JP2020027901A - Semiconductor cooling device - Google Patents

Semiconductor cooling device Download PDF

Info

Publication number
JP2020027901A
JP2020027901A JP2018152824A JP2018152824A JP2020027901A JP 2020027901 A JP2020027901 A JP 2020027901A JP 2018152824 A JP2018152824 A JP 2018152824A JP 2018152824 A JP2018152824 A JP 2018152824A JP 2020027901 A JP2020027901 A JP 2020027901A
Authority
JP
Japan
Prior art keywords
substrate
jacket
cooling device
heat dissipation
prevention plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018152824A
Other languages
Japanese (ja)
Other versions
JP7068097B2 (en
Inventor
誠二 松島
Seiji Matsushima
誠二 松島
平野 智哉
Tomoya Hirano
智哉 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Holdings Corp
Original Assignee
Showa Denko KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Denko KK filed Critical Showa Denko KK
Priority to JP2018152824A priority Critical patent/JP7068097B2/en
Publication of JP2020027901A publication Critical patent/JP2020027901A/en
Application granted granted Critical
Publication of JP7068097B2 publication Critical patent/JP7068097B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation

Landscapes

  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

To provide a semiconductor cooling device capable of preventing a wrapping of a heat dissipation substrate while obtaining an excellent cooling performance.SOLUTION: A semiconductor cooling device bonded to a semiconductor module 2 on which a semiconductor element 42 is mounted via a wiring layer on one surface of an insulation substrate 40, comprises: a heat dissipation substrate 10 bonded to the other surface side of the insulation substrate 40; a plurality of fins 11 provided onto a surface opposite to the insulation substrate side in the heat dissipation substrate 10; a wrapping prevention board 20 bonded to a tip of each fin 11, and formed by a material having a linear expansion coefficient smaller than that of a material of the heat dissipation substrate 10; and a jacket 30 mounted onto the surface side where each fin of the heat dissipation substrate 10 is provided, and in which a cooling medium flow space is formed by housing each fin 11 from the heat dissipation substrate 10. The wrapping prevention board 20 comprises: a substrate 20a; and a projection part 20b provided to at least one part of the surface on the side opposite to the heat dissipation substrate side in the substrate.SELECTED DRAWING: Figure 2

Description

本発明は、半導体素子を搭載した基板を冷却する半導体冷却装置に関する。   The present invention relates to a semiconductor cooling device that cools a substrate on which a semiconductor element is mounted.

近年、半導体素子は大電力を扱うことが多く、それに伴って発熱量が増大している。このため、半導体素子を実装した基板に冷却器を接合し、この冷却器に放熱して、発生した熱の除去が行われている。放熱に大きなスペースを確保できる定置設備では、強制空冷が可能であるが、限られたスペース内に機器が配置される場合は、液冷式冷却器が用いられる。   2. Description of the Related Art In recent years, semiconductor elements often handle large electric power, and accordingly, the amount of heat generated has increased. For this reason, a cooler is bonded to a substrate on which a semiconductor element is mounted, and heat is radiated to the cooler to remove generated heat. In a stationary facility that can secure a large space for heat radiation, forced air cooling is possible, but when equipment is arranged in a limited space, a liquid-cooled cooler is used.

半導体素子は、セラミック等の絶縁基板上に形成された配線層に搭載され、前記絶縁基板の反対側の面に、アルミニウムや銅の高熱伝導金属からなる冷却器がろう付等により接合される。冷却器としては、放熱板の一方の面に放熱フィンを接合したものがあり、さらに放熱板の前記一方の面側にジャケットを装着してフィンを内蔵した冷却媒体流通空間を形成した液冷式冷却器が知られている。   The semiconductor element is mounted on a wiring layer formed on an insulating substrate made of ceramic or the like, and a cooler made of a high heat conductive metal such as aluminum or copper is joined to the surface on the opposite side of the insulating substrate by brazing or the like. As the cooler, there is a cooler in which a heat radiating fin is joined to one surface of a heat radiating plate, and a liquid cooling type in which a cooling medium circulation space containing a fin is formed by attaching a jacket to the one surface of the heat radiating plate. Coolers are known.

従来、フィンを備えた放熱板と、ジャケット(冷媒流通空間形成用筐体)とが、別部材で構成されている場合には、ジャケットを装着した際にフィンの先端と筐体との間に隙間が生じてしまっていたが、この隙間を流れる冷却媒体と、フィンとの間で殆ど熱交換がなされないために、十分な放熱性能(冷却性能)が得られないという問題があった。   Conventionally, when the radiator plate provided with the fins and the jacket (housing for forming the coolant circulation space) are formed of different members, when the jacket is mounted, the space between the tip of the fins and the housing is formed. Although a gap has been created, there is a problem that sufficient heat radiation performance (cooling performance) cannot be obtained because heat is hardly exchanged between the cooling medium flowing through the gap and the fins.

そこで、上記のようなフィンの先端とジャケットとの隙間を冷却媒体が通過してしまう問題を解消するために、以下のような構成の冷却器が提案されている。   Therefore, in order to solve the problem that the cooling medium passes through the gap between the tip of the fin and the jacket as described above, a cooler having the following configuration has been proposed.

特許文献1では、放熱フィンの先端部と接するように冷媒流動防止部材を設け、フィンの先端とジャケットとの隙間を冷媒が通過してしまうことを防止する構成が提案されている。また、特許文献2では、放熱フィンの先端部を、ジャケットの底壁の内面に設けられた凹部内に配置した構成が提案されている。また、特許文献3では、ジャケットは、放熱フィンの先端部分に対して先端に対向する方向および側方を微小な隙間を介して囲む状態にフィンの先端を受け入れる遊嵌手段を備えた構成とすることが提案されている。   Patent Literature 1 proposes a configuration in which a refrigerant flow preventing member is provided so as to be in contact with the distal end portion of a radiation fin, and the refrigerant is prevented from passing through a gap between the distal end of the fin and the jacket. Further, Patent Document 2 proposes a configuration in which the distal end portion of the radiation fin is disposed in a concave portion provided on the inner surface of the bottom wall of the jacket. In Patent Document 3, the jacket has a configuration in which the jacket is provided with a loose fitting means for receiving the distal end of the fin so as to surround the distal end portion of the radiating fin in a direction facing the distal end and sideways via a small gap. It has been proposed.

特開2007−110025号公報JP 2007-110025 A 特開2012−4405号公報JP 2012-4405 A 特開2007−165481号公報JP 2007-165481 A

上記のような液冷式冷却器を接合した半導体冷却装置において、半導体素子の発熱によって温度が上昇すると、放熱基板の材料である金属の線膨張係数が、絶縁基板の材料であるセラミックの線膨張係数よりも大きいために、膨張しようとする放熱基板が絶縁基板に引っ張られて反りが生じる。放熱基板にこのような反りが生じると、絶縁基板にクラックが生じたり、絶縁基板が剥離することがある。   In a semiconductor cooling device in which a liquid-cooled cooler as described above is joined, when the temperature rises due to the heat generated by the semiconductor element, the linear expansion coefficient of the metal that is the material of the heat radiation substrate is increased by the linear expansion of the ceramic that is the material of the insulating substrate. Since the coefficient is larger than the coefficient, the heat-dissipating substrate that is about to expand is pulled by the insulating substrate, causing warpage. When such a warp occurs in the heat radiation substrate, cracks may occur in the insulating substrate, or the insulating substrate may peel off.

本発明は、かかる技術的背景に鑑みてなされたものであって、優れた冷却性能が得られると共に放熱基板の反りを防止できる半導体冷却装置を提供することを目的とする。   The present invention has been made in view of such a technical background, and an object of the present invention is to provide a semiconductor cooling device that can obtain excellent cooling performance and can prevent warpage of a heat dissipation substrate.

前記目的を達成するために、本発明は以下の手段を提供する。   In order to achieve the above object, the present invention provides the following means.

[1]絶縁基板の一方の面に配線層を介して半導体素子が搭載される半導体モジュールに接合される半導体冷却装置であり、
前記絶縁基板の他方の面側に接合される放熱基板と、
前記放熱基板における前記絶縁基板側とは反対側の面に設けられた複数のフィンと、
前記フィンの先端に接合され、前記放熱基板の材料より線膨張係数の小さい材料で形成された反り防止板と、
前記放熱基板のフィンが設けられた面側に装着されて、前記放熱基板との間に前記フィンを収容して冷却媒体流通空間を形成したジャケットと、を備え、
前記反り防止板は、基板と、該基板における前記放熱基板側とは反対側の面の少なくとも一部に設けられた突出部と、を備え、
前記突出部の先端が前記ジャケットの内面の一部に当接していることを特徴とする半導体冷却装置。
[1] A semiconductor cooling device joined to a semiconductor module in which a semiconductor element is mounted on one surface of an insulating substrate via a wiring layer,
A heat dissipation substrate joined to the other surface side of the insulating substrate,
A plurality of fins provided on a surface of the heat dissipation substrate opposite to the insulating substrate side,
A warp prevention plate joined to a tip of the fin and formed of a material having a smaller linear expansion coefficient than a material of the heat dissipation board;
A jacket mounted on the fin-provided surface side of the heat-dissipating substrate and containing the fin between the heat-dissipating substrate and a cooling medium flow space;
The warpage prevention plate includes a substrate and a protrusion provided on at least a part of a surface of the substrate opposite to the heat radiation substrate,
A semiconductor cooling device, wherein a tip of the protruding portion is in contact with a part of an inner surface of the jacket.

[2]前記放熱基板のフィンが設けられた面側に前記ジャケットが装着された際に前記反り防止板の突出部の先端が前記ジャケットの内面の一部に接触することで前記反り防止板の少なくとも一部が変形した状態で前記突出部の先端が前記ジャケットの内面の一部に当接している前項1に記載の半導体冷却装置。   [2] The tip of the protrusion of the warpage prevention plate contacts a part of the inner surface of the jacket when the jacket is mounted on the surface of the heat dissipation board on which the fins are provided. 2. The semiconductor cooling device according to item 1, wherein a tip of the protruding portion abuts a part of an inner surface of the jacket in a state where at least a part thereof is deformed.

[3]前記突出部は、前記基板を構成する材料とは異なる材料で形成されている前項1または2に記載の半導体冷却装置。   [3] The semiconductor cooling device according to the above item 1 or 2, wherein the protruding portion is formed of a material different from a material forming the substrate.

[4]前記反り防止板の突出部が、隣り合うフィンとフィンの間の領域に対応した領域に設けられている前項1〜3のいずれか1項に記載の半導体冷却装置。   [4] The semiconductor cooling device according to any one of the preceding items 1 to 3, wherein the protrusion of the warpage prevention plate is provided in a region corresponding to a region between the adjacent fins.

[5]前記反り防止板の突出部は、突条部からなり、該突条部の長さ方向が、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている前項1〜4のいずれか1項に記載の半導体冷却装置。   [5] The projecting portion of the warpage prevention plate is formed of a ridge portion, and the ridge portion is arranged so that the length direction of the ridge portion is substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space. The semiconductor cooling device according to any one of the preceding items 1 to 4.

[6]前記反り防止板の突出部は、相互に離間して配置された複数の突条部からなり、これら複数の突条部の長さ方向が、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている前項1〜4のいずれか1項に記載の半導体冷却装置。   [6] The protruding portion of the warpage prevention plate includes a plurality of ridges arranged apart from each other, and the length direction of the plurality of ridges is determined by the flow of the cooling medium in the cooling medium flow space. The semiconductor cooling device according to any one of Items 1 to 4, wherein the semiconductor cooling device is arranged to be substantially orthogonal to the direction.

[1]の発明では、放熱基板における絶縁基板側とは反対側の面に設けられたフィンの先端に、放熱基板の材料より線膨張係数の小さい材料で形成された反り防止板が接合されている。半導体素子の発熱によって絶縁基板および放熱基板の温度が上昇すると、絶縁基板よりも線膨張係数の大きい放熱基板が伸びて反ろうとするが、フィンの先端に接合された反り防止板が放熱基板の伸びを抑制するので、放熱基板の反りを防止できて、絶縁基板のクラック発生や絶縁基板の剥離を防ぐことができ、ろう付け後の冷却での反りも防止できる。また、反り防止板は、基板と、該基板における放熱基板側とは反対側の面の少なくとも一部に設けられた突出部と、を備えてなる構成であるから、反り防止板の突出部の先端がジャケットの内面の一部に十分に当接した状態の半導体冷却装置を提供できる。即ち、反り防止板とジャケットの内面との間の隙間に生じる冷却媒体の流れを阻害できて、冷却性能に優れた半導体冷却装置を提供できる。   According to the invention as recited in the aforementioned Item [1], a warp prevention plate formed of a material having a smaller linear expansion coefficient than the material of the heat dissipation board is joined to the tip of the fin provided on the surface of the heat dissipation board opposite to the insulating substrate side. I have. When the temperature of the insulating substrate and the heat radiating substrate rises due to the heat generated by the semiconductor element, the heat radiating substrate having a larger linear expansion coefficient than the insulating substrate tends to stretch and warp. Therefore, warpage of the heat dissipation substrate can be prevented, cracks in the insulating substrate and peeling of the insulating substrate can be prevented, and warpage due to cooling after brazing can also be prevented. Further, since the warpage prevention plate has a configuration including a substrate and a protrusion provided on at least a part of a surface of the substrate opposite to the heat dissipation substrate side, the protrusion of the warpage prevention plate is It is possible to provide a semiconductor cooling device in a state where the tip is sufficiently in contact with a part of the inner surface of the jacket. That is, the flow of the cooling medium generated in the gap between the warpage preventing plate and the inner surface of the jacket can be inhibited, and a semiconductor cooling device having excellent cooling performance can be provided.

[2]の発明では、反り防止板の少なくとも一部が変形した状態で突出部の先端がジャケットの内面の一部に当接しており、前記変形に対して反り防止板が変形前の本来の形状に復帰しようとすることで、反り防止板の突出部の先端がジャケットの内面の一部に十分に当接した状態の半導体冷却装置を提供できる。即ち、反り防止板とジャケットの内面との間の隙間に生じる冷却媒体の流れを十分に阻害でき、これにより冷却性能をより向上させることができる。   In the invention of [2], the tip of the protruding portion abuts a part of the inner surface of the jacket in a state where at least a part of the warp prevention plate is deformed, and the warp prevention plate responds to the deformation by the original shape before the deformation. By trying to return to the shape, the semiconductor cooling device can be provided in a state where the tip of the projecting portion of the warpage prevention plate is sufficiently in contact with a part of the inner surface of the jacket. That is, the flow of the cooling medium generated in the gap between the warpage prevention plate and the inner surface of the jacket can be sufficiently inhibited, and the cooling performance can be further improved.

[3]の発明では、突出部を構成する材料と、基板を構成する材料とは、異なる材料であるから、放熱基板の様々な形状に対し、反りをより十分に防止できる。また、異なる材料を用いることにより、反り防止板とジャケット内面との間の隙間に生じる冷却媒体の流れを十分に阻害できる。   In the invention [3], since the material forming the protruding portion and the material forming the substrate are different materials, warping can be more sufficiently prevented for various shapes of the heat dissipation substrate. Further, by using different materials, the flow of the cooling medium generated in the gap between the warpage prevention plate and the inner surface of the jacket can be sufficiently inhibited.

[4]の発明では、反り防止板の突出部が、隣り合うフィンとフィンの間の領域に対応した領域に設けられているので、放熱基板の反りをより十分に防止できる。   In the invention as recited in the aforementioned Item [4], the protrusion of the warpage prevention plate is provided in the region corresponding to the region between the adjacent fins, so that the heat radiation substrate can be more sufficiently prevented from warping.

[5]の発明では、反り防止板の突出部は、突条部からなり、該突条部の長さ方向が、冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されているから、反り防止板とジャケットの内面との間の隙間に生じる冷却媒体の流れを十分に阻害できて、冷却性能をより一層向上させることができる。   In the invention as recited in the aforementioned Item [5], the projecting portion of the warpage prevention plate comprises a ridge, and the length direction of the ridge is arranged so as to be substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space. Therefore, the flow of the cooling medium generated in the gap between the warpage preventing plate and the inner surface of the jacket can be sufficiently inhibited, and the cooling performance can be further improved.

[6]の発明では、反り防止板の突出部は、相互に離間して配置された複数の突条部からなり、これら複数の突条部の長さ方向が、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されているから、反り防止板とジャケットの内面との間の隙間に生じる冷却媒体の流れをより十分に阻害できて、冷却性能をさらに向上させることができる。   According to the invention as recited in the aforementioned Item [6], the projecting portion of the warpage prevention plate comprises a plurality of ridges arranged apart from each other, and the length direction of the plurality of ridges is determined by the cooling direction in the cooling medium flow space. Since it is arranged so as to be substantially perpendicular to the flow direction of the medium, the flow of the cooling medium generated in the gap between the warpage prevention plate and the inner surface of the jacket can be more sufficiently hindered, and the cooling performance is further improved. be able to.

本発明に係る半導体冷却装置の一実施形態を分解状態で示す斜視図である。It is a perspective view showing one embodiment of a semiconductor cooling device concerning the present invention in an exploded state. 図1の半導体冷却装置の組み立て状態におけるA−A線断面図である。FIG. 2 is a sectional view taken along line AA in an assembled state of the semiconductor cooling device of FIG. 1. 図1の半導体冷却装置の放熱基板を反り防止板側から見た斜視図である。FIG. 2 is a perspective view of a heat dissipation board of the semiconductor cooling device of FIG. 1 as viewed from a warp prevention plate side. 本発明に係る半導体冷却装置の他の実施形態を示す断面図である。It is sectional drawing which shows other embodiment of the semiconductor cooling device which concerns on this invention. 本発明に係る半導体冷却装置のさらに他の実施形態を示す断面図である。It is sectional drawing which shows further another embodiment of the semiconductor cooling device concerning this invention. 反り防止板のさらに他の実施形態を示す斜視図である。It is a perspective view showing other embodiments of a warpage prevention board. 図6の反り防止板を用いて構成された本発明の半導体冷却装置を示す断面図である。FIG. 7 is a cross-sectional view illustrating a semiconductor cooling device of the present invention configured using the warpage prevention plate of FIG. 6. 本発明に係る半導体冷却装置のさらに他の実施形態を示す断面図である。It is sectional drawing which shows further another embodiment of the semiconductor cooling device concerning this invention.

本発明の半導体冷却装置1の一実施形態を図1、2に示す。図1は、組み立て前の分解状態で示す斜視図であり、図2は、組み立て後の半導体冷却装置を示す断面図である。   1 and 2 show an embodiment of a semiconductor cooling device 1 of the present invention. FIG. 1 is a perspective view showing an exploded state before assembly, and FIG. 2 is a sectional view showing the semiconductor cooling device after assembly.

前記半導体冷却装置1は、放熱基板10、多数のピン状のフィン11、反り防止板20およびジャケット30を備えている。前記放熱基板10は、平面視略長方形形状の板体で構成されている。通常は、前記放熱基板10は、金属材で形成されている。前記放熱基板10における一方の面(絶縁基板側とは反対側の面)の中央部に多数のフィン11が放熱基板10と一体に立設され、前記放熱基板10における前記フィン11群の周囲がフランジ部12となされている(図1〜3参照)。前記フランジ部12の四つの角部(コーナー部)にジャケット取付用孔13が穿設されている(図1、3参照)。   The semiconductor cooling device 1 includes a heat dissipation board 10, a large number of pin-shaped fins 11, a warpage prevention plate 20, and a jacket 30. The heat dissipation board 10 is formed of a plate having a substantially rectangular shape in plan view. Usually, the heat dissipation board 10 is formed of a metal material. A large number of fins 11 are erected integrally with the heat radiating substrate 10 at the center of one surface (the surface opposite to the insulating substrate side) of the heat radiating substrate 10. A flange 12 is provided (see FIGS. 1 to 3). At four corners (corners) of the flange 12, holes 13 for attaching a jacket are formed (see FIGS. 1 and 3).

前記反り防止板20は、平面寸法が前記放熱基板10より小さい大きさの平面視略長方形形状である(図3参照)。前記反り防止板20は、前記フィン11の先端にろう付けされて前記放熱基板10と平行状に配置されている(図2、3参照)。前記反り防止板20は、前記放熱基板10を構成する材料より線膨張係数の小さい材料で形成されている。   The warpage preventing plate 20 has a substantially rectangular shape in plan view having a smaller plane dimension than the heat dissipation board 10 (see FIG. 3). The warpage prevention plate 20 is brazed to the tip of the fin 11 and is disposed in parallel with the heat dissipation board 10 (see FIGS. 2 and 3). The warpage prevention plate 20 is formed of a material having a smaller linear expansion coefficient than the material of the heat dissipation board 10.

本実施形態では、前記反り防止板20は、基板20aと、該基板20aにおける放熱基板10側とは反対側の面の少なくとも一部に設けられた突出部20bとを備えてなる(図2、3参照)。前記基板20aは、前記フィン11の先端にろう付け接合された平面視略矩形状の平板からなる。前記突出部20bは、前記基板20aに設けられた突条部からなり、該突条部20bは、前記基板20aの一方の端縁部から対向する他方の端縁部まで延ばされている(図3参照)。本実施形態では、前記基板20aと前記突出部20bとは一体に形成されている。   In the present embodiment, the warpage prevention plate 20 includes a substrate 20a and a protruding portion 20b provided on at least a part of a surface of the substrate 20a opposite to the heat radiation substrate 10 (FIG. 3). The substrate 20a is formed of a flat plate having a substantially rectangular shape in plan view and brazed to the tip of the fin 11. The protruding portion 20b is composed of a protruding portion provided on the substrate 20a, and the protruding portion 20b extends from one edge of the substrate 20a to the other opposing edge ( (See FIG. 3). In the present embodiment, the substrate 20a and the protruding portion 20b are formed integrally.

前記ジャケット30は、前記フィン11群を収容する凹部(収容部)31を有する箱形(天面のない箱形)である(図1参照)。前記ジャケット30のひとつの側壁に孔33が設けられ、該側壁に対向する側壁に孔34が設けられ、これらの孔33、34は、いずれも前記ジャケット30の収容部31に連通している(図1、2参照)。前記互いに対向する側壁の各孔33、34に連通してパイプ管からなるジョイント35が取り付けられている。このジョイント35に冷却媒体の導管が接続される。また、前記ジャケット30の上面において、前記凹部(収容部)31の開口縁の近傍にこれを取り囲むように溝36が形成され、この溝36にOリング37が嵌め込まれている。また、前記ジャケット30の上面における前記溝36の外側に4つの雌ねじ部38が形成されている。   The jacket 30 has a box shape (a box shape without a top surface) having a concave portion (housing portion) 31 for housing the group of fins 11 (see FIG. 1). A hole 33 is provided on one side wall of the jacket 30, and a hole 34 is provided on a side wall opposite to the side wall, and these holes 33 and 34 are both in communication with the accommodating portion 31 of the jacket 30 ( 1 and 2). A joint 35 formed of a pipe tube is attached to communicate with the holes 33 and 34 of the side wall facing each other. A cooling medium conduit is connected to the joint 35. A groove 36 is formed on the upper surface of the jacket 30 near the opening edge of the recess (housing portion) 31 so as to surround the recess, and an O-ring 37 is fitted into the groove 36. Four female screw portions 38 are formed on the upper surface of the jacket 30 outside the groove 36.

半導体モジュール2は、絶縁基板40の一方の面に配線層41が接合され、該配線層41に半導体素子42がはんだ層43によって接合されてなる(図1、2参照)。また、前記絶縁基板40の他方の面に、半導体素子42が発する熱を前記半導体冷却装置1に伝達するための伝熱層44が接合されている。そして、前記半導体モジュール2は、伝熱層44を介して前記半導体冷却装置1の放熱基板10にろう付け接合されている(図2参照)。   The semiconductor module 2 includes a wiring layer 41 joined to one surface of an insulating substrate 40, and a semiconductor element 42 joined to the wiring layer 41 by a solder layer 43 (see FIGS. 1 and 2). Further, a heat transfer layer 44 for transferring heat generated by the semiconductor element 42 to the semiconductor cooling device 1 is joined to the other surface of the insulating substrate 40. The semiconductor module 2 is brazed to the heat dissipation board 10 of the semiconductor cooling device 1 via the heat transfer layer 44 (see FIG. 2).

前記半導体冷却装置1は、以下のようにして組み立てられて半導体モジュール2に取り付けられる。   The semiconductor cooling device 1 is assembled and attached to the semiconductor module 2 as described below.

前記半導体モジュール2が接合された放熱基板10をジャケット30に被せ、凹部31にフィン11群を収容して放熱基板10でジャケット30の(凹部31の)開口部を閉じて、放熱基板10のジャケット取付用孔13をジャケット30の雌ねじ部38に位置合わせを行う。次に、放熱基板10のジャケット取付用孔13にボルト50を挿入し、ジャケット30の雌ねじ部38に止め付ける。これにより、放熱基板10とジャケット30で取り囲まれた冷却媒体流通空間が形成され、Oリング37によって液密構造が形成される。このようにして半導体モジュール2に半導体冷却装置1が接合された液密構造において、前記反り防止板20の突出部(突条部)20bの下面が、前記ジャケット30の底壁の内面に当接して、突出部(突条部)20bの下面とジャケット30の底壁の内面との間の隙間がない状態になっている(隙間が閉塞されている)。また、前記反り防止板20の突出部(突条部)20bの長さ方向の一方の端縁が、前記ジャケット30における一方の側壁(4つの側壁のうちジョイントが取り付けられていない2つの側壁のうちの一方の側壁)の内面に当接すると共に、前記突出部(突条部)20bの長さ方向の他方の端縁が、ジャケット30の他方の側壁(4つの側壁のうちジョイントが取り付けられていない2つの側壁のうちの残りの側壁)の内面に当接している。また、前記反り防止板20の突条部20bの長さ方向は、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている(図2参照)。   The heat radiating substrate 10 to which the semiconductor module 2 is joined is put on the jacket 30, the fins 11 are accommodated in the concave portion 31, the opening of the jacket 30 (of the concave portion 31) is closed by the heat radiating substrate 10, and the jacket of the heat radiating substrate 10 is formed. The mounting hole 13 is aligned with the female screw portion 38 of the jacket 30. Next, the bolt 50 is inserted into the jacket mounting hole 13 of the heat dissipation board 10 and is fixed to the female screw portion 38 of the jacket 30. Thereby, a cooling medium circulation space surrounded by the heat dissipation substrate 10 and the jacket 30 is formed, and a liquid-tight structure is formed by the O-ring 37. In the liquid-tight structure in which the semiconductor cooling device 1 is joined to the semiconductor module 2 in this manner, the lower surface of the protrusion (protrusion) 20 b of the warpage prevention plate 20 contacts the inner surface of the bottom wall of the jacket 30. Thus, there is no gap between the lower surface of the protruding portion (projecting ridge) 20b and the inner surface of the bottom wall of the jacket 30 (the gap is closed). In addition, one end of the protrusion (protrusion) 20b of the warpage prevention plate 20 in the longitudinal direction is connected to one side wall of the jacket 30 (the two side walls of the four side walls to which no joint is attached). One of the side walls is in contact with the inner surface of the other, and the other end of the protruding portion (protrusion) 20b in the longitudinal direction is connected to the other side wall of the jacket 30 (a joint among the four side walls). Of the remaining two side walls). Further, the length direction of the protrusion 20b of the warpage prevention plate 20 is disposed so as to be substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space (see FIG. 2).

前記半導体モジュール2に接合された半導体冷却装置1において、ジャケット30の一方の側壁の孔33から冷却媒体流通空間に冷却媒体を導入すると、この冷却媒体は、反り防止板20の突出部(突条部)20bの存在により反り防止板20とジャケット30底面との間の隙間を流れることなく(前記隙間を冷却媒体が流れるのを防止できて)、前記冷却媒体流通空間のフィン11群の間の空間を通過して熱交換を行って、対向する他方の側壁の孔34から排出される(図2参照)から、優れた冷却性能が得られる。   In the semiconductor cooling device 1 joined to the semiconductor module 2, when the cooling medium is introduced into the cooling medium flow space from the hole 33 on one side wall of the jacket 30, this cooling medium is Part) due to the presence of 20b, without flowing through the gap between the warpage prevention plate 20 and the bottom surface of the jacket 30 (the cooling medium can be prevented from flowing through the gap), and between the fins 11 in the cooling medium flow space. Heat is exchanged through the space, and the heat is discharged from the hole 34 on the other side wall (see FIG. 2), so that excellent cooling performance can be obtained.

即ち、前記半導体モジュール2に接合された半導体冷却装置1において、半導体素子42が発する熱は、配線層41、絶縁基板40、伝熱層44、放熱基板10、フィン11に伝達され、フィン11から冷却媒体に排熱されるのであるが、このとき、冷却媒体は、反り防止板20の突出部(突条部)20bの存在により反り防止板20とジャケット30底面との間の隙間を流れることがないから(前記隙間を冷却媒体が流れるのを防止できるから)、優れた冷却性能が得られる(図2参照)。   That is, in the semiconductor cooling device 1 joined to the semiconductor module 2, heat generated by the semiconductor element 42 is transmitted to the wiring layer 41, the insulating substrate 40, the heat transfer layer 44, the heat dissipation substrate 10, and the fins 11, The heat is discharged to the cooling medium. At this time, the cooling medium may flow through the gap between the warpage prevention plate 20 and the bottom surface of the jacket 30 due to the presence of the protrusion (protrusion) 20 b of the warpage prevention plate 20. Since there is no cooling medium (since the cooling medium can be prevented from flowing through the gap), excellent cooling performance can be obtained (see FIG. 2).

前記放熱基板10の線膨張係数は前記絶縁基板40の線膨張係数よりも大きく、前記反り防止板20の線膨張係数は前記放熱基板10の線膨張係数よりも小さい。即ち、放熱基板10の両側に放熱基板10よりも線膨張率の小さい絶縁基板40と反り防止板20が配置されている。半導体素子42の発熱によって絶縁基板40および放熱基板10の温度が上昇すると、線膨張係数の大きい放熱基板10が絶縁基板40よりも伸びて反ろうとするが、反対側に配置された反り防止板20が放熱基板10の伸びを抑制する。その結果、放熱基板10の反りが抑制され、絶縁基板40でのクラック発生や絶縁基板の剥離を防止でき、ろう付け後の冷却での反りも防止できる。   The linear expansion coefficient of the heat dissipation substrate 10 is larger than the linear expansion coefficient of the insulating substrate 40, and the linear expansion coefficient of the warpage preventing plate 20 is smaller than the linear expansion coefficient of the heat dissipation substrate 10. That is, the insulating substrate 40 having a smaller linear expansion coefficient than the heat radiating substrate 10 and the warpage preventing plate 20 are arranged on both sides of the heat radiating substrate 10. When the temperature of the insulating substrate 40 and the heat dissipation substrate 10 rises due to the heat generated by the semiconductor element 42, the heat dissipation substrate 10 having a large linear expansion coefficient tends to extend and warp more than the insulating substrate 40, but the warpage preventing plate 20 disposed on the opposite side. Suppresses elongation of the heat dissipation board 10. As a result, warpage of the heat radiating substrate 10 is suppressed, cracks in the insulating substrate 40 and peeling of the insulating substrate can be prevented, and warpage due to cooling after brazing can also be prevented.

図5に、本発明に係る半導体冷却装置1の他の実施形態を示す。この実施形態では、前記反り防止板20は、基板20aと、該基板20aにおける放熱基板10側とは反対側の面の一部に形成された突条部20bとを備えてなり、前記基板20aと前記突出部20bとは一体に形成されており、前記突出部20bの先端は、前記基板20aの表面(下面)よりも突出している。このように基板20aと突出部20bとが一体に形成されてなる反り防止板20は、前記放熱基板10の構成材料よりも線膨張係数の小さい材料で形成されている。前記反り防止板20の基板20aにおける前記突出部20bの突出側とは反対側の面(上面)が、前記フィン11の先端にろう付け接合されている。前記突条部20bは、前記基板20aの一方の端縁部から対向する他方の端縁部まで延ばされている。また、前記反り防止板20の突条部20bの長さ方向は、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている(図5参照)。しかして、前記放熱基板10のフィン11が設けられた面側に前記ジャケット30が装着された際に前記反り防止板20の突出部20Bの先端が前記ジャケット30の内面(底面)の一部に接触することで前記反り防止板20の突出部20Bおよびその近傍部が特に内方側に(冷却媒体流通空間側に)少し変形した状態で突出部20bの先端がジャケット30の内面(底面)の一部に当接している。前記変形に対して反り防止板20が変形前の本来の形状に復帰しようとすることで反り防止板20の突出部20bの先端がジャケット30の内面(底面)の一部に十分に当接した(接触した)状態になるので、反り防止板20とジャケット30の内面との間の隙間に生じ得る冷却媒体の流れを十分に阻止できて、優れた冷却性能が得られる。   FIG. 5 shows another embodiment of the semiconductor cooling device 1 according to the present invention. In this embodiment, the warpage prevention plate 20 includes a substrate 20a and a ridge 20b formed on a part of the surface of the substrate 20a opposite to the heat radiation substrate 10 side. And the protruding portion 20b are integrally formed, and the tip of the protruding portion 20b protrudes from the surface (lower surface) of the substrate 20a. The warpage preventing plate 20 in which the substrate 20a and the protruding portion 20b are integrally formed is formed of a material having a smaller linear expansion coefficient than the material of the heat dissipation substrate 10. The surface (upper surface) of the warpage preventing plate 20 on the side opposite to the protruding side of the protruding portion 20b of the substrate 20a is brazed to the tip of the fin 11. The ridge 20b extends from one edge of the substrate 20a to the other opposite edge. Further, the length direction of the protruding ridge portion 20b of the warpage prevention plate 20 is disposed so as to be substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space (see FIG. 5). Thus, when the jacket 30 is mounted on the surface of the heat dissipation board 10 on which the fins 11 are provided, the tip of the projecting portion 20B of the warpage prevention plate 20 becomes part of the inner surface (bottom surface) of the jacket 30. With the contact, the projecting portion 20B of the warpage preventing plate 20 and the vicinity thereof are particularly slightly deformed inward (toward the cooling medium flow space side), and the tip of the projecting portion 20b is formed on the inner surface (bottom surface) of the jacket 30. Abuts part. The tip of the protruding portion 20b of the warpage prevention plate 20 sufficiently abuts a part of the inner surface (bottom surface) of the jacket 30 by the warpage prevention plate 20 trying to return to the original shape before the deformation. Since it is in the (contacted) state, the flow of the cooling medium that may occur in the gap between the warpage prevention plate 20 and the inner surface of the jacket 30 can be sufficiently prevented, and excellent cooling performance can be obtained.

図7に、本発明に係る半導体冷却装置1のさらに他の実施形態を示す。この実施形態では、前記反り防止板20は、波板からなり(図6参照)、即ち基板20aと、該基板20aにおける放熱基板10側とは反対側の面の一部に形成された複数条の突条部20bとを備えてなり、前記基板20aと前記突出部20bとは一体に形成されていて、前記突出部20bの先端は、前記基板20aの表面(下面)よりも突出している。このように基板20aと突出部20bとが一体に形成されてなる波板形状の反り防止板20は、前記放熱基板10の構成材料よりも線膨張係数の小さい材料で形成されている。前記反り防止板20の基板20aにおける前記突出部20bの突出側とは反対側の面(上面)が、前記フィン11の先端にろう付け接合されている(図7参照)。前記突条部20bは、前記基板20aの一方の端縁部から対向する他方の端縁部まで延ばされている(図6参照)。また、前記反り防止板20の複数の突条部20bの長さ方向は、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている(図7参照)。しかして、前記放熱基板10のフィン11が設けられた面側に前記ジャケット30が装着された際に前記反り防止板20の突出部20Bの先端が前記ジャケット30の内面(底面)の一部に接触することで前記反り防止板20の突出部20Bおよびその近傍部が特に内方側に(冷却媒体流通空間側に)少し変形した状態で突出部20bの先端がジャケット30の内面(底面)の一部に当接している。前記変形に対して反り防止板20が変形前の本来の形状に復帰しようとすることで反り防止板20の突出部20bの先端がジャケット30の内面の一部に十分に当接した状態になるので、反り防止板20とジャケット30の内面との間の隙間に生じ得る冷却媒体の流れを十分に阻止できて、優れた冷却性能が得られる。   FIG. 7 shows still another embodiment of the semiconductor cooling device 1 according to the present invention. In this embodiment, the warpage preventing plate 20 is formed of a corrugated plate (see FIG. 6), that is, a plurality of strips formed on a substrate 20a and a part of the surface of the substrate 20a opposite to the heat radiation substrate 10 side. The substrate 20a and the projecting portion 20b are integrally formed, and the tip of the projecting portion 20b projects beyond the surface (lower surface) of the substrate 20a. Thus, the corrugated plate-like warpage preventing plate 20 in which the substrate 20a and the protruding portion 20b are integrally formed is formed of a material having a smaller linear expansion coefficient than the constituent material of the heat radiation substrate 10. The surface (upper surface) of the warpage prevention plate 20 on the side opposite to the projecting side of the projecting portion 20b of the substrate 20a is brazed to the tip of the fin 11 (see FIG. 7). The ridge 20b extends from one edge of the substrate 20a to the other opposite edge (see FIG. 6). The length direction of the plurality of ridges 20b of the warpage prevention plate 20 is disposed so as to be substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space (see FIG. 7). Thus, when the jacket 30 is mounted on the surface of the heat dissipation board 10 on which the fins 11 are provided, the tip of the projecting portion 20B of the warpage prevention plate 20 becomes part of the inner surface (bottom surface) of the jacket 30. With the contact, the projecting portion 20B of the warpage preventing plate 20 and the vicinity thereof are particularly slightly deformed inward (toward the cooling medium flow space side), and the tip of the projecting portion 20b is formed on the inner surface (bottom surface) of the jacket 30. Abuts part. When the warp prevention plate 20 attempts to return to the original shape before the deformation, the distal end of the protruding portion 20b of the warp prevention plate 20 is brought into a state in which it is sufficiently in contact with a part of the inner surface of the jacket 30. Therefore, it is possible to sufficiently prevent the flow of the cooling medium that may occur in the gap between the warpage prevention plate 20 and the inner surface of the jacket 30, and to obtain excellent cooling performance.

図8に、本発明に係る半導体冷却装置1のさらに他の実施形態を示す。この実施形態では、前記反り防止板20は、基板20aと、該基板20aにおける放熱基板10側とは反対側の面の一部に形成された2条の突条部20bとを備えてなり、前記基板20aと前記突条部20bとは一体に形成されており、前記突条部20bの先端は、前記基板20aの表面(下面)よりも突出している。前記反り防止板の突条部20bは、いずれも、隣り合うフィン11とフィン11の間の領域に対応した領域に設けられている(図8参照)。このように基板20aと突出部20bとが一体に形成されてなる反り防止板20は、前記放熱基板10の構成材料よりも線膨張係数の小さい材料で形成されている。前記反り防止板20の基板20aにおける前記突出部20bの突出側とは反対側の面(上面)が、前記フィン11の先端にろう付け接合されている。前記突条部20bは、前記基板20aの一方の端縁部から対向する他方の端縁部まで延ばされている。また、前記反り防止板20の突条部20bの長さ方向は、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている(図8参照)。しかして、前記放熱基板10のフィン11が設けられた面側に前記ジャケット30が装着された際に前記反り防止板20の突出部20Bの先端が前記ジャケット30の内面(底面)の一部に接触することで前記反り防止板20の突出部20Bおよびその近傍部が特に内方側に(冷却媒体流通空間側に)少し変形した状態で突出部20bの先端がジャケット30の内面(底面)の一部に当接している。前記変形に対して反り防止板20が変形前の本来の形状に復帰しようとすることで反り防止板20の突出部20bの先端がジャケット30の内面(底面)の一部に十分に当接した(接触した)状態になるので、反り防止板20とジャケット30の内面との間の隙間に生じ得る冷却媒体の流れを十分に阻止できて、優れた冷却性能が得られる。   FIG. 8 shows still another embodiment of the semiconductor cooling device 1 according to the present invention. In this embodiment, the warpage prevention plate 20 includes a substrate 20a, and two protruding ridges 20b formed on a part of a surface of the substrate 20a opposite to the heat dissipation substrate 10 side, The substrate 20a and the ridge 20b are formed integrally, and the tip of the ridge 20b protrudes from the surface (lower surface) of the substrate 20a. Each of the protrusions 20b of the warpage prevention plate is provided in a region corresponding to a region between the adjacent fins 11 (see FIG. 8). The warpage preventing plate 20 in which the substrate 20a and the protruding portion 20b are integrally formed is formed of a material having a smaller linear expansion coefficient than the material of the heat dissipation substrate 10. The surface (upper surface) of the warpage preventing plate 20 on the side opposite to the protruding side of the protruding portion 20b of the substrate 20a is brazed to the tip of the fin 11. The ridge 20b extends from one edge of the substrate 20a to the other opposite edge. Further, the length direction of the protrusion 20b of the warpage prevention plate 20 is disposed so as to be substantially orthogonal to the flow direction of the cooling medium in the cooling medium flow space (see FIG. 8). Thus, when the jacket 30 is mounted on the surface of the heat dissipation board 10 on which the fins 11 are provided, the tip of the projecting portion 20B of the warpage prevention plate 20 becomes part of the inner surface (bottom surface) of the jacket 30. With the contact, the projecting portion 20B of the warpage preventing plate 20 and the vicinity thereof are particularly slightly deformed inward (toward the cooling medium flow space side), and the tip of the projecting portion 20b is formed on the inner surface (bottom surface) of the jacket 30. Abuts part. The tip of the protruding portion 20b of the warpage prevention plate 20 sufficiently abuts a part of the inner surface (bottom surface) of the jacket 30 by the warpage prevention plate 20 trying to return to the original shape before the deformation. Since it is in the (contacted) state, the flow of the cooling medium that may occur in the gap between the warpage prevention plate 20 and the inner surface of the jacket 30 can be sufficiently prevented, and excellent cooling performance can be obtained.

本発明において、放熱基板10とフィン11は、一体成形物であってもよいし、相互に接合されてなる接合物であってもよい。   In the present invention, the heat radiating substrate 10 and the fins 11 may be an integrally molded product, or may be a joined product joined to each other.

前記放熱基板10を構成する材料としては、純アルミニウム、アルミニウム合金、純銅、銅合金などの高熱伝導性材料が好ましい。これらの金属の線膨張係数は、後述する絶縁基板40を構成する材料の線膨張係数よりも大きい。   As a material constituting the heat dissipation board 10, a high heat conductive material such as pure aluminum, aluminum alloy, pure copper, and copper alloy is preferable. The linear expansion coefficients of these metals are larger than the linear expansion coefficients of the materials forming the insulating substrate 40 described later.

前記フィン11の形状は、図示例の横断面円形のピン形状(図3参照)に特に限定されるものではなく、例えば、横断面菱形のピン形状であってもよいし、或いは冷却媒体の流れを阻害しない方向に延ばされた略板状のストレートフィンであってもよい。前記フィン11は、熱、温度変化、冷却媒体等の影響により変形するものでない、又は変形し難いものであるのが好ましい。フィン11が変形すると、反り防止板20による放熱基板10の反り防止効果が低下するため、フィン11は高剛性材で形成されているのが好ましい。このような高剛性のフィン11としては、特に限定されるものではないが、例えば、ピンフィン、角柱フィン、菱形フィンと呼ばれる支柱形状のフィンが挙げられ、略板状のフィンでは高さ15mm以下、板厚0.2mm以上で隣り合うフィン間の隙間(離間間隔)が2mm以下に設定されたものが挙げられる。   The shape of the fin 11 is not particularly limited to the pin shape having a circular cross section in the illustrated example (see FIG. 3), and may be, for example, a pin shape having a rhombic cross section, or a flow of a cooling medium. It may be a substantially plate-shaped straight fin extended in a direction that does not hinder the straight fin. The fins 11 are preferably not deformed or hardly deformed by the influence of heat, temperature change, cooling medium and the like. When the fins 11 are deformed, the effect of the warpage prevention plate 20 for preventing the heat dissipation substrate 10 from being warped is reduced. Therefore, the fins 11 are preferably formed of a highly rigid material. Examples of such high rigidity fins 11 include, but are not particularly limited to, pin-shaped fins, prismatic fins, and pillar-shaped fins called rhombic fins. A fin having a thickness of 0.2 mm or more and a gap (separation interval) between adjacent fins set to 2 mm or less may be used.

前記フィン11を構成する材料としては、純アルミニウム、アルミニウム合金、純銅、銅合金等の高熱伝導性材料が好ましい。   As a material for forming the fin 11, a high heat conductive material such as pure aluminum, an aluminum alloy, pure copper, and a copper alloy is preferable.

前記反り防止板20を構成する材料としては、前記放熱基板10の構成材料よりも線膨張係数の小さい材料を用いる。純アルミニウムよりも線膨張係数が小さい材料を用いるのが好ましく、例えば、AlN、SiN、アルミニウムめっき鋼板、ニッケルめっき鋼板の他、これらの複合材等を例示できる。   As a material forming the warpage prevention plate 20, a material having a smaller linear expansion coefficient than a material forming the heat dissipation board 10 is used. It is preferable to use a material having a smaller linear expansion coefficient than pure aluminum, and examples thereof include AlN, SiN, an aluminum-plated steel sheet, a nickel-plated steel sheet, and a composite material thereof.

前記反り防止板20の厚さは、0.2mm〜5mmであるのが好ましく、中でも0.2mm〜2mmであるのが特に好ましい。   The thickness of the warpage preventing plate 20 is preferably 0.2 mm to 5 mm, and particularly preferably 0.2 mm to 2 mm.

上記実施形態(図2)では、反り防止板20を構成する基板20aと突出部20bとは、一体に形成されていたが、反り防止板20は、例えば、別部材である基板20aと突出部20bとが接合されてなる構成であってもよい(図4参照)。このような別部材の構成としては、例えば、前記放熱基板10の構成材料よりも線膨張係数の小さい材料で形成された基板20aと、該基板20aにおける前記放熱基板10側とは反対側の面の少なくとも一部に接合された突出部20bとを備えた構成であって、前記突出部20bが、アルミニウム、アルミニウム合金、鉄、SUS、樹脂又はゴム等からなる構成が挙げられる。   In the above-described embodiment (FIG. 2), the board 20a and the protruding portion 20b that constitute the warpage prevention plate 20 are formed integrally. 20b may be joined (see FIG. 4). As a configuration of such another member, for example, a substrate 20a formed of a material having a smaller linear expansion coefficient than the constituent material of the heat radiation substrate 10 and a surface of the substrate 20a opposite to the heat radiation substrate 10 side And a projecting portion 20b joined to at least a part thereof, wherein the projecting portion 20b is made of aluminum, an aluminum alloy, iron, SUS, resin, rubber, or the like.

前記ジャケット30を構成する材料としては、特に限定されるものではないが、例えば、純アルミニウム、アルミニウム合金、アルミニウム複合材、樹脂等が挙げられる。なお、放熱基板10とジャケット30で形成される液密構造は、特に限定されず、例えば、上記実施形態のようなボルト50等を用いたものであってもよいし、その他の液密構造としてもよい。   The material forming the jacket 30 is not particularly limited, and examples thereof include pure aluminum, an aluminum alloy, an aluminum composite material, and a resin. The liquid-tight structure formed by the heat-radiating substrate 10 and the jacket 30 is not particularly limited. For example, the liquid-tight structure using the bolt 50 or the like as in the above embodiment may be used. Is also good.

なお、前記絶縁基板40を構成する材料は、電気絶縁性に優れていると共に、熱伝導性が良くて放熱性に優れている材料であるのが好ましく、このような好適材料として、窒化アルミニウム、酸化アルミニウム、窒化ケイ素、酸化ジルコニウム、炭化ケイ素等のセラミックを例示できる。   The material forming the insulating substrate 40 is preferably a material having excellent electrical insulation properties and also having good heat conductivity and excellent heat dissipation. As such suitable materials, aluminum nitride, Ceramics such as aluminum oxide, silicon nitride, zirconium oxide, and silicon carbide can be exemplified.

前記配線層41および前記伝熱層44を構成する材料としては、導電性に優れかつ熱伝導性に優れた材料を用いるのが好ましく、このような好適材料として、純アルミニウム、アルミニウム合金、純銅、銅合金等を例示できる。   As a material for forming the wiring layer 41 and the heat transfer layer 44, it is preferable to use a material having excellent conductivity and excellent heat conductivity. As such a suitable material, pure aluminum, an aluminum alloy, pure copper, A copper alloy or the like can be exemplified.

なお、上記実施形態では、半導体モジュール2の絶縁基板40と、半導体冷却装置1の放熱基板10とが伝熱層44を介して接合されていたが、このような伝熱層を介さずに絶縁基板40と放熱基板10とが直接に接合された構成を採用してもよい。   In the above-described embodiment, the insulating substrate 40 of the semiconductor module 2 and the heat radiating substrate 10 of the semiconductor cooling device 1 are joined via the heat transfer layer 44. A configuration in which the substrate 40 and the heat radiation substrate 10 are directly joined may be employed.

本発明に係る半導体冷却装置は、例えば、発熱量の大きい半導体素子の冷却装置として好適に用いられる。   The semiconductor cooling device according to the present invention is suitably used, for example, as a cooling device for a semiconductor element generating a large amount of heat.

1…半導体冷却装置
2…半導体モジュール
10…放熱基板
11…フィン
20…反り防止板
20a…基板
20b…突出部
30…ジャケット
40…絶縁基板
41…配線層
42…半導体素子
DESCRIPTION OF SYMBOLS 1 ... Semiconductor cooling device 2 ... Semiconductor module 10 ... Heat dissipation board 11 ... Fin 20 ... Warpage prevention plate 20a ... Substrate 20b ... Projection part 30 ... Jacket 40 ... Insulating substrate 41 ... Wiring layer 42 ... Semiconductor element

Claims (6)

絶縁基板の一方の面に配線層を介して半導体素子が搭載される半導体モジュールに接合される半導体冷却装置であり、
前記絶縁基板の他方の面側に接合される放熱基板と、
前記放熱基板における前記絶縁基板側とは反対側の面に設けられた複数のフィンと、
前記フィンの先端に接合され、前記放熱基板の材料より線膨張係数の小さい材料で形成された反り防止板と、
前記放熱基板のフィンが設けられた面側に装着されて、前記放熱基板との間に前記フィンを収容して冷却媒体流通空間を形成したジャケットと、を備え、
前記反り防止板は、基板と、該基板における前記放熱基板側とは反対側の面の少なくとも一部に設けられた突出部と、を備え、
前記突出部の先端が前記ジャケットの内面の一部に当接していることを特徴とする半導体冷却装置。
A semiconductor cooling device that is joined to a semiconductor module in which a semiconductor element is mounted on one surface of an insulating substrate via a wiring layer,
A heat dissipation substrate joined to the other surface side of the insulating substrate,
A plurality of fins provided on a surface of the heat dissipation substrate opposite to the insulating substrate side,
A warp prevention plate joined to a tip of the fin and formed of a material having a smaller linear expansion coefficient than a material of the heat dissipation board;
A jacket mounted on the fin-provided surface side of the heat-dissipating substrate and containing the fin between the heat-dissipating substrate and a cooling medium flow space;
The warpage prevention plate includes a substrate and a protrusion provided on at least a part of a surface of the substrate opposite to the heat radiation substrate,
A semiconductor cooling device, wherein a tip of the protruding portion is in contact with a part of an inner surface of the jacket.
前記放熱基板のフィンが設けられた面側に前記ジャケットが装着された際に前記反り防止板の突出部の先端が前記ジャケットの内面の一部に接触することで前記反り防止板の少なくとも一部が変形した状態で前記突出部の先端が前記ジャケットの内面の一部に当接している請求項1に記載の半導体冷却装置。   When the jacket is mounted on the surface of the heat dissipation board on which the fins are provided, the tip of the protrusion of the warpage prevention plate contacts a part of the inner surface of the jacket so that at least a part of the warpage prevention plate is provided. 2. The semiconductor cooling device according to claim 1, wherein a tip of the protruding portion abuts a part of an inner surface of the jacket in a state where is deformed. 3. 前記突出部は、前記基板を構成する材料とは異なる材料で形成されている請求項1または2に記載の半導体冷却装置。   The semiconductor cooling device according to claim 1, wherein the protrusion is formed of a material different from a material forming the substrate. 前記反り防止板の突出部が、隣り合うフィンとフィンの間の領域に対応した領域に設けられている請求項1〜3のいずれか1項に記載の半導体冷却装置。   The semiconductor cooling device according to claim 1, wherein the protrusion of the warpage prevention plate is provided in a region corresponding to a region between adjacent fins. 前記反り防止板の突出部は、突条部からなり、該突条部の長さ方向が、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている請求項1〜4のいずれか1項に記載の半導体冷却装置。   The projecting portion of the warpage prevention plate comprises a projecting portion, and a longitudinal direction of the projecting portion is disposed so as to be substantially orthogonal to a flow direction of the cooling medium in the cooling medium flow space. The semiconductor cooling device according to any one of claims 1 to 4. 前記反り防止板の突出部は、相互に離間して配置された複数の突条部からなり、これら複数の突条部の長さ方向が、前記冷却媒体流通空間における冷却媒体の流れ方向に対して略直交するように配置されている請求項1〜4のいずれか1項に記載の半導体冷却装置。   The protrusion of the warpage prevention plate is composed of a plurality of ridges arranged apart from each other, and the length direction of the plurality of ridges is set with respect to the flow direction of the cooling medium in the cooling medium flow space. The semiconductor cooling device according to any one of claims 1 to 4, wherein the semiconductor cooling device is disposed so as to be substantially orthogonal.
JP2018152824A 2018-08-15 2018-08-15 Semiconductor cooling device Active JP7068097B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018152824A JP7068097B2 (en) 2018-08-15 2018-08-15 Semiconductor cooling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018152824A JP7068097B2 (en) 2018-08-15 2018-08-15 Semiconductor cooling device

Publications (2)

Publication Number Publication Date
JP2020027901A true JP2020027901A (en) 2020-02-20
JP7068097B2 JP7068097B2 (en) 2022-05-16

Family

ID=69620363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018152824A Active JP7068097B2 (en) 2018-08-15 2018-08-15 Semiconductor cooling device

Country Status (1)

Country Link
JP (1) JP7068097B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021124704A1 (en) * 2019-12-19 2021-06-24 富士電機株式会社 Semiconductor device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110108247A1 (en) * 2009-11-12 2011-05-12 Toyota Jidosha Kabushiki Kaisha Cooling apparatus for semiconductor element
JP2012156322A (en) * 2011-01-26 2012-08-16 Toyota Motor Corp Heat exchanger
WO2014045758A1 (en) * 2012-09-19 2014-03-27 富士電機株式会社 Power semiconductor module
JP2016219572A (en) * 2015-05-19 2016-12-22 昭和電工株式会社 Liquid cooling cooler
JP2017092468A (en) * 2015-11-10 2017-05-25 昭和電工株式会社 Power module basis

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110108247A1 (en) * 2009-11-12 2011-05-12 Toyota Jidosha Kabushiki Kaisha Cooling apparatus for semiconductor element
JP2011108683A (en) * 2009-11-12 2011-06-02 Nippon Soken Inc Cooling apparatus for semiconductor element
JP2012156322A (en) * 2011-01-26 2012-08-16 Toyota Motor Corp Heat exchanger
WO2014045758A1 (en) * 2012-09-19 2014-03-27 富士電機株式会社 Power semiconductor module
JP2016219572A (en) * 2015-05-19 2016-12-22 昭和電工株式会社 Liquid cooling cooler
JP2017092468A (en) * 2015-11-10 2017-05-25 昭和電工株式会社 Power module basis

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021124704A1 (en) * 2019-12-19 2021-06-24 富士電機株式会社 Semiconductor device
JPWO2021124704A1 (en) * 2019-12-19 2021-06-24
JP7160216B2 (en) 2019-12-19 2022-10-25 富士電機株式会社 semiconductor equipment

Also Published As

Publication number Publication date
JP7068097B2 (en) 2022-05-16

Similar Documents

Publication Publication Date Title
KR101384426B1 (en) Base for power module
EP3503701B1 (en) Heat sink, heat dissipation apparatus, heat dissipation system and communication device
US6554060B2 (en) Heat sink with fins
US7967059B2 (en) Heat dissipation device
US7414844B2 (en) Liquid cooled heat sink with cold plate retention mechanism
US8120917B2 (en) Heat dissipation device
TW202026583A (en) Heatsink
EP2061079B1 (en) Semiconductor package and semiconductor package assembly
JP2005057088A (en) Heat-conductive member of multilayer structure and electronic apparatus using it
JP2008270297A (en) Power unit and heat dissipation container
JPH042156A (en) Power semiconductor device
JP2007141932A (en) Power module base
JP7068097B2 (en) Semiconductor cooling device
CN111164748B (en) Semiconductor cooling device
JP2008124187A (en) Base for power module
JP2006210611A (en) Heat sink equipped with radiation fin, and manufacturing method thereof
JP7064974B2 (en) Semiconductor cooling device
JP7064989B2 (en) Semiconductor cooling device
JP2006140390A (en) Power semiconductor equipment
JP7275505B2 (en) semiconductor equipment
JP5117303B2 (en) heatsink
CN219919561U (en) Heat radiation structure and heat radiation device
JP3576431B2 (en) Electronic circuit board cooling structure
JP5227681B2 (en) Semiconductor device
JP2019092337A (en) Heat sink and power conversion equipment

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20210520

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20220330

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20220412

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20220428

R150 Certificate of patent or registration of utility model

Ref document number: 7068097

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: R3D02

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350