JP6046237B2 - マイクロ波プラズマ化学気相成長装置 - Google Patents
マイクロ波プラズマ化学気相成長装置 Download PDFInfo
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- JP6046237B2 JP6046237B2 JP2015505687A JP2015505687A JP6046237B2 JP 6046237 B2 JP6046237 B2 JP 6046237B2 JP 2015505687 A JP2015505687 A JP 2015505687A JP 2015505687 A JP2015505687 A JP 2015505687A JP 6046237 B2 JP6046237 B2 JP 6046237B2
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
- C23C16/27—Diamond only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4402—Reduction of impurities in the source gas
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/025—Continuous growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/12—Substrate holders or susceptors
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/20—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/04—Diamond
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32899—Multiple chambers, e.g. cluster tools
Description
Claims (19)
- 1つ又はそれ以上のチャンバを含み、各チャンバは、1つ又はそれ以上の他のチャンバと流体連通しており、各チャンバは、複数のダイヤモンドシードが上に配置される基材ステージを支持する1つ又はそれ以上の基材ステージ組立体を前記チャンバ内に含むことを特徴とする、ダイヤモンドを成長させるための装置。
- 前記チャンバを、各チャンバ間にガスフロー管で直列に配置することができることを特徴とする、請求項1に記載の装置。
- 前記チャンバを、前記チャンバ間でガスが流れることができるように各チャンバが隣接チャンバと接続されたネットワーク状に配置することができることを特徴とする、請求項1に記載の装置。
- 前記チャンバは、前記チャンバ内にマイクロ波エネルギーを供給するためのマイクロ波機構をさらに含むことを特徴とする、請求項1から請求項3のいずれか1項に記載の装置。
- 前記マイクロ波機構は、2.45GHzのマイクロ波を発生させ、前記マイクロ波のエネルギーを前記チャンバ内の前記基材ステージの領域に振り向けて、偏球プラズマ領域を形成することを特徴とする、請求項4に記載の装置。
- 前記チャンバは、前記基材ステージ組立体を内部に収容するようになっている筐体を有することを特徴とする、請求項1〜請求項5のいずれかに記載の装置。
- 基材ステージ組立体は、プレートと、基材ステージと、周縁反射体とを含み、前記基材ステージ及び前記周縁反射体は、前記プレート上に支持されることを特徴とする、請求項1〜請求項6のいずれかに記載の装置。
- 前記プレートは、高い熱伝導率を有する金属で作られることを特徴とする、請求項7に記載の装置。
- 前記基材ステージは、
実質的に円形の平面状の基部と、
前記基部に対する周縁***縁部と、を含み、
前記周縁***縁部は、それにより中央凹部基材受入れ面を定め、前記中央凹部基材受入れ面は実質的に平面であり、前記基部に対する前記周縁***縁部は、内縁部及び外縁部を含み、前記内縁部は、斜面を含む、
ことを特徴とする、請求項7または請求項8に記載の装置。 - 前記周縁***縁部は、環状溝を含むことを特徴とする、請求項9に記載の装置。
- 前記周縁***縁部は、上面及び下面を含み、前記周縁***縁部は、少なくとも前記上面及び前記下面の一方に環状溝を含むことを特徴とする、請求項9または請求項10に記載の装置。
- 前記周縁反射体は、前記基材ステージを中心とする円筒形本体を含み、前記周縁反射体は、前記基材ステージの前記周縁***縁部から横方向に離間していることを特徴とする、請求項9〜請求項11のいずれかに記載の装置。
- 前記斜面は、上方鋭縁部及び下方鋭縁部を定め、前記上方鋭縁部及び前記下方鋭縁部は共同で、使用時のプラズマ領域を定めることを支援することを特徴とする、請求項9〜請求項12のいずれかに記載の装置。
- 前記基材ステージは、モリブデンで作られることを特徴とする、請求項7〜請求項13のいずれかに記載の装置。
- 前記基材ステージの外周は、前記基材ステージ組立体の主要な大部分から、前記基材ステージの上面及び下面の両方にある環状又はスロット状の溝で隔てられていることを特徴とする、請求項7〜請求項14のいずれかに記載の装置。
- 請求項1〜請求項15の装置の第1のチャンバの前に配置され、ガスを供給して前記チャンバ内でダイヤモンドを形成するようになっていることを特徴とする、ガス供給部。
- 請求項1〜請求項15の装置の最終チャンバの後に配置され、全ての前記チャンバを排気し、一連のチャンバを通して、プロセスガスをガス入口から第1のチャンバの中に引き込むようになっていることを特徴とする、真空ポンプ。
- 請求項1〜請求項15の装置の各々のチャンバ上に固定され、前記チャンバ内のガス品質比率を測定するようになっていることを特徴とする、測定手段。
- 請求項1〜請求項15の装置の各々のチャンバ上に固定され、前記チャンバ内の圧力を測定するようになっていることを特徴とする、圧力測定手段。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/445,070 | 2012-04-12 | ||
US13/445,070 US20130272928A1 (en) | 2012-04-12 | 2012-04-12 | Apparatus for the deposition of diamonds by microwave plasma chemical vapour deposition process and substrate stage used therein |
PCT/SG2013/000144 WO2013154504A2 (en) | 2012-04-12 | 2013-04-12 | Apparatus for the growing diamonds by microwave plasma chemical vapour deposition process and substrate stage used therein |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015518088A JP2015518088A (ja) | 2015-06-25 |
JP6046237B2 true JP6046237B2 (ja) | 2016-12-14 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2015505687A Active JP6046237B2 (ja) | 2012-04-12 | 2013-04-12 | マイクロ波プラズマ化学気相成長装置 |
Country Status (10)
Country | Link |
---|---|
US (2) | US20130272928A1 (ja) |
EP (1) | EP2836622B1 (ja) |
JP (1) | JP6046237B2 (ja) |
KR (1) | KR101722478B1 (ja) |
CN (1) | CN104321461B (ja) |
DK (1) | DK2836622T3 (ja) |
ES (1) | ES2652129T3 (ja) |
PT (1) | PT2836622T (ja) |
SG (1) | SG11201406391YA (ja) |
WO (1) | WO2013154504A2 (ja) |
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JP2014185382A (ja) * | 2013-03-25 | 2014-10-02 | Atsumi Tec:Kk | ナノ粒子の分別装置 |
SG10201506020UA (en) * | 2014-08-19 | 2016-03-30 | Silcotek Corp | Chemical vapor deposition system, arrangement of chemical vapor deposition systems, and chemical vapor deposition method |
GB2547574A (en) | 2014-12-22 | 2017-08-23 | Halliburton Energy Services Inc | Chemically strenghened bond between thermally stable polycrystalline hard materials and braze material |
SG10201505413VA (en) * | 2015-01-14 | 2016-08-30 | Iia Technologies Pte Ltd | Electronic device grade single crystal diamonds and method of producing the same |
US11469077B2 (en) | 2018-04-24 | 2022-10-11 | FD3M, Inc. | Microwave plasma chemical vapor deposition device and application thereof |
WO2019222458A1 (en) * | 2018-05-18 | 2019-11-21 | Board Of Trustees Of Michigan State University | Methods for forming large area diamond substrates |
CN108624870B (zh) * | 2018-07-05 | 2023-07-28 | 成都纽曼和瑞微波技术有限公司 | 一种可调谐圆抛腔式高功率微波等离子体化学气相沉积装置 |
CN111663179A (zh) * | 2019-03-05 | 2020-09-15 | 中国科学院物理研究所 | 用于单晶金刚石生长的晶种托 |
CN110735130B (zh) * | 2019-11-13 | 2021-11-26 | 湖南红太阳光电科技有限公司 | 制备背面钝化膜的管式pecvd设备及方法 |
CN111020699A (zh) * | 2019-12-12 | 2020-04-17 | 上海征世科技有限公司 | 一种提高微波等离子体生长单晶钻石生长速度的基片台 |
CN111962048B (zh) * | 2020-07-16 | 2021-08-20 | 上海征世科技股份有限公司 | 一种微波等离子体设备用的基片台及设备 |
KR102532228B1 (ko) * | 2021-08-11 | 2023-05-15 | 중앙대학교 산학협력단 | 에칭과 화학기상증착에 의한 재성장을 이용한 계층적 다이아몬드 구조 제작방법 및 그 다이아몬드 구조를 갖는 방열소재 |
WO2023240026A1 (en) * | 2022-06-06 | 2023-12-14 | Plasmability, LLC. | Multiple chamber system for plasma chemical vapor deposition of diamond and related materials |
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2012
- 2012-04-12 US US13/445,070 patent/US20130272928A1/en not_active Abandoned
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- 2013-04-12 ES ES13721420.1T patent/ES2652129T3/es active Active
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- 2013-04-12 CN CN201380019823.2A patent/CN104321461B/zh active Active
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Publication number | Publication date |
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KR20150020537A (ko) | 2015-02-26 |
CN104321461B (zh) | 2017-03-15 |
SG11201406391YA (en) | 2014-11-27 |
DK2836622T3 (en) | 2017-12-11 |
US20130272928A1 (en) | 2013-10-17 |
EP2836622B1 (en) | 2017-09-27 |
CN104321461A (zh) | 2015-01-28 |
WO2013154504A3 (en) | 2014-08-28 |
JP2015518088A (ja) | 2015-06-25 |
KR101722478B1 (ko) | 2017-04-03 |
EP2836622A2 (en) | 2015-02-18 |
WO2013154504A2 (en) | 2013-10-17 |
PT2836622T (pt) | 2017-12-21 |
US20150059647A1 (en) | 2015-03-05 |
US10184192B2 (en) | 2019-01-22 |
ES2652129T3 (es) | 2018-01-31 |
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