JPH02128511U - - Google Patents
Info
- Publication number
- JPH02128511U JPH02128511U JP3503889U JP3503889U JPH02128511U JP H02128511 U JPH02128511 U JP H02128511U JP 3503889 U JP3503889 U JP 3503889U JP 3503889 U JP3503889 U JP 3503889U JP H02128511 U JPH02128511 U JP H02128511U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- fixing jig
- displacement meter
- inspection device
- laser displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006073 displacement reaction Methods 0.000 claims description 6
- 238000005452 bending Methods 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
第１図は本考案による一実施例を示すＩＣリー
ド曲り検査装置の側面図、第２図はＩＣに対する
レーザ変位計の向きを示す平面図、第３図は第１
図のＩＣリード曲り検査装置の別の構造例を示す
側面図、第４図は従来の一例を示すＩＣリード曲
り検査装置の側面図、第５図ａ及びｂは第４図の
レーザ変位計とＩＣの位置関係を示す平面図及び
ＡＡ断面図、第６図ａ及びｂは第４図のレーザ変
位計とＩＣの位置関係を示す平面図及びＢＢ断面
図である。
１……ＩＣ、２……リード、３……レーザ変位
計、４……レーザ光、５……固定治具、６……回
転機構、７……Ｘ軸駆動機構、８……Ｙ軸駆動機
構、９……コラム。
Fig. 1 is a side view of an IC lead bending inspection device showing an embodiment of the present invention, Fig. 2 is a plan view showing the orientation of the laser displacement meter with respect to the IC, and Fig. 3 is a
Figure 4 is a side view showing another example of the structure of the IC lead bending inspection device shown in the figure, Figure 4 is a side view of a conventional example of the IC lead bending inspection equipment, and Figures 5a and 5b are the laser displacement meter shown in Figure 4. FIGS. 6A and 6B are a plan view and a BB sectional view showing the positional relationship between the IC and the laser displacement meter in FIG. 4. FIGS. 1...IC, 2...Lead, 3...Laser displacement meter, 4...Laser light, 5...Fixing jig, 6...Rotation mechanism, 7...X-axis drive mechanism, 8...Y-axis drive Mechanism, 9...column.
Claims (1)
リード面にレーザ光を照射しこのリード面より反
射するレーザ光を検知することにより前記リード
面の歪みを測定するレーザ変位計と、前記ＩＣを
載置する固定治具と、この固定治具を積載してＸ
軸及びＹ軸方向に移動させる駆動機構とを有する
ＩＣリード曲り検査装置において、前記固定治具
あるいは前記レーザ変位計を回転させ四等分に割
り出す回転機構とを備えることを特徴とするＩＣ
リード曲り検査装置。 A laser displacement meter that measures distortion of the lead surface by irradiating a laser beam onto the lead surface of an IC having leads protruding from four sides and detecting the laser beam reflected from the lead surface, and mounting the IC. Load the fixing jig and this fixing jig and
An IC lead bending inspection device having a driving mechanism for moving the IC lead in the axial and Y-axis directions, comprising a rotating mechanism that rotates the fixing jig or the laser displacement meter and divides it into four equal parts.
Lead bending inspection device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3503889U JPH02128511U (en) | 1989-03-27 | 1989-03-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3503889U JPH02128511U (en) | 1989-03-27 | 1989-03-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02128511U true JPH02128511U (en) | 1990-10-23 |
Family
ID=31540047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3503889U Pending JPH02128511U (en) | 1989-03-27 | 1989-03-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02128511U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03154802A (en) * | 1989-11-10 | 1991-07-02 | Matsushita Electric Ind Co Ltd | Instrument and method for measuring lead of electronic component |
-
1989
- 1989-03-27 JP JP3503889U patent/JPH02128511U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03154802A (en) * | 1989-11-10 | 1991-07-02 | Matsushita Electric Ind Co Ltd | Instrument and method for measuring lead of electronic component |
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