JP6548219B2 - Ct検出器 - Google Patents
Ct検出器 Download PDFInfo
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- JP6548219B2 JP6548219B2 JP2015140930A JP2015140930A JP6548219B2 JP 6548219 B2 JP6548219 B2 JP 6548219B2 JP 2015140930 A JP2015140930 A JP 2015140930A JP 2015140930 A JP2015140930 A JP 2015140930A JP 6548219 B2 JP6548219 B2 JP 6548219B2
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- 239000000956 alloy Substances 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000002131 composite material Substances 0.000 claims description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000010937 tungsten Substances 0.000 claims description 2
- 238000002591 computed tomography Methods 0.000 description 19
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000013440 design planning Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000013439 planning Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Radiology & Medical Imaging (AREA)
- Pulmonology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
102 検出対象物
103 検出器
301 検出器モジュール
302 コリメータプレート
303 シンチレータ
304 光電受光ダイオード
305 モジュール台座
306 隙間
307 グリッド
1031 検出器モジュール
1032 検出器モジュール
Claims (9)
- CT検出器であって、
間に隙間(306)を有し、2次元離散画素を構成するための複数のシンチレータ(303)を含む検出器モジュール(301)と、
X線を対応する前記2次元離散画素に誘導するための、前記検出器モジュール(301)の、前記X線を受ける一面の上方に配置されたコリメータプレート(302)と
を備え、
前記CT検出器は、
前記X線が前記隙間(306)に放射されるのを阻止するために、前記検出器モジュール(301)と前記コリメータプレート(302)との間に配置されたグリッド(307)をさらに備え、
前記グリッド(307)は、交差する2方向における前記隙間(306)に設けられており、前記方向の少なくとも一方に破断接合部を有している、
CT検出器。 - CT検出器であって、
間に隙間(306)を有し、2次元離散画素を構成するための複数のシンチレータ(303)を含む検出器モジュール(301)と、
X線を対応する前記2次元離散画素に誘導するための、前記検出器モジュール(301)の、前記X線を受ける一面の上方に配置されたコリメータプレート(302)と
を備え、
前記CT検出器は、
前記X線が前記隙間(306)に放射されるのを阻止するために、前記検出器モジュール(301)と前記コリメータプレート(302)との間に配置されたグリッド(307)をさらに備え、
前記グリッド(307)は、一方向における前記隙間(306)に設けられており、前記方向に破断接合部を有している、CT検出器。 - 前記グリッド(307)は、80マイクロメートル〜10ミリメートルの厚さを有する、請求項1に記載のCT検出器。
- 前記グリッド(307)のグリッド線は、10マイクロメートル〜700マイクロメートルの幅を有する、請求項1に記載のCT検出器。
- 前記グリッド(307)内の隣接する2つのグリッド線は、0.08ミリメートル〜3ミリメートルのピッチを有する、請求項1に記載のCT検出器。
- 前記グリッド(307)は、タングステン若しくは高密度合金を含むか、または前記X線を強く吸収するための複合材料から作製される、請求項1に記載のCT検出器。
- 前記グリッド(307)は、前記隙間(306)に非対称に設けられる、請求項1に記載のCT検出器。
- 前記グリッド(307)は、前記隙間(306)に対称に設けられている、請求項1に記載のCT検出器。
- 前記CT検出器は、ポリライン形状に構成されている複数の検出器モジュール(301)を備えている、請求項1乃至8のいずれか1項に記載のCT検出器。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410360281.1 | 2014-07-25 | ||
CN201410360281.1A CN105266835A (zh) | 2014-07-25 | 2014-07-25 | 一种ct探测器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016030215A JP2016030215A (ja) | 2016-03-07 |
JP6548219B2 true JP6548219B2 (ja) | 2019-07-24 |
Family
ID=53879306
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015140930A Active JP6548219B2 (ja) | 2014-07-25 | 2015-07-15 | Ct検出器 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20160025867A1 (ja) |
EP (1) | EP2977792B1 (ja) |
JP (1) | JP6548219B2 (ja) |
CN (1) | CN105266835A (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10058293B2 (en) | 2016-02-19 | 2018-08-28 | Morpho Detection, Llc | Detector assemblies and methods for helical CT scanning |
CN108121014A (zh) * | 2017-12-07 | 2018-06-05 | 公安部第三研究所 | 立体视角散射阵列探测***及方法 |
CN108577880B (zh) * | 2018-05-18 | 2022-05-27 | 上海联影医疗科技股份有限公司 | 防散射栅格及ct探测*** |
CN110123355B (zh) * | 2019-05-30 | 2023-03-31 | 东软医疗***股份有限公司 | 探测*** |
CN111067555A (zh) * | 2019-12-25 | 2020-04-28 | 上海联影医疗科技有限公司 | Ct探测器 |
CN117064422A (zh) * | 2023-09-13 | 2023-11-17 | 北京富通康影科技有限公司 | 一种ct探测器抗散射滤线栅 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6304626B1 (en) * | 1998-10-20 | 2001-10-16 | Kabushiki Kaisha Toshiba | Two-dimensional array type of X-ray detector and computerized tomography apparatus |
DE10142531A1 (de) * | 2001-08-30 | 2003-03-20 | Philips Corp Intellectual Pty | Sensoranordnung aus licht- und/oder röntgenstrahlungsempfindlichen Sensoren |
KR101125284B1 (ko) * | 2010-02-03 | 2012-03-21 | 주식회사 디알텍 | 엑스선 그리드 및 그 제조 방법 |
JP5660910B2 (ja) * | 2010-03-30 | 2015-01-28 | 富士フイルム株式会社 | 放射線画像撮影用グリッドの製造方法 |
DE102010020610A1 (de) * | 2010-05-14 | 2011-11-17 | Siemens Aktiengesellschaft | Strahlendetektor und Verfahren zur Herstellung eines Strahlendetektors |
WO2012048296A1 (en) * | 2010-10-08 | 2012-04-12 | Turtle Bay Partners, Llc | Three-dimensional focused anti-scatter grid and method for manufacturing thereof |
JP5661486B2 (ja) * | 2011-01-25 | 2015-01-28 | 株式会社日立メディコ | X線検出器及びそれを備えたx線ct装置 |
DE102011103851B4 (de) * | 2011-05-26 | 2019-05-29 | Siemens Healthcare Gmbh | Gittermodul eines Streustrahlungsgitters, modulares Streustrahlungsgitter, CT-Detektor und CT-System |
JP2013040859A (ja) * | 2011-08-17 | 2013-02-28 | Toshiba Corp | X線検出器及びx線ct装置 |
CN103135121B (zh) * | 2011-11-28 | 2017-04-26 | Ge医疗***环球技术有限公司 | 用于消除串扰的线段形模块ct探测器和方法 |
-
2014
- 2014-07-25 CN CN201410360281.1A patent/CN105266835A/zh active Pending
-
2015
- 2015-07-15 JP JP2015140930A patent/JP6548219B2/ja active Active
- 2015-07-20 EP EP15177549.1A patent/EP2977792B1/en active Active
- 2015-07-24 US US14/807,906 patent/US20160025867A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP2977792A1 (en) | 2016-01-27 |
EP2977792B1 (en) | 2018-06-13 |
CN105266835A (zh) | 2016-01-27 |
JP2016030215A (ja) | 2016-03-07 |
US20160025867A1 (en) | 2016-01-28 |
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