JP4067991B2 - Printed circuit board continuity testing device with surface mount components - Google Patents

Printed circuit board continuity testing device with surface mount components Download PDF

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Publication number
JP4067991B2
JP4067991B2 JP2003061839A JP2003061839A JP4067991B2 JP 4067991 B2 JP4067991 B2 JP 4067991B2 JP 2003061839 A JP2003061839 A JP 2003061839A JP 2003061839 A JP2003061839 A JP 2003061839A JP 4067991 B2 JP4067991 B2 JP 4067991B2
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Japan
Prior art keywords
circuit board
component
fpc
inspection
printed circuit
Prior art date
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JP2003061839A
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Japanese (ja)
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JP2004273726A (en
Inventor
厨 真 澄 三
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Nippon Mektron KK
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Nippon Mektron KK
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  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、表面実装部品を搭載したプリント回路基板を導通検査する装置に係り、とくに検査のために部品実装状態の回路基板を局部的に撓ませるための装置に関する。
【0002】
【従来の技術】
プリント回路基板では、部品との接続不良を防止するために、検査装置を用いて導通検査を行っている。特許文献1は、その一例を示したものであり、検査すべきプリント回路基板における接続端子、スルーホールにスプリング付きの検査プローブを接触させて電気的に導電パターンの接続状態を検出する装置を開示している。
【0003】
そして、この検査方式を実現するために検査すべき接点に対応する多数の検査プローブを高精度に配列した検査ヘッドが設けられている。この検査ヘッドは、スタンド等により上下方向に往復移動可能に支持されており、この検査ヘッドを検査すべきプリント回路基板に接近させて検査プローブをプリント回路基板に接触させ、検査を行う。
【0004】
また、プリント回路基板に関しては、接続不良検査と別に、バーンイン検査と呼ばれる、所定の温度環境下での検査がある。この検査は、実装基板を恒温槽に装填して通電状態を検査するものである。そして、検査結果は、通電不良として検知されるだけであり、電子部品とプリント基板との半田付け不良に起因しているのか、電子部品が不良であるのかは特定できない。
【0005】
この対策として、特許文献2に記載されているように、実装基板が組み込まれた製品ケースを温度の高、低切替が可能な恒温槽に装填して応力印加を伴った通電検査を行う。すなわち、製品ケースに応力を印加して実装基板を製品ケースと共に反らせた状態で恒温槽の温度を高、低切り換えて通電検査を行い、通電不良の原因が電子部品、半田付けの何れの不良であるかを判定する。
【0006】
ここにおいて、検査対象がフレキシブルプリント回路基板(以下、単にFPCという。)である場合、FPCに検査プローブを押し当てることにより導通テストを行うと、不具合が生じることがある。つまり、FPCが撓んで逃げてしまい、検査プローブが正しい接触圧で当接しなかったり、検査プローブが回路パターンから外れてしまうことがある。
【0007】
このため、FPCを平坦にしかも逃げないように固定し得る治具と、この治具上のFPCに当接するように配された複数の検査プローブを持った検査ヘッドとを用意し、確実にFPCの検査を行うこととしている。
【0008】
図5および図6は、従来のこの種の検査装置の構成を示した側断面、およびその表面実装部品周りを示した拡大側断面を示している。
【0009】
そして図5に示すように、治具100は、上側板状部材11および下側板状部材12を有し、これら両板状部材11,12間に部品4が実装されたFPC5を挟み込む。下側板状部材12は、FPCを所定の位置に保持するための基板位置決めピン10もしくは図示しないざぐり部を有し、かつ検査プローブ2が貫通するための孔12aを有する。
【0010】
この下側板状部材12は、より上方に図示された上側板状部材11と組み合わされるもので、基板位置決めピン10を有し、この位置決めピン10の先端が上側板状部材11に設けられた凹部11aに係合することにより一対の板状部材11,12間にFPC5を挟持し、固定する。このとき、FPC5に取り付けられた部品4は、下側板状部材12に設けられた凹部12bに収容されるから、FPC5全体が一対の板状部材11,12間に挟持された状態となる。
【0011】
そして、板状部材12の下方から検査ヘッド3が昇降装置6によって押し上げられると、図6に示すように、検査プローブ2が板状部材12の貫通孔を通ってFPC5に当接され、FPC5が一対の板状部材11,12間に挟持されて導通テストが行われる。
【0012】
【特許文献1】
特開平4−95881号公報
【特許文献2】
特開2000−321315号公報
【0013】
【発明が解決しようとする課題】
上記した導通テストでは、検査プローブ2がFPC5に当接されると、FPC5の背後が上側板状部材11によって支持されているため、検査プローブ2の押圧力で一時的な接触状態が形成され、半田付け不良等が検出されない場合が生じる。
【0014】
本発明は、上述の点を考慮してなされたもので、半田接続が不完全な状態を確実に判定しうるプリント回路基板の導通検査装置を提供することを目的とする。
【0015】
【課題を解決するための手段】
上記目的達成のため、本願では、下記第1および第2の発明を提供する。
第1の発明は、
表面実装部品を搭載したプリント回路基板を挟持する手段と、前記回路基板およびこの回路基板に搭載、接続される部品に対して前記回路基板から引き離す方向に力が加わるように、前記回路基板の面に力を作用させる作用力付与手段と、前記作用力付与手段による力の作用下で、前記回路基板と前記部品との間の導通を判定する手段とをそなえた、表面実装部品を搭載したプリント回路基板の導通検査装置において、
前記作用力付与手段は、前記回路基板の背面を吸気することにより前記回路基板と前記部品との接続部を局部的に撓ませるようにした、
ことを特徴とする表面実装部品を搭載したプリント回路基板の導通検査装置、
である。
第2の発明は、
対向配置された一対の部材からなり、これら部材相互間に、表面実装部品を搭載した回路基板を挟持する回路基板保持機構と、
前記回路基板保持機構における一方の部材を介して前記回路基板における前記表面実装部品と接続した部分付近を局部的に吸引することにより撓ませる押圧機構と、
前記押圧機構により前記回路基板を局部的に押圧した状態で前記回路基板の端子を利用して前記回路基板と前記表面実装部品との接続部の接続状態を検査する検査手段と
をそなえた、表面実装部品を搭載したプリント回路基板の導通検査装置、
である。
【0016】
【発明の実施の形態】
図1は、本発明の参考例につき、その構成を示す断面図である。この図1に示すように、位置決めピン10が凹部11aに嵌入して上下に配されて位置合わせされる上側板状部材11と下側板状部材12との間に挟持されるFPC5には、表面実装部品4が取り付けられている。
【0017】
そして、この表面実装部品4を実装し半田付けした部分の背後(図示上側)にある上側板状部材11には、凹部11bが形成されている。この凹部11bがあるため、FPC5における部品4の背後に逃げ空間が生じ、FPC5に対して力が作用すると、撓むことになる。
【0018】
一方、検査ヘッド3には、部品4の半田付け部分に図示上方向の力を作用させるために、一対の押しピン9が設けられている。そして、この押しピン9の先端は、検査ヘッド支持部13が検査ヘッド3を図示上方に押し上げると、下側板状部材12に設けられた貫通孔12cを通って、FPC5の部品を半田付けした部分に力を作用させる。
【0019】
このとき、FPC5は、部品4の半田付けが不完全であると、上側板状部材1aの凹部11b内を逃げ空間として撓み変形することになる。そして、FPC5が変形するとき、FPC5の回路パターンは部品4と接続が断たれた状態にある訳であり、検査ヘッド3に設けられた検査プローブ2,2間も接続が断たれた状態になる筈であるから、半田付け不良による接続不完全が確実に検出される。
【0020】
図2は、図1の参考例における部品搭載部を拡大して示したものである。この図では、FPC5が押しピン9の図示上端で押されて、上方に屈曲した様子を誇張して描いている。
【0021】
ここでは、FPC5における押しピン9の上端で押された部分が図示上方に屈曲している。これは、FPC5と部品4の半田付け部分20との接続状態が不完全であり、その結果、図示左側端子6の半田付け部分20は接続が完全であってFPC5の屈曲はほんの僅かであるが、図示右側端子7の半田付け部分20は凹部11b内に向かって大きく上方に屈曲し、部品4と剥離した状態となっている。したがって、本来、部品4で接続されているべき回路パターンが不接続状態となっている。
【0022】
このように、半田付け不良による接続不完全がはっきりと露呈するため、検査ヘッドにより導通テストを行うと不導通状態が生じ、明確に不良判定することができる。
【0023】
図3は、本発明の第の実施例を示したもので、図2における板状部材12に設けられた押しピンに替えて、上側板状部材11の凹部11bに吸気式吸着機構8を組み込んでFPC5を吸着することにより、FPC5に負圧を与えてFPC5と部品4との接続状態を検知し得るように構成したものである。
【0024】
これにより、FPC5と部品4との接続が不完全であると、FPC5に対する吸気力の作用により、図示するように、FPC5が凹部11bに向かって屈曲する。この結果、部品4の図示右端でFPC5との接続が断たれる。そして、導通テストをすると、接続不完全であることが明確に検知される。
【0025】
図4は、本発明の第の実施例を示したもので、図3におけると同様の吸気機構を下側板状部材12に設け、FPC5に負圧を与えるようにしたものである。この場合は、吸気機構8の吸気作用力は部品4に作用する。そして、図示左側端子6の半田付け部分20は半田接合されているが、図示右側端子7の半田付け部分20は半田付けが不完全であるため、部品4は右側が垂れ下がった状態となっている。
【0026】
(変形例)
上記実施例では、FPC5における部品の接続部を吸気により負圧を作用させる場合を示したが、機械的な力でFPCを引っ張るとか、FPCにエアを吹き付けてFPCを屈曲させても同様に接続検査を行うことができる。
【0027】
【発明の効果】
本発明は上述のように、FPCに対して力を作用させながら導通テストを行うようにしたため、検査プローブを押し当ててもその押圧力でFPCに接続不完全な個所が一時的に接続されて接続状態が完全であるかのような誤った検査を防止することができ、不完全な接続を確実に検知することができる。
【図面の簡単な説明】
【図1】 本発明の参考例の構成を示す断面図。
【図2】 図1の要部を拡大して示した断面図。
【図3】 本発明に係る第1の実施例の要部を示す断面図。
【図4】 本発明に係る第2の実施例の要部を示す断面図。
【図5】 従来のFPC検査装置の構造を示す断面図。
【図6】 図5に示した構造の要部を示す断面図。
【符号の説明】
100 治具
11 上側板状部材
11a,11b 凹部
12 下側板状部材
12a,12c 貫通孔
12b 凹部
13 検査ヘッド支持部
2 検査プローブ
3 検査ヘッ
4 部品
5 FPC
,7 端子
8 吸気
9 押しピン
10 位置決めピン
20 半田付け部分
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an apparatus for inspecting continuity of a printed circuit board on which surface-mounted components are mounted, and more particularly to an apparatus for locally bending a circuit board in a component-mounted state for inspection.
[0002]
[Prior art]
In the printed circuit board, in order to prevent a connection failure with a component, a continuity test is performed using an inspection device. Japanese Patent Application Laid-Open No. H10-228561 shows an example of this, and discloses an apparatus for electrically detecting a connection state of a conductive pattern by bringing a test probe with a spring into contact with a connection terminal and a through hole in a printed circuit board to be inspected. is doing.
[0003]
And in order to implement | achieve this test | inspection system, the test | inspection head which arranged many test | inspection probes corresponding to the contact which should be test | inspected with high precision is provided. The inspection head is supported by a stand or the like so as to be able to reciprocate in the vertical direction. The inspection head is brought close to the printed circuit board to be inspected, and the inspection probe is brought into contact with the printed circuit board for inspection.
[0004]
In addition to the connection failure inspection, the printed circuit board includes an inspection under a predetermined temperature environment called a burn-in inspection. This inspection is to inspect the energized state by loading the mounting board in a thermostatic chamber. The inspection result is only detected as an energization failure, and it cannot be determined whether the electronic component is due to a soldering failure between the electronic component and the printed board or whether the electronic component is defective.
[0005]
As a countermeasure against this, as described in Patent Document 2, a product case in which a mounting substrate is incorporated is loaded into a thermostatic chamber capable of switching between high and low temperatures, and an energization inspection accompanied by stress application is performed. In other words, in a state where stress is applied to the product case and the mounting board is warped along with the product case, the temperature of the thermostatic chamber is switched between high and low, and an energization inspection is performed. Determine if there is.
[0006]
Here, when the inspection target is a flexible printed circuit board (hereinafter simply referred to as an FPC), a malfunction may occur when the continuity test is performed by pressing the inspection probe against the FPC. That is, the FPC may bend and escape, and the inspection probe may not come into contact with the correct contact pressure, or the inspection probe may be detached from the circuit pattern.
[0007]
For this reason, a jig that can fix the FPC flatly so as not to escape and an inspection head having a plurality of inspection probes arranged so as to come into contact with the FPC on the jig are prepared, and the FPC is surely provided. We are going to perform the inspection.
[0008]
5 and 6 show a side cross section showing the configuration of this type of conventional inspection apparatus and an enlarged side cross section showing the periphery of the surface-mounted component.
[0009]
As shown in FIG. 5, the jig 100 includes an upper plate member 11 and a lower plate member 12, and the FPC 5 on which the component 4 is mounted is sandwiched between the plate members 11 and 12. The lower plate-like member 12 has a board positioning pin 10 for holding the FPC in a predetermined position or a counterbore portion (not shown), and a hole 12a for the inspection probe 2 to pass therethrough.
[0010]
The lower plate-like member 12 is combined with the upper plate-like member 11 illustrated above, and has a substrate positioning pin 10, and the tip of the positioning pin 10 is a recess provided in the upper plate-like member 11. The FPC 5 is sandwiched and fixed between the pair of plate-like members 11 and 12 by engaging with 11a. At this time, since the component 4 attached to the FPC 5 is accommodated in the recess 12b provided in the lower plate-like member 12, the entire FPC 5 is sandwiched between the pair of plate-like members 11 and 12.
[0011]
When the inspection head 3 is pushed up by the lifting device 6 from below the plate-like member 12, the inspection probe 2 is brought into contact with the FPC 5 through the through-hole of the plate-like member 12 as shown in FIG. The continuity test is performed by being sandwiched between the pair of plate-like members 11 and 12.
[0012]
[Patent Document 1]
Japanese Patent Laid-Open No. 4-95881 [Patent Document 2]
JP 2000-321315 A
[Problems to be solved by the invention]
In the above-described continuity test, when the inspection probe 2 is brought into contact with the FPC 5, the back of the FPC 5 is supported by the upper plate member 11, so that a temporary contact state is formed by the pressing force of the inspection probe 2, In some cases, soldering failure or the like is not detected.
[0014]
The present invention has been made in consideration of the above-described points, and an object of the present invention is to provide a printed circuit board continuity inspection apparatus that can reliably determine an incomplete solder connection.
[0015]
[Means for Solving the Problems]
To achieve the above object, the present application provides the following first and second inventions.
The first invention is
Means for sandwiching a printed circuit board on which a surface mount component is mounted; and a surface of the circuit board so that a force is applied in a direction away from the circuit board with respect to the circuit board and a component mounted on and connected to the circuit board. A print mounted with a surface mount component, comprising: an action force applying means for applying a force to the surface; and a means for determining conduction between the circuit board and the component under the action of the force by the action force applying means. In circuit board continuity testing equipment ,
The acting force applying means is adapted to locally bend the connection portion between the circuit board and the component by sucking the back surface of the circuit board.
A continuity testing device for printed circuit boards equipped with surface mount components,
It is.
The second invention is
A circuit board holding mechanism comprising a pair of opposed members, and sandwiching a circuit board on which surface-mounted components are mounted, between these members;
A pressing mechanism that bends by locally sucking the vicinity of a portion of the circuit board that is connected to the surface mount component through one member of the circuit board holding mechanism;
A surface having inspection means for inspecting a connection state of a connection portion between the circuit board and the surface mounting component using a terminal of the circuit board in a state where the circuit board is locally pressed by the pressing mechanism. Printed circuit board continuity testing device with mounted components,
It is.
[0016]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 1 is a cross-sectional view showing the configuration of a reference example of the present invention. As shown in FIG. 1, the FPC 5 sandwiched between the upper plate member 11 and the lower plate member 12 in which the positioning pins 10 are inserted into the recesses 11a and are arranged vertically and aligned is provided on the surface. A mounting component 4 is attached.
[0017]
A concave portion 11b is formed in the upper plate member 11 behind (on the upper side in the drawing) the portion where the surface mount component 4 is mounted and soldered. Since there is this recess 11 b, a clearance space is created behind the component 4 in the FPC 5, and when the force acts on the FPC 5, the FPC 5 is bent.
[0018]
On the other hand, the inspection head 3 is provided with a pair of push pins 9 in order to apply a force in the upward direction to the soldered portion of the component 4. The tip of the push pin 9 is a part where the components of the FPC 5 are soldered through the through hole 12c provided in the lower plate member 12 when the inspection head support 13 pushes the inspection head 3 upward in the figure. Applying force to
[0019]
At this time, if the soldering of the component 4 is incomplete, the FPC 5 bends and deforms with the inside of the recess 11b of the upper plate member 1a as a relief space. When the FPC 5 is deformed, the circuit pattern of the FPC 5 is disconnected from the component 4, and the connection between the inspection probes 2 and 2 provided on the inspection head 3 is also disconnected. As a result, incomplete connection due to poor soldering is reliably detected.
[0020]
FIG. 2 is an enlarged view of the component mounting portion in the reference example of FIG. In this figure, the state in which the FPC 5 is pushed by the upper end of the push pin 9 and bent upward is exaggerated.
[0021]
Here, the portion of the FPC 5 that is pushed by the upper end of the push pin 9 is bent upward in the drawing. This is because the connection state between the FPC 5 and the soldered portion 20 of the component 4 is incomplete, and as a result, the soldered portion 20 of the left terminal 6 shown in the drawing is completely connected and the FPC 5 is bent only slightly. The soldered portion 20 of the right terminal 7 shown in the figure is bent upward largely toward the inside of the recess 11b and is separated from the component 4. Therefore, the circuit pattern that should originally be connected by the component 4 is in a disconnected state.
[0022]
In this way, incomplete connection due to poor soldering is clearly exposed, and when a continuity test is performed by the inspection head, a non-conducting state is generated, and a defective determination can be clearly made.
[0023]
FIG. 3 shows a first embodiment of the present invention. In place of the push pin provided on the plate-like member 12 in FIG. 2, the suction type suction mechanism 8 is provided in the concave portion 11 b of the upper plate-like member 11. By incorporating and adsorbing the FPC 5, a negative pressure is applied to the FPC 5 so that the connection state between the FPC 5 and the component 4 can be detected.
[0024]
Thus, if the connection between the FPC 5 and the component 4 is incomplete, the FPC 5 bends toward the recess 11b as shown in the figure due to the action of the intake force on the FPC 5. As a result, the connection with the FPC 5 is disconnected at the right end of the component 4 in the figure. When the continuity test is performed, it is clearly detected that the connection is incomplete.
[0025]
FIG. 4 shows a second embodiment of the present invention, in which an intake mechanism similar to that in FIG. 3 is provided in the lower plate member 12 so as to apply a negative pressure to the FPC 5. In this case, the intake acting force of the intake mechanism 8 acts on the component 4. The soldered portion 20 of the illustrated left terminal 6 is soldered, but the soldered portion 20 of the illustrated right terminal 7 is incompletely soldered, so that the component 4 is in a state where the right side hangs down. .
[0026]
(Modification)
In the above embodiment, although the case for applying a negative pressure by air suction connection of the component in the FPC 5, Toka pull the FPC in mechanical force, even by bending the FPC by blowing air into FPC same A connection test can be performed.
[0027]
【The invention's effect】
As described above, since the continuity test is performed while applying a force to the FPC as described above, an incomplete connection to the FPC is temporarily connected to the FPC even when the inspection probe is pressed. An erroneous inspection as if the connection state is complete can be prevented, and an incomplete connection can be reliably detected.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view showing a configuration of a reference example of the present invention.
FIG. 2 is an enlarged cross-sectional view showing a main part of FIG.
FIG. 3 is a cross-sectional view showing a main part of a first embodiment according to the present invention.
FIG. 4 is a sectional view showing a main part of a second embodiment according to the present invention.
FIG. 5 is a cross-sectional view showing the structure of a conventional FPC inspection apparatus.
6 is a cross-sectional view showing a main part of the structure shown in FIG. 5;
[Explanation of symbols]
100 jig 11 upper plate member 11a, 11b recess 12 the lower plate-like member 12a, 12c through-hole 12b recess 13 inspection head supporting portion 2 test probes 3 test heads 4 parts 5 FPC
6 and 7 terminals 8 Intake hole 9 Push pin 10 Positioning pin 20 Solder part

Claims (2)

表面実装部品を搭載したプリント回路基板を挟持する手段と、前記回路基板およびこの回路基板に搭載、接続される部品に対して前記回路基板から引き離す方向に力が加わるように、前記回路基板の面に力を作用させる作用力付与手段と、前記作用力付与手段による力の作用下で、前記回路基板と前記部品との間の導通を判定する手段とをそなえた、表面実装部品を搭載したプリント回路基板の導通検査装置において、
前記作用力付与手段は、前記回路基板の背面を吸気することにより前記回路基板と前記部品との接続部を局部的に撓ませるようにした、
ことを特徴とする表面実装部品を搭載したプリント回路基板の導通検査装置。
Means for sandwiching a printed circuit board on which a surface mount component is mounted; and a surface of the circuit board so that a force is applied in a direction away from the circuit board with respect to the circuit board and a component mounted on and connected to the circuit board. A print mounted with a surface mount component, comprising: an action force applying means for applying a force to the circuit; and a means for determining conduction between the circuit board and the component under the action of the force by the action force applying means. In a circuit board continuity testing device ,
The acting force applying means is configured to locally deflect the connection portion between the circuit board and the component by sucking the back surface of the circuit board.
A printed circuit board continuity testing device having surface mount components mounted thereon.
対向配置された一対の部材からなり、これら部材相互間に、表面実装部品を搭載した回路基板を挟持する回路基板保持機構と、
前記回路基板保持機構における一方の部材を介して前記回路基板における前記表面実装部品と接続した部分付近を局部的に吸引することにより撓ませる押圧機構と、
前記押圧機構により前記回路基板を局部的に押圧した状態で前記回路基板の端子を利用して前記回路基板と前記表面実装部品との接続部の接続状態を検査する検査手段と
をそなえた、表面実装部品を搭載したプリント回路基板の導通検査装置。
A circuit board holding mechanism that includes a pair of members disposed opposite to each other, and sandwiches a circuit board on which surface-mounted components are mounted, between these members;
A pressing mechanism that bends by locally sucking a portion of the circuit board that is connected to the surface-mounted component through one member of the circuit board holding mechanism;
A surface having inspection means for inspecting a connection state of a connection portion between the circuit board and the surface mounting component using a terminal of the circuit board in a state where the circuit board is locally pressed by the pressing mechanism. A continuity testing device for printed circuit boards with mounted components.
JP2003061839A 2003-03-07 2003-03-07 Printed circuit board continuity testing device with surface mount components Expired - Fee Related JP4067991B2 (en)

Priority Applications (1)

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JP2003061839A JP4067991B2 (en) 2003-03-07 2003-03-07 Printed circuit board continuity testing device with surface mount components

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Application Number Priority Date Filing Date Title
JP2003061839A JP4067991B2 (en) 2003-03-07 2003-03-07 Printed circuit board continuity testing device with surface mount components

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4659479B2 (en) * 2005-02-14 2011-03-30 日本メクトロン株式会社 Electrical inspection device for flexible printed circuit board
WO2016076671A1 (en) * 2014-11-13 2016-05-19 세종대학교산학협력단 Method and apparatus for testing flexible element
KR101675387B1 (en) * 2014-11-13 2016-11-29 세종대학교산학협력단 Method and apparatus for testing of flexible device

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