JP7410979B2 - Polarizing plate liquid crystal unevenness inspection device and polarizing plate liquid crystal unevenness inspection method - Google Patents

Polarizing plate liquid crystal unevenness inspection device and polarizing plate liquid crystal unevenness inspection method Download PDF

Info

Publication number
JP7410979B2
JP7410979B2 JP2021568603A JP2021568603A JP7410979B2 JP 7410979 B2 JP7410979 B2 JP 7410979B2 JP 2021568603 A JP2021568603 A JP 2021568603A JP 2021568603 A JP2021568603 A JP 2021568603A JP 7410979 B2 JP7410979 B2 JP 7410979B2
Authority
JP
Japan
Prior art keywords
polarizing plate
liquid crystal
light
polarizing
unevenness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021568603A
Other languages
Japanese (ja)
Other versions
JP2022532427A (en
Inventor
ジェ・イル・リュ
テク・グン・ナム
ジェ・ヒュク・ユ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LG Chem Ltd
Original Assignee
LG Chem Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LG Chem Ltd filed Critical LG Chem Ltd
Publication of JP2022532427A publication Critical patent/JP2022532427A/en
Application granted granted Critical
Publication of JP7410979B2 publication Critical patent/JP7410979B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14Protective coatings, e.g. hard coatings
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3016Polarising elements involving passive liquid crystal elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3083Birefringent or phase retarding elements
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N2021/216Polarisation-affecting properties using circular polarised light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N2021/218Measuring properties of electrooptical or magnetooptical media
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8848Polarisation of light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • G01N2021/945Liquid or solid deposits of macroscopic size on surfaces, e.g. drops, films, or clustered contaminants
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00Function characteristic
    • G02F2203/69Arrangements or methods for testing or calibrating a device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Polarising Elements (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Electroluminescent Light Sources (AREA)

Description

本出願は偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法に関する。 The present application relates to an apparatus for inspecting liquid crystal unevenness on a polarizing plate and a method for inspecting liquid crystal unevenness on a polarizing plate.

本出願は2019年06月07日付韓国特許出願第10-2019-0067543に基づいた優先権の利益を主張し、該当韓国特許出願の文献に開示されたすべての内容は本明細書の一部として含まれる。 This application claims the benefit of priority based on Korean Patent Application No. 10-2019-0067543 dated June 7, 2019, and all contents disclosed in the documents of the corresponding Korean patent application are incorporated herein by reference. included.

有機発光表示装置(OLED、Organic light emitting display)はモバイルおよびTVなどの多様な用途に拡大している。 Organic light emitting displays (OLEDs) are expanding into diverse applications such as mobile and TV.

このような有機発光表示装置は、下部に金属電極により外部から印加される面光源を反射させて明室環境でのパネル視認性が悪化するため、偏光板を含む。 Such organic light emitting display devices include a polarizing plate at the bottom of the organic light emitting display because the metal electrode reflects a surface light source applied from the outside, resulting in poor panel visibility in a bright room environment.

偏光板は反射光を遮断するために、光の位相を1/4回り回す1/4波長板(QWP、Quarter wave plate)を含む。このような1/4波長板は高分子フィルムまたは液晶コーティングで具現することができる。しかし、1/4波長板で液晶コーティングを具現する場合、液晶層の厚さの偏差や押されなどによって反射時の色感が異なって見える液晶ムラが発生する問題が発生した。 The polarizing plate includes a quarter wave plate (QWP) that rotates the phase of light by 1/4 to block reflected light. Such a quarter-wave plate may be implemented using a polymer film or a liquid crystal coating. However, when a quarter-wave plate is used to implement a liquid crystal coating, a problem arises in that liquid crystal unevenness occurs in which the color appearance upon reflection appears different due to deviations in the thickness of the liquid crystal layer or when the liquid crystal layer is pressed.

このような液晶ムラは一般の検査方法では確認が難しく、偏光板の完成品上に保護フィルムおよび/または離型フィルムが付着されている時にさらに確認が難しい問題が発生した。したがって、このような問題点を解決するための偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法が要求されている。 Such liquid crystal unevenness is difficult to confirm using general inspection methods, and even more difficult to confirm occurs when a protective film and/or a release film is attached to the finished polarizing plate. Therefore, there is a need for an apparatus for inspecting liquid crystal unevenness on a polarizing plate and a method for inspecting liquid crystal unevenness on a polarizing plate in order to solve these problems.

本出願の課題は、偏光板に発生する液晶ムラを優秀な視認性で容易に検査できる偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法を提供することである。 An object of the present application is to provide a polarizing plate liquid crystal unevenness inspection device and a polarizing plate liquid crystal unevenness inspection method that can easily inspect liquid crystal unevenness occurring on a polarizing plate with excellent visibility.

上記課題を解決するために本出願の偏光板の液晶ムラ検査装置は、面光源、前記面光源から光が印加されるように配置された第1偏光部材、前記第1偏光部材を透過した光が印加されるように配置されて前記印加された光を反射する偏光板、前記偏光板から反射した光が印加されるように配置された第2偏光部材、および前記第2偏光部材を透過した光が印加されるように配置され、前記第2偏光部材を透過した光に基づいて前記偏光板の液晶ムラを判断する検査源を含み、前記偏光板は偏光子、および液晶フィルムを含む1/4波長板を順次含み、前記第1偏光部材を透過した光は前記偏光板の1/4波長板に印加される。 In order to solve the above problems, the liquid crystal unevenness inspection device for a polarizing plate of the present application includes a surface light source, a first polarizing member arranged so that light is applied from the surface light source, and light transmitted through the first polarizing member. a polarizing plate arranged so that the applied light is applied thereto and reflects the applied light, a second polarizing member arranged so that the light reflected from the polarizing plate is applied, and the light transmitted through the second polarizing member an inspection source disposed to apply light and determining liquid crystal unevenness of the polarizing plate based on the light transmitted through the second polarizing member, the polarizing plate including a polarizer and a liquid crystal film; The device includes four wavelength plates in sequence, and the light transmitted through the first polarizing member is applied to the quarter wavelength plate of the polarizing plate.

また、前記面光源は前記第1偏光部材側に無偏光の光を放出することができる。 Further, the surface light source can emit unpolarized light toward the first polarizing member.

また、前記面光源から放出される光は前記偏光板に対する入射角が30°~60°であり得る。 Furthermore, the light emitted from the surface light source may have an incident angle of 30° to 60° with respect to the polarizing plate.

また、前記第1偏光部材は前記偏光板の偏光子と吸収軸が垂直し得る。 Further, the absorption axis of the first polarizing member may be perpendicular to the polarizer of the polarizing plate.

また、前記偏光板は保護フィルムおよび離型フィルムをさらに含み、保護フィルム、偏光子、1/4波長板および離型フィルムを順次含むことができる。 In addition, the polarizing plate may further include a protective film and a release film, and may sequentially include a protective film, a polarizer, a quarter-wave plate, and a release film.

また、前記偏光板は有機発光表示装置用偏光板であり得る。 Further, the polarizing plate may be a polarizing plate for an organic light emitting display device.

また、前記液晶フィルムは基材フィルムおよび液晶層を順次含むことができる。 Further, the liquid crystal film may sequentially include a base film and a liquid crystal layer.

また、前記液晶層は重合性液晶化合物を重合された状態で含むことができる。 Further, the liquid crystal layer may include a polymerizable liquid crystal compound in a polymerized state.

また、前記第1偏光部材を透過した光は前記偏光板の偏光子で反射され得る。 Also, the light transmitted through the first polarizing member may be reflected by a polarizer of the polarizing plate.

また、前記偏光板の偏光子から反射して放出される光は前記偏光板に対する反射角が30°~60°であり得る。 Further, the light reflected and emitted from the polarizer of the polarizing plate may have a reflection angle of 30° to 60° with respect to the polarizing plate.

また、前記第2偏光部材は前記偏光板の偏光子と吸収軸が平行し得る。 Further, the absorption axis of the second polarizing member may be parallel to the polarizer of the polarizing plate.

また、前記第2偏光部材は前記偏光板から反射した光が印加され得る。 Further, the second polarizing member may be applied with light reflected from the polarizing plate.

また、本出願の偏光板の液晶ムラ検査方法は前記偏光板の液晶ムラ検査装置を利用した偏光板の液晶ムラ検査方法に関し、面光源から光を放出させて第1偏光部材、偏光板、第2偏光部材を順次透過させる段階、および前記第2偏光部材を透過して前記検査源に印加される光に基づいて前記偏光板の液晶ムラを判断する段階を含む。 Further, the method for inspecting liquid crystal unevenness on a polarizing plate of the present application relates to a method for inspecting liquid crystal unevenness on a polarizing plate using the liquid crystal unevenness inspection device for a polarizing plate, in which light is emitted from a surface light source, and the first polarizing member, the polarizing plate, the first The method includes sequentially transmitting light through two polarizing members, and determining liquid crystal unevenness of the polarizing plate based on light transmitted through the second polarizing member and applied to the inspection source.

また、前記偏光板に印加された光は反射され得る。 Furthermore, the light applied to the polarizing plate may be reflected.

本出願の偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法によると、偏光板に発生する液晶ムラを優秀な視認性で容易に検査することができる。 According to the device for inspecting liquid crystal unevenness on a polarizing plate and the method for inspecting liquid crystal unevenness on a polarizing plate of the present application, liquid crystal unevenness occurring on a polarizing plate can be easily inspected with excellent visibility.

本出願の一実施例に係る偏光板の液晶ムラ検査装置を示した図面である。1 is a drawing showing a liquid crystal unevenness inspection device for a polarizing plate according to an embodiment of the present application. 本出願の一実施例に係る偏光板を示した図面である。1 is a drawing showing a polarizing plate according to an embodiment of the present application.

以下、添付された図面を参照で本出願の偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法を説明し、添付された図面は例示的なものであって、本出願の偏光板の液晶ムラ検査装置および偏光板の液晶ムラ検査方法は添付された図面に制限されるものではない。 Hereinafter, the apparatus for inspecting liquid crystal unevenness of a polarizing plate and the method of inspecting liquid crystal unevenness of a polarizing plate of the present application will be explained with reference to the attached drawings. The liquid crystal unevenness inspection device and the liquid crystal unevenness inspection method for a polarizing plate are not limited to the attached drawings.

図1は、本出願の一実施例に係る偏光板の液晶ムラ検査装置を示した図面である。図1に示した通り、本出願の偏光板の液晶ムラ検査装置は、面光源100、第1偏光部材200、偏光板300、第2偏光部材400および検査源500を含む。図2は、本出願の一実施例に係る偏光板を示した図面である。図2に示した通り、上記偏光板300は偏光子320、および1/4波長板330を順次含む。また、上記1/4波長板330は液晶フィルム(図示されず)を含む。また、上記第1偏光部材を透過した光は上記偏光板300の1/4波長板330に印加される。本出願の偏光板の液晶ムラ検査装置は偏光板300に発生する液晶ムラ10を優秀な視認性で容易に検査することができる。 FIG. 1 is a drawing showing a liquid crystal unevenness inspection device for a polarizing plate according to an embodiment of the present application. As shown in FIG. 1, the polarizing plate liquid crystal unevenness inspection apparatus of the present application includes a surface light source 100, a first polarizing member 200, a polarizing plate 300, a second polarizing member 400, and an inspection source 500. FIG. 2 is a diagram showing a polarizing plate according to an embodiment of the present application. As shown in FIG. 2, the polarizing plate 300 includes a polarizer 320 and a quarter wavelength plate 330 in sequence. Further, the quarter wavelength plate 330 includes a liquid crystal film (not shown). Further, the light transmitted through the first polarizing member is applied to the quarter wavelength plate 330 of the polarizing plate 300. The polarizing plate liquid crystal unevenness inspection apparatus of the present application can easily inspect liquid crystal unevenness 10 occurring on the polarizing plate 300 with excellent visibility.

本明細書で用語「順次位置する」は、それぞれの構成が直列構造で平行に位置した状態を意味し得る。 As used herein, the term "sequentially located" may refer to a state in which the respective components are located in parallel in a serial structure.

上記面光源100は表面が均一に光り厚さがない光源であって、従来の点または線の形態の光源と区別され得る。一つの例示において、本出願で液晶ムラは不規則に形成された不定形のムラであって、点光源を導光板によって拡散させずに利用する場合、液晶ムラの視認性が落ちるため、面光源を利用して上記偏光板の液晶ムラを検査することができる。 The surface light source 100 has a uniform surface and no thickness, and can be distinguished from conventional point or line light sources. In one example, the liquid crystal unevenness in this application is an irregularly formed unevenness, and when a point light source is used without being diffused by a light guide plate, the visibility of the liquid crystal unevenness decreases, so a surface light source is used. The liquid crystal unevenness of the polarizing plate can be inspected using the following method.

上記面光源100は多様な方向に振動する無偏光の光を放出することができる。上記面光源100としては、多様な白色光を発するか、または可視光線領域のスペクトル範囲で連続的なスペクトルを有する多様な類型の面光源ランプを使うことができる。上記面光源として無偏光の光を使うことによって、上記偏光板の液晶ムラ検査装置の製作費および維持費が安価となり得る。もう一つの例示において、上記面光源100としては、点光源や線光源を導光板によって拡散させて面光源と同一の機能を遂行する光を利用することができる。 The surface light source 100 can emit unpolarized light that vibrates in various directions. As the surface light source 100, various types of surface light source lamps that emit various kinds of white light or have continuous spectra in the visible light region can be used. By using unpolarized light as the surface light source, the manufacturing cost and maintenance cost of the polarizing plate liquid crystal unevenness inspection device can be reduced. In another example, the surface light source 100 may use light that performs the same function as a surface light source by diffusing a point light source or a line light source using a light guide plate.

上記面光源100は上記第1偏光部材200側に無偏光の光を放出することができる。上記無偏光の光が放出された面光源100は上記第1偏光部材200を透過しながら、上記第1偏光部材200の透過軸と平行な方向に偏光され得る。 The surface light source 100 can emit unpolarized light toward the first polarizing member 200. The surface light source 100 emitting the unpolarized light may be polarized in a direction parallel to the transmission axis of the first polarizing member 200 while passing through the first polarizing member 200 .

また、上記面光源100は光量を調節することができる。例えば、上記面光源100は光量を高く調節することによって、視認性を向上させることができる。 Furthermore, the amount of light of the surface light source 100 can be adjusted. For example, visibility of the surface light source 100 can be improved by adjusting the amount of light to a high level.

また、上記面光源100から放出された光は入射角を調節することができる。一つの例示において、上記面光源100から放出された光は上記偏光板300に対する入射角が30°~60°であり得る。例えば、上記偏光板300に対する上記面光源100から放出された光の入射角は35°~55°または40°~50°であり得る。上記面光源100から放出された光の入射角が前述した範囲を満足することによって、液晶ムラの視認性が優秀となり得る。また、上記光源100から放出された光の入射角が前述した範囲に比べて低い場合、視感の差が小さいため検出が難しく、前述した範囲に比べて高い場合、表面の反射が多いため液晶ムラの検出が困難であり得る。 Furthermore, the incident angle of the light emitted from the surface light source 100 can be adjusted. In one example, the light emitted from the surface light source 100 may have an incident angle with respect to the polarizing plate 300 of 30° to 60°. For example, the incident angle of the light emitted from the surface light source 100 to the polarizing plate 300 may be 35° to 55° or 40° to 50°. When the incident angle of the light emitted from the surface light source 100 satisfies the above range, the visibility of liquid crystal unevenness can be excellent. Furthermore, if the incident angle of the light emitted from the light source 100 is lower than the above-mentioned range, it is difficult to detect because the difference in visual perception is small, and if it is higher than the above-mentioned range, there is a lot of reflection on the surface of the liquid crystal display. Detection of unevenness can be difficult.

上記第1偏光部材200は上記面光源から放出された光を特定の方向に偏光させるための部分であって、上記面光源から光が印加されるように配置され得る。 The first polarizing member 200 is a part for polarizing the light emitted from the surface light source in a specific direction, and may be disposed so that the light from the surface light source is applied.

本明細書で用語「偏光部材および偏光子」は、いずれか一方向に形成された透過軸を有し、かつ入射光に対して非等方性透過特性を示す機能性層を意味し得る。例えば、偏光部材および偏光子は多様な方向に振動する入射光から、いずれか一方向に振動する光は透過し、残りの方向に振動する光は反射または吸収して遮断する機能を有することができる。このような偏光子は例えば、反射型偏光子または吸収型偏光子であり得、本出願の第1偏光部材、第2偏光部材および偏光子は吸収型偏光子であり得る。 As used herein, the term "polarizing member and polarizer" may mean a functional layer that has a transmission axis formed in any one direction and exhibits anisotropic transmission characteristics with respect to incident light. For example, polarizing members and polarizers may have the function of transmitting light that vibrates in one direction from incident light that vibrates in various directions, and reflecting or absorbing and blocking light that vibrates in the remaining directions. can. Such a polarizer can be, for example, a reflective polarizer or an absorbing polarizer, and the first polarizing member, the second polarizing member and the polarizer of the present application can be absorbing polarizers.

本明細書で用語「吸収型偏光子」は多様な方向に振動する入射光から、透過軸と平行な方向を有する光は透過し、残りの方向に振動する光は吸収して遮断する層を意味し得る。一つの例示において、吸収型偏光子は面方向に互いに直交する透過軸および吸収軸を有することができる。例えば、上記透過軸と吸収軸がなす角度が85°~95°または90°を形成することができ、上記透過軸と平行な方向に振動する光は透過することができ、吸収軸と平行な方向に振動する光は反射または吸収することができる。 As used herein, the term "absorption polarizer" refers to a layer that transmits light having a direction parallel to the transmission axis from incident light vibrating in various directions, and absorbs and blocks light vibrating in the remaining directions. It can mean something. In one example, an absorptive polarizer can have a transmission axis and an absorption axis that are perpendicular to each other in the plane direction. For example, the angle between the transmission axis and the absorption axis may form 85° to 95° or 90°, and light vibrating in a direction parallel to the transmission axis can be transmitted, and light vibrating in a direction parallel to the absorption axis can be transmitted. Light that oscillates in a direction can be reflected or absorbed.

本明細書で角度を定義するにおいて、垂直、平行、直交または水平などの用語を使う場合、これは目的とする効果を損傷させない範囲での実質的な垂直、平行、直交または水平を意味するものであり、例えば、製造誤差(error)または偏差(variation)等を勘案した誤差を含むものである。例えば、上記それぞれの場合は、約±15°以内の誤差、約±10°以内の誤差または約±5°以内の誤差を含むことができる。 In defining angles herein, when we use terms such as vertical, parallel, orthogonal, or horizontal, we mean substantially vertical, parallel, perpendicular, or horizontal to the extent that the desired effect is not impaired. For example, it includes errors that take into account manufacturing errors, deviations, and the like. For example, each of the above cases may include an error within about ±15°, an error within about ±10°, or an error within about ±5°.

上記吸収型偏光子としては、この分野で公知になっている通常の吸収型偏光子を使うことができる。例えば、上記吸収型偏光子としてはヨウ素化合物または有機染料で染色された延伸された重合体膜、例えば、ポリビニルアルコール(PVA)フィルムなどを使うことができる。このような吸収型偏光子は通常的に透過軸および上記透過軸に直交する吸収軸を有することができる。 As the above-mentioned absorption type polarizer, a normal absorption type polarizer known in this field can be used. For example, the absorption polarizer may be a stretched polymer film dyed with an iodine compound or an organic dye, such as a polyvinyl alcohol (PVA) film. Such absorptive polarizers can typically have a transmission axis and an absorption axis orthogonal to the transmission axis.

一つの例示において、上記第1偏光部材200は上記偏光板300の偏光子320と吸収軸が垂直し得る。具体的には、上記第1偏光部材200が第1方向(左右方向の矢印で図示)に吸収軸を有する場合、上記偏光板300の偏光子320は上記第1偏光部材200の吸収軸と直交する第2方向(上下方向の矢印で図示)に吸収軸を有することができ、上記第1偏光部材200および偏光板300の偏光子320はそれぞれの吸収軸と直交する方向(図示されず)に透過軸を有することができる。上記第1偏光部材および偏光板の偏光子は吸収軸を垂直に有することによって、後述するように、上記第1偏光部材200を透過して線偏光された光が上記偏光板300の1/4波長板330を経て円偏光された光を形成し、上記円偏光された光が上記偏光板300の偏光子320により、具体的には、上記偏光板300の偏光子320と後述する保護フィルム310の界面によって反射され得る。 In one example, the absorption axis of the first polarizing member 200 may be perpendicular to the polarizer 320 of the polarizing plate 300. Specifically, when the first polarizing member 200 has an absorption axis in a first direction (indicated by left-right arrows), the polarizer 320 of the polarizing plate 300 is perpendicular to the absorption axis of the first polarizing member 200. The first polarizing member 200 and the polarizer 320 of the polarizing plate 300 may have absorption axes in a second direction (indicated by vertical arrows), and the polarizers 320 of the first polarizing member 200 and the polarizing plate 300 may have absorption axes in a direction perpendicular to their respective absorption axes (not shown). It can have a transmission axis. Since the polarizers of the first polarizing member and the polarizing plate have vertical absorption axes, as will be described later, the light transmitted through the first polarizing member 200 and linearly polarized is 1/4 of the polarizing plate 300. Circularly polarized light is formed through the wavelength plate 330, and the circularly polarized light is passed through the polarizer 320 of the polarizing plate 300, specifically, the polarizer 320 of the polarizing plate 300 and the protective film 310 described below. can be reflected by the interface of

上記偏光板300は液晶ムラ10を検査するための測定対象となるサンプルであって、検査部(図示されず)に含まれ得る。例えば、上記偏光板300は検査部上に配置され得る。 The polarizing plate 300 is a sample to be measured for inspecting the liquid crystal unevenness 10, and may be included in an inspection section (not shown). For example, the polarizing plate 300 may be placed on the inspection unit.

上記偏光板300は上記第1偏光部材200を透過した光が印加されるように配置されて上記印加された光を反射する。例えば、上記第1偏光部材200を透過して線偏光された光が、上記偏光板300の1/4波長板330を経て円偏光された光を形成し、上記円偏光された光が上記偏光板300の偏光子320により、具体的には、上記偏光板300の偏光子320と後述する保護フィルム310の界面によって反射され得る。上記偏光板300の偏光子320で光を反射させることによって、右円偏光から左円偏光または左円偏光から右円偏光に反射させることができる。 The polarizing plate 300 is arranged to receive the light transmitted through the first polarizing member 200 and reflects the applied light. For example, the linearly polarized light that passes through the first polarizing member 200 passes through the quarter-wave plate 330 of the polarizing plate 300 to form circularly polarized light, and the circularly polarized light becomes the polarized light. The light may be reflected by the polarizer 320 of the plate 300, specifically, by the interface between the polarizer 320 of the polarizing plate 300 and the protective film 310 described below. By reflecting the light with the polarizer 320 of the polarizing plate 300, the light can be reflected from right-handed circularly polarized light to left-handed circularly polarized light or from left-handed circularly polarized light to right-handed circularly polarized light.

また、図2に示した通り、上記偏光板300は保護フィルム310および離型フィルム340をさらに含むことができる。具体的には、上記偏光板300は保護フィルム310、偏光子320、1/4波長板330および離型フィルム340を順次含むことができる。上記偏光板300が保護フィルム310および離型フィルム340をさらに含む場合、上記第1偏光部材200を透過した光は上記偏光板300の離型フィルム340に印加されて透過され得る。 Further, as shown in FIG. 2, the polarizing plate 300 may further include a protective film 310 and a release film 340. Specifically, the polarizing plate 300 may sequentially include a protective film 310, a polarizer 320, a quarter wavelength plate 330, and a release film 340. When the polarizing plate 300 further includes a protective film 310 and a release film 340, the light transmitted through the first polarizing member 200 may be applied to the release film 340 of the polarizing plate 300 and transmitted therethrough.

上記保護フィルム310は上記偏光子320を保護するために付着されるフィルムであって、TACシートのようにこの分野で公知になっている偏光子用保護フィルムであり得るが、これに制限されるものではない。 The protective film 310 is a film attached to protect the polarizer 320, and may be a protective film for polarizers that is known in this field, such as a TAC sheet, but is not limited thereto. It's not a thing.

また、上記偏光板300は後述する有機発光表示装置に適用時、上記偏光板300をパネルに付着させることができる粘着剤層(図示されず)をさらに含み、上記粘着剤層を保護するために、上記離型フィルム340が上記粘着剤層に付着され得る。具体的には、上記粘着剤層は上記1/4波長板と離型フィルムの間に形成され得る。上記粘着剤層はアクリル系粘着剤、シリコン系粘着剤またはウレタン系粘着剤からなり得、上記離型フィルムとしてポリエチレンテレフタレート系フィルムまたはポリオレフィン系フィルムなどが使われ得る。 In addition, the polarizing plate 300 further includes an adhesive layer (not shown) capable of attaching the polarizing plate 300 to a panel when applied to an organic light emitting display device (to be described later), to protect the adhesive layer. , the release film 340 may be attached to the adhesive layer. Specifically, the adhesive layer may be formed between the quarter wavelength plate and the release film. The adhesive layer may be made of an acrylic adhesive, a silicone adhesive, or a urethane adhesive, and the release film may be a polyethylene terephthalate film or a polyolefin film.

一つの例示において、上記偏光板300は有機発光表示装置用偏光板であり得る。具体的には、有機発光表示装置は電極の露出によって太陽光、照明などの外光の反射に脆弱であるという短所があるため、電源OFF状態で表面の外光の反射を遮断し、暗い視感を有するために線偏光された光を作るための偏光子と、円偏光された光を作るための1/4波長板を含む偏光板を含むことができる。しかし、液晶表示装置は二枚の偏光板間に液晶を利用して光の進行方向を変えたり光の強さを調節する透過型表示装置であって、上記偏光板に線偏光された光を作る偏光子を含むが1/4波長板を必要としない。 In one example, the polarizing plate 300 may be a polarizing plate for an organic light emitting display. Specifically, organic light emitting display devices have the disadvantage that they are vulnerable to the reflection of external light such as sunlight and lighting due to the exposed electrodes. A polarizing plate including a polarizer for producing linearly polarized light and a quarter wave plate for producing circularly polarized light can be included. However, a liquid crystal display device is a transmissive display device that uses liquid crystal between two polarizing plates to change the direction of light and adjust the intensity of the light. It includes a polarizer to create, but does not require a quarter wave plate.

本明細書で用語「1/4波長板」は、入射する光をその波長の1/4倍だけ位相遅延させることができる位相遅延フィルムを意味し得る。このような1/4波長板は円偏光を線偏光に作ったり、または線偏光を円偏光に作る役割を遂行することができる。一つの例示において、上記1/4波長板は360nmの波長の光に対する面方向位相差が50nm~250nmまたは90nm~200nm程度であり得る。本明細書で用語「面方向位相差」は「(n-n)Xd」で計算される数値であり、上記nは該当層の面上遅相軸(slow axis)方向の屈折率であり、nは該当層の面上進相軸(fast axis)方向の屈折率であり、dは四分の一波長フィルムの厚さである。また、本明細書で用語「遅相軸(slow axis)」は1/4波長板で最も高い屈折率を示す方向の軸を意味し得、上記遅相軸は本明細書内で位相遅延軸と同一の意味で使われ得る。本明細書で用語「進相軸(fast axis)」は1/4波長板で最も低い屈折率を示す方向の軸、すなわち、上記遅相軸と直交する方向を意味し得る。 As used herein, the term "quarter wave plate" may refer to a phase retardation film that can retard the phase of incident light by one quarter of its wavelength. Such a quarter-wave plate can perform the function of converting circularly polarized light into linearly polarized light, or converting linearly polarized light into circularly polarized light. In one example, the quarter-wave plate may have an in-plane retardation of about 50 nm to 250 nm or about 90 nm to 200 nm for light having a wavelength of 360 nm. In this specification, the term "in-plane retardation" is a numerical value calculated by "(n x - n y )Xd", where n x is the refractive index in the in-plane slow axis direction of the corresponding layer. , n y is the refractive index of the layer in the in-plane fast axis direction, and d is the thickness of the quarter-wave film. In addition, the term "slow axis" as used herein may mean an axis in a direction that exhibits the highest refractive index in a quarter-wave plate, and the slow axis is herein referred to as a phase retardation axis. can be used with the same meaning. As used herein, the term "fast axis" may mean an axis in a direction showing the lowest refractive index in a quarter-wave plate, that is, a direction perpendicular to the slow axis.

一つの例示において、本出願の1/4波長板330は液晶フィルムを含む。例えば、上記液晶フィルムは基材フィルム(図示されず)および液晶層(図示されず)を順次含むことができる。具体的には、上記1/4波長板330は上記基材フィルム上に重合性液晶化合物を配向および重合させて液晶層が形成された液晶フィルムであり得る。 In one example, the quarter wave plate 330 of the present application includes a liquid crystal film. For example, the liquid crystal film may sequentially include a base film (not shown) and a liquid crystal layer (not shown). Specifically, the quarter wavelength plate 330 may be a liquid crystal film in which a liquid crystal layer is formed by aligning and polymerizing a polymerizable liquid crystal compound on the base film.

上記液晶層は重合性液晶化合物を重合された状態で含むことができる。本明細書で用語「重合性液晶化合物」は液晶性を示すことができる部位、例えばメソゲン(mesogen)骨格などを含み、重合性官能基を一つ以上含む化合物を意味し得る。また、本明細書で用語「重合性液晶化合物を重合された状態で含むことができること」は、上記液晶化合物が重合されて液晶層内で液晶高分子の主鎖または側鎖のような骨格を形成している状態を意味し得る。例えば、上記重合性液晶化合物は水平配向された状態で上記液晶層内に含まれていてもよい。本明細書で用語「水平配向」は、重合された液晶化合物を含む液晶層の光軸が液晶層の平面に対して約0°~約25°、約0°~約15°、約0°~約10°、約0°~約5°または約0°の傾斜角を有する場合を意味し得る。 The liquid crystal layer may contain a polymerizable liquid crystal compound in a polymerized state. As used herein, the term "polymerizable liquid crystal compound" may refer to a compound that includes a moiety capable of exhibiting liquid crystallinity, such as a mesogen skeleton, and includes one or more polymerizable functional groups. In addition, in this specification, the term "can contain a polymerizable liquid crystal compound in a polymerized state" means that the liquid crystal compound is polymerized to form a skeleton such as a main chain or side chain of a liquid crystal polymer in a liquid crystal layer. It can mean the state of being formed. For example, the polymerizable liquid crystal compound may be contained in the liquid crystal layer in a horizontally aligned state. As used herein, the term "horizontal alignment" means that the optical axis of a liquid crystal layer containing a polymerized liquid crystal compound is about 0° to about 25°, about 0° to about 15°, about 0° with respect to the plane of the liquid crystal layer. This may mean having an inclination angle of between about 10°, between about 0° and about 5°, or between about 0°.

一つの例示において、上記第1偏光部材200を透過した光は上記偏光板300の偏光子320で反射され得る。具体的には、上記第1偏光部材200を透過して線偏光された光は上記偏光板300の1/4波長板330を透過して円偏光され、上記円偏光された光は上記偏光板300の偏光子320に入射して180°回転され得る。すなわち、上記偏光板300の偏光子320に入射した円偏光された光は右円偏光から左円偏光または左円偏光から右円偏光に反射され得る。 In one example, the light transmitted through the first polarizing member 200 may be reflected by the polarizer 320 of the polarizing plate 300. Specifically, the light that is linearly polarized after passing through the first polarizing member 200 is transmitted through the 1/4 wavelength plate 330 of the polarizing plate 300 and becomes circularly polarized, and the circularly polarized light is transmitted through the polarizing plate 300 and becomes circularly polarized. 300 and can be rotated by 180 degrees. That is, the circularly polarized light incident on the polarizer 320 of the polarizing plate 300 may be reflected from right-handed circularly polarized light to left-handed circularly polarized light, or from left-handed circularly polarized light to right-handed circularly polarized light.

この時、上記反射した光は上記偏光板300の1/4波長板330を透過することによって、上記第1偏光部材200を透過して線偏光された光と垂直な方向に整列され得る。例えば、上記反射した光が上記偏光板300の液晶ムラ10が存在する部分を透過して線偏光される場合、上記第2偏光部材400の吸収軸と一部は平行し、一部は平行しないように整列され得、これによって反射視感が変わり得る。また、上記反射した光が上記偏光板300の液晶ムラ10が存在しない部分を透過して線偏光される場合、いずれも上記第2偏光部材400の吸収軸と垂直に、すなわち、透過軸と平行に整列され得る。 At this time, the reflected light passes through the 1/4 wavelength plate 330 of the polarizing plate 300 and can be aligned in a direction perpendicular to the linearly polarized light that passes through the first polarizing member 200. For example, when the reflected light passes through a portion of the polarizing plate 300 where the liquid crystal unevenness 10 exists and is linearly polarized, part of the light is parallel to the absorption axis of the second polarizing member 400, and part of the light is not parallel to the absorption axis of the second polarizing member 400. This can change the reflective visual appearance. Further, when the reflected light is transmitted through a portion of the polarizing plate 300 where the liquid crystal unevenness 10 does not exist and is linearly polarized, the reflected light is perpendicular to the absorption axis of the second polarizing member 400, that is, parallel to the transmission axis. can be aligned.

この時、上記偏光板300の偏光子320から反射して放出される光は上記偏光板300に対する反射角が30°~60°であり得る。例えば、上記偏光板300に対する上記偏光子320から反射して放出される光の反射角は35°~55°または40°~50°であり得る。上記偏光子320から反射して放出される光の反射角が前述した範囲を満足することによって、液晶ムラの視認性が優秀となり得る。また、上記偏光板300の偏光子320から反射して放出される光の反射角が前述した範囲に比べて低い場合、視感の差が小さいため検出が難しく、前述した範囲に比べて高い場合、表面の反射が多いため液晶ムラの検出が困難であり得る。 At this time, the light reflected and emitted from the polarizer 320 of the polarizing plate 300 may have a reflection angle of 30° to 60° with respect to the polarizing plate 300. For example, the reflection angle of the light reflected and emitted from the polarizer 320 with respect to the polarizer 300 may be 35° to 55° or 40° to 50°. When the reflection angle of the light reflected and emitted from the polarizer 320 satisfies the above-mentioned range, the visibility of liquid crystal unevenness can be excellent. Furthermore, if the reflection angle of the light reflected and emitted from the polarizer 320 of the polarizing plate 300 is lower than the above-mentioned range, it is difficult to detect because the difference in visibility is small, and if it is higher than the above-mentioned range. , it can be difficult to detect liquid crystal unevenness because of the large amount of surface reflection.

上記第2偏光部材400は偏光板300の液晶ムラの有無によって上記偏光板300から反射した光を透過および/または吸収する部分であり、上記偏光板300から反射した光が印加されるように配置される。具体的には、上記偏光板300内に液晶ムラが存在する部分を印加して反射した光は、第2偏光部材400を一部は透過し、第2偏光部材400に一部は吸収され得る。これとは反対に、上記偏光板300内に液晶ムラが存在しない部分を印加して反射した光は、第2偏光部材400をすべて透過することができる。上記偏光板から反射した光が上記第2偏光部材に印加されることによって、検査源で検出される色を通じて偏光板の液晶ムラを検査することができる。 The second polarizing member 400 is a portion that transmits and/or absorbs the light reflected from the polarizing plate 300 depending on the presence or absence of liquid crystal unevenness in the polarizing plate 300, and is arranged so that the light reflected from the polarizing plate 300 is applied. be done. Specifically, a portion of the light that is applied to and reflected from a portion of the polarizing plate 300 where liquid crystal unevenness exists may be transmitted through the second polarizing member 400 and may be partially absorbed by the second polarizing member 400. . On the other hand, the light that is applied to and reflected by a portion of the polarizing plate 300 where no liquid crystal unevenness exists can completely pass through the second polarizing member 400 . By applying the light reflected from the polarizing plate to the second polarizing member, the liquid crystal unevenness of the polarizing plate can be inspected through the color detected by the inspection source.

一つの例示において、上記第2偏光部材400は上記偏光板300の偏光子320と吸収軸が平行し得る。すなわち、上記第2偏光部材400は上記第1偏光部材200と吸収軸が垂直し得る。具体的には、上記第2偏光部材400が第2方向(上下方向の矢印で図示)に吸収軸を有する場合、上記偏光板300の偏光子320も第2方向(上下方向の矢印で図示)に吸収軸を有することができ、上記第2偏光部材400および偏光板300の偏光子320はそれぞれ吸収軸と直交する第1方向(左右方向の矢印で図示)に透過軸を有することができる。上記第2偏光部材および偏光板の偏光子は吸収軸を平行に有することによって、上記第2偏光部材に印加された光を通じて偏光板の液晶ムラを検査することができる。 In one example, the absorption axis of the second polarizing member 400 may be parallel to the polarizer 320 of the polarizing plate 300. That is, the absorption axis of the second polarizing member 400 may be perpendicular to that of the first polarizing member 200. Specifically, when the second polarizing member 400 has an absorption axis in a second direction (indicated by vertical arrows), the polarizer 320 of the polarizing plate 300 also has an absorption axis in the second direction (indicated by vertical arrows). The second polarizing member 400 and the polarizer 320 of the polarizing plate 300 can each have a transmission axis in a first direction (indicated by left-right arrows) orthogonal to the absorption axis. Since the second polarizing member and the polarizer of the polarizing plate have absorption axes parallel to each other, it is possible to inspect the liquid crystal unevenness of the polarizing plate through the light applied to the second polarizing member.

上記検査源500は、上記第2偏光部材400を透過した光に基づいて上記偏光板300の液晶ムラ10を判断するための部分であり、上記第2偏光部材400を透過した光が印加されるように配置される。具体的には、液晶ムラが存在して1/4波長板330に厚さの差が発生した部分を透過した光は、第2偏光部材400を一部は透過し、第2偏光部材400に一部は吸収され得、これにより、緑色を示すことができる。すなわち、上記第2偏光部材400を透過した光が緑色を示す部分は、液晶ムラが存在すると判断することができる。また、液晶ムラが存在しない1/4波長板330部分を透過した光は、すべて第2偏光部材400を透過して白色に近い明るい色を示すことができる。すなわち、上記検査源500で検出された光が明るい色を示す部分は、液晶ムラが存在しないと判断することができる。 The inspection source 500 is a part for determining the liquid crystal unevenness 10 of the polarizing plate 300 based on the light transmitted through the second polarizing member 400, and the light transmitted through the second polarizing member 400 is applied. It is arranged like this. Specifically, light that has passed through a portion where liquid crystal unevenness exists and a difference in thickness has occurred in the quarter-wave plate 330 is partially transmitted through the second polarizing member 400 and is not transmitted to the second polarizing member 400. A portion can be absorbed, which can give it a green color. That is, it can be determined that liquid crystal unevenness exists in a portion where the light transmitted through the second polarizing member 400 shows green color. Furthermore, all of the light that passes through the quarter-wave plate 330 portion where there is no liquid crystal unevenness passes through the second polarizing member 400 and can exhibit a bright color close to white. That is, in a portion where the light detected by the inspection source 500 shows a bright color, it can be determined that liquid crystal unevenness does not exist.

一つの例示において、上記検査源500としては肉眼を利用して直接的に偏光板の液晶ムラ10の検事を遂行することができ、もう一つの例示において、肉眼に代わってビデオカメラなどの撮像機を利用して得られた画像をコンピュータを通じて間接的に偏光板の液晶ムラ10の検事を遂行することができる。 In one example, the inspection source 500 can directly inspect the liquid crystal unevenness 10 on the polarizing plate using the naked eye, and in another example, an imaging device such as a video camera may be used instead of the naked eye. It is possible to indirectly detect the liquid crystal unevenness 10 on the polarizing plate using the image obtained using the computer.

本出願はまた、偏光板の液晶ムラ検査方法に関する。例示的な偏光板の液晶ムラ検査方法は、前述した偏光板の液晶ムラ検査装置を利用した検査方法に関する。したがって、後述する偏光板の液晶ムラ検査方法に関する具体的な事項は上記偏光板の液晶ムラ検査装置で記述した内容が同一に適用され得るため、省略することにする。 The present application also relates to a method for inspecting liquid crystal unevenness of a polarizing plate. An exemplary method for inspecting liquid crystal unevenness on a polarizing plate relates to an inspection method using the above-described apparatus for inspecting liquid crystal unevenness on a polarizing plate. Therefore, specific details regarding the method for inspecting liquid crystal unevenness of a polarizing plate, which will be described later, will be omitted since the contents described in the apparatus for inspecting liquid crystal unevenness of a polarizing plate can be applied in the same manner.

本出願の偏光板の液晶ムラ検査方法は、透過させる段階および判断する段階を含む。本出願の偏光板の液晶ムラ検査方法を使うことによって、偏光板に発生する液晶ムラを優秀な視認性で容易に検査することができる。 The liquid crystal unevenness inspection method for a polarizing plate of the present application includes a transmitting step and a determining step. By using the method for inspecting liquid crystal unevenness on a polarizing plate of the present application, liquid crystal unevenness occurring on a polarizing plate can be easily inspected with excellent visibility.

上記透過させる段階は前述した偏光板の液晶ムラ検査装置を利用して光を透過させる段階であって、面光源から光を放出させて第1偏光部材、偏光板、第2偏光部材を順次透過させる。上記面光源、第1偏光部材、偏光板、第2偏光部材および光の進行に対する具体的な内容は上記偏光板の液晶ムラ検査装置で前述した通りであるため省略することにする。 The above-mentioned transmitting step is a step of transmitting light using the above-mentioned polarizing plate liquid crystal unevenness inspection device, in which the light is emitted from a surface light source and sequentially passes through the first polarizing member, the polarizing plate, and the second polarizing member. let The specific details regarding the surface light source, the first polarizing member, the polarizing plate, the second polarizing member, and the progress of light are the same as described above in connection with the liquid crystal unevenness inspection device for the polarizing plate, and will therefore be omitted.

上記判断する段階は上記偏光板の液晶ムラを判断するための段階であって、上記第2偏光部材を透過して上記検査源に印加される光に基づいて上記偏光板の液晶ムラと判断する。すなわち、上記面光源から上記検査源に光が到達して緑色を示す場合、上記偏光板に液晶ムラが存在すると判断し、上記面光源から上記検査源に光が到達して白色に近い明るい色を示す場合、上記偏光板に液晶ムラが存在しないと判断することができる。また、上記検査源および光の進行に対する具体的な内容は上記偏光板の液晶ムラ検査装置で前述した通りであるため省略することにする。 The determining step is a step for determining liquid crystal unevenness in the polarizing plate, and is determined to be liquid crystal unevenness in the polarizing plate based on the light transmitted through the second polarizing member and applied to the inspection source. . That is, if light reaches the inspection source from the surface light source and shows a green color, it is determined that liquid crystal unevenness exists in the polarizing plate, and light reaches the inspection source from the surface light source and displays a bright color close to white. If it shows, it can be determined that there is no liquid crystal unevenness in the polarizing plate. Further, the specific details regarding the inspection source and the progress of light are the same as described above in connection with the polarizing plate liquid crystal unevenness inspection apparatus, and will therefore be omitted.

一つの例示において、上記偏光板に印加された光は反射され得る。具体的には、上記偏光板の偏光子を透過した光が上記偏光板の偏光子、さらに具体的には、上記偏光板の偏光子と保護フィルムの界面で反射され得る。上記偏光板で光の反射を通じて偏光板の液晶ムラを検査することができる。上記光の反射に対する具体的な内容は上記偏光板の液晶ムラ検査装置で前述した通りであるため省略することにする。 In one example, the light applied to the polarizer may be reflected. Specifically, the light transmitted through the polarizer of the polarizing plate may be reflected by the polarizer of the polarizing plate, more specifically, the interface between the polarizer of the polarizing plate and the protective film. The liquid crystal unevenness of the polarizing plate can be inspected by reflecting light with the polarizing plate. The specific details regarding the above-mentioned light reflection are as described above in connection with the liquid crystal unevenness inspection apparatus for the above-mentioned polarizing plate, and will therefore be omitted.

本出願の一実施例に係る偏光板の液晶ムラ検査装置、他の一実施例に係る偏光板の液晶ムラ検査装置および一実施例に従わない偏光板の液晶ムラ検査装置を利用して、偏光板の液晶ムラが検出されるかの検査を遂行した。 By using the liquid crystal unevenness inspection device for a polarizing plate according to one embodiment of the present application, the liquid crystal unevenness inspection device for a polarizing plate according to another embodiment, and the liquid crystal unevenness inspection device for a polarizing plate not according to one embodiment, We carried out an inspection to see if any unevenness in the liquid crystal of the board was detected.

本出願の一実施例に係る偏光板の液晶ムラ検査装置は、光源として面光源を使用し、上記面光源を偏光板に対する入射角45°で吸収軸が第1方向(左右方向の矢印)を有する第1偏光部材に印加して線偏光させ、線偏光された光を液晶ムラが存在する偏光板の1/4波長板に印加して右円偏光させた。その後、右円偏光された光を吸収軸が第2方向(上下方向の矢印)を有する偏光板の偏光子に印加して180°反射させて左円偏光させた。その後、左円偏光された光を上記偏光板の1/4波長板に印加して透過させることによって、第1偏光部材を通過して線偏光された光と垂直な方向に整列させた。その後、上記線偏光された光を吸収軸が第2方向(上下方向の矢印)を有する第2偏光部材に印加して透過させることによって、肉眼で検査する検査源で検査された光を通じて偏光板の液晶ムラが検出されることを確認した。 A liquid crystal unevenness inspection device for a polarizing plate according to an embodiment of the present application uses a surface light source as a light source, and the absorption axis of the surface light source is oriented in the first direction (horizontal arrow) at an incident angle of 45° with respect to the polarizing plate. The linearly polarized light was applied to the quarter-wave plate of the polarizing plate where the liquid crystal unevenness was present to make it right circularly polarized. Thereafter, the right-handed circularly polarized light was applied to a polarizer of a polarizing plate having an absorption axis in the second direction (vertical arrow), and was reflected by 180° to become left-handed circularly polarized light. Thereafter, the left circularly polarized light was applied to the 1/4 wavelength plate of the polarizing plate and transmitted therethrough, thereby aligning it in a direction perpendicular to the linearly polarized light that passed through the first polarizing member. Thereafter, the linearly polarized light is applied to a second polarizing member whose absorption axis has a second direction (vertical arrow) and is transmitted, so that the light inspected by the inspection source inspected with the naked eye passes through the polarizing member. It was confirmed that unevenness in the liquid crystal display could be detected.

また、本出願の他の一実施例に係る偏光板の液晶ムラ検査装置は、第1偏光部材、偏光板の偏光子および第2偏光部材の吸収軸を90°回転させたことを除き、上記一実施例に係る偏光板の液晶ムラ検査装置と同じ方法で偏光板の液晶ムラ検査を遂行した。 In addition, the liquid crystal unevenness inspection device for a polarizing plate according to another embodiment of the present application has the above-described features except that the absorption axes of the first polarizing member, the polarizer of the polarizing plate, and the second polarizing member are rotated by 90°. A liquid crystal unevenness inspection of a polarizing plate was performed using the same method as the liquid crystal unevenness inspection apparatus for a polarizing plate according to an embodiment.

また、本出願の一実施例に従わない偏光板の液晶ムラ検査装置は、光源として面光源の代わりに点光源を使ったことを除き、上記一実施例に係る偏光板の液晶ムラ検査装置と同じ方法で偏光板の液晶ムラ検査を遂行した。 In addition, the liquid crystal unevenness inspection device for polarizing plates that does not follow the embodiment of the present application is the same as the liquid crystal unevenness inspection device for polarizing plates according to the above embodiment, except that a point light source is used instead of a surface light source as the light source. The polarizing plate was tested for liquid crystal unevenness using the same method.

すなわち、本出願の一実施例に従わない偏光板の液晶ムラ検査装置を利用して偏光板の液晶ムラを検査する場合、偏光板の液晶ムラが検出されるものの、光量が均一ではないため視認性が落ちる。これに反し、本出願の一実施例および本出願の他の一実施例に係る偏光板の液晶ムラ検査装置を利用して偏光板の液晶ムラを検査する場合、優秀な視認性で偏光板の液晶ムラの検査が可能である。 That is, when inspecting liquid crystal unevenness on a polarizing plate using a polarizing plate liquid crystal unevenness inspection apparatus that does not follow one embodiment of the present application, although liquid crystal unevenness on the polarizing plate is detected, it is difficult to visually detect it because the amount of light is not uniform. Sexuality decreases. On the other hand, when inspecting liquid crystal unevenness on a polarizing plate using the apparatus for inspecting liquid crystal unevenness on a polarizing plate according to one embodiment of the present application and another embodiment of the present application, the polarizing plate can be inspected with excellent visibility. It is possible to inspect liquid crystal unevenness.

10:液晶ムラ
100:面光源
200:第1偏光部材
300:偏光板
310:保護フィルム
320:偏光子
330:1/4波長板
340:離型フィルム
400:第2偏光部材
500:検査源
10: Liquid crystal unevenness 100: Surface light source 200: First polarizing member 300: Polarizing plate 310: Protective film 320: Polarizer 330: 1/4 wavelength plate 340: Release film 400: Second polarizing member 500: Inspection source

Claims (10)

面光源;
前記面光源から光が印加されるように配置された第1偏光部材;
前記第1偏光部材を透過した光が印加されるように配置されて前記印加された光を反射する偏光板;
前記偏光板から反射した光が印加されるように配置された第2偏光部材;および
前記第2偏光部材を透過した光が印加されるように配置され、前記第2偏光部材を透過した光に基づいて前記偏光板の液晶ムラを判断する検査源を含み、
前記偏光板は、保護フィルムと、偏光子と、液晶フィルムを含む1/4波長板と、を順次含み、
前記面光源から前記第1偏光部材に入射した光は、前記第1偏光部材を透過することによって線偏光に変換され、前記偏光板の1/4波長板に印加され、前記1/4波長板を透過することによって円偏光に変換され、前記偏光板の前記偏光子と前記保護フィルムとの界面によって右円偏光から左円偏光になるように、または左円偏光から右円偏光になるように反射されて、再び前記1/4波長板を透過することによって線偏光に変換された後、前記第2偏光部材に印加され、
前記第1偏光部材の吸収軸と前記第2偏光部材吸収軸垂直である、偏光板の液晶ムラ検査装置。
Surface light source;
a first polarizing member arranged to receive light from the surface light source;
a polarizing plate arranged to receive the light transmitted through the first polarizing member and reflecting the applied light;
a second polarizing member arranged so that the light reflected from the polarizing plate is applied; and a second polarizing member arranged so that the light transmitted through the second polarizing member is applied, and the light transmitted through the second polarizing member is applied. an inspection source for determining liquid crystal unevenness of the polarizing plate based on the
The polarizing plate sequentially includes a protective film, a polarizer , and a quarter wavelength plate including a liquid crystal film ,
The light incident on the first polarizing member from the surface light source is converted into linearly polarized light by passing through the first polarizing member, and is applied to the 1/4 wavelength plate of the polarizing plate, and is applied to the 1/4 wavelength plate of the polarizing plate. is converted into circularly polarized light by passing through the polarizer, and the right-handed circularly polarized light becomes left-handed circularly polarized light, or the left-handed circularly polarized light becomes right-handed circularly polarized light by the interface between the polarizer of the polarizing plate and the protective film. After being reflected and converted into linearly polarized light by passing through the quarter-wave plate again, it is applied to the second polarizing member,
A liquid crystal unevenness inspection device for a polarizing plate, wherein an absorption axis of the first polarizing member and an absorption axis of the second polarizing member are perpendicular .
前記面光源は前記第1偏光部材側に無偏光の光を放出する、請求項1に記載の偏光板の液晶ムラ検査装置。 2. The liquid crystal unevenness inspection device for a polarizing plate according to claim 1, wherein the surface light source emits unpolarized light toward the first polarizing member. 前記面光源から放出される光は前記偏光板に対する入射角が30°~60°である、請求項2に記載の偏光板の液晶ムラ検査装置。 3. The apparatus for inspecting liquid crystal unevenness of a polarizing plate according to claim 2, wherein the light emitted from the surface light source has an incident angle of 30° to 60° with respect to the polarizing plate. 前記偏光板は保護フィルムおよび離型フィルムをさらに含み、保護フィルム、偏光子、1/4波長板および離型フィルムを順次含む、請求項1~3のいずれか一項に記載の偏光板の液晶ムラ検査装置。 The liquid crystal polarizing plate according to any one of claims 1 to 3, wherein the polarizing plate further includes a protective film and a release film, and sequentially includes a protective film, a polarizer, a quarter-wave plate, and a release film. Unevenness inspection device. 前記偏光板は有機発光表示装置用偏光板である、請求項1~4のいずれか一項に記載の偏光板の液晶ムラ検査装置。 5. The liquid crystal unevenness inspection device for a polarizing plate according to claim 1, wherein the polarizing plate is a polarizing plate for an organic light emitting display device. 前記液晶フィルムは基材フィルムおよび液晶層を順次含む、請求項1~5のいずれか一項に記載の偏光板の液晶ムラ検査装置。 6. The liquid crystal unevenness inspection device for a polarizing plate according to claim 1, wherein the liquid crystal film sequentially includes a base film and a liquid crystal layer. 前記液晶層は重合性液晶化合物を重合された状態で含む、請求項6に記載の偏光板の液晶ムラ検査装置。 7. The liquid crystal unevenness inspection device for a polarizing plate according to claim 6, wherein the liquid crystal layer contains a polymerizable liquid crystal compound in a polymerized state. 前記第1偏光部材を透過した光は前記偏光板の偏光子で反射する、請求項1~7のいずれか一項に記載の偏光板の液晶ムラ検査装置。 8. The liquid crystal unevenness inspection device for a polarizing plate according to claim 1, wherein the light transmitted through the first polarizing member is reflected by a polarizer of the polarizing plate. 前記偏光板から反射して放出される光は前記偏光板に対する反射角が30°~60°である、請求項1~8のいずれか一項に記載の偏光板の液晶ムラ検査装置。 9. The liquid crystal unevenness inspection device for a polarizing plate according to claim 1, wherein the light reflected and emitted from the polarizing plate has a reflection angle of 30° to 60° with respect to the polarizing plate. 請求項1~9のいずれか一項に記載された偏光板の液晶ムラ検査装置を利用した偏光板の液晶ムラ検査方法であって、
前記面光源から光を放出させて、当該放出させた光に前記第1偏光部材を透過させ当該透過させた光を前記偏光板に入射させ、当該入射させた光を前記偏光板の前記偏光子において右円偏光から左円偏光になるようにまたは左円偏光から右円偏光になるように反射させ当該反射させた光に前記第2偏光部材を透過させる段階;および
前記第2偏光部材を透過して前記検査源に印加される光に基づいて前記偏光板の液晶ムラを判断する段階を含む、偏光板の液晶ムラ検査方法。
A method for inspecting liquid crystal unevenness on a polarizing plate using the apparatus for inspecting liquid crystal unevenness on a polarizing plate according to any one of claims 1 to 9,
Light is emitted from the surface light source , the emitted light is transmitted through the first polarizing member, the transmitted light is incident on the polarizing plate, and the incident light is converted into the polarized light of the polarizing plate. reflecting the right-handed circularly polarized light to the left-handed circularly polarized light or the left-handed circularly polarized light to the right-handed circularly polarized light , and transmitting the reflected light through the second polarizing member; and A method for inspecting liquid crystal unevenness of a polarizing plate, comprising the step of determining liquid crystal unevenness of the polarizing plate based on light transmitted through the member and applied to the inspection source.
JP2021568603A 2019-06-07 2020-03-09 Polarizing plate liquid crystal unevenness inspection device and polarizing plate liquid crystal unevenness inspection method Active JP7410979B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020190067543A KR102486442B1 (en) 2019-06-07 2019-06-07 Device for testing liquid crystal stain of polarizing plate and method for testing liquid crystal stain of polarizing plate
KR10-2019-0067543 2019-06-07
PCT/KR2020/003256 WO2020246691A1 (en) 2019-06-07 2020-03-09 Device for detecting liquid crystal mura in polarizing plate, and method for detecting liquid crystal mura in polarizing plate

Publications (2)

Publication Number Publication Date
JP2022532427A JP2022532427A (en) 2022-07-14
JP7410979B2 true JP7410979B2 (en) 2024-01-10

Family

ID=73652455

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021568603A Active JP7410979B2 (en) 2019-06-07 2020-03-09 Polarizing plate liquid crystal unevenness inspection device and polarizing plate liquid crystal unevenness inspection method

Country Status (6)

Country Link
US (1) US20220228994A1 (en)
EP (1) EP3982193A4 (en)
JP (1) JP7410979B2 (en)
KR (1) KR102486442B1 (en)
CN (1) CN113841083A (en)
WO (1) WO2020246691A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7256567B1 (en) * 2022-04-28 2023-04-12 ニシハツ産業株式会社 Seaweed foreign matter detection device

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116925A (en) 1999-10-20 2001-04-27 Sumitomo Chem Co Ltd Method of inspecting optical sheet
JP2005069989A (en) 2003-08-27 2005-03-17 Apollo Mec:Kk Inspection apparatus
JP2006078426A (en) 2004-09-13 2006-03-23 Konica Minolta Holdings Inc Apparatus and method for inspecting defect
US20070075279A1 (en) 2005-09-30 2007-04-05 Intergral Vision, Inc. Method and system for automatically inspecting a display including a layer of liquid crystal material
JP2009069054A (en) 2007-09-14 2009-04-02 Otsuka Denshi Co Ltd Optical anisotropy measuring device and optical anisotropy measuring method
JP2010534351A (en) 2008-01-07 2010-11-04 エルジー・ケム・リミテッド Non-uniformity inspection method for polarizing plate using image analysis, and automatic non-uniformity inspection system for polarizing plate using the same
WO2013191133A1 (en) 2012-06-18 2013-12-27 富士フイルム株式会社 Inspection device and inspection method for pattern phase difference filter
JP2016206217A (en) 2015-04-15 2016-12-08 大日本印刷株式会社 Optical film, transfer film, image display device, method for manufacturing optical film, and method for manufacturing transfer film
WO2016194874A1 (en) 2015-06-05 2016-12-08 住友化学株式会社 Inspection method for defects in light transmissive film, manufacturing method for linear polarizer film, and manufcturing method for polarizing plate
JP2017067664A (en) 2015-09-30 2017-04-06 日東電工株式会社 Method of inspecting polarizer and method for producing polarizing plate
CN107643292A (en) 2016-07-20 2018-01-30 南京造币有限公司 A kind of surface detection apparatus and its method based on liquid-crystalline glasses
JP2020166155A (en) 2019-03-29 2020-10-08 東洋紡株式会社 Method of manufacturing liquid crystal compound layer laminate, and method for inspecting liquid crystal compound layer
JP2020166154A (en) 2019-03-29 2020-10-08 東洋紡株式会社 Film for transferring oriented liquid crystal compound layer, laminate for transferring oriented liquid crystal compound layer, method for manufacturing oriented liquid crystal compound layer laminate, and method for inspecting laminate for transferring oriented liquid crystal compound layer
JP2020190553A (en) 2019-05-15 2020-11-26 住友化学株式会社 Method for inspecting optical film and method for manufacturing optical film

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5973760A (en) * 1997-08-06 1999-10-26 Rockwell Science Center, Inc. Display apparatus having quarter-wave plate positioned to eliminate conflicts with polarized sunglasses
JP3401743B2 (en) * 1997-10-22 2003-04-28 日東電工株式会社 Polarizing element, polarized light source device and liquid crystal display device
US6661482B2 (en) * 2001-10-05 2003-12-09 Nitto Denko Corporation Polarizing element, optical element, and liquid crystal display
JP2012068641A (en) * 2008-04-14 2012-04-05 Nitto Denko Corp Optical display device manufacturing system and optical display device manufacturing method
JP2012053077A (en) * 2010-08-31 2012-03-15 Sumitomo Chemical Co Ltd Rolled polarizing plate set, method for manufacturing the same, and method for manufacturing liquid crystal panel
JP5806837B2 (en) * 2011-04-11 2015-11-10 株式会社モリテックス Optical anisotropy parameter measuring device, measuring method and measuring program
WO2014196637A1 (en) * 2013-06-06 2014-12-11 富士フイルム株式会社 Optical sheet member and image display device employing same
KR20180050802A (en) * 2016-11-07 2018-05-16 주식회사 엘지화학 Organic Light-Emitting Device
KR102430497B1 (en) 2017-12-07 2022-08-08 삼성전자주식회사 Manufacturing method of light emitting device

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116925A (en) 1999-10-20 2001-04-27 Sumitomo Chem Co Ltd Method of inspecting optical sheet
JP2005069989A (en) 2003-08-27 2005-03-17 Apollo Mec:Kk Inspection apparatus
JP2006078426A (en) 2004-09-13 2006-03-23 Konica Minolta Holdings Inc Apparatus and method for inspecting defect
US20070075279A1 (en) 2005-09-30 2007-04-05 Intergral Vision, Inc. Method and system for automatically inspecting a display including a layer of liquid crystal material
JP2009069054A (en) 2007-09-14 2009-04-02 Otsuka Denshi Co Ltd Optical anisotropy measuring device and optical anisotropy measuring method
JP2010534351A (en) 2008-01-07 2010-11-04 エルジー・ケム・リミテッド Non-uniformity inspection method for polarizing plate using image analysis, and automatic non-uniformity inspection system for polarizing plate using the same
WO2013191133A1 (en) 2012-06-18 2013-12-27 富士フイルム株式会社 Inspection device and inspection method for pattern phase difference filter
JP2016206217A (en) 2015-04-15 2016-12-08 大日本印刷株式会社 Optical film, transfer film, image display device, method for manufacturing optical film, and method for manufacturing transfer film
WO2016194874A1 (en) 2015-06-05 2016-12-08 住友化学株式会社 Inspection method for defects in light transmissive film, manufacturing method for linear polarizer film, and manufcturing method for polarizing plate
JP2017067664A (en) 2015-09-30 2017-04-06 日東電工株式会社 Method of inspecting polarizer and method for producing polarizing plate
CN107643292A (en) 2016-07-20 2018-01-30 南京造币有限公司 A kind of surface detection apparatus and its method based on liquid-crystalline glasses
JP2020166155A (en) 2019-03-29 2020-10-08 東洋紡株式会社 Method of manufacturing liquid crystal compound layer laminate, and method for inspecting liquid crystal compound layer
JP2020166154A (en) 2019-03-29 2020-10-08 東洋紡株式会社 Film for transferring oriented liquid crystal compound layer, laminate for transferring oriented liquid crystal compound layer, method for manufacturing oriented liquid crystal compound layer laminate, and method for inspecting laminate for transferring oriented liquid crystal compound layer
JP2020190553A (en) 2019-05-15 2020-11-26 住友化学株式会社 Method for inspecting optical film and method for manufacturing optical film

Also Published As

Publication number Publication date
EP3982193A4 (en) 2022-07-27
EP3982193A1 (en) 2022-04-13
WO2020246691A1 (en) 2020-12-10
KR102486442B1 (en) 2023-01-09
US20220228994A1 (en) 2022-07-21
KR20200140638A (en) 2020-12-16
JP2022532427A (en) 2022-07-14
CN113841083A (en) 2021-12-24

Similar Documents

Publication Publication Date Title
US8982300B2 (en) Viewing angle controlling system, and image display device using the same
TWI425257B (en) Phase difference element and display device
JP2019152883A (en) Polarizing plate
KR101544249B1 (en) Optical film
KR101913421B1 (en) Phase difference element and display unit
US20100265433A1 (en) Phase difference element and display device
JP2007213016A (en) Layered film manufacturing method, layered film defect detection method, layered film defect detection device, layered film and image display device
JP5158468B2 (en) Substrate inspection system and inspection substrate inspection method
KR20160055431A (en) Polarizing film and display device having the same
TWI630440B (en) Liquid crystal modulator for detecting a defective substrate and inspection apparatus having the same
JP7410979B2 (en) Polarizing plate liquid crystal unevenness inspection device and polarizing plate liquid crystal unevenness inspection method
US11860480B2 (en) Liquid crystal display device
WO2021256392A1 (en) Three-dimensional display device and circularly polarized glasses
TWI665499B (en) Device for testing optical properties and method for testing optical properties
WO2017092154A1 (en) Polarization device and display
KR102020837B1 (en) Back light unit and display divice
KR20200050716A (en) Polarizing Plate
CN109844615A (en) Optic isolator device
US20160085114A1 (en) Display device
US20050207008A1 (en) Structure and generated method of a polarizer
CN113906287A (en) Device and method for inspecting adhesive stains in polarizing plate
CN115826299A (en) Optical element and liquid crystal display device provided with optical element
JP2021189421A (en) Liquid crystal display and polarizing plate
KR20240082026A (en) Poarlizing plate and optical display apparatus
JP2016062017A5 (en)

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20211116

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20221125

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20221212

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230313

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230619

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230919

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20231204

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20231222

R150 Certificate of patent or registration of utility model

Ref document number: 7410979

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150