JPH02181669A - Method and device for inspecting wiring of electronic circuit - Google Patents
Method and device for inspecting wiring of electronic circuitInfo
- Publication number
- JPH02181669A JPH02181669A JP64000081A JP8189A JPH02181669A JP H02181669 A JPH02181669 A JP H02181669A JP 64000081 A JP64000081 A JP 64000081A JP 8189 A JP8189 A JP 8189A JP H02181669 A JPH02181669 A JP H02181669A
- Authority
- JP
- Japan
- Prior art keywords
- test paper
- circuit
- terminal
- electronic circuit
- substance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 10
- 238000012360 testing method Methods 0.000 claims abstract description 91
- 238000007689 inspection Methods 0.000 claims abstract description 26
- 239000000126 substance Substances 0.000 claims abstract description 21
- 238000004040 coloring Methods 0.000 claims abstract description 20
- 238000005868 electrolysis reaction Methods 0.000 claims abstract description 19
- 238000006243 chemical reaction Methods 0.000 claims abstract description 18
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical group [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 claims description 27
- 238000002845 discoloration Methods 0.000 claims description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 239000011888 foil Substances 0.000 claims description 3
- 239000007864 aqueous solution Substances 0.000 abstract description 4
- 239000000376 reactant Substances 0.000 abstract description 3
- 101100084627 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) pcb-4 gene Proteins 0.000 description 4
- 239000004020 conductor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000011630 iodine Substances 0.000 description 4
- 229910052740 iodine Inorganic materials 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- JAYCNKDKIKZTAF-UHFFFAOYSA-N 1-chloro-2-(2-chlorophenyl)benzene Chemical compound ClC1=CC=CC=C1C1=CC=CC=C1Cl JAYCNKDKIKZTAF-UHFFFAOYSA-N 0.000 description 3
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229920002472 Starch Polymers 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 2
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000008107 starch Substances 0.000 description 2
- QLOKJRIVRGCVIM-UHFFFAOYSA-N 1-[(4-methylsulfanylphenyl)methyl]piperazine Chemical compound C1=CC(SC)=CC=C1CN1CCNCC1 QLOKJRIVRGCVIM-UHFFFAOYSA-N 0.000 description 1
- 101710134784 Agnoprotein Proteins 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- JLQUFIHWVLZVTJ-UHFFFAOYSA-N carbosulfan Chemical compound CCCCN(CCCC)SN(C)C(=O)OC1=CC=CC2=C1OC(C)(C)C2 JLQUFIHWVLZVTJ-UHFFFAOYSA-N 0.000 description 1
- 230000002925 chemical effect Effects 0.000 description 1
- GVPFVAHMJGGAJG-UHFFFAOYSA-L cobalt dichloride Chemical compound [Cl-].[Cl-].[Co+2] GVPFVAHMJGGAJG-UHFFFAOYSA-L 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- 229910000366 copper(II) sulfate Inorganic materials 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- -1 iodine ions Chemical class 0.000 description 1
- 150000008040 ionic compounds Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- PIJPYDMVFNTHIP-UHFFFAOYSA-L lead sulfate Chemical compound [PbH4+2].[O-]S([O-])(=O)=O PIJPYDMVFNTHIP-UHFFFAOYSA-L 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 1
- 239000012286 potassium permanganate Substances 0.000 description 1
- FJWLWIRHZOHPIY-UHFFFAOYSA-N potassium;hydroiodide Chemical compound [K].I FJWLWIRHZOHPIY-UHFFFAOYSA-N 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910001961 silver nitrate Inorganic materials 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- PRZSXZWFJHEZBJ-UHFFFAOYSA-N thymol blue Chemical compound C1=C(O)C(C(C)C)=CC(C2(C3=CC=CC=C3S(=O)(=O)O2)C=2C(=CC(O)=C(C(C)C)C=2)C)=C1C PRZSXZWFJHEZBJ-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は電子回路（電気回路を含む）の通電状態を検査
する方法及び装置に関する。更に詳述すると、本発明は
回路における通電の有無の池、余分な配線（余配と言わ
れている）や誤った配線（誤配と言われている）及び未
配線（未配と言われている）、短絡等の不良接続の有無
を検出する検査方法及び装置に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method and apparatus for testing the energization state of an electronic circuit (including an electric circuit). More specifically, the present invention detects the presence or absence of current in a circuit, redundant wiring (referred to as extra wiring), incorrect wiring (referred to as erroneous wiring), and unwired wiring (referred to as unwired wiring). The present invention relates to an inspection method and apparatus for detecting the presence or absence of defective connections such as short circuits.
（従来の技術）
従来、電子回路例えばプリント基板（以下ＰＣＢと略称
する）やその他の各種配線の導通検査を行なうには、目
視検査やブザーあるいはテスター等を使用した導通チエ
ツクが一般的である。また、大量生産品の場゛合には各
ＰＣＢに対応したエミュレータを製作して、このＰＣＢ
を検査している。(Prior Art) Conventionally, continuity checks of electronic circuits such as printed circuit boards (hereinafter abbreviated as PCBs) and other various types of wiring have generally been conducted by visual inspection or by using a buzzer, a tester, or the like. In addition, in the case of mass-produced products, we create emulators that are compatible with each PCB.
is being inspected.
（発明が解決しようとする課題）
この従来の検査方法においては、各回路素子の端子間あ
るいは配線間毎に検査をしなければならないので、導通
の有無を検査する場合には端子相互の導通チエツクが主
であり、導通すべき端子相互間以外は全て末チエツクと
なる。従って、回路内の余配や誤配等をチエツクする場
合には、決められた一つの端子から導通してはならない
全ての端子に向かってそれぞれ点検しなければならない
。(Problem to be Solved by the Invention) In this conventional testing method, it is necessary to test between the terminals of each circuit element or between each wiring, so when testing for continuity, it is necessary to check the continuity between the terminals. This is the main thing, and all terminals other than the terminals that should be electrically connected are checked. Therefore, when checking for excess wiring or incorrect wiring in a circuit, it is necessary to check each terminal starting from one determined terminal and moving toward all the terminals that should not be electrically connected.
しかしながら、この検査は、検査ポイント（端子間）が
非常に多く、作業に多大な時間を要するばかりでなく、
極めて困難な作業となる０例えば、コンピュータ等に使
われる大型プリント基板を専用のエミュレータを使用せ
ず検査する場合、多い場合には端子数（スルーホール数
等）が数千箇所（例えば３０００箇所）にも及び、成る
端子の余配や誤配を検査するにはその端子と残りの大多
数の端子（例えば２９９９本）の全ての間で導通チエツ
クを実施しなければならなくなる。このため、必要最少
限の導通検査即ち配線すべき箇所に配線さ、れているか
否かの有無だけしか行われていないのが実状である。However, this inspection not only requires a large number of inspection points (between terminals) and a large amount of time, but also
For example, when inspecting large printed circuit boards used in computers, etc. without using a dedicated emulator, the number of terminals (through holes, etc.) is in the thousands (for example, 3000). In order to check for redundant or misplaced terminals, it is necessary to perform a continuity check between that terminal and all of the remaining terminals (for example, 2999 terminals). For this reason, the reality is that only the minimum necessary continuity test is performed, that is, only the presence or absence of wiring at the location where it should be wired.
ところが、回路内での短絡や不要接続、未接続は、その
回路の働きを不安定にし装置の誤動作を招く原因となっ
たりする。更に、短絡や不要接続がある場合には使用部
品の焼損を生じる場合がある。そこで、このような事故
を防止するには、短絡、余配及び誤配等を検査時に発見
することが望まれる。また、各ＰＣＢに対応したエミュ
レータを製作して、ＰＣＢをチエツクすれば所望するポ
イント間のチエツクは全て可能ではあるが、このエミュ
レータの製作には多大な費用がかかるばがってなく、Ｐ
ＣＢが若干変更された場合にはエミュレータのソフト及
びハードを変更する必要があり、この費用も多大なもの
となっている。However, short circuits, unnecessary connections, or disconnections within the circuit can make the circuit function unstable and cause the device to malfunction. Furthermore, if there is a short circuit or unnecessary connection, the parts used may burn out. Therefore, in order to prevent such accidents, it is desirable to discover short circuits, excess wiring, incorrect wiring, etc. during inspection. Also, if you manufacture an emulator that is compatible with each PCB and check the PCB, it is possible to check between all the desired points, but manufacturing this emulator costs a lot of money, and the
When the CB is slightly changed, it is necessary to change the software and hardware of the emulator, and this costs a lot of money.
本発明は、導通検査は勿論のこと、不要接続ま。The present invention not only allows continuity testing but also eliminates unnecessary connections.
たは短絡についても、容易かつ迅速に検査を可能にする
安価な検査方法及び装置を提供することを目的とする。It is an object of the present invention to provide an inexpensive testing method and device that enables easy and quick testing of short circuits or short circuits.
（課題を解決するための手段）
かかる目的を達成するため、本発明の電子回路の配線検
査方法は、電気分解によって発色ないし変色反応を起こ
す物質を含む含水試験紙を検査対象たる電子回路の回路
素子の全ての端子に接触させ、該試験紙を介して全端子
に検査用直流電源の一方の極性を接続すると共に検査対
象端子側に他方の極性を接続するようにしている。(Means for Solving the Problems) In order to achieve the above object, the wiring inspection method for an electronic circuit of the present invention uses a water-containing test paper containing a substance that causes a coloring or discoloration reaction by electrolysis to test the circuit of an electronic circuit to be inspected. All the terminals of the element are brought into contact with each other, and one polarity of the DC power supply for testing is connected to all the terminals via the test paper, and the other polarity is connected to the terminal to be tested.
また、本発明の検査装置は、電気分解によって発色ない
し変色反応を起こす物質を含む含水試験紙と、この試験
紙を支持する電極板と、前記試験紙を介在させた状態で
検査対象回路とｔ４１ｉ板との間に電圧を印加する検査
用直流電源とから成り、前記試験紙を介して回路に通電
するようにしている。Further, the inspection device of the present invention includes a water-containing test paper containing a substance that causes a coloring or discoloration reaction due to electrolysis, an electrode plate that supports this test paper, and a test target circuit and a t41i with the test paper interposed therebetween. It consists of a test DC power supply that applies voltage between the test paper and the test paper, and the circuit is energized through the test paper.
また、本発明の検査装置は、前記電極板と試験紙との間
に導電ゴムを設けたことを特徴としている。Further, the testing device of the present invention is characterized in that a conductive rubber is provided between the electrode plate and the test paper.
また、本発明の検査装置は、前記電極板は導電ゴムと金
属箔を積層したものであることを特徴としている。Further, the inspection device of the present invention is characterized in that the electrode plate is a laminate of conductive rubber and metal foil.
また、本発明の検査装置は、前記物質はヨウ化カリウム
であることを特徴としている。Further, the inspection device of the present invention is characterized in that the substance is potassium iodide.
また、本発明の検査装置は、試験紙と検査対象回路の端
子との間に導電性フィルムを介在させることを特徴とす
る。Furthermore, the testing device of the present invention is characterized in that a conductive film is interposed between the test paper and the terminal of the circuit to be tested.
また、本発明の検査装置は、導電ゴムと試験紙との間及
び検査対象回路の端子と試験紙との間に導電性フィルム
を介在させることを特徴とする。Furthermore, the testing device of the present invention is characterized in that a conductive film is interposed between the conductive rubber and the test paper and between the terminal of the circuit to be tested and the test paper.
（作用）
したがって、チエツク電圧を電気回路と電極板との間に
かけると、当然導通すべき端子の他、短絡や余配ないし
誤配によって導通している端子にも電流が流れ、試験紙
に含まれている反応物質を電気分解して着色ないし変色
反応を起こす、この着色ないし変色反応によって通電の
有無を視認できる。しかも、この着色ないし変色反応は
、短絡の場合、正常通電の場合に比べて流れる電流が大
きいので発色の程度が濃く、また誤配等の不要接続は配
線図と比較することによって容易に判明する。(Function) Therefore, when a check voltage is applied between the electric circuit and the electrode plate, current flows not only to the terminals that should be conductive but also to the terminals that are conductive due to short circuits, excessive wiring, or incorrect wiring, and the current flows to the test paper. The contained reactants are electrolyzed to cause a coloring or color-changing reaction, and this coloring or color-changing reaction makes it possible to visually confirm whether or not electricity is being applied. Moreover, this coloring or discoloration reaction occurs when there is a short circuit, as the current flowing is larger than when the current is normally flowing, so the degree of coloring is darker, and unnecessary connections such as incorrect wiring can be easily identified by comparing with the wiring diagram. .
（実施例）
以下、本発明の構成を図面に示す実施例に基づいて詳細
に説明する。(Example) Hereinafter, the configuration of the present invention will be described in detail based on an example shown in the drawings.
第１図に本発明の検査方法を実施する検査装置の一例を
概略説明図で示す、この検査装置は、電気分解によって
発色ないし変色反応を起こす物質を含む含水試験紙１と
、これを支持し検査対象回路あるいは回路素子８等の端
子５の全てに検査電圧の一方を印加する電極板３と、該
電極板３と前記検査対象回路の端子５との接触を確実な
ものとする導電ゴム２及び″ｇｓ！ｆｌ板３と検査対象
回路の任意の端子５との間に検査用直流電圧を印加する
直流電源９とから成り、電極板３の上に、導電ゴムシー
ト２、試験紙１、被検査体である電気回路ＰＣＢ４の順
に重ね、電極板３と任意の端子５との間に直流電圧を印
加するように構成されている。FIG. 1 shows a schematic explanatory diagram of an example of an inspection device for carrying out the inspection method of the present invention. An electrode plate 3 that applies one of the test voltages to all terminals 5 of the circuit to be tested or circuit elements 8, etc., and a conductive rubber 2 that ensures contact between the electrode plate 3 and the terminals 5 of the circuit to be tested. and a DC power source 9 that applies a testing DC voltage between the "gs!fl board 3 and any terminal 5 of the circuit to be tested. On the electrode plate 3, a conductive rubber sheet 2, a test paper 1, The electric circuit PCB4, which is the object to be inspected, is stacked in this order, and a DC voltage is applied between the electrode plate 3 and any terminal 5.
前記反応物質としては、検査しようとする電子回路に流
し得る電流値及び印加し得る電圧値よりも小さな電流あ
るいは低い電圧によって電気分解反応を起こし、発色な
いし変色反応を起こす物質であり、回路に悪影響を与え
ないものであれば使用可能である６例えば、酸化鉛（Ｐ
ｂＯ） 、過マンガン酸カリウム（ＫＭｎＯａ ） 、
クロム酸カリウム（Ｃｒ２０？ Ｋ２ ） 、硝Ｍ銀（
ＡｇＮＯｓ ）、硫酸銅（ＣｕＳＯ４）、硫酸ニッケル
（ＮｉＳＯ４）、硫酸鉛（ＰｂＳＯ，ｉ ）塩化コバル
ト（ＣｏＣｊり、ｐＨ試験紙等に例えば酸又は塩性物質
を加えたもの等が挙げられ、低電流・低電圧で電気分解
反応する最も安価で入手し易いヨウ化カリウムが好まし
い。しかし、これに限定されるものではなく、他のヨウ
素系化合物やイオン性化合物の使用が可能である。また
、電気分解によって発生する物質例えば水素や酸素と反
応することによって発色ないし変色反応を起こす物質も
使用可能である。これら物質は、水溶液にしであるいは
水と共に試験紙１に含ませ、試験紙ｌ自体を導電性物質
としている。また、ｐＨ試験紙（チモールブルー（ＴＢ
）、リドマス）等に例えば酸又は塩性物質を加えておき
、電気分解によってρ■（値を変化させることによって
変色させることができる。The above-mentioned reactive substance is a substance that causes an electrolytic reaction with a current or voltage lower than the current value and voltage value that can be applied to the electronic circuit to be tested, and causes a coloring or discoloration reaction, which has an adverse effect on the circuit. 6 For example, lead oxide (P) can be used as long as it does not give
bO), potassium permanganate (KMnOa),
Potassium chromate (Cr20? K2), silver nitrate (
AgNOs), copper sulfate (CuSO4), nickel sulfate (NiSO4), lead sulfate (PbSO,i), cobalt chloride (CoCj), pH test paper, etc. with acid or salt substances added, etc., and low current.・Potassium iodide, which is the cheapest and most easily available, is preferable because it undergoes an electrolysis reaction at low voltage.However, it is not limited to this, and other iodine-based compounds and ionic compounds can be used. Substances generated by decomposition, such as substances that develop color or change color by reacting with hydrogen or oxygen, can also be used.These substances are included in the test strip 1 in an aqueous solution or together with water, and the test strip 1 itself is made conductive. In addition, pH test paper (thymol blue (TB)
), lidomas), etc., by adding an acid or a salt substance, and changing the value of ρ■ (by electrolysis), the color can be changed.
また、試験紙としては、紙に限る物ではなく布、不織布
、その自溶液浸透性のあるフィルム等、他の媒体物を用
いることもある。この試験紙１に検査対象たる回路の配
線図、端子配置図等を印刷しておけば検査結果の判定が
更に容易になる。Further, the test paper is not limited to paper, and other media such as cloth, nonwoven fabric, and films permeable to their own solution may be used. If a wiring diagram, a terminal layout diagram, etc. of the circuit to be tested are printed on the test paper 1, it will be easier to judge the test results.
導電ゴム２は回路部品が実装されたＰＣＢと電極板３と
の電気的接触を考慮して使用されているが、全ての端子
が！極板３に対して確実に接触可能であれば導電ゴムシ
ート２を必ずしも使用することはない、また、金属板か
ら成る電極板と導電ゴムシートに代えて、導電性の良い
金属箔を導電ゴムシートでサンドイッチしたものや導電
ゴムシートの裏面に金属を蒸着したものを使用しても良
い。The conductive rubber 2 is used in consideration of electrical contact between the PCB on which circuit components are mounted and the electrode plate 3, but all the terminals! The conductive rubber sheet 2 is not necessarily used as long as it can make reliable contact with the electrode plate 3. Also, instead of the electrode plate and the conductive rubber sheet made of metal plates, a metal foil with good conductivity can be used as a conductive rubber sheet. It is also possible to use a sheet sandwich or a conductive rubber sheet with metal vapor-deposited on the back side.
以上のように構成された電子回路の配線検査装置を使用
して電子回路の導通検査、誤配等の不良接続を検査する
方法を説明する。A method of testing electronic circuit continuity and faulty connections such as incorrect wiring using the electronic circuit wiring testing device configured as described above will be described.
ＰＣＢ４上にはトランジスタ、抵抗、ＩＣパッケージ等
の回路素子８が実装されている。ＩＣパッケージ８には
′ｌ゛１〜Ｔ８の８本の端子ビン５が並んでおり、左端
の端子ビンＴｌ 、Ｔ２がプリント配線によって結線さ
れ、それ以外の端子′１゛３〜Ｔ８は’ｒ１．Ｔ２とは
結線されていないものとする。この電気回路において、
直流電源９の（−）極を電極板３に接続し、（＋）極を
Ｔ１端子に接触させると、端子ビン５の７１．Ｔ２と試
験紙の接触点６．７より試験紙１、導電ゴム２を厚さ方
向に貫いて、電極板３に向かって電流が流れる。Circuit elements 8 such as transistors, resistors, and IC packages are mounted on the PCB 4. In the IC package 8, eight terminal bins 5 labeled 'l'1 to T8 are lined up, the leftmost terminal bins Tl and T2 are connected by printed wiring, and the other terminals'1'3 to T8 are connected to 'r1'. ．． It is assumed that it is not connected to T2. In this electric circuit,
When the (-) pole of the DC power supply 9 is connected to the electrode plate 3 and the (+) pole is brought into contact with the T1 terminal, 71. of the terminal bin 5 is connected. From the contact point 6.7 between T2 and the test paper, a current flows through the test paper 1 and the conductive rubber 2 in the thickness direction toward the electrode plate 3.
導電ゴム２は厚さ方向には大して電気抵抗とならないの
で下敷となっている電極板３から通電される、このとき
、試験紙１に含まれるヨウ化カリウム水溶液中において
電気分解が起こる。即ち、試験紙１と端子ピン５のＴＩ
、Ｔ２の接触点６，７において、ヨウ素イオンがヨウ
素として分離され褐色を呈す、゛ＩＥヨウ化カジカリウ
ム水溶液中らかじめデンテレを含ませておくと、電気分
解が生じる部位、この場合には試験紙１と端子ピン５の
Ｔｉ 、Ｔ２の接触点６．７にヨウ素デンプン反応によ
ってヨウ化カリウムだけの場合よりも、検出感度を高め
られると共に、青又は紫の彩色変化を生じる。また、デ
ンプンの種類によっては赤、赤褐色、褐色を呈するもの
もある。尚、電気ゴテ先などで変色点だけを加熱するこ
とによって一度変色したヨウ化カリウムを気化させた後
、水分を補給すれば、残存する未分解のヨウ化カリウム
が分散して再使用できるので、−回の検査ごとに試験紙
を交換しなくとも検査を続けることができる。Since the conductive rubber 2 does not have much electrical resistance in the thickness direction, electricity is applied from the underlying electrode plate 3. At this time, electrolysis occurs in the potassium iodide aqueous solution contained in the test paper 1. That is, the TI of test strip 1 and terminal pin 5
, at the contact points 6 and 7 of T2, iodine ions are separated as iodine and appear brown.If Dentele is pre-contained in the IE potassium iodide aqueous solution, it will be possible to detect the site where electrolysis occurs, in this case the test The iodine-starch reaction at the contact point 6.7 between the Ti and T2 of the paper 1 and the terminal pin 5 increases the detection sensitivity compared to the case of using only potassium iodide, and also causes a blue or purple color change. Also, depending on the type of starch, there are some that exhibit red, reddish-brown, and brown colors. In addition, if you vaporize the discolored potassium iodide by heating only the discoloration point with the tip of an electric iron, etc., and then replenishing the water, the remaining undecomposed potassium iodide will be dispersed and can be reused. - Tests can be continued without replacing test strips every time the test is performed.
発色が端子Ｔ１にだけ起こり、端子Ｔ２の点に現れない
場合は’ｒｌ 、 ７２間で結線不良が起きており、’
ｒｌ 、 Ｔ２以外の他の端子に発色が現れた場合は不
要結線が存在していることがわかる。If coloring occurs only at terminal T1 and does not appear at terminal T2, there is a poor connection between 'rl and 72,'
If color appears on other terminals than rl and T2, it can be seen that unnecessary connections exist.
本実施例において、ヨウ素カリウムの電気分解に必要な
直流電源９の電圧は０．７ｖ程度、電流値としては数μ
Ａ以下であり、電気分解が生じた場合にはその反応部位
に目視可能な彩色変化（発色）を生じる。このなめ、検
査対象たる電子回路内に流れる電流や電圧よりも小さな
検査用電流によって回路チエツクを行なうことができる
。In this example, the voltage of the DC power supply 9 required for electrolysis of potassium iodine is about 0.7V, and the current value is several μ.
A, and when electrolysis occurs, a visually visible color change (color development) occurs at the reaction site. Therefore, a circuit check can be performed using a test current smaller than the current or voltage flowing in the electronic circuit to be tested.
また、回路上の部品、特にトランジスタ、Ｃ・ＭＯＳ、
ＴＴＬ等の半導体部品によっては部品内を電流が流れ、
不要結線でないにもかかわらず、他の端子において発色
が示される場合がある。このような場合には、通電時間
（検査時間）、直流電源９の電圧、電流制限のため電源
９と直列に入れる抵抗器の値等を適切に調整することに
よって、導体による接続と回路部品中を流れた電流値に
差を持たせて区別することができる。この電流の差によ
って発色の程度に差が現れることから、多くの場合不要
接続と部品中を通る電流との判別を可能にできる。In addition, components on the circuit, especially transistors, C/MOS,
Depending on the semiconductor component such as TTL, current flows inside the component,
Coloring may appear on other terminals even though the connections are not unnecessary. In such a case, by appropriately adjusting the energization time (inspection time), the voltage of the DC power supply 9, the value of the resistor connected in series with the power supply 9 to limit the current, etc., it is possible to reduce the connection between conductors and the circuit components. They can be distinguished by making a difference in the value of the current that flows through them. Since a difference in the degree of color development appears depending on the difference in current, it is often possible to distinguish between unnecessary connections and current passing through the component.
また、ヨウ素は活性が比較的弱いので回路基板４等に及
ぼす化学的な影響は少ないので端子ピン５等と試験紙と
を直接接触させているが、試験紙１とＰＣＢ４との間に
導電性フィルム１０等を介在させることによって、電解
液と回路部品との直接接触を回避し、ＰＣＢ４への化学
的影響を遮断した状態で電気分解を起こさせるようにし
ても良い。In addition, since iodine has a relatively weak activity, it has little chemical effect on the circuit board 4, etc., so the terminal pins 5, etc. are brought into direct contact with the test paper, but there is no conductivity between the test paper 1 and the PCB 4. By interposing the film 10 or the like, direct contact between the electrolyte and the circuit components may be avoided, and electrolysis may be caused in a state where chemical influence on the PCB 4 is blocked.
更に、導電ゴム２と試験紙１との間及びプリント基板上
の端子ピン５やその池の部品等のハンダ着は部分と試験
紙１の間には電池作用があるため微弱ではあるが起電力
が生じる。この場合にも、微弱な自己起電力によって起
こる電気分解によって発色反応が起こるが、短絡してい
る所や正規導通箇所等にはそうでない部分よりも余分に
流れるので発色濃度＜Ｓ淡）で判別することができる。Furthermore, soldering between the conductive rubber 2 and the test paper 1, as well as the terminal pins 5 on the printed circuit board and other parts of the circuit board, generates electromotive force, although it is weak, because there is a battery action between the parts and the test paper 1. occurs. In this case as well, a coloring reaction occurs due to electrolysis caused by a weak self-electromotive force, but since there is more flow in areas where there is a short circuit or normal conduction than in areas where there is not, discrimination is made based on the color density < S light). can do.
しかし、試験紙１の表裏両面に同じ導電性フィルム１０
を用いることによって互いに起電力を打ち消し合い、直
流電源９の電圧を更に低くして用いることが可能になる
。However, the same conductive film 10 is placed on both the front and back sides of the test paper 1.
By using these, the electromotive forces can be canceled each other out, and the voltage of the DC power supply 9 can be further lowered.
検査用直流電源９の電圧については、使用する物質即ち
、電気分解によって可視反応を起こす物質の種類によっ
て、適宜決定されるものであるが、ダイオード、トラン
ジスタ、Ｃ−ＭＯＳ、ＴＴＬ等の各種半導体の順方向電
圧以下の電圧とすることにより、適切な導通検査を行な
うことが可能となる。この場合、直流電源９の電圧が半
導体の順方向電圧以下であり、半導体を介しては電流は
流れず、導体のみとなる。従って、半導体部位での発色
（電気分解）は生じず、導通している導体の部位のみで
発色するので、導通状態の判断を確実、かつ容易に行な
うことができる。The voltage of the inspection DC power supply 9 is appropriately determined depending on the type of substance used, that is, the type of substance that causes a visible reaction due to electrolysis. By setting the voltage to be lower than the forward voltage, it becomes possible to perform an appropriate continuity test. In this case, the voltage of the DC power supply 9 is lower than the forward voltage of the semiconductor, and no current flows through the semiconductor, which is only a conductor. Therefore, coloring (electrolysis) does not occur in the semiconductor portion, and coloring occurs only in the conducting portion of the conductor, so that the conductive state can be determined reliably and easily.
次に、デジタル回路の検査例について第３図に基づいて
説明する。検査対象回路は’［’３ 、 Ｔ５ 。Next, an example of testing a digital circuit will be explained based on FIG. 3. The circuit to be tested is '['3, T5.
’ｒｅ 、ＴＶの４本の入力端子５を有し、各端子はＴ
３ “Ｈ”、’ｒ５ Ｈ”、Ｔ８’Ｌ″、ＴＶ”Ｌ”
の状態に有るとする。尚、“Ｈ”はその端子がハイレベ
ルの状態、Ｌ”はロウレベルの状態に有ることを示す、
また、回路は１’２．ＴＡの２本の出力端子を有し、前
記の入力条件に従えば、端子Ｔ２ “し”、端子Ｔ４
“Ｈ”の出力となる。また、端子７１．Ｔｏは回路を動
作させている電源の（＋）側及び〈−）側端子である。're, has four input terminals 5 of TV, each terminal is T
3 "H", 'r5 H", T8'L", TV"L"
Suppose that it is in the state of Note that "H" indicates that the terminal is at high level, and "L" indicates that the terminal is at low level.
Also, the circuit is 1'2. It has two output terminals of TA, and if the above input conditions are followed, terminal T2 is "off" and terminal T4 is "off".
The output is “H”. Also, terminal 71. To is the (+) side and <-) side terminal of the power supply that operates the circuit.
″ｆ４４ｉｉ！板３、導電ゴム２、試験紙１の用い方は
第１図及び第２図の場合と同様で電源９と電極板３との
結線が異なるだけである。"f44ii! The usage of the plate 3, conductive rubber 2, and test paper 1 is the same as in the case of FIGS. 1 and 2, and the only difference is the connection between the power source 9 and the electrode plate 3.
ハイレベルの端子を発色させる場合、即ち正論理の時に
発色を望む場合は、実線のように電源９の（−）＠と電
極板３とを瞬間的に接続する。このとき、“Ｈ”の状態
に有る端子から試験紙１、導電ゴム２、Ｔｈ極板３の方
向に電流が流れ、端子Ｔ３ 、Ｔ４ 、’［’５及び電
源電圧のかかつている端子Ｔ１の先端部分に電気分解が
生じ、試験紙１上に発色の痕跡となって転写される。When a high level terminal is to be colored, that is, when a positive logic is desired, the (-) @ of the power supply 9 and the electrode plate 3 are momentarily connected as shown by the solid line. At this time, current flows from the terminal in the "H" state to the test paper 1, the conductive rubber 2, and the Th electrode plate 3, and the terminals T3, T4, '['5 and the tip of the terminal T1 to which the power supply voltage is applied Electrolysis occurs in the portion, and a colored trace is transferred onto the test paper 1.
また、“し７の端子の先端、即ち負論理の状態で発色さ
せようとする場合は、破線で示すように電源９の（＋）
極と電極板３とを瞬間的に接続する。このとき、正論理
状態での転写と異なるのは図面上で下から上へ向かって
電流が流れるので、試験紙１の下の面から発色が始まる
点である。In addition, if you want to generate color at the tip of the terminal 7, that is, in a negative logic state, connect the (+) terminal of the power supply 9 as shown by the broken line.
The pole and the electrode plate 3 are momentarily connected. At this time, the difference from transfer in a positive logic state is that since the current flows from the bottom to the top in the drawing, coloring starts from the lower surface of the test paper 1.
この方法をアナログ回路に用いた場合、試験紙ｌを通る
電気呈によって、発色の度合が変わってくるのでその濃
淡の程度を回路状況の判断材料とすることはできる。し
かし、入力インピーダンスの高い部品等では試験紙１を
介して該部品に４４：ａが流れ回路動作に影響してしま
うので注意を要する。特にＦＥＴ入力型の部品には注意
を要する。When this method is used for analog circuits, the degree of color development changes depending on the electric current passing through the test paper 1, so the degree of shading can be used as a basis for determining the state of the circuit. However, in the case of components with high input impedance, 44:a flows into the component through the test paper 1 and affects the circuit operation, so care must be taken. Particular attention should be paid to FET input type parts.
更に、本発明の検査方法及び装置は、多くの電線を束ね
たケーブル、例えば電話用通信用ケーブル等の中の一本
一本の線について仕分けする必要がある時、例えば埋設
状態で火災その他の事故によって結線光が不明となった
とき等に用いることができる。Furthermore, the inspection method and device of the present invention can be used when it is necessary to sort each wire in a bundle of many electric wires, such as a telephone communication cable, for example, in case of fire or other damage while buried. This can be used when the connection light becomes unclear due to an accident.
第４図のように、ケーブル両端の外被覆１４を切り取り
、さらに心線被覆１５を一部取り除き、導体１６を取り
出し、ゴム板１３（絶縁性ゴム）と試験紙１の間に並べ
て置き、その上から透明電極１２を施したガラス板１１
で軽く圧迫する。−方、ケーブルの他端の心線被覆も一
部切り取り、心線に電源９の〈−）極を接続する。電源
９の（＋）極と透明電極１とは接地し、電源９の（＋）
極、大地、透明電極１２、試験紙１、心線１６を通って
電源９の（−）極の順に電流が流れる。その結果、試験
紙には通電している心線と接している部分にのみ発色し
、容易に多数の心線を仕分けできる。As shown in Fig. 4, cut off the outer sheath 14 at both ends of the cable, remove part of the core wire sheath 15, take out the conductor 16, and place it between the rubber plate 13 (insulating rubber) and the test paper 1. Glass plate 11 with transparent electrode 12 applied from above
Apply light pressure. - On the other hand, also cut off part of the core wire sheathing at the other end of the cable, and connect the <-) pole of the power source 9 to the core wire. The (+) pole of the power source 9 and the transparent electrode 1 are grounded, and the (+) pole of the power source 9
A current flows through the pole, the ground, the transparent electrode 12, the test paper 1, and the core wire 16 in the order of the (-) pole of the power source 9. As a result, the test paper develops color only in the areas that are in contact with the energized core wires, making it easy to sort a large number of core wires.
（発明の効果）
以上の説明より明らかなように、本発明の電子回路の検
査方法は、検査対象たる端子と導通状態にある他の端子
を電気分解に起因する発色反応によって確認することが
できるので、従来の検査では困難であった電気回路の余
配、誤配、短絡及び未接続を短時間で簡単かつ確実に行
なうことができる。特に、試験紙に含ませる反応物質と
してヨウ化カリウムを使用する場合、小さな電流低い電
圧で作動するのでデジタル回路の導通チエ・ツクにａ適
である。(Effects of the Invention) As is clear from the above explanation, the method for testing an electronic circuit of the present invention can confirm whether a terminal to be tested and another terminal in a conductive state are connected by a coloring reaction caused by electrolysis. Therefore, it is possible to easily and reliably detect over-placement, wrong-placement, short-circuiting, and disconnection of electric circuits, which were difficult in conventional inspections, in a short time. In particular, when potassium iodide is used as a reactant contained in the test strip, it is suitable for checking continuity in digital circuits because it operates with a small current and low voltage.
また、本発明の検査装置によると、検査しようとする電
子回路基板あるいは回路素子そのものを試験紙上に載せ
て検査しようとする端子に検査用電圧をかけるだけで、
導通状態を発色により可視化できるので、簡単な操作に
よって正規配線の導通の有無の他、不良配線、余配、短
絡簿を確実に検査することができる。しかも、エミュレ
ータに比べて非常に安価である。Furthermore, according to the testing device of the present invention, by simply placing the electronic circuit board or circuit element itself to be tested on the test paper and applying a testing voltage to the terminal to be tested,
Since the conduction state can be visualized by coloring, it is possible to reliably inspect the presence or absence of continuity of normal wiring, as well as defective wiring, extra wiring, and short circuits, with a simple operation. Moreover, it is much cheaper than emulators.
また、導電フィルムを試験紙と検査回路の端子との間に
介在させれば、発色反応物質によって回路素材が悪影響
を受けることがないし、半田付は部分等に発生する自己
起電力を解消し、低い電圧での検査を可能とする。In addition, if a conductive film is interposed between the test paper and the terminal of the test circuit, the circuit material will not be adversely affected by the color-forming reaction substance, and soldering eliminates self-electromotive force generated in parts, etc. Enables inspection at low voltage.
第１図は本発明の検査方法及び装置の概略を示す中央縦
断面図、第２図は他の実籍例を示す中央縦断面図、第３
図は更に池の実施例を示す断面図、第４図はケーブルの
心線チエツクを行なう場合に適用した本発明のその他の
実施例を示す斜視図である。
１・・・試験紙、２・・・導電ゴム、３・・・電極板、
４・・・プリント基板、６．７・・・発色している部分
、９・・・直流電源、１０・・・導電フィルム。
手続補正書（帥）
平成１年３月
１日Fig. 1 is a central longitudinal cross-sectional view showing an outline of the inspection method and apparatus of the present invention, Fig. 2 is a central longitudinal cross-sectional view showing another example of actual registration, and Fig. 3
FIG. 4 is a cross-sectional view showing an embodiment of the pond, and FIG. 4 is a perspective view showing another embodiment of the present invention applied to checking the core wires of a cable. 1... Test paper, 2... Conductive rubber, 3... Electrode plate,
4... Printed circuit board, 6.7... Colored part, 9... DC power supply, 10... Conductive film. Procedural amendment (marshal) March 1, 1999
Claims (7)
質を含む含水試験紙を検査対象たる電子回路の回路素子
の全ての端子に接触させ、該試験紙を介して全端子に検
査用直流電源の一方の極性を接続すると共に検査対象端
子側に他方の極性を接続することを特徴とする電子回路
の配線検査方法。(1) A water-containing test paper containing a substance that causes coloration or discoloration reaction due to electrolysis is brought into contact with all terminals of the circuit elements of the electronic circuit to be tested, and all terminals are connected to one side of the DC power supply for testing through the test paper. 1. A wiring inspection method for an electronic circuit, characterized by connecting one polarity of the terminal and connecting the other polarity to the terminal to be inspected.
質を含む含水試験紙と、この試験紙を支持する電極板と
、前記試験紙を介在させた状態で検査対象回路と電極板
との間に電圧を印加する検査用直流電源とから成り、前
記試験紙を介して回路に通電することを特徴とする電子
回路の配線検査装置。(2) A water-containing test paper containing a substance that causes coloring or discoloration reaction due to electrolysis, an electrode plate that supports this test paper, and a voltage between the circuit under test and the electrode plate with the test paper interposed. 1. A wiring inspection device for an electronic circuit, comprising: a direct current power source for inspection that applies a voltage, and energizes the circuit through the test paper.
とを特徴とする請求項２記載の電子回路の配線検査装置
。(3) The electronic circuit wiring inspection device according to claim 2, further comprising a conductive rubber provided between the electrode plate and the test paper.
あることを特徴とする請求項２記載の電子回路の配線検
査装置。(4) The electronic circuit wiring inspection device according to claim 2, wherein the electrode plate is a laminate of conductive rubber and metal foil.
る請求項２ないし４のいずれかに記載の電子回路の配線
検査装置。(5) The electronic circuit wiring inspection device according to any one of claims 2 to 4, wherein the substance is potassium iodide.
フィルムを介在させることを特徴とする請求項２ないし
５のいずれかに記載の電子回路の配線検査装置。(6) The electronic circuit wiring inspection device according to any one of claims 2 to 5, characterized in that a conductive film is interposed between the test paper and the terminal of the circuit to be inspected.
端子と試験紙との間に導電性フィルムを介在させること
を特徴とする請求項３に記載の電子回路の配線検査装置
。(7) The electronic circuit wiring inspection device according to claim 3, characterized in that a conductive film is interposed between the conductive rubber and the test paper and between the terminal of the circuit to be inspected and the test paper.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP64000081A JP2965573B2 (en) | 1989-01-05 | 1989-01-05 | Wiring inspection device for mounted electronic circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP64000081A JP2965573B2 (en) | 1989-01-05 | 1989-01-05 | Wiring inspection device for mounted electronic circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02181669A true JPH02181669A (en) | 1990-07-16 |
| JP2965573B2 JP2965573B2 (en) | 1999-10-18 |
Family
ID=11464201
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP64000081A Expired - Fee Related JP2965573B2 (en) | 1989-01-05 | 1989-01-05 | Wiring inspection device for mounted electronic circuits |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2965573B2 (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5587056A (en) * | 1978-12-25 | 1980-07-01 | Fujikura Ltd | Test method for disconnection of multi-core cable |
| JPS57100356A (en) * | 1980-12-15 | 1982-06-22 | Nec Corp | Detecting method for disconnection of through-hole |
| JPS57168413A (en) * | 1981-04-09 | 1982-10-16 | Fujikura Ltd | Method of searching core wire of cable |
| JPS63195273U (en) * | 1987-06-04 | 1988-12-15 |
-
1989
- 1989-01-05 JP JP64000081A patent/JP2965573B2/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5587056A (en) * | 1978-12-25 | 1980-07-01 | Fujikura Ltd | Test method for disconnection of multi-core cable |
| JPS57100356A (en) * | 1980-12-15 | 1982-06-22 | Nec Corp | Detecting method for disconnection of through-hole |
| JPS57168413A (en) * | 1981-04-09 | 1982-10-16 | Fujikura Ltd | Method of searching core wire of cable |
| JPS63195273U (en) * | 1987-06-04 | 1988-12-15 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2965573B2 (en) | 1999-10-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |