JP3128973B2 - Temperature measurement device - Google Patents
Temperature measurement deviceInfo
- Publication number
- JP3128973B2 JP3128973B2 JP04219508A JP21950892A JP3128973B2 JP 3128973 B2 JP3128973 B2 JP 3128973B2 JP 04219508 A JP04219508 A JP 04219508A JP 21950892 A JP21950892 A JP 21950892A JP 3128973 B2 JP3128973 B2 JP 3128973B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- relay
- measured
- switching
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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- Monitoring And Testing Of Nuclear Reactors (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本発明は、無停電電源装置等の半
導体応用製品の温度を監視する温度計測装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature measuring device for monitoring the temperature of a semiconductor application product such as an uninterruptible power supply.
【０００２】[0002]
【従来の技術】図１はインバータ装置の温度計測装置を
示す。2. Description of the Related Art FIG. 1 shows a temperature measuring device for an inverter device.
【０００３】図１において、Ｔｈ1，Ｔｈ2，Ｔｈ3はイ
ンバータ装置の順変換部１，直流リアクトル部２，逆変
換部３に設けられたサーミスタ、ｒｙ1〜ｒｙ3は順次所
定の間隔で動作するリレーＲＹ1〜ＲＹ3の接点、４は絶
縁アンプ。In FIG. 1, Th 1 , Th 2 , and Th 3 are thermistors provided in the forward converter 1, DC reactor 2, and inverse converter 3 of the inverter device, and ry 1 to ry 3 are sequentially arranged at predetermined intervals. contact of the relay RY 1 to Ry 3 operating, the isolation amplifier 4.
【０００４】５は温度を監視するマイクロコンピュータ
からなるデジタル回路、６はデジタル回路で制御され前
記リレーＲＹ1〜ＲＹ3の駆動用トランジスタＴｒ1〜Ｔ
ｒ3のベースを駆動するリレードライブ回路である。[0004] Digital circuit 5 comprising a microcomputer for monitoring the temperature, the driving transistor Tr 1 in 6 is controlled by a digital circuit the relay RY 1 ~RY 3 ~T
a relay drive circuit for driving the base of r 3.
【０００５】デジタル回路５は設定された順変換部、直
流リアクトル部、逆変換部の温度危険値Ｔ1＊，Ｔ2＊，
Ｔ3＊と、リレー接点ｒｙ1〜ｒｙ3及び絶縁アンプ４を
介して順次入力するサーミスタＴｈ1〜Ｔｈ3からの温度
信号Ｔ1〜Ｔ3をＤ／Ａ変換器５１でデジタル値に変換
し、Ｔn＊とＴn（ただしｎ＝１，２，３）とを順次比較
して温度監視をすると共に、リレードライブ回路６を介
してリレーＲＹ1〜ＲＹ3を所定時間△ｔ（＝数十秒〜数
分）間隔で制御するようになっている。[0005] The digital circuit 5 includes temperature danger values T 1 *, T 2 *, and T d * for the set forward converter, DC reactor, and inverse converter.
The D / A converter 51 converts T 3 * and the temperature signals T 1 to T 3 from the thermistors Th 1 to Th 3 sequentially input via the relay contacts ry 1 to ry 3 and the insulating amplifier 4 to digital values. , T n * and T n (where n = 1, 2, 3) are sequentially monitored to monitor the temperature, and the relays RY 1 to RY 3 are activated via the relay drive circuit 6 for a predetermined time Δt (= number). It is controlled at intervals of ten seconds to several minutes).
【０００６】[0006]
【発明が解決しようとする課題】上記従来の温度計測装
置は、リレーで測定点を一定周期で切換えてＡ／Ｄ変換
し、デジタル回路で測定する構成となっているので、次
のような問題がある。The above-mentioned conventional temperature measuring apparatus has a configuration in which a measuring point is switched at a fixed cycle by a relay, A / D converted, and measured by a digital circuit. There is.
【０００７】(1)温度計測点切換に用いているリレーの
寿命の関係で短い時間間隔での切換には適しない。(1) It is not suitable for switching at short time intervals due to the life of the relay used for switching the temperature measurement point.
【０００８】(2)過負荷等によりインバータ装置等の内
部に急な温度変化が生ずる場合があるが、このような場
合長い時間間隔で温度測定点を切換えていたのでは異常
の検知が間に合わない。(2) A sudden temperature change may occur inside the inverter device or the like due to an overload or the like. In such a case, if the temperature measurement points are switched at long time intervals, the detection of an abnormality cannot be made in time. .
【０００９】(3)従来装置は常時一定時間間隔でリレー
による温度測定点切換を行っているので、リレーの寿命
を一定以上に保つと共に異常温度計測の時間間隔を短く
することはできない。(3) In the conventional device, the temperature measurement points are always switched by the relay at fixed time intervals. Therefore, the life of the relay cannot be kept longer than a certain value and the time interval of the abnormal temperature measurement cannot be shortened.
【００１０】本発明は、従来のこのような問題点に鑑み
てなされたもので、その目的とするところは、通常は温
度計測点のリレー切換を長い周期で行いリレーの寿命を
長く保ち、計測温度が危険温度を越えたときはリレー切
換を短い周期で行い急変する温度を確実に計測する温度
計測装置を提供することにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to normally perform a relay switching of a temperature measuring point at a long cycle so as to maintain the life of the relay for a long time. It is an object of the present invention to provide a temperature measuring device that performs relay switching in a short cycle when a temperature exceeds a dangerous temperature and reliably measures a rapidly changing temperature.
【００１１】[0011]
【課題を解決するための手段】上記目的を達成するため
に、本発明における温度計測装置は、各温度検出部に設
けられた各温度検出素子と、この各温度検出素子からの
各部温度信号をサンプリングする各リレーと、このサン
プリングされた各温度信号と各温度計測部の温度危険値
が入力し各温度信号から各計測温度を求めると共に前記
各リレーを順次制御するデジタル回路からなる温度計測
装置において、前記デジタル回路が計測温度と温度危険
値とを比較し、計測温度が温度危険値以下のときは前記
各リレーを長い期間で切換え、計測温度か温度危険値を
越えたとき前記各リレーを短い期間で切換えるリレー切
換信号の設定を行うようにしたものである。In order to achieve the above object, a temperature measuring apparatus according to the present invention comprises: a temperature detecting element provided in each temperature detecting section; and a temperature signal of each section from each temperature detecting element. In a temperature measuring device comprising a relay to be sampled, a digital circuit which receives each sampled temperature signal and a temperature danger value of each temperature measuring section, obtains each measured temperature from each temperature signal, and sequentially controls each relay. The digital circuit compares the measured temperature with the dangerous temperature value, and when the measured temperature is equal to or lower than the dangerous temperature value, switches each relay over a long period of time, and when the measured temperature exceeds the dangerous temperature value, shortens each relay. A relay switching signal for switching over a period is set.
【００１２】[0012]
【作用】各温度検出部に設けられた各温度検出素子から
の各部温度信号はデジタル回路で制御される各リレーに
よりサンプリングされて順次デジタル回路に入る。The respective temperature signals from the respective temperature detecting elements provided in the respective temperature detecting sections are sampled by the respective relays controlled by the digital circuit and sequentially input to the digital circuit.
【００１３】デジタル回路は入力する温度信号をデジタ
ル変換し、温度計測し、温度危険値と比較して計測温度
が温度危険値以下のときは各リレーを長い期間で切換え
るリレー切換の設定を行う。The digital circuit converts the input temperature signal into a digital signal, measures the temperature, compares the measured temperature signal with the dangerous temperature value, and sets a relay switching for switching each relay for a long period when the measured temperature is equal to or less than the dangerous temperature value.
【００１４】このためデジタル回路で制御される各リレ
ーは長い期間で切換えられ前記各温度信号を長い期間で
サンプリングする。従ってリレーの寿命は長く保たれ
る。Therefore, each relay controlled by the digital circuit is switched over for a long period of time, and samples each of the temperature signals over a long period. Therefore, the life of the relay is kept long.
【００１５】計測温度が温度危険値を越えると各リレー
を短い期間で切換えるリレー切換の設定を行う。このた
め各リレーは短い期間で切換えられ前記各温度信号を短
い期間でサンプリングする。When the measured temperature exceeds the dangerous temperature value, a relay switching setting for switching each relay in a short period is performed. For this reason, each relay is switched in a short period, and samples each of the temperature signals in a short period.
【００１６】従って温度が急変しても、短いサンプリン
グ期間で計測することができるので、温度の急変を確実
に監視することが可能となる。Therefore, even if the temperature changes suddenly, the measurement can be performed in a short sampling period, so that the sudden change in the temperature can be surely monitored.
【００１７】[0017]
【実施例】本発明の実施例を図面を参照して説明する。An embodiment of the present invention will be described with reference to the drawings.
【００１８】本発明は、従来の技術で説明した図１の温
度計測装置におけるデジタル回路５を図２に示すフロー
で動作するように構成したものである。よって図１につ
いて重複する説明は省略する。According to the present invention, the digital circuit 5 in the temperature measuring apparatus of FIG. 1 described in the prior art is configured to operate according to the flow shown in FIG. Therefore, a duplicate description of FIG. 1 will be omitted.
【００１９】図１，図２について、 (1)温度正の場合 先ず、デジタル回路５において出力ポート５４にリレー
切換信号が出力される（Ｓ１）。これによりリレードラ
イブ回路６，トランジスタＴｒn（ｎ：１，２，３）を
介してリレーＲＹnが付勢され、その接点ｒｙnが閉じ
る。Referring to FIGS. 1 and 2, (1) When the temperature is positive First, the digital circuit 5 outputs a relay switching signal to the output port 54 (S1). Thus the relay drive circuit 6, the transistor Tr n (n: 1,2,3) is biased relay RY n via a its contacts ry n is closed.
【００２０】しかしてサーミスタＴｒnからの温度（信
号）Ｔnが接点ｒｙn絶縁アンプ４を介してデジタル回路
５のＡ／Ｄ変換器５１でデジタル信号となり、ＣＰＵ５
２で温度が計測され、メモリ５３に記憶されているその
温度計測点の温度危険値Ｔn＊と比較されＴn≧Ｔn＊の
判断をする（Ｓ２，Ｓ３）。[0020] Thus becomes a digital signal by an A / D converter 51 of the digital circuit 5 temperature from the thermistor Tr n (signal) T n via the contact ry n isolation amplifier 4, CPU 5
The temperature is measured at 2, and the temperature is compared with the dangerous temperature value T n * of the temperature measurement point stored in the memory 53 to determine T n ≧ T n * (S2, S3).
【００２１】この場合、Ｔn≧Ｔn＊はＮＯであるので、
温度危険フラグ（ｎ）をリセットし他の温度計測点の危
険フラグのセットの有無を判断する（Ｓ４，Ｓ５）。In this case, since T n ≧ T n * is NO,
The temperature danger flag (n) is reset, and it is determined whether a danger flag has been set for another temperature measurement point (S4, S5).
【００２２】この場合、他の温度計測点の危険フラグセ
ットはＮＯであるので、サンプリング時間（割込時間）
△ｔ1セットの処理を行う（Ｓ６）。In this case, since the danger flag set for other temperature measurement points is NO, the sampling time (interruption time)
Δt One set of processing is performed (S6).
【００２３】これにより出力ポート５４からリレードラ
イブ回路６へリレー切換信号が出力されリレーＲＹnが
切換えられると共に、リターンによりスタートに戻り次
の温度計測点の温度計測を行う。[0023] with the thereby from the output port 54 to the relay drive circuit 6 is output relay switching signal relay RY n is switched, the temperature measurement of the return next temperature measurement point to the start by the return.
【００２４】即ち、サンプリング期間△ｔ1毎にリレー
ＲＹnを順次切換て図３(a)に示すように順変換部，直流
リアクトル部，逆変換部，順変換部…という順序で温度
を計測する。[0024] That is, the rectifier unit as shown in FIG. 3 (a) for each sampling period △ t 1 Te sequentially switching the relay RY n, DC reactor unit, inverse transform unit, a temperature in the order of the rectifier unit ... Measurement I do.
【００２５】(2)温度危険の場合 上記温度正常における長いサンプリング期間△ｔ1によ
る温度検出中ステップ３においてＴn≧Ｔn＊がＹＥＳと
判断されると温度危険フラグ（ｎ）をセットし、サンプ
リング時間（割込時間）△ｔ2（＜△ｔ1）セットの処理
を行う（Ｓ７，Ｓ８）。[0025] (2) Set the in the temperature detected in step 3 due to a long sampling period △ t 1 when the temperature normal temperature danger T n ≧ T n * YES is determined temperature dangerous flag (n), sampling time (interrupt time) △ t 2 performs (<△ t 1) set of the processing (S7, S8).
【００２６】これにより出力ポート５４からリレードラ
イブ回路６へリレー切換出力がなされると共にリターン
によりスタートに戻り次の温度計測点の温度計測を行
う。As a result, a relay switching output is output from the output port 54 to the relay drive circuit 6, and the process returns to the start by return to measure the temperature at the next temperature measurement point.
【００２７】この場合図３(b)に示すように短いサンプ
リング時間で温度計測点が順次換えられ温度計測され
る。In this case, as shown in FIG. 3B, the temperature measurement points are sequentially changed within a short sampling time and the temperature is measured.
【００２８】(3)温度正常に戻った場合 ステップ３のＴn≧Ｔn＊の判断がＮＯとなりステップＳ
４側に移り、上記(1)の正常の場合のフローにより温度
計測がなされる。(3) When the temperature returns to normal: The determination of T n ≧ T n * in step 3 is NO, and step S
Moving to the side 4, the temperature is measured according to the flow in the normal case of the above (1).
【００２９】この実施例によれば、通常は長いサンプリ
ング時間リレーＲＹnが切換るので、リレーの寿命が長
くなる。また温度異常時は自動的に短いサンプリング時
間で温度計測ができるので、急な温度変化を監視するこ
とができる。According to this embodiment, generally a long sampling time relay RY n so Setsu換Ru, relay life is prolonged. Further, when the temperature is abnormal, the temperature can be automatically measured in a short sampling time, so that a sudden temperature change can be monitored.
【００３０】[0030]
【発明の効果】本発明は、上述のとおり構成されている
ので、次に記載する効果を奏する。Since the present invention is configured as described above, the following effects can be obtained.
【００３１】(1)被監視装置の各部温度が危険値を十分
下回っている通常時は温度計測点のリレー切換が長い期
間で行われるので、切換回数に反比例するリレーの寿命
は従来と同様の長さに保つことができる。(1) Normally, when the temperature of each part of the monitored device is sufficiently lower than the dangerous value, the relay switching of the temperature measuring point is performed in a long period. Can be kept in length.
【００３２】(2)被監視装置の各部温度のある１点が危
険を越えた時リレー切換時間が短くなるので、被監視装
置の危険時は短いサンプリング期間で各部温度を計測す
ることができる。このため急な温度変化も計測できる。(2) When one point of the temperature of each part of the monitored device exceeds the danger, the relay switching time is shortened. Therefore, when the monitored device is in danger, the temperature of each part can be measured in a short sampling period. Therefore, a sudden temperature change can be measured.
【００３３】(3)上記(1)(2)によりリレーの寿命、即ち
温度計測装置の寿命を従来とほぼ同様に保ったまま被監
視装置の危険時のみその各部温度を短いサンプリング期
間で測定することができる。(3) According to the above (1) and (2), while keeping the life of the relay, that is, the life of the temperature measuring device almost the same as before, the temperature of each part is measured in a short sampling period only when the monitored device is in danger. be able to.
【００３４】(4)従来デジタル式温度計測装置のハード
ウェアをそのまま使用しデジタル回路のソフトウェアの
改良のみによって対応できる。(4) Conventional hardware of the digital temperature measuring device can be used as it is, and it can be dealt with only by improving the software of the digital circuit.
【図１】本発明の実施例にかかる温度計測装置を示すブ
ロック回路図。FIG. 1 is a block circuit diagram showing a temperature measuring device according to an embodiment of the present invention.
【図２】デジタル回路の動作フロー図。FIG. 2 is an operation flowchart of a digital circuit.
【図３】(a)及び(b)は温度正常時及び温度危険時のサン
プリング時間説明図。FIGS. 3A and 3B are explanatory diagrams of sampling time when the temperature is normal and when the temperature is dangerous.
１…順変換部 ２…直流リアクトル ３…逆変換部 ４…絶縁アンプ ５…デジタル回路 ６…リレードライブ回路 ＲＹ1〜ＲＹ3…リレー ｒｙ1〜ｒｙ3…リレーの接点1 ... rectifier unit 2 ... DC reactor 3 ... inverse conversion unit 4 ... insulation amplifier 5 ... digital circuit 6 ... relay drive circuit RY 1 to Ry 3 ... relay ry 1 to Ry 3 ... relay contacts
Claims (1)
子と、この各温度検出素子からの各部温度信号をサンプ
リングする各リレーと、このサンプリングされた各温度
信号と各温度計測部の温度危険値が入力し各温度信号か
ら各計測温度を求めると共に前記各リレーを順次制御す
るデジタル回路からなる温度計測装置において、前記デ
ジタル回路が計測温度と温度危険値とを比較し、計測温
度が温度危険値以下のときは前記各リレーを長い期間で
切換え、計測温度か温度危険値を越えたとき前記各リレ
ーを短い期間で切換えるリレー切換信号の設定を行うこ
とを特徴とした温度計測装置。1. A temperature detecting element provided in each temperature detecting section, a relay for sampling a temperature signal of each section from each temperature detecting element, a temperature signal of each of the sampled temperature signals and a temperature of each temperature measuring section. In a temperature measuring device including a digital circuit that receives a dangerous value and obtains each measured temperature from each temperature signal and sequentially controls each of the relays, the digital circuit compares the measured temperature with the temperature dangerous value, and the measured temperature becomes the temperature. A temperature measuring device, wherein a relay switching signal for switching each relay for a long period when the temperature is equal to or lower than the critical value and for switching each relay for a short period when the measured temperature or the temperature exceeds the critical value is set.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04219508A JP3128973B2 (en) | 1992-08-19 | 1992-08-19 | Temperature measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04219508A JP3128973B2 (en) | 1992-08-19 | 1992-08-19 | Temperature measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0666642A JPH0666642A (en) | 1994-03-11 |
| JP3128973B2 true JP3128973B2 (en) | 2001-01-29 |
Family
ID=16736561
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP04219508A Expired - Fee Related JP3128973B2 (en) | 1992-08-19 | 1992-08-19 | Temperature measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3128973B2 (en) |
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| WO2018017365A1 (en) | 2016-07-18 | 2018-01-25 | Merit Medical Systems, Inc. | Inflatable radial artery compression device |
-
1992
- 1992-08-19 JP JP04219508A patent/JP3128973B2/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6245472B1 (en) | 1997-09-12 | 2001-06-12 | Canon Kabushiki Kaisha | Phthalocyanine compounds, process for production thereof and electrophotographic photosensitive member using the compounds |
| US6472524B2 (en) | 1997-09-12 | 2002-10-29 | Canon Kabushiki Kaisha | Phthalocyanine compounds, process for production thereof and electrophotographic photosensitive member using the compounds |
| US6225015B1 (en) | 1998-06-04 | 2001-05-01 | Mitsubishi Paper Mills Ltd. | Oxytitanium phthalocyanine process for the production thereof and electrophotographic photoreceptor to which the oxytitanium phthalocyanine is applied |
| US6210847B1 (en) | 1998-10-28 | 2001-04-03 | Sharp Kabushiki Kaisha | Crystalline oxotitanylphthalocyanine and electrophotographic photoreceptor using the same |
| US6258498B1 (en) | 1998-12-25 | 2001-07-10 | Canon Kabushiki Kaisha | Electrophotographic photosensitive member, and process cartridge and electrophotographic photosensitive member |
| US6503673B2 (en) | 2000-10-24 | 2003-01-07 | Mitsubishi Paper Mills Limited | Phthalocyanine composition, process for production thereof, and electrophotographic photoreceptor |
| US6703174B2 (en) | 2001-01-31 | 2004-03-09 | Canon Kabushiki Kaisha | Electrophotographic apparatus and process cartridge |
| US6833226B2 (en) | 2001-03-30 | 2004-12-21 | Canon Kabushiki Kaisha | Electrophotographic apparatus, process cartridge and electrophotographic photosensitive member |
| US7981581B2 (en) | 2004-03-04 | 2011-07-19 | Mitsubishi Chemical Corporation | Phthalocyanine composition and photoconductive material, electrophotographic photoreceptor cartridge, and image-forming apparatus each employing the composition |
| US8323861B2 (en) | 2006-05-18 | 2012-12-04 | Mitsubishi Chemical Corporation | Electrophotographic photoreceptor, image-forming apparatus, and electrophotographic cartridge |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0666642A (en) | 1994-03-11 |
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| Date | Code | Title | Description |
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| LAPS | Cancellation because of no payment of annual fees |