JP2021105557A - Inspection method of power storage device - Google Patents
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Abstract
Description
本発明は、蓄電デバイスの検査方法に関する。 The present invention relates to a method for inspecting a power storage device.
従来、二次電池など蓄電デバイスの良否を判定する検査方法が種々提案されている。例えば特許文献１では、検査対象とする二次電池を加圧状態で放置する放置工程を行うと共に、この放置工程の前後に電池電圧を測定する。放置工程の前後に生じた電池電圧の差は、放置工程の間に生じた自己放電による電圧低下量を示している。即ち、電圧低下量が大きい電池は自己放電量が多いことになる。このため、電圧低下量の大小により二次電池の良否を判定できる。なおこの検査方法は、二次電池などの蓄電デバイスの製造方法をなす工程中の一工程として行われることもある。 Conventionally, various inspection methods for determining the quality of a power storage device such as a secondary battery have been proposed. For example, in Patent Document 1, a leaving step of leaving the secondary battery to be inspected in a pressurized state is performed, and the battery voltage is measured before and after this leaving step. The difference in battery voltage generated before and after the leaving process indicates the amount of voltage decrease due to self-discharge generated during the leaving process. That is, a battery having a large amount of voltage drop has a large amount of self-discharge. Therefore, the quality of the secondary battery can be determined by the magnitude of the voltage drop. Note that this inspection method may be performed as one step in the process of manufacturing a power storage device such as a secondary battery.
しかしながら、上述の二次電池の良否判定の手法では、蓄電デバイスの良否判定に時間が掛かる不具合があった。放置工程の放置時間を長く取らないと、二次電池の良否の判定に有意性があるといえるほどの電圧低下量の大小の差異が生じないからである。 However, the above-mentioned method for determining the quality of the secondary battery has a problem that it takes time to determine the quality of the power storage device. This is because unless the leaving time of the leaving step is long, there is no difference in the amount of voltage decrease that can be said to be significant in determining the quality of the secondary battery.
そこで、図５に示すように、二次電池などの蓄電デバイスＣＴの接続端子ＣＴ１，ＣＴ２に接続配線ＣＷを介して可変直流定電圧電源ＳＰを接続し、適宜設定した定電圧（電源電圧）Ｖｓｐを印加し続けることにより、蓄電デバイスＣＴを通じて流れる電源電流（漏れ電流）Ｉｄを電流検知部ＳＰＩで検知し、この電源電流Ｉｄが安定した時点での電源電流Ｉｄの大きさから、蓄電デバイスＣＴの良否を判定する手法を考えた。なお、図５では、蓄電デバイスＣＴは、並列に接続されたデバイス容量Ｃｄ及び短絡抵抗Ｒｄｐに、直流抵抗Ｒｄｓが直列に接続された等価回路で示してある。また、蓄電デバイスＣＴの接続端子ＣＴ１，ＣＴ２と接続配線ＣＷの接続プローブＰ１，Ｐ２との間には、それぞれ接触抵抗Ｒ１，Ｒ２が発生する。また、接続配線ＣＷに生じる抵抗を併せて配線抵抗Ｒｗとする。 Therefore, as shown in FIG. 5, a variable DC constant voltage power supply SP is connected to the connection terminals CT1 and CT2 of the power storage device CT such as a secondary battery via the connection wiring CW, and the constant voltage (power supply voltage) Vsp set appropriately is set. Is continuously applied, the power supply current (leakage current) Id flowing through the power storage device CT is detected by the current detection unit SPI, and from the magnitude of the power supply current Id when the power supply current Id becomes stable, the power storage device CT I considered a method to judge the quality. In FIG. 5, the power storage device CT is shown by an equivalent circuit in which a DC resistor Rds is connected in series to a device capacitance Cd and a short-circuit resistor Rdp connected in parallel. Further, contact resistors R1 and R2 are generated between the connection terminals CT1 and CT2 of the power storage device CT and the connection probes P1 and P2 of the connection wiring CW, respectively. Further, the resistance generated in the connection wiring CW is also referred to as the wiring resistance Rw.
定電圧の電源電圧Ｖｓｐを蓄電デバイスＣＴに印加し続けると、この蓄電デバイスＣＴが充電あるいは放電されて、可変直流定電圧電源ＳＰの電源電圧Ｖｓｐと、蓄電デバイスＣＴ（そのデバイス容量Ｃｄに生じる）デバイス電圧Ｖｄとが徐々に均衡し、蓄電デバイスＣＴのうち、デバイス容量Ｃｄには充電電流Ｉｉｄが流れず、直流抵抗Ｒｄｓ及び短絡抵抗Ｒｄｐを通じて電源電流（漏れ電流）Ｉｄのみが流れる状態となって安定すると考えられる。従って、安定した状態における電源電流Ｉｄを検知すれば、蓄電デバイスＣＴの短絡抵抗Ｒｄｐの大小を検知できると考えられるからである。 When the constant voltage power supply voltage Vsp is continuously applied to the power storage device CT, the power storage device CT is charged or discharged, and the power supply voltage Vsp of the variable DC constant voltage power supply SP and the power storage device CT (generated in the device capacity Cd). The device voltage Vd is gradually balanced, and among the power storage device CT, the charging current Iid does not flow in the device capacitance Cd, and only the power supply current (leakage current) Id flows through the DC resistance Rds and the short-circuit resistance Rdp. It is considered to be stable. Therefore, if the power supply current Id in a stable state is detected, it is considered that the magnitude of the short-circuit resistance Rdp of the power storage device CT can be detected.
ところで、電源電流Ｉｄを早期に安定させ、蓄電デバイスＣＴの良否判定を早期に可能とするには、図５に示す、可変直流定電圧電源ＳＰと蓄電デバイスＣＴとを接続した回路において、蓄電デバイスＣＴ外に存在する外部抵抗Ｒｅｘｔを、より正確には、接続配線ＣＷの配線抵抗Ｒｗと、接続プローブＰ１，Ｐ２と接続端子ＣＴ１，ＣＴ２との間の接触抵抗Ｒ１，Ｒ２と、直流抵抗Ｒｓとの和（Ｒｅｘｔ＝Ｒｗ＋Ｒ１＋Ｒ２）を小さくするとよい。電源電流Ｉｄの変化の速さを羈束する時定数τ（＝Ｃｂ・Ｒｅｘｔ）を小さくできるからである。具体的には、接続配線ＣＷの配線抵抗Ｒｗを下げるべく、接続配線ＣＷの長さを短く、径を太くするのが好ましい。 By the way, in order to stabilize the power supply current Id at an early stage and enable the quality determination of the power storage device CT at an early stage, the power storage device in the circuit connecting the variable DC constant voltage power supply SP and the power storage device CT shown in FIG. To be more precise, the external resistance Next existing outside the CT is the wiring resistance Rw of the connection wiring CW, the contact resistances R1 and R2 between the connection probes P1 and P2 and the connection terminals CT1 and CT2, and the DC resistance Rs. It is preferable to reduce the sum of (Rext = Rw + R1 + R2). This is because the time constant τ (= Cb · Next) that bundles the speed of change of the power supply current Id can be reduced. Specifically, in order to reduce the wiring resistance Rw of the connecting wiring CW, it is preferable to shorten the length of the connecting wiring CW and increase the diameter.
一方、可変直流定電圧電源ＳＰの可変定電圧源ＳＰＥで発生させ電圧検知部ＳＰＶで検知する電源電圧Ｖｓｐの大きさは、設定値に対し誤差が生じるので、蓄電デバイスＣＴに実際に印加される電源電圧Ｖｓｐを蓄電デバイスＣＴ（デバイス容量Ｃｄ）に生じているデバイス電圧Ｖｄに完全に一致させることは困難である。このため、図５に示す回路において、可変直流定電圧電源ＳＰの電源電圧Ｖｓｐと蓄電デバイスＣＴのデバイス電圧Ｖｄとの間に電圧差ΔＶ（＝Ｖｓｐ−Ｖｄ）が存在すると、蓄電デバイスＣＴに対し電源電圧Ｖｓｐを印加した直後に、大きな電源電流Ｉｄ（≒ΔＶ／Ｒｅｘｔ）が流れる（蓄電デバイスの直流抵抗Ｒｄｓは十分小さいとする）。ここで前述のように、外部抵抗Ｒｅｘｔを小さくしていた場合には、特に大きな電源電流Ｉｄが印加当初に流れる。これにより、可変直流定電圧電源ＳＰを損傷したり、接続配線ＣＷの接続プローブＰ１，Ｐ２と蓄電デバイスＣＴの接続端子ＣＴ１，ＣＴ２とが溶着するなどの不具合を生じる虞がある。一方、このような不具合を避けるために外部抵抗Ｒｅｘｔを大きくすると、蓄電デバイスＣＴの良否判定に時間が掛かる。 On the other hand, the magnitude of the power supply voltage Vsp generated by the variable constant voltage source SPE of the variable DC constant voltage power supply SP and detected by the voltage detection unit SPV causes an error with respect to the set value, so that it is actually applied to the power storage device CT. It is difficult to completely match the power supply voltage Vsp with the device voltage Vd generated in the power storage device CT (device capacitance Cd). Therefore, in the circuit shown in FIG. 5, if a voltage difference ΔV (= Vsp-Vd) exists between the power supply voltage Vsp of the variable DC constant voltage power supply SP and the device voltage Vd of the power storage device CT, the power storage device CT Immediately after applying the power supply voltage Vsp, a large power supply current Id (≈ΔV / Next) flows (assuming that the DC resistance Rds of the power storage device is sufficiently small). Here, as described above, when the external resistance Next is reduced, a particularly large power supply current Id flows at the initial stage of application. This may damage the variable DC constant voltage power supply SP, or cause problems such as welding of the connection probes P1 and P2 of the connection wiring CW and the connection terminals CT1 and CT2 of the power storage device CT. On the other hand, if the external resistance Next is increased in order to avoid such a problem, it takes time to determine the quality of the power storage device CT.
本発明は、かかる現状に鑑みてなされたものであって、蓄電デバイスに定電圧を印加した場合に流れる電源電流により、当該蓄電デバイスの良否を判定するにあたり、設定した電源電圧とデバイス電圧との電圧差が存在することに伴う不具合の発生を防止した、蓄電デバイスの検査方法を提供するものである。 The present invention has been made in view of the current situation, and the set power supply voltage and the device voltage are used to determine the quality of the power storage device based on the power supply current flowing when a constant voltage is applied to the power storage device. It provides an inspection method of a power storage device that prevents the occurrence of a defect due to the existence of a voltage difference.
上記課題を解決するための本発明の一態様は、定電圧モードと定電流モードとを相互に切り替え可能な直流電源を、接続配線を介して蓄電デバイスの蓄電端子間に接続し、上記定電流モードとした上記直流電源から上記蓄電端子を通じて上記蓄電デバイスに、予め定めた大きさの定電流を流す定電流ステップと、上記定電流ステップに続いて、上記定電流ステップにおける上記接続配線を介した上記直流電源と上記蓄電デバイスとの接続を維持したまま、かつ、上記定電圧モードとした上記直流電源に、上記定電流ステップの終期に上記直流電源で生じさせていた終期電源電圧と同じ大きさの電源電圧を発生させて、上記接続配線を介して上記蓄電デバイスの上記蓄電端子間に印加する電圧印加ステップと、上記電圧印加ステップにおいて上記蓄電デバイスに流す電源電流の収束状況から、上記蓄電デバイスの内部短絡を検知する検知ステップと、を備える蓄電デバイスの検査方法である。 One aspect of the present invention for solving the above-mentioned problems is to connect a DC power supply capable of switching between a constant voltage mode and a constant current mode between storage terminals of a power storage device via a connection wiring, and to connect the constant current mode. A constant current step in which a constant current of a predetermined magnitude is passed from the DC power supply in the mode to the storage device through the storage terminal, and following the constant current step, via the connection wiring in the constant current step. The same magnitude as the final power supply voltage generated by the DC power supply at the end of the constant current step in the DC power supply in the constant voltage mode while maintaining the connection between the DC power supply and the power storage device. From the convergence status of the voltage application step of generating the power supply voltage of the above and applying it between the storage terminals of the power storage device via the connection wiring and the power supply current flowing to the power storage device in the voltage application step, the power storage device It is a method of inspecting a power storage device including a detection step for detecting an internal short circuit.
上述の検査方法では、まず定電流ステップでは、定電流モードとした直流電源から蓄電デバイスに定電流を流すため、そもそも大電流は流れない。その後、電圧印加ステップにおいて、定電圧モードとした直流電源で蓄電デバイスに電圧を印加するのであるが、定電流ステップの終期に直流電源で生じさせていた終期電源電圧と同じ大きさの電源電圧を発生させて、蓄電デバイスに印加する。このため、上述のように定電流ステップでも大電流は流れない上、従来と異なり、電圧印加ステップの当初にも、定電流ステップで流した定電流と同じ大きさの電流が流れるに留まり、外部抵抗の大小に拘わらず、大電流が流れることがない。このため、従来のような不具合を生じないで、外部抵抗、具体的には、接続配線の配線抵抗を適宜の大きさに選択して、蓄電デバイスの内部短絡を検知できる。 In the above-mentioned inspection method, first, in the constant current step, a constant current is passed from the DC power supply in the constant current mode to the power storage device, so that a large current does not flow in the first place. After that, in the voltage application step, the voltage is applied to the power storage device by the DC power supply in the constant voltage mode, but the power supply voltage of the same magnitude as the final power supply voltage generated by the DC power supply at the end of the constant current step is applied. Generate and apply to the power storage device. Therefore, as described above, a large current does not flow even in the constant current step, and unlike the conventional case, a current of the same magnitude as the constant current flowed in the constant current step flows even at the beginning of the voltage application step, and is external. A large current does not flow regardless of the magnitude of the resistance. Therefore, it is possible to detect an internal short circuit of the power storage device by selecting an external resistance, specifically, a wiring resistance of the connection wiring, to an appropriate size without causing a problem as in the past.
なお、定電流ステップで蓄電デバイスに流す定電流の大きさは、適宜設定すれば良いが、電圧印加ステップにおいて蓄電デバイスを流れる電流が収束して安定する大きさに近い大きさとすると良い。例えば、蓄電デバイスの良否を判別する電流しきい値を設定する場合には、この電流しきい値の１／２〜２倍程度の大きさとすると良い。 The magnitude of the constant current flowing through the power storage device in the constant current step may be appropriately set, but it is preferable that the size is close to the size at which the current flowing through the power storage device converges and stabilizes in the voltage application step. For example, when setting a current threshold value for determining the quality of the power storage device, the size may be about 1/2 to 2 times the current threshold value.
電圧印加ステップでは、蓄電デバイスを流れる電源電流の変化は徐々に収束する。具体的には、終期電源電圧と同じ大きさとした電源電圧と蓄電デバイスの内部短絡で生じる短絡抵抗の大きさとから定まる電流値（収束電流値）に向けて、徐々に変化が収束し安定する。この収束電流値が、蓄電デバイスの内部短絡の大きさの良否を判別する電流しきい値よりも大きい場合には、蓄電デバイスの短絡抵抗の大きさが小さく、内部短絡が生じていると考えられ、不良品と判断できる。一方、収束電流値が電流しきい値よりも小さい場合には、蓄電デバイスの短絡抵抗が大きく、内部短絡が生じていないと考えられ、良品と判断できる。
このことから、検知ステップにおいて、蓄電デバイスを流れる電流の収束状況から、蓄電デバイスの内部短絡を検知する手法としては、上述の収束電流値が得られる時期まで電圧印加ステップを継続し収束電流値を取得して、取得した収束電流値を用いて、内部短絡を判断する手法が挙げられる。そのほか、蓄電デバイスに流す電源電流が十分収束しなくとも、安定に近づいていると判断できた段階での電源電流の値、電流しきい値と比較する手法も挙げられる。また、蓄電デバイスに流す電源電流が十分収束しなくとも、蓄電デバイスに流す電源電流の収束の方向が、電流しきい値に比して、増加方向か減少方向かを判断することで、蓄電デバイスの内部短絡を検知するようにしても良い。
In the voltage application step, the change in the power supply current flowing through the power storage device gradually converges. Specifically, the change gradually converges and stabilizes toward a current value (convergent current value) determined by the power supply voltage having the same magnitude as the final power supply voltage and the magnitude of the short-circuit resistance generated by the internal short circuit of the power storage device. When this convergent current value is larger than the current threshold value for determining the quality of the internal short circuit of the power storage device, it is considered that the short circuit resistance of the power storage device is small and an internal short circuit has occurred. , It can be judged as a defective product. On the other hand, when the convergent current value is smaller than the current threshold value, it is considered that the short-circuit resistance of the power storage device is large and no internal short-circuit has occurred, and it can be judged as a non-defective product.
Therefore, in the detection step, as a method of detecting the internal short circuit of the power storage device from the convergence state of the current flowing through the power storage device, the voltage application step is continued until the time when the above-mentioned convergent current value is obtained to obtain the convergent current value. There is a method of determining an internal short circuit by acquiring and using the acquired convergent current value. In addition, even if the power supply current flowing through the power storage device does not converge sufficiently, there is also a method of comparing the value of the power supply current and the current threshold value at the stage when it can be determined that the power supply current is approaching stability. Further, even if the power supply current flowing through the power storage device does not converge sufficiently, the power storage device can be determined whether the direction of convergence of the power supply current flowing through the power storage device is an increase direction or a decrease direction with respect to the current threshold value. It may be possible to detect an internal short circuit of.
このような検査方法を適用できる蓄電デバイスとしては、リチウムイオン二次電池などの二次電池のほか、電気二重層キャパシタ、リチウムイオンキャパシタなどのキャパシタが挙げられる。 Examples of the power storage device to which such an inspection method can be applied include a secondary battery such as a lithium ion secondary battery, an electric double layer capacitor, and a capacitor such as a lithium ion capacitor.
さらに、組み立てた未充電の蓄電デバイスをあらかじめ定めた充電状態まで初充電して充電済みの蓄電デバイスとする初充電工程と、上記充電済みの蓄電デバイスを検査する検査工程と、を備え、上記検査工程は、請求項１に記載の蓄電デバイスの検査方法を行う工程を含む蓄電デバイスの製造方法とするのが好ましい。 Further, the inspection is provided with an initial charging step of first charging the assembled uncharged power storage device to a predetermined charging state to make it a charged power storage device, and an inspection step of inspecting the charged power storage device. The step is preferably a method for manufacturing a power storage device, which includes a step of performing the method for inspecting the power storage device according to claim 1.
この蓄電デバイスの製造方法では、初充電工程の後の検査工程に、前述の蓄電デバイスの内部短絡を検知する検査方法を行う工程を含むので、電源電圧とデバイス電圧との電圧差が存在することに伴う不具合の発生を防止しつつ、内部短絡の検査を行った蓄電デバイスを製造できる。 In this method for manufacturing a power storage device, the inspection step after the initial charging step includes the step of performing the above-mentioned inspection method for detecting an internal short circuit of the power storage device, so that there is a voltage difference between the power supply voltage and the device voltage. It is possible to manufacture a power storage device that has been inspected for an internal short circuit while preventing the occurrence of problems associated with the above.
以下、本発明の実施形態を、図面を参照しつつ説明する。まず、検査対象の蓄電デバイスである二次電池１について説明する。図１に示す二次電池１は、扁平な直方体形状でアルミニウムからなる電池ケース１０と、この電池ケース１０内に内蔵された、図示しない電極体を有している。電池ケース１０は、有底で四角筒状のケース本体１１と、ケース本体１１を封口する矩形板状の蓋体１３とからなる。この蓋体１３には、接続端子である正極端子５０及び負極端子６０が設けられている。但し、検査する二次電池１は、図１のような扁平角型のものに限らず、円筒型など他の形状のものでも構わない。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. First, the secondary battery 1 which is a power storage device to be inspected will be described. The secondary battery 1 shown in FIG. 1 has a
次いで図２に、二次電池１を検査回路ＩＰＣに接続した状態の等価回路図を示す。図２では、二次電池１は、起電要素である電池容量Ｃｂと、この電池容量Ｃｂと並列に接続された短絡抵抗Ｒｐと、電池容量Ｃｂ及び短絡抵抗Ｒｐに直列に接続された直流抵抗Ｒｓより構成される等価回路で示してある。このうち、短絡抵抗Ｒｐは、二次電池１内の図示しない電極体が本来有している絶縁抵抗を、あるいはこれに加えて、電極体に混入する場合がある金属異物などによる短絡経路の有する抵抗をモデル化したものである。このため、短絡抵抗Ｒｐが小さい不良品の二次電池１では、電池容量Ｃｂに蓄積された電荷が短絡抵抗Ｒｐを通じた内部短絡により、比較的短時間で放電（自己放電）されることになる。 Next, FIG. 2 shows an equivalent circuit diagram in a state where the secondary battery 1 is connected to the inspection circuit IPC. In FIG. 2, the secondary battery 1 has a battery capacity Cb, which is an electromotive element, a short-circuit resistance Rp connected in parallel with the battery capacity Cb, and a DC resistance connected in series with the battery capacity Cb and the short-circuit resistance Rp. It is shown by an equivalent circuit composed of Rs. Of these, the short-circuit resistance Rp has the insulation resistance originally possessed by the electrode body (not shown) in the secondary battery 1, or in addition to this, has a short-circuit path due to a metal foreign substance that may be mixed in the electrode body. It is a model of resistance. Therefore, in the defective secondary battery 1 having a small short-circuit resistance Rp, the electric charge accumulated in the battery capacity Cb is discharged (self-discharged) in a relatively short time due to an internal short circuit through the short-circuit resistance Rp. ..
検査回路ＩＰＣは、直流電源ＥＰと、先端に接続プローブＰ１，Ｐ２を有する接続配線ＣＷと、を有している。直流電源ＥＰは、定電流モードと定電圧モードとを切り替えて相互に移行できるようになっている。即ち、図２に示す等価回路で言えば、可変定電圧源ＥＰＥと可変定電流源ＥＰＣとをモード選択スイッチＳＷで切り替え可能となっている。また直流電源ＥＰは、可変定電圧源ＥＰＥあるいは可変定電流源ＥＰＣとモード選択スイッチＳＷとに直列に接続され、直流電源ＥＰが流す電源電流Ｉｂを検知する電流検知部ＥＰＩを有している。また、可変定電圧源ＥＰＥあるいは可変定電流源ＥＰＣとモード選択スイッチＳＷとに並列に接続され、直流電源ＥＰが出力する電源電圧Ｖｅｐを検知する電圧検知部ＥＰＶを有している。 The inspection circuit IPC has a DC power supply EP and a connection wiring CW having connection probes P1 and P2 at the tips thereof. The DC power supply EP can switch between the constant current mode and the constant voltage mode to switch between them. That is, in the equivalent circuit shown in FIG. 2, the variable constant voltage source EPE and the variable constant current source EPC can be switched by the mode selection switch SW. Further, the DC power supply EP is connected in series with the variable constant voltage source EPE or the variable constant current source EPC and the mode selection switch SW, and has a current detection unit EPI that detects the power supply current Ib flowing through the DC power supply EP. Further, it has a voltage detection unit EPV which is connected in parallel to the variable constant voltage source EPE or the variable constant current source EPC and the mode selection switch SW and detects the power supply voltage Vep output by the DC power supply EP.
図２に示すように、接続配線ＣＷには配線抵抗Ｒｗが生じる。また、接続プローブＰ１と二次電池１の正極端子５０との間には接触抵抗Ｒ１が、接続プローブＰ２と負極端子６０との間には接触抵抗Ｒ２が発生する。さらに、配線抵抗Ｒｗと接触抵抗Ｒ１及びＲ２の和を、外部抵抗Ｒｅｘｔ（＝Ｒｗ＋Ｒ１＋Ｒ２）とする。
As shown in FIG. 2, a wiring resistor Rw is generated in the connection wiring CW. Further, a contact resistor R1 is generated between the connection probe P1 and the
この検査回路ＩＰＣを用いて、二次電池１の短絡抵抗Ｒｐの大小による、二次電池１の良否を検査する。短絡抵抗Ｒｐが小さければ不良品であり、大きければ良品である。但し、本実施形態では、後述するように、短絡抵抗Ｒｐの大小判断に代えて、定電圧を印加した後に安定した電源電流Ｉｂの大きさを用いて、二次電池１の良否を判断する。 Using this inspection circuit IPC, the quality of the secondary battery 1 is inspected depending on the magnitude of the short-circuit resistance Rp of the secondary battery 1. If the short-circuit resistance Rp is small, it is a defective product, and if it is large, it is a good product. However, in the present embodiment, as will be described later, the quality of the secondary battery 1 is determined by using the magnitude of the power supply current Ib that is stable after applying a constant voltage instead of determining the magnitude of the short-circuit resistance Rp.
この検査を含む二次電池１の製造方法の流れについて、図３のフローチャートを参照して説明する。先ず、組立工程Ｓ１において、二次電池１を組み立てる。出来上がった二次電池１は未充電であるため、初充電工程Ｓ２において、予め定めた充電パターンで初充電を行う。次いで、初充電された二次電池１を、開放状態として、高温下で所定時間に亘り放置する高温エージング工程Ｓ３を行う。その後、冷却工程Ｓ４において二次電池１を室温まで徐々に冷却する。 The flow of the manufacturing method of the secondary battery 1 including this inspection will be described with reference to the flowchart of FIG. First, in the assembly step S1, the secondary battery 1 is assembled. Since the completed secondary battery 1 is not charged, it is first charged in a predetermined charging pattern in the initial charging step S2. Next, a high-temperature aging step S3 is performed in which the initially charged secondary battery 1 is left in an open state for a predetermined time at a high temperature. Then, in the cooling step S4, the secondary battery 1 is gradually cooled to room temperature.
次いで、図３において破線で示す検査工程Ｓ５を行う。この検査工程Ｓ５は、定電流工程Ｓ５１、電圧印加工程Ｓ５２、収束検知工程Ｓ５３、及び判定工程Ｓ５４を含む。この検査工程Ｓ５では、具体的には図２に示すように、二次電池１の正極端子５０に接続プローブＰ１を、負極端子６０に接続プローブＰ２を接続して、検査回路ＩＰＣを二次電池１に接続する。検査工程Ｓ５においては、この状態を維持する。即ち、一旦形成した正極端子５０と接続プローブＰ１との接続、及び、負極端子６０と接続プローブＰ２との接続は、この検査工程Ｓ５が終了するまで変化させず、接続し直しは行わない。正極端子５０と接続プローブＰ１との間に生じる接触抵抗Ｒ１、及び、負極端子６０と接続プローブＰ２との間に生じる接触抵抗Ｒ２の大きさは、接続のたびに変動するからである。
Next, the inspection step S5 shown by the broken line in FIG. 3 is performed. This inspection step S5 includes a constant current step S51, a voltage application step S52, a convergence detection step S53, and a determination step S54. In this inspection step S5, specifically, as shown in FIG. 2, the connection probe P1 is connected to the
この状態で、定電流工程Ｓ５１において、直流電源ＥＰを定電流モードとして、図２に即して言えば、モード選択スイッチＳＷを切り替えて可変定電流源ＥＰＣに接続して、予め定めた大きさの定電流Ｉｂｃ（本実施形態では、Ｉｂｃ＝８０μＡ）を二次電池１に流す。すると、既に初充電工程Ｓ２で充電されていた二次電池１の電池容量Ｃｂがさらに充電される。また、二次電池１の正負極端子５０，６０間には、電池電圧Ｖｂが発生し、直流電源ＥＰの電源電圧Ｖｅｐは、定電流Ｉｂｃを流すべく、電池電圧Ｖｂと外部抵抗Ｒｅｘｔで決まる大きさに制御される（Ｖｅｐ＝Ｖｂ＋Ｒｅｘｔ・Ｉｂｃ）。本実施形態では、この定電流工程Ｓ５１を、検査時間ｔ＝０〜２００秒に亘って行う。なお、図４に、典型的な良品と不良品の二次電池１について、定電流工程Ｓ５１及び次述する電圧印加工程Ｓ５２を行った場合の、電源電流Ｉｂの変化の様子を示す。図４から理解できるように、定電流工程Ｓ５１に検査時間ｔ＝０〜２００秒の間は、良品及び不良品のいずれの二次電池１でも、電源電流Ｉｂとして、Ｉｂｃ＝８０μＡの定電流が流されていることが判る。
In this state, in the constant current step S51, the DC power supply EP is set to the constant current mode, and according to FIG. 2, the mode selection switch SW is switched and connected to the variable constant current source EPC to have a predetermined size. The constant current Ibc (Ibc = 80 μA in this embodiment) is passed through the secondary battery 1. Then, the battery capacity Cb of the secondary battery 1 already charged in the initial charging step S2 is further charged. Further, a battery voltage Vb is generated between the positive and
次いで、電圧印加工程Ｓ５２に進む。具体的には、直流電源ＥＰと二次電池１との接続を維持したまま、直流電源ＥＰを定電圧モードに移行させる、図２に即して言えば、モード選択スイッチＳＷを切り替えて、可変定電圧源ＥＰＥに接続して、定電圧を発生させ、二次電池１に印加する。具体的には、定電流工程Ｓ５１の終期（検査時間ｔ＝２００ｓｅｃの直前、以下、ｔ＝２００（−）と表記する）において、直流電源ＥＰが発生していた終期電源電圧Ｖｅｐｅ＝Ｖｅｐ（２００（−））と同じ大きさの電源電圧Ｖｅｐを、電圧印加工程Ｓ５２で継続維持して発生させる。このため、この電圧印加工程Ｓ５２の当初（検査時間ｔ＝２００ｓｅｃの直後、以下、ｔ＝２００（＋）と表記する）において流れる電源電流（電池電流）Ｉｂ（２００（＋））は、定電流工程Ｓ５１で流していた定電流Ｉｂｃに等しくなる（Ｉｂ（２００（＋））＝Ｉｂｃ）。本実施形態で言えば、電圧印加工程Ｓ５２の当初の電源電流Ｉｂ（２００（＋））は８０μＡとなる（Ｉｂ（２００（＋））＝８０μＡ）。このように、本実施形態では、電圧印加工程Ｓ５２で二次電池１に終期電源電圧Ｖｅｐｅと同じ定電圧を印加するのであるが、外部抵抗Ｒｅｘｔの大小に拘わらず、定電圧の印加当初に大電流が流れることがない。このため、適宜の外部抵抗Ｒｅｘｔを選択できる。従って、次述するように、この電圧印加工程Ｓ５２で、徐々に変化が収束して安定する電源電流Ｉｂを、早期に収束させ安定させるため、外部抵抗Ｒｅｘｔを小さくすること、具体的には、接続配線ＣＷを太くあるいは短くして配線抵抗Ｒｗを小さくすることができる。 Then, the process proceeds to the voltage application step S52. Specifically, the DC power supply EP is shifted to the constant voltage mode while maintaining the connection between the DC power supply EP and the secondary battery 1. In accordance with FIG. 2, the mode selection switch SW is switched and variable. It is connected to a constant voltage source EPE to generate a constant voltage and applied to the secondary battery 1. Specifically, at the end of the constant current process S51 (immediately before the inspection time t = 200 sec, hereinafter referred to as t = 200 (-)), the final power supply voltage Vep = Vep (200) in which the DC power supply EP was generated. A power supply voltage Vep having the same magnitude as (-)) is continuously maintained and generated in the voltage application step S52. Therefore, the power supply current (battery current) Ib (200 (+)) flowing at the beginning of the voltage application step S52 (immediately after the inspection time t = 200 sec, hereinafter referred to as t = 200 (+)) is a constant current. It becomes equal to the constant current Ibc flowing in the step S51 (Ib (200 (+)) = Ibc). According to the present embodiment, the initial power supply current Ib (200 (+)) of the voltage application step S52 is 80 μA (Ib (200 (+)) = 80 μA). As described above, in the present embodiment, the same constant voltage as the final power supply voltage Vep is applied to the secondary battery 1 in the voltage application step S52, but regardless of the magnitude of the external resistance Rext, the constant voltage is large at the beginning of application of the constant voltage. No current flows. Therefore, an appropriate external resistance Next can be selected. Therefore, as described below, in the voltage application step S52, in order to reduce the external resistance Rext in order to quickly converge and stabilize the power supply current Ib whose change gradually converges and stabilizes, specifically, The wiring resistance Rw can be reduced by making the connection wiring CW thicker or shorter.
さて、図４からも理解できるように、この電圧印加工程Ｓ５２では、上述のように、終期電源電圧Ｖｅｐｅ（＝Ｖｅｐ（２００（−）））と同じ大きさの電源電圧Ｖｅｐを継続して発生するので、二次電池１の電池容量Ｃｂに引き続き充電される。すると、電池容量Ｃｂで発生する電圧（従って、電池電圧Ｖｂ）が徐々に上昇し、電源電流Ｉｂが徐々に減少する。そしてついには、終期電源電圧Ｖｅｐｅと同じ大きさの電源電圧Ｖｅｐでは、電池容量Ｃｂを充電できなくなり、電池容量Ｃｂには充電電流Ｉｉｂが流れず、電源電流Ｉｂは、直流抵抗Ｒｓと短絡抵抗Ｒｐの直列回路を流れる分のみとなって安定する。なお、短絡抵抗Ｒｐに比して、直流抵抗Ｒｓは十分小さいので無視できる。従って、電圧印加工程Ｓ５２を介してから十分時間が経過した後に、電源電流Ｉｂは、短絡抵抗Ｒｐの大小に応じた大きさとなって安定する。即ち、二次電池１に内部短絡が生じており、短絡抵抗Ｒｐが相対的に小さい場合には、電源電流Ｉｂが大きい値で安定する。逆に、二次電池１に内部短絡が生じておらず、短絡抵抗Ｒｐが相対的に大きい場合には、電源電流Ｉｂが小さな値で安定する。従って、安定した時点での電源電流Ｉｂの大きさにより、二次電池１の内部短絡の有無に関する、二次電池１の良否を判定できる。 As can be understood from FIG. 4, in this voltage application step S52, as described above, the power supply voltage Vep having the same magnitude as the final power supply voltage Vep (= Vep (200 (−))) is continuously generated. Therefore, the battery capacity Cb of the secondary battery 1 is continuously charged. Then, the voltage generated in the battery capacity Cb (hence, the battery voltage Vb) gradually increases, and the power supply current Ib gradually decreases. Finally, at a power supply voltage Vep having the same magnitude as the final power supply voltage Vep, the battery capacity Cb cannot be charged, the charging current Iib does not flow through the battery capacity Cb, and the power supply current Ib is the DC resistance Rs and the short-circuit resistance Rp. It is stable because it flows only through the series circuit of. The DC resistance Rs is sufficiently smaller than the short-circuit resistance Rp and can be ignored. Therefore, after a sufficient time has elapsed after passing through the voltage application step S52, the power supply current Ib becomes stable with a magnitude corresponding to the magnitude of the short-circuit resistance Rp. That is, when an internal short circuit occurs in the secondary battery 1 and the short circuit resistance Rp is relatively small, the power supply current Ib stabilizes at a large value. On the contrary, when the secondary battery 1 does not have an internal short circuit and the short circuit resistance Rp is relatively large, the power supply current Ib stabilizes at a small value. Therefore, the quality of the secondary battery 1 with respect to the presence or absence of an internal short circuit of the secondary battery 1 can be determined from the magnitude of the power supply current Ib at the time of stabilization.
そこで、収束検知工程Ｓ５３では、電源電流Ｉｂの変化が収束し安定したか否かを検知し、変化が収束していない場合（Ｎｏ）には、電圧印加工程Ｓ５２を継続する。一方、変化が収束している場合（Ｙｅｓ）には、判定工程Ｓ５４に進む。なお、電源電流Ｉｂの変化が収束しているかどうかを検知する手法としては、適宜の手法を選択できる。 Therefore, in the convergence detection step S53, it is detected whether or not the change in the power supply current Ib has converged and is stable, and if the change has not converged (No), the voltage application step S52 is continued. On the other hand, when the changes have converged (Yes), the process proceeds to the determination step S54. An appropriate method can be selected as a method for detecting whether or not the change in the power supply current Ib has converged.
例えば本実施形態では、定期的（１０秒毎）に電源電流Ｉｂの大きさを検知して、電源電流の値Ｉｂ（ｎ）を得ておく（ｎは自然数）。続いて、電源電流の値Ｉｂ（ｎ）を得た各時点で、Ｉｂ（ｎ−１２）からＩｂ（ｎ）までの１３ヶ（過去２分間）の電源電流値の平均値ＡＶ１と、Ｉｂ（ｎ−２４）からＩｂ（ｎ−１２）までの１３ヶ（過去４分〜過去２分までの２分間）の電源電流値の平均値ＡＶ２との差（ＡＶ１−ＡＶ２）を算出する。本実施形態では、図４に示すように、定電流工程Ｓ５１において、Ｉｂｃ＝８０μＡの定電流を流したので、電圧印加工程Ｓ５２では、良品及び不良品の二次電池１のいずれでも、電源電流Ｉｂは、８０μＡから徐々に減少して、短絡抵抗Ｒｐの大きさに応じた電源電流Ｉｂの大きさで安定する。そこで、初めて２つの平均値の差が０以上（０又は正の値）となった（ＡＶ１−ＡＶ２≧０）となった時点で、電源電流Ｉｂの変化が収束したと判断する。図４に示す良品の二次電池１は、上向き矢印で示す検査時間ｔ＝１４６０秒の時点で電源電流Ｉｂの変化が収束したと判断された。また、図４に示す負良品の二次電池１は、下向き矢印で示す検査時間ｔ＝１３８０秒の時点で電源電流Ｉｂの変化が収束したと判断された。 For example, in the present embodiment, the magnitude of the power supply current Ib is detected periodically (every 10 seconds) to obtain the value of the power supply current Ib (n) (n is a natural number). Subsequently, at each time when the power supply current value Ib (n) was obtained, the average value AV1 of the 13 power supply current values (for the past 2 minutes) from Ib (n-12) to Ib (n) and Ib ( The difference (AV1-AV2) from the average value AV2 of the power supply current values of 13 months (the past 4 minutes to the past 2 minutes) from n-24) to Ib (n-12) is calculated. In the present embodiment, as shown in FIG. 4, a constant current of Ibc = 80 μA was applied in the constant current step S51. Therefore, in the voltage application step S52, the power supply current was supplied to both the non-defective and defective secondary batteries 1. Ib gradually decreases from 80 μA and stabilizes at the magnitude of the power supply current Ib according to the magnitude of the short-circuit resistance Rp. Therefore, when the difference between the two average values becomes 0 or more (0 or a positive value) for the first time (AV1-AV2 ≧ 0), it is determined that the change in the power supply current Ib has converged. In the non-defective secondary battery 1 shown in FIG. 4, it was determined that the change in the power supply current Ib had converged at the time of the inspection time t = 1460 seconds indicated by the upward arrow. Further, in the non-defective secondary battery 1 shown in FIG. 4, it was determined that the change in the power supply current Ib had converged at the time of the inspection time t = 1380 seconds indicated by the downward arrow.
判定工程Ｓ５４では、収束検知工程Ｓ５３で電源電流Ｉｂの変化が収束し安定したと判断した時点での電源電流Ｉｂの大きさなどを用いて、検査対象の二次電池１が良品であるか不良品であるかを判定する。例えば、本実施形態では、電源電流Ｉｂの変化が収束したと判断された時点（図４に示す二次電池１で言えば、検査時間ｔ＝１４６０秒あるいはｔ＝１３８０秒の時点）で算出していた平均値ＡＶ１の大きさ（１３ヶ分、過去２分間の電源電流の平均値）と、予め定めておいた電流しきい値Ｉｂｔｈとを比較する。そして、平均値ＡＶ１が電流しきい値Ｉｂｔｈよりも小さい（ＡＶ１＜Ｉｂｔｈ）の場合（Ｙｅｓ）には、検査対象の二次電池１が良品であると判定する。しかし、平均値ＡＶ１が電流しきい値Ｉｂｔｈ以上（ＡＶ１≧Ｉｂｔｈ）である場合（Ｎｏ）には、検査対象の二次電池１は不良品であると判定する。本実施形態では、図４において破線で示すように、電流しきい値Ｉｂｔｈを３０μＡ（Ｉｂｔｈ＝３０μＡ）に設定してある。このため、図４において上側のグラフをなす二次電池１は、ＡＶ１≧Ｉｂｔｈであるので、判定工程Ｓ５４において、不良品と判定される。一方、図４において下側のグラフをなす二次電池１は、ＡＶ１＜Ｉｂｔｈであるので、判定工程Ｓ５４において、良品と判定される。かくして、良品とされた二次電池１が完成する。なお、不良品と判定された二次電池１は廃棄される。 In the determination step S54, whether the secondary battery 1 to be inspected is a non-defective product or not by using the magnitude of the power supply current Ib at the time when it is determined in the convergence detection step S53 that the change in the power supply current Ib has converged and is stable. Determine if it is a good product. For example, in the present embodiment, it is calculated at the time when it is determined that the change in the power supply current Ib has converged (in the case of the secondary battery 1 shown in FIG. 4, the inspection time is t = 1460 seconds or t = 1380 seconds). The magnitude of the average value AV1 (13 months, the average value of the power supply current for the past 2 minutes) and the predetermined current threshold Ibth are compared. Then, when the average value AV1 is smaller than the current threshold value Ibth (AV1 <Ibth) (Yes), it is determined that the secondary battery 1 to be inspected is a non-defective product. However, when the average value AV1 is equal to or higher than the current threshold value Ibth (AV1 ≧ Ibth) (No), it is determined that the secondary battery 1 to be inspected is a defective product. In the present embodiment, as shown by the broken line in FIG. 4, the current threshold value Ibth is set to 30 μA (Ibth = 30 μA). Therefore, since the secondary battery 1 forming the upper graph in FIG. 4 has AV1 ≧ Ibth, it is determined to be a defective product in the determination step S54. On the other hand, since the secondary battery 1 forming the lower graph in FIG. 4 has AV1 <Ibth, it is determined to be a non-defective product in the determination step S54. In this way, the secondary battery 1 which is regarded as a good product is completed. The secondary battery 1 determined to be defective is discarded.
以上において、本発明を実施形態に即して説明したが、本発明は実施形態に限定されるものではなく、その要旨を逸脱しない範囲で、適宜変更して適用できることは言うまでもない。
例えば、実施形態では、二次電池１の製造方法における検査工程Ｓ５で、上述の検査方法を採用した。しかし、二次電池１の製造段階のみならず、二次電池１を一旦使用した後に、二次電池を検査する場合に適用しても良い。
In the above, the present invention has been described according to the embodiment, but it goes without saying that the present invention is not limited to the embodiment and can be appropriately modified and applied without departing from the gist thereof.
For example, in the embodiment, the above-mentioned inspection method is adopted in the inspection step S5 in the manufacturing method of the secondary battery 1. However, it may be applied not only in the manufacturing stage of the secondary battery 1 but also in the case of inspecting the secondary battery after the secondary battery 1 is used once.
１ 二次電池（蓄電デバイス）
５０ （二次電池の）正極端子（接続端子）
６０ （二次電池の）負極端子（接続端子）
ＩＰＣ 検査回路
ＥＰ 直流電源
ＥＰＥ 可変定電圧源
ＥＰＣ 可変定電流源
ＳＷ モード選択スイッチ
ＥＰＩ 電流検知部
ＥＰＶ 電圧検知部
Ｖｅｐ 電源電圧
Ｖｅｐｅ 終期電源電圧
ＣＷ 接続配線
Ｐ１，Ｐ２ （接続配線の）接続プローブ
Ｒｗ （接続配線の）配線抵抗
Ｒ１，Ｒ２ （接続配線の接続プローブと蓄電デバイスの接続端子との間の）接触抵抗
Ｖｂ （二次電池の）電池電圧
Ｉｂ （二次電池を流れる）電源電流
Ｉｂｃ （定電流モードで流す）定電流
Ｃｂ （二次電池の）電池容量
Ｒｓ （二次電池の）直流抵抗
Ｒｐ （二次電池の）短絡抵抗
Ｉｉｂ 充電電流
ｔ 検査時間
Ｓ１ 組立工程
Ｓ２ 初充電工程
Ｓ３ 高温エージング工程
Ｓ４ 冷却工程
Ｓ５ 検査工程
Ｓ５１ 定電流工程（定電流ステップ）
Ｓ５２ 電圧印加工程（電圧印加ステップ）
Ｓ５３ 収束検知工程（検知ステップ）
Ｓ５４ 判定工程（検知ステップ）
1 Secondary battery (power storage device)
50 Positive electrode terminal (connection terminal) (of secondary battery)
60 Negative terminal (connection terminal) (of secondary battery)
IPC inspection circuit EP DC power supply EPE variable constant voltage source EPC variable constant current source SW mode selection switch EPI current detector EPV voltage detector Vep power supply voltage Vep terminal power supply voltage CW connection wiring P1, P2 (connection wiring) connection probe Rw ( Wiring resistance R1 and R2 (between the connection probe of the connection wiring and the connection terminal of the power storage device) Contact resistance Vb (secondary battery) Battery voltage Ib (flowing through the secondary battery) Power supply current Ibc (constant) Constant current Cb (for secondary battery) Battery capacity Rs (for secondary battery) DC resistance Rp (for secondary battery) Short-circuit resistance Iib Charging current t Inspection time S1 Assembly process S2 Initial charging process S3 High temperature aging Process S4 Cooling process S5 Inspection process S51 Constant current process (constant current step)
S52 Voltage application step (voltage application step)
S53 Convergence detection process (detection step)
S54 Judgment process (detection step)
Claims (1)
上記定電流ステップに続いて、上記定電流ステップにおける上記接続配線を介した上記直流電源と上記蓄電デバイスとの接続を維持したまま、かつ、上記定電圧モードとした上記直流電源に、上記定電流ステップの終期に上記直流電源で生じさせていた終期電源電圧と同じ大きさの電源電圧を発生させて、上記接続配線を介して上記蓄電デバイスの上記蓄電端子間に印加する電圧印加ステップと、
上記電圧印加ステップにおいて上記蓄電デバイスに流す電源電流の収束状況から、上記蓄電デバイスの内部短絡を検知する検知ステップと、を備える
蓄電デバイスの検査方法。 A DC power supply capable of switching between a constant voltage mode and a constant current mode is connected between the storage terminals of the power storage device via a connection wiring, and the DC power supply in the constant current mode is connected to the power storage device through the power storage terminal. In addition, a constant current step in which a constant current of a predetermined size is passed, and
Following the constant current step, the constant current is applied to the DC power supply in the constant voltage mode while maintaining the connection between the DC power supply and the power storage device via the connection wiring in the constant current step. At the end of the step, a voltage application step of generating a power supply voltage having the same magnitude as the final power supply voltage generated by the DC power supply and applying it between the power storage terminals of the power storage device via the connection wiring, and a voltage application step.
A method for inspecting a power storage device, comprising a detection step for detecting an internal short circuit of the power storage device from the convergence state of a power supply current flowing through the power storage device in the voltage application step.
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