JP6156131B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP6156131B2 JP6156131B2 JP2013265421A JP2013265421A JP6156131B2 JP 6156131 B2 JP6156131 B2 JP 6156131B2 JP 2013265421 A JP2013265421 A JP 2013265421A JP 2013265421 A JP2013265421 A JP 2013265421A JP 6156131 B2 JP6156131 B2 JP 6156131B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- phase
- electrode
- temperature sensor
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 51
- 239000000758 substrate Substances 0.000 claims description 161
- 238000001514 detection method Methods 0.000 claims description 10
- 230000020169 heat generation Effects 0.000 claims description 5
- 230000002159 abnormal effect Effects 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 8
- 229910052802 copper Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- 230000005856 abnormality Effects 0.000 description 7
- 239000011347 resin Substances 0.000 description 7
- 229920005989 resin Polymers 0.000 description 7
- 238000005476 soldering Methods 0.000 description 6
- 230000008646 thermal stress Effects 0.000 description 6
- 239000012212 insulator Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 238000009529 body temperature measurement Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
Landscapes
- Power Conversion In General (AREA)
- Inverter Devices (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
図2ではインバータ回路のパワーモジュールを例に挙げたが、コンバータ回路のパワーモジュールも典型的な例として挙げられる。また、図3では温度センサを実装基板の中央部に配置したが、任意の位置でよく、各素子基板から均等に離れた場所や特定の素子基板の近傍などに配置してもよい。また、上記例では温度センサをそれぞれ2つの実装基板が対向する側の面上に設けたが、これに限らず、各温度センサについて、2つの実装基板が対向する側の面上やその反対側の面上、実装基板の中など、実装基板の任意の部位に設けてもよい。
2 発電電動機
10 素子基板
11、12、13、14、15、16 IGBT
21、22、23、24、25、26 ダイオード
31、41 温度センサ
32、33 配線パターン
32a、42a 接続パッド領域
51 絶縁樹脂板
52 銅板
100 正電極
200 負電極
101、102、103、104、105、106 領域
110、210 U相電極
130、230 V相電極
150、250 W相電極
SU1、SU2、SV1、SV2、SW1、SW2 スイッチ回路
T1、T2 矢印
A、B 電極
BD1 コレクタ側基板
BD2 エミッタ側基板
C1、C2 接合部
h1、h2、h3 半田付け部
g スペーサ
Claims (1)
- 半導体素子が形成されている素子基板と、
前記素子基板に前記素子基板の一方面側から第1の接合部を介して接合された第1の基板と、
前記素子基板に前記素子基板の他方面側から前記第1の接合部とは構成が異なる第2の接合部を介して接合された第2の基板と、
前記第1の基板に設けられた第1の温度センサと、
前記第2の基板に設けられた第2の温度センサとを備え、
前記第1の温度センサの検出温度と前記第2の温度センサの検出温度との絶対値及び相対値を用いて前記素子基板の異常発熱を検出することを特徴とする半導体装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013265421A JP6156131B2 (ja) | 2013-12-24 | 2013-12-24 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013265421A JP6156131B2 (ja) | 2013-12-24 | 2013-12-24 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015122876A JP2015122876A (ja) | 2015-07-02 |
JP6156131B2 true JP6156131B2 (ja) | 2017-07-05 |
Family
ID=53534037
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013265421A Expired - Fee Related JP6156131B2 (ja) | 2013-12-24 | 2013-12-24 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP6156131B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7119399B2 (ja) | 2018-02-06 | 2022-08-17 | 株式会社デンソー | 半導体装置 |
JP7070070B2 (ja) | 2018-05-15 | 2022-05-18 | 株式会社デンソー | 半導体装置 |
JP2022160154A (ja) | 2021-04-06 | 2022-10-19 | 三菱重工業株式会社 | 半導体装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63309930A (ja) * | 1987-06-10 | 1988-12-19 | Canon Inc | 液晶装置 |
JP2008124430A (ja) * | 2006-10-18 | 2008-05-29 | Hitachi Ltd | パワー半導体モジュール |
JP5083798B2 (ja) * | 2006-10-27 | 2012-11-28 | 株式会社ジャパンディスプレイウェスト | 液晶表示装置 |
-
2013
- 2013-12-24 JP JP2013265421A patent/JP6156131B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2015122876A (ja) | 2015-07-02 |
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