JP6184061B2 - 積層型半導体装置及び電子機器 - Google Patents
積層型半導体装置及び電子機器 Download PDFInfo
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- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
- H01L23/3128—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
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- H—ELECTRICITY
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- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/10—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/1011—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
- H01L2225/1017—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support
- H01L2225/1023—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support the support being an insulating substrate
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- H01L2225/10—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/1011—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
- H01L2225/1047—Details of electrical connections between containers
- H01L2225/1058—Bump or bump-like electrical connections, e.g. balls, pillars, posts
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
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Description
図1は、本発明の第1実施形態に係る積層型半導体装置の概略構成を示す断面図である。図1において、積層型半導体装置100は、PoP構造の積層型半導体パッケージであり、第1半導体パッケージとしての上段半導体パッケージ101と、第2半導体パッケージとしての下段半導体パッケージ201とを備えている。そして、積層型半導体装置100は、下段半導体パッケージ201上に上段半導体パッケージ101が積層され、複数のはんだボール301ではんだ接合されて構成されている。
次に、本発明の第2実施形態に係る積層型半導体装置について説明する。図3は、本発明の第2実施形態に係る積層型半導体装置のはんだボール近傍を拡大した断面図である。なお、本第2実施形態において、上記第1実施形態と同様の構成については、同一符号を付してその説明を省略する。
本実施例1では、上記第1実施形態の積層型半導体装置の構成についてシミュレーション及び実験を行った結果について説明する。
上記実施例1では、第1開口132を第2開口232に対して小さくし、第2接触点X2におけるはんだ部302と下段インターポーザ202の第2ソルダーレジスト231とのなす角度θ2を大きくすることで、第2接触点X2に起こるひずみを低減している。
本実施例3では、上記第2実施形態の積層型半導体装置についてシミュレーションを行った結果について説明する。本実施例3では、図3に示すように、第1開口132Aが、第2開口232よりも深く形成されている。
Claims (3)
- 第1プリント配線板、前記第1プリント配線板の第1表層に実装された第1半導体素子、及び前記第1半導体素子を封止した封止樹脂を有する第1半導体パッケージと、
第2プリント配線板、及び前記第2プリント配線板に実装された第2半導体素子を有する第2半導体パッケージと、を備え、
前記第1プリント配線板は、
前記第1表層とは反対側の第2表層に形成された第1ランドと、
前記第2表層に形成され、前記第1ランドの一部を覆い、一部を露出させることで第1開口を形成する第1ソルダーレジストと、を備え、
前記第2プリント配線板は、
前記第1プリント配線板の第2表層に対向する表層に形成され、前記第1ランドに対向する第2ランドと、
前記表層に形成され、前記第2ランドの一部を覆い、一部を露出させることで前記第1開口に対向する第2開口を形成する第2ソルダーレジストと、を備え、
前記第1ランドと前記第2ランドとが、前記第1開口及び前記第2開口を通じてはんだ接合され、
前記第1開口の開口面積が、前記第2開口の開口面積よりも小さく、前記第2開口の開口面積に対する前記第1開口の開口面積の比が、0.56以上0.81以下であり、かつ、前記第1開口の深さが、前記第2開口の深さよりも大きいことを特徴とする積層型半導体装置。 - 前記第1半導体パッケージは、前記第1半導体素子として、互いに積層して配置された複数の半導体素子を有していることを特徴とする請求項1に記載の積層型半導体装置。
- 請求項1又は2に記載の積層型半導体装置を搭載したことを特徴とする電子機器。
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JP2012122271A JP6184061B2 (ja) | 2012-05-29 | 2012-05-29 | 積層型半導体装置及び電子機器 |
US13/897,659 US9299666B2 (en) | 2012-05-29 | 2013-05-20 | Stacked semiconductor device |
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JP2012122271A JP6184061B2 (ja) | 2012-05-29 | 2012-05-29 | 積層型半導体装置及び電子機器 |
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JP2013247344A JP2013247344A (ja) | 2013-12-09 |
JP6184061B2 true JP6184061B2 (ja) | 2017-08-23 |
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Families Citing this family (3)
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US9508663B2 (en) * | 2013-07-24 | 2016-11-29 | Invensense, Inc. | Assembly and packaging of MEMS device |
US9455177B1 (en) * | 2015-08-31 | 2016-09-27 | Dow Global Technologies Llc | Contact hole formation methods |
JP6772232B2 (ja) * | 2018-10-03 | 2020-10-21 | キヤノン株式会社 | プリント回路板及び電子機器 |
Family Cites Families (17)
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JP2001077301A (ja) * | 1999-08-24 | 2001-03-23 | Amkor Technology Korea Inc | 半導体パッケージ及びその製造方法 |
JP2004047510A (ja) * | 2002-07-08 | 2004-02-12 | Fujitsu Ltd | 電極構造体およびその形成方法 |
JP2004128364A (ja) * | 2002-10-07 | 2004-04-22 | Renesas Technology Corp | 半導体パッケージおよび半導体パッケージの実装構造体 |
JP4096774B2 (ja) * | 2003-03-24 | 2008-06-04 | セイコーエプソン株式会社 | 半導体装置、電子デバイス、電子機器、半導体装置の製造方法及び電子デバイスの製造方法 |
JP2005310837A (ja) * | 2004-04-16 | 2005-11-04 | Elpida Memory Inc | 半導体装置及びその製造方法 |
JP2006086161A (ja) * | 2004-09-14 | 2006-03-30 | Canon Inc | 半導体装置 |
JP2006156453A (ja) * | 2004-11-25 | 2006-06-15 | Mitsubishi Electric Corp | Bgaパッケージの実装構造 |
US7838977B2 (en) * | 2005-09-07 | 2010-11-23 | Alpha & Omega Semiconductor, Ltd. | Packages for electronic devices implemented with laminated board with a top and a bottom patterned metal layers |
JP2007103681A (ja) * | 2005-10-05 | 2007-04-19 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP4901384B2 (ja) * | 2006-09-14 | 2012-03-21 | パナソニック株式会社 | 樹脂配線基板とそれを用いた半導体装置および積層型の半導体装置 |
JP5211493B2 (ja) * | 2007-01-30 | 2013-06-12 | 富士通セミコンダクター株式会社 | 配線基板及び半導体装置 |
JP5135828B2 (ja) * | 2007-02-28 | 2013-02-06 | ソニー株式会社 | 基板およびその製造方法、半導体パッケージおよびその製造方法、並びに半導体装置およびその製造方法 |
JP5098902B2 (ja) * | 2008-09-02 | 2012-12-12 | 富士通株式会社 | 電子部品 |
JP5491077B2 (ja) | 2009-06-08 | 2014-05-14 | キヤノン株式会社 | 半導体装置、及び半導体装置の製造方法 |
JP2011014757A (ja) | 2009-07-03 | 2011-01-20 | Panasonic Corp | 積層型半導体装置 |
JP5525793B2 (ja) * | 2009-10-19 | 2014-06-18 | パナソニック株式会社 | 半導体装置 |
JP2011165741A (ja) * | 2010-02-05 | 2011-08-25 | Renesas Electronics Corp | 半導体装置およびその製造方法 |
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US9299666B2 (en) | 2016-03-29 |
JP2013247344A (ja) | 2013-12-09 |
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