JPH0187205U - - Google Patents

Info

Publication number
JPH0187205U
JPH0187205U JP18391287U JP18391287U JPH0187205U JP H0187205 U JPH0187205 U JP H0187205U JP 18391287 U JP18391287 U JP 18391287U JP 18391287 U JP18391287 U JP 18391287U JP H0187205 U JPH0187205 U JP H0187205U
Authority
JP
Japan
Prior art keywords
ultrasonic sensor
film thickness
oscillating part
substrate
ultrasonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18391287U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18391287U priority Critical patent/JPH0187205U/ja
Publication of JPH0187205U publication Critical patent/JPH0187205U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案のセンサの説明図、第2図A
および第2Bはそれぞれ異なる圧電体による基板
のみからの反射波のスペクトルを示す図、第3図
は極小部の周波数と膜厚の関係を示す図、第4図
Aおよび第4図Bはそれぞれ異なる膜厚と圧電体
による反射スペクトルを示す図、第5図は異なる
入射角における極小部の周波数と膜厚の関係を示
す図、第6図Aおよび第6図Bはそれぞれ異なる
膜厚と入射角による反射スペクトルを示す図であ
る。 10……被検体、12……膜、14……基板、
16……超音波伝搬媒体、17……遅延材、18
,19……圧電体(発振部用)、20,21……
圧電体(受振部用)、30……ホルダー、50…
…超音波センサ、51,52……発振部、53,
54……受振部。
Figure 1 is an explanatory diagram of the sensor of this invention, Figure 2A
and 2B are diagrams showing the spectra of reflected waves from only the substrates of different piezoelectric materials, Figure 3 is a diagram showing the relationship between the frequency of the minimum part and the film thickness, and Figures 4A and 4B are different from each other. Figure 5 shows the relationship between the frequency of the minimum part and the film thickness at different angles of incidence. Figures 6A and 6B show the relationship between the film thickness and the reflection spectrum due to the piezoelectric material, respectively. FIG. 10... Subject, 12... Membrane, 14... Substrate,
16...Ultrasonic propagation medium, 17...Delay material, 18
, 19...Piezoelectric body (for oscillation part), 20, 21...
Piezoelectric body (for vibration receiver), 30...Holder, 50...
...Ultrasonic sensor, 51, 52... Oscillator, 53,
54... Receiving section.

補正 昭63.5.25 図面の簡単な説明を次のように補正する。 明細書第12頁第10行目「第2B」を「第2
図B」と補正する。
Amendment May 25, 1983 The brief description of the drawing is amended as follows. “2nd B” on page 12, line 10 of the specification
Figure B”.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 基板とこの基板上に形成された膜とを有する被
検体の膜厚を測定するのに用いる超音波センサで
あつて、発振部より超音波を被検体に対して発振
し、その反射波を受振部で受振してそのスペクト
ル分布より前記被検体の膜厚を測定する超音波セ
ンサに於いて、前記発振部及び受振部を角度及び
/若しくは方向を変えて複数組設けたことを特色
とする超音波センサ。
This is an ultrasonic sensor used to measure the film thickness of a test object that has a substrate and a film formed on the substrate.It is an ultrasonic sensor that emits ultrasonic waves to the test object from an oscillating part and receives the reflected waves. The ultrasonic sensor is characterized in that a plurality of sets of the oscillating part and the receiving part are provided at different angles and/or directions, in the ultrasonic sensor that measures the film thickness of the object from the spectral distribution of the oscillating part. Sonic sensor.
JP18391287U 1987-12-02 1987-12-02 Pending JPH0187205U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18391287U JPH0187205U (en) 1987-12-02 1987-12-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18391287U JPH0187205U (en) 1987-12-02 1987-12-02

Publications (1)

Publication Number Publication Date
JPH0187205U true JPH0187205U (en) 1989-06-08

Family

ID=31475312

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18391287U Pending JPH0187205U (en) 1987-12-02 1987-12-02

Country Status (1)

Country Link
JP (1) JPH0187205U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04315909A (en) * 1991-04-15 1992-11-06 Toppan Printing Co Ltd Layer thickness measuring method
JP2020153810A (en) * 2019-03-20 2020-09-24 三菱電機株式会社 Liquid detection method and liquid detection device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4835883A (en) * 1971-09-09 1973-05-26
JPS6120803A (en) * 1984-07-10 1986-01-29 Toppan Printing Co Ltd Measuring method of film thickness

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4835883A (en) * 1971-09-09 1973-05-26
JPS6120803A (en) * 1984-07-10 1986-01-29 Toppan Printing Co Ltd Measuring method of film thickness

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04315909A (en) * 1991-04-15 1992-11-06 Toppan Printing Co Ltd Layer thickness measuring method
JP2020153810A (en) * 2019-03-20 2020-09-24 三菱電機株式会社 Liquid detection method and liquid detection device

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