JP6030926B2 - 導通検査装置 - Google Patents
導通検査装置 Download PDFInfo
- Publication number
- JP6030926B2 JP6030926B2 JP2012250175A JP2012250175A JP6030926B2 JP 6030926 B2 JP6030926 B2 JP 6030926B2 JP 2012250175 A JP2012250175 A JP 2012250175A JP 2012250175 A JP2012250175 A JP 2012250175A JP 6030926 B2 JP6030926 B2 JP 6030926B2
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- JP
- Japan
- Prior art keywords
- terminal
- potential
- electric wire
- wire
- reference electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
電線の一端の端子に非接触状態で対向させた一方のプローブへの電圧印加によって静電気を帯電させた前記電線の他端の端子の表面電位を、該他端の端子に非接触状態で対向させた他方のプローブを通じて、前記静電気を前記電線に帯電させたままの状態で測定し、その結果に基づいて前記電線の導通状態を検査する装置であって、
前記電線の中間部に沿って配置され、前記電線の静電気の電位よりも低い電位に固定された基準電極板を備える、
ことを特徴とする。
3…給電側コネクタ受け
3a〜3h…給電プローブ(一方のプローブ)
3i,5i…内側壁
3j,5j…スリット
5…検査側コネクタ受け
5a〜5h…検査プローブ(他方のプローブ)
7…基準電極板
9…電源ユニット
11,15…切替機
13…計測器
51,53…電線
51a,53a…端子(一端の端子)
51b,53b…端子(他端の端子)
51c,53c…中間部
55a,55b…コネクタ
57a,57b…フランジ
Claims (2)
- 電線の一端の端子に非接触状態で対向させた一方のプローブへの電圧印加によって静電気を帯電させた前記電線の他端の端子の表面電位を、該他端の端子に非接触状態で対向させた他方のプローブを通じて、前記静電気を前記電線に帯電させたままの状態で測定し、その結果に基づいて前記電線の導通状態を検査する装置であって、
前記電線の中間部に沿って配置され、前記電線の静電気の電位よりも低い電位に固定された基準電極板を備える、
ことを特徴とする導通検査装置。 - 複数の前記電線の前記各端子に非接触状態でそれぞれ対向させた複数の前記一方及び他方の各プローブを備えていて、前記各電線の中間部に沿って前記基準電極板が配置されており、単一の前記電線の前記一端の端子に対向する単一の前記一方のプローブへの電圧印加時における、前記単一の電線を含む複数の電線における前記他端の端子の表面電位の測定結果に基づいて、前記複数の電線の導通状態を検査することを特徴とする請求項1記載の導通検査装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012250175A JP6030926B2 (ja) | 2012-11-14 | 2012-11-14 | 導通検査装置 |
DE112013005452.3T DE112013005452T5 (de) | 2012-11-14 | 2013-10-15 | Durchgangsinspektionssvorrichtung |
CN201380059654.5A CN104781681B (zh) | 2012-11-14 | 2013-10-15 | 导通性检查装置 |
PCT/JP2013/077943 WO2014077075A1 (ja) | 2012-11-14 | 2013-10-15 | 導通検査装置 |
US14/710,021 US9989577B2 (en) | 2012-11-14 | 2015-05-12 | Continuity inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012250175A JP6030926B2 (ja) | 2012-11-14 | 2012-11-14 | 導通検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014098612A JP2014098612A (ja) | 2014-05-29 |
JP6030926B2 true JP6030926B2 (ja) | 2016-11-24 |
Family
ID=50730996
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012250175A Active JP6030926B2 (ja) | 2012-11-14 | 2012-11-14 | 導通検査装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9989577B2 (ja) |
JP (1) | JP6030926B2 (ja) |
CN (1) | CN104781681B (ja) |
DE (1) | DE112013005452T5 (ja) |
WO (1) | WO2014077075A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6864979B2 (ja) * | 2015-06-05 | 2021-04-28 | 矢崎総業株式会社 | 導通検査方法及び導通検査装置 |
CN105974259B (zh) * | 2016-06-27 | 2018-10-23 | 苏州韵安电器有限公司 | 一种导线自动测试装置 |
AT524105A1 (de) * | 2020-08-13 | 2022-02-15 | Khu Peter | Durchgangsprüfung eines Kabels |
CN113009266A (zh) * | 2021-03-18 | 2021-06-22 | 广州亚美智造科技有限公司 | 一种治具插拔检测电路 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS526989A (en) * | 1975-07-04 | 1977-01-19 | Dainichi Nippon Cables Ltd | Electric test method for multicore cable |
US4878017A (en) * | 1986-10-28 | 1989-10-31 | Williams Bruce T | High speed D.C. non-contacting electrostatic voltage follower |
JPH07280864A (ja) * | 1994-04-12 | 1995-10-27 | Amp Japan Ltd | 導通検査方法及び導通検査装置 |
AU4391799A (en) * | 1998-06-23 | 2000-01-10 | Ks Techno Co., Ltd. | Fence sensor |
JP2001091543A (ja) * | 1999-09-27 | 2001-04-06 | Hitachi Ltd | 半導体検査装置 |
JP2002014135A (ja) * | 2000-06-30 | 2002-01-18 | Hioki Ee Corp | 回路基板検査方法および回路基板検査装置 |
US7123022B2 (en) * | 2004-04-28 | 2006-10-17 | Agilent Technologies, Inc. | Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies |
JP4794828B2 (ja) * | 2004-06-08 | 2011-10-19 | キヤノン株式会社 | 電位測定装置および画像形成装置 |
US20070059965A1 (en) * | 2005-09-13 | 2007-03-15 | Magna International Inc. | Method and apparatus for non-contact grounding detection in an electrostatic paint system |
KR100898584B1 (ko) * | 2007-09-10 | 2009-05-20 | 주식회사 하이닉스반도체 | 정전기 방전 회로 |
JP2009103683A (ja) * | 2007-10-01 | 2009-05-14 | Mitsubishi Electric Corp | 静電気帯電試験装置および静電気帯電試験方法 |
CN101533057A (zh) * | 2008-03-13 | 2009-09-16 | 安捷伦科技有限公司 | 用于测试电路导通性的装置和方法 |
KR101006097B1 (ko) * | 2008-11-10 | 2011-01-07 | 주식회사 하이닉스반도체 | 정전기 보호회로 |
-
2012
- 2012-11-14 JP JP2012250175A patent/JP6030926B2/ja active Active
-
2013
- 2013-10-15 CN CN201380059654.5A patent/CN104781681B/zh active Active
- 2013-10-15 DE DE112013005452.3T patent/DE112013005452T5/de not_active Withdrawn
- 2013-10-15 WO PCT/JP2013/077943 patent/WO2014077075A1/ja active Application Filing
-
2015
- 2015-05-12 US US14/710,021 patent/US9989577B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20150241502A1 (en) | 2015-08-27 |
US9989577B2 (en) | 2018-06-05 |
WO2014077075A1 (ja) | 2014-05-22 |
CN104781681A (zh) | 2015-07-15 |
JP2014098612A (ja) | 2014-05-29 |
DE112013005452T5 (de) | 2015-07-30 |
CN104781681B (zh) | 2017-09-08 |
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