JPH02190813A - Method and device for adjusting horizontality of sample container - Google Patents

Method and device for adjusting horizontality of sample container

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Publication number
JPH02190813A
JPH02190813A JP975989A JP975989A JPH02190813A JP H02190813 A JPH02190813 A JP H02190813A JP 975989 A JP975989 A JP 975989A JP 975989 A JP975989 A JP 975989A JP H02190813 A JPH02190813 A JP H02190813A
Authority
JP
Japan
Prior art keywords
sample
pedestal
microscope
points
sample container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP975989A
Other languages
Japanese (ja)
Inventor
Sei Murakami
聖 村上
Masao Takai
高井 正生
Nobuo Kimura
信夫 木村
Yachiyo Iwakiri
岩切 八千代
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP975989A priority Critical patent/JPH02190813A/en
Publication of JPH02190813A publication Critical patent/JPH02190813A/en
Pending legal-status Critical Current

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  • Apparatus Associated With Microorganisms And Enzymes (AREA)

Abstract

PURPOSE:To facilitate the horizontal adjustment of a sample container being simplified in structure by providing one piece of supporting point, and two pieces of supporting points which pass through the supporting point, placed on straight lines being orthogonal to each other and can be adjusted upward and downward, on a plate of a rack base. CONSTITUTION:A sample base is constituted of a sample base body 5, and a sample base receiver 6 inserted between an XY stage of a microscope and the sample base body 5, and supported by total three points of a leg 7 and two pieces of adjusting screws 4b, 4c against the sample base body 5 and the sample base receiver 6. That is, it is supported so as to form a right angled triangle by three points of a fixed supporting point 7 and movable supporting points. In such a way, a mutual interference of two points of adjustment use supporting points 4b, 4c is eliminated and levelness of the rack base can be adjusted easily, and also, the structure can be simplified by holding the center of gravity in the right angled triangle formed in the supporting points even after a sample container is loaded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は顕微鏡用試料台の水平調節要領に係り、特に試
料面の広い範囲で対物レンズとの作動距離を一定に保持
し、かつ、簡単な構造で容易に水平調整が可能な方法及
び装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for horizontally adjusting a sample stage for a microscope, and in particular, a method for maintaining a constant working distance with an objective lens over a wide range of the sample surface, and a method for easily adjusting the level. The present invention relates to a method and apparatus that allow easy horizontal adjustment with a simple structure.

〔従来の技術〕[Conventional technology]

従来の顕微鏡用の試料台は、試料台が水平面というだけ
で、各試料の広い範囲で試料と対物レンズとの作動距離
を一定にするための機構を有していないか、あるいはこ
の機能を有していても第5図に示すように顕微鏡のステ
ージに4点支持の試料台を設け、試料面が対物レンズに
対し水平になるように4個の脚の長さを調整していた。
Conventional sample stands for microscopes only have a horizontal sample stand, but either do not have a mechanism to keep the working distance between the sample and objective lens constant over a wide range of each sample, or do not have this function. However, as shown in FIG. 5, a four-point sample stand was installed on the microscope stage, and the lengths of the four legs were adjusted so that the sample surface was parallel to the objective lens.

すなわち、第5図に示すように空孔1を有する試料台2
に試料3を載せて試料台2をm整する場合、任意の基準
点、たとえばA点に対物レンズの焦点を合わせ、その後
、顕微鏡のXYステージを移動して他の点、たとえばB
点でも焦点が合うように4bの調整ねじを調整していた
。しかし、第6図に示すように調整ねじ4bを調整する
と、4aの調整ねじが支点になるのでA点の焦点がずれ
る。そのため再びA点での焦点合わせが必要である。
That is, as shown in FIG.
When aligning the sample stage 2 with the sample 3 placed on it, focus the objective lens on an arbitrary reference point, such as point A, and then move the XY stage of the microscope to focus on another point, such as point B.
I adjusted the adjustment screw 4b so that even the dots could be in focus. However, when adjusting the adjusting screw 4b as shown in FIG. 6, the adjusting screw 4a becomes the fulcrum, and the focus of point A is shifted. Therefore, focusing at point A is required again.

この作業を繰り返せば、徐々に対物レンズに対して水平
面が出てくるが調整に非常に多畷の時間を費していた。
If this process is repeated, a horizontal plane will gradually appear relative to the objective lens, but the adjustment takes a lot of time.

上記はX方向に対してであるが同様な調整がX方向に対
しても必要であり、また支持点が4点であるため逐次繰
り返しの調整が必要であった。
Although the above is for the X direction, a similar adjustment is also required for the X direction, and since there are four support points, repeated adjustments are required.

また、レーザ光の照射装置としてレーザ光の特徴を生か
し、すく゛れた操作性を備えた方法として、特公昭62
−7837号に記載のような生細胞レーザ穿孔装置があ
る。この方法はパルスモータでX、Y2方向に水平自動
可能とした顕微鏡試料台上に搭載した試料容器内の生細
胞に対物レンズを通過したレーザ光を集光させることに
より、生細胞に穿孔等の加工を行うものである。この加
工を行うにあたりては、ライトベンでモニタテレビに映
し出された生細胞像上の任意の位置を指示することによ
り特定の位置を1個ずつ加工してい曵方法と、試料台を
X、  X方向に自動移動させながらレーザ光を連続的
に照射する方法とがある。
In addition, as a laser beam irradiation device that takes advantage of the characteristics of laser light and has excellent operability, the
There are live cell laser perforation devices such as those described in US Pat. No. 7,837. This method uses a pulse motor to focus a laser beam that has passed through an objective lens on living cells in a sample container mounted on a microscope sample stage that can be horizontally moved horizontally in the X and Y directions. It is used for processing. To carry out this processing, we use a light ben to specify any position on the live cell image displayed on a monitor TV, process each specific position one by one, and move the sample stage in the X and X directions. There is a method of continuously irradiating laser light while automatically moving the target.

〔発明が解決しようとする副題〕[Sub-problem to be solved by the invention]

上記従来技術は試料の水平度の調節に関して配慮がされ
ておらず、生細胞を収納する容器にガラス製の物が多く
使用されるため、容器の加工精度をあまり高くすること
ができず、試料台上に搭載した際に加工面が水平になら
ない。また、試料台をX、X方向に水平移動させると、
レーザ光の焦点が生細胞の上又は下方へずれてしまう欠
点があり、特に試料台をX、X方向に移動させなからレ
ーザ光を連続的に照射する方法においては、レーザ光の
焦点ずれを手動で調節しなければならないという欠点が
あった。
The above conventional technology does not take into account the leveling of the sample, and glass containers are often used to store living cells, so the processing accuracy of the container cannot be very high. The machined surface is not level when mounted on the table. Also, when the sample stage is moved horizontally in the X and X directions,
There is a drawback that the focus of the laser beam shifts to above or below living cells, and in particular, in the method of continuously irradiating the laser beam without moving the sample stage in the X and X directions, it is difficult to prevent the focus shift of the laser beam The drawback was that it had to be adjusted manually.

さらに、加工面の傾きを調整するためのゴニオステージ
等の一般的な調節機構は、厚みがあるため顕微鏡の対物
レンズと試料台との間の距離や、照明用コンデンサの焦
点距離等の関係から取り付けることができなかった。
Furthermore, general adjustment mechanisms such as a goniometer stage for adjusting the inclination of the machined surface are thick and have to be adjusted due to the distance between the microscope objective lens and the sample stage, the focal length of the illumination condenser, etc. I couldn't install it.

本発明の目的は簡略化した構造で安価な架台を構成し、
かつ、試料容器の水平調節を容易にする方法及び装置を
提供することにある。
The purpose of the present invention is to construct an inexpensive frame with a simplified structure,
Another object of the present invention is to provide a method and apparatus that facilitate horizontal adjustment of a sample container.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的を達成するために平板状の架台上に試料容器を
搭載し、平板を1個の固定支持点と、2個の調節可能な
支持点とで支持し、該調節可能な支持点を調整すること
により、試料容器の水平調節が達成される。
In order to achieve the above purpose, a sample container is mounted on a flat plate-shaped pedestal, the flat plate is supported by one fixed support point and two adjustable support points, and the adjustable support points are adjusted. By doing so, horizontal adjustment of the sample container is achieved.

さらに詳述すれば、試料台本体の支点の位置を対物レン
ズの光軸上近傍に配設し、かつ、その位置で試料面も観
察できるように該支点を細い脚で構成すると共に、調整
を容易にするため3点支持構造とし支点以外の2点は、
X方向とX方向とで独立に調整ができるように支点を原
点とするX軸及びY軸上に1個ずつ配置することにより
、達成される。
More specifically, the fulcrum of the sample stage body is located close to the optical axis of the objective lens, and the fulcrum is constructed with thin legs so that the sample surface can also be observed at that position. To make it easier, we have a three-point support structure, and the two points other than the fulcrum are:
This is achieved by arranging one each on the X-axis and the Y-axis with the fulcrum as the origin so that adjustment can be made independently in the X-direction and the X-direction.

〔作  用〕[For production]

対物レンズの光軸上近傍に位置する脚は、顕微鏡の照明
光を遮ぎらない材質の試料台受に保持され、かつ、脚も
照明光の一部しか遮ぎらないので、対物レンズで試料面
の観察ができる。
The legs located near the optical axis of the objective lens are held in a sample holder made of a material that does not block the illumination light of the microscope, and since the legs only partially block the illumination light, the objective lens can be observed.

また試料台本体の3点支持点の内上記の脚以外の2点は
上記の脚の交点を原点とする顕微鏡のXYステージと同
じ座標系のX軸上およびY軸上に位置するため、試料の
水平面の調整がX方向とX方向とで独立になり上記の脚
の支点で試料面に焦点合せなした後、X方向、X方向の
各1回の調整をすれば対物レンズの光軸に対する試料の
水平面出しが可能になる。
In addition, of the three supporting points on the sample stage body, two points other than the above-mentioned legs are located on the X-axis and Y-axis of the same coordinate system as the XY stage of the microscope, whose origin is the intersection of the above-mentioned legs. Adjustment of the horizontal plane becomes independent in the X direction and the It becomes possible to expose the sample horizontally.

即ち、固定支持点と、可動支持点との3点で直角三角形
を形成するように支持するので調節用支持点2点の相互
干渉をなくして架台の水平度が容易に調整できる。また
、試料容器を搭載後も重心を支持点内で形成される直角
三角形内におさめることにより構造が簡略化できる。
That is, since the fixed support point and the movable support point are supported so as to form a right triangle, mutual interference between the two adjustment support points is eliminated, and the horizontality of the pedestal can be easily adjusted. Further, even after the sample container is mounted, the structure can be simplified by keeping the center of gravity within the right triangle formed within the support point.

〔実 施 例〕〔Example〕

以下、本発明の一実施例を第1図、第2図により説明す
る。
An embodiment of the present invention will be described below with reference to FIGS. 1 and 2.

図において、試料台は試料台本体5と、顕微鏡のXYス
テージ13と試料台本体50間に入れる試料台受6より
構成され、試料台本体5と試料台受6に対し、7の脚と
4b、4Cの2個の調整ねじの計3Aで支持される。
In the figure, the sample stand consists of a sample stand main body 5 and a sample stand holder 6 inserted between the XY stage 13 of the microscope and the sample stand main body 50. , 4C, for a total of 3A.

試料台本体5には試料を顕微鏡の透過照明光で照明する
ための空孔1があり、8の試料ビンに保持された試料3
の観察面は二の空孔1の中央部−こ設置される。脚7は
先端が鋭利な形状で、この先端と試料台受6との接点が
支点dになる。
The sample stage main body 5 has a hole 1 for illuminating the sample with the transmitted illumination light of the microscope, and the sample 3 held in the sample bottle 8
The observation surface is placed at the center of the second hole 1. The leg 7 has a sharp tip, and the point of contact between this tip and the sample pedestal 6 serves as a fulcrum d.

li整ねじ4bおよび4Cは第1図に示すように支点a
を原点とし、顕微鏡のXYステージ13と同じ座標系の
X軸上およびY軸上に位置する。試料台本体5には試料
ビン8を保持するため、板ばね9を有する試料ホルダl
Oが設置されており、これらを総合した重心は、支点a
と2個の調整ねし4b、4cによる3点支持が可能なよ
うに、この3点で形成される三角形内にある。
The setting screws 4b and 4C are set at the fulcrum a as shown in FIG.
is the origin, and is located on the X-axis and Y-axis of the same coordinate system as the XY stage 13 of the microscope. The sample stage main body 5 includes a sample holder l having a leaf spring 9 to hold the sample bottle 8.
O is installed, and the combined center of gravity of these is the fulcrum a
It is located within a triangle formed by these three points so that it can be supported at three points by the two adjustment screws 4b and 4c.

次に、試料台受6について述べる。Next, the sample holder 6 will be described.

試料台受6は顕微鏡の透過照明を可能にするため透明ア
クリルあるいは透明ガラス製である。試料台受6の上面
およびその形状は試料台本体5の調整ねじ4b、4cを
回す際、試料台本体5と試料台受6と顕微鏡のXYステ
ージ13との間がずれないように以下の配慮がなされて
いる。すなわち、試料台受6の形状は顕微鏡のXYステ
ージ13上のクレンメル11で保持可能なような大きさ
と矩形状の形状をなす。また試料台受6の上面にはl!
1整ねじ4b、4cの位置に第2図に示すような窪みが
あり、試料台本体5をこの2点で保持する。
The sample holder 6 is made of transparent acrylic or transparent glass to enable transmitted illumination of the microscope. The upper surface and shape of the sample pedestal holder 6 should be designed with the following considerations in place so that when turning the adjustment screws 4b and 4c of the sample pedestal body 5, there is no misalignment between the sample pedestal body 5, the sample pedestal holder 6, and the XY stage 13 of the microscope. is being done. That is, the shape of the sample pedestal 6 is such that it can be held by the Kremmel 11 on the XY stage 13 of the microscope and has a rectangular shape. Moreover, l!
There are recesses as shown in FIG. 2 at the positions of the first adjustment screws 4b and 4c, and the sample stage main body 5 is held at these two points.

以上、本発明の一実施例の構成について述べたが、以下
、本−実施例の使用法について説明する。
The configuration of one embodiment of the present invention has been described above, and below, how to use this embodiment will be explained.

まず、顕微鏡のXYステージ13に試料台受6および試
料台本体5を設置し、試料3の観察面を試料台本体5の
空孔lの中央部に設置する。次に対物レンズを低倍率に
して脚7の先端、すなわち支点aが顕微鏡視野内に入る
ように顕微鏡のXYステージ13を移動し、この位置を
顕微鏡のXYステージ13に付属のスケール等で記憶す
る。次に顕微鏡のXYステージ13はそのままの位置で
、対物レンズを試料lを観察する対物レンズに交換し、
試料面に焦点を合わせる。次に顕微鏡のXYステージ1
3のX座標だけを任意の距離、たとえば3H程度動かし
、試料面に焦点が合うように調整ねじ4bを調整する。
First, the sample stand holder 6 and the sample stand main body 5 are placed on the XY stage 13 of the microscope, and the observation surface of the sample 3 is placed in the center of the hole 1 of the sample stand main body 5. Next, set the objective lens to a low magnification, move the XY stage 13 of the microscope so that the tip of the leg 7, that is, the fulcrum a, is within the field of view of the microscope, and memorize this position using the scale etc. attached to the XY stage 13 of the microscope. . Next, leave the XY stage 13 of the microscope in the same position and replace the objective lens with an objective lens for observing sample l.
Focus on the sample surface. Next, the XY stage 1 of the microscope
Move only the X coordinate of No. 3 by an arbitrary distance, for example, about 3H, and adjust the adjustment screw 4b so that the sample surface is in focus.

次に、顕微鏡のXYステージ13のY座標だけ任意の距
離、たとえば3jLI程度動かし11!!!、ねじ4C
で試料面に焦点を合わせる。
Next, move the XY stage 13 of the microscope by the Y coordinate by an arbitrary distance, for example, about 3jLI (11!). ! ! , screw 4C
to focus on the sample surface.

本発明の試料台の調整は、原理的に上記の調整ねじ4b
、4cの各1回の調整で光rするが、念のため顕微鏡ス
テージBを上記の記憶した場所すなわち、支点aに戻し
、再度、上記と同じ調整を行うと、より正確で完全な調
整が可能となる。
In principle, the adjustment of the sample stage of the present invention is performed using the adjustment screw 4b described above.
, 4c. However, just to be safe, return the microscope stage B to the memorized location above, that is, the fulcrum a, and perform the same adjustments as above again for more accurate and complete adjustment. It becomes possible.

さらに、本発明の他の実施例を第3図、第4図により説
明する。
Furthermore, another embodiment of the present invention will be explained with reference to FIGS. 3 and 4.

図において、第4図に示すように対物レンズガを出たレ
ーザ光nはカバーグラスZを通過後、生細胞ス上に焦点
を結ぶ。試料台5bを水平移動させたときに対物レンズ
Zとカバーグラスnとの相対距離が変化するとレーザ光
乙の焦点が生細胞冴上からずれてしまうため加工ができ
なくなる。そ二で第3図に示すように架台5aを試料台
5bと試料容器々との間に入れて傾きを調整する。架台
5aは試料容器々を搭載するための平板、バランスウェ
イト囚、調節ねじ29a、29bおよび固定支持点加か
ら構成される。平板では顕微鏡の透過照明光を透過させ
られるように透明アクリル製である。バランスウェイト
囚は試料容器漢な搭載しても重心が調節ねじ29a、2
9bおよび固定支持点々で形成される三角形の内側にな
るよう、試料容器局と比較して十分な重量のある材料(
例えばステンレス鋼製)とする。調節ねじ29aおよび
29bと固定支持点(9)を通る直線が互いに直交する
ように配置しであるため、2個の調節ねじ29aおよび
四すは互いに子渉することな(それぞれ前後および左右
の傾きの調節が可能である。調節ねじ29a。
In the figure, as shown in FIG. 4, the laser beam N exiting the objective lens passes through a cover glass Z and focuses on a living cell S. If the relative distance between the objective lens Z and the cover glass n changes when the sample stage 5b is moved horizontally, the focus of the laser beam B will shift from the living cell surface, making it impossible to process the living cells. Then, as shown in FIG. 3, the pedestal 5a is placed between the sample stand 5b and the sample container to adjust the inclination. The pedestal 5a is composed of a flat plate for mounting sample containers, a balance weight, adjusting screws 29a, 29b, and a fixed support point. The flat plate is made of transparent acrylic so that the transmitted illumination light from the microscope can pass through it. Even if the balance weight prisoner is loaded with a sample container, the center of gravity can be adjusted by adjusting screws 29a and 2.
9b and a material of sufficient weight compared to the sample container station (
For example, made of stainless steel). Since the adjusting screws 29a and 29b and the straight line passing through the fixed support point (9) are arranged so as to be orthogonal to each other, the two adjusting screws 29a and the four screws do not interfere with each other (respectively, the front and back and left and right inclinations are fixed). adjustment screw 29a.

29bは先細り形状にし、先端をとがらせたねじで形成
すると良い。ここで、レーザ光の照射エリアは約5X5
簡程度であり、レーザ光の焦点深度は±1μm程度であ
るため、傾きの調節精度としてtanQ=115000
程度が要求される。試料台5bの大きさから架台5mの
大きさは制約を受けるため、調節ねじ291および29
bと固定支持点々との距離は約700程度となるため、
調節ねじ9麿、29bは7015000−0.014態
程度の上下動が要求される。これは調節ねじ29a、2
9bにM3XP0.5の並目ねじを使用した場合、ねじ
の回転角に直すと、360degX0.01410.5
=10.1degとなり、手動による調節が十分可動と
なる。
29b is preferably formed with a tapered shape and a screw with a pointed tip. Here, the laser beam irradiation area is approximately 5x5
Since it is simple and the depth of focus of the laser beam is about ±1 μm, the tilt adjustment accuracy is tanQ=115000.
degree is required. Since the size of the mount 5m is limited by the size of the sample pedestal 5b, the adjustment screws 291 and 29 are
The distance between b and the fixed support point is about 700, so
The adjustment screws 9 and 29b are required to move up and down by about 7015000-0.014 degrees. This is the adjustment screw 29a, 2
When using a coarse screw of M3XP0.5 for 9b, the rotation angle of the screw is 360degX0.01410.5
= 10.1 deg, and manual adjustment is sufficiently movable.

次に本実施例の具体的な調進方法について説明する。生
細胞へのレーザ照射装置には生細胞Uを加工するための
作業レーザと、調整用の小出力のパイロットレーザが通
常備えられている(図示省略)。このパイロットレーザ
の焦点をカバーグラスフの上面に合わせると、パイロッ
トレーザのスボプトが顕微鏡で観察される。次に試料台
5bをX方向に移動させ、X方向にカバーグラス※が傾
いた場合、次第にパイロットレーザの焦点とカバーグラ
スnの上面が離れ、パイロットレーザのスボブトが次第
に大きくなる。そこで調節ねじ211aを回転させ、試
料台5bをX方向に移動させても、パイロブトレーザの
スポット径が変化しなくなるまで調節する。次にX方向
についても同様の調節を行う。両方向の調節が終了すれ
ば、作業レーザの焦点を生細胞3上に合わせて、レーザ
加工を行う。カバーグラスフは平行度が良いため、一般
の物を用いても上面と生細胞冴の付着した下面とは平行
に近く、上記方法により上面を水平にしておけば、下面
も水平を保つことができる。
Next, a specific advancing method of this embodiment will be explained. A laser irradiation device for living cells is usually equipped with a working laser for processing the living cells U and a small-output pilot laser for adjustment (not shown). When this pilot laser is focused on the top surface of the cover glass, the drop of the pilot laser is observed under a microscope. Next, when the sample stage 5b is moved in the X direction and the cover glass* is tilted in the X direction, the focal point of the pilot laser gradually separates from the top surface of the cover glass n, and the width of the pilot laser gradually increases. Therefore, the adjustment screw 211a is rotated and adjusted until the spot diameter of the pyrobe laser does not change even if the sample stage 5b is moved in the X direction. Next, similar adjustments are made in the X direction. When the adjustment in both directions is completed, the working laser is focused on the living cells 3 and laser processing is performed. Cover glasses have good parallelism, so even if you use a regular object, the top surface and the bottom surface with living cells attached are close to parallel, and if you keep the top surface horizontal using the above method, you can keep the bottom surface horizontal as well. can.

本実施例によれば試料台をXおよびX方向に移動させて
も、常にレーザ光の焦点を生細胞上に一致させることが
できる。また、構造の簡単な安価な架台の追加工のめで
レーザ加工の加工面と対物レンズの距離を一定に保てる
ため、操作の簡略化。
According to this embodiment, even if the sample stage is moved in the X and X directions, the focus of the laser beam can always be made to coincide with the living cells. In addition, the distance between the laser processing surface and the objective lens can be maintained constant through additional machining of a simple and inexpensive mount, simplifying operation.

り 加工精度の向上等の効果がある。さらに、二遥調整を行
りた試料はいずれの箇所を観察してもほぼ焦点合せが不
要である。
This has the effect of improving machining accuracy. Furthermore, a sample subjected to two-harvest adjustment requires almost no focusing no matter where it is observed.

またこの試料台を特公昭62−7837号記載の生細胞
レーザ穿孔装置に用いれば、顕微鏡ステージの移動に際
しても焦点がずれないので、シャッターを開放にし、顕
微鏡ス、テージ位置制御装置走査すれば、最初の調整だ
けで後は無人運転が可能になる等の効果がある。
Furthermore, if this sample stage is used in the live cell laser perforation device described in Japanese Patent Publication No. 62-7837, the focus will not shift even when the microscope stage is moved, so if the shutter is opened and the microscope stage is scanned by the stage position control device, With just the initial adjustment, unmanned operation is possible.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、簡略化した構造で安価な架台が構成で
き、かつ、試料容器の水平調節を簡単な操作で短時間に
行うことができる効果がある。
According to the present invention, an inexpensive pedestal can be constructed with a simplified structure, and the horizontal adjustment of a sample container can be performed in a short time with a simple operation.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の水平調節装置の平織 面図、第2図は第1図の1−1M断面図、第3図は本発
明の他の実施例の試料容器の水平調節装置の正面斜視図
、第4図は従来のレーザ加工装置の加工部の正面斜視図
、第5図は従来の装置の平面図、第6図はfJ5図のl
−1線断面図である。 !・・・・・・空孔、4b、4c・・・・・・調整ねじ
、5・・・・・・試料台本体、6・・・・・・試料台受
、7・・・・・・脚、セ・・・・・・対物レンズ、コ・
・・・・・カバーグラス、為・・・・・・生細胞、5a
・・−・・架台、5b・・・・・・試料台、々・・・・
・・試料容器、!・・−・・平板、29a、29b・・
・・・・調節ねじ、加・・−・・固定支持点 代理人 弁理士  小 川 勝 男 弘−−一−−宋台 2θ−一一一励U助点 n−−−−−+ 板 Zfa、勲−m−調節ねし゛ 閉
FIG. 1 is a plain woven surface view of a horizontal adjustment device according to an embodiment of the present invention, FIG. 2 is a 1-1M sectional view of FIG. 1, and FIG. 3 is a horizontal adjustment of a sample container according to another embodiment of the present invention. FIG. 4 is a front perspective view of the processing section of a conventional laser processing device, FIG. 5 is a plan view of the conventional device, and FIG. 6 is a front perspective view of the conventional laser processing device.
-1 line sectional view. ! ...... Hole, 4b, 4c... Adjustment screw, 5... Sample stand body, 6... Sample stand holder, 7... Legs, C...Objective lens, C...
・・・Cover glass, for ・・・Living cells, 5a
...... mount, 5b... sample stand, etc.
...sample container! ...Flat plate, 29a, 29b...
...Adjustment screw, addition...Fixed support point agent Patent attorney Masaru Ogawa Otoko--1--Songtai 2θ-111 U support point n-----+ Board Zfa , Ion-m-adjustment closed

Claims (1)

【特許請求の範囲】 1、加工用試料を搭載する架台の水平調節方法において
、 前記架台の平板に1個の支持点と、該支持点を通り互い
に直交する直線上にある2個の上下に調節可能な支持点
とを有し、該可動支持点を調節することにより、加工用
試料の傾きを調整することを特徴とする試料容器の水平
調節方法。 2、加工用試料を搭載する架台の水平調節装置において
、 前記架台の平板に1個の支持点と、該支持点を通り互い
に直交する直線上2箇所に上下に調節可能な支持点とを
設け、かつ、架台を含めた総合重心が前記3点の支持点
内に納まるように構成したことを特徴とする試料容器の
水平調節装置。 3、特許請求の範囲第2項において、前記架台はレーザ
加工用試料を搭載、又はレーザ加工用試料を搭載し顕微
鏡試料台上に設置したことを特徴とする試料容器の水平
調節装置。 4、顕微鏡の対物レンズの光軸上近傍に位置し、かつ、
顕微鏡の照明光の一部しか遮ぎらない1個の脚と、この
脚の先端を原点とする顕微鏡のXYステージと同じ座標
系のX軸上に1箇所、Y軸上に1箇所位置する長さが可
変の2個の脚とを有し、顕微鏡の照明光の光路部に空孔
あるいは照明光を透過する材質の窓を設けた板状の試料
台本体と、少くとも顕微鏡の照明光の光路部は、照明光
を透過する材質で形成された板状の試料台受より構成し
たことを特徴とする試料容器の水平調節装置。 5、前記試料台本体の重心が3個の脚で形成される三角
形内にあることを特徴とする請求項第4記載の試料容器
の水平調節装置。 6、前記、試料台本体の3個の脚と試料台受の接触点3
箇所の内、試料台受の少なくとも2箇所に窪みを設けた
ことを特徴とする請求項第4記載の試料容器の水平調節
装置。
[Claims] 1. A method for leveling a pedestal on which a sample for processing is mounted, including one support point on a flat plate of the pedestal, and two upper and lower points on a straight line passing through the support point and perpendicular to each other. 1. A method for horizontally adjusting a sample container, comprising: adjusting the movable support point to adjust the inclination of the sample for processing. 2. In a horizontal adjustment device for a pedestal on which a sample for processing is mounted, one support point is provided on the flat plate of the pedestal, and two vertically adjustable support points are provided on a straight line that passes through the support point and intersects perpendicularly to each other. and a horizontal adjustment device for a sample container, characterized in that the overall center of gravity including the pedestal is configured to fall within the three support points. 3. The horizontal adjustment device for a sample container according to claim 2, wherein the pedestal is mounted with a sample for laser processing, or is mounted with a sample for laser processing and placed on a microscope sample stand. 4. Located near the optical axis of the objective lens of the microscope, and
One leg that only partially blocks the illumination light of the microscope, and a length that is located at one location on the X-axis and one location on the Y-axis of the same coordinate system as the XY stage of the microscope, with the tip of this leg as the origin. A plate-shaped sample stage body having two legs whose height is variable and having a hole or a window made of a material that transmits the illumination light in the optical path of the illumination light of the microscope; 1. A horizontal adjustment device for a sample container, characterized in that the optical path section is constituted by a plate-shaped sample pedestal made of a material that transmits illumination light. 5. The horizontal adjustment device for a sample container according to claim 4, wherein the center of gravity of the sample stage body is located within a triangle formed by three legs. 6. Contact point 3 between the three legs of the sample stand main body and the sample stand holder
5. The horizontal adjustment device for a sample container according to claim 4, wherein recesses are provided in at least two of the locations on the sample pedestal.
JP975989A 1989-01-20 1989-01-20 Method and device for adjusting horizontality of sample container Pending JPH02190813A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP975989A JPH02190813A (en) 1989-01-20 1989-01-20 Method and device for adjusting horizontality of sample container

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP975989A JPH02190813A (en) 1989-01-20 1989-01-20 Method and device for adjusting horizontality of sample container

Publications (1)

Publication Number Publication Date
JPH02190813A true JPH02190813A (en) 1990-07-26

Family

ID=11729209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP975989A Pending JPH02190813A (en) 1989-01-20 1989-01-20 Method and device for adjusting horizontality of sample container

Country Status (1)

Country Link
JP (1) JPH02190813A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07128598A (en) * 1993-11-04 1995-05-19 S T Japan:Kk Sample holder for microscopic analysis
JPH08136820A (en) * 1994-11-11 1996-05-31 Koike Seiki Kk Sample stage vertical fine adjustment device for laser scanning microscope
CN105549196A (en) * 2016-03-02 2016-05-04 河南师范大学 Inclinable type auxiliary device for optical microscope objective table
JP2017006148A (en) * 2016-10-18 2017-01-12 株式会社日立製作所 Automatic culture apparatus
CN108398776A (en) * 2018-03-30 2018-08-14 河北工业大学 A kind of general level adjusting apparatus adapted on microscope

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07128598A (en) * 1993-11-04 1995-05-19 S T Japan:Kk Sample holder for microscopic analysis
JPH08136820A (en) * 1994-11-11 1996-05-31 Koike Seiki Kk Sample stage vertical fine adjustment device for laser scanning microscope
CN105549196A (en) * 2016-03-02 2016-05-04 河南师范大学 Inclinable type auxiliary device for optical microscope objective table
JP2017006148A (en) * 2016-10-18 2017-01-12 株式会社日立製作所 Automatic culture apparatus
CN108398776A (en) * 2018-03-30 2018-08-14 河北工业大学 A kind of general level adjusting apparatus adapted on microscope

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