JP7407629B2 - Non-destructive testing equipment - Google Patents
Non-destructive testing equipment Download PDFInfo
- Publication number
- JP7407629B2 JP7407629B2 JP2020045216A JP2020045216A JP7407629B2 JP 7407629 B2 JP7407629 B2 JP 7407629B2 JP 2020045216 A JP2020045216 A JP 2020045216A JP 2020045216 A JP2020045216 A JP 2020045216A JP 7407629 B2 JP7407629 B2 JP 7407629B2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- inspection conveyor
- inspection
- conveyor
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000009659 non-destructive testing Methods 0.000 title claims description 19
- 238000007689 inspection Methods 0.000 claims description 113
- 238000012546 transfer Methods 0.000 claims description 75
- 230000005855 radiation Effects 0.000 claims description 62
- 230000007246 mechanism Effects 0.000 claims description 43
- 238000003780 insertion Methods 0.000 claims description 5
- 230000002950 deficient Effects 0.000 description 54
- 238000003860 storage Methods 0.000 description 19
- 230000001066 destructive effect Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 8
- 230000007723 transport mechanism Effects 0.000 description 8
- 230000008859 change Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000032258 transport Effects 0.000 description 5
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 4
- 229910001416 lithium ion Inorganic materials 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 230000002238 attenuated effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/346—Sorting according to other particular properties according to radioactive properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Secondary Cells (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
本発明の実施形態は、非破壊検査装置に関する。 Embodiments of the present invention relate to non-destructive testing equipment.
Ｘ線で代表される放射線を被検査物に照射し、被検査物を透過することで減弱した放射線の二次元分布を検出して画像化することで、被検査物の非破壊検査を行う非破壊検査装置が知られている。被検査物は、例えば円筒型のリチウムイオン電池であり、その内部は正極板と負極板とを円筒状に幾重にも巻き付けてなる捲回構造となっている。 A non-destructive inspection method that performs non-destructive inspection of the inspected object by irradiating the inspected object with radiation, typically X-rays, and detecting the two-dimensional distribution of the attenuated radiation as it passes through the inspected object and creating an image. Destructive inspection devices are known. The object to be inspected is, for example, a cylindrical lithium ion battery, and its interior has a wound structure in which a positive electrode plate and a negative electrode plate are wound several times in a cylindrical shape.
この捲回構造に巻きずれがあると、例えば正極板が負極板よりはみ出していると、はみ出した正極板にリチウムが析出してショートし、発火するおそれがある。そのため、リチウムイオン電池の内部において正極板が負極板からはみ出していないかを検査する必要がある。この非破壊検査は、被検査物をコンベア等で搬送し、放射線発生器の前を通過させることにより行われる。 If there is any misalignment in this winding structure, for example, if the positive electrode plate protrudes from the negative electrode plate, lithium may be deposited on the protruding positive electrode plate, causing a short-circuit and ignition. Therefore, it is necessary to inspect whether the positive electrode plate protrudes from the negative electrode plate inside the lithium ion battery. This non-destructive inspection is performed by transporting the object to be inspected using a conveyor or the like and passing it in front of a radiation generator.
例えば、特許文献１に示す従来技術の非破壊検査装置は、ループ状の検査用搬送路に沿って２組の放射線発生器と放射線検出器を配置して、被検査物の異なる個所を１回で検査できるようにしたものであり、効率的に検査を実施できる点で優れている。 For example, a conventional non-destructive inspection device disclosed in Patent Document 1 arranges two sets of radiation generators and radiation detectors along a loop-shaped inspection conveyance path, and inspects different parts of the object at once. The system is designed to allow inspections to be carried out in a single manner, and is excellent in that inspections can be carried out efficiently.
一方で、このようなループ状の検査用搬送路を有する非破壊検査装置は、その構成部品が大型化・複雑化する傾向があり、比較的低コストで構成できる直線状の検査コンベアに沿って放射線発生器と放射線検出器が配置された非破壊検査装置も検討されている。このタイプの非破壊検査装置では、検査工程の前後には製造工程や出荷工程が設けられているため、これらの工程に設けられた搬入用或いは搬出用のコンベアと、検査工程の直線状のコンベアとの間で、未検査の被検査物或いは検査済みの被検査物を移載する必要がある。具体的には、各工程のコンベア同士をその端部で突き合わせ、コンベアからコンベアに被検査物を移載させる。 On the other hand, non-destructive testing equipment that has such a loop-shaped inspection conveyance path tends to have larger and more complex components, and it is difficult to move along a linear inspection conveyor that can be constructed at a relatively low cost. Nondestructive testing equipment equipped with a radiation generator and a radiation detector is also being considered. This type of non-destructive testing equipment has a manufacturing process and a shipping process before and after the inspection process, so there is a conveyor for loading or unloading in these processes, and a linear conveyor for the inspection process. It is necessary to transfer uninspected objects or inspected objects between the two. Specifically, the conveyors in each process are butted against each other at their ends, and the object to be inspected is transferred from one conveyor to another.
しかしながら、コンベアの端部はスプロケットの外周に沿って下方に凹んでいるため、２つのコンベアを突き合わせた場合にはその端部間にＶ字状の凹みができる。この凹みの近傍を移載する際に、被検査物が傾き、転倒するおそれがある。また、転倒しないまでも被検査物の搬送間隔が変わってしまうこともあり、被検査物を連続して撮像する場合に上手く撮像できないおそれがある。 However, since the ends of the conveyors are recessed downward along the outer periphery of the sprocket, when two conveyors are butted against each other, a V-shaped recess is created between the ends. When transferring near this recess, there is a risk that the object to be inspected will tilt and fall. Further, even if the object to be inspected does not fall over, the conveyance interval of the object to be inspected may change, and there is a risk that the images of the object to be inspected cannot be captured properly when images are taken continuously.
本実施形態は、上記課題を解決すべく、比較的低コストで構成できる直線状の検査コンベアを採用しながらも、非検査物の確実な移載を可能とする非破壊検査装置を提供することを目的とする。 In order to solve the above-mentioned problems, the present embodiment provides a non-destructive inspection device that enables reliable transfer of non-inspection items while employing a linear inspection conveyor that can be configured at relatively low cost. With the goal.
実施形態の非破壊検査装置は、次のような構成を備える。
（１）被検査物に放射線ビームを照射する放射線発生器。
（２）前記放射線発生器に対向して設けられた放射線検出器。
（３）前記放射線発生器と前記放射線検出器の間に設けられ、前記被検査物を一定の間隔で複数並べた状態で搬送する直線状の検査コンベア。
（４）前記被検査物を前記検査コンベアの搬入側まで搬入する搬入装置。
（５）前記搬入装置から前記検査コンベアへと前記被検査物を移載する第１の移載装置。
（６）前記検査コンベアの側方かつ前記搬入装置と前記検査コンベアとの間に設けられた第１の受け渡し部。
（７）前記被検査物の移載経路において、前記搬入装置、前記第１の受け渡し部、前記検査コンベアにおける前記被検査物の各載置面が、同一平面上で互いに隙間なく突き合わされている。
The non-destructive testing device of the embodiment has the following configuration.
(1) A radiation generator that irradiates the object to be inspected with a radiation beam.
(2) A radiation detector provided opposite to the radiation generator.
(3) A linear inspection conveyor that is provided between the radiation generator and the radiation detector and conveys a plurality of objects to be inspected lined up at regular intervals.
(4) A carry-in device that carries the object to be inspected to the carry-in side of the inspection conveyor.
(5) A first transfer device that transfers the object to be inspected from the carry-in device to the inspection conveyor.
(6) A first transfer section provided on the side of the inspection conveyor and between the carry-in device and the inspection conveyor.
(7) In the transfer path of the object to be inspected, each mounting surface of the object to be inspected in the carrying-in device, the first transfer section, and the inspection conveyor is butted against each other on the same plane without any gap. .
実施形態の非破壊検査装置は、更に次のような構成を備えてもよい。
（１）前記放射線検出器は、前記被検査物の良否を判定する判定部を備え、前記判定部が否と判定した前記被検査物を振り分ける誘導機構と、前記判定部が否と判定した前記被検査物を、前記検査コンベアから前記誘導機構へと移載する第２の移載装置と、前記検査コンベアの側方かつ前記検査コンベアと前記誘導機構との間に設けられた第２の受け渡し部と、を更に備え、前記判定部が否と判定した前記被検査物の移載経路において、前記検査コンベア、前記第２の受け渡し部、前記誘導機構における前記被検査物の各載置面が、同一平面上で互いに隙間なく突き合わされている。
The non-destructive testing device of the embodiment may further include the following configuration.
(1) The radiation detector includes a determination unit that determines whether the object to be inspected is good or bad, and a guiding mechanism that distributes the object to be inspected that the determination unit determines to be unacceptable; a second transfer device for transferring an object to be inspected from the inspection conveyor to the guide mechanism; and a second transfer device provided on the side of the inspection conveyor and between the inspection conveyor and the guide mechanism. further comprising a section, in the transfer path of the object to be inspected which is determined to be negative by the determination section, each placement surface of the object to be inspected in the inspection conveyor, the second transfer section, and the guiding mechanism is configured to , are butted against each other on the same plane without any gaps.
（２）前記第１の移載装置は、前記被検査物を保持または解放する複数の凹部を備えるホイールを備え、前記複数の凹部は、前記ホイールの外周に沿って等間隔に設けられている。 (2) The first transfer device includes a wheel having a plurality of recesses for holding or releasing the object to be inspected, and the plurality of recesses are provided at equal intervals along the outer periphery of the wheel. .
（３）前記検査コンベアの上面には一定間隔ごとに突起が設けられ、前記被検査物は、前記突起の間に載置されて搬送される。 (3) Protrusions are provided on the upper surface of the inspection conveyor at regular intervals, and the objects to be inspected are placed between the protrusions and transported.
（４）前記放射線発生器及び前記放射線検出器は、２組設けられ、一方の組が前記被検査物の上側を撮像し、他方の組が前記被検査物の下側を撮像する。 (4) Two sets of the radiation generator and the radiation detector are provided, one set images the upper side of the object to be inspected, and the other set images the lower side of the object to be inspected.
（５）前記誘導機構の出口に設けられ、前記判定部が否と判定した前記被検査物を貯留するストックヤードと、前記ストックヤードの出口に設けられ、当該ストックヤードに貯留された前記被検査物を前記搬入装置へと再投入する再投入機構と、を更に備える。 (5) A stockyard provided at the exit of the guiding mechanism and storing the inspected object determined as negative by the determination section; and a stockyard provided at the exit of the stockyard and stored in the stockyard. The apparatus further includes a re-insertion mechanism for re-inserting objects into the carrying-in device.
［１．第１の実施形態］
［１－１．実施形態の構成］
以下、第１の実施形態に係る非破壊検査装置について、図面を参照しつつ詳細に説明する。
[1. First embodiment]
[1-1. Configuration of embodiment]
Hereinafter, a non-destructive testing apparatus according to a first embodiment will be described in detail with reference to the drawings.
［被検査物］
被検査物Ｗは、放射線により非破壊検査されるものであれば特に限定されないが、本実施形態では、内部に捲回構造を備える円筒型のリチウムイオン電池とする。被検査物Ｗは、円柱状のホルダーＨの上面に設けられた凹みに保持されて搬送される（図２参照）。
[Object to be inspected]
The object W to be inspected is not particularly limited as long as it is subjected to a non-destructive inspection using radiation, but in this embodiment, it is a cylindrical lithium ion battery having an internal winding structure. The object W to be inspected is held in a recess provided on the upper surface of a cylindrical holder H and transported (see FIG. 2).
［非破壊検査装置］
図１に示すように、非破壊検査装置１は、被検査物Ｗに放射線を照射し、被検査物Ｗを透過した放射線を検出する。この検出結果に基づき、非破壊検査装置１は、被検査物Ｗの透視画像を生成する。非破壊検査装置１は、被検査物Ｗの透視画像を撮像する放射線発生器２と放射線検出器３、遮蔽箱４、被検査物Ｗが保持されたホルダーＨを搬送する搬送機構５、検査を終えた被検査物Ｗを仕分けする誘導機構７、ストックヤード８、再投入機構９、これらの動作を制御する制御部１０を備える（図５参照）。
[Non-destructive testing equipment]
As shown in FIG. 1, the non-destructive testing apparatus 1 irradiates an object W to be inspected with radiation and detects the radiation that has passed through the object W to be inspected. Based on this detection result, the non-destructive inspection apparatus 1 generates a perspective image of the object W to be inspected. The non-destructive inspection device 1 includes a radiation generator 2 and a radiation detector 3 that take a fluoroscopic image of an object W to be inspected, a shielding box 4, a transport mechanism 5 that conveys a holder H holding an object W to be inspected, and a transport mechanism 5 that carries out an inspection. It includes a guiding mechanism 7 for sorting finished inspected objects W, a stockyard 8, a re-feeding mechanism 9, and a control section 10 for controlling these operations (see FIG. 5).
放射線発生器２は、被検査物Ｗに向けて放射線ビームを照射する。放射線ビームは、焦点を頂点として角錐形状に拡大する放射線の束である。放射線は、例えばＸ線である。この放射線発生器２は、例えばＸ線管である。 The radiation generator 2 irradiates a radiation beam toward the object W to be inspected. A radiation beam is a bundle of radiation that expands into a pyramid shape with a focal point as its apex. The radiation is, for example, an X-ray. This radiation generator 2 is, for example, an X-ray tube.
放射線検出器３は、放射線発生器２の焦点と対向して配置され、放射線の透過経路に応じて減弱した放射線強度の二次元分布を検出し、当該放射線強度に比例した透過データを出力する。この放射線検出器３は、例えばイメージインテンシファイア（Ｉ．Ｉ．）とカメラ、又はフラットパネルディテクタ（ＦＰＤ）により構成される。 The radiation detector 3 is disposed facing the focal point of the radiation generator 2, detects a two-dimensional distribution of radiation intensity that is attenuated according to the radiation transmission path, and outputs transmission data proportional to the radiation intensity. The radiation detector 3 includes, for example, an image intensifier (I.I.), a camera, or a flat panel detector (FPD).
放射線検出器３は、判定部３１、記憶部３２を備える（図５参照）。判定部３１は、例えばＣＰＵであり、記憶部３２は、例えばＨＤＤまたはＳＳＤといったストレージである。判定部３１は、放射線検出器３が撮像した画像を、記憶部３２内部に予め記憶している基準画像と比較することにより、被検査物Ｗの良否を判定する。被検査物Ｗの良否は、例えば正極板が負極板よりはみ出していないか否かによって判定される。また、被検査物Ｗの良否は、撮像した画像が鮮明か否かによっても判定される。本実施形態では、前者の基準で否と判定されたものを不良品Ｘ、後者の基準で否と判定されたものを未検査品Ｙとする。なお、前者後者両方の基準で共に否と判定されたものは未検査品Ｙとする。また、前者後者両方の基準で共に良と判定されたものを良品Ｚとする。 The radiation detector 3 includes a determination section 31 and a storage section 32 (see FIG. 5). The determination unit 31 is, for example, a CPU, and the storage unit 32 is, for example, a storage such as an HDD or an SSD. The determining unit 31 determines the quality of the inspected object W by comparing the image captured by the radiation detector 3 with a reference image stored in advance in the storage unit 32. The quality of the inspected object W is determined by, for example, whether or not the positive electrode plate protrudes from the negative electrode plate. Furthermore, the quality of the inspected object W is also determined based on whether the captured image is clear or not. In this embodiment, a defective product X is defined as a defective product based on the former criterion, and an uninspected product Y is defined as a defective product based on the latter criterion. It should be noted that items that are judged to be negative based on both the former and latter criteria are treated as uninspected items Y. Furthermore, a product that is determined to be good based on both the former and latter criteria is defined as a non-defective product Z.
本実施形態において、放射線発生器２と放射線検出器３は横並びに２組設けられ、いずれの組も非検査物Ｗの検査用搬送路を挟んで対向するように配置されている。また、２組は非検査物Ｗを撮像する高さが互いに異なり、一方は非検査物Ｗの上側を、他方は被検査物Ｗの下側を、それぞれ撮像可能な高さに位置している。 In this embodiment, two sets of radiation generators 2 and radiation detectors 3 are provided side by side, and both sets are arranged to face each other across the inspection transport path for the non-inspection object W. In addition, the two sets have different heights at which to image the non-inspection object W, one of which is located at a height that allows the upper side of the non-inspection object W to be imaged, and the other to image the lower side of the object to be inspected W. .
遮蔽箱４は、放射線発生器２、放射線検出器３を囲い、放射線を遮蔽する。遮蔽箱４は、鉛などの放射線を遮蔽する材料を含み構成されている。遮蔽箱４は、例えば直方体形状である。遮蔽箱４には、被検査物Ｗが保持されたホルダーＨを内部に搬入する搬入口４１、遮蔽箱４内部の被検査物Ｗを遮蔽箱４外部に搬出する搬出口４２が設けられている。 The shielding box 4 surrounds the radiation generator 2 and the radiation detector 3 and shields them from radiation. The shielding box 4 is configured to include a radiation shielding material such as lead. The shielding box 4 has a rectangular parallelepiped shape, for example. The shielding box 4 is provided with an entrance 41 for transporting the holder H holding the object W to be inspected into the inside, and an exit 42 for transporting the object W inside the shielding box 4 to the outside of the shielding box 4. .
搬送機構５は、被検査物Ｗが載置されたホルダーＨを搬送する機構である。搬送機構５は、被検査物Ｗの検査用搬送路である検査コンベア５１、検査コンベア５１の搬入側に設けられた搬入装置５２、検査コンベア５１の搬出側に設けられた搬出装置５３、検査コンベア５１と搬入装置５２との間に設けられた第１の移載装置６ａ、検査コンベア５１と搬出装置５３との間に設けられた第２の移載装置６ｂを備える。 The transport mechanism 5 is a mechanism that transports the holder H on which the object W to be inspected is placed. The conveyance mechanism 5 includes an inspection conveyor 51 which is a conveyance path for inspection of the inspected object W, a carry-in device 52 provided on the carry-in side of the inspection conveyor 51, a carry-out device 53 provided on the carry-out side of the inspection conveyor 51, and an inspection conveyor. 51 and the carry-in device 52, and a second transfer device 6b provided between the inspection conveyor 51 and the carry-out device 53.
検査コンベア５１は、遮蔽箱４に設けられた搬入口４１と搬出口４２を結ぶ方向に直線状に設けられ、遮蔽箱４を貫通している。検査コンベア５１としては、例えばチェーンコンベアやベルトコンベアを用いることが出来る。検査コンベア５１の両端にはスプロケット５１１が設けられ、図示しないモータが回転することによりスプロケット５１１に巻き付けられたチェーンまたはベルトが駆動する。また、図２に示すように、検査コンベア５１の上面には一定間隔ごとに突起５１２が設けられている。より詳細には、検査コンベア５１の搬送方向における中心線よりも片側、すなわち後述の移送機構６の反対側に寄って設けられている。この突起５１２により、ホルダーＨは一定の間隔を開けた状態で搬送される。 The inspection conveyor 51 is provided in a straight line in a direction connecting the inlet 41 and the outlet 42 provided in the shielding box 4 and passes through the shielding box 4 . As the inspection conveyor 51, for example, a chain conveyor or a belt conveyor can be used. Sprockets 511 are provided at both ends of the inspection conveyor 51, and a chain or belt wound around the sprockets 511 is driven by rotation of a motor (not shown). Further, as shown in FIG. 2, protrusions 512 are provided on the upper surface of the inspection conveyor 51 at regular intervals. More specifically, it is provided on one side of the center line of the inspection conveyor 51 in the conveying direction, that is, on the opposite side of the transfer mechanism 6, which will be described later. This protrusion 512 allows the holders H to be transported at a constant interval.
搬入装置５２、搬出装置５３としては、上述のチェーンコンベアやベルトコンベアだけでなく、ターンテーブルを用いることも出来る。また、図１に示すように、これらを組み合わせて用いることも出来る。本実施形態の搬入装置５２は、コンベア５２ａ、ターンテーブル５２ｂ、５２ｃ、５２ｄの組み合わせによりなる。搬入装置５２は、被検査物Ｗが載置されたホルダーＨを第１の移載装置６ａを介して検査コンベア５１に搬入する。また、第１の移載装置６ａの手前には、ゲート５２１が例えばモータにより開閉可能に設けられ、被検査物Ｗの搬入を停止させることが出来る。本実施形態の搬出装置５３は、ターンテーブル５３ａ、５３ｂ、コンベア５３ｃによりなる。搬出装置５３は、検査コンベア５１において非破壊検査を終えた被検査物Ｗのうち、第２の移載装置６ｂを介して良品と判定された良品Ｚが載置されたホルダーＨを検査コンベア５１から搬出する。 As the carrying-in device 52 and the carrying-out device 53, not only the above-mentioned chain conveyor or belt conveyor but also a turntable can be used. Moreover, as shown in FIG. 1, these can also be used in combination. The carrying-in device 52 of this embodiment is made up of a combination of a conveyor 52a, turntables 52b, 52c, and 52d. The carry-in device 52 carries the holder H on which the inspected object W is placed onto the inspection conveyor 51 via the first transfer device 6a. Further, in front of the first transfer device 6a, a gate 521 is provided so as to be openable and closable by, for example, a motor, so that the conveyance of the object W to be inspected can be stopped. The carry-out device 53 of this embodiment includes turntables 53a, 53b, and a conveyor 53c. The carry-out device 53 transfers the holder H on which the non-defective product Z, which has been determined to be non-defective through the second transfer device 6b, out of the inspected objects W that has been non-destructively tested on the inspection conveyor 51, to the inspection conveyor 51. Remove from.
第１の移載装置６ａは、搬入装置５２と検査コンベア５１の間に設けられ、搬入装置５２から検査コンベア５１へと被検査物Ｗが載置されたホルダーＨを移載する。また、第２の移載装置６ｂは、検査コンベア５１と後述の誘導機構７との間に設けられ、検査コンベア５１から誘導機構７へと被検査物Ｗが載置されたホルダーＨを移載する。 The first transfer device 6a is provided between the carry-in device 52 and the inspection conveyor 51, and transfers the holder H on which the object to be inspected W is placed from the carry-in device 52 to the inspection conveyor 51. Further, the second transfer device 6b is provided between the inspection conveyor 51 and the guiding mechanism 7, which will be described later, and transfers the holder H on which the inspected object W is placed from the inspection conveyor 51 to the guiding mechanism 7. do.
第１の移載装置６ａと第２の移載装置６ｂは、基本的に同様な構成を有する。第１の移載装置６ａは、ホイール６１ａと、このホイール６１ａの下方に設けられた第１の受け渡し部６２ａを備える（図３参照）。第２の移載装置６ｂは、ホイール６１ｂと、このホイール６１ｂの下方に設けられた第２の受け渡し部６２ｂを備える（図４参照）。本実施形態のホイール６１ａ、６１ｂは、例えば図２に示すようなスターホイールであって、それぞれ複数の凹部６１１を備える。この複数の凹部６１１は、ホイール６１ａ、６１ｂの外周に沿って等間隔に設けられている。なお、図２は、搬入装置５２と検査コンベア５１の間に設けられる第１の移載装置６ａを示している。ホイール６１ａ、６１ｂは、図示しないモータにより回転し、凹部６１１に設けられた図示しない保持機構により、ホルダーＨを保持または解放し、ホルダーＨを移載する。この保持は、例えば真空または磁力による吸着や機械によるクランプにより実現されるが、本実施形態では真空または磁力による吸着を採用している。 The first transfer device 6a and the second transfer device 6b have basically the same configuration. The first transfer device 6a includes a wheel 61a and a first transfer section 62a provided below the wheel 61a (see FIG. 3). The second transfer device 6b includes a wheel 61b and a second transfer section 62b provided below the wheel 61b (see FIG. 4). The wheels 61a and 61b of this embodiment are, for example, star wheels as shown in FIG. 2, and are each provided with a plurality of recesses 611. The plurality of recesses 611 are provided at equal intervals along the outer periphery of the wheels 61a, 61b. Note that FIG. 2 shows the first transfer device 6a provided between the carry-in device 52 and the inspection conveyor 51. The wheels 61a and 61b are rotated by a motor (not shown), hold or release the holder H, and transfer the holder H by a holding mechanism (not shown) provided in the recess 611. This holding is achieved, for example, by vacuum or magnetic attraction or mechanical clamping, and in this embodiment vacuum or magnetic attraction is used.
第１の受け渡し部６２ａは、検査コンベア５１の側方かつ搬入装置５２と検査コンベア５１の間に設けられる。すなわち、搬入装置５２と検査コンベア５１の隙間を埋めるように設けられる。また、第２の受け渡し部６２ｂは、検査コンベア５１の側方かつ検査コンベア５１と誘導機構７の間に設けられる。より詳細には、検査コンベア５１と誘導機構７の隙間及び誘導機構７のターンテーブル７１ａと７２ａの隙間を埋めるように設けられる。本実施形態においては、第１の受け渡し部６２ａは、図３に示すように概略五角形であり、第２の受け渡し部６２ｂは、図４に示すように概略Ｔ字型である。なお、検査コンベア５１の側方とは、当該検査コンベア５１の両端に設けられたスプロケット５１１の外周に沿って下方に凹んでいない部分を指す。 The first delivery section 62a is provided on the side of the inspection conveyor 51 and between the carry-in device 52 and the inspection conveyor 51. That is, it is provided so as to fill the gap between the carry-in device 52 and the inspection conveyor 51. Further, the second delivery section 62b is provided on the side of the inspection conveyor 51 and between the inspection conveyor 51 and the guiding mechanism 7. More specifically, it is provided to fill the gap between the inspection conveyor 51 and the guiding mechanism 7 and the gap between the turntables 71a and 72a of the guiding mechanism 7. In this embodiment, the first transfer section 62a is approximately pentagonal as shown in FIG. 3, and the second transfer section 62b is approximately T-shaped as shown in FIG. Note that the sides of the inspection conveyor 51 refer to portions that are not recessed downward along the outer periphery of the sprockets 511 provided at both ends of the inspection conveyor 51.
第１の受け渡し部６２ａにおけるホルダーＨの載置面は、その両側の搬入装置５２と検査コンベア５１におけるホルダーＨの載置面と同一平面上に位置する。また、第２の受け渡し部６２ｂの載置面は、検査コンベア５１と誘導機構７の載置面と同一平面上に位置する。同一平面上とは、ホルダーＨが各構成の載置面間をスムーズに渡ることが可能な程度に同一平面上であることを示す。さらに、搬入装置５２、第１の受け渡し部６２ａ、検査コンベア５１における被検査物Ｗの各載置面は、互いに隙間なく突き合わされている。隙間なくといっても、搬入装置５２や検査コンベア５１の駆動を妨げない程度には隙間があり、ホルダーＨが各構成の載置面間をスムーズに渡ることが可能な程度に各構成の載置面が近接していることを示す。 The mounting surface of the holder H in the first transfer section 62a is located on the same plane as the mounting surface of the holder H in the carrying-in device 52 and the inspection conveyor 51 on both sides thereof. Further, the mounting surface of the second transfer section 62b is located on the same plane as the mounting surfaces of the inspection conveyor 51 and the guiding mechanism 7. "On the same plane" means that the holder H is on the same plane to the extent that it can smoothly cross between the mounting surfaces of each structure. Furthermore, the mounting surfaces of the inspection object W in the carrying-in device 52, the first transfer section 62a, and the inspection conveyor 51 are butted against each other without any gap. Even if there is no gap, there is a gap to the extent that it does not impede the driving of the loading device 52 or the inspection conveyor 51, and the mounting of each configuration is sufficient to allow the holder H to smoothly cross between the mounting surfaces of each configuration. Indicates that the mounting surfaces are close.
載置面とはホルダーＨが載置される面を指すので、少なくともホルダーＨの移載経路において、各構成の載置面が同一平面上かつ互いに隙間なく突き合わされていればよい。なお、ホルダーＨの載置面は、特許請求の範囲における「被検査物の載置面」に含まれる概念であり、この場合の「被検査物の載置面」は、当然のことながらホルダーＨの上面を指すものではない。 Since the mounting surface refers to the surface on which the holder H is mounted, it is only necessary that the mounting surfaces of each structure are abutted against each other on the same plane and without any gaps, at least in the transfer path of the holder H. Note that the placement surface of the holder H is a concept included in the "placement surface of the object to be inspected" in the claims, and the "placement surface of the object to be inspected" in this case is of course the holder. It does not refer to the top surface of H.
誘導機構７は、非破壊検査を終えて不良品Ｘまたは未検査品Ｙと判定された被検査物Ｗが第２の移載装置６ｂにより振り分けられる誘導路である。誘導機構７は、不良品Ｘの誘導路７１、未検査品Ｙの誘導路７２を備える。本実施形態の誘導路７１、７２は、第２の移載装置６ｂの回転方向に沿って順次設けられ、誘導路７１が検査コンベア５１から１８０°位置に、誘導路７２が２７０°位置に、それぞれ設けられる。誘導路７１、７２は、底部に設けられたターンテーブルによってそれぞれ不良品Ｘまたは未検査品Ｙを搬送する。本実施形態の誘導路７１、７２は、例えば回転方向の異なるターンテーブル７１ａ、７１ｂまたは７２ａ、７２ｂを並べることにより、不良品Ｘまたは未検査品Ｙを搬送するＳ字状の誘導路とすることが出来る。 The guiding mechanism 7 is a guiding path through which the inspected objects W determined to be defective products X or uninspected products Y after non-destructive testing are sorted by the second transfer device 6b. The guiding mechanism 7 includes a guiding path 71 for defective products X and a guiding path 72 for uninspected products Y. The guideways 71 and 72 of this embodiment are provided sequentially along the rotational direction of the second transfer device 6b, with the guideway 71 at a position of 180° from the inspection conveyor 51, and the guideway 72 at a position of 270° from the inspection conveyor 51. Each is provided. The guide paths 71 and 72 transport defective products X and uninspected products Y, respectively, by turntables provided at the bottom. The guideways 71 and 72 of this embodiment can be formed into S-shaped guideways for transporting defective products X or uninspected products Y by arranging turntables 71a, 71b or 72a, 72b with different rotational directions, for example. I can do it.
ストックヤード８は、誘導路７１、７２の出口に設けられ、搬送されてきた不良品Ｘ及び未検査品Ｙを一時的に貯留する空間である。ストックヤード８は、図１に示すように、検査コンベア５１と平行に設けられる。ストックヤード８は、それぞれ長手方向に延びる２つの空間に区分される。この２つの空間のうち、誘導路７１の出口と接続される空間が貯留部８１であり、誘導路７２の出口と接続される空間が貯留部８２である。貯留部８１には不良品Ｘが、貯留部８２には未検査品Ｙが、それぞれ貯留される。貯留部８１、８２の底部には検査コンベア５１と平行に延びるコンベア８３が設けられており、誘導路７１、７２から搬送されてきた不良品Ｘ及び未検査品Ｙは、ストックヤード８の出口側、すなわち被検査物Ｗの搬入側へと搬送される。コンベア８３としては、例えばチェーンコンベアやベルトコンベアを用いることが出来る。不良品Ｘの貯留部８１及び未検査品Ｙの貯留部８２の出口付近には、ストックヤード８内に不良品Ｘ及び未検査品Ｙを停止させておくためのゲート８１１、８２１がそれぞれ設けられる。ゲート８１１、８２１は、例えばモータにより独立して開閉可能である。 The stockyard 8 is a space that is provided at the exit of the guideways 71 and 72 and temporarily stores the transported defective products X and uninspected products Y. The stockyard 8 is provided parallel to the inspection conveyor 51, as shown in FIG. The stockyard 8 is divided into two spaces each extending in the longitudinal direction. Of these two spaces, the space connected to the exit of the guideway 71 is the storage section 81, and the space connected to the exit of the guideway 72 is the storage section 82. Defective products X are stored in the storage section 81, and uninspected products Y are stored in the storage section 82. A conveyor 83 extending parallel to the inspection conveyor 51 is provided at the bottom of the storage sections 81 and 82, and defective products X and uninspected products Y transported from the guideways 71 and 72 are delivered to the exit side of the stockyard 8. That is, the inspection object W is transported to the carry-in side. As the conveyor 83, for example, a chain conveyor or a belt conveyor can be used. Gates 811 and 821 are provided near the exits of the storage section 81 for defective products X and the storage section 82 for uninspected products Y, respectively, for stopping the defective products X and uninspected products Y in the stockyard 8. . The gates 811 and 821 can be opened and closed independently by, for example, a motor.
ゲート８１１、８２１の先には、再投入機構９が設けられる。再投入機構９は、不良品Ｘまたは未検査品Ｙを搬入装置５２へと再投入する誘導路である。本実施形態の再投入機構９は、図１に示すように、ターンテーブル９ａと搬入経路変更スイッチ９１により構成される。ターンテーブル９ａは、ゲート８１１、８２１から流れてきた不良品Ｘまたは未検査品Ｙを搬入装置５２へと再投入するために、平面視でゲート８１１、８２１と搬入装置５２の間を埋めるように設けられる。搬入装置５２へと不良品Ｘまたは未検査品Ｙを再投入する部分の近傍には、例えばモータにより駆動する搬入経路変更スイッチ９１が設けられる。搬入経路変更スイッチ９１は、非破壊検査前の被検査物Ｗの流れを停止させ、再投入機構９から搬入装置５２へと不良品Ｘまたは未検査品Ｙを再投入する切り替えスイッチである。 A re-input mechanism 9 is provided beyond the gates 811 and 821. The reinsertion mechanism 9 is a guideway for reintroducing defective products X or uninspected products Y into the carrying-in device 52. The re-loading mechanism 9 of this embodiment is comprised of a turntable 9a and a carry-in route change switch 91, as shown in FIG. The turntable 9a fills the space between the gates 811, 821 and the carry-in device 52 in a plan view in order to reinject defective products X or uninspected products Y flowing from the gates 811, 821 into the carry-in device 52. provided. A carry-in route change switch 91 driven by, for example, a motor is provided near a portion where defective products X or uninspected products Y are reintroduced into the carry-in device 52. The carry-in route change switch 91 is a changeover switch that stops the flow of the inspected object W before non-destructive testing and reinjects the defective product X or the uninspected product Y from the reinsertion mechanism 9 into the carry-in device 52.
制御部１０は、被検査物Ｗを搬送及び検査するために、放射線発生器２、放射線検出器３、搬送機構５、誘導機構７、ストックヤード８、再投入機構９の動作を制御する。制御部１０は、所謂コンピュータであり、ＨＤＤまたはＳＳＤといったストレージ、ＲＡＭ、ＣＰＵ及びドライバ回路で構成される。ストレージには、例えば各構成を制御するためのプログラムやデータが記憶されている。ＲＡＭには、プログラムが展開され、またデータが一時的に記憶される。ＣＰＵはプログラムを処理し、この処理結果に従ってドライバ回路は各構成に電力を供給する。 The control unit 10 controls the operations of the radiation generator 2, the radiation detector 3, the transport mechanism 5, the guide mechanism 7, the stockyard 8, and the reloading mechanism 9 in order to transport and test the object W to be inspected. The control unit 10 is a so-called computer, and is composed of a storage such as an HDD or an SSD, a RAM, a CPU, and a driver circuit. The storage stores, for example, programs and data for controlling each configuration. In the RAM, programs are expanded and data is temporarily stored. The CPU processes the program, and the driver circuit supplies power to each component according to the processing result.
［１－２．実施形態の作用］
本実施形態の被検査物Ｗの搬送及び検査手順について、図５の機能ブロック図及び図６のフローチャートを参照しつつ、以下に説明する。なお、図５は、制御部１０による制御の一部を示すのみであり、例えば搬送機構５の動作の制御などは示していない。前提として、搬入装置５２の搬送経路には、被検査物Ｗが載置されたホルダーＨがゲート５２１の手前まで並べられている。制御部１０による制御により、ゲート５２１が開かれ、搬送機構５が駆動されると、ホルダーＨは順次ターンテーブル５２ｄから第１の移載装置６ａの凹部６１１へと受け渡される。凹部６１１は、真空または磁力によりホルダーＨを吸着保持し、ホイール６１ａが時計回りに回転することにより、第１の受け渡し部６２ａの載置面上を滑らせながら検査コンベア５１の載置面へと移載する（ステップＳ０１）。より詳細には、図２に示すように、検査コンベア５１の上面に一定間隔ごとに設けられた突起５１２の間にホルダーＨを移載する。検査コンベア５１の載置面に移載されたホルダーＨに対して、当該ホルダーＨを吸着保持している凹部６１１は真空または磁力を解除する。これにより、ホルダーＨは凹部６１１から解放され、検査コンベア５１上を搬送される（ステップＳ０２）。
[1-2. Effect of embodiment]
The transportation and inspection procedure of the inspection object W of this embodiment will be described below with reference to the functional block diagram of FIG. 5 and the flowchart of FIG. 6. Note that FIG. 5 only shows part of the control by the control unit 10, and does not show, for example, control of the operation of the transport mechanism 5. As a premise, the holders H on which the objects to be inspected W are placed are lined up on the transport path of the carry-in device 52 up to the front of the gate 521 . When the gate 521 is opened and the transport mechanism 5 is driven under the control of the control unit 10, the holders H are sequentially transferred from the turntable 52d to the recess 611 of the first transfer device 6a. The recess 611 attracts and holds the holder H by vacuum or magnetic force, and as the wheel 61a rotates clockwise, the holder H is slid onto the mounting surface of the inspection conveyor 51 while sliding on the mounting surface of the first transfer section 62a. Transfer (step S01). More specifically, as shown in FIG. 2, the holder H is transferred between projections 512 provided at regular intervals on the upper surface of the inspection conveyor 51. With respect to the holder H transferred to the mounting surface of the inspection conveyor 51, the recess 611 that holds the holder H by attraction releases the vacuum or magnetic force. As a result, the holder H is released from the recess 611 and transported on the inspection conveyor 51 (step S02).
検査コンベア５１上を搬送されるホルダーＨは、搬入口４１から遮蔽箱４内部へと搬入される。遮蔽箱４内部において、２組の放射線発生器２及び放射線検出器３は、ホルダーＨ上に載置された被検査物Ｗを撮像する（ステップＳ０３）。より詳細には、一方の組が被検査物Ｗの上部を撮像し、他方の組が被検査物Ｗの下部を撮像する。２つの放射線検出器３の判定部３１は、それぞれ被検査物Ｗに対してその良否を判定し、判定結果を制御部１０へと出力する（ステップＳ０４）。この判定結果とは、被検査物Ｗが、不良品Ｘ、未検査品Ｙ、良品Ｚのいずれであるかという情報である。 The holder H conveyed on the inspection conveyor 51 is carried into the shielding box 4 through the carry-in port 41. Inside the shielding box 4, the two sets of radiation generator 2 and radiation detector 3 image the inspected object W placed on the holder H (step S03). More specifically, one set images the upper part of the object W to be inspected, and the other set images the lower part of the object W to be inspected. The determination units 31 of the two radiation detectors 3 determine the quality of each inspected object W, and output the determination results to the control unit 10 (step S04). This determination result is information as to whether the inspected object W is a defective product X, an uninspected product Y, or a non-defective product Z.
制御部１０は、２つの判定部３１からの判定結果に基づき、第２の移載装置６ｂを制御する。以降では、被検査物Ｗが、不良品Ｘまたは未検査品Ｙの場合、良品Ｚの場合に分けて説明する。なお、本実施形態において、２つの判定部３１からの判定結果が異なる場合は、未検査品Ｙ＞不良品Ｘ＞良品Ｚの優劣により最終的な判定結果を定めるものとする。例えば、一方の判定結果が不良品Ｘまたは未検査品Ｙであるのに対し、他方の判定結果が良品Ｚである場合は、最終的な判定結果は不良品Ｘまたは未検査品Ｙであるものとする。また、一方の判定結果が不良品Ｘであるのに対し、他方の判定結果が未検査品Ｙである場合は、最終的な判定結果は未検査品Ｙであるものとする。 The control unit 10 controls the second transfer device 6b based on the determination results from the two determination units 31. Hereinafter, cases in which the inspected object W is a defective product X, an uninspected product Y, and a non-defective product Z will be explained separately. In this embodiment, if the determination results from the two determination units 31 are different, the final determination result is determined based on the following: uninspected product Y>defective product X>defective product Z. For example, if one judgment result is a defective product X or an uninspected product Y, and the other judgment result is a non-defective product Z, the final judgment result is a defective product X or an uninspected product Y. shall be. Further, if one determination result is a defective product X and the other determination result is an uninspected product Y, the final determination result is an uninspected product Y.
［判定結果が良品Ｚの場合］
判定結果が良品Ｚの場合、制御部１０は第２の移載装置６ｂを制御せず、すなわち凹部６１１に当該良品Ｚを吸着保持させない（ステップＳ０５のＮＯ）。この場合、良品Ｚは凹部６１１により搬送経路を変更されないので、良品Ｚは検査コンベア５１の出口へと到達し、搬出装置５３のターンテーブル５３ａ、５３ｂ、コンベア５３ｃにより被検査装置１の外部へと搬出される。
[If the judgment result is good product Z]
When the determination result is a good product Z, the control unit 10 does not control the second transfer device 6b, that is, does not cause the recess 611 to attract and hold the good product Z (NO in step S05). In this case, since the conveyance path of the non-defective product Z is not changed by the recess 611, the non-defective product Z reaches the exit of the inspection conveyor 51 and is transported to the outside of the device to be inspected 1 by the turntables 53a, 53b and conveyor 53c of the unloading device 53. It will be carried out.
［判定結果が不良品Ｘまたは未検査品Ｙの場合］
第２の移載装置６ｂの凹部６１１は、遮蔽箱４の搬出口４２から検査コンベア５１により搬送されてきた、不良品Ｘまたは未検査品Ｙであると判定された被検査物Ｗを吸着保持する。この被検査物Ｗは、ホイール６１ｂが時計回りに回転することにより、第２の受け渡し部６２ｂの載置面上を滑りながらターンテーブル７１ａの載置面へと移載される（ステップＳ０５のＹＥＳ）。ここで、吸着保持された被検査物Ｗが不良品Ｘである場合は、凹部６１１による吸着保持が解除される（ステップＳ０６のＹＥＳ）。凹部６１１から解放された当該不良品Ｘはターンテーブル７１ａから７１ｂへと移載され、ストックヤード８の貯留部８１へと搬送される。貯留部８１において、不良品Ｘは、コンベア８３によりゲート８１１の手前、すなわちストックヤード８の出口まで順次搬送される（ステップＳ０７－１）。
[If the judgment result is defective product X or uninspected product Y]
The concave portion 611 of the second transfer device 6b attracts and holds the inspected object W, which has been conveyed by the inspection conveyor 51 from the exit 42 of the shielding box 4 and is determined to be a defective product do. As the wheel 61b rotates clockwise, the object W to be inspected is transferred to the mounting surface of the turntable 71a while sliding on the mounting surface of the second transfer section 62b (YES in step S05). ). Here, if the inspected object W held by suction is a defective product X, suction and holding by the recess 611 is released (YES in step S06). The defective product X released from the recess 611 is transferred from the turntable 71a to the turntable 71b, and is transported to the storage section 81 of the stockyard 8. In the storage section 81, the defective products X are sequentially transported by the conveyor 83 to the front of the gate 811, that is, to the exit of the stockyard 8 (step S07-1).
一方で、第２の移載装置６ｂの凹部６１１により吸着保持された被検査物Ｗが未検査品Ｙである場合は、ターンテーブル７１ａの載置面において吸着保持が解除されず、再び第２の受け渡し部６２ｂの載置面上を滑ってターンテーブル７２ａの載置面へと移載される（ステップＳ０６のＮＯ）。ここで、凹部６１１による吸着保持が解除され、凹部６１１から解放された当該未検査品Ｙはターンテーブル７２ａからターンテーブル７２ｂへと移載され、ストックヤード８の貯留部８２へと搬送される。貯留部８２において、未検査品Ｙは、コンベア８３によりゲート８２１の手前、すなわちストックヤード８の出口まで順次搬送される（ステップＳ０７－２）。不良品Ｘまたは未検査品Ｙを再投入機構９により搬入コンテナ５２へと再投入しない場合、不良品Ｘまたは未検査品Ｙに係るステップは終了する（ステップＳ０８のＮＯ）。 On the other hand, if the inspected object W suction-held by the recess 611 of the second transfer device 6b is an uninspected item Y, the suction-holding is not released on the mounting surface of the turntable 71a, and the second It slides on the mounting surface of the transfer section 62b and is transferred to the mounting surface of the turntable 72a (NO in step S06). Here, the suction and holding by the recess 611 is released, and the uninspected product Y released from the recess 611 is transferred from the turntable 72a to the turntable 72b and transported to the storage section 82 of the stockyard 8. In the storage section 82, the uninspected products Y are sequentially conveyed by the conveyor 83 to the front of the gate 821, that is, to the exit of the stockyard 8 (step S07-2). If the defective product X or the uninspected product Y is not reinjected into the carrying-in container 52 by the re-insertion mechanism 9, the steps related to the defective product X or the uninspected product Y end (NO in step S08).
ステップＳ０７の後、不良品Ｘまたは未検査品Ｙを再投入機構９により搬入コンテナ５２へと再投入する場合について説明する。再投入する場合、搬送機構５及び誘導機構７上に存在する被検査物Ｗを非破壊検査装置１から取り除く（ステップＳ０８のＹＥＳ）。次に、搬入経路変更スイッチ９１を切り替える（ステップＳ０９）。最後にゲート８１１、８２１を開けることにより、不良品Ｘまたは未検査品Ｙが、コンベア８３からターンテーブル９ａを介して搬入装置５２のターンテーブル５２ｃへと再投入される（ステップＳ１０）。なお、制御部１０は、ゲート８１１、８２１を個別に開閉可能であり、本実施形態では不良品Ｘと未検査品Ｙは別々に再投入され、再検査される。 A case will be described in which the defective product X or the uninspected product Y is reinserted into the carrying-in container 52 by the re-insertion mechanism 9 after step S07. When reinserting, the inspected object W existing on the transport mechanism 5 and the guiding mechanism 7 is removed from the non-destructive testing apparatus 1 (YES in step S08). Next, the carry-in route change switch 91 is switched (step S09). Finally, by opening the gates 811 and 821, the defective product X or the uninspected product Y is reinjected from the conveyor 83 to the turntable 52c of the carry-in device 52 via the turntable 9a (step S10). Note that the control unit 10 can open and close the gates 811 and 821 individually, and in this embodiment, the defective product X and the uninspected product Y are separately reinjected and re-inspected.
以上、ステップＳ０１～Ｓ１０により、ホルダーＨに載置された被検査物Ｗが順次搬送及び検査される。 As described above, through steps S01 to S10, the object to be inspected W placed on the holder H is sequentially transported and inspected.
［１－３．実施形態の効果］
（１）本実施形態では、直線状の検査コンベア５１の側方かつ搬入装置５２と検査コンベア５１との間に第１の受け渡し部６２ａが設けられ、搬入装置５２、第１の受け渡し部６２ａ、検査コンベア５１におけるホルダーＨの各載置面は同一平面上で互いに隙間なく突き合わされている。これにより、ループ状の検査用搬送路に比べて低コストで導入可能な直線状の検査コンベア５１を採用しながらも、第１の移載装置６ａは、直線状の検査コンベア５１の側方に設けられているので、搬入装置５２から検査コンベア５１へと被検査物Ｗを転倒させることなくスムーズに移載することができる。また、転倒せずとも移載時に搬送間隔が変わってしまうといった課題も解消するので、撮像に失敗するおそれも低減される。
[1-3. Effects of embodiment]
(1) In this embodiment, the first delivery section 62a is provided on the side of the linear inspection conveyor 51 and between the carry-in device 52 and the inspection conveyor 51, and the carry-in device 52, the first transfer section 62a, The mounting surfaces of the holders H on the inspection conveyor 51 are abutted against each other on the same plane without any gaps. As a result, although the linear inspection conveyor 51, which can be introduced at a lower cost than a loop-shaped inspection conveyance path, is adopted, the first transfer device 6a is placed on the side of the linear inspection conveyor 51. Since it is provided, it is possible to smoothly transfer the inspected object W from the carry-in device 52 to the inspection conveyor 51 without overturning it. Furthermore, since the problem that the conveyance interval changes during transfer without overturning is solved, the possibility of failure in imaging is also reduced.
（２）本実施形態では、直線状の検査コンベア５１の側方かつ検査コンベア５１と誘導機構７との間に第２の受け渡し部６２ｂが設けられ、検査コンベア５１、第２の受け渡し部６２ｂ、誘導機構７におけるホルダーＨの各載置面は同一平面上で互いに隙間なく突き合わされている。これにより、第２の移載装置６ｂは、検査コンベア５１から誘導機構７へと不良品Ｘまたは未検査品Ｙを転倒させることなくスムーズに移載することができる。 (2) In this embodiment, the second delivery section 62b is provided on the side of the linear inspection conveyor 51 and between the inspection conveyor 51 and the guiding mechanism 7, and the inspection conveyor 51, the second delivery section 62b, The mounting surfaces of the holders H in the guiding mechanism 7 are abutted against each other on the same plane without any gaps. Thereby, the second transfer device 6b can smoothly transfer the defective product X or the uninspected product Y from the inspection conveyor 51 to the guiding mechanism 7 without overturning the defective product X or the uninspected product Y.
（３）本実施形態では、第１の移載装置６ａ及び第２の移載装置６ｂは、それぞれホイール６１ａ、６１ｂを備え、これらホイール６１ａ、６１ｂの外周に沿って等間隔に設けられた複数の凹部６１１が、ホルダーを保持または解放するものとした。これにより、搬入装置５２におけるホルダーＨの搬送間隔が不揃いであっても、検査コンベア５１には等間隔に移載することが出来る。これにより、被検査物Ｗを連続的に撮像する場合であっても、撮像に失敗するおそれが低減される。 (3) In this embodiment, the first transfer device 6a and the second transfer device 6b each include wheels 61a and 61b, and a plurality of wheels are provided at equal intervals along the outer periphery of these wheels 61a and 61b. The recess 611 was used to hold or release the holder. Thereby, even if the conveyance intervals of the holders H in the carry-in device 52 are uneven, the holders H can be transferred to the inspection conveyor 51 at equal intervals. Thereby, even when the inspected object W is imaged continuously, the possibility of failure in imaging is reduced.
（４）本実施形態では、検査コンベア５１の上面に一定間隔ごとに突起５１２が設けられる。これにより、検査コンベア５１がその搬送を停止してもホルダーＨ間の間隔が保たれるので、放射線発生器２及び放射線検出器３の撮像タイミングがずれるおそれが低減される。その結果、未検査品Ｙが出る確率が低減され、被検査物Ｗの歩留まりが向上する。 (4) In this embodiment, protrusions 512 are provided on the upper surface of the inspection conveyor 51 at regular intervals. Thereby, even if the inspection conveyor 51 stops transporting the holders H, the distance between the holders H is maintained, so that the possibility that the imaging timings of the radiation generator 2 and the radiation detector 3 are shifted is reduced. As a result, the probability of uninspected products Y being produced is reduced, and the yield of inspected objects W is improved.
（５）本実施形態では、２組の放射線発生器２及び放射線検出器３が設けられ、一方が被検査物Ｗの上部を、他方が被検査物Ｗの下部を撮像する。これにより、被検査物Ｗの良否を高精度で判定することができ、被検査物Ｗの品質が向上する。 (5) In this embodiment, two sets of radiation generators 2 and radiation detectors 3 are provided, one of which images the upper part of the object W to be inspected, and the other one which images the lower part of the object W to be inspected. Thereby, the quality of the inspected object W can be determined with high precision, and the quality of the inspected object W is improved.
（６）本実施形態では、誘導機構７の出口に設けられたストックヤード８と、ストックヤード８に貯留された不良品Ｘまたは未検査品Ｙを搬入装置５２へと再投入する再投入機構９を備える。これにより、不良品Ｘまたは未検査品Ｙを再検査することができるので、被検査物Ｗの歩留まりが向上する。 (6) In the present embodiment, a stockyard 8 provided at the exit of the guide mechanism 7 and a re-insertion mechanism 9 for reinjecting defective products X or uninspected products Y stored in the stockyard 8 into the carrying-in device 52 Equipped with. Thereby, the defective product X or the uninspected product Y can be re-inspected, so that the yield of the inspected objects W is improved.
［２．他の実施形態］
本明細書においては、本発明に係る複数の実施形態を説明したが、これらの実施形態は例として提示したものであって、発明の範囲を限定することを意図していない。以上のような実施形態は、その他の様々な形態で実施されることが可能であり、発明の範囲を逸脱しない範囲で、種々の省略や置き換え、変更を行うことができる。これらの実施形態やその変形は、発明の範囲や要旨に含まれると同様に、特許請求の範囲に記載された発明とその均等の範囲に含まれるものである。
[2. Other embodiments]
Although a plurality of embodiments according to the present invention have been described in this specification, these embodiments are presented as examples and are not intended to limit the scope of the invention. The embodiments described above can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the scope of the invention. These embodiments and their modifications are included within the scope and gist of the invention as well as within the scope of the invention described in the claims and its equivalents.
（１）第１の実施形態では、不良品Ｘまたは未検査品Ｙを再投入することにより再検査することとしたが、不良品Ｘについては再検査を行うことなく、破棄或いは再生処理を行うことも出来る。その場合、不良品Ｘの貯留部８１の出口に回収ボックスなどを配置する。 (1) In the first embodiment, defective product X or uninspected product Y is re-inspected by reintroducing it, but defective product You can also do that. In that case, a collection box or the like is placed at the outlet of the storage section 81 for defective products X.
（２）第１の実施形態では、被検査物Ｗを内部に捲回構造を備える円筒型のリチウムイオン電池としたが、例えば角型やラミネート型の各種電池、アルミ電解コンデンサ、電気二重層キャパシタなどの電気化学キャパシタであってもよい。 (2) In the first embodiment, the object W to be inspected is a cylindrical lithium ion battery with an internal winding structure, but for example, various types of square or laminate batteries, aluminum electrolytic capacitors, electric double layer capacitors, etc. It may also be an electrochemical capacitor such as.
（３）第１の実施形態では、判定部３１が判定する被検査物Ｗの良否について、不良品Ｘであるとも未検査品Ｙであるとも判定されたものは未検査品Ｙとしたが、不良品Ｘとしてもよい。また、２つの放射線検出器３の判定部３１の一方が、被検査物Ｗを不良品Ｘと判定し、他方が当該被検査物Ｗを未検査品Ｙと判定した場合、制御部１０は当該被検査物を未検査品Ｙとしたが、不良品Ｘとしてもよい。さらに、不良品Ｘの基準についても、正極板が負極板からはみ出ていることに限られない。 (3) In the first embodiment, regarding the quality of the inspected object W determined by the determination unit 31, an item determined to be either a defective item X or an uninspected item Y is defined as an uninspected item Y. It may be treated as defective product X. Further, when one of the determination units 31 of the two radiation detectors 3 determines that the inspected object W is a defective product X, and the other determines that the inspected object W is an uninspected product Y, the control unit 10 Although the object to be inspected is an uninspected product Y, it may also be a defective product X. Furthermore, the criterion for defective product X is not limited to the positive electrode plate protruding from the negative electrode plate.
（４）第１の実施形態では、第１の移載装置６ａ、第２の移載装置６ｂを設けたが、さらに検査コンベア５１の出口と搬出装置５３との間に、第１の移載装置６ａ、第２の移載装置６ｂと基本的に同様の構成である第３の移載装置を設けてもよい。この場合、検査コンベア５１とターンテーブル５３ａの間に第３の受け渡し部が設けられ、検査コンベア５１、第３の受け渡し部、ターンテーブル５３ａの載置面は同一平面上にある。同一平面上とは、ホルダーＨが各構成の載置面間をスムーズに渡ることが可能な程度に同一平面上であることを示す。 (4) In the first embodiment, the first transfer device 6a and the second transfer device 6b are provided. A third transfer device having basically the same configuration as the device 6a and the second transfer device 6b may be provided. In this case, a third transfer section is provided between the inspection conveyor 51 and the turntable 53a, and the mounting surfaces of the inspection conveyor 51, the third transfer section, and the turntable 53a are on the same plane. On the same plane means that the holder H is on the same plane to the extent that it can smoothly cross between the mounting surfaces of each structure.
（５）第１の実施形態では、搬入装置５２、搬出装置５３は、コンベアとターンテーブルを組み合わせて構成されたが、コンベアのみまたはターンテーブルのみで構成されてもよく、その数やターンテーブルの回転方向も第１の実施形態に限定されない。 (5) In the first embodiment, the carry-in device 52 and the carry-out device 53 are configured by combining a conveyor and a turntable, but they may be configured by only a conveyor or only a turntable, and the number and number of turntables may be changed. The rotation direction is also not limited to the first embodiment.
（６）第１の実施形態の移載装置としては、真空または磁力によりホルダーＨを吸着保持するスターホイールであるホイール６１ａ、６１ｂを採用したが、吸着保持しなくとも、凹部６１１間の突起でホルダーＨを押し出すことも出来る。また、移載装置もスターホイールに限定されるものではなく、無端状のチェーンコンベアの周囲に所定間隔で被検査物Ｗを送り出す突起やアームを設けたものでも良い。また、回転軸の周囲に放射状に突起やアームを設けたものでも良い。 (6) As the transfer device of the first embodiment, the wheels 61a and 61b, which are star wheels that attract and hold the holder H using vacuum or magnetic force, are used. Holder H can also be pushed out. Further, the transfer device is not limited to the star wheel, but may be one that is provided with protrusions or arms around an endless chain conveyor to send out the inspected objects W at predetermined intervals. Alternatively, projections or arms may be provided radially around the rotating shaft.
１…非破壊検査装置
２…放射線発生器
３…放射線検出器
４…遮蔽箱
４１…搬入口
４２…搬出口
５…搬送機構
５１…検査コンベア
５１１…スプロケット
５１２…突起
５２…搬入装置
５２ａ…コンベア
５２ｂ、５２ｃ、５２ｄ…ターンテーブル
５２１…ゲート
５３…搬出装置
５３ａ、５３ｂ…ターンテーブル
５３ｃ…コンベア
６ａ…第１の移載装置
６ｂ…第２の移載装置
６１ａ、６１ｂ…ホイール
６１１…凹部
６２ａ…第１の受け渡し部
６２ｂ…第２の受け渡し部
７…誘導機構
７１、７２…誘導路
７１ａ、７１ｂ、７２ａ、７２ｂ…ターンテーブル
８…ストックヤード
８１、８２…貯留部
８１１、８２１…ゲート
８３…コンベア
９…再投入機構
９ａ…ターンテーブル
９１…搬入経路変更スイッチ
１０…制御部
Ｈ…ホルダー
Ｗ…被検査物
Ｘ…不良品
Ｙ…未検査品
Ｚ…良品
1...Non-destructive inspection device 2...Radiation generator 3...Radiation detector 4...Shielding box 41...Carry-in port 42...Carry-out port 5...Transport mechanism 51...Inspection conveyor 511...Sprocket 512...Protrusion 52...Carry-in device 52a...Conveyor 52b , 52c, 52d... Turntable 521... Gate 53... Carrying out devices 53a, 53b... Turntable 53c... Conveyor 6a... First transfer device 6b... Second transfer device 61a, 61b... Wheel 611... Concavity 62a... 1 delivery part 62b...Second delivery part 7...Guidance mechanisms 71, 72...Guidance paths 71a, 71b, 72a, 72b...Turntable 8...Stock yards 81, 82...Storage parts 811, 821...Gate 83...Conveyor 9 ...Reloading mechanism 9a...Turntable 91...Carry-in route change switch 10...Control unit H...Holder W...Object to be inspected X...Defective product Y...Uninspected product Z...Good product
Claims (5)
前記放射線発生器に対向して設けられた放射線検出器と、
前記放射線発生器と前記放射線検出器の間に設けられ、前記被検査物を一定の間隔で複 数並べた状態で搬送する直線状の検査コンベアと、
前記被検査物を前記検査コンベアの搬入側まで搬入する搬入装置と、
前記搬入装置から前記検査コンベアへと前記被検査物を移載する第１の移載装置と、
前記検査コンベアの側方かつ前記搬入装置と前記検査コンベアとの間に設けられた第１ の受け渡し部と、
前記放射線検出器は、前記被検査物の良否を判定する判定部を備え、
前記判定部が否と判定した前記被検査物を振り分ける誘導機構と、
前記判定部が否と判定した前記被検査物を、前記検査コンベアから前記誘導機構へと移載する第２の移載装置と、
前記検査コンベアの側方かつ前記検査コンベアと前記誘導機構との間に設けられた第２の受け渡し部と、
を備え、
前記被検査物の移載経路において、前記搬入装置の載置面の端部、前記第１の受け渡し部の載置面の端部、前記検査コンベアの載置面の端部が、各前記載置面が同一平面上となるように、前記搬入装置及び前記検査コンベアの駆動を妨げない程度に互いに隙間なく突き合わされており、
前記判定部が否と判定した前記被検査物の移載経路において、前記検査コンベアの前記載置面の前記端部、前記第２の受け渡し部の載置面の端部、前記誘導機構の載置面の端部が、各前記載置面が同一平面上となるように、前記検査コンベア及び前記誘導機構の駆動を妨げない程度に互いに隙間なく突き合わされている、
非破壊検査装置。 a radiation generator that irradiates a radiation beam to an object to be inspected;
a radiation detector provided opposite to the radiation generator;
a linear inspection conveyor that is provided between the radiation generator and the radiation detector and conveys a plurality of the inspection objects lined up at regular intervals;
a carry-in device that carries the object to be inspected to the carry-in side of the inspection conveyor;
a first transfer device that transfers the object to be inspected from the carry-in device to the inspection conveyor;
a first delivery section provided on the side of the inspection conveyor and between the carrying-in device and the inspection conveyor;
The radiation detector includes a determination unit that determines the quality of the inspected object,
a guiding mechanism for distributing the object to be inspected which the determination unit has determined as negative;
a second transfer device that transfers the object to be inspected, which the judgment unit has judged as negative, from the inspection conveyor to the guide mechanism;
a second delivery section provided on the side of the inspection conveyor and between the inspection conveyor and the guide mechanism;
Equipped with
In the transfer path of the object to be inspected, the end of the loading surface of the carrying-in device, the end of the loading surface of the first transfer section, and the end of the loading surface of the inspection conveyor are located in front of each other. so that the writing surfaces are on the same plane, butted against each other without any gaps to the extent that they do not impede the driving of the carrying-in device and the inspection conveyor;
In the transfer path of the object to be inspected, which is determined to be negative by the determination section, the end portion of the placement surface of the inspection conveyor, the end portion of the placement surface of the second transfer section, and the placement surface of the guide mechanism are The ends of the placing surfaces are butted against each other without any gaps to the extent that the driving of the inspection conveyor and the guiding mechanism is not hindered so that the placing surfaces are on the same plane.
Non-destructive testing equipment.
前記複数の凹部は、前記ホイールの外周に沿って等間隔に設けられている、
請求項１に記載の非破壊検査装置。 The first transfer device includes a wheel having a plurality of recesses for holding or releasing the object to be inspected,
The plurality of recesses are provided at equal intervals along the outer periphery of the wheel,
The non-destructive testing device according to claim 1 .
前記被検査物は、前記突起の間に載置されて搬送される、
請求項１又は２のいずれかに記載の非破壊検査装置。 Protrusions are provided at regular intervals on the upper surface of the inspection conveyor,
The object to be inspected is placed between the protrusions and transported.
A non-destructive testing device according to claim 1 or 2 .
一方の組が前記被検査物の上側を撮像し、
他方の組が前記被検査物の下側を撮像する、
請求項１乃至３のいずれかに記載の非破壊検査装置。 Two sets of the radiation generator and the radiation detector are provided,
one set images the upper side of the object to be inspected;
the other set images the lower side of the object to be inspected;
A non-destructive testing device according to any one of claims 1 to 3 .
前記ストックヤードの出口に設けられ、当該ストックヤードに貯留された前記被検査物を前記搬入装置へと再投入する再投入機構と、
を更に備える、
請求項１乃至４のいずれかに記載の非破壊検査装置。 a stockyard that is provided at the exit of the guide mechanism and stores the inspected object that has been determined as negative by the determination section;
a re-insertion mechanism provided at an exit of the stockyard for reintroducing the inspected objects stored in the stockyard into the carrying-in device;
further comprising;
A non-destructive testing device according to any one of claims 1 to 4 .
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020045216A JP7407629B2 (en) | 2020-03-16 | 2020-03-16 | Non-destructive testing equipment |
| CN202010927616.9A CN113399315A (en) | 2020-03-16 | 2020-09-07 | Nondestructive inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020045216A JP7407629B2 (en) | 2020-03-16 | 2020-03-16 | Non-destructive testing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2021148445A JP2021148445A (en) | 2021-09-27 |
| JP7407629B2 true JP7407629B2 (en) | 2024-01-04 |
Family
ID=77677358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020045216A Active JP7407629B2 (en) | 2020-03-16 | 2020-03-16 | Non-destructive testing equipment |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7407629B2 (en) |
| CN (1) | CN113399315A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014048178A (en) | 2012-08-31 | 2014-03-17 | Ishida Co Ltd | Article inspection device and article inspection method |
| JP2015075400A (en) | 2013-10-09 | 2015-04-20 | 日立アロカメディカル株式会社 | Sample measurement instrument |
| US20170082777A1 (en) | 2015-09-22 | 2017-03-23 | Nuctech Company Limited | Security inspection passage and security inspection apparatus |
| JP2017075830A (en) | 2015-10-14 | 2017-04-20 | プリマハム株式会社 | Foreign matter detection device by x-ray |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4080377B2 (en) * | 2003-05-21 | 2008-04-23 | コスモ石油株式会社 | Nondestructive inspection method and nondestructive inspection device |
| JP4829949B2 (en) * | 2008-10-22 | 2011-12-07 | 東芝Ｉｔコントロールシステム株式会社 | Battery inspection device |
| JP2013101017A (en) * | 2011-11-08 | 2013-05-23 | Nidec-Read Corp | Substrate inspection device |
| KR20150118492A (en) * | 2014-04-14 | 2015-10-22 | (주)자비스 | X-ray Apparatus for Inspecting Object Automatically Using Controlled Transfer Structure |
| KR101707220B1 (en) * | 2015-08-03 | 2017-02-28 | (주)자비스 | An Apparatus for Inspecting a Battery with X-ray Image and a Method for Inspecting a Battery Using the Same |
| JP6780309B2 (en) * | 2016-06-10 | 2020-11-04 | オムロン株式会社 | Inspection equipment |
-
2020
- 2020-03-16 JP JP2020045216A patent/JP7407629B2/en active Active
- 2020-09-07 CN CN202010927616.9A patent/CN113399315A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014048178A (en) | 2012-08-31 | 2014-03-17 | Ishida Co Ltd | Article inspection device and article inspection method |
| JP2015075400A (en) | 2013-10-09 | 2015-04-20 | 日立アロカメディカル株式会社 | Sample measurement instrument |
| US20170082777A1 (en) | 2015-09-22 | 2017-03-23 | Nuctech Company Limited | Security inspection passage and security inspection apparatus |
| JP2017075830A (en) | 2015-10-14 | 2017-04-20 | プリマハム株式会社 | Foreign matter detection device by x-ray |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113399315A (en) | 2021-09-17 |
| JP2021148445A (en) | 2021-09-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101707220B1 (en) | An Apparatus for Inspecting a Battery with X-ray Image and a Method for Inspecting a Battery Using the Same | |
| US9521793B2 (en) | Method and device for filling carrier tapes with electronic components | |
| KR101133048B1 (en) | Battery inspection apparatus | |
| JP2921937B2 (en) | IC inspection equipment | |
| KR101380858B1 (en) | Battery inspection apparatus | |
| KR20150118492A (en) | X-ray Apparatus for Inspecting Object Automatically Using Controlled Transfer Structure | |
| KR20180111562A (en) | Inspection device, inspection method, and method of producing film roll | |
| KR102646569B1 (en) | A Plural Conveying Paths Type of an X-ray Investigating Apparatus | |
| KR102049429B1 (en) | X-ray Apparatus for Inspecting Object Automatically Using Controlled Transfer Structure | |
| KR102000955B1 (en) | X-Ray Apparatus for Inspecting a Plural of Objects Simultaneously and Method for the Same | |
| KR102216872B1 (en) | A Noncontact Type of an X-Ray Investigating Apparatus and a Method for Investigating an Article with the Same | |
| JP7407629B2 (en) | Non-destructive testing equipment | |
| JP7401232B2 (en) | Non-destructive testing equipment | |
| KR102528246B1 (en) | A System for Investigating a Total Electrode Condition of a Battery | |
| KR102270832B1 (en) | An X-ray Apparatus for Detecting a Flaw of an Object with a Structure of Multi-Investigating Point and Multi-Exit Passage | |
| WO2019182435A1 (en) | Apparatus and method for filling carrier tapes with electronic components | |
| JP7485543B2 (en) | Non-destructive Inspection Equipment | |
| JP7382773B2 (en) | Radiation inspection equipment | |
| KR200416589Y1 (en) | Automatic Inspecting Apparatus for O-Ring | |
| JP7466362B2 (en) | Non-destructive Inspection Equipment | |
| JP7219148B2 (en) | Inspection system and method for driving inspection system | |
| KR20220013698A (en) | Secondary battery manufacturing system having an overhang inspection device for secondary batteries | |
| JP7267886B2 (en) | Radiographic inspection equipment | |
| JP2023047534A (en) | Radiation inspection device | |
| JP2022136511A (en) | Radiation inspection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20221212 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230929 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20231003 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20231130 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20231205 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20231219 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7407629 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |