JP2018017666A - 測定装置 - Google Patents
測定装置 Download PDFInfo
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- JP2018017666A JP2018017666A JP2016149656A JP2016149656A JP2018017666A JP 2018017666 A JP2018017666 A JP 2018017666A JP 2016149656 A JP2016149656 A JP 2016149656A JP 2016149656 A JP2016149656 A JP 2016149656A JP 2018017666 A JP2018017666 A JP 2018017666A
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- 238000005259 measurement Methods 0.000 title claims abstract description 74
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- 238000005070 sampling Methods 0.000 description 19
- 230000032258 transport Effects 0.000 description 12
- 238000000034 method Methods 0.000 description 9
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 239000000809 air pollutant Substances 0.000 description 1
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- 238000003915 air pollution Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
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- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N1/2205—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2247—Sampling from a flowing stream of gas
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2273—Atmospheric sampling
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/24—Suction devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N2001/002—Devices for supplying or distributing samples to an analysing apparatus
- G01N2001/005—Packages for mailing or similar transport of samples
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
- G01N2001/2826—Collecting by adsorption or absorption
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
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- G01N2223/102—Different kinds of radiation or particles beta or electrons
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Abstract
Description
以下、図1〜図7を参照しながら、本発明の実施形態に係る測定装置について説明する。なお、以下の全ての図面においては、図面を見やすくするため、各構成要素の寸法や比率などは適宜異ならせてある。
さらには、制御部50は、後述する吸引ポンプ29の動作を制御することとしてもよい。
図3において、試料大気流路121は、第1部材11と第2部材12とで濾紙Fを挟持したとき濾紙Fに面する位置に、一端121xが開口している。試料大気流路121は、濾紙Fの表面の法線方向と交差する方向、言い換えると面12aの法線方向に対して交差する方向に延在している。
また、第2切欠き部702に収容されると仮想した仮想円VC2と、第2切欠き部702における周縁部72aとの接点を、接点P2とする。
また、第1切欠き部701から接点P2までの周縁部72a上の任意の点を、点P3とする。
また、接点P2から係止部703までの周縁部72a上の任意の点を点P4とする。
また、本実施形態の校正部材70は、長さLaと、中心P1と点P4とを結ぶ線分Cの長さLcとが、長さLa<長さLcとなるように設けられている。
Claims (4)
- 大気に含まれる粒子状物質を濾紙で収集する測定部と、
内部に前記大気を流通させ、前記測定部に前記大気を導入する採集管と、
前記測定部が取り付けられる筐体と、を備え、
前記測定部は、前記採集管が接続される第1部材と、
前記第1部材と対向して設けられる第2部材と、を有し、
前記第1部材および前記第2部材は、互いの対向面において前記濾紙を挟持し、
前記第1部材は、前記採集管の一端が接続される試料大気流路と、
前記試料大気流路と交差して設けられ、β線が通過するβ線照射路と、が形成され、
前記試料大気流路は、前記第1部材と前記第2部材とで前記濾紙を挟持したとき前記濾紙に面する位置に一端が開口し、前記濾紙の表面の法線方向と交差する方向に延在しており、
前記筐体は、前記試料大気流路を鉛直方向に向けた姿勢で前記測定部を保持する保持部を有し、
前記採集管と前記試料大気流路とが連通して形成される内部空間が、直線状に形成され、かつ鉛直方向に延在している測定装置。 - 前記保持部は、前記筐体に設けられた傾斜面である請求項1に記載の測定装置。
- 前記濾紙は帯状であり、
ロール状に巻き取られた前記濾紙を前記測定部の方に巻き出す巻出しロールと、
前記測定部にて前記粒子状物質を収集した後の前記濾紙を巻き取る巻取りロールと、
前記巻出しロールと前記巻取りロールとの間に設定された前記濾紙の搬送経路に設けられ、前記濾紙を搬送する搬送ローラと、
前記巻出しロールおよび前記巻取りロールの動作を制御する制御部と、を有し、
前記搬送ローラは、自身の回転角度を検出する検出手段が設けられ、
前記制御部は、前記検出手段により検出された回転角度に基づいて、前記濾紙の巻出し長さを制御する請求項1または2に記載の測定装置。 - 前記測定部において、前記試料大気流路の一端に重なるように、前記第1部材と前記第2部材との間に着脱自在に挿入される校正部材を有し、
前記測定部は、前記第1部材と前記第2部材とを接続する柱状部材を有し、
前記柱状部材は、前記試料大気流路の一端を挟んで前記試料大気流路の一端の両側に設けられ、
前記校正部材は、等価膜と、前記等価膜を保持する枠体とを有し、
前記枠体は、周縁部に設けられた第1切欠き部と、前記等価膜を挟んで前記第1切欠き部とは反対側の前記周縁部に設けられた第2切欠き部と、を有し、
前記第1切欠き部に収容される仮想円の中心と、前記第2切欠き部に収容される仮想円と前記第2切欠き部との接点と、を結ぶ線分の長さは、前記中心と、前記第1切欠き部から前記接点までの前記周縁部上の任意の点と、を結ぶ線分の長さよりも常に長い請求項1から3のいずれか1項に記載の測定装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016149656A JP6586929B2 (ja) | 2016-07-29 | 2016-07-29 | 測定装置 |
KR1020170032440A KR102266565B1 (ko) | 2016-07-29 | 2017-03-15 | 측정장치 |
CN201710377899.2A CN107664589B (zh) | 2016-07-29 | 2017-05-25 | 测定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016149656A JP6586929B2 (ja) | 2016-07-29 | 2016-07-29 | 測定装置 |
Publications (2)
Publication Number | Publication Date |
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JP2018017666A true JP2018017666A (ja) | 2018-02-01 |
JP6586929B2 JP6586929B2 (ja) | 2019-10-09 |
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JP2016149656A Active JP6586929B2 (ja) | 2016-07-29 | 2016-07-29 | 測定装置 |
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JP (1) | JP6586929B2 (ja) |
KR (1) | KR102266565B1 (ja) |
CN (1) | CN107664589B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109085026A (zh) * | 2018-10-22 | 2018-12-25 | 武汉怡特环保科技有限公司 | 一种颗粒物采样装置及β射线法大气颗粒物监测设备 |
CN117606867A (zh) * | 2023-11-29 | 2024-02-27 | 安徽智测环境科技有限公司 | 一种颗粒物监测采样设备 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS54137095U (ja) * | 1978-03-15 | 1979-09-22 | ||
JPS58160806A (ja) * | 1982-03-17 | 1983-09-24 | Denki Kagaku Keiki Co Ltd | ダスト計 |
JPS63134933A (ja) * | 1986-11-27 | 1988-06-07 | Nippon Steel Corp | 降下ばいじん測定装置 |
JPH09127023A (ja) * | 1995-11-02 | 1997-05-16 | Dkk Corp | ダスト計 |
JP2000321181A (ja) * | 1999-05-10 | 2000-11-24 | Dkk Corp | 濾紙への通気装置 |
JP2007147437A (ja) * | 2005-11-28 | 2007-06-14 | Dkk Toa Corp | 浮遊粒子状物質測定装置 |
US20090321635A1 (en) * | 2007-07-03 | 2009-12-31 | Wuhan Tianhong Instruments Co., Ltd. | Beta-ray soot concentration direct readout monitor and method for determining effective sample |
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KR200159881Y1 (ko) * | 1994-12-07 | 1999-11-01 | 유무성 | 광투과 및 흡수측정용 시료장착 유니트 |
KR960032301U (ko) * | 1995-03-23 | 1996-10-24 | 각도측정기구 | |
US6964190B2 (en) * | 2002-06-28 | 2005-11-15 | Horiba, Ltd. | Particulate matter concentration measuring apparatus |
JP2004028945A (ja) * | 2002-06-28 | 2004-01-29 | Horiba Ltd | 浮遊粒子状物質濃度測定装置 |
JP5764970B2 (ja) * | 2011-02-25 | 2015-08-19 | 東亜ディーケーケー株式会社 | ダスト計 |
CN204346781U (zh) * | 2015-01-04 | 2015-05-20 | 深圳睿境环保科技有限公司 | 颗粒物收集检测装置 |
CN105738262B (zh) * | 2016-02-23 | 2018-09-28 | 中煤科工集团重庆研究院有限公司 | β射线法三通道大气颗粒物监测仪 |
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- 2016-07-29 JP JP2016149656A patent/JP6586929B2/ja active Active
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- 2017-03-15 KR KR1020170032440A patent/KR102266565B1/ko active IP Right Grant
- 2017-05-25 CN CN201710377899.2A patent/CN107664589B/zh not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54137095U (ja) * | 1978-03-15 | 1979-09-22 | ||
JPS58160806A (ja) * | 1982-03-17 | 1983-09-24 | Denki Kagaku Keiki Co Ltd | ダスト計 |
JPS63134933A (ja) * | 1986-11-27 | 1988-06-07 | Nippon Steel Corp | 降下ばいじん測定装置 |
JPH09127023A (ja) * | 1995-11-02 | 1997-05-16 | Dkk Corp | ダスト計 |
JP2000321181A (ja) * | 1999-05-10 | 2000-11-24 | Dkk Corp | 濾紙への通気装置 |
JP2007147437A (ja) * | 2005-11-28 | 2007-06-14 | Dkk Toa Corp | 浮遊粒子状物質測定装置 |
US20090321635A1 (en) * | 2007-07-03 | 2009-12-31 | Wuhan Tianhong Instruments Co., Ltd. | Beta-ray soot concentration direct readout monitor and method for determining effective sample |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109085026A (zh) * | 2018-10-22 | 2018-12-25 | 武汉怡特环保科技有限公司 | 一种颗粒物采样装置及β射线法大气颗粒物监测设备 |
CN109085026B (zh) * | 2018-10-22 | 2024-03-19 | 武汉怡特环保科技有限公司 | 一种颗粒物采样装置及β射线法大气颗粒物监测设备 |
CN117606867A (zh) * | 2023-11-29 | 2024-02-27 | 安徽智测环境科技有限公司 | 一种颗粒物监测采样设备 |
CN117606867B (zh) * | 2023-11-29 | 2024-06-07 | 安徽智测环境科技有限公司 | 一种颗粒物监测采样设备 |
Also Published As
Publication number | Publication date |
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KR102266565B1 (ko) | 2021-06-18 |
CN107664589B (zh) | 2021-12-21 |
KR20180013677A (ko) | 2018-02-07 |
JP6586929B2 (ja) | 2019-10-09 |
CN107664589A (zh) | 2018-02-06 |
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