JP2022138495A - ライトガイド、電子線検出器、及び荷電粒子装置 - Google Patents
ライトガイド、電子線検出器、及び荷電粒子装置 Download PDFInfo
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- JP2022138495A JP2022138495A JP2021038410A JP2021038410A JP2022138495A JP 2022138495 A JP2022138495 A JP 2022138495A JP 2021038410 A JP2021038410 A JP 2021038410A JP 2021038410 A JP2021038410 A JP 2021038410A JP 2022138495 A JP2022138495 A JP 2022138495A
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- light guide
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- 238000010894 electron beam technology Methods 0.000 title claims abstract description 113
- 239000002245 particle Substances 0.000 title claims abstract description 18
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 246
- 229910052751 metal Inorganic materials 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- 239000011521 glass Substances 0.000 claims description 5
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 claims description 4
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 4
- 229920005989 resin Polymers 0.000 claims description 4
- 229910052727 yttrium Inorganic materials 0.000 claims description 4
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 35
- 238000012790 confirmation Methods 0.000 description 15
- 230000000694 effects Effects 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 11
- 238000010586 diagram Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 10
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 9
- 238000012986 modification Methods 0.000 description 9
- 230000004048 modification Effects 0.000 description 9
- 239000010453 quartz Substances 0.000 description 9
- 230000002093 peripheral effect Effects 0.000 description 8
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 108010043121 Green Fluorescent Proteins Proteins 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000005388 borosilicate glass Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- -1 acryl Chemical group 0.000 description 1
- PSNPEOOEWZZFPJ-UHFFFAOYSA-N alumane;yttrium Chemical compound [AlH3].[Y] PSNPEOOEWZZFPJ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
- G02B6/0003—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being doped with fluorescent agents
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Measurement Of Radiation (AREA)
- Light Guides In General And Applications Therefor (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
[第1実施形態]
[第2実施形態]
[第3実施形態]
[第4実施形態]
[効果確認試験]
[変形例]
Claims (12)
- 一の方向に延びる導光体と、
前記導光体の一端側に配置され、被検出線の入射によって1次蛍光を発生させる第1蛍光体層と、
前記導光体の前記一端側から他端側に向かって延在し、前記1次蛍光の入射によって2次蛍光を発生させる第2蛍光体層と、を備えるライトガイド。 - 前記第2蛍光体層は、前記第1蛍光体層よりも前記導光体の前記他端側に延びている請求項1記載のライトガイド。
- 前記第2蛍光体層は、前記導光体の前記一端側から前記他端側まで延びている請求項1又は2記載のライトガイド。
- 前記導光体の前記一端側から前記他端側に向かって延在し、前記2次蛍光の入射によって3次蛍光を発生させる第3蛍光体層を更に備える請求項1~3のいずれか一項記載のライトガイド。
- 前記第1蛍光体層は、酸硫化ガドリニウム、ケイ酸イットリウム、YAG、YAP、InGaN/GaNの量子井戸構造層を有する蛍光体、ZnOのいずれかによって構成されている請求項1~4のいずれか一項記載のライトガイド。
- 前記導光体は、透明ガラス、透明樹脂、空気、又は真空によって構成されている請求項1~5のいずれか一項記載のライトガイド。
- 前記導光体は、第1面及び前記第1面の反対側に位置する第2面を有し、
前記第1蛍光体層は、前記第1面側に設けられ、
前記第2蛍光体層は、少なくとも前記第2面側に設けられ、
前記第2面には、前記導光体の一端側において、前記一端側に向かうにつれて前記第1面に近づくように傾斜する傾斜面が設けられている請求項1~6のいずれか一項記載のライトガイド。 - 前記第2蛍光体層における前記導光体の前記一端側の縁を覆う反射膜を更に備える請求項1~7のいずれか一項記載のライトガイド。
- 前記導光体の一端側には、前記導光体、前記第1蛍光体層、及び前記第2蛍光体層を貫通する貫通孔が設けられている請求項1~8のいずれか一項記載のライトガイド。
- 前記貫通孔の内壁を覆う金属膜を更に備える請求項9記載のライトガイド。
- 請求項1~10のいずれか一項記載のライトガイドと、
前記ライトガイドにおける前記導光体の前記他端側に配置され、前記導光体と光学的に結合された検出部と、を備える電子線検出器。 - 電子線を試料に向けて放出する電子源と、
前記電子線の照射によって前記試料で発生する荷電粒子を検出する検出器と、を備え、
前記検出器は、請求項11に記載の電子線検出器によって構成されている荷電粒子装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021038410A JP7076021B1 (ja) | 2021-03-10 | 2021-03-10 | ライトガイド、電子線検出器、及び荷電粒子装置 |
PCT/JP2021/043254 WO2022190473A1 (ja) | 2021-03-10 | 2021-11-25 | ライトガイド、電子線検出器、及び荷電粒子装置 |
KR1020237024428A KR20230154794A (ko) | 2021-03-10 | 2021-11-25 | 라이트 가이드, 전자선 검출기, 및 하전 입자 장치 |
IL303580A IL303580A (en) | 2021-03-10 | 2021-11-25 | Light guide, electron beam detector and charged particle device |
CN202180092581.4A CN116802766A (zh) | 2021-03-10 | 2021-11-25 | 光导、电子线检测器及带电粒子装置 |
TW110146954A TW202236346A (zh) | 2021-03-10 | 2021-12-15 | 光導,電子線檢測器,及帶電粒子裝置 |
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JP2021038410A JP7076021B1 (ja) | 2021-03-10 | 2021-03-10 | ライトガイド、電子線検出器、及び荷電粒子装置 |
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JP7076021B1 JP7076021B1 (ja) | 2022-05-26 |
JP2022138495A true JP2022138495A (ja) | 2022-09-26 |
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Country Status (6)
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JP (1) | JP7076021B1 (ja) |
KR (1) | KR20230154794A (ja) |
CN (1) | CN116802766A (ja) |
IL (1) | IL303580A (ja) |
TW (1) | TW202236346A (ja) |
WO (1) | WO2022190473A1 (ja) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001272471A (ja) * | 2000-03-23 | 2001-10-05 | Toshiba Corp | 放射線検出装置 |
JP2009187949A (ja) * | 2008-02-08 | 2009-08-20 | Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | ビーム電流キャリブレーションシステム |
JP2010043971A (ja) * | 2008-08-13 | 2010-02-25 | Toshiba Corp | 放射線検出器 |
JP2011249273A (ja) * | 2010-05-31 | 2011-12-08 | Jeol Ltd | 走査電子顕微鏡 |
US8895935B2 (en) * | 2012-03-12 | 2014-11-25 | Hermes Microvision, Inc. | High efficiency secondary and back scattered electron detector |
JP2015005351A (ja) * | 2013-06-19 | 2015-01-08 | 日本電子株式会社 | 検出器および荷電粒子線装置 |
US20170271124A1 (en) * | 2016-03-16 | 2017-09-21 | Ngr Inc. | Secondary particle detection system of scanning electron microscope |
JP2020129545A (ja) * | 2016-03-31 | 2020-08-27 | 株式会社日立ハイテク | 荷電粒子線装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013243055A (ja) | 2012-05-21 | 2013-12-05 | Hitachi High-Technologies Corp | 電子顕微鏡および電子検出器 |
JP6739207B2 (ja) | 2016-03-31 | 2020-08-12 | 株式会社日立ハイテク | 荷電粒子線装置 |
-
2021
- 2021-03-10 JP JP2021038410A patent/JP7076021B1/ja active Active
- 2021-11-25 KR KR1020237024428A patent/KR20230154794A/ko active Search and Examination
- 2021-11-25 IL IL303580A patent/IL303580A/en unknown
- 2021-11-25 WO PCT/JP2021/043254 patent/WO2022190473A1/ja active Application Filing
- 2021-11-25 CN CN202180092581.4A patent/CN116802766A/zh active Pending
- 2021-12-15 TW TW110146954A patent/TW202236346A/zh unknown
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001272471A (ja) * | 2000-03-23 | 2001-10-05 | Toshiba Corp | 放射線検出装置 |
JP2009187949A (ja) * | 2008-02-08 | 2009-08-20 | Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | ビーム電流キャリブレーションシステム |
JP2010043971A (ja) * | 2008-08-13 | 2010-02-25 | Toshiba Corp | 放射線検出器 |
JP2011249273A (ja) * | 2010-05-31 | 2011-12-08 | Jeol Ltd | 走査電子顕微鏡 |
US8895935B2 (en) * | 2012-03-12 | 2014-11-25 | Hermes Microvision, Inc. | High efficiency secondary and back scattered electron detector |
JP2015005351A (ja) * | 2013-06-19 | 2015-01-08 | 日本電子株式会社 | 検出器および荷電粒子線装置 |
US20170271124A1 (en) * | 2016-03-16 | 2017-09-21 | Ngr Inc. | Secondary particle detection system of scanning electron microscope |
JP2020129545A (ja) * | 2016-03-31 | 2020-08-27 | 株式会社日立ハイテク | 荷電粒子線装置 |
Also Published As
Publication number | Publication date |
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JP7076021B1 (ja) | 2022-05-26 |
IL303580A (en) | 2023-08-01 |
KR20230154794A (ko) | 2023-11-09 |
TW202236346A (zh) | 2022-09-16 |
CN116802766A (zh) | 2023-09-22 |
WO2022190473A1 (ja) | 2022-09-15 |
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