JP3259031B2 - Measurement result or analysis result projection apparatus and method - Google Patents
Measurement result or analysis result projection apparatus and methodInfo
- Publication number
- JP3259031B2 JP3259031B2 JP24286999A JP24286999A JP3259031B2 JP 3259031 B2 JP3259031 B2 JP 3259031B2 JP 24286999 A JP24286999 A JP 24286999A JP 24286999 A JP24286999 A JP 24286999A JP 3259031 B2 JP3259031 B2 JP 3259031B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- result
- optical axis
- analysis result
- sample
- Prior art date
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Description
【０００１】[0001]
【発明の属する技術分野】本発明は、試料の計測結果又
はそれを解析することによって得られる解析結果をその
試料に投影する計測結果又は解析結果投影装置及び方法
に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus and a method for projecting measurement results or analysis results obtained by analyzing a measurement result of a sample or an analysis result obtained by analyzing the measurement result on the sample.
【０００２】[0002]
【従来の技術】近年、テレビカメラを用いて撮影した試
料の形状や変形を計測する形状変形計測装置及び方法
が、例えば、本発明者による特開平１０−９６６０６号
公報や特開平１０−１０１８４８公報に記載されてい
る。そのような計測方法によって得られる計測結果は、
直接又は解析された後にモニタ上に表示され又はプリン
トアウトされる。2. Description of the Related Art In recent years, a shape deformation measuring apparatus and method for measuring the shape and deformation of a sample photographed using a television camera have been disclosed in, for example, JP-A-10-96606 and JP-A-10-101848 by the present inventor. It is described in. The measurement result obtained by such a measurement method is
Displayed on a monitor or printed out directly or after being analyzed.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、計測結
果又は解析結果をモニタ上に表示し又はプリントアウト
する従来の計測方法では、例えば、（１）比較的大きな
試料の場合、（２）動きのある試料の場合、（３）モニ
タ画面に移っている計測範囲において試料に起伏や境界
のような目印となる部分が少ない場合、例えば、大きな
タンクの一部分を計測範囲としている場合、平面に広が
っているシート状の物質や人間の皮膚の一部分を拡大し
て計測する場合、及び（４）検査対象物が次々と流れて
くるような工場内の検査場において検査作業者がモニタ
画面と試料の両方を監視することが困難な場合、解析結
果と実物との対応が観察者にとって困難なものとなる。However, in the conventional measurement method of displaying or printing out a measurement result or an analysis result on a monitor, for example, (1) in the case of a relatively large sample, (2) there is a movement. In the case of the sample, (3) the sample spreads on a plane when the sample has a small portion such as undulations or boundaries in the measurement range shifted to the monitor screen, for example, when a part of a large tank is used as the measurement range. In the case of measuring a sheet-like substance or a part of human skin by enlarging it, and (4) Inspection workers in the factory where inspection objects flow one after another, monitor both the monitor screen and the sample. When it is difficult to monitor, it is difficult for the observer to correspond the analysis result to the real thing.
【０００４】本発明の目的は、計測結果又は解析結果と
試料との対応が観察者にとって容易となる計測結果又は
解析結果投影装置及び方法を提供することである。An object of the present invention is to provide an apparatus and a method for projecting a measurement result or an analysis result in which a measurement result or an analysis result and a sample can be easily corresponded to an observer.
【０００５】[0005]
【課題を解決するための手段】本発明による計測結果又
は解析結果投影装置は、試料を計測する計測手段と、そ
の計測手段による計測結果を解析し又は保存するする解
析又は保存手段と、その解析又は保存手段による解析結
果又は計測結果を前記試料に投影する投影手段とを具
え、前記計測手段の光軸を、前記投影手段の光軸に一致
させたことを特徴とするものである。A measurement result or analysis result projection device according to the present invention comprises a measurement means for measuring a sample, an analysis or storage means for analyzing or storing the measurement result by the measurement means, and an analysis thereof. Or a projection unit for projecting an analysis result or a measurement result by the storage unit onto the sample, wherein an optical axis of the measurement unit is made to coincide with an optical axis of the projection unit.
【０００６】本発明によれば、解析又は保存手段が、計
測手段による計測結果を解析又は保存し、その解析結果
又は測定結果を、投影手段によって試料に投影する。こ
の際、計測手段の光軸を投影手段の光軸に一致させる。
このように解析結果又は保存結果を試料に投影すること
によって、解析結果又は測定結果と試料との対応が観察
者にとって容易となる。According to the present invention, the analyzing or storing means analyzes or stores the measurement result by the measuring means, and projects the analysis result or the measurement result onto the sample by the projecting means. At this time, the optical axis of the measuring means is made to coincide with the optical axis of the projecting means.
By projecting the analysis result or the storage result on the sample in this way, the correspondence between the analysis result or the measurement result and the sample becomes easy for the observer.
【０００７】好適には、前記計測手段の光軸を、ハーフ
ミラーによって前記投影手段の光軸に一致させる。[0007] Preferably, the optical axis of the measuring means is made coincident with the optical axis of the projecting means by a half mirror.
【０００８】本発明による計測結果又は解析結果投影方
法は、試料を計測する計測ステップと、この計測ステッ
プの計測結果を解析し又は保存する解析又は保存ステッ
プと、この解析又は保存ステップで解析された解析結果
又は保存された測定結果を前記試料に投影する投影ステ
ップとを具え、前記試料を計測する計測手段の光軸を、
前記解析結果を投影する投影手段の光軸に一致させるこ
とを特徴とするものである。According to the method for projecting a measurement result or an analysis result according to the present invention, a measurement step of measuring a sample, an analysis or storage step of analyzing or storing the measurement result of the measurement step, and an analysis performed by the analysis or storage step are performed. Projecting the analysis result or the stored measurement result onto the sample, and the optical axis of the measuring means for measuring the sample,
The analysis result is made to coincide with the optical axis of the projection means for projecting the analysis result.
【０００９】これによって、計測結果又は解析結果と試
料との対応が観察者にとって容易となり、好適には、前
記計測手段の光軸を、ハーフミラーによって前記投影手
段の光軸に一致させる。This makes it easier for the observer to associate the measurement result or the analysis result with the sample. Preferably, the optical axis of the measuring means is made coincident with the optical axis of the projecting means by a half mirror.
【００１０】[0010]
【発明の実施の形態】本発明による計測結果又は解析結
果投影装置及び方法を、図面を参照して詳細に説明す
る。なお、図面中同一部材には同一符号を付すものとす
る。図１は、本発明による計測結果又は解析結果投影装
置の実施の形態を示す図である。例えば計測装置や、形
状計測や、監視装置に適用することができるこの解析結
果投影装置は、試料１を撮影し及びその解析結果を投影
する計測及び投影部２と、計測及び投影部２によって計
測された結果を解析する計測結果解析部３と、この計測
結果解析部３からの制御信号又は投影格子画像に応答し
て試料１に格子画像を投影する格子投影用プロジェクタ
４とを具える。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A measurement result or analysis result projection apparatus and method according to the present invention will be described in detail with reference to the drawings. In the drawings, the same members are given the same reference numerals. FIG. 1 is a diagram showing an embodiment of a measurement result or analysis result projection device according to the present invention. This analysis result projection device, which can be applied to, for example, a measurement device, a shape measurement, and a monitoring device, measures a measurement and a projection unit 2 that photographs a sample 1 and projects the analysis result, and a measurement and a projection unit 2. A measurement result analysis unit 3 for analyzing the obtained result, and a grid projection projector 4 for projecting a grid image on the sample 1 in response to a control signal or a projection grid image from the measurement result analysis unit 3 are provided.
【００１１】計測及び投影部２は、計測部５と、投影部
６と、ハーフミラー７と、黒色の遮光板８と、光軸調整
部９とを有する。計測部５は、試料１を撮影する計測用
テレビカメラ５ａと、この計測用テレビカメラ５ａと光
軸の向きが一致するズームレンズ５ｂと、上下左右方向
のあおり量及びズーム量を調整できるように計測用テレ
ビカメラ５ａ及びズームレンズ５ｂが取り付けられたあ
おり調整機構付きカメラ・レンズ取付台５ｃと、ズーム
レンズ５ｂに取り付けられた赤外線透過フィルタ（可視
光が透過しないフィルタ）５ｄとを有する。投影部６
は、解析結果投影用プロジェクタ６ａと、それに取り付
けられた赤外線遮断フィルタ（可視光が通過するフィル
タ）６ｂとを有する。The measuring and projecting unit 2 includes a measuring unit 5, a projecting unit 6, a half mirror 7, a black light shielding plate 8, and an optical axis adjusting unit 9. The measuring unit 5 is configured to adjust the tilting amount and the zooming amount in the up, down, left, and right directions, a measuring television camera 5a for photographing the sample 1, a zoom lens 5b having the same optical axis as the measuring television camera 5a. It has a camera / lens mounting base 5c with a tilt adjustment mechanism to which the measurement television camera 5a and the zoom lens 5b are mounted, and an infrared transmission filter (a filter through which visible light is not transmitted) 5d mounted to the zoom lens 5b. Projection unit 6
Has an analysis result projection projector 6a and an infrared cutoff filter (a filter through which visible light passes) 6b attached to the projector 6a.
【００１２】ハーフミラー７は、計測用テレビカメラ５
ａ及びズームレンズ５ｂの光軸と解析結果投影用プロジ
ェクタ６ａの光軸とを一致させるように配置したもので
あり、その表面と裏面で２重写りの影響がでないよう
に、２重写りした場合のずれが１画素未満となるような
厚さを有する。ハーフミラー７と光路との関係を図２に
示す。図２において、ずれて撮影されない画像の光路を
実線で示すとともに、ずれて撮影される画像の光路を破
線で示す。これら実線の位置と破線の位置との相違は、
ハーフミラー７の厚さによって決定される。なお、図２
では赤外線透過フィルタ５ｄ及び赤外線遮断フィルタ６
ｂを省略している。The half mirror 7 is a television camera 5 for measurement.
a and the optical axis of the zoom lens 5b and the optical axis of the analysis result projecting projector 6a are arranged so as to be coincident with each other. Is less than one pixel. FIG. 2 shows the relationship between the half mirror 7 and the optical path. In FIG. 2, the optical path of an image that is not shifted and photographed is indicated by a solid line, and the optical path of an image that is shifted and photographed is indicated by a broken line. The difference between these solid and broken line positions is
It is determined by the thickness of the half mirror 7. Note that FIG.
Then, the infrared transmission filter 5d and the infrared cutoff filter 6
b is omitted.
【００１３】遮光板８は、図３に示すように計測用テレ
ビカメラ５ａのレンズ面に対して所定の角度θだけ傾斜
させて計測及び投影部２（図１）に取り付けられ、解析
結果投影用プロジェクタ６ａから投影された画像のうち
のハーフミラー７によって反射される成分を吸収し、か
つ、外部からハーフミラー７を透過して計測用テレビカ
メラ５ａに入射する光を遮断する。遮光板８をこのよう
な角度θをつけて取り付けることによって、解析結果投
影用プロジェクタ６ａから投影された画像のうちのハー
フミラー７によって反射される成分のうち、遮光板８で
反射される成分が、計測用テレビカメラ５ａに入射する
のを防止する。図３においても赤外線透過フィルタ５ｄ
及び赤外線遮断フィルタ６ｂを省略している。The light shielding plate 8 is attached to the measurement and projection unit 2 (FIG. 1) at a predetermined angle θ with respect to the lens surface of the measurement television camera 5a as shown in FIG. It absorbs the component reflected by the half mirror 7 of the image projected from the projector 6a, and blocks the light transmitted through the half mirror 7 from the outside and entering the measurement television camera 5a. By attaching the light-shielding plate 8 at such an angle θ, of the components reflected by the half mirror 7 in the image projected from the analysis result projection projector 6a, the component reflected by the light-shielding plate 8 becomes To prevent the light from entering the measuring television camera 5a. Also in FIG. 3, the infrared transmission filter 5d
And the infrared cutoff filter 6b is omitted.
【００１４】光軸調整部９は、計測用テレビカメラ５ａ
の光軸と解析結果投影用プロジェクタ６ａの光軸が画素
単位で一致するように光軸及び拡大率の調整を行うもの
であり、水平方向に並んだ２個のレーザポインタ９ａ，
９ｂを有する。なお、光軸調整部９による光軸調整につ
いては後に説明する。また、格子投影用プロジェクタ４
には赤外線透過フィルタ１０が取り付けられる。The optical axis adjusting unit 9 includes a measuring television camera 5a.
The optical axis and the enlargement ratio are adjusted so that the optical axis of the projector 6a and the optical axis of the analysis result projection projector 6a coincide with each other in pixels, and two laser pointers 9a,
9b. The optical axis adjustment by the optical axis adjustment unit 9 will be described later. Also, the grid projection projector 4
Is provided with an infrared transmission filter 10.
【００１５】本実施の形態の動作を、主に図１を用いて
説明する。先ず、計測結果解析部３から制御信号又は投
影格子画像を格子投影用プロジェクタ４に供給すること
によって、格子投影用プロジェクタ４から投影格子画像
を試料１に投影し、その画像を計測用テレビカメラ５ａ
で撮影することによって形状計測を行う。この際に行わ
れる形状計測方法として、例えば、上記特開平１０−９
６６０６号公報や特開平１０−１０１８４８公報に記載
された形状計測方法を挙げることができる。The operation of this embodiment will be described mainly with reference to FIG. First, by supplying a control signal or a projection grid image from the measurement result analysis unit 3 to the grid projection projector 4, the projection grid image is projected from the grid projection projector 4 onto the sample 1, and the image is transmitted to the measurement television camera 5a.
The shape is measured by photographing with. As a shape measuring method performed at this time, for example, Japanese Patent Application Laid-Open No.
The shape measuring method described in Japanese Patent Application Laid-Open No. 6606 and Japanese Patent Application Laid-Open No. 10-101848 can be used.
【００１６】計測部５によって計測された計測結果の画
像は、計測結果解析部３に供給され、計測結果解析部３
は、この計測結果の画像に基づいて試料１の形状又は変
形の解析を行い、その結果得られた解析結果の画像を解
析結果投影用プロジェクタ６ａに供給する。解析結果投
影用プロジェクタ６ａは、解析結果の画像を試料１に投
影する。なお、後に説明する光軸調整を行うことによっ
て計測部５による計測点と投影部６による撮影点が一致
し、実際の試料１の上に計測結果が投影される。これに
よって、解析結果が表示されるモニタ上の点の位置が実
際の試料のどの点に対応するのか判断しにくい場合で
も、解析結果の画像と試料との対応が観察者にとって容
易となる。なお、格子投影用プロジェクタ４からは赤外
線の格子が投影されるため、観察者には解析結果の画像
だけが見えることになる。The image of the measurement result measured by the measurement unit 5 is supplied to the measurement result analysis unit 3, and the measurement result analysis unit 3
Analyzes the shape or deformation of the sample 1 based on the image of the measurement result, and supplies the analysis result image obtained as a result to the analysis result projection projector 6a. The analysis result projection projector 6a projects an image of the analysis result on the sample 1. Note that by performing the optical axis adjustment described later, the measurement point by the measurement unit 5 and the imaging point by the projection unit 6 match, and the measurement result is projected on the actual sample 1. Thereby, even when it is difficult to determine which point on the monitor at which the analysis result is displayed corresponds to the actual point of the sample, the observer can easily associate the image of the analysis result with the sample. Since the grid of the infrared ray is projected from the grid projection projector 4, the observer can see only the image of the analysis result.
【００１７】図４は、解析結果を試料に投影した例を示
す図である。この場合、平成１１年６月２５日に出願し
た本発明者による特願平１１−１７９９５０号に記載さ
れたリアルタイム形状変形計測方法を用いて人体の形状
計測を行い、その解析結果を人体上に投影したものであ
る。なお、解析結果として、計測用テレビカメラ方向の
距離の分布を等高線の位相（濃淡の繰り返し）として表
現している。FIG. 4 is a diagram showing an example in which the analysis result is projected on a sample. In this case, the shape of a human body is measured using the real-time shape deformation measuring method described in Japanese Patent Application No. 11-179950 filed on June 25, 1999 by the present inventors, and the analysis result is displayed on the human body. It is a projection. As a result of the analysis, the distribution of the distance in the direction of the measurement television camera is expressed as the phase of the contour line (repetition of shading).
【００１８】次に、光軸調整部による光軸調整を、図５
及び６を用いて説明する。図５において、試料の位置に
平面のスクリーン１１を配置し、赤外線通過フィルタ５
ｄ（図１）を取り外して、解析結果投影用プロジェクタ
６ａの映像を計測用カメラ５ａによって撮影できるよう
にする。レーザポインタ９ａ，９ｂがそれぞれスクリー
ン１１を照射することによってマークを付ける。その映
像は計測用テレビカメラ５ａによって撮影され、撮影さ
れた映像は、解析結果投影用プロジェクタ６ａに直接供
給され、解析結果撮影用プロジェクタ６ａがその映像を
スクリーン１１に投影する。投影されたマークの画像
は、再び計測用カメラ５ａによって撮影され、解析結果
投影用プロジェクタ６ａによって再びスクリーン１１上
に投影される。Next, the optical axis adjustment by the optical axis adjusting unit is described with reference to FIG.
This will be described with reference to FIGS. In FIG. 5, a flat screen 11 is arranged at the position of the sample,
By removing d (FIG. 1), the image of the analysis result projection projector 6a can be photographed by the measurement camera 5a. The laser pointers 9a and 9b irradiate the screen 11 to make marks. The image is photographed by the measuring television camera 5a, and the photographed image is directly supplied to the analysis result projecting projector 6a, and the analysis result photographing projector 6a projects the image on the screen 11. The projected image of the mark is captured again by the measuring camera 5a, and is again projected on the screen 11 by the analysis result projector 6a.
【００１９】これら操作を繰り返すと、そのマークの位
置において計測用テレビカメラ５ａの撮影画素と解析結
果投影用プロジェクタ６ａの投影画素の光軸（位置）が
一致していない場合には、投影されたマークは、最初の
点からずれた位置に投影され、点列が発生する。したが
って、マークの位置と投影された画像の位置を一致させ
て点列を消失させることによって、マークの位置におい
て解析結果投影用プロジェクタ６ａの画素の光軸と計測
用カメラ５ａの画素の光軸が一致することになる。光軸
調整点、画像及び調整箇所の関係を示す図を図６に示
す。When these operations are repeated, when the optical axis (position) of the pixel of the measurement television camera 5a does not coincide with the projection pixel of the analysis result projection projector 6a at the position of the mark, the image is projected. The mark is projected at a position shifted from the first point, and a point sequence is generated. Therefore, by aligning the position of the mark with the position of the projected image to eliminate the point sequence, the optical axis of the pixel of the analysis result projection projector 6a and the optical axis of the pixel of the measurement camera 5a at the mark position. Will match. FIG. 6 shows a relationship between the optical axis adjustment point, the image, and the adjustment location.
【００２０】計測用テレビカメラ５ａの画素間隔の縦横
比と解析結果投影用プロジェクタ６ａの画素間隔の縦横
比が同一の場合、２点以上のマークについて上記方法を
用いて点列が表示されないように光軸調整を行うことに
よって、結果的には全ての画素において解析結果投影用
プロジェクタ６ａの投影線と計測用テレビカメラ５ａが
撮影する視線が一致する。When the aspect ratio of the pixel interval of the measuring television camera 5a and the aspect ratio of the pixel interval of the analysis result projection projector 6a are the same, the point sequence is not displayed for two or more marks using the above method. As a result of performing the optical axis adjustment, the projection line of the analysis result projection projector 6a and the line of sight captured by the measurement television camera 5a coincide with each other in all pixels.
【００２１】このようにレーザポインタ９ａ，９ｂによ
って、光軸調整を容易に行うことができる。As described above, the optical axis can be easily adjusted by the laser pointers 9a and 9b.
【００２２】本発明は、上記実施の形態に限定されるも
のではなく、幾多の変更及び変形が可能である。例え
ば、計測結果解析部の代わりに画像メモリやビデオのよ
うな計測画像保存部を用い、時間差をもたせて計測した
結果を表示することもできる。The present invention is not limited to the above-described embodiment, and many modifications and variations are possible. For example, instead of the measurement result analysis unit, a measurement image storage unit such as an image memory or a video may be used to display a measurement result with a time difference.
【００２３】形状測定や変形測定だけでなく、温度分布
の計測のようにカメラを用いて分布を計測する場合にも
本発明を適用することができる。また、有限要素法など
と組み合わせることによって、形状変形計測結果を使用
した応力分布などの解析を行った結果を試料上に投影す
ることもできる。The present invention can be applied not only to shape measurement and deformation measurement but also to measurement of distribution using a camera, such as measurement of temperature distribution. In addition, by combining with a finite element method or the like, it is possible to project a result of analyzing a stress distribution or the like using a shape deformation measurement result on a sample.
【００２４】さらに、ハーフミラーを使用することなく
計測用カメラと解析結果投影用プロジェクタとを並べて
これらの光軸を一致させることもできる。Further, the measuring camera and the analysis result projecting projector can be arranged side by side without using a half mirror so that their optical axes coincide with each other.
【図１】 本発明による解析結果投影装置の実施の形態
を示す図である。FIG. 1 is a diagram showing an embodiment of an analysis result projection device according to the present invention.
【図２】 ハーフミラーと光路との関係を示す図であ
る。FIG. 2 is a diagram showing a relationship between a half mirror and an optical path.
【図３】 遮光板の配置を示す図である。FIG. 3 is a diagram showing an arrangement of a light shielding plate.
【図４】 解析結果を試料に投影した例を示す図であ
る。FIG. 4 is a diagram showing an example in which an analysis result is projected on a sample.
【図５】 光軸調整を説明するための図である。FIG. 5 is a diagram for explaining optical axis adjustment.
【図６】 光軸調整の際の調整点、画像及び調整箇所の
関係を示す図である。FIG. 6 is a diagram showing a relationship between an adjustment point, an image, and an adjustment portion when adjusting the optical axis.
【符号の説明】 １ 試料 ２ 計測及び投影部 ３ 計測結果解析部 ４ 格子投影用プロジェクタ ５ 計測部 ５ａ 計測用テレビカメラ ５ｂ ズームレンズ ５ｃ あおり調整機構付きカメラ・レンズ取付台 ５ｄ 赤外線透過フィルタ ６ 撮影部 ６ａ 解析結果投影用プロジェクタ ６ｂ，１０ 赤外線遮断フィルタ ７ ハーフミラー ８ 遮光板 ９ 光軸調整部 ９ａ，９ｂ レーザポインタ １１ スクリーン[Description of Signs] 1 Sample 2 Measurement and projection unit 3 Measurement result analysis unit 4 Grid projection projector 5 Measurement unit 5a Measurement TV camera 5b Zoom lens 5c Camera / lens mount with tilt adjustment mechanism 5d Infrared transmission filter 6 Imaging unit 6a Analysis result projection projector 6b, 10 Infrared cutoff filter 7 Half mirror 8 Shield plate 9 Optical axis adjustment unit 9a, 9b Laser pointer 11 Screen
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平８−280710（ＪＰ，Ａ) 特開 平11−25262（ＪＰ，Ａ) 特開 平６−292008（ＪＰ，Ａ) 特開 平８−68673（ＪＰ，Ａ) (58)調査した分野(Int.Cl.7，ＤＢ名) G01D 7/00 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-8-280710 (JP, A) JP-A-11-25262 (JP, A) JP-A-6-292008 (JP, A) JP-A-8-280 68673 (JP, A) (58) Field surveyed (Int. Cl. 7 , DB name) G01D 7/00
Claims (4)
段による計測結果を解析し又は保存するする解析又は保
存手段と、その解析又は保存手段による解析結果又は計
測結果を前記試料に投影する投影手段とを具え、前記計
測手段の光軸を、前記投影手段の光軸に一致させたこと
を特徴とする計測結果又は解析結果投影装置。1. A measuring means for measuring a sample, an analyzing or storing means for analyzing or storing a measurement result by the measuring means, and a projection for projecting an analysis result or a measuring result by the analyzing or storing means on the sample. Means for projecting a measurement result or an analysis result, wherein the optical axis of the measuring means is made coincident with the optical axis of the projecting means.
よって前記投影手段の光軸に一致させたことを特徴とす
る請求項１記載の計測結果又は解析結果投影装置。2. The measurement result or analysis result projection device according to claim 1, wherein the optical axis of said measuring means is made coincident with the optical axis of said projecting means by a half mirror.
測ステップの計測結果を解析し又は保存する解析又は保
存ステップと、この解析又は保存ステップで解析された
解析結果又は保存された測定結果を前記試料に投影する
投影ステップとを具え、前記試料を計測する計測手段の
光軸を、前記解析結果を投影する投影手段の光軸に一致
させることを特徴とする計測結果又は解析結果投影方
法。3. A measurement step of measuring a sample, an analysis or storage step of analyzing or storing the measurement result of the measurement step, and an analysis result or a stored measurement result analyzed in the analysis or storage step. A projecting step of projecting onto the sample, wherein the optical axis of the measuring means for measuring the sample is made coincident with the optical axis of the projecting means for projecting the analysis result.
よって前記投影手段の光軸に一致させることを特徴とす
る請求項３記載の計測結果又は解析結果投影方法。4. The measurement result or analysis result projection method according to claim 3, wherein an optical axis of said measuring means is made to coincide with an optical axis of said projecting means by a half mirror.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24286999A JP3259031B2 (en) | 1999-08-30 | 1999-08-30 | Measurement result or analysis result projection apparatus and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24286999A JP3259031B2 (en) | 1999-08-30 | 1999-08-30 | Measurement result or analysis result projection apparatus and method |
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| Publication Number | Publication Date |
|---|---|
| JP2001066158A JP2001066158A (en) | 2001-03-16 |
| JP3259031B2 true JP3259031B2 (en) | 2002-02-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24286999A Expired - Lifetime JP3259031B2 (en) | 1999-08-30 | 1999-08-30 | Measurement result or analysis result projection apparatus and method |
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Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4552484B2 (en) * | 2004-03-31 | 2010-09-29 | ブラザー工業株式会社 | Image input / output device |
| JP4552485B2 (en) * | 2004-03-31 | 2010-09-29 | ブラザー工業株式会社 | Image input / output device |
| WO2005096126A1 (en) | 2004-03-31 | 2005-10-13 | Brother Kogyo Kabushiki Kaisha | Image i/o device |
| US9879976B2 (en) | 2010-01-20 | 2018-01-30 | Faro Technologies, Inc. | Articulated arm coordinate measurement machine that uses a 2D camera to determine 3D coordinates of smoothly continuous edge features |
| US9607239B2 (en) | 2010-01-20 | 2017-03-28 | Faro Technologies, Inc. | Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations |
| US9628775B2 (en) | 2010-01-20 | 2017-04-18 | Faro Technologies, Inc. | Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations |
| DE102010007449B4 (en) * | 2010-02-10 | 2013-02-28 | Siemens Aktiengesellschaft | Arrangement and method for evaluating a test object by means of active thermography |
| GB2478903A (en) * | 2010-02-24 | 2011-09-28 | Brian Michael Harper | A combined infra-red camera/image projector viewing system for heat emission visualisation. |
| DE102010014744B4 (en) * | 2010-04-13 | 2013-07-11 | Siemens Aktiengesellschaft | Apparatus and method for projecting information onto an object in thermographic surveys |
| JP2013539541A (en) * | 2010-09-08 | 2013-10-24 | ファロ テクノロジーズ インコーポレーテッド | Laser scanner or laser tracking device having a projector |
| JP4908642B1 (en) * | 2011-04-14 | 2012-04-04 | 昌治 井上 | Waveform observation system |
| DE102011089856A1 (en) * | 2011-12-23 | 2013-06-27 | Siemens Aktiengesellschaft | Inspection of a test object |
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1999
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| JP2001066158A (en) | 2001-03-16 |
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