JP7192317B2 - encoder - Google Patents

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JP7192317B2
JP7192317B2 JP2018164365A JP2018164365A JP7192317B2 JP 7192317 B2 JP7192317 B2 JP 7192317B2 JP 2018164365 A JP2018164365 A JP 2018164365A JP 2018164365 A JP2018164365 A JP 2018164365A JP 7192317 B2 JP7192317 B2 JP 7192317B2
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magnet
rotating shaft
scale plate
hub
axis
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JP2020038081A (en
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雄二 松添
智晴 中山
寛之 松本
裕丈 久間
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Fuji Electric Co Ltd
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Fuji Electric Co Ltd
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Priority to DE102019119834.8A priority patent/DE102019119834B4/en
Priority to CN201910680862.6A priority patent/CN110873579A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/142—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices
    • G01D5/145—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices influenced by the relative movement between the Hall device and magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/264—Mechanical constructional elements therefor ; Mechanical adjustment thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
    • G01D5/2454—Encoders incorporating incremental and absolute signals
    • G01D5/2458—Encoders incorporating incremental and absolute signals with incremental and absolute tracks on separate encoders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/42—Devices characterised by the use of electric or magnetic means
    • G01P3/44—Devices characterised by the use of electric or magnetic means for measuring angular speed
    • G01P3/48—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage
    • G01P3/481—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage of pulse signals
    • G01P3/487—Devices characterised by the use of electric or magnetic means for measuring angular speed by measuring frequency of generated current or voltage of pulse signals delivered by rotating magnets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/3473—Circular or rotary encoders

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)

Description

本発明はエンコーダに関する。 The present invention relates to encoders.

従来、回転符号板（スリット板）やリング状磁石の回転を回路基板に設けられた光学センサや磁気センサにより検出し、測定対象の多回転量（回転数等）や一回転中の回転位置（回転角度）を検出可能なエンコーダが知られている（例えば、特許文献１参照）。 Conventionally, the rotation of a rotation code plate (slit plate) or a ring-shaped magnet is detected by an optical sensor or a magnetic sensor provided on a circuit board, and the amount of multiple rotations (number of rotations, etc.) of the object to be measured and the rotation position during one rotation ( An encoder capable of detecting a rotation angle is known (see, for example, Patent Document 1).

特開２０１１－４７７６５号公報JP 2011-47765 A

しかしながら、特許文献１では、回路基板上において、測定対象の回転軸に対してリング状磁石の半径に相当する距離だけ離れた位置に複数の磁気センサが分散して配置される。そのため、磁気センサの配置に起因して、配線の配索や他の電気・電子部品の配置に制約が生じ、回路基板への電気・電子部品や配線等の実装面積が相対的に増大する可能性がある。 However, in Patent Document 1, a plurality of magnetic sensors are dispersedly arranged on a circuit board at positions separated by a distance corresponding to the radius of the ring-shaped magnet with respect to the rotating shaft to be measured. Therefore, due to the placement of the magnetic sensor, there are restrictions on the placement of wiring and the placement of other electrical and electronic components, and the mounting area for electrical and electronic components and wiring on the circuit board may increase relatively. have a nature.

そこで、上記課題に鑑み、回路基板への電気・電子部品や配線等の実装面積を抑制することが可能なエンコーダを提供することを目的とする。 Therefore, in view of the above problems, it is an object of the present invention to provide an encoder capable of suppressing the mounting area of electrical/electronic components, wiring, etc. on a circuit board.

上記目的を達成するため、本発明の一実施形態では、
測定対象の回転軸の一端に取り付けられるハブ部と、
前記回転軸に沿う方向から見て、前記ハブ部の前記回転軸と反対側の端面における前記回転軸の軸心を含む領域に取り付けられ、前記回転軸に垂直な方向で異なる磁極が着磁された磁石と、
前記回転軸に沿う方向で前記磁石と対向して配置され、前記磁石による磁場を検出する磁気センサと、
前記ハブ部の前記回転軸と反対側の端面に載置され、回転位置に応じて所定の照射光を所定のパターンで反射又は透過するパターン情報を有するスケール板と、
前記スケール板から反射又は透過される前記照射光を受光し、前記パターン情報を検出する受光部と、を備え、
前記スケール板は、前記回転軸に沿う方向から見て、前記ハブ部の前記領域に対応する中央部が切り欠かれ、
前記回転軸に沿う方向から見て、前記スケール板における切り欠かれた前記中央部に対応する内縁、及び、前記磁石の外縁の何れか一方に凸部が設けられ、何れか他方に前記凸部に対応する凹部が設けられる、
エンコーダが提供される。

To achieve the above object, in one embodiment of the present invention,
a hub portion attached to one end of a rotating shaft to be measured;
When viewed from the direction along the rotating shaft, it is attached to a region including the center of the rotating shaft on the end surface of the hub portion opposite to the rotating shaft, and is magnetized with different magnetic poles in the direction perpendicular to the rotating shaft. a magnet and
a magnetic sensor disposed facing the magnet in a direction along the rotation axis and detecting a magnetic field generated by the magnet;
a scale plate mounted on the end surface of the hub portion opposite to the rotation shaft and having pattern information for reflecting or transmitting a predetermined pattern of irradiation light according to the rotational position;
a light receiving unit that receives the irradiation light reflected or transmitted from the scale plate and detects the pattern information ;
the scale plate has a notched central portion corresponding to the region of the hub portion when viewed from the direction along the rotation axis;
When viewed from the direction along the rotation axis, a convex portion is provided on one of an inner edge corresponding to the notched central portion of the scale plate and an outer edge of the magnet, and the convex portion is provided on the other. is provided with a recess corresponding to
An encoder is provided.

上述の実施形態によれば、回路基板への電気・電子部品や配線等の実装面積を抑制することが可能なエンコーダを提供することができる。 According to the above-described embodiments, it is possible to provide an encoder capable of reducing the mounting area for electrical/electronic components, wiring, and the like on a circuit board.

第１実施形態に係るアブソリュートエンコーダの一例を示す図である。It is a figure which shows an example of the absolute encoder which concerns on 1st Embodiment. 第１実施形態に係るアブソリュートエンコーダにおける磁石の配置部分の断面を拡大して示す拡大断面図である。3 is an enlarged cross-sectional view showing an enlarged cross-section of a portion where magnets are arranged in the absolute encoder according to the first embodiment; FIG. 第１実施形態に係るアブソリュートエンコーダの他の例を示す図である。FIG. 4 is a diagram showing another example of the absolute encoder according to the first embodiment; FIG. 第２実施形態に係るアブソリュートエンコーダの一例を示す図である。It is a figure which shows an example of the absolute encoder which concerns on 2nd Embodiment. 第２実施形態に係るアブソリュートエンコーダの磁石及びスケール板の構造を示す図である。FIG. 10 is a diagram showing the structure of a magnet and a scale plate of an absolute encoder according to a second embodiment;

以下、図面を参照して発明を実施するための形態について説明する。 BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, embodiments for carrying out the invention will be described with reference to the drawings.

＜第１実施形態＞
最初に、本発明の第１実施形態について説明する。 <First embodiment>
First, a first embodiment of the invention will be described.

［アブソリュートエンコーダの構成及び構造］
まず、図１、図２を参照して、本実施形態に係るアブソリュートエンコーダ１００の構成及び構造等について説明する。 [Configuration and structure of absolute encoder]
First, the configuration, structure, etc. of an absolute encoder 100 according to the present embodiment will be described with reference to FIGS. 1 and 2. FIG.

図１は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す図である。具体的には、図１（Ａ）は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す平面図であり、図１（Ｂ）は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す側面断面図（図１（Ａ）のＡ－Ａ断面図）である。図２は、本実施形態に係るアブソリュートエンコーダ１００における磁石１３０の配置部分を拡大して示す拡大断面図である。具体的には、図２は、図１（Ｂ）の側面視断面図における磁石１３０の配置部分を拡大して示す拡大断面図である。以下、後述の第２実施形態も含め、図中の三次元直交座標系（ＸＹＺ座標系）を適宜用いて説明を行い、便宜的に、Ｚ軸の正方向（以下、「Ｚ軸正方向」）を"上"、Ｚ軸の負方向（以下、「Ｚ軸負方向」）を"下"と称する場合がある。また、Ｘ軸の正方向及び負方向、Ｙ軸の正方向及び負方向、並びに、Ｚ軸の正方向及び負方向のそれぞれを、総括的に、"Ｘ軸方向"、"Ｙ軸方向"、及び、"Ｚ軸方向"と称する場合がある。 FIG. 1 is a diagram showing an example of an absolute encoder 100 according to this embodiment. Specifically, FIG. 1A is a plan view showing an example of the absolute encoder 100 according to this embodiment, and FIG. 1B is a side sectional view showing an example of the absolute encoder 100 according to this embodiment. FIG. 1(A) is a sectional view taken along the line AA in FIG. FIG. 2 is an enlarged cross-sectional view showing an enlarged portion where the magnet 130 is arranged in the absolute encoder 100 according to this embodiment. Specifically, FIG. 2 is an enlarged cross-sectional view showing an enlarged portion where the magnet 130 is arranged in the cross-sectional side view of FIG. 1(B). Hereinafter, the three-dimensional orthogonal coordinate system (XYZ coordinate system) in the drawings will be used as appropriate for description, including the second embodiment described later. ) is sometimes called “up”, and the negative direction of the Z-axis (hereinafter, “Z-axis negative direction”) is sometimes called “down”. In addition, the positive and negative directions of the X-axis, the positive and negative directions of the Y-axis, and the positive and negative directions of the Z-axis are collectively referred to as "X-axis direction", "Y-axis direction", And it may be called "Z-axis direction".

尚、図１（Ａ）において、基板１４０、並びに、基板１４０に搭載される光学モジュール１５０及びホールＩＣ（Integrated Circuit）１６０等は、ハブ１１０、スケール板１２０、及び磁石１３０等がＺ軸正方向、つまり、上から露出して見えるように一点鎖線で表されている。また、図１において、アブソリュートエンコーダ１００の構成要素を収容する筐体（ケース）は、省略されている。以下、後述の図３、図４についても同様である。 In FIG. 1A, the substrate 140, and the optical module 150 and the Hall IC (Integrated Circuit) 160 mounted on the substrate 140 are configured such that the hub 110, the scale plate 120, the magnet 130, etc. , that is, represented by a dashed line so that it appears exposed from above. Also, in FIG. 1, a housing (case) that houses the components of the absolute encoder 100 is omitted. The same applies to FIGS. 3 and 4, which will be described later.

本実施形態に係るアブソリュートエンコーダ１００（エンコーダの一例）は、ハブ１１０と、スケール板１２０（スリット板）と、磁石１３０と、基板１４０と、光学モジュール１５０と、ホールＩＣ１６０を含む。 An absolute encoder 100 (an example of an encoder) according to this embodiment includes a hub 110, a scale plate 120 (slit plate), a magnet 130, a substrate 140, an optical module 150, and a Hall IC 160.

ハブ１１０（ハブ部の一例）は、アブソリュートエンコーダ１００による多回転量（例えば、回転数）や一回転中の回転位置（回転角度）等の測定対象（例えば、回転式のサーボモータ等）の回転軸２００の一端に取り付けられる。 A hub 110 (an example of a hub portion) measures the rotation of an object (for example, a rotary servomotor, etc.) to be measured by the absolute encoder 100, such as the amount of multiple rotations (for example, the number of rotations) and the rotational position (rotational angle) during one rotation. It is attached to one end of shaft 200 .

例えば、ハブ１１０は、回転軸２００に沿う方向（Ｚ軸方向）から見て、つまり、平面視で、回転軸２００の外径よりも大きな外径を有する略円柱形状を有する。ハブ１１０のＺ軸負方向側の端面（つまり、下側の端面）の軸心位置付近の領域には、ハブ１１０と同軸で、且つ、回転軸２００の外径と略同じ（実際上は、回転軸２００の外径よりも若干大きい）内径を有する窪み部が設けられる。当該窪み部には、ハブ１１０の軸心と回転軸２００の軸心２００ＡＸとが一致する態様で、回転軸２００が嵌挿される。また、ハブ１１０の軸心位置には、両端面の間を貫通するねじ孔が設けられ、ハブ１１０のＺ軸正方向側の端面（つまり、上側の端面）から下側の端面の窪み部に嵌挿された回転軸２００に対して、雄ねじ１１５が螺合されることにより、ハブ１１０は、回転軸２００に取り付けられる。これにより、ハブ１１０は、測定対象の回転軸２００の回転に伴い、一体として回転する。 For example, hub 110 has a substantially cylindrical shape with an outer diameter larger than the outer diameter of rotating shaft 200 when viewed from the direction along rotating shaft 200 (the Z-axis direction), that is, when viewed from above. In a region near the axial position of the end face of the hub 110 on the Z-axis negative direction side (that is, the lower end face), there is provided an area coaxial with the hub 110 and substantially the same outer diameter as the rotating shaft 200 (actually, A recess is provided having an inner diameter that is slightly larger than the outer diameter of the rotating shaft 200 . Rotating shaft 200 is fitted into the recess in such a manner that the axis of hub 110 and the axis 200AX of rotating shaft 200 are aligned. In addition, a threaded hole is provided at the axial position of hub 110 so as to penetrate between both end faces. The hub 110 is attached to the rotating shaft 200 by screwing the external thread 115 onto the inserted rotating shaft 200 . As a result, the hub 110 rotates together with the rotation of the rotating shaft 200 to be measured.

また、ハブ１１０の上側の端面の軸心位置付近の領域には、図２に示すように、ハブ１１０と同軸（即ち、回転軸２００と同軸）で、且つ、後述する磁石１３０の円柱形状の外径と略同じ（実際上は、磁石１３０の外径よりも若干大きい）内径を有する窪み部１１１が設けられる。つまり、上述のねじ孔は、窪み部１１１の底面と、回転軸２００が嵌挿される、上述したハブ１１０の下側の端面の窪み部の底面との間を貫通している。このとき、当該ねじ穴の内径は、磁石１３０の外径、つまり、窪み部１１１の内径よりも小さい。また、雄ねじ１１５は、頭部の外径が窪み部１１１の内径より小さく、且つ、平面状の頭頂部を有する。雄ねじ１１５は、例えば、平ねじであってよい。これにより、平面視で、雄ねじ１１５の頭部を窪み部１１１に収めることができると共に、雄ねじ１１５の頭頂部と、窪み部１１１の底面とを同一平面に揃える、つまり、面一の状態にし、後述の如く、雄ねじ１１５の頭頂部の上に磁石１３０を配置することができる。 In addition, as shown in FIG. 2, in a region near the axial position of the upper end face of the hub 110, there is provided a cylindrical magnet 130 coaxial with the hub 110 (that is, coaxial with the rotating shaft 200) and a magnet 130 to be described later. A recess 111 is provided having an inner diameter approximately the same as the outer diameter (in practice, slightly larger than the outer diameter of magnet 130). That is, the screw hole described above penetrates between the bottom surface of the recessed portion 111 and the bottom surface of the recessed portion of the lower end surface of the hub 110 into which the rotating shaft 200 is inserted. At this time, the inner diameter of the screw hole is smaller than the outer diameter of the magnet 130 , that is, the inner diameter of the recess 111 . In addition, the male screw 115 has a head having an outer diameter smaller than the inner diameter of the recess 111 and has a planar top. External threads 115 may be, for example, flat threads. As a result, the head of the male screw 115 can be accommodated in the recessed portion 111 in a plan view, and the top of the male screw 115 and the bottom surface of the recessed portion 111 are aligned on the same plane. A magnet 130 may be placed on top of the male thread 115 as described below.

スケール板１２０は、例えば、嫌気性の接着材等を用いて、ハブ１１０の回転軸２００が取り付けられる側の端面とは反対側の端面、つまり、上側の端面に取り付けられる。スケール板１２０は、例えば、ガラス製である。また、スケール板１２０は、金属製であってもよい。具体的には、スケール板１２０は、円板形状を有し、その中央部が切り欠かれ、貫通孔１２１が設けられると共に、平面視で、その中心が回転軸２００の軸心２００ＡＸに一致するように、配置される。また、スケール板１２０のＺ軸正方向側の面（つまり、上面）には、その外周（外縁）付近における異なる半径位置の全周に亘って、インクリメンタルパターン１２２及びアブソリュートパターン１２３が設けられる。 The scale plate 120 is attached to the end surface of the hub 110 opposite to the side to which the rotating shaft 200 is attached, that is, to the upper end surface using, for example, an anaerobic adhesive. The scale plate 120 is made of glass, for example. Also, the scale plate 120 may be made of metal. Specifically, the scale plate 120 has a disk shape, is notched at the center, and is provided with a through hole 121, and its center coincides with the axis 200AX of the rotation shaft 200 in a plan view. are placed so that Also, on the surface of the scale plate 120 in the positive direction of the Z-axis (that is, the upper surface), an incremental pattern 122 and an absolute pattern 123 are provided over the entire circumference at different radial positions near the outer periphery (outer edge).

インクリメンタルパターン１２２（パターン情報の一例）は、スケール板１２０の回転位置に応じて、光学モジュール１５０からの照射光を、任意の角度位置からの回転角度（つまり、相対角度）を表す所定のパターンで反射する。インクリメンタルパターン１２２は、例えば、照射光を反射する複数の反射部が周方向に等間隔に、且つ、それぞれの反射部の間に非反射部（或いは、反射部よりも反射率が低い低反射率部）が挟まれるように配置される。インクリメンタルパターン１２２の反射部、及び、非反射部或いは低反射率部は、例えば、既知のフォトエッチング加工により形成される。以下、アブソリュートパターン１２３の反射部、及び、非反射部或いは低反射率部についても同様である。 Incremental pattern 122 (an example of pattern information) is a predetermined pattern representing a rotation angle (i.e., relative angle) from an arbitrary angular position of irradiation light from optical module 150 according to the rotational position of scale plate 120 . reflect. The incremental pattern 122 includes, for example, a plurality of reflecting portions that reflect irradiation light at equal intervals in the circumferential direction, and a non-reflecting portion (or a low-reflecting portion having a lower reflectance than the reflecting portion) between the reflecting portions. part) are placed in between. The reflective portions and non-reflective or low-reflectance portions of the incremental pattern 122 are formed, for example, by a known photoetching process. Hereinafter, the same applies to the reflective portion and the non-reflective portion or low reflectance portion of the absolute pattern 123 .

アブソリュートパターン１２３（パターン情報の一例）は、スケール板１２０の回転位置に応じて、光学モジュール１５０からの照射光を、回転角度の絶対位置を表す所定のパターンで反射する。アブソリュートパターン１２３は、例えば、スケール板１２０の角度位置に応じて、所定のビット数（例えば、９ビット）のＭ系列コードを表す複数の反射部が周方向に配置される。このとき、アブソリュートパターン１２３の周方向における反射部同士の間には、非反射部或いは低反射率部が配置される。 The absolute pattern 123 (an example of pattern information) reflects the irradiation light from the optical module 150 in a predetermined pattern representing the absolute position of the rotation angle according to the rotation position of the scale plate 120 . The absolute pattern 123 has, for example, a plurality of reflection portions representing an M-sequence code of a predetermined number of bits (for example, 9 bits) arranged in the circumferential direction according to the angular position of the scale plate 120 . At this time, a non-reflecting portion or a low reflectance portion is arranged between the reflecting portions in the circumferential direction of the absolute pattern 123 .

磁石１３０は、回転軸２００の軸心２００ＡＸ、つまり、Ｚ軸に垂直な方向（図１では、Ｙ軸方向）で異なる磁極、つまり、Ｓ極及びＮ極が着磁されている。具体的には、磁石１３０は、Ｚ軸方向、つまり、上下方向に延設される略円柱形状を有し、Ｙ軸正方向側及びＹ軸負方向側に区分される半円柱形状のＳ極部１３０Ａ及びＮ極部１３０Ｂを含む。 The magnet 130 is magnetized with different magnetic poles, that is, the S pole and the N pole, in the direction perpendicular to the axis 200AX of the rotating shaft 200, that is, the Z axis (the Y axis direction in FIG. 1). Specifically, the magnet 130 has a substantially cylindrical shape extending in the Z-axis direction, that is, in the vertical direction, and has a semi-cylindrical S pole divided into the Y-axis positive direction side and the Y-axis negative direction side. It includes a portion 130A and a north pole portion 130B.

例えば、磁石１３０は、図２に示すように、ハブ１１０の上側の端面の窪み部１１１に嵌挿される態様で配置される。具体的には、窪み部１１１の底面に液状の接着剤１３５が適量塗布された状態で、その上に、磁石１３０が載置される。このとき、接着剤１３５は、例えば、嫌気性（つまり、空気との接触を抑制することで固まる性質）、及び、紫外線硬化性（つまり、紫外線が照射されることで固まる性質）を有する。これにより、磁石１３０の下端面と窪み部１１１の底面との間の領域から磁石１３０の側面と窪み部１１１の側面との間まで液状の接着剤１３５が広がり、その一部が窪み部１１１の上端よりも上まで露出する（露出部１３５Ａ）。そのため、磁石１３０が、液状の接着剤１３５が底面に塗布された窪み部１１１に載置された後に、磁石１３０の上方から紫外線が照射されることで、接着剤１３５のうちの露出部１３５Ａが固められ、磁石１３０が仮固定される。そして、接着剤１３５のうちの露出部１３５Ａ以外の部分は、その嫌気性の作用により、所定の時間をかけて固まる。よって、磁石１３０の接着剤１３５が完全に固定されていない状態であっても、露出部１３５Ａの硬化により、検査工程等において、ハブ１１０を回転させて、各種検査を行うことができる。また、紫外線が照射されない限り、接着剤１３５の嫌気性の作用によって、露出部１３５Ａが直ぐに固まることはないため、磁石１３０が窪み部１１１の中に載置（嵌挿）された後であっても、磁石１３０の周方向での位置合わせ等を行うことができる。 For example, as shown in FIG. 2, the magnet 130 is arranged in such a manner as to be inserted into the recessed portion 111 of the upper end face of the hub 110 . Specifically, an appropriate amount of liquid adhesive 135 is applied to the bottom surface of the recessed portion 111, and the magnet 130 is placed thereon. At this time, the adhesive 135 has, for example, anaerobic properties (that is, properties that harden by suppressing contact with air) and ultraviolet curing properties (that is, properties that harden when irradiated with ultraviolet rays), for example. As a result, the liquid adhesive 135 spreads from the region between the lower end surface of the magnet 130 and the bottom surface of the recess 111 to between the side surface of the magnet 130 and the side surface of the recess 111 , and a part of the adhesive 135 spreads over the recess 111 . It is exposed above the upper end (exposed portion 135A). Therefore, after the magnet 130 is placed in the recessed portion 111 having the liquid adhesive 135 applied to the bottom surface, the exposed portion 135A of the adhesive 135 is exposed by irradiating ultraviolet rays from above the magnet 130. It hardens and the magnet 130 is temporarily fixed. Then, the portion of the adhesive 135 other than the exposed portion 135A hardens over a predetermined period of time due to its anaerobic action. Therefore, even if the adhesive 135 of the magnet 130 is not completely fixed, various inspections can be performed by rotating the hub 110 in an inspection process or the like due to hardening of the exposed portion 135A. Further, unless the ultraviolet rays are irradiated, the exposed portion 135A does not immediately harden due to the anaerobic action of the adhesive 135. Also, alignment of the magnet 130 in the circumferential direction can be performed.

尚、磁石１３０は、Ｚ軸に垂直な方向で異なる磁極を有する限り、円柱形状以外の形状であってもよい。 Note that the magnet 130 may have a shape other than a cylindrical shape as long as it has different magnetic poles in the direction perpendicular to the Z-axis.

基板１４０は、例えば、円板形状を有し、ハブ１１０（スケール板１２０及び磁石１３０等）からＺ軸正方向、つまり、上方向に所定の距離だけ離れた位置において、回転軸２００の軸心２００ＡＸと垂直に、即ち、スケール板１２０と平行に配置される。また、基板１４０は、円板形状の軸心が回転軸２００の軸心２００ＡＸと一致するように配置される。具体的には、基板１４０は、アブソリュートエンコーダ１００の構成要素を収容する図示しないケースに固定される。つまり、基板１４０は、回転軸２００と共に回転しないため、基板１４０に実装される各種センサ（例えば、光学モジュール１５０やホールＩＣ１６０等）は、回転軸２００と共に回転するスケール板１２０や磁石１３０の回転状態を観測できる。基板１４０は、例えば、ＦＲ－４（Flame Retardant type 4）規格の配線基板である。基板１４０には、光学モジュール１５０及びホールＩＣ１６０が実装される。また、基板１４０には、その他、光学モジュール１５０やホールＩＣ１６０に接続され、一回転中の回転位置や多回転量（回転数）等を検出する各種処理を行う電子部品（電子回路）や、基板１４０に実装される電子部品を駆動する電源ＩＣ等の電気部品が実装される。 The substrate 140 has, for example, a disc shape, and is located at a position apart from the hub 110 (the scale plate 120, the magnet 130, etc.) in the Z-axis positive direction, that is, upward by a predetermined distance. It is arranged perpendicular to 200AX, that is, parallel to the scale plate 120 . Further, the substrate 140 is arranged so that the axis of the disk shape coincides with the axis 200AX of the rotating shaft 200 . Specifically, the substrate 140 is fixed to a case (not shown) that houses the components of the absolute encoder 100 . In other words, since the substrate 140 does not rotate together with the rotating shaft 200, the various sensors mounted on the substrate 140 (for example, the optical module 150, the Hall IC 160, etc.) cannot detect the rotating state of the scale plate 120 and the magnet 130 that rotate together with the rotating shaft 200. can be observed. The substrate 140 is, for example, an FR-4 (Flame Retardant type 4) standard wiring substrate. An optical module 150 and a Hall IC 160 are mounted on the substrate 140 . The substrate 140 also includes electronic components (electronic circuits) connected to the optical module 150 and the Hall IC 160 and performing various processes such as detecting the rotational position during one rotation and the amount of multiple rotations (number of rotations). An electric component such as a power supply IC for driving the electronic component mounted on 140 is mounted.

光学モジュール１５０（受光部の一例）は、基板１４０のＺ軸負方向側の面、つまり、下面において、スケール板１２０のインクリメンタルパターン１２２及びアブソリュートパターン１２３に対応するように、回転軸２００の軸心２００ＡＸを中心とする半径位置に設けられる。具体的には、光学モジュール１５０は、スケール板１２０に向けて光を照射する発光素子と、インクリメンタルパターン１２２やアブソリュートパターン１２３の反射部で反射された反射光を受光する受光素子を含む。このとき、発光素子は、例えば、ＬＥＤ（Light Emitting Diode）であり、受光素子は、例えば、フォトダイオード（Photo Diode）である。また、光学モジュール１５０の受光素子は、インクリメンタルパターン１２２に対応する反射光を受光する受光素子と、アブソリュートパターン１２３に対応する反射光を受光する受光素子とを含む。 The optical module 150 (an example of a light-receiving unit) is arranged on the surface of the substrate 140 in the negative Z-axis direction, that is, the lower surface, so as to correspond to the incremental pattern 122 and the absolute pattern 123 of the scale plate 120. They are provided at radial positions around 200AX. Specifically, the optical module 150 includes a light-emitting element that emits light toward the scale plate 120 and a light-receiving element that receives reflected light reflected by the reflecting portions of the incremental pattern 122 and the absolute pattern 123 . At this time, the light emitting element is, for example, an LED (Light Emitting Diode), and the light receiving element is, for example, a photo diode. The light receiving elements of the optical module 150 include light receiving elements that receive reflected light corresponding to the incremental pattern 122 and light receiving elements that receive reflected light corresponding to the absolute pattern 123 .

ホールＩＣ１６０（磁気センサの一例）は、基板１４０の下面において、Ｚ軸方向で磁石１３０と対向する位置、つまり、平面視で、回転軸２００の軸心２００ＡＸを含む領域に実装され、磁石１３０のＳ極及びＮ極の間で生成される磁場を検出する磁気センサである。例えば、ホールＩＣ１６０は、複数（例えば、４個）のホール素子を含み、それぞれのホール素子が、回転軸２００の一回転中に磁石１３０のＳ極及びＮ極の間で生成される、異なる方向の磁場を検出可能に構成される。これにより、ホールＩＣ１６０は、回転軸２００の回転に伴う磁石１３０のＳ極及びＮ極の間の磁場の変化に応じた検出信号を複数のホール素子から出力することができるため、後段の検出回路において、回転軸２００の回転数等が検出されうる。 Hall IC 160 (an example of a magnetic sensor) is mounted on the lower surface of substrate 140 at a position facing magnet 130 in the Z-axis direction, that is, in a region including axis 200AX of rotating shaft 200 in plan view. A magnetic sensor that detects the magnetic field generated between south and north poles. For example, the Hall IC 160 includes a plurality (eg, four) of Hall elements, each of which is generated between the south and north poles of the magnet 130 during one rotation of the rotating shaft 200. is configured to be able to detect the magnetic field of As a result, the Hall IC 160 can output, from a plurality of Hall elements, detection signals corresponding to changes in the magnetic field between the S and N poles of the magnet 130 as the rotating shaft 200 rotates. , the number of revolutions of the rotating shaft 200 and the like can be detected.

尚、回転軸２００の回転に伴う磁石１３０のＳ極及びＮ極の間の磁場（磁界の向き）の変化を検出可能であれば、ホールＩＣ１６０に代えて、他の種類の磁気センサが採用されてもよい。 Note that other types of magnetic sensors may be employed instead of the Hall IC 160 as long as they can detect changes in the magnetic field (direction of the magnetic field) between the S and N poles of the magnet 130 as the rotary shaft 200 rotates. may

［作用］
次に、引き続き、図１、図２を参照して、本実施形態に係るアブソリュートエンコーダ１００の作用について説明する。 [Action]
Next, the operation of the absolute encoder 100 according to this embodiment will be described with reference to FIGS. 1 and 2. FIG.

本実施形態では、アブソリュートエンコーダ１００は、回転軸２００に沿う方向から見て（つまり、平面視で）、ハブ１１０の回転軸２００と反対側の端面（つまり、上側の端面）における回転軸２００の軸心２００ＡＸを含む領域（つまり、円柱形状のハブ１１０の軸心位置付近の領域）に取り付けられ、回転軸２００に垂直な方向で異なる磁極が着磁される磁石１３０を備える。そして、アブソリュートエンコーダ１００は、複数のホール素子を含むホールＩＣ１６０であって、磁石１３０と対向して配置され、磁石１３０による磁場を検出するホールＩＣ１６０を備える。 In the present embodiment, the absolute encoder 100 is positioned on the end surface of the hub 110 opposite to the rotation shaft 200 (that is, the upper end surface) when viewed from the direction along the rotation shaft 200 (that is, in a plan view). A magnet 130 attached to an area including the axis 200AX (that is, an area near the axis position of the cylindrical hub 110) and magnetized with different magnetic poles in the direction perpendicular to the rotating shaft 200 is provided. The absolute encoder 100 includes a Hall IC 160 that includes a plurality of Hall elements, is arranged to face the magnet 130 , and detects the magnetic field generated by the magnet 130 .

例えば、上述の特許文献１では、回路基板上において、測定対象の回転軸に対してリング状磁石の半径に相当する距離だけ離れた位置に複数の磁気センサが分散して配置される。そのため、磁気センサの配置に起因して、配線の配索や他の電気・電子部品の配置に制約が生じ、回路基板への電気・電子部品や配線等の実装面積が相対的に増大する可能性がある。 For example, in Patent Document 1 mentioned above, a plurality of magnetic sensors are dispersedly arranged on a circuit board at positions separated by a distance corresponding to the radius of the ring-shaped magnet with respect to the rotating shaft to be measured. Therefore, due to the placement of the magnetic sensor, there are restrictions on the placement of wiring and the placement of other electrical and electronic components, and the mounting area for electrical and electronic components and wiring on the circuit board may increase relatively. have a nature.

これに対して、本実施形態では、測定対象の回転数等を検出するための磁気センサとしてのホールＩＣ１６０を基板１４０における回転軸２００の軸心２００ＡＸに対応する中央領域に集約して配置させることができる。そのため、磁気センサの配置に起因する、配線の配索や他の電気・電子部品の配置に対する制約を緩和し、基板１４０への電気・電子部品や配線等の実装面積の増大を抑制することができる。そのため、例えば、基板１４０の層数を減少させたり、ＩＶＨ（Interstitial Via Hole）の代わりに、スルーホールを採用したり等し、アブソリュートエンコーダ１００の実装コストを抑制することができる。 On the other hand, in the present embodiment, Hall ICs 160 as magnetic sensors for detecting the number of revolutions of the object to be measured are collectively arranged in the central region corresponding to the axis 200AX of the rotating shaft 200 on the substrate 140. can be done. Therefore, it is possible to alleviate the restrictions on the arrangement of wiring and the arrangement of other electric/electronic components due to the arrangement of the magnetic sensor, and suppress the increase in the mounting area of the electric/electronic components, wiring, etc. on the substrate 140. can. Therefore, for example, the number of layers of the substrate 140 can be reduced, or through holes can be used instead of IVHs (Interstitial Via Holes), thereby reducing the mounting cost of the absolute encoder 100 .

また、本実施形態では、ハブ１１０の上側の端面における軸心位置付近の領域には、窪み部１１１が設けられ、磁石１３０は、窪み部１１１に配置（嵌挿）される。 Further, in the present embodiment, a depression 111 is provided in a region near the axial position on the upper end surface of the hub 110 , and the magnet 130 is arranged (inserted) in the depression 111 .

これにより、製造ライン等において、窪み部１１１に磁石１３０を配置するだけで、ハブ１１０の上端面における（つまり、ＸＹ平面上における）磁石１３０の位置決めを行うことができるため、生産性を向上させることができる。また、接着剤１３５が窪み部１１１に塗布されるため、接着剤１３５がハブ１１０の上側の端面に広くはみ出してしまうような事態を抑制することができる。 As a result, the magnet 130 can be positioned on the upper end surface of the hub 110 (that is, on the XY plane) simply by arranging the magnet 130 in the recess 111 in a manufacturing line or the like, thereby improving productivity. be able to. Moreover, since the adhesive 135 is applied to the recessed portion 111 , it is possible to prevent the adhesive 135 from protruding widely over the upper end face of the hub 110 .

尚、本実施形態のアブソリュートエンコーダ１００は、構造が簡略化され、ハブ１１０の窪み部１１１は、省略されてもよい。 It should be noted that the absolute encoder 100 of this embodiment may have a simplified structure and the recessed portion 111 of the hub 110 may be omitted.

例えば、図３は、本実施形態に係るアブソリュートエンコーダ１００の他の例、つまり、ハブ１１０の窪み部１１１が省略される具体例である。具体的には、図３（Ａ）は、本実施形態に係るアブソリュートエンコーダ１００の他の例を示す平面図であり、図３（Ｂ）は、本実施形態に係るアブソリュートエンコーダ１００の他の例を示す側面断面図（図３（Ａ）のＡ－Ａ断面図）である。 For example, FIG. 3 shows another example of the absolute encoder 100 according to this embodiment, that is, a specific example in which the recessed portion 111 of the hub 110 is omitted. Specifically, FIG. 3A is a plan view showing another example of the absolute encoder 100 according to this embodiment, and FIG. 3B is another example of the absolute encoder 100 according to this embodiment. 4 is a side cross-sectional view (cross-sectional view taken along the line AA in FIG. 3(A)).

本例の場合、図３（Ｂ）に示すように、ハブ１１０の上側の端面は、平面で構成され、磁石１３０は、当該平面における回転軸２００の軸心２００ＡＸに対応する領域に載置される。 In this example, as shown in FIG. 3B, the upper end surface of the hub 110 is a plane, and the magnet 130 is placed in a region corresponding to the axis 200AX of the rotating shaft 200 on the plane. be.

また、本実施形態では、磁石１３０は、紫外線硬化性及び嫌気性を有する接着剤１３５を用いて、ハブ１１０の上側の端面に固定される。 Also, in this embodiment, the magnet 130 is fixed to the upper end surface of the hub 110 using an adhesive 135 having ultraviolet curing and anaerobic properties.

これにより、磁石１３０を固定する接着剤が完全に固まっていない状態であっても、紫外線の照射による磁石１３０とハブ１１０との間から露出する接着剤の部分（例えば、露出部１３５Ａ）の硬化により、検査工程等において、回転軸２００を回転させて、各種検査を行うことができる。また、紫外線が照射されない限り、接着剤の嫌気性の作用によって、磁石１３０とハブ１１０との間から露出する接着剤の部分が直ぐに固まることはないため、磁石１３０が窪み部１１１の中に載置（嵌挿）された後であっても、磁石１３０の位置合わせ等を行うことができる。 As a result, even if the adhesive that fixes the magnet 130 is not completely hardened, the portion of the adhesive that is exposed between the magnet 130 and the hub 110 (for example, the exposed portion 135A) is cured by the ultraviolet irradiation. Accordingly, various inspections can be performed by rotating the rotating shaft 200 in an inspection process or the like. In addition, since the portion of the adhesive exposed between the magnet 130 and the hub 110 does not immediately harden due to the anaerobic action of the adhesive unless it is irradiated with ultraviolet rays, the magnet 130 is placed in the recess 111 . Alignment of the magnet 130 and the like can be performed even after the placement (insertion).

また、本実施形態では、ハブ１１０は、回転軸２００と反対側の端面（つまり、上側の端面）から回転軸２００に対して、平面状の頭頂部を有する雄ねじ１１５が螺合されることにより、回転軸２００に取り付けられる。そして、磁石１３０は、雄ねじ１１５の頭頂部の上に配置される。 Further, in this embodiment, the hub 110 is formed by screwing a male screw 115 having a planar top portion onto the rotating shaft 200 from the end surface opposite to the rotating shaft 200 (that is, the upper end surface). , is attached to the rotating shaft 200 . The magnet 130 is then placed on top of the male thread 115 .

これにより、ハブ１１０及び回転軸２００を軸方向で固定しつつ、磁石１３０をハブ１１０の上側の端面における回転軸２００の軸心２００ＡＸに対応する位置に配置することができる。 As a result, while the hub 110 and the rotating shaft 200 are fixed in the axial direction, the magnet 130 can be arranged on the upper end surface of the hub 110 at a position corresponding to the axis 200AX of the rotating shaft 200 .

＜第２実施形態＞
次いで、第２実施形態について説明する。 <Second embodiment>
Next, a second embodiment will be described.

本実施形態のアブソリュートエンコーダ１００は、スケール板１２０及び磁石１３０の構成及び構造等が第１実施形態と異なる。以下、第１実施形態と同一或いは対応する構成には、同一の符号を付し、第１実施形態と異なる部分を中心に説明する。 The absolute encoder 100 of this embodiment differs from that of the first embodiment in the configurations and structures of the scale plate 120 and the magnets 130 . In the following, the same reference numerals are assigned to the same or corresponding configurations as in the first embodiment, and the description will focus on the portions that differ from the first embodiment.

［アブソリュートエンコーダの構成及び構造］
まず、図４、図５を参照して、本実施形態に係るアブソリュートエンコーダ１００の構成及び構造等について説明する。 [Configuration and structure of absolute encoder]
First, the configuration, structure, etc. of the absolute encoder 100 according to the present embodiment will be described with reference to FIGS. 4 and 5. FIG.

図４は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す図である。具体的には、図４（Ａ）は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す平面図であり、図４（Ｂ）は、本実施形態に係るアブソリュートエンコーダ１００の一例を示す側面断面図（図４（Ａ）のＡ－Ａ断面図）である。図５は、本実施形態に係るアブソリュートエンコーダ１００の磁石１３０及びスケール板１２０の構造を示す図である。具体的には、図５（Ａ）は、磁石１３０の構造を示す平面図であり、図５（Ｂ）は、スケール板１２０の構造を示す平面図である。 FIG. 4 is a diagram showing an example of the absolute encoder 100 according to this embodiment. Specifically, FIG. 4A is a plan view showing an example of the absolute encoder 100 according to this embodiment, and FIG. 4B is a side sectional view showing an example of the absolute encoder 100 according to this embodiment. FIG. 4B is a cross-sectional view taken along the line AA in FIG. 4A. FIG. 5 is a diagram showing the structures of the magnet 130 and the scale plate 120 of the absolute encoder 100 according to this embodiment. Specifically, FIG. 5A is a plan view showing the structure of the magnet 130, and FIG. 5B is a plan view showing the structure of the scale plate 120. FIG.

尚、図５（Ｂ）では、便宜的に、インクリメンタルパターン１２２及びアブソリュートパターン１２３の図示が省略されている。 Incidentally, in FIG. 5B, illustration of the incremental pattern 122 and the absolute pattern 123 is omitted for the sake of convenience.

本実施形態に係るアブソリュートエンコーダ１００は、第１実施形態と同様、ハブ１１０と、スケール板１２０と、磁石１３０と、基板１４０と、光学モジュール１５０と、ホールＩＣ１６０を含む。 An absolute encoder 100 according to this embodiment includes a hub 110, a scale plate 120, a magnet 130, a substrate 140, an optical module 150, and a Hall IC 160, as in the first embodiment.

スケール板１２０は、図５（Ｂ）に示すように、平面視で、貫通孔１２１の内縁（内側面）における所定の周方向の位置から径方向の内側、つまり、回転軸２００の軸心２００ＡＸ（スケール板１２０の軸心）に向けて張り出した凸部１２４を含む。 As shown in FIG. 5B, the scale plate 120 extends radially inward from a predetermined circumferential position on the inner edge (inner side surface) of the through hole 121 in plan view, that is, the axis 200AX of the rotating shaft 200. It includes a protrusion 124 projecting toward (the axis of the scale plate 120).

磁石１３０は、図５（Ａ）に示すように、平面視で、円柱形状の側面（外縁）から径方向の内側、つまり、回転軸２００の軸心２００ＡＸ（磁石１３０の円柱形状の軸心）に向けてへこんでいる凹部１３１を含む。具体的には、凹部１３１は、平面視で、磁石１３０の側面（外縁）における極性が変化する周方向の位置に設けられている。 As shown in FIG. 5A, the magnet 130 is positioned radially inward from the side surface (outer edge) of the cylindrical shape in plan view, that is, the axis 200AX of the rotating shaft 200 (the axis of the cylindrical shape of the magnet 130). It includes a recess 131 that is recessed toward the . Specifically, the concave portion 131 is provided at a position in the circumferential direction where the polarity of the side surface (outer edge) of the magnet 130 changes in plan view.

スケール板１２０の凸部１２４、及び磁石１３０の凹部１３１は、対応している。つまり、ハブ１１０に搭載された状態において、スケール板１２０の凸部１２４は、磁石１３０の凹部１３１に係合するように、スケール板１２０の凸部１２４及び磁石１３０の凹部１３１のそれぞれが形成されている。これにより、例えば、ハブ１１０に先に搭載されるスケール板１２０に対して、回転軸２００の軸心２００ＡＸを基準とする磁石１３０の回転方向の適切な相対位置を実現しつつ、容易に、磁石１３０の搭載作業を行うことが可能になる。 The convex portion 124 of the scale plate 120 and the concave portion 131 of the magnet 130 correspond to each other. In other words, the projections 124 of the scale plate 120 and the recesses 131 of the magnets 130 are formed so that the projections 124 of the scale plate 120 are engaged with the recesses 131 of the magnets 130 when mounted on the hub 110 . ing. As a result, for example, the magnet 130 can be easily rotated while realizing an appropriate relative position in the rotation direction of the magnet 130 with respect to the axis 200AX of the rotation shaft 200 with respect to the scale plate 120 mounted on the hub 110 first. 130 can be installed.

尚、スケール板１２０に凹部が設けられ、磁石１３０に、スケール板１２０の凹部に係合する凸部が設けられる態様であってもよい。また、スケール板１２０の貫通孔１２１の内縁（内側面）に設けられる凸部１２４は、回転軸２００の軸心２００ＡＸを基準として、特定の周方向位置で径方向の内側に突出するように設けられる代わりに、例えば、周方向の所定範囲が弦状に張り出すように設けられてもよい。この場合、磁石１３０には、弦状の凹部１３１が設けられる。 Alternatively, the scale plate 120 may be provided with a concave portion, and the magnet 130 may be provided with a convex portion that engages with the concave portion of the scale plate 120 . The convex portion 124 provided on the inner edge (inner side surface) of the through hole 121 of the scale plate 120 is provided so as to protrude radially inward at a specific circumferential position with the axis 200AX of the rotating shaft 200 as a reference. Instead, for example, a predetermined range in the circumferential direction may be provided so as to protrude like a chord. In this case, the magnet 130 is provided with a chordal recess 131 .

［作用］
次に、引き続き、図４、図５を参照して、本実施形態に係るアブソリュートエンコーダ１００の作用について説明する。 [Action]
Next, the operation of the absolute encoder 100 according to this embodiment will be described with reference to FIGS. 4 and 5. FIG.

本実施形態では、スケール板１２０は、回転軸２００に沿う方向から見て、つまり、平面視で、ハブ１１０における軸心位置付近の領域に対応する中央部が切り欠かれて、貫通孔１２１が設けられる。そして、平面視で、スケール板１２０における切り欠かれた中央部に対応する内縁、つまり、貫通孔１２１の内縁（内側面）、及び、磁石１３０の外縁（側面）の何れか一方に凸部が設けられ、何れか他方に当該凸部に対応する凹部が設けられる。このとき、磁石１３０の外縁（側面）における凹部或いは凸部は、磁石１３０の磁極が切り替わる周方向の位置に設けられてよい。 In the present embodiment, the scale plate 120 has a notched central portion corresponding to an area in the vicinity of the axial center position of the hub 110 when viewed from the direction along the rotating shaft 200, that is, when viewed from above, so that the through hole 121 is formed. be provided. In a plan view, the inner edge corresponding to the notched central portion of the scale plate 120, that is, the inner edge (inner side surface) of the through hole 121 or the outer edge (side surface) of the magnet 130 has a convex portion. One of them is provided with a concave portion corresponding to the convex portion. At this time, the concave portion or convex portion on the outer edge (side surface) of the magnet 130 may be provided at a position in the circumferential direction where the magnetic pole of the magnet 130 is switched.

例えば、ホールＩＣ１６０を含む磁気系は、比較的低い消費電力で稼働可能であるため、何等かの理由で電力供給に問題が発生しても、測定対象の多回転量を検出し続けることが可能である。一方、光学モジュール１５０を含む光学系は、ある程度の消費電力を要するため、電力供給に問題が生じると、稼働できない。そのため、電力供給の問題が解消された場合に、それまでに磁気系で測定された多回転量に対して、以後、光学系で検出される一回転中の回転位置を繋げる態様で、測定が継続される必要がある。つまり、ホールＩＣ１６０により検出される測定対象の回転位置と、光学モジュール１５０（受光素子）により検出される測定対象の回転位置との間には、予め規定された関係が成立している必要がある。そのため、アブソリュートパターン１２３を有するスケール板１２０と、回転に伴う磁界変化を生じさせる磁石１３０との間には、回転軸２００の軸心２００ＡＸを基準として、回転方向での所定の相対的な位置関係が成立している必要がある。よって、当該位置関係が成立するように、当該凹部及び凸部が設けられることにより、当該位置関係を実現しつつ、容易に、磁石１３０の搭載作業を行うことができる。 For example, the magnetic system including the Hall IC 160 can operate with relatively low power consumption, so even if there is a problem with the power supply for some reason, it is possible to continue detecting the multi-rotation amount of the object to be measured. is. On the other hand, since the optical system including the optical module 150 requires a certain amount of power consumption, it cannot operate if there is a problem with the power supply. Therefore, when the power supply problem is solved, the measurement will be performed in such a manner that the rotational position detected by the optical system during one rotation is connected to the multiple rotation amount measured by the magnetic system up to that point. need to be continued. That is, a predetermined relationship must be established between the rotational position of the measurement object detected by the Hall IC 160 and the rotational position of the measurement object detected by the optical module 150 (light receiving element). . Therefore, there is a predetermined relative positional relationship in the direction of rotation between the scale plate 120 having the absolute pattern 123 and the magnet 130 that produces a magnetic field change with rotation, with the axis 200AX of the rotation shaft 200 as a reference. must be established. Therefore, by providing the concave portion and the convex portion so as to establish the positional relationship, the work of mounting the magnet 130 can be easily performed while realizing the positional relationship.

尚、磁石１３０の外縁（側面）における凹部或いは凸部は、スケール板１２０及び磁石１３０の間で当該位置関係が成立するのであれば、磁石１３０の磁極が切り替わる周方向の位置以外に設けられてもよい。 If the positional relationship between the scale plate 120 and the magnet 130 is established, the concave portion or convex portion on the outer edge (side surface) of the magnet 130 may be provided at a position other than the position in the circumferential direction where the magnetic pole of the magnet 130 is switched. good too.

＜変形・変更＞
以上、本発明を実施するための形態について詳述したが、本発明はかかる特定の実施形態に限定されるものではなく、特許請求の範囲に記載された本発明の要旨の範囲内において、種々の変形・変更が可能である。 <deformation/change>
Although the embodiments for carrying out the present invention have been described in detail above, the present invention is not limited to such specific embodiments, and various can be transformed or changed.

例えば、上述した実施形態では、アブソリュートエンコーダ１００は、反射型であったが、透過型であってもよい。この場合、スケール板１２０のインクリメンタルパターン１２２及びアブソリュートパターン１２３は、反射部、及び、非反射部或いは低反射率部の代わりに、照射光を透過する透過部、及び、照射光を透過しない非透過部により構成される。また、スケール板１２０に光を照射する発光素子は、光学モジュール１５０とは別に、スケール板１２０から見て、光学モジュール１５０（受光素子）とは反対側、つまり、スケール板１２０からＺ軸負方向（つまり、下方）に所定距離だけ離れた位置に設けられる。 For example, although the absolute encoder 100 is of a reflective type in the above-described embodiment, it may be of a transmissive type. In this case, the incremental pattern 122 and the absolute pattern 123 of the scale plate 120 have a transmissive portion that transmits the irradiated light and a non-transmissive portion that does not transmit the irradiated light, instead of the reflective portion and the non-reflecting portion or the low reflectance portion. It consists of the department. In addition, the light-emitting element that irradiates the scale plate 120 with light is located on the opposite side of the optical module 150 (light-receiving element) when viewed from the scale plate 120, that is, in the negative Z-axis direction from the scale plate 120, separately from the optical module 150. (that is, below) at a predetermined distance.

１００ アブソリュートエンコーダ（エンコーダ）
１１０ ハブ（ハブ部）
１１１ 窪み部
１２０ スケール板
１２４ 凸部
１３０ 磁石
１３０Ａ Ｓ極部
１３０Ｂ Ｎ極部
１３１ 凹部
１４０ 基板
１５０ 光学モジュール（受光部）
１６０ ホールＩＣ（磁気センサ）
２００ 回転軸
２００ＡＸ 軸心 100 absolute encoder (encoder)
110 hub (hub part)
111 recessed part 120 scale plate 124 convex part 130 magnet 130A S pole part 130B N pole part 131 concave part 140 substrate 150 optical module (light receiving part)
160 Hall IC (magnetic sensor)
200 Axis of rotation 200AX Center of axis

Claims (6)

測定対象の回転軸の一端に取り付けられるハブ部と、
前記回転軸に沿う方向から見て、前記ハブ部の前記回転軸と反対側の端面における前記回転軸の軸心を含む領域に取り付けられ、前記回転軸に垂直な方向で異なる磁極が着磁された磁石と、
前記回転軸に沿う方向で前記磁石と対向して配置され、前記磁石による磁場を検出する磁気センサと、
前記ハブ部の前記回転軸と反対側の端面に載置され、回転位置に応じて所定の照射光を所定のパターンで反射又は透過するパターン情報を有するスケール板と、
前記スケール板から反射又は透過される前記照射光を受光し、前記パターン情報を検出する受光部と、を備え、
前記スケール板は、前記回転軸に沿う方向から見て、前記ハブ部の前記領域に対応する中央部が切り欠かれ、
前記回転軸に沿う方向から見て、前記スケール板における切り欠かれた前記中央部に対応する内縁、及び、前記磁石の外縁の何れか一方に凸部が設けられ、何れか他方に前記凸部に対応する凹部が設けられる、
エンコーダ。 a hub portion attached to one end of a rotating shaft to be measured;
When viewed from the direction along the rotating shaft, it is attached to a region including the center of the rotating shaft on the end surface of the hub portion opposite to the rotating shaft, and is magnetized with different magnetic poles in the direction perpendicular to the rotating shaft. a magnet and
a magnetic sensor disposed facing the magnet in a direction along the rotation axis and detecting a magnetic field generated by the magnet;
a scale plate mounted on the end surface of the hub portion opposite to the rotation shaft and having pattern information for reflecting or transmitting a predetermined pattern of irradiation light according to the rotational position;
a light receiving unit that receives the irradiation light reflected or transmitted from the scale plate and detects the pattern information ;
the scale plate has a notched central portion corresponding to the region of the hub portion when viewed from the direction along the rotation axis;
When viewed from the direction along the rotation axis, a convex portion is provided on one of an inner edge corresponding to the notched central portion of the scale plate and an outer edge of the magnet, and the convex portion is provided on the other. is provided with a recess corresponding to
encoder. 前記磁気センサは、複数のホール素子を含むホールＩＣである、
請求項１に記載のエンコーダ。 The magnetic sensor is a Hall IC including a plurality of Hall elements,
An encoder according to claim 1. 前記ハブ部の前記領域には、窪み部が設けられ、
前記磁石は、前記窪み部に嵌挿される、
請求項１又は２に記載のエンコーダ。 The region of the hub portion is provided with a recessed portion,
The magnet is inserted into the recess,
3. Encoder according to claim 1 or 2. 前記磁石は、紫外線硬化性及び嫌気性を有する接着材を用いて、前記ハブ部に固定される、
請求項１乃至３の何れか一項に記載のエンコーダ。 The magnet is fixed to the hub portion using an adhesive having UV curable and anaerobic properties.
4. An encoder according to any one of claims 1-3. 前記ハブ部は、前記回転軸と反対側の端面から前記回転軸に対して、平面状の頭頂部を有する雄ねじが螺合されることにより、前記回転軸に取り付けられ、
前記磁石は、前記雄ねじの頭頂部の上に配置される、
請求項１乃至４の何れか一項に記載のエンコーダ。 The hub portion is attached to the rotating shaft by screwing a male screw having a planar top portion to the rotating shaft from the end face opposite to the rotating shaft,
the magnet is positioned on top of the crown of the male screw;
5. An encoder according to any one of claims 1-4. 前記磁石の前記外縁における前記凹部又は前記凸部は、前記磁石の磁極が切り替わる位置に設けられる、
請求項１乃至５の何れか一項に記載のエンコーダ。 The concave portion or the convex portion on the outer edge of the magnet is provided at a position where the magnetic pole of the magnet is switched,
6. An encoder according to any one of claims 1-5 .
JP2018164365A 2018-09-03 2018-09-03 encoder Active JP7192317B2 (en)

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