JPH02199690A - Optical disk device - Google Patents
Optical disk deviceInfo
- Publication number
- JPH02199690A JPH02199690A JP2061189A JP2061189A JPH02199690A JP H02199690 A JPH02199690 A JP H02199690A JP 2061189 A JP2061189 A JP 2061189A JP 2061189 A JP2061189 A JP 2061189A JP H02199690 A JPH02199690 A JP H02199690A
- Authority
- JP
- Japan
- Prior art keywords
- optical disk
- output
- amplifier
- temperature detector
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 45
- 238000001816 cooling Methods 0.000 abstract description 16
- 239000000428 dust Substances 0.000 abstract description 4
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は光ディスク装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to an optical disc device.
最近、市場にあられれた光ディスク装置は、従来の磁気
ディスク装置に比して、−桁以上の面記録密度を実現し
ており、又、媒体の可換性を利用して、イメージデータ
の保存用、磁気ディスク装置に対するバックアップ用と
して使われ出している。この光ディスク装置では、レー
ザダイオードのレーザ光を光ディスク媒体上において、
1μm程度の微小スポットに絞るための対物レンズを使
用している。この対物レンズへのゴミ、ホコリ等の付着
は、光ディスク媒体上への情報の書込み品質に大きな影
響を与える。一方、光ディスク装置の中には、ロジック
部、リードライト回路部、サーボ回路部、サーボアンプ
部等の発熱源を有しており、これら回路部の温度上昇を
規定以下に押さえるためには、成る程度の冷却風が必要
である。Optical disk devices that have recently appeared on the market have achieved areal recording densities that are orders of magnitude higher than conventional magnetic disk devices. It is beginning to be used for backup purposes and magnetic disk drives. In this optical disc device, a laser beam from a laser diode is directed onto an optical disc medium.
An objective lens is used to narrow down the image to a minute spot of about 1 μm. The attachment of dirt, dust, etc. to the objective lens greatly affects the quality of writing information onto the optical disk medium. On the other hand, optical disk devices have heat sources such as the logic section, read/write circuit section, servo circuit section, and servo amplifier section, and in order to keep the temperature rise of these circuit sections below the specified level, A certain amount of cooling air is required.
このファンによる冷却風量は、光ディスク装置の最悪動
作モード、つまりシーク動作時の最悪デユーティ時のキ
ャリッジ駆動部等の発熱量を見込んで、必要風量が決定
されていた。The required amount of cooling air by this fan has been determined by taking into account the amount of heat generated by the carriage drive unit, etc. at the worst operating mode of the optical disk device, that is, the worst duty during a seek operation.
上述した従来の光ディスク装置では、筐体内の空冷のた
めのファンの回転数が装置の動作モード(特にシークモ
ード)の最悪デユーティ時を想定した回転数となってい
るため、装置が非動作時、例えば光ディスク装置に光デ
ィスク媒体が投入されていない時でも、又光ディスク装
置に光ディスク媒体が投入されているが、上位制御装置
からデータアクセスがない、いわゆる待機時においても
、余分な冷却mJlが送られていた。In the above-mentioned conventional optical disk device, the rotation speed of the fan for air cooling inside the housing is the rotation speed assuming the worst duty of the device's operating mode (especially seek mode), so when the device is not operating, For example, extra cooling mJl is not sent even when no optical disk medium is inserted into the optical disk device, or when an optical disk medium is inserted into the optical disk device but there is no data access from the host control device, so-called standby mode. Ta.
このなめ、冷却風量内に含まれるゴミ、ホコリ等が光学
ヘッド内の対物レンズに付着し、これによって、光ディ
スク媒体上に情報を記録する際の記録パワーの低下を招
き、十分な書込品質が確保できないという欠点があった
。Dirt, dust, etc. contained in this slick and cooling air volume adhere to the objective lens in the optical head, which causes a decrease in the recording power when recording information on the optical disk medium, resulting in insufficient writing quality. The drawback was that it could not be secured.
本発明の目的は上述した対物レンズの汚れを少なくした
改良された光ディスク装置を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide an improved optical disc device in which the objective lens is less contaminated.
前記目的を達成するため、本発明はレーザダイオードか
ら発するレーザ光を微小に絞って、光ディスク媒体上に
情報の記録・再生を行う光ディスク装置において、光学
ヘッドを搭載し、光ディスク媒体上への任意のトラック
に移動可能な光ディスク駆動amと、上位制御装置から
の動作指令に応じて前記光ディスク駆動機構を制御する
光ディスク制御回路と、前記光ディスク制御回路の出力
を電力増幅し、前記光ディスク駆動機構を駆動するため
の電力増幅器と、前記電力増幅器の駆動素子の温度を検
出する温度検出器と、前記温度検出器の出力を増幅する
増幅器と、前記増幅器の出力に応じて回転数が変化する
ファンとを有するものである。In order to achieve the above object, the present invention provides an optical disc device that records and reproduces information on an optical disc medium by focusing a laser beam emitted from a laser diode into a very small area. an optical disk drive am movable to a track; an optical disk control circuit that controls the optical disk drive mechanism according to an operation command from a host control device; and a power amplification of the output of the optical disk control circuit to drive the optical disk drive mechanism. a temperature detector that detects the temperature of a drive element of the power amplifier, an amplifier that amplifies the output of the temperature detector, and a fan whose rotation speed changes according to the output of the amplifier. It is something.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の実施例を示すブロック図である。FIG. 1 is a block diagram showing an embodiment of the present invention.
図において、光学ヘッドを搭載し、光ディスク媒体上を
半径方向に移動可能な光ディスク駆動機構2は、光ディ
スク制御回路1の出力を電力増幅する電力増幅器3の出
力によって駆動Mfnされる。In the figure, an optical disk drive mechanism 2 equipped with an optical head and capable of moving in the radial direction on an optical disk medium is driven Mfn by the output of a power amplifier 3 that amplifies the output of an optical disk control circuit 1.
この電力増幅器3の巾の駆動素子4上には温度検出器(
又はヒートシンク)5が設けられており、この温度検出
器5の出力は増幅器6によって適度に増幅され、その出
力電圧に基いてファン7を電圧駆動する。A temperature detector (
The output of the temperature detector 5 is suitably amplified by an amplifier 6, and a fan 7 is driven based on the output voltage.
これらの各要素は一つの筐体8の中に適切に実装配置さ
れている。さて、前記構成から判るように、筐体内の各
要素からの発熱源の冷却は、電圧可変なファン7の冷却
風量によって行われる。この風量(つまりファンの回転
数)の設計の際には、光ディスク駆動機構2、具体的に
はキャリッジ可動部の最悪シーク動作デユーティ時のキ
ャリッジコイル及びパワーアンプ部の発熱量に相応した
冷却風量を必要とする1本発明の実施例においては、電
力増幅器3の中の駆動素子4上に取り付けられた温度検
出器5の出力を検出し、この温度検出器5の出力を増幅
器6によって増幅することによって、DCファン7の印
加電圧を変えることによってファン7の回転数が変えら
れるよう構成されている。もちろん、温度検出器5の取
り付けは駆動素子4が取付けられているヒートシンク上
に設けられていても良い。Each of these elements is appropriately mounted and arranged in one housing 8. Now, as can be seen from the above configuration, cooling of the heat generation sources from each element within the housing is performed by the cooling air volume of the fan 7 whose voltage is variable. When designing this air volume (that is, fan rotation speed), the cooling air volume should be determined in accordance with the amount of heat generated by the optical disk drive mechanism 2, specifically the carriage coil and power amplifier unit during the worst seek operation duty of the carriage movable part. In one embodiment of the present invention, the output of a temperature sensor 5 mounted on the drive element 4 in the power amplifier 3 is detected, and the output of the temperature sensor 5 is amplified by an amplifier 6. Accordingly, the rotation speed of the fan 7 can be changed by changing the voltage applied to the DC fan 7. Of course, the temperature detector 5 may be mounted on the heat sink to which the drive element 4 is mounted.
以上説明したように本発明は光ディスク駆動装置の主な
発熱源であるキャリッジ駆動用パワーアンプのヒートシ
ンクの温度上昇を測定するための温度検出器を設け、こ
の出力に応じて冷却用ファンの駆動電圧を制御し、激し
いシーク動作の繰り返しによるパワーアンプのヒートシ
ンクの温度上昇に相応して、冷却ファンの回転数を上昇
させて冷却風を増やし、又、シーク動作が少ない場合に
は、つまり、パワーアンプのヒートシンクの温度上昇が
少ない時には、ファン回転数を下げ、これによって冷却
風量も減らす。As explained above, the present invention provides a temperature detector for measuring the temperature rise of the heat sink of the carriage drive power amplifier, which is the main heat source of the optical disk drive, and adjusts the drive voltage of the cooling fan according to the output of the temperature detector. In response to the rise in temperature of the heat sink of the power amplifier due to repeated intense seek operations, the number of revolutions of the cooling fan is increased to increase the cooling air. When the temperature rise of the heat sink is small, the fan rotation speed is lowered, thereby reducing the amount of cooling air.
このように必要冷却風量を細かく制御することによって
、冷却風量に含まれるゴミ、ホコリによる対物レンズの
汚れの進行を少なくし、これに起因する障害発生頻度を
少なくできるという効果がある。By finely controlling the required amount of cooling air in this manner, it is possible to reduce the progress of staining of the objective lens due to dirt and dust contained in the amount of cooling air, and to reduce the frequency of failures caused by this.
第1図は本発明の一実施例を示すブロック図である。 1・・・光ディスク制御回路 2・・・光ディスク駆動機構 3・・・電力増幅器 FIG. 1 is a block diagram showing one embodiment of the present invention. 1... Optical disc control circuit 2...Optical disk drive mechanism 3...Power amplifier
Claims (1)
って、光ディスク媒体上に情報の記録・再生を行う光デ
ィスク装置において、光学ヘッドを搭載し、光ディスク
媒体上への任意のトラックに移動可能な光ディスク駆動
機構と、上位制御装置からの動作指令に応じて前記光デ
ィスク駆動機構を制御する光ディスク制御回路と、前記
光ディスク制御回路の出力を電力増幅し、前記光ディス
ク駆動機構を駆動するための電力増幅器と、前記電力増
幅器の駆動素子の温度を検出する温度検出器と、前記温
度検出器の出力を増幅する増幅器と、前記増幅器の出力
に応じて回転数が変化するファンとを有することを特徴
とする光ディスク装置。(1) In an optical disk device that records and reproduces information on an optical disk medium by narrowing the laser light emitted from a laser diode, an optical disk drive is equipped with an optical head and can be moved to any track on the optical disk medium. an optical disc control circuit for controlling the optical disc drive mechanism in accordance with an operation command from a host control device; a power amplifier for power amplifying the output of the optical disc control circuit and driving the optical disc drive mechanism; An optical disk device comprising: a temperature detector that detects the temperature of a driving element of a power amplifier; an amplifier that amplifies the output of the temperature detector; and a fan whose rotation speed changes according to the output of the amplifier. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2061189A JPH02199690A (en) | 1989-01-30 | 1989-01-30 | Optical disk device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2061189A JPH02199690A (en) | 1989-01-30 | 1989-01-30 | Optical disk device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02199690A true JPH02199690A (en) | 1990-08-08 |
Family
ID=12032059
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2061189A Pending JPH02199690A (en) | 1989-01-30 | 1989-01-30 | Optical disk device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02199690A (en) |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8964361B2 (en) | 2010-07-21 | 2015-02-24 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
US9779780B2 (en) | 2010-06-17 | 2017-10-03 | Teradyne, Inc. | Damping vibrations within storage device testing systems |
US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
-
1989
- 1989-01-30 JP JP2061189A patent/JPH02199690A/en active Pending
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9779780B2 (en) | 2010-06-17 | 2017-10-03 | Teradyne, Inc. | Damping vibrations within storage device testing systems |
US8964361B2 (en) | 2010-07-21 | 2015-02-24 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
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