JPH0199273A - Optoelectronic integrated element - Google Patents

Optoelectronic integrated element

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Publication number
JPH0199273A
JPH0199273A JP25683487A JP25683487A JPH0199273A JP H0199273 A JPH0199273 A JP H0199273A JP 25683487 A JP25683487 A JP 25683487A JP 25683487 A JP25683487 A JP 25683487A JP H0199273 A JPH0199273 A JP H0199273A
Authority
JP
Japan
Prior art keywords
fet
electrode
layer
laser
active layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25683487A
Other languages
Japanese (ja)
Inventor
Shogo Takahashi
省吾 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP25683487A priority Critical patent/JPH0199273A/en
Publication of JPH0199273A publication Critical patent/JPH0199273A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To simply and inexpensively manufacture an LD-FET by forming a junction type FET by diffusing directly under the active region of a light emitting element. CONSTITUTION:Both sides of the active layer 2 of a substrate 1 formed with a laser layer are etched to form a mesa. Then, an SiO2 film 3 is formed on a whole, and the SiO2 of both sides of the mesa are partly removed. Then, with the SiO2 as a mask a substrate is etched, and P is diffused at 4. This diffusion is so controlled that the part directly under the active layer becomes the channel of an FET. Then, a gate electrode 5, a P-type electrode 6 and an N-type electrode 7 are formed. In operation, a current applied from the electrode 6 is injected to the layer 2 to irradiate a light, and a voltage is applied to the gate 3 to stop radiation of the light.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は光電子集積素子に関するものである。[Detailed description of the invention] [Industrial application field] The present invention relates to an optoelectronic integrated device.

〔従来の技術〕[Conventional technology]

第6図は例えばレーザとFET 1個を集積した縦型光
電子集積素子(LD−FET)の断面図である。図にお
いて(1)はn−InP基板、(2)はInGaAsP
活性層、(3)はStow、(4)はP拡散領域、6旧
よFET能動層、(5)はゲート電極、旬はドレイン電
極、同はソース電極、βυはFET層とレーザ層の分離
層、(6)はレーザのP1!極、(7)はn電極である
FIG. 6 is a cross-sectional view of a vertical optoelectronic integrated device (LD-FET) in which a laser and one FET are integrated, for example. In the figure, (1) is an n-InP substrate, and (2) is an InGaAsP substrate.
Active layer, (3) is Stow, (4) is P diffusion region, (6) is FET active layer, (5) is gate electrode, is drain electrode, is source electrode, βυ is separation between FET layer and laser layer layer, (6) is P1 of the laser! The pole (7) is an n-electrode.

次に作用について説明する。基板上に、まずレーザ層が
形成され、最上部にFET能動層(511および各電極
が形成され、両者は分離層δυで電気的に分離されてい
る。レーザを駆動する電流は、P電極(6)の直下のP
拡散領域(4)を通じて活性層(2)に注入される。
Next, the effect will be explained. A laser layer is first formed on the substrate, and an FET active layer (511) and each electrode are formed on the top, and both are electrically separated by a separation layer δυ.The current that drives the laser is applied to the P electrode ( 6) P directly below
It is implanted into the active layer (2) through the diffusion region (4).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の縦型LD−FETは以上のような構成のため、レ
ーザとFET 1個づつのような小規模な集積にもかか
わらず、結晶成長を多層に行なう必要があった。また、
素子の面積が大きくなる欠点があった。
Because of the above-described configuration of the conventional vertical LD-FET, it was necessary to perform crystal growth in multiple layers despite the small-scale integration of one laser and one FET. Also,
There was a drawback that the area of the element became large.

この発明は上記のような問題点を解消するためになされ
たもので、従来の装置、技術で簡単に、かつ、コンパク
トなLD−FETが安価にできることを目的とする。
This invention was made to solve the above-mentioned problems, and aims to make a compact LD-FET simple and inexpensive using conventional equipment and techniques.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る光・電子集積素子は、レーザの直下の基
板に対し、周囲を拡散することによって、(レーザに対
し)直列のJ−FETを形成したものである。
The opto-electronic integrated device according to the present invention has a J-FET in series (with respect to the laser) formed by diffusing the periphery of the substrate directly below the laser.

〔作用〕[Effect]

この発明における光・電子集積素子は、レーザの直下i
2:J−PETを作り付けたことにより、LD−FET
 カ従来の装置、技術のみで安価にかつ、コンパクトに
製造できる。
The opto-electronic integrated device in this invention is directly below the laser.
2: By building J-PET, LD-FET
It can be manufactured inexpensively and compactly using only conventional equipment and technology.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の実施例を図番こついて説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図〜第4図は、この発明の光電子集積素子の製造方
法の例、および構造を示すものである。第5図はその回
路図を示すものである。
FIGS. 1 to 4 show an example of a method of manufacturing an optoelectronic integrated device according to the present invention and its structure. FIG. 5 shows the circuit diagram.

@1図において、結晶成長を行ない、レーザ層を形成し
た基板(1)の活性層(2)の両側をエツチングするこ
とにより、メサを形成する。次に、全体にS i 02
 (33を形成し、メサの両側の5i02の一部を取り
除く。(第2図)SiOzをマスクとし、基板のエツチ
ングを行ない、P拡散(4)を行なう。(第3図)この
とき拡散は活性層の直下がFETのチャンネルとなるよ
うに制御して行なう。
In Figure 1, a mesa is formed by etching both sides of an active layer (2) of a substrate (1) on which crystal growth is performed and a laser layer is formed. Next, the entire S i 02
(33 is formed and a part of 5i02 on both sides of the mesa is removed. (Figure 2) Using SiOz as a mask, the substrate is etched and P diffusion (4) is performed. (Figure 3) At this time, the diffusion is This is controlled so that the area directly below the active layer becomes the channel of the FET.

第4図において、ゲート電極(5)、P電極(6)、n
電極(力を形成する。
In FIG. 4, the gate electrode (5), the P electrode (6), the n
Electrodes (forming forces)

次に、動作について説明する。P電極(6)より印加さ
れた電流は活性層(2)に注入されて発光するが、ゲー
ト(3)に電圧をかけることによってレーザは発光しな
くなる。すなわち、ゲート電圧のON 、 OFFによ
り、レーザは点滅する。
Next, the operation will be explained. A current applied from the P electrode (6) is injected into the active layer (2) and emits light, but by applying a voltage to the gate (3), the laser no longer emits light. That is, the laser blinks depending on whether the gate voltage is turned on or off.

なお、上記実施例は材料にInP系を使用したがGaA
s系等、他の材料でもよい。また、p M板を用いても
よい。また、レーザは埋込型としているが、他のタイプ
のレーザでもよいことは言うまでもない。
Note that although InP was used as the material in the above embodiment, GaA
Other materials such as s-based materials may also be used. Alternatively, a PM plate may be used. Further, although the laser is of an embedded type, it goes without saying that other types of lasers may be used.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明はレーザの活性層直下にJ−F
ETを形成したので、LD−FETが従来の装置および
技術で簡単、かつ安価にできるとともfこ、コンパクト
になる。
As described above, the present invention provides J-F directly under the active layer of the laser.
Because the ET is formed, the LD-FET is simple, inexpensive, and compact using conventional equipment and technology.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図〜第4図はこの発明の一実施例による光・電子集
積素子の製造方法および構造を示す断面図、第5図はそ
の回路図、第6図は従来の縦型光電子集積素子を示す断
面図である。図Cζおいて、(υはn−InP基板、(
2)はInGaAsP活性層、(3)は5i02、(4
)はP拡散領域、(5)はゲート電極、(6)はP電極
、(7)はn電極、6月よFET能a層、(2)はドレ
イン電極、qυはソース電極、i8υは分離層である。 尚、各図中、同一符号は同一または相当部分を示す。
1 to 4 are cross-sectional views showing a manufacturing method and structure of an optoelectronic integrated device according to an embodiment of the present invention, FIG. 5 is a circuit diagram thereof, and FIG. 6 is a diagram showing a conventional vertical optoelectronic integrated device. FIG. In figure Cζ, (υ is n-InP substrate, (
2) is InGaAsP active layer, (3) is 5i02, (4
) is the P diffusion region, (5) is the gate electrode, (6) is the P electrode, (7) is the n electrode, June FET function a layer, (2) is the drain electrode, qυ is the source electrode, i8υ is the separation It is a layer. In each figure, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims]  発光素子の活性領域直下に、拡散によつて接合型FE
Tを形成したことを特徴とする光電子集積素子。
A junction type FE is formed by diffusion directly under the active region of the light emitting device.
An optoelectronic integrated device characterized by forming a T.
JP25683487A 1987-10-12 1987-10-12 Optoelectronic integrated element Pending JPH0199273A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25683487A JPH0199273A (en) 1987-10-12 1987-10-12 Optoelectronic integrated element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25683487A JPH0199273A (en) 1987-10-12 1987-10-12 Optoelectronic integrated element

Publications (1)

Publication Number Publication Date
JPH0199273A true JPH0199273A (en) 1989-04-18

Family

ID=17298074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25683487A Pending JPH0199273A (en) 1987-10-12 1987-10-12 Optoelectronic integrated element

Country Status (1)

Country Link
JP (1) JPH0199273A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103765060A (en) * 2011-09-10 2014-04-30 伊格尔工业股份有限公司 Sliding component

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103765060A (en) * 2011-09-10 2014-04-30 伊格尔工业股份有限公司 Sliding component

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