JP5820886B2 - 走査プローブ顕微鏡 - Google Patents
走査プローブ顕微鏡 Download PDFInfo
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- JP5820886B2 JP5820886B2 JP2013537300A JP2013537300A JP5820886B2 JP 5820886 B2 JP5820886 B2 JP 5820886B2 JP 2013537300 A JP2013537300 A JP 2013537300A JP 2013537300 A JP2013537300 A JP 2013537300A JP 5820886 B2 JP5820886 B2 JP 5820886B2
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- probe microscope
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
- G01Q30/12—Fluid environment
- G01Q30/14—Liquid environment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
- G01Q60/06—SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/30—Scanning potential microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/653—Coherent methods [CARS]
- G01N2021/656—Raman microprobe
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
Description
前記制御装置により、前記振動子の前記探針位置を周期的に変位させるとともに、前記探針位置と前記探針に印加する交流電圧のタイミングを制御して培養液中の静電場分布計測の感度を最適化することを特徴とするものである。
神経シグナルの測定においては、試料3の表面と探針1の先端の距離を常に一定に保ちながら行う。神経シグナルは、電荷注入電極56により神経細胞に電荷を注入することにより神経細胞に生ずる電圧パルスである。神経シグナルの測定には、まず試料3に対して所定の電荷を注入することにより神経細胞に電圧パルスを印加する。このとき、電圧パルスの大きさは50μV〜100mV程度である。試料3の所望の位置に探針3を接触、または、接近させ、この電圧パルスを実施例5の走査プローブ顕微鏡により検出する。試料3の多点において電圧パルス計測を行い神経シグナルが伝達されているかを判断することにより、培養された神経細胞の不良箇所を特定することができる。
2 振動子
3 試料
4 配線
5 探針用電源
11 試料ホルダ
12 培養液注入口
13 培養液回収口
14 培養液(水、溶媒)
21 プリズム
22 第一のパルスレーザー光
23 第二のパルスレーザー光
24 出力光
25 フィルター付検出器
26 制御装置
31 走査機構
41 探針が光を遮らない幾何学的条件による出力光極大
42 探針増強効果による出力光極大
51 バイポテンショスタット
52 探針電極
53 試料電極
54 作用電極
55 参照電極
56 電荷注入電極
Claims (4)
- 探針と、試料を載置する試料ホルダと、前記探針の位置を変位させる振動子と、前記探針に印加される力を検出する検出部と、前記探針に交流電圧と直流電圧を印加する探針用電源と、前記試料ホルダを移動する走査機構と、制御装置とを備え、試料の表面の静電場力分布を計測する走査プローブ顕微鏡において、
前記制御装置により、前記振動子の前記探針位置を周期的に変位させるとともに、前記探針位置と前記探針に印加する交流電圧のタイミングを制御して培養液中の静電場分布計測の感度を最適化することを特徴とする走査プローブ顕微鏡。 - 請求項1記載の走査プローブ顕微鏡において、
前記試料ホルダは、培養液を保持・循環させる機能を有することを特徴とする走査プローブ顕微鏡。 - 請求項1記載の走査プローブ顕微鏡において、
前記試料は、前記培養液中で培養される生体分子・生体細胞・生体組織などの生体材料であることを特徴とする走査プローブ顕微鏡。 - 請求項1記載の走査プローブ顕微鏡において、
前記試料は、前記培養液中で培養される神経組織などの生体材料であり、前記試料の静電場分布は神経活動による神経シグナルであることを特徴とする走査プローブ顕微鏡。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2011/072812 WO2013051094A1 (ja) | 2011-10-03 | 2011-10-03 | 走査プローブ顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2013051094A1 JPWO2013051094A1 (ja) | 2015-03-30 |
JP5820886B2 true JP5820886B2 (ja) | 2015-11-24 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2013537300A Expired - Fee Related JP5820886B2 (ja) | 2011-10-03 | 2011-10-03 | 走査プローブ顕微鏡 |
Country Status (2)
Country | Link |
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JP (1) | JP5820886B2 (ja) |
WO (1) | WO2013051094A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018053483A1 (en) * | 2016-09-19 | 2018-03-22 | Zyvex Labs, Llc | Methods, devices, and systems for scanning tunneling microscopy control system design |
KR102619577B1 (ko) * | 2022-12-22 | 2023-12-29 | 포항공과대학교 산학협력단 | 탐침 증강 현미경의 분석 방법 및 탐침 증강 현미경 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6554539B2 (ja) * | 2015-05-15 | 2019-07-31 | オリンパス株式会社 | 原子間力顕微鏡の情報取得方法 |
FR3039280B1 (fr) * | 2015-07-22 | 2019-05-17 | Vmicro S.A.S | Sonde pour microscopie a force atomique a faible encombrement et microscope a force atomique comprenant une telle sonde |
CN112513648A (zh) * | 2018-05-25 | 2021-03-16 | 分子前景公司 | 用于针对样本改善光透导力的使用传感器分子的扫描探针显微镜 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4987284B2 (ja) * | 2005-11-10 | 2012-07-25 | エスアイアイ・ナノテクノロジー株式会社 | 液中用カンチレバーホルダ及び走査型プローブ顕微鏡 |
JP5091065B2 (ja) * | 2008-09-11 | 2012-12-05 | 日本電子株式会社 | 走査プローブ顕微鏡 |
JP5270280B2 (ja) * | 2008-09-19 | 2013-08-21 | 独立行政法人科学技術振興機構 | 近接場光学顕微鏡の信号光測定システム |
-
2011
- 2011-10-03 JP JP2013537300A patent/JP5820886B2/ja not_active Expired - Fee Related
- 2011-10-03 WO PCT/JP2011/072812 patent/WO2013051094A1/ja active Application Filing
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018053483A1 (en) * | 2016-09-19 | 2018-03-22 | Zyvex Labs, Llc | Methods, devices, and systems for scanning tunneling microscopy control system design |
KR102619577B1 (ko) * | 2022-12-22 | 2023-12-29 | 포항공과대학교 산학협력단 | 탐침 증강 현미경의 분석 방법 및 탐침 증강 현미경 |
Also Published As
Publication number | Publication date |
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WO2013051094A1 (ja) | 2013-04-11 |
JPWO2013051094A1 (ja) | 2015-03-30 |
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