JP2018500544A - 顕微鏡用の検出装置 - Google Patents
顕微鏡用の検出装置 Download PDFInfo
- Publication number
- JP2018500544A JP2018500544A JP2017524347A JP2017524347A JP2018500544A JP 2018500544 A JP2018500544 A JP 2018500544A JP 2017524347 A JP2017524347 A JP 2017524347A JP 2017524347 A JP2017524347 A JP 2017524347A JP 2018500544 A JP2018500544 A JP 2018500544A
- Authority
- JP
- Japan
- Prior art keywords
- beam path
- light
- detection device
- spectral
- spectral portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 88
- 230000003595 spectral effect Effects 0.000 claims abstract description 198
- 230000003287 optical effect Effects 0.000 claims abstract description 61
- 230000004075 alteration Effects 0.000 claims description 71
- 201000009310 astigmatism Diseases 0.000 claims description 24
- 238000003384 imaging method Methods 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 8
- 230000000295 complement effect Effects 0.000 claims description 7
- 238000000354 decomposition reaction Methods 0.000 claims description 7
- 238000011144 upstream manufacturing Methods 0.000 claims description 5
- 238000001228 spectrum Methods 0.000 description 20
- 238000000034 method Methods 0.000 description 13
- 238000000926 separation method Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 6
- 239000006185 dispersion Substances 0.000 description 5
- 238000005286 illumination Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000004624 confocal microscopy Methods 0.000 description 4
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 239000003086 colorant Substances 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000386 microscopy Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000011896 sensitive detection Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000023077 detection of light stimulus Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/14—Generating the spectrum; Monochromators using refracting elements, e.g. prisms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
- G02B27/1013—Beam splitting or combining systems for splitting or combining different wavelengths for colour or multispectral image sensors, e.g. splitting an image into monochromatic image components on respective sensors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/12—Beam splitting or combining systems operating by refraction only
- G02B27/126—The splitting element being a prism or prismatic array, including systems based on total internal reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
- G01N2021/6421—Measuring at two or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Spectrometry And Color Measurement (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
Claims (14)
- 顕微鏡(100)用の検出装置(113)であって、
前記検出装置は、前記顕微鏡(100)の標本領域(112)からの光のスペクトル部分(401)を選択的に検出するように構成され、
前記検出装置(113)は、
前記光のビーム経路(290)内に配置された分散要素(211)と、
前記光の前記ビーム経路(290)から前記光の前記スペクトル部分(401)のビーム経路(291)を分離するように、前記光の前記ビーム経路(290)内の前記分散要素(211)の下流に配置された選択要素(212)と、
前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記選択要素(212)の下流に配置され、前記光の前記スペクトル部分(401)の前記ビーム経路(291)を、センサ(214)上に集束するように構成された集束光学ユニット(213)と、
前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記集束光学ユニット(213)の下流に配置された前記センサ(214)とを含む、
検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内に配置された横方向色収差補正要素(311)を含み、
前記選択要素(212)は、少なくとも1つのくさび形プリズム(212−1,212−2)を含み、
前記横方向色収差補正要素(311)は、少なくとも1つのくさび形プリズム(311−1,311−2)を含み、
前記選択要素(212)及び前記横方向色収差補正要素(311)は、前記選択要素(212)の前記少なくとも1つのくさび形プリズム(212−1,212−2)の横方向色収差が、前記横方向色収差補正要素(311)の前記少なくとも1つのくさび形プリズム(311−1,311−2)のさらなる横方向色収差を打ち消すように、互いに対して配置され得る、
請求項1に記載の検出装置(113)。 - 前記選択要素(212)の前記少なくとも1つのくさび形プリズム(212−1,212−2)及び前記横方向色収差補正要素(311)の前記少なくとも1つのくさび形プリズム(311−1,311−2)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)に関して、互いに相補的に配置される、
請求項2に記載の検出装置(113)。 - 前記選択要素(212)の前記少なくとも1つのプリズム(212−1,212−2)の材料は、前記横方向色収差補正要素(311)の前記少なくとも1つのプリズム(311−1,311−2)の材料に対応し、
前記選択要素(212)の前記少なくとも1つのプリズム(212−1,212−2)のくさび角は、前記横方向色収差補正要素(311)の前記少なくとも1つのプリズム(311−1,311−2)のくさび角に対応する、
請求項3に記載の検出装置(113)。 - 前記検出装置(113)は、前記光の前記ビーム経路(290)内に変位可能に配置された前記選択要素(212)の位置を決めるように構成され、かつ、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内に変位可能に配置された前記横方向色収差補正要素(311)の位置を決めるようにさらに構成された駆動ユニットをさらに含み、
前記駆動ユニットは、前記選択要素(212)及び前記横方向色収差補正要素(311)を、結合された態様で位置決めするように構成される、
請求項2乃至4のいずれか一項に記載の検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記センサ(214)の上流に配置された収集要素(312)を含み、
前記分散要素(211)は、プリズム及び格子の少なくとも一方であり、
前記収集要素(312)は、プリズム及び格子の少なくとも一方であり、
前記分散要素(211)は、前記光の前記ビーム経路(290)のスペクトル分解をもたらし、
前記収集要素(312)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)のスペクトル統一をもたらす、
請求項1乃至5のいずれか一項に記載の検出装置(113)。 - 前記検出装置(113)は、少なくとも部分的に、前記光の前記ビーム経路(290)内及び前記光の前記スペクトル部分(401)の前記ビーム経路(291)内における前記分散要素(211)と前記収集要素(312)との間に配置された結像光学系(703,704,901,902)をさらに含み、
前記結像光学系(703,704,901,902)は、前記収集要素(312)上に前記分散要素(211)の光画像を得るように構成される、
請求項6に記載の検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)の非点収差を低減するように構成された非点収差補正ユニットを含む、
請求項1乃至7のいずれか一項に記載の検出装置(113)。 - 前記選択要素(212)は、前記光の前記ビーム経路(290)から前記光のさらなるスペクトル部分(402)のビーム経路(292)を分離するように、前記光のビーム経路(290)内に配置され、
前記検出装置(113)は、
前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)内の前記選択要素(212)の下流に配置され、前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)をさらなるセンサ上に集束させるように構成された、さらなる集束光学ユニットと、
前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)内の前記さらなる集光光学ユニットの下流に配置された、前記さらなるセンサとを含む、
請求項1乃至8のいずれか一項に記載の検出装置(113)。 - 前記センサ(214)は、0.1mm2より小さく、好ましくは1mm2より小さく、特に好ましくは100mm2より小さい感知領域を有し、
前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)を前記センサ(214)の前記感知領域上に集束させるように構成される、
請求項1乃至9のいずれか一項に記載の検出装置(113)。 - 前記センサ(214)は、複数の画素を含む、
請求項1乃至10のいずれか一項に記載の検出装置(113)。 - 前記選択要素(212)は、少なくとも1つの傾斜ミラーを含む、
請求項1乃至11のいずれか一項に記載の検出装置(113)。 - 請求項1乃至12のいずれか一項に記載の検出装置(113)を含む顕微鏡(100)。
- 前記顕微鏡(100)は共焦点顕微鏡である、
請求項13に記載の顕微鏡(100)。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102014116782.1A DE102014116782A1 (de) | 2014-11-17 | 2014-11-17 | Detektorvorrichtung für ein Mikroskop |
DE102014116782.1 | 2014-11-17 | ||
PCT/EP2015/075811 WO2016078925A1 (de) | 2014-11-17 | 2015-11-05 | Detektorvorrichtung zur detektion eines spektralen teilbereichs für ein mikroskop |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019073286A Division JP2019144570A (ja) | 2014-11-17 | 2019-04-08 | 顕微鏡用の検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018500544A true JP2018500544A (ja) | 2018-01-11 |
JP6510044B2 JP6510044B2 (ja) | 2019-05-08 |
Family
ID=54396905
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017524347A Active JP6510044B2 (ja) | 2014-11-17 | 2015-11-05 | 顕微鏡用の検出装置 |
JP2019073286A Pending JP2019144570A (ja) | 2014-11-17 | 2019-04-08 | 顕微鏡用の検出装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019073286A Pending JP2019144570A (ja) | 2014-11-17 | 2019-04-08 | 顕微鏡用の検出装置 |
Country Status (4)
Country | Link |
---|---|
US (2) | US10132685B2 (ja) |
JP (2) | JP6510044B2 (ja) |
DE (1) | DE102014116782A1 (ja) |
WO (1) | WO2016078925A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021524597A (ja) * | 2018-08-10 | 2021-09-13 | ペルキネルマー ヘルス サイエンシーズ, インコーポレイテッド | 再帰反射性表面を有する分光計及び関連する器具 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014116782A1 (de) * | 2014-11-17 | 2016-05-19 | Carl Zeiss Microscopy Gmbh | Detektorvorrichtung für ein Mikroskop |
DE102015109674A1 (de) * | 2015-06-17 | 2016-12-22 | Carl Zeiss Microscopy Gmbh | Verfahren zur Bestimmung und Kompensation geometrischer Abbildungsfehler |
EP3494429A1 (de) * | 2016-08-02 | 2019-06-12 | Leica Microsystems CMS GmbH | Mikroskop, insbesondere lichtscheiben- oder konfokalmikroskop und nachrüstsatz für ein mikroskop |
DE102016119730A1 (de) * | 2016-10-17 | 2018-04-19 | Carl Zeiss Microscopy Gmbh | Optikgruppe für Detektionslicht für ein Mikroskop, Verfahren zur Mikroskopie und Mikroskop |
DE102016120308A1 (de) | 2016-10-25 | 2018-04-26 | Carl Zeiss Microscopy Gmbh | Optische Anordnung, Multispot-Scanning-Mikroskop und Verfahren zum Betreiben eines Mikroskops |
US11506877B2 (en) | 2016-11-10 | 2022-11-22 | The Trustees Of Columbia University In The City Of New York | Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees |
US10277842B1 (en) * | 2016-11-29 | 2019-04-30 | X Development Llc | Dynamic range for depth sensing |
CN106969710B (zh) * | 2017-05-26 | 2023-05-19 | 四川瑞丰锻造有限公司 | 便于检测的稳定型分光器 |
US10571687B2 (en) * | 2018-02-05 | 2020-02-25 | Goodrich Corporation | Imaging systems and methods |
DE102020120114A1 (de) | 2020-07-30 | 2022-02-03 | Abberior Instruments Gmbh | Detektionseinrichtung für ein Laserscanning-Mikroskop |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02502588A (ja) * | 1987-12-22 | 1990-08-16 | ヒューズ―ジェイブイシー・テクノロジー・コーポレーション | 色補正器向け浸込み型プリズムおよびこのプリズムを用いたカラープロジェクション装置 |
JP2000056233A (ja) * | 1998-08-04 | 2000-02-25 | Carl Zeiss Jena Gmbh | 顕微鏡の照射光路における波長または波長領域を調整下で集束化するための装置 |
JP2002530716A (ja) * | 1998-11-19 | 2002-09-17 | メディカル リサーチ カウンシル | 走査共焦点光学顕微鏡システム |
US20050174425A1 (en) * | 2002-04-26 | 2005-08-11 | Martin Harris | Laser scanning confocal microscope with fibre bundle return |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4193691A (en) * | 1977-05-02 | 1980-03-18 | Rca Corporation | Spectrometer |
CA2084923A1 (en) * | 1991-12-20 | 1993-06-21 | Ronald E. Stafford | Slm spectrometer |
DE4330347C2 (de) | 1993-09-08 | 1998-04-09 | Leica Lasertechnik | Verwendung einer Vorrichtung zur Selektion und Detektion mindestens zweier Spektralbereiche eines Lichtstrahls |
DE19902625A1 (de) | 1998-01-28 | 1999-09-30 | Leica Microsystems | Vorrichtung zur gleichzeitigen Detektion mehrerer Spektralbereiche eines Lichtstrahls |
DE19842288A1 (de) | 1998-08-04 | 2000-02-10 | Zeiss Carl Jena Gmbh | Einstellbare Einkopplung und/oder Detektion einer oder mehrerer Wellenlängen in einem Mikroskop |
JP4270610B2 (ja) | 1998-09-24 | 2009-06-03 | オリンパス株式会社 | 走査型光学顕微鏡 |
DE102004058833A1 (de) * | 2004-12-06 | 2006-06-08 | Leica Microsystems Cms Gmbh | Optische Anordnung für ein Mikroskop und ein Mikroskop |
US8049885B1 (en) * | 2008-05-15 | 2011-11-01 | Ondax, Inc. | Method and apparatus for large spectral coverage measurement of volume holographic gratings |
DE102009006728A1 (de) * | 2009-01-29 | 2010-08-05 | Carl Zeiss Microimaging Gmbh | Optische Anordnung im Detektionsstrahlengang eines Laser-Scanning-Mikroskopes |
DE102009043745A1 (de) * | 2009-09-30 | 2011-04-07 | Carl Zeiss Microlmaging Gmbh | Spektraldetektor mit variabler Filterung durch räumliche Farbtrennung und Laser-Scanning- Mikroskop |
US20130077086A1 (en) * | 2011-09-23 | 2013-03-28 | Kla-Tencor Corporation | Solid-State Laser And Inspection System Using 193nm Laser |
DE102014116782A1 (de) * | 2014-11-17 | 2016-05-19 | Carl Zeiss Microscopy Gmbh | Detektorvorrichtung für ein Mikroskop |
-
2014
- 2014-11-17 DE DE102014116782.1A patent/DE102014116782A1/de active Pending
-
2015
- 2015-11-05 WO PCT/EP2015/075811 patent/WO2016078925A1/de active Application Filing
- 2015-11-05 JP JP2017524347A patent/JP6510044B2/ja active Active
- 2015-11-05 US US15/524,119 patent/US10132685B2/en active Active
-
2018
- 2018-10-25 US US16/170,931 patent/US10371574B2/en active Active
-
2019
- 2019-04-08 JP JP2019073286A patent/JP2019144570A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02502588A (ja) * | 1987-12-22 | 1990-08-16 | ヒューズ―ジェイブイシー・テクノロジー・コーポレーション | 色補正器向け浸込み型プリズムおよびこのプリズムを用いたカラープロジェクション装置 |
JP2000056233A (ja) * | 1998-08-04 | 2000-02-25 | Carl Zeiss Jena Gmbh | 顕微鏡の照射光路における波長または波長領域を調整下で集束化するための装置 |
JP2002530716A (ja) * | 1998-11-19 | 2002-09-17 | メディカル リサーチ カウンシル | 走査共焦点光学顕微鏡システム |
US20050174425A1 (en) * | 2002-04-26 | 2005-08-11 | Martin Harris | Laser scanning confocal microscope with fibre bundle return |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021524597A (ja) * | 2018-08-10 | 2021-09-13 | ペルキネルマー ヘルス サイエンシーズ, インコーポレイテッド | 再帰反射性表面を有する分光計及び関連する器具 |
JP7069403B2 (ja) | 2018-08-10 | 2022-05-17 | ペルキネルマー ヘルス サイエンシーズ, インコーポレイテッド | 再帰反射性表面を有する分光計及び関連する器具 |
Also Published As
Publication number | Publication date |
---|---|
US10132685B2 (en) | 2018-11-20 |
WO2016078925A1 (de) | 2016-05-26 |
US20170350763A1 (en) | 2017-12-07 |
JP6510044B2 (ja) | 2019-05-08 |
DE102014116782A1 (de) | 2016-05-19 |
JP2019144570A (ja) | 2019-08-29 |
US20190063993A1 (en) | 2019-02-28 |
US10371574B2 (en) | 2019-08-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2019144570A (ja) | 顕微鏡用の検出装置 | |
KR102567597B1 (ko) | 광학 측정 장치 | |
CN111433652B (zh) | 显微镜***和用于采用这种显微镜***显微地成像的方法 | |
US9470883B2 (en) | High-resolution scanning microscopy | |
US10802256B2 (en) | Multifocal scanning fluorescence microscope | |
US10401607B2 (en) | High-resolution scanning microscopy resolving at least two spectral ranges | |
US10371932B2 (en) | Light field imaging with scanning optical unit | |
US9804029B2 (en) | Microspectroscopy device | |
JP2008268387A (ja) | 共焦点顕微鏡 | |
US10067058B1 (en) | Auto-focus system | |
KR20100018984A (ko) | 빔 스캐닝 방식의 크로마틱 공초점 현미경 | |
US11137345B2 (en) | Apparatus for implementing confocal image using chromatic aberration lens | |
US20100097693A1 (en) | Confocal microscope | |
US20120162754A1 (en) | Pinhole for a Confocal Laser Scanning Microscope | |
KR20150116999A (ko) | 다채널 여기 광원 스위칭용 마이크로 라만 및 형광 분광분석장치 | |
CN116249891A (zh) | 探测发射光的方法、探测设备和激光扫描显微镜 | |
US9891422B2 (en) | Digital confocal optical profile microscopy | |
WO2022269961A1 (ja) | 顕微鏡システム、情報処理装置及び制御方法 | |
WO2018128146A1 (ja) | 分光測定方法および分光測定装置 | |
JP2021051074A (ja) | 分光分析装置 | |
US11714269B2 (en) | Apparatus and method for capturing an image | |
JP2005121522A (ja) | 蛍光画像/スペクトルを測定する蛍光測定装置 | |
JP2010008279A (ja) | 蛍光観察装置 | |
JP2013245940A (ja) | 測光装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20180427 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20180522 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20180820 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20181005 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20190312 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20190403 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6510044 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |