JP2599036Y2 - IC handler using IC device transport tray - Google Patents
IC handler using IC device transport trayInfo
- Publication number
- JP2599036Y2 JP2599036Y2 JP1993044117U JP4411793U JP2599036Y2 JP 2599036 Y2 JP2599036 Y2 JP 2599036Y2 JP 1993044117 U JP1993044117 U JP 1993044117U JP 4411793 U JP4411793 U JP 4411793U JP 2599036 Y2 JP2599036 Y2 JP 2599036Y2
- Authority
- JP
- Japan
- Prior art keywords
- tray
- test
- handler
- measured
- customer tray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【０００１】[0001]
【産業上の利用分野】この考案は、被測定ＩＣデバイス
がテストトレイに格納されて、水平に搬送され、測定部
でテストされるＩＣデバイス搬送トレイを用いたＩＣハ
ンドラに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC handler using an IC device transport tray in which an IC device to be measured is stored in a test tray, transported horizontally, and tested by a measuring unit.
【０００２】[0002]
【従来の技術】ＩＣハンドラには、被測定ＩＣデバイス
をテストトレイに格納しＩＣハンドラ内で水平に搬送さ
せて測定部の位置で測定用ソケットと電気的に接続し、
ＩＣテスタを用いてテストを行う方式のものと、ＩＣデ
バイスの自重で滑らせながらソケットに挿入し、テスト
を行う方式のものとがある。本考案は、前者の被測定Ｉ
Ｃデバイスをテストトレイに格納し水平に搬送させてテ
ストする方式で、特にテストトレイとカスタマトレイに
関する考案である。2. Description of the Related Art In an IC handler, an IC device to be measured is stored in a test tray, transported horizontally in the IC handler, and electrically connected to a measuring socket at a position of a measuring section.
There is a method of performing a test using an IC tester, and a method of performing a test by inserting the IC device into a socket while sliding the IC device under its own weight. The present invention is based on the former measured I
This is a method in which a C device is stored in a test tray and transported horizontally to perform a test. In particular, the invention relates to a test tray and a customer tray.
【０００３】図３に従来のテストトレイ１０とカスタマ
トレイ２０の一例を図示する。被測定ＩＣデバイス３０
は、外部より運搬用のカスタマトレイ２０に格納されて
テスト室に運ばれてくる。この被測定ＩＣデバイス３０
は、テストトレイ１０に移され、テストトレイ１０はＩ
Ｃハンドラ内をベルトにより或いはレール上を水平に移
動して測定部の測定用ソケット３０の位置に達して被測
定ＩＣデバイス３０をＩＣテスタでテストし、良否を判
別する。良否を判別されたＩＣデバイス３０は、それぞ
れテスト結果のカテゴリー別に区分されてカスタマトレ
イ２０に収納され、テストトレイ１０は最初の位置に戻
る。FIG. 3 shows an example of a conventional test tray 10 and a conventional customer tray 20. IC device under test 30
Is stored in the customer tray 20 for transportation from outside and is carried to the test room. This measured IC device 30
Is moved to the test tray 10, and the test tray 10
The IC device under test 30 is moved by a belt or horizontally on a rail to reach the position of the measuring socket 30 of the measuring section, and the IC device 30 to be measured is tested by an IC tester to judge the quality. The IC devices 30 determined to be good or bad are stored in the customer tray 20 in accordance with the respective categories of the test results, and the test tray 10 returns to the initial position.
【０００４】ここで問題になるのは、被測定ＩＣデバイ
ス３０がカスタマトレイ２０からテストトレイ１０に１
つずつ移されることである。手袋をした人手で１つ１つ
移すか、図示していないが、吸着マニュピュレータでカ
スタマトレイ２０から被測定ＩＣデバイス３０を１つ１
つ吸い上げてテストトレイ１０に自動的に移したりする
が、いずれにしても時間がかかりすぎる。また、移し換
えるときに被測定ＩＣデバイス３０にダメージを与える
おそれもある。The problem here is that the IC device 30 to be measured is transferred from the customer tray 20 to the test tray 10 by one.
It is to be transferred one by one. The IC devices 30 to be measured 30 are individually transferred from the customer tray 20 by a suction manipulator (not shown).
And automatically transfer it to the test tray 10, but in any case, it takes too much time. Further, there is a possibility that the IC device 30 to be measured may be damaged when the IC device 30 is transferred.
【０００５】[0005]
【考案が解決しようとする課題】本考案は、上記の両ト
レイに着眼し、速やかに、安全に移動させ、テスト稼動
時間を多くし、テストコストを削減するにある。SUMMARY OF THE INVENTION An object of the present invention is to focus on both trays described above, move the trays quickly and safely, increase test operation time, and reduce test costs.
【０００６】[0006]
【課題を解決するための手段】上記目的を達成するため
に、本考案は従来のテストトレイ１０を搬送枠１１即ち
本考案のカスタマトレイ２１を収納するフレームだけの
ものとし、この中に被測定ＩＣデバイス３０を格納して
運搬されてきた本考案のカスタマトレイ２１をはめ込
み、カスタマトレイ２１と従来のテストトレイ１０に代
わる搬送枠１１とが一体となり、ＩＣハンドラ内を循環
させてテストさせるようにする。In order to achieve the above-mentioned object, in the present invention, the conventional test tray 10 comprises only a transfer frame 11, that is, a frame for accommodating the customer tray 21 of the present invention. The customer tray 21 of the present invention stored and transported with the IC device 30 is fitted therein, and the customer tray 21 and the transport frame 11 instead of the conventional test tray 10 are integrated to circulate in the IC handler for testing. I do.
【０００７】[0007]
【実施例】本考案の実施例を図１及び図２に基づいて説
明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIGS.
【０００８】図１に、従来のテストトレイ１０に代わる
フレームのみで構成された搬送枠１１と搬送枠１１の内
部にはめ込まれる本考案のカスタマトレイ２１の一実施
例を示す。FIG. 1 shows an embodiment of a transport frame 11 composed of only a frame replacing the conventional test tray 10 and a customer tray 21 of the present invention which is fitted inside the transport frame 11.
【０００９】搬送枠１１は、テストトレイ２１を複数個
収納できる大きさとして、ＩＣハンドラの搬送機構に連
続して繋がる構成とする。そして搬送枠１１の幅Ｘ、長
さＹ、高さＺの寸法は一定とし、カストマトレイ２１を
挿入する収納穴は、底辺に突っ張りが有ってカスタマト
レイ２１を支える構造とし、上辺にはカスタマトレイ２
１を抑えて安定させるための鉤等を付ける。カスタマト
レイ２１の位置決めのためには搬送枠１１の底辺または
側面の外形で決めてもよいが、搬送枠１１にピンを付け
カスタマトレイ２１にピン受けを設けて勘合する決め方
が確実に位置決めができる。The transport frame 11 has such a size that a plurality of test trays 21 can be stored and is continuously connected to the transport mechanism of the IC handler. The width X, the length Y, and the height Z of the transfer frame 11 are constant, and the storage hole for inserting the custom tray 21 has a structure in which the bottom has a strut to support the customer tray 21 and the top has a customer Tray 2
Attach hooks or the like to keep 1 stable. The position of the customer tray 21 may be determined by the outer shape of the bottom side or the side surface of the transport frame 11. .
【００１０】運搬用のカスタマトレイ２１の外形は搬送
枠１１に丁度入る大きさ、形状とする。カスタマトレイ
２１にはＩＣデバイス格納室２２が複数行、複数列で整
然と並んで有り、その中にＩＣデバイス３０を格納す
る。そしてカスタマトレイ２１のＩＣデバイス格納室２
２の底辺は、ＩＣデバイス３０の入出力ピン３１の真下
に穴を開けている構造とし、テストの際に測定用ソケッ
ト３５のコンタクタ３６が入出力ピン３１と電気的に接
続できるようにする。カスタマトレイ２１が、外部より
運搬されてテスト室で被測定ＩＣデバイス３０をテスト
する際に、従来はＩＣデバイス３０を１つ１つテストト
レイに移し換えていたが、本考案はカスタマトレイ２１
そのものを搬送枠１１に位置決めして収納すればよい。The outer shape of the customer tray 21 for transportation has a size and a shape that just fits in the transport frame 11. An IC device storage room 22 is arranged in a customer tray 21 in a plurality of rows and a plurality of columns, and the IC devices 30 are stored therein. Then, the IC device storage room 2 of the customer tray 21
The bottom of 2 has a structure in which a hole is formed directly below the input / output pins 31 of the IC device 30 so that the contactor 36 of the measuring socket 35 can be electrically connected to the input / output pins 31 during a test. Conventionally, when the customer tray 21 is transported from the outside and the IC devices 30 to be measured are tested in the test room, the IC devices 30 are conventionally transferred one by one to the test tray.
What is necessary is just to position itself in the conveyance frame 11, and to store it.
【００１１】搬送枠１１がＩＣハンドラ内を搬送機構に
より水平に搬送されて、測定部のテスト位置に到達する
と、図２に示すようにコンタクタ３６を有する測定用ソ
ケット３５が下方から上方に突き上げてきて、コンタク
タ３６と被測定ＩＣデバイス３０の入出力ピン３１が電
気的に接続される。測定用ソケット３５は、図示してい
ないがＩＣテスタと接続しており、ここで被測定ＩＣデ
バイスのテストが開始する。テストが終了すると測定用
ソケット３５は、再び下降し元の位置に戻る。測定用ソ
ケット３５が元の位置に戻ると、搬送枠１１は移動し、
次の被測定ＩＣデバイス３０の測定準備に移る。このよ
うにして、被測定ＩＣデバイスを順次測定しながら、搬
送枠１１はＩＣハンドラ内を搬送機構により循環する。
この循環の過程で、測定されたＩＣデバイス３０は、測
定データに基ずくカテゴリー別に分類される。When the transport frame 11 is transported horizontally in the IC handler by the transport mechanism and reaches the test position of the measuring section, the measuring socket 35 having the contactor 36 as shown in FIG. Thus, the contactor 36 and the input / output pin 31 of the IC device under test 30 are electrically connected. The measurement socket 35 is connected to an IC tester (not shown), and the test of the IC device to be measured starts here. When the test is completed, the measuring socket 35 descends again and returns to the original position. When the measurement socket 35 returns to the original position, the transport frame 11 moves,
The process proceeds to preparation for measurement of the next IC device 30 to be measured. In this way, the transport frame 11 is circulated in the IC handler by the transport mechanism while sequentially measuring the IC devices to be measured.
In this circulation process, the measured IC devices 30 are classified into categories based on the measurement data.
【００１２】[0012]
【考案の効果】以上説明したように、本考案は運搬用の
カスタマトレイ２１をそのままテストトレイ１０の一部
として利用するので、被測定ＩＣデバイスを１つ１つ移
し換える必要がなく、カスタマトレイ２１のまま、搬送
枠１１にはめ込めばよい。従って、その移動は簡単で、
短時間で安全に移動できる。そこでテスト準備時間を短
縮でき、テストの稼動時間が多く取れ、テストコストを
削減することができる。As described above, according to the present invention, the customer tray 21 for transportation is used as it is as a part of the test tray 10. Therefore, there is no need to transfer the IC devices to be measured one by one. What is necessary is just to fit into the conveyance frame 11 as it is. Therefore, the movement is easy,
You can move safely in a short time. Therefore, test preparation time can be reduced, test operation time can be increased, and test cost can be reduced.
【図１】本考案の一実施例の図である。FIG. 1 is a diagram of one embodiment of the present invention.
【図２】本考案の測定部における実施例の図である。FIG. 2 is a diagram illustrating an embodiment of a measuring unit according to the present invention.
【図３】従来のテストトレイおよびカスタマトレイの概
略図である。FIG. 3 is a schematic view of a conventional test tray and a customer tray.
１０ 従来のテストトレイ １１ 搬送枠 ２０ 従来のカスタマトレイ ２１ 本考案のカスタマトレイ ２２ ＩＣデバイス格納室 ３０ ＩＣデバイス ３１ 入出力ピン ３５ 測定用ソケット ３６ コンタクタ DESCRIPTION OF SYMBOLS 10 Conventional test tray 11 Transport frame 20 Conventional customer tray 21 Customer tray of the present invention 22 IC device storage room 30 IC device 31 I / O pin 35 Measurement socket 36 Contactor
Claims (1)
（１１）を連結してＩＣハンドラ内を循環するＩＣデバ
イス搬送機構と、 ＩＣデバイス格納室（２２）を複数行、複数列有し、該
ＩＣデバイス格納室（２２）に格納されたＩＣデバイス
（３０）の入出力ピン（３１）の下方に穴を開けられた
構造をもつカストマトレイ（２１）と、 該カストマトレイ（２１）を収納した該搬送枠（１１）
が測定部に到達したとき測定用ソケット（３５）でＩＣ
デバイス（３０）をテストする機構と、 を有することを特徴とするＩＣデバイス搬送トレイを用
いたＩＣハンドラ。An IC device transport mechanism for connecting a transport frame (11) for accommodating a customer tray (21) and circulating in an IC handler, and an IC device storage room (22) having a plurality of rows and a plurality of columns. A custom tray (21) having a structure in which a hole is formed below the input / output pin (31) of the IC device (30) stored in the IC device storage room (22), and the custom tray (21) is stored. The transfer frame (11)
When the IC reaches the measuring section, the IC is connected with the measuring socket (35).
An IC handler using an IC device transport tray, comprising: a mechanism for testing a device (30);
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1993044117U JP2599036Y2 (en) | 1993-07-19 | 1993-07-19 | IC handler using IC device transport tray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1993044117U JP2599036Y2 (en) | 1993-07-19 | 1993-07-19 | IC handler using IC device transport tray |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH078785U JPH078785U (en) | 1995-02-07 |
| JP2599036Y2 true JP2599036Y2 (en) | 1999-08-30 |
Family
ID=12682668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1993044117U Expired - Fee Related JP2599036Y2 (en) | 1993-07-19 | 1993-07-19 | IC handler using IC device transport tray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2599036Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5629180Y2 (en) * | 1977-12-28 | 1981-07-10 |
-
1993
- 1993-07-19 JP JP1993044117U patent/JP2599036Y2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH078785U (en) | 1995-02-07 |
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