電界を与え
つる高出力の高周波電源を要し、さらに、外来光の遮断
などが必要となる。Further, the device 61 shown in FIG. 8 requires a high-output high-frequency power source that provides a strong high-frequency electric field, and also requires blocking of external light.
そこで、この発明は、特殊な構成要素を必要とせず、取
扱いも容易なガラス繊維の欠陥検査装置を提供すること
を目的とする。Therefore, an object of the present invention is to provide a glass fiber defect inspection device that does not require special components and is easy to handle.
［課題を解決するための手段］
この発明のガラス繊維の欠陥検査装置は、ガラス繊維に
近接して設置される電極対と、その電極対で形成される
コンデンサを一部に含むか又はそのコンデンサと間接的
に結合されている発振回路と、前記コンデンサに生じる
電気的変化を検出する検出回路とを具備してなることを
構成上の特徴とするものである。[Means for Solving the Problems] The glass fiber defect inspection device of the present invention includes a pair of electrodes installed in close proximity to the glass fibers, and a capacitor formed by the pair of electrodes. The configuration is characterized in that it includes an oscillation circuit that is indirectly coupled to the capacitor, and a detection circuit that detects electrical changes occurring in the capacitor.
」１記構成において「発振回路」の周波数は、ＩＭＨｚ
〜数１０ＭＨｚが好ましく、さらにはＩＭＨｚ〜２０Ｍ
）Ｉｚが好ましい。” In the configuration described in item 1, the frequency of the “oscillation circuit” is IMHz.
~several 10 MHz is preferable, and more preferably IMHz ~ 20 MHz
) Iz is preferred.
また上記構成において［コンデンサに生じる電気的変化
」とは、コンデンサにおける高周波信号の振幅１周波数
、位相、波形の少なくとも一つの変化を意味するもので
ある。Furthermore, in the above configuration, "electrical change occurring in the capacitor" means a change in at least one of the amplitude, frequency, phase, and waveform of a high-frequency signal in the capacitor.
［作用］
ガラス繊維の欠陥の代表的なものはガラスモノフィラメ
ント（直径数μ）中に鉄、ニッケル等の金属の微小片（
直径１μ以下から数μ、長さ１市以下から数ｍ＋＊）が
混入するものであるが、このような欠陥のある部分が近
接したときと欠陥のない部分が近接したときとではコン
デンサのキャパシタンスが異なって（る。[Function] A typical defect in glass fiber is the presence of minute pieces of metals such as iron and nickel in glass monofilaments (several micrometers in diameter).
The capacitance of the capacitor differs between when a defective part is close to the capacitor and when a non-defective part is close to it. are different.
そこで、このコンデンサを発振回路の一部とすれば、発
振周波数が異なることとなる。また、このコンデンサを
発振回路の負荷として結合すれば、負荷の大きさが異な
ることとなる。Therefore, if this capacitor is used as part of an oscillation circuit, the oscillation frequency will be different. Furthermore, if this capacitor is coupled as a load of an oscillation circuit, the magnitude of the load will be different.
したがって、コンデンサに生じる電気的変化（振幅１周
波数変化など）を検出回路で検知すれば、ガラス繊維の
欠陥を検出することが出来る。Therefore, defects in the glass fiber can be detected by detecting electrical changes (such as changes in amplitude and frequency) occurring in the capacitor using a detection circuit.
［実施例］
以下、図に示す実施例によりこの発明を更に詳しく説明
する。なお、これによりこの発明が限定されるものでは
ない。[Example] Hereinafter, the present invention will be explained in more detail with reference to Examples shown in the drawings. Note that this invention is not limited to this.
第１図に示すこの発明の一実施例のガラス繊維の欠陥検
査装置１は、絶縁チューブ２と、その絶縁チューブ２に
巻き付けられた第１の検出用電極３ａと、その検出用電
極３ａから所定距離だけ隔てて前記絶縁チューブ２に巻
き付けられた第２の検出用電極３ｂと、それら検出用電
極３ａ、３ｂの対で形成される検出用コンデンサ３に並
列接続されたコイル４と、前記検出用コンデンサ３をそ
の一部として含む発振回路５と、その発振回路５の発振
周波数ｆを電圧Ｖに変換するｆ−Ｖ変換回路６と、その
ｆ−Ｖ変換回路６の出力電圧■の変化を検出する検出回
路７とを具備してなっている。A glass fiber defect inspection apparatus 1 according to an embodiment of the present invention shown in FIG. 1 includes an insulating tube 2, a first detection electrode 3a wound around the insulating tube 2, and A second detection electrode 3b wrapped around the insulating tube 2 at a distance apart, a coil 4 connected in parallel to the detection capacitor 3 formed by the pair of detection electrodes 3a and 3b, and the detection An oscillation circuit 5 including a capacitor 3 as a part thereof, an f-V conversion circuit 6 that converts the oscillation frequency f of the oscillation circuit 5 into a voltage V, and a change in the output voltage ■ of the f-V conversion circuit 6 is detected. It is equipped with a detection circuit 7 for detecting.
絶縁チューブ２はガラスモノフィラメントを数百本束ね
たガラス繊維糸Ｇ（太さ０． １〜１關）と接触、しな
い程度の内径（半径Ｒ）を有し仮に接触してもガラス繊
維糸Ｇを傷つけない素材のものである。例えば直径２關
程度のテフロンチューブである。その内部にガラス繊維
糸Ｇが速度Ｓで通、されている。The insulating tube 2 has an inner diameter (radius R) such that it does not come into contact with the glass fiber thread G (thickness 0.1 to 1 inch) made by bundling several hundred glass monofilaments, and even if it does come into contact with it, it will not touch the glass fiber thread G. It is made of non-damaging material. For example, it is a Teflon tube about 2 inches in diameter. A glass fiber thread G is threaded through it at a speed S.
検出用電極３ａ、３ｂは、銅パイプを所定の長さにカッ
トしたものであり、所定の間隔（距Ｍｄ）をあけて並設
しである。The detection electrodes 3a and 3b are made by cutting copper pipes to a predetermined length, and are arranged in parallel at a predetermined interval (distance Md).
検出用コンデンサ３とコイル４とは並列共振回路を形成
し、その共振周波数が発振回路５の発振周波数ｆとなる
工
ｆ−Ｖ変換回路６は人力周波数が高いときは低い出力電
圧を出力し、入力周波数が低いときは高い出力電圧を出
力する。The detection capacitor 3 and the coil 4 form a parallel resonant circuit, the resonant frequency of which is the oscillation frequency f of the oscillation circuit 5. The f-V conversion circuit 6 outputs a low output voltage when the human power frequency is high. Outputs a high output voltage when the input frequency is low.
検出回路７は、前記出力電圧■の大きさと、その大きさ
が変化する遷移時間と、変化後の一定の大きさが持続す
る持続時間とを検知し、これらから欠陥の有無と欠陥の
長さを判定して出力する。The detection circuit 7 detects the magnitude of the output voltage (2), the transition time during which the magnitude changes, and the duration during which the magnitude remains constant after the change, and from these detects the presence or absence of a defect and the length of the defect. Determine and output.
次に上記欠陥検査装置１の動作を説明する。Next, the operation of the defect inspection apparatus 1 will be explained.
ガラス繊維糸Ｇの欠陥のない部分か検出用コンデンサ３
の近傍を通過しているときの発振周波数をｆＯとすると
、ｆ−Ｖ変換回路６は前記発振周波数ｆｏに対応した出
力電圧■０を出力する。Capacitor 3 for detecting defect-free portion of glass fiber thread G
Let fO be the oscillation frequency when passing near the oscillation frequency fo, the fV conversion circuit 6 outputs an output voltage 0 corresponding to the oscillation frequency fo.
他方、例えば微小金属片を含んだ欠陥部分が検出用コン
デンサ３の近傍を通過すると、検出用コンデンサ３のキ
ャパシタンスが増加するので、発振周波数は例えばｆｌ
に下がり、ｆ−Ｖ変換回路６はその発振周波数ｆ１に対
応した出力電圧■１を出力する。ｆＯ＞ｆｌなので、Ｖ
Ｏ＜Ｖｌである。On the other hand, when a defective part containing, for example, a minute metal piece passes near the detection capacitor 3, the capacitance of the detection capacitor 3 increases, so the oscillation frequency becomes, for example, fl.
The f-V conversion circuit 6 outputs an output voltage 1 corresponding to the oscillation frequency f1. Since fO>fl, V
O<Vl.
欠陥部分が通過してしまうと、もとの発振周波数ｆｏに
戻り、ｆ−Ｖ変換回路６は出力電圧ＶＯを出力する。Once the defective portion has passed, the oscillation frequency returns to the original oscillation frequency fo, and the fV conversion circuit 6 outputs the output voltage VO.
第２図はこの出力電圧■の時間変化を示したものである
。FIG. 2 shows the time change of this output voltage (2).
検出回路７は、前記ｆ−Ｖ変換回路６の出力電圧ｖ１が
所定のレベル（例えば無視できる最大の欠陥部分が通過
したときの出力電圧ｖ１より僅かに高い電圧値を用いる
ことが出来る）以上であれば、欠陥検出信号を出力する
。また、前記ｆ−Ｖ変換回路６の出力電圧が７０〜７１
間で変化する遷移時間τＯおよび■１の持続時間τ１を
検知し、欠陥部分の長さを算出する。The detection circuit 7 detects that the output voltage v1 of the f-V conversion circuit 6 is equal to or higher than a predetermined level (for example, a voltage value slightly higher than the output voltage v1 when the largest negligible defective part has passed can be used). If there is, a defect detection signal is output. Further, the output voltage of the f-V conversion circuit 6 is 70 to 71
The length of the defective portion is calculated by detecting the transition time τO and the duration τ1 of ■1.
すなわち、第３図に示すように、ガラスモノフィラメン
トＧＯの通過速度をＳとしくそれはガラス繊維糸Ｇの通
過速度Ｓである）とし、検出用コンデンサ３の実効長さ
（充分小さな欠陥部分が通過するときのｆＯとτ１を得
ると（τ０＋τ１）×Ｓが実効長さとなる）をＷとし、
ガラスモノフィラメントＧｏに含まれる欠陥部分αの長
さをＤとするとき、
ｒｏ＜Ｗ／ｓならば、Ｄ＃ｒｏｘｓ
ｒＯ≧Ｗ／ｓならば、Ｄ＃（ｒＯ＋ｒｌ）Ｘｓで算出し
た欠陥部分の長さＤを出力する。That is, as shown in Fig. 3, the passing speed of the glass monofilament GO is S, which is the passing speed S of the glass fiber thread G), and the effective length of the detection capacitor 3 (a sufficiently small defective portion passes When fO and τ1 are obtained, (τ0 + τ1) x S becomes the effective length), and
When the length of the defective part α included in the glass monofilament Go is D, if ro<W/s, D#roxs If rO≧W/s, the length of the defective part calculated by Xs is D#(rO+rl) Outputs D.
１紀ガラス繊維の欠陥検査装置１の変形例としては、上
記検出回路７に代えて、ｆ−Ｖ変換回路６の出力電圧Ｖ
が所定のレベル未満ではＬを出力しそのレベル以」二で
はＨを出力するシュミットトリガ回路と■（の持続時間
Ｔを検知する計数回路とを設け、シュミットトリガ回路
からのＨ出力を欠陥検出信号として出力すると共に、欠
陥部分の長さＤを
Ｄ＝Ｔｘｓ−Ｗ
で算出し、て出力するものが挙げられる。As a modification of the primary glass fiber defect inspection device 1, the output voltage V of the fV conversion circuit 6 is replaced with the detection circuit 7.
A Schmitt trigger circuit that outputs L when the voltage is below a predetermined level and H when it exceeds that level and a counting circuit that detects the duration T of () are provided, and the H output from the Schmitt trigger circuit is used as a defect detection signal. In addition, the length D of the defective portion is calculated as D=Txs-W and outputted.
また、他の変形例としては、前記ｆ−Ｖ変換回路６の出
力電圧■１の大きさから欠陥部分の大きさをある程度判
定して（例えば数段階に評価して）出力するものが挙げ
られる。Another modification is one in which the size of the defective part is determined to some extent from the magnitude of the output voltage (1) of the f-V conversion circuit 6 (e.g., evaluated in several stages) and outputted. .
なお、ノイズを避けるために、検出用コンデンサ３の周
囲を金属ケースで覆ってシールドするのが好ましい。Note that in order to avoid noise, it is preferable to cover the detection capacitor 3 with a metal case for shielding.
また、検出精度を高めるために、検出用電極３ａ、３ｂ
の距離ｄを、
０、 ５市＜ｄ＜１０順（ζ２Ｄ）
とすると共に、絶縁チューブ２の半径Ｒを、Ｒ＜２ｄ
とするのが、好ましい。In addition, in order to improve the detection accuracy, the detection electrodes 3a, 3b
It is preferable to set the distance d of 0,5<d<10 (ζ2D) and set the radius R of the insulating tube 2 to R<2d.
次に第４図はこの発明の他の実施例のガラス繊維の欠陥
検査装置１１を示すものである。Next, FIG. 4 shows a glass fiber defect inspection apparatus 11 according to another embodiment of the present invention.
このガラス繊維の欠陥検査装置１１は、電極の構造と検
出回路の作動が上記欠陥検査装置１と異なっている。This glass fiber defect inspection device 11 is different from the defect inspection device 1 described above in the structure of the electrode and the operation of the detection circuit.
すなわち、絶縁チューブ２に３つの検出用電極３ａ、３
ｂ、３ｃを設け、両端の電極３ｂ、３ｃは接地側とし、
それら両端の電極３ｂ、３ｃと中央の電極３ａの間で検
出用コンデンサ１３を形成している。この電極構造によ
れば、両端の電極３ｂ、３ｃがシールド効果を持つため
、耐ノイズ性が改善される。That is, three detection electrodes 3a, 3 are provided in the insulating tube 2.
b and 3c are provided, and the electrodes 3b and 3c at both ends are on the ground side,
A detection capacitor 13 is formed between the electrodes 3b and 3c at both ends and the central electrode 3a. According to this electrode structure, since the electrodes 3b and 3c at both ends have a shielding effect, noise resistance is improved.
また、検出回路１７は、ｆ−Ｖ変換回路６の出力電圧■
が続いて２回変動することを確認してから欠陥検出信号
を出力するようになっている。電極３Ｃと３８の間で形
成されるコンデンサ部分と、電極３ａと３ｂの間で形成
されるコンデンサ部分の２箇所でガラス繊維糸Ｇの欠陥
部分を検出することになるから、真の欠陥のときはｆ−
Ｖ変換回路６の出力電圧■が続いて２回変動する。他方
、何らかの異常であれば、ｆ−Ｖ変換回路６の出力電圧
Ｖが続いて２回変動する確率は極めて低い。The detection circuit 17 also detects the output voltage of the f-V conversion circuit 6.
After confirming that the value fluctuates twice in succession, a defect detection signal is output. Since the defective portion of the glass fiber thread G is detected at two locations: the capacitor portion formed between electrodes 3C and 38, and the capacitor portion formed between electrodes 3a and 3b, it is possible to detect a true defect. is f-
The output voltage (■) of the V conversion circuit 6 fluctuates twice successively. On the other hand, if there is some abnormality, the probability that the output voltage V of the fV conversion circuit 6 will fluctuate twice in succession is extremely low.
従って、欠陥検出信号の信頼性を向上することが出来る
。Therefore, the reliability of the defect detection signal can be improved.
次に第５図はこの発明のさらに他の実施例のガラス繊維
の欠陥検査装置２１を示すものである。Next, FIG. 5 shows a glass fiber defect inspection apparatus 21 according to still another embodiment of the present invention.
このガラス繊維の欠陥検査装置２１は、絶縁チューブ２
と、その絶縁チューブ２の周囲に設けられた電極３ａ、
３ｂ、３ｃ、３ｄ、３ｅと、前記電極 ３ａ、３ｃの間
および電極３ａ、３ｂの間に形成されるコンデンサ２３
に並列接続されたコイル２４と、前記コンデンサ２３お
よびコイル２４をその一部として含む発振回路２５と、
前記コイル２４に磁束Φを介して結合されると共に前記
電極３ｂ、３ｄの間および電極３ｄ、３ｅの間に形成さ
れるコンデンサ３３に並列接続されたたコイル３４と、
そのコイル３４の誘起電圧の変化を検出する検出回路３
７とを具備してなっている。This glass fiber defect inspection device 21 includes an insulating tube 2
and an electrode 3a provided around the insulating tube 2,
3b, 3c, 3d, 3e and a capacitor 23 formed between the electrodes 3a, 3c and between the electrodes 3a, 3b.
an oscillation circuit 25 including the capacitor 23 and the coil 24 as a part thereof;
a coil 34 coupled to the coil 24 via magnetic flux Φ and connected in parallel to a capacitor 33 formed between the electrodes 3b, 3d and between the electrodes 3d, 3e;
Detection circuit 3 that detects changes in the induced voltage of the coil 34
It is equipped with 7.
コイル２４．３４は重ねて巻回されてもよいし、同一ボ
ビンに近接して並べて巻回されてもよい。The coils 24, 34 may be wound one on top of the other, or may be wound in close proximity to each other on the same bobbin.
コンデンサ３３とコイル３４とは並列共振回路を構成し
、ガラス繊維糸Ｇの欠陥のない部分がコンデンサ３３の
近傍を通過しているときの共振周波数をｆＯとすると、
コイル２４から与えられる磁束の周波数ｆとコイル３４
の誘起電圧Ｅの関係は第６図に示すようになる。The capacitor 33 and the coil 34 constitute a parallel resonant circuit, and if the resonant frequency when the defect-free portion of the glass fiber thread G passes near the capacitor 33 is fO, then
The frequency f of the magnetic flux given from the coil 24 and the coil 34
The relationship between the induced voltage E and the voltage E is as shown in FIG.
このため、ガラス繊維糸Ｇの欠陥のない部分がコンデン
サ２３の近傍を通過しているときの発振回路２５の発振
周波数をｆｏとすると、ガラス繊維糸Ｇの欠陥のない部
分がコンデンサ２３および３３の近傍を通過していると
きのフィル３４の誘起電圧はＥＯとなる。Therefore, if the oscillation frequency of the oscillation circuit 25 when the defect-free portion of the glass fiber thread G passes near the capacitor 23 is fo, then the defect-free portion of the glass fiber thread G passes near the capacitors 23 and 33. The induced voltage in the fill 34 when passing nearby is EO.
欠陥部分がコンデンサ２３の近傍を通過すると、コンデ
ンサ２３のキャパシタンスが変化するので、発振周波数
ｆが変化する。すると、第６図から理解されるようにコ
イル３４の誘起電圧Ｅは急激に低くなる。When the defective portion passes near the capacitor 23, the capacitance of the capacitor 23 changes, and therefore the oscillation frequency f changes. Then, as understood from FIG. 6, the induced voltage E in the coil 34 suddenly decreases.
したがって、検出回路３７から欠陥検出信号が出力され
ることとなる。Therefore, the detection circuit 37 outputs a defect detection signal.
上記欠陥検出装置２１では、発振周波数ｆがわ゛ずかに
変化しても誘起電圧Ｅが大きく変化するので、小さな欠
陥でも高感度に検出することが出来る。In the defect detection device 21, even if the oscillation frequency f changes slightly, the induced voltage E changes greatly, so even small defects can be detected with high sensitivity.
なお、パイプ状の電極をガラス繊維糸Ｇの進行方向に並
べた上記実施例の電極構造以外に、断面Ｕ字状の電極を
ガラス繊維糸Ｇの進行方向に並べた電極構造としてもよ
いし、断面Ｕ字状の電極をガラス繊維糸Ｇを挟んで対向
させた電極構造としてもよい。In addition to the electrode structure of the above embodiment in which pipe-shaped electrodes are arranged in the direction of movement of the glass fiber thread G, an electrode structure in which electrodes with a U-shaped cross section are arranged in the direction of movement of the glass fiber thread G may be used. An electrode structure may be used in which electrodes having a U-shaped cross section are opposed to each other with the glass fiber thread G interposed therebetween.
また、ガラス繊維布の場合は平板状電極をガラス繊維布
に対向させ且つその進行方向に並べた電極構造とすれば
よく、好ましくはガラス繊維布を挟んで更に同様の平板
状電極を対向させた構造とすればよい。In addition, in the case of glass fiber cloth, the electrode structure may be such that flat electrodes are arranged opposite to the glass fiber cloth and arranged in the direction of movement of the cloth. It may be a structure.
［発明の効果］
この発明のガラス繊維の欠陥検出装置によれば、ＧＨｚ
オーダーのマイクロ波や高出力の高周波電源を必要とし
ないから、構成も取扱いも簡単になり、容易にガラス繊
維の欠陥を検出できるようになる。[Effect of the invention] According to the glass fiber defect detection device of the present invention, GHz
Since custom-made microwaves and high-power radio frequency power sources are not required, the structure and handling are simple, and defects in glass fibers can be easily detected.
第１図はこの発明の一実施例のガラス繊維の欠陥検出装
置のブロック図、第２図は第１図に示す欠陥検出装置に
おける電圧の時間変化を示すグラフ、第３図は検出用コ
イルの実効長さと欠陥部分の長さの関係を示す概念図、
第４図はこの発明の他の実施例のガラス繊維の欠陥検出
装置のブロック図、第５図はこの発明のさらに他の実施
例のガラス繊維の欠陥検出装置のブロック図、第６図は
第５図に示す欠陥検出装置における誘起電圧と周波数の
関係を示すグラフ、第７図は従来のガラス繊維の欠陥検
出装置の一例のブロック図、第８図は従来のガラス繊維
の欠陥検出装置の他の一例のブロック図である。
（符号の説明）
１．１１．２１・・・ガラス繊維の欠陥検出装置２・・
・絶縁チューブ
３８〜３ｅ・・・電極
３．１３，２３．３３・・・コンデンサ５．２５・・・
発振回路
７．１７．３７・・・検出回路
Ｇ・・・ガラス繊維糸
ＧＯ・・・ガラスモノフィラメント
α・・・欠陥。
第
図
第
図
第
図
Ｇ。
Ｂ
第
図
第
図
Ｏ
−一−−〉FIG. 1 is a block diagram of a glass fiber defect detection device according to an embodiment of the present invention, FIG. 2 is a graph showing the voltage change over time in the defect detection device shown in FIG. 1, and FIG. 3 is a graph of the detection coil. A conceptual diagram showing the relationship between the effective length and the length of the defective part,
FIG. 4 is a block diagram of a glass fiber defect detection apparatus according to another embodiment of the present invention, FIG. 5 is a block diagram of a glass fiber defect detection apparatus according to still another embodiment of the present invention, and FIG. Fig. 5 is a graph showing the relationship between induced voltage and frequency in a defect detection device, Fig. 7 is a block diagram of an example of a conventional glass fiber defect detection device, and Fig. 8 is a graph showing a conventional glass fiber defect detection device and other examples. It is a block diagram of an example. (Explanation of symbols) 1.11.21...Glass fiber defect detection device 2...
- Insulating tubes 38 to 3e... Electrodes 3.13, 23.33... Capacitors 5.25...
Oscillation circuit 7.17.37...Detection circuit G...Glass fiber thread GO...Glass monofilament α...Defect. Figure Figure Figure G. B Figure Figure O -1-->
Claims (1)
極対で形成されるコンデンサを一部に含むか又はそのコ
ンデンサと間接的に結合されている発振回路と、前記コ
ンデンサに生じる電気的変化を検出する検出回路とを具
備してなることを特徴とするガラス繊維の欠陥検査装置
。1. An electrode pair installed in close proximity to the glass fiber, an oscillation circuit that partially includes a capacitor formed by the electrode pair or is indirectly coupled to the capacitor, and an electric current generated in the capacitor. 1. A glass fiber defect inspection device comprising a detection circuit for detecting a change.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1061399A JPH02240558A (en) | 1989-03-14 | 1989-03-14 | Defect inspecting device for glass fiber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1061399A JPH02240558A (en) | 1989-03-14 | 1989-03-14 | Defect inspecting device for glass fiber |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02240558A true JPH02240558A (en) | 1990-09-25 |
Family
ID=13170032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1061399A Pending JPH02240558A (en) | 1989-03-14 | 1989-03-14 | Defect inspecting device for glass fiber |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02240558A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003535335A (en) * | 2000-05-31 | 2003-11-25 | ツエルヴエーゲル・ルーヴア・アクチエンゲゼルシヤフト | METHOD AND APPARATUS FOR CONFIRMING CONTAMINANTS IN FILT PRODUCTS LONGLY MOVED |
| JP2011227052A (en) * | 2010-04-02 | 2011-11-10 | Ogihara Mfg Co Ltd | Coiled capacitor and air bubble detecting device using the same |
-
1989
- 1989-03-14 JP JP1061399A patent/JPH02240558A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003535335A (en) * | 2000-05-31 | 2003-11-25 | ツエルヴエーゲル・ルーヴア・アクチエンゲゼルシヤフト | METHOD AND APPARATUS FOR CONFIRMING CONTAMINANTS IN FILT PRODUCTS LONGLY MOVED |
| JP4811813B2 (en) * | 2000-05-31 | 2011-11-09 | ウステル・テヒノロジーズ・アクチエンゲゼルシヤフト | Method and apparatus for confirming contaminants in filamentary product moved in the longitudinal direction |
| JP2011227052A (en) * | 2010-04-02 | 2011-11-10 | Ogihara Mfg Co Ltd | Coiled capacitor and air bubble detecting device using the same |
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