JP6639470B2 - 少なくとも1つのoledまたはledから放射される光放射の空間分解及び波長分解検出のための装置 - Google Patents
少なくとも1つのoledまたはledから放射される光放射の空間分解及び波長分解検出のための装置 Download PDFInfo
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Description
本発明の有利な実施形態は、従属請求項に指定された特徴を用いて実現することができる。
この例においては、放出された波長と角度との間にほぼ直線的な関係が得られており、異なる角度を有する光放射は、例として、波長λ1、λ2、λ3に応じて放射される。
図示されていない形態において、基板側の多層システムに加えてOLEDのカソード側に多層システムを配置して同様に放射野に影響を与えることができる。
この場合のカソード3は、放射された各光放射に対して十分に透明な材料で構成されなければならない。
OLEDまたはLEDにおいて使用されるエミッタの発光スペクトル。
エミッタのカソードからの間隔(ETL層の厚さ)。
誘電体多層系の特性。
基板にあって、その際基板において影響を受け得る。例えば、半球/半円筒、又はこれに類するもの(図3参照)を伴う浸漬カップリングを介して、又は
(基板側の)空気中において、場合によっては、微視的構造による分離の後
(クラッド側の)空気中において、
である。
(i)角度分解による単色の測定、すなわち、図4の方向Sλ(θ)に沿った断面の観察、又は、
(ii)図4のセクションSθ(λ)に沿った固定角度でのスペクトル分解による測定、 または
(iii)所定の角度および所定の波長における強度変動の観察、が挙げられる。
Claims (6)
- 光放射の空間分解および波長分解検出のための装置であって、
複数の異なる波長λ1、λ2、λ3、...λnを有する光放射が放射される少なくとも1つのOLED(1)又はLEDと、
OLED(1)又はLEDの電極(3、4)と、基板(5)と、の間に配置され、光屈折率nが高い方の材料と低い方の材料とを交互に上下に配置したレイヤを使用して形成され、複数の異なる波長λ1、λ2、λ3、...λnを有する少なくとも1つのOLED(1)又はLEDからの光放射が、所定の複数の角度に出射する、多層システム(2)と、
少なくとも一の検出器アレイ(9、9.1)および光学素子(10、11)と、
を備え、
前記光学素子は、前記OLED(1)又は前記LEDの基板(5)と光学レンズ(10)又はプリズム(11)とが統合された構成の前記光学レンズ(10)又は前記プリズム(11)が、液浸流体によって前記基板(5)に接続されているか、又は、前記基板(5)との間に間隔を置いて配置され、
前記放射された光放射は、前記光学素子(10、11)での少なくとも一回の単屈折の後に、少なくとも部分的に光放射に対して透過するサンプル(8)を介して前記検出器アレイ(9、9.1)に導かれ、波長λ1、λ2、λ3、...またはλnを有する光放射が前記検出器アレイ(9、9.1)のそれぞれの検出要素に入射し、前記検出器アレイ(9、9.1)の検出要素が互いに離散的に配置されている、
光放射の空間分解および波長分解検出のための装置。 - 光放射の空間分解および波長分解検出のための装置であって、
複数の異なる波長λ1、λ2、λ3、...λnを有する光放射が放射される少なくとも1つのOLED(1)又はLEDと、
OLED(1)又はLEDの電極(3、4)と、基板(5)と、の間に配置され、光屈折率nが高い方の材料と低い方の材料とを交互に上下に配置したレイヤを使用して形成され、複数の異なる波長λ1、λ2、λ3、...λnを有する少なくとも1つのOLED(1)又はLEDからの光放射が、所定の複数の角度に出射する、多層システム(2)と、
少なくとも一の検出器アレイ(9、9.1)および少なくとも一のセンサ(12)と、
を備え、
前記少なくとも一のセンサ(12)は、サンプル(8)が配置されたフィルムまたは薄膜システム(12.1)を有する少なくとも一のSPR(表面プラズモン共鳴)センサまたはBSW(ブロッホ表面波)センサ12であって、
前記放射された光放射は、フィルムまたは薄膜システム(12.1)での少なくとも一回の単屈折の後に、前記検出器アレイ(9、9.1)に導かれ、波長λ1、λ2、λ3、...またはλnを有する光放射が前記検出器アレイ(9、9.1)のそれぞれの検出要素に入射し、前記検出器アレイ(9、9.1)の検出要素が互いに離散的に配置されている、
光放射の空間分解および波長分解検出のための装置。 - 前記基板(5)の表面上に、微小光学表面構造(6)が形成され、
OLED(1)またはLEDから放射された前記光放射が入射またはそこに存在する、請求項1または2に記載の装置。 - それぞれの角度の光放射が対応するように配置された前記検出器アレイ(9、9.1)の所定の検出要素に入射し、
対応する波長λ1、λ2、λ3、...λnのそれぞれの光放射の強度は光源の特性のために測定可能である、請求項1〜3のうちいずれか一項に記載の装置。 - 基準測定に使用可能な第2の検出器アレイ(9.1)が存在する、請求項1〜4のうちいずれか一項に記載の装置。
- 第2の多層システム(2)が、前記放射された光放射を透過する第2の電極(3又は4)の上に配置されており、
異なる波長λ1、λ2、λ3、...λnが複数の異なる角度において放射されるようにそこから放射された分散光放射が、少なくとも1つのさらなる検出器アレイ(9、9.1)に入射する、請求項1〜5のうちいずれか一項に記載の装置。
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DE102014214721.2 | 2014-07-25 | ||
DE102014214721.2A DE102014214721A1 (de) | 2014-07-25 | 2014-07-25 | Anordnung zur orts- und wellenlängenaufgelösten Erfassung von Lichtstrahlung, die von mindestens einer OLED oder LED emittiert wird |
PCT/EP2015/065834 WO2016012276A1 (de) | 2014-07-25 | 2015-07-10 | Anordnung zur orts- und wellenlängenaufgelösten erfassung von lichtstrahlung, die von mindestens einer oled oder led emittiert wird |
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Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5478658A (en) * | 1994-05-20 | 1995-12-26 | At&T Corp. | Article comprising a microcavity light source |
JP3319251B2 (ja) * | 1995-01-10 | 2002-08-26 | 株式会社日立製作所 | 多重共振構造を有する発光素子 |
US5682402A (en) * | 1995-01-10 | 1997-10-28 | Hitachi, Ltd. | Organic luminescent devices with a multiplex structure |
JP3528470B2 (ja) * | 1995-10-27 | 2004-05-17 | 株式会社豊田中央研究所 | 微小光共振器型有機電界発光素子 |
US5780174A (en) * | 1995-10-27 | 1998-07-14 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Micro-optical resonator type organic electroluminescent device |
EP1038167A4 (en) * | 1997-12-12 | 2001-08-22 | Perkin Elmer Corp | ANALYSIS DEVICE USING OPTICAL RESONANCE |
JPH11224783A (ja) * | 1998-02-04 | 1999-08-17 | Toyota Central Res & Dev Lab Inc | 有機エレクトロルミネッセンス素子 |
KR20020065893A (ko) * | 1999-10-29 | 2002-08-14 | 트러스티스 오브 프린스턴 유니버시티 | 구형 패턴을 가지는 유기발광 다이오드 |
WO2003047316A1 (en) * | 2001-11-29 | 2003-06-05 | The Trustees Of Princeton University | Increased emission efficiency in organic light-emitting devices on high-index substrates |
JP2003344276A (ja) * | 2002-05-30 | 2003-12-03 | Fuji Photo Film Co Ltd | 測定装置 |
US20040140757A1 (en) * | 2003-01-17 | 2004-07-22 | Eastman Kodak Company | Microcavity OLED devices |
JP2005172665A (ja) * | 2003-12-12 | 2005-06-30 | Oputeru:Kk | 光放射パターン測定装置 |
US7489074B2 (en) * | 2004-09-28 | 2009-02-10 | Osram Opto Semiconductors Gmbh | Reducing or eliminating color change for microcavity OLED devices |
FR2887684A1 (fr) | 2005-06-28 | 2006-12-29 | Thomson Licensing Sa | Diode electroluminescente dont l'une des electrodes est multicouche en carbone amorphe |
US7583712B2 (en) * | 2006-06-16 | 2009-09-01 | Pbc Lasers Gmbh | Optoelectronic device and method of making same |
DE102006039171A1 (de) | 2006-08-21 | 2008-02-28 | Siemens Ag | Verfahren und Vorrichtung zum Ermitteln eines Winkels eines Messobjektes gegenüber einer Detektionsvorrichtung mittels einer organischen Leuchtdiode |
WO2010060915A2 (de) | 2008-11-28 | 2010-06-03 | Siemens Aktiengesellschaft | Messvorrichtung und verfahren für spektroskopische messungen mit led beleuchtung |
DE102009037185B4 (de) | 2009-05-29 | 2018-11-22 | Osram Oled Gmbh | Organische Leuchtdiode |
JP5731830B2 (ja) * | 2010-01-19 | 2015-06-10 | パナソニック株式会社 | 面状発光装置 |
JP2012204240A (ja) | 2011-03-28 | 2012-10-22 | 21 Aomori Sangyo Sogo Shien Center | 発光領域推定システム、発光領域推定装置、発光領域推定方法および発光領域推定プログラム |
DE102012109135A1 (de) | 2012-09-27 | 2014-03-27 | Osram Opto Semiconductors Gmbh | Vorrichtung und Verfahren zum Ermitteln mindestens einer vorbestimmten Eigenschaft eines elektromagnetische Strahlung emittierenden Bauelements |
JPWO2014181695A1 (ja) | 2013-05-09 | 2017-02-23 | コニカミノルタ株式会社 | 有機エレクトロルミネッセンス素子 |
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2014
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- 2015-07-10 EP EP15734414.4A patent/EP3172542B1/de active Active
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US10281321B2 (en) | 2019-05-07 |
EP3172542B1 (de) | 2018-09-12 |
DE102014214721A1 (de) | 2016-01-28 |
WO2016012276A1 (de) | 2016-01-28 |
US20170248463A1 (en) | 2017-08-31 |
JP2017521673A (ja) | 2017-08-03 |
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