JP7502244B2 - データ・サンプル生成方法 - Google Patents
データ・サンプル生成方法 Download PDFInfo
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- JP7502244B2 JP7502244B2 JP2021166399A JP2021166399A JP7502244B2 JP 7502244 B2 JP7502244 B2 JP 7502244B2 JP 2021166399 A JP2021166399 A JP 2021166399A JP 2021166399 A JP2021166399 A JP 2021166399A JP 7502244 B2 JP7502244 B2 JP 7502244B2
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- 238000005259 measurement Methods 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 16
- 238000005070 sampling Methods 0.000 description 10
- 238000012935 Averaging Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000013459 approach Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 239000000969 carrier Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000003467 diminishing effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/20—Increasing resolution using an n bit system to obtain n + m bits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
- H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
- H03M1/0658—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by calculating a running average of a number of subsequent samples
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0254—Circuits therefor for triggering, synchronisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0272—Circuits therefor for sampling
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/004—Reconfigurable analogue/digital or digital/analogue converters
- H03M1/005—Reconfigurable analogue/digital or digital/analogue converters among different converters types
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
- H03M1/1265—Non-uniform sampling
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- User Interface Of Digital Computer (AREA)
Description
上記ADCで実現可能な最小ADCサンプル期間Mに対する上記所定サンプル期間の比を整数に切り捨てることで、上記Kを求める処理と、
上記サブ測定間のクロック数(B)について、所定サンプル期間に対する平均化されるADCのサンプル数である上記Kの比から最小ADCサンプル期間(M)を引いた値を整数に切り捨てて求める処理と、
上記所定サンプル期間の最後のサブ測定後のクロック数(E)について、所定サンプル期間(L)から平均化されるADCのサンプル数(K)と最小ADCサンプル期間(M)との積及び平均化されるADCのサンプル数(K)から1を引いた値(K-1)とサブ測定間のクロック数(B)の積を引いて求める処理と、
上記K個の上記サブ測定それぞれの開始部分を上記所定サンプル期間内に所定の間隔で配置する処理と、
(K-1)個のADCサンプルのグループそれぞれの終了部分を上記サブ測定間の上記クロック数(B)だけ間隔を空ける処理と、
上記最後のサブ測定の後に上記クロック数(E)を空ける処理と、
上記K個の上記サブ測定それぞれの平均を上記データ・サンプルとして出力する処理と
を具えている。
K 平均化されるサブ測定の個数
B サブ測定間のクロック数
E 最後のサブ測定後のクロック数
N サンプル期間(測定)の繰り返す回数
M システム・クロックの個数
Claims (1)
- 所定サンプル期間が与えられたときに、上記所定サンプル期間内にアナログ・デジタル・コンバータ(ADC)で取ることが可能な最大サンプル数L個のサンプルの中のK個のサブ測定中のサンプルの平均をそれぞれ表すデータ・サンプルを生成する方法であって、
上記ADCで実現可能な最小ADCサンプル期間Mに対する上記所定サンプル期間の比を整数に切り捨てることで、上記Kを求める処理と、
上記サブ測定間のクロック数(B)について、所定サンプル期間に対する平均化されるADCのサンプル数である上記Kの比から最小ADCサンプル期間(M)を引いた値を整数に切り捨てて求める処理と、
上記所定サンプル期間の最後のサブ測定後のクロック数(E)について、所定サンプル期間(L)から平均化されるADCのサンプル数(K)と最小ADCサンプル期間(M)との積及び平均化されるADCのサンプル数(K)から1を引いた値(K-1)とサブ測定間のクロック数(B)の積を引いて求める処理と、
上記K個の上記サブ測定それぞれの開始部分を上記所定サンプル期間内に所定の間隔で配置する処理と、
(K-1)個のADCサンプルのグループそれぞれの終了部分を上記サブ測定間の上記クロック数(B)だけ間隔を空ける処理と、
上記最後のサブ測定の後に上記クロック数(E)を空ける処理と、
上記K個の上記サブ測定それぞれの平均を上記データ・サンプルとして出力する処理と
を具えるデータ・サンプル生成方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201462079754P | 2014-11-14 | 2014-11-14 | |
US62/079754 | 2014-11-14 | ||
US14/568,904 US9197236B1 (en) | 2014-11-14 | 2014-12-12 | Digitizer auto aperture with trigger spacing |
US14/568904 | 2014-12-12 | ||
JP2015224158A JP2016103820A (ja) | 2014-11-14 | 2015-11-16 | データ・サンプル生成方法 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015224158A Division JP2016103820A (ja) | 2014-11-14 | 2015-11-16 | データ・サンプル生成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022003829A JP2022003829A (ja) | 2022-01-11 |
JP7502244B2 true JP7502244B2 (ja) | 2024-06-18 |
Family
ID=54542979
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015224158A Pending JP2016103820A (ja) | 2014-11-14 | 2015-11-16 | データ・サンプル生成方法 |
JP2021166399A Active JP7502244B2 (ja) | 2014-11-14 | 2021-10-08 | データ・サンプル生成方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
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JP2015224158A Pending JP2016103820A (ja) | 2014-11-14 | 2015-11-16 | データ・サンプル生成方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9197236B1 (ja) |
EP (1) | EP3021490A1 (ja) |
JP (2) | JP2016103820A (ja) |
CN (1) | CN105656487B (ja) |
TW (1) | TW201633722A (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9197236B1 (en) * | 2014-11-14 | 2015-11-24 | Tektronix, Inc. | Digitizer auto aperture with trigger spacing |
CN108572272A (zh) * | 2017-12-26 | 2018-09-25 | 深圳市鼎阳科技有限公司 | 一种提高万用表测量精度的方法和万用表 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000187087A (ja) | 1998-12-24 | 2000-07-04 | Yokogawa Electric Corp | 測定装置 |
JP2002118463A (ja) | 2000-08-22 | 2002-04-19 | Lucent Technol Inc | デジタル・サンプル値を結合することによるアナログ・デジタル変換のための方法およびシステム |
JP2006003325A (ja) | 2004-06-21 | 2006-01-05 | Anritsu Corp | サンプリング装置および波形観測システム |
JP2016103820A (ja) | 2014-11-14 | 2016-06-02 | ケースレー・インスツルメンツ・インコーポレイテッドKeithley Instruments,Inc. | データ・サンプル生成方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS58104522A (ja) * | 1981-12-16 | 1983-06-22 | Nippon Denso Co Ltd | アナログ・デイジタル変換方法 |
US4982193A (en) * | 1986-01-30 | 1991-01-01 | Plessey Overseas Limited | Analogue to digital conversion: method and apparatus therefor |
US4791404A (en) * | 1986-03-03 | 1988-12-13 | Tektronix, Inc. | Predictive time base control circuit for a waveform system |
EP0235899B1 (en) * | 1986-03-03 | 1993-03-31 | Tektronix, Inc. | Predictive time base control circuit for a waveform sampling system |
JPH04331991A (ja) * | 1991-05-07 | 1992-11-19 | Casio Comput Co Ltd | 楽音制御装置 |
JPH06139023A (ja) * | 1992-10-23 | 1994-05-20 | Nippon Koden Corp | サンプリング方法及び回路 |
JPH0919413A (ja) * | 1995-07-06 | 1997-01-21 | Ge Yokogawa Medical Syst Ltd | Mriの被検体体重計測方法、mri装置及びテーブル装置 |
DE69721249T2 (de) * | 1997-09-19 | 2004-01-29 | Alcatel Sa | Verfahren zur Auswahl einer Zellenfolge in einer zweidimensionalen Matrixstruktur eines Digital-Analog-Wandlers und nach diesem Verfahren arbeitender Wandler |
US6486809B1 (en) * | 1999-06-02 | 2002-11-26 | Texas Instruments Incorporated | Analog to digital converter with configurable sequence controller |
JP3870089B2 (ja) * | 2001-12-27 | 2007-01-17 | 富士通テン株式会社 | A/d変換装置、及び信号処理システム |
JP4039295B2 (ja) * | 2003-04-04 | 2008-01-30 | 株式会社デンソー | ノッキング検出装置 |
JP4476700B2 (ja) * | 2004-05-31 | 2010-06-09 | アンリツ株式会社 | サンプリング装置および波形観測システム |
US20070252747A1 (en) * | 2006-04-28 | 2007-11-01 | Colin Lyden | No-missing-code analog to digital converter system and method |
US8755460B2 (en) * | 2010-07-30 | 2014-06-17 | National Instruments Corporation | Phase aligned sampling of multiple data channels using a successive approximation register converter |
US8223057B2 (en) * | 2010-09-30 | 2012-07-17 | Schneider Electric USA, Inc. | Quantizing sampled inputs using fixed frequency analog to digital conversions through interpolation |
US8618975B2 (en) * | 2011-10-26 | 2013-12-31 | Semtech Corporation | Multi-bit successive approximation ADC |
JP5616948B2 (ja) * | 2012-02-16 | 2014-10-29 | 株式会社半導体理工学研究センター | マルチビットのデルタシグマ型タイムデジタイザ回路及びその校正方法 |
US9626335B2 (en) * | 2013-01-17 | 2017-04-18 | Honeywell International Inc. | Field device including a software configurable analog to digital converter system |
-
2014
- 2014-12-12 US US14/568,904 patent/US9197236B1/en active Active
-
2015
- 2015-11-13 TW TW104137528A patent/TW201633722A/zh unknown
- 2015-11-14 CN CN201510973900.9A patent/CN105656487B/zh active Active
- 2015-11-16 JP JP2015224158A patent/JP2016103820A/ja active Pending
- 2015-11-16 EP EP15194831.2A patent/EP3021490A1/en not_active Withdrawn
-
2021
- 2021-10-08 JP JP2021166399A patent/JP7502244B2/ja active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000187087A (ja) | 1998-12-24 | 2000-07-04 | Yokogawa Electric Corp | 測定装置 |
JP2002118463A (ja) | 2000-08-22 | 2002-04-19 | Lucent Technol Inc | デジタル・サンプル値を結合することによるアナログ・デジタル変換のための方法およびシステム |
JP2006003325A (ja) | 2004-06-21 | 2006-01-05 | Anritsu Corp | サンプリング装置および波形観測システム |
JP2016103820A (ja) | 2014-11-14 | 2016-06-02 | ケースレー・インスツルメンツ・インコーポレイテッドKeithley Instruments,Inc. | データ・サンプル生成方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201633722A (zh) | 2016-09-16 |
US9197236B1 (en) | 2015-11-24 |
EP3021490A1 (en) | 2016-05-18 |
JP2022003829A (ja) | 2022-01-11 |
CN105656487A (zh) | 2016-06-08 |
CN105656487B (zh) | 2022-02-11 |
JP2016103820A (ja) | 2016-06-02 |
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