JP2020181737A - スリットセパレータの製造方法およびスリットセパレータの製造装置 - Google Patents
スリットセパレータの製造方法およびスリットセパレータの製造装置 Download PDFInfo
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Abstract
Description
本発明の実施形態1に係るセパレータ1の製造方法には、検査工程が含まれる。この検査工程では、少なくとも以下の第1ステップ〜第6ステップを含む検査が行われる。
本発明の実施形態2に係るスリットセパレータ32の製造方法は、少なくとも以下のステップ1〜ステップ3を含んでいる。
以下、再び図1〜図3を参照して、本発明の実施形態3に係るセパレータ1の製造方法について説明する。
図15は、変形例1に係るセパレータ1の検査装置45および検査方法を概略的に示す斜視図である。
図16は、変形例2に係るセパレータ1の検査装置49および検査方法を概略的に示す正面図である。
2 基材
3 機能層
4、7 スリット(欠陥、欠損)
5 ピンホール(欠陥、欠損)
6 凹部(欠陥、欠損)
10、11、24、25、42、43、47、48、51、52 電極
12 欠損(欠陥)
13、13a、26、33、39、80 ローラー
14、18 捲回装置
17、31、44 捲回体
20 被巻出部分
21 検査実行装置
22 被検査部分
27 欠陥
28 切断装置
29 ラベル
30 セパレータ片
32 スリットセパレータ
34 スリット装置
35 前検査装置
40、45、49、58、60 検査装置
59、61 絶縁体
Claims (7)
- セパレータをスリットし、スリットセパレータを作成するステップと、
上記スリットセパレータをローラーによって搬送するステップと、
上記ローラーによって搬送された上記スリットセパレータに対して、欠陥が含まれているか否かを検査するステップとを含んでいるスリットセパレータの製造方法。 - 上記検査するステップにて、上記スリットセパレータの欠損を検出する、上記スリットセパレータに対する耐電圧検査を行う請求項1に記載のスリットセパレータの製造方法。
- 上記スリットセパレータを作成するステップの前に、上記セパレータに対して、欠陥が含まれているか否かを検査するステップを含んでいる請求項1または2に記載のスリットセパレータの製造方法。
- 上記スリットセパレータを巻き取って捲回体を作成するステップと、
上記捲回体から、上記スリットセパレータの一部を巻き出すステップとを含んでおり、
上記検査するステップにて、上記スリットセパレータにおける巻き出した部分の少なくとも一部に対して、欠陥が含まれているか否かを検査する請求項1から3のいずれか1項に記載のスリットセパレータの製造方法。 - セパレータをスリットし、スリットセパレータを作成するスリット装置と、
上記スリットセパレータを搬送するローラーと、
上記ローラーによって搬送された上記スリットセパレータに対して、欠陥が含まれているか否かを検査する検査装置とを備えているスリットセパレータの製造装置。 - 上記検査装置は、上記スリットセパレータの欠損を検出する、上記スリットセパレータに対する耐電圧検査を行う請求項5に記載のスリットセパレータの製造装置。
- 上記セパレータの搬送経路における上記スリット装置の上流にて、上記セパレータに対して、欠陥が含まれているか否かを検査する請求項5または6に記載のスリットセパレータの製造装置。
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JP2019084520A JP7277244B2 (ja) | 2019-04-25 | 2019-04-25 | スリットセパレータの製造方法およびスリットセパレータの製造装置 |
US16/857,320 US20200341070A1 (en) | 2019-04-25 | 2020-04-24 | Method for producing slit separators and apparatus for producing slit separators |
CN202010333000.9A CN111855758A (zh) | 2019-04-25 | 2020-04-24 | 分切隔膜的制造方法和分切隔膜的制造装置 |
KR1020200049779A KR20200125512A (ko) | 2019-04-25 | 2020-04-24 | 슬릿 세퍼레이터의 제조 방법 및 슬릿 세퍼레이터의 제조 장치 |
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- 2020-04-24 KR KR1020200049779A patent/KR20200125512A/ko active Search and Examination
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KR20200125512A (ko) | 2020-11-04 |
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