JP2017120255A - Circular polarization irradiator, analyzer, and microscope - Google Patents
Circular polarization irradiator, analyzer, and microscope Download PDFInfo
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Abstract
Description
本発明は、円偏光を出射する光照射器と、この光照射器を備える分析装置及び顕微鏡に関する。より詳しくは、試料に対して円偏光を照射し、円二色性などの光学特性を測定する技術に関する。 The present invention relates to a light irradiator that emits circularly polarized light, and an analyzer and a microscope including the light irradiator. More specifically, the present invention relates to a technique for irradiating a sample with circularly polarized light and measuring optical characteristics such as circular dichroism.
円二色性（CD：Circular Dichroism）は、左円偏光と右円偏光とで吸収が異なる現象であり、左右円偏光の吸収の差で表される。この円二色性は、光学活性を有する物質特有の性質であり、光学活性物質の分析、光学異性体の存在率の測定、生体分子の構造や状態の解析などに利用されている（例えば、特許文献１、２参照。）。 Circular dichroism (CD: Circular Dichroism) is a phenomenon in which absorption is different between left circularly polarized light and right circularly polarized light, and is represented by a difference in absorption between left and right circularly polarized light. This circular dichroism is a property peculiar to substances having optical activity, and is used for analysis of optically active substances, measurement of the abundance of optical isomers, analysis of structures and states of biomolecules (for example, (See Patent Documents 1 and 2.)
一般に、円二色性分散計は、光弾性変調器などにより左円偏光と右円偏光を周期的に発生させて試料に照射し、試料を透過した透過光の強度を、変調周波数に同期させて検出する。また、従来、左右円偏光を照射して、試料から放射される蛍光を検出する円二色性蛍光顕微鏡（特許文献３参照）や、円二色性の光電子前方散乱ピークで形成される光電子回折パターンを検出する立体原子顕微鏡（特許文献４）も提案されている。 In general, a circular dichroism dispersometer periodically generates left circularly polarized light and right circularly polarized light with a photoelastic modulator or the like and irradiates the sample, and synchronizes the intensity of transmitted light transmitted through the sample with the modulation frequency. To detect. Conventionally, a circular dichroism fluorescence microscope (see Patent Document 3) that detects left and right circularly polarized light to detect fluorescence emitted from a sample, and photoelectron diffraction formed by a circular dichroism photoelectron forward scattering peak. A stereo atomic microscope (Patent Document 4) for detecting a pattern has also been proposed.
一方、前述した円二色性計測において、試料が直線偏光に対する二色性や複屈折などの円二色性以外の偏光特性を有する場合、円偏光変調に非線形性や位相歪みがあると、この円二色性以外の偏光特性が円二色性信号に混入し、アーティファクトが生じる。特に、試料が、液晶や結晶などの固体の場合や、膜、ミセル及びゲルなどの巨視的な異方性をもつ場合は、直線偏光に対するアーティファクトの影響が大きい。 On the other hand, in the circular dichroism measurement described above, when the sample has polarization characteristics other than circular dichroism such as dichroism or birefringence for linearly polarized light, if there is nonlinearity or phase distortion in circular polarization modulation, Polarization characteristics other than circular dichroism are mixed in the circular dichroic signal, resulting in artifacts. In particular, when the sample is a solid such as a liquid crystal or a crystal or has a macroscopic anisotropy such as a film, a micelle, or a gel, the influence of the artifact on the linearly polarized light is large.
図１２は従来の円偏光照射器の構成例を示す模式図である。図１２に示すように、従来の円二色性計測に用いられている円偏光照射器は、光源１００から出射した光を直線偏光子１０１に入射させて直線偏光を取り出し、それを光弾性変調器１０２により左円偏光又は右円偏光に変調している。 FIG. 12 is a schematic diagram showing a configuration example of a conventional circularly polarized irradiator. As shown in FIG. 12, the circularly polarized irradiator used in the conventional circular dichroism measurement makes light emitted from the light source 100 incident on a linear polarizer 101 to extract linearly polarized light, which is photoelastically modulated. Modulator 102 modulates left circularly polarized light or right circularly polarized light.
しかしながら、通常、光弾性変調器で生成される光は、例えば９０°と２７０°などのように特定の位相では左又は右偏光状態となるが、それ以外の位相では直線偏光又は直線偏光を含む楕円偏光状態となっている。このため、従来の装置では、直線偏光の混入がない純粋な左右円偏光を試料に照射することができず、固体試料や巨視的な異方性を持つ試料の円二色性を高精度で計測することは困難とされている。 However, typically, light generated by a photoelastic modulator is left or right polarized at certain phases, such as 90 ° and 270 °, but contains linear or linear polarization at other phases. It is in an elliptically polarized state. For this reason, the conventional apparatus cannot irradiate the sample with pure left and right circularly polarized light that does not contain linearly polarized light, and the circular dichroism of a solid sample or a sample having macroscopic anisotropy can be accurately obtained. It is considered difficult to measure.
従来、円二色性計測においてアーティファクトを取り除く技術としては、例えば固体試料については、試料を回転したり、裏返して両面を測定したりする方法が提案されている（特許文献５参照）。また、光位相変調器において直線偏光の振動面とは異なる振動面を持ち互いに直交する２つの偏光成分の間の位相差の最大値δ０が１／４λ＜δ０となるように位相差に変調を加える円偏光光源システムも提案されている（特許文献６参照）。 Conventionally, as a technique for removing artifacts in circular dichroism measurement, for example, for a solid sample, a method of rotating the sample or turning it over and measuring both sides has been proposed (see Patent Document 5). Further, in the optical phase modulator, the phase difference is set so that the maximum value δ 0 of the phase difference between two polarization components having a vibration plane different from that of the linearly polarized light and orthogonal to each other is 1 / 4λ <δ 0. A circularly polarized light source system for applying modulation has also been proposed (see Patent Document 6).
しかしながら、前述したアーティファクト除去技術には、以下に示す問題点がある。例えば、特許文献５に記載の測定方法は、回転や反転させることが困難な試料や装置には適用できない。また、特許文献６に記載の円偏光光源システムは、位相差変調が行われた光に含まれる水平偏光成分の光の出力がゼロとなるタイミングでゲートを開き、光を通過させているが、ゲート幅を最短にしても数％程度水平偏光成分が残っており、完全に純粋な円偏光照射は実現できていない。 However, the artifact removal technique described above has the following problems. For example, the measurement method described in Patent Document 5 cannot be applied to a sample or an apparatus that is difficult to rotate or reverse. Further, the circularly polarized light source system described in Patent Document 6 opens the gate at a timing when the output of the light of the horizontally polarized component contained in the light subjected to phase difference modulation becomes zero, and allows the light to pass through. Even when the gate width is made the shortest, a horizontal polarization component remains about several percent, and a completely pure circularly polarized light irradiation cannot be realized.
そこで、本発明は、直線偏光成分の混入のない円偏光を生成し出射することができる円偏光照射器、並びにこれを用いた分析装置及び顕微鏡を提供することを目的とする。 Accordingly, an object of the present invention is to provide a circularly polarized light irradiator capable of generating and emitting circularly polarized light free from the mixing of linearly polarized light components, and an analyzer and a microscope using the same.
本発明に係る円偏光照射器は、光源と、前記光源から出射された直線偏光又は前記光源から出射された光から取り出された直線偏光を、ｘ軸方向成分とｙ軸方向成分とに分ける偏光分離部と、前記偏光分離部で分離された直線偏光のｘ軸方向成分とｙ軸方向成分とを交互に遮断する光遮断部と、前記光遮断部を通過した直線偏光のｘ軸方向成分とｙ軸方向成分とを同軸に合成する偏光合成部と、前記偏光合成部から出射された直線偏光を円偏光に変換する偏光変換部を有する。
この円偏光照射器は、前記偏光変換部から、右円偏光と左円偏光を交互にかつ連続的に出射することができる。
本発明の円偏光照射器は、前記光源と前記偏光分離部との間に、前記光源から出射された光から直線偏光を取り出す偏光子部が設けられていてもよい。
前記偏光分離部は、入射時の光軸に対して、前記直線偏光のｘ軸方向成分及びｙ軸方向成分のいずれか一方若しくは両方の光軸を変位又は角度変化させる光学素子を備えていてもよい。
前記光遮断部は、光チョッパを備えていてもよい。
前記光源としては、例えば平行光を出射するものを使用することができる。
The circularly polarized light irradiator according to the present invention divides a light source and linearly polarized light emitted from the light source or linearly polarized light extracted from the light emitted from the light source into an x-axis direction component and a y-axis direction component. A separating unit, a light blocking unit that alternately blocks the x-axis direction component and the y-axis direction component of the linearly polarized light separated by the polarization separating unit, and an x-axis direction component of the linearly polarized light that has passed through the light blocking unit, a polarization combining unit that coaxially combines the y-axis direction component; and a polarization conversion unit that converts linearly polarized light emitted from the polarization combining unit into circularly polarized light.
This circularly polarized light irradiator can emit right circularly polarized light and left circularly polarized light alternately and continuously from the polarization converter.
In the circularly polarized light irradiator of the present invention, a polarizer unit that extracts linearly polarized light from light emitted from the light source may be provided between the light source and the polarization separation unit.
The polarization separation unit may include an optical element that displaces or changes an angle of one or both of the x-axis direction component and the y-axis direction component of the linearly polarized light with respect to the incident optical axis. Good.
The light blocking unit may include a light chopper.
As the light source, for example, a light source that emits parallel light can be used.
本発明に係る分析装置は、前述した円偏光照射器を備えるものであり、前記円偏光照射器から出射された円偏光を試料に照射し、前記試料の光学特性を測定する。
本発明の分析装置は、前記試料からの透過光、反射光、散乱光又は発光を電気信号として検出する１又は２以上の光検出器を備えていてもよい。
更に、前記光検出器で検出された電気信号から円二色性信号を得る円二色性検出部を設けることもできる。
その場合、前記光検出器で透過光を検出し、前記円二色性検出部において、前記透過光の電気信号を、前記円偏光における左右円偏光変調の位相でロックイン検出を行い、前記透過光における左円偏光と右円偏光の相対的な強度差を求め、円二色性信号を得てもよい。
The analyzer according to the present invention includes the above-described circularly polarized light irradiator, irradiates the sample with circularly polarized light emitted from the circularly polarized light irradiator, and measures the optical characteristics of the sample.
The analyzer of the present invention may include one or more photodetectors that detect transmitted light, reflected light, scattered light, or light emission from the sample as an electrical signal.
Furthermore, a circular dichroism detection unit that obtains a circular dichroism signal from the electrical signal detected by the photodetector can be provided.
In this case, transmitted light is detected by the photodetector, and the circular dichroism detection unit performs lock-in detection on the electrical signal of the transmitted light with the phase of left-right circular polarization modulation in the circularly polarized light, and transmits the transmitted light. A circular dichroism signal may be obtained by obtaining a relative intensity difference between left circularly polarized light and right circularly polarized light in light.
本発明に係る顕微鏡は、前述した円偏光照射器を備えるものであり、観察対象の試料に、前記円偏光照射器から出射された円偏光を照射する。
この顕微鏡は、前記試料からの透過光を捕集する対物レンズと、前記対物レンズから出射した透過光を結像させる結像レンズと、前記透過光を電気信号として検出する光検出器と、前記光検出器で検出された電気信号から円二色性信号を得る円二色性検出部を備えていてもよい。
その場合、前記円二色性検出部は、例えば前記電気信号を、前記円偏光における左右円偏光変調の位相でロックイン検出を行い、前記透過光における左円偏光と右円偏光の相対的な強度差を求め、円二色性信号を得ることもできる。
本発明の顕微鏡は、前記透過光の結像位置にピンホールを設け、前記ピンホールを通過した光を前記光検出器で検出してもよい。
本発明の顕微鏡は、前記試料に対して前記円偏光を相対的に走査しながら照射することもできる。
A microscope according to the present invention includes the circularly polarized illuminator described above, and irradiates a sample to be observed with circularly polarized light emitted from the circularly polarized irradiator.
The microscope includes an objective lens that collects transmitted light from the sample, an imaging lens that forms an image of transmitted light emitted from the objective lens, a photodetector that detects the transmitted light as an electrical signal, You may provide the circular dichroism detection part which acquires a circular dichroism signal from the electric signal detected with the photodetector.
In that case, for example, the circular dichroism detection unit performs lock-in detection on the electrical signal at the phase of left-right circular polarization modulation in the circularly polarized light, and relative to the left circularly polarized light and the right circularly polarized light in the transmitted light. It is also possible to obtain an intensity difference and obtain a circular dichroism signal.
In the microscope of the present invention, a pinhole may be provided at the image forming position of the transmitted light, and the light passing through the pinhole may be detected by the photodetector.
The microscope of the present invention can also irradiate the sample while scanning the circularly polarized light relatively.
本発明によれば、試料に対して直線偏光成分の混入のない円偏光を照射することができるため、巨視的な異方性を有するものについてもアーティファクトの影響を抑えた円二色性の測定が可能となる。 According to the present invention, it is possible to irradiate a sample with circularly polarized light that does not contain linearly polarized light components. Therefore, even for those having macroscopic anisotropy, circular dichroism measurement with suppressed influence of artifacts is achieved. Is possible.
以下、本発明を実施するための形態について、添付の図面を参照して、詳細に説明する。なお、本発明は、以下に説明する実施形態に限定されるものではない。 DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the accompanying drawings. Note that the present invention is not limited to the embodiments described below.
（第１の実施形態）
先ず、本発明の第１の実施形態に係る円偏光照射器について説明する。図１は本実施形態の円偏光照射器の構成を示す概念図であり、図２はその変形例に係る円偏光照射器の構成を示す概念図である。また、図３は図２に示す円偏光照射器の具体的構成例を模式的に示す図である。
(First embodiment)
First, the circularly polarized light irradiator according to the first embodiment of the present invention will be described. FIG. 1 is a conceptual diagram showing a configuration of a circularly polarized irradiator of this embodiment, and FIG. 2 is a conceptual diagram showing a configuration of a circularly polarized irradiator according to a modification thereof. FIG. 3 is a diagram schematically showing a specific configuration example of the circularly polarized light irradiator shown in FIG.
図１に示すように、本実施形態の円偏光照射器１は、円偏光を照射するものであり、少なくとも、光源１０、偏光分離部１２、光遮断部１３、偏光合成部１４及び偏光変換部１５を備えている。また、本実施形態の円偏光照射器には、図２に示すように、光源１０と偏光分離部１２との間に、偏光子部１１やその他の光学素子が設けられていてもよい。 As shown in FIG. 1, the circularly polarized irradiator 1 of the present embodiment irradiates circularly polarized light, and includes at least a light source 10, a polarization separation unit 12, a light blocking unit 13, a polarization combining unit 14, and a polarization conversion unit. 15 is provided. Further, in the circularly polarized light irradiator of this embodiment, as shown in FIG. 2, a polarizer unit 11 and other optical elements may be provided between the light source 10 and the polarization separation unit 12.
［光源１０］
光源１０は、試料の種類や検出光の波長などに応じて適宜選択することができ、例えば固体レーザや半導体レーザ（ＬＤ：laser diode）などの各種レーザ、発光ダイオード（ＬＥＤ：Light Emitting Diode）などの発光素子、各種放電管、白熱灯光源を適切に処理したもの、放射光（特に短波長）を使用することができる。光の利用効率、輝度、集光性などの観点から、光源１０はレーザなどのコリメートされた光（平行光）を出射するものであることが好ましい。
[Light source 10]
The light source 10 can be appropriately selected according to the type of sample, the wavelength of detection light, and the like. For example, various lasers such as a solid laser and a semiconductor laser (LD: laser diode), a light emitting diode (LED), and the like. The light emitting element, various discharge tubes, appropriately processed incandescent lamp light sources, and radiated light (especially short wavelength) can be used. The light source 10 preferably emits collimated light (parallel light) such as a laser from the viewpoints of light utilization efficiency, luminance, light condensing performance, and the like.
［偏光子部１１］
偏光子部１１は、光源１０から出射された光Ｌ１から直線偏光Ｌ２を取り出すものであり、必要に応じて光源１０と偏光分離部１２との間の光Ｌ１の光軸上に配置される。ここで、光源１０から出射された光Ｌ１が直線偏光以外の成分を含む場合だけでなく、光源１０から出射された光Ｌ１が直線偏光のみである場合にも、偏光成分の調整などのために、光源１０と偏光分離部１２との間に偏光子部１１を配置することもできる。
[Polarizer 11]
The polarizer unit 11 extracts linearly polarized light L2 from the light L1 emitted from the light source 10, and is disposed on the optical axis of the light L1 between the light source 10 and the polarization separation unit 12 as necessary. Here, not only when the light L1 emitted from the light source 10 includes a component other than linearly polarized light but also when the light L1 emitted from the light source 10 is only linearly polarized light, for adjustment of the polarization component, etc. The polarizer unit 11 may be disposed between the light source 10 and the polarization separation unit 12.
偏光子部１１を構成する光学素子には、各種直線偏光子を用いることができる。直線偏光子の具体例としては、複屈折結晶を用いたグラントムソン、グランテーラー、グランレーザーなどの各種プリズム、プラスチックフィルムなどを用いた吸収型偏光フィルター、薄膜偏光素子、ワイヤグリッド型偏光子などが挙げられる。 Various optical polarizers can be used for the optical elements constituting the polarizer unit 11. Specific examples of linear polarizers include various prisms such as Glan-Thomson, Glan-Taylor, and Glan-Laser using birefringent crystals, absorption polarizing filters using plastic films, thin-film polarizing elements, wire grid polarizers, and the like. Can be mentioned.
なお、円偏光照射器１から出射される円偏光Ｌ４の左円偏光と右円偏光のバランスがずれていると、円二色性計測などに用いた場合に、得られる円二色性信号にオフセットが生じることがある。そこで、左円偏光と右円偏光の強度が一致した円偏光Ｌ４を出射するため、偏光子部１１を構成する光学素子には、回転などによって直線偏光Ｌ２における縦と横の偏光成分の比率を調整できるものを用いることが好ましい。 If the left circularly polarized light and right circularly polarized light of the circularly polarized light L4 emitted from the circularly polarized light irradiator 1 are out of balance, the circular dichroism signal obtained when used for circular dichroism measurement or the like is used. An offset may occur. Therefore, in order to emit the circularly polarized light L4 in which the intensity of the left circularly polarized light and the right circularly polarized light coincides, the optical element constituting the polarizer unit 11 has a ratio of the vertical and horizontal polarization components in the linearly polarized light L2 by rotation or the like. What can be adjusted is preferably used.
［偏光分離部１２］
偏光分離部１２は、光源１０から出射された直線偏光Ｌ２又は偏光子部１１で取り出された直線偏光Ｌ２を、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとに分離するものであり、直線偏光Ｌ２の光軸上に配置されている。この偏光分離部１２では、例えば直線偏光Ｌ２の入射時の光軸に対して、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙのいずれか一方若しくは両方の光軸を変位させるか又は光軸の角度（進行方向）を変化させる。
[Polarization separation unit 12]
The polarization separation unit 12 separates the linearly polarized light L2 emitted from the light source 10 or the linearly polarized light L2 extracted by the polarizer unit 11 into an x-axis direction component L2x and a y-axis direction component L2y. It is arranged on the optical axis of L2. In the polarization separation unit 12, for example, one or both of the x-axis direction component L2x and the y-axis direction component L2y are displaced with respect to the optical axis when the linearly polarized light L2 is incident, or the angle of the optical axis Change the direction of travel.
偏光分離部１２を構成する光学素子としては、例えば方解石を用いた偏波ビームディスプレーサ（ＰＢＤ：Polarizing beam displacer）、ウォラストンプリズム、グランテーラープリズム、グランレーザプリズム、ローションプリズム、サヴァール板、偏光ビームスプリッタ（ＰＢＳ：Polarizing Beam Splitter）などが挙げられる。これらの光学素子のうち、偏波ビームディスプレーサ及びサヴァール板は光軸変位素子２２であり、その他の素子は光軸角度変更素子である。 As an optical element constituting the polarization separation unit 12, for example, a polarizing beam displacer (PBD) using calcite, a Wollaston prism, a Grand Taylor prism, a Grand laser prism, a lotion prism, a Savart plate, a polarizing beam splitter (PBS: Polarizing Beam Splitter). Among these optical elements, the polarization beam displacer and the savar plate are the optical axis displacement elements 22, and the other elements are optical axis angle changing elements.
偏光分離部１２を構成する光学素子は、直線偏光Ｌ２をｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとに分離可能なものであればよく、その種類や数は特に限定されるものではない。例えば、直線偏光Ｌ２を分離する光学素子の偏光消光比が低い場合は、分離されたｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの各光軸上に高い消光比をもつ直線偏光子を配置することで、偏光消光比が高い分離素子を用いた場合と同等の効果を得ることができる。ただし、部品数低減などの観点から、偏光分離部１２を構成する光学素子には、高い偏光消光比で直線偏光中の成分を分離するものを用いることが好ましい。 The optical element that constitutes the polarization separation unit 12 is not particularly limited as long as it can separate the linearly polarized light L2 into the x-axis direction component L2x and the y-axis direction component L2y. For example, when the polarization extinction ratio of the optical element that separates the linearly polarized light L2 is low, a linear polarizer having a high extinction ratio is disposed on each optical axis of the separated x-axis direction component L2x and y-axis direction component L2y. Thus, an effect equivalent to that obtained when a separation element having a high polarization extinction ratio is used can be obtained. However, from the viewpoint of reducing the number of components, it is preferable to use an optical element that constitutes the polarization separation unit 12 that separates components in linearly polarized light with a high polarization extinction ratio.
［光遮断部１３］
光遮断部１３は、偏光分離部１２で分離された直線偏光のｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの光軸上に配置され、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙを交互に遮断するものである。この光遮断部１３を構成する光学素子としては、光チョッパ２３や光シャッターなどのように光を物理的に遮断するものが好ましいが、これらに限定されるものではなく、電気光学素子や音響光学素子、液晶偏光素子などを使用してもよい。
[Light blocking unit 13]
The light blocking unit 13 is disposed on the optical axis of the x-axis direction component L2x and the y-axis direction component L2y of the linearly polarized light separated by the polarization separation unit 12, and alternately converts the x-axis direction component L2x and the y-axis direction component L2y. It is a thing to cut off. The optical element constituting the light blocking unit 13 is preferably an optical element that physically blocks light, such as the optical chopper 23 or an optical shutter, but is not limited thereto, and is not limited thereto. An element, a liquid crystal polarizing element, or the like may be used.
また、光遮断部１３に光チョッパ２３を用いる場合は、動作時の振動が他の光学素子に影響しないように、光遮断部１３は他の光学素子とは分離し、独立配置することが好ましい。更に、光チョッパ２３には、デューティ比が１〜４９％程度のものを使用することが好ましい。これにより、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとが同時に光チョッパ２３を通過することを防止し、光チョッパ２３からこれらの成分を離散的に出射することが可能となる。 Further, when the optical chopper 23 is used for the light blocking unit 13, it is preferable that the light blocking unit 13 is separated from the other optical elements and arranged independently so that vibration during operation does not affect the other optical elements. . Furthermore, it is preferable to use a light chopper 23 having a duty ratio of about 1 to 49%. Thereby, the x-axis direction component L2x and the y-axis direction component L2y are prevented from passing through the optical chopper 23 at the same time, and these components can be emitted discretely from the optical chopper 23.
なお、光遮断部１３は、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの光軸上にそれぞれ１つずつ設けられていてもよく、また、１つの光遮断部１３でｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの両方を遮断してもよい。 One light blocking unit 13 may be provided on each of the optical axes of the x-axis direction component L2x and the y-axis direction component L2y. Both y-axis direction components L2y may be blocked.
［偏光合成部１４］
偏光合成部１４は、光遮断部１３を通過したｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙを同軸に合成して同一光軸の直線偏光に戻すものであり、光遮断部１３を通過したｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの光軸上に配置されている。この偏光合成部１４では、例えば、光遮断部１３を通過したｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙのいずれか一方若しくは両方の光軸を変位させるか、又は光軸の角度（進行方向）を変化させる。これにより、ｘ軸方向の直線偏光とｙ軸方向の直線偏光が離散的に繰り返す変調を有する直線偏光Ｌ３が得られる。
[Polarized light synthesis unit 14]
The polarization combining unit 14 is configured to coaxially combine the x-axis direction component L2x and the y-axis direction component L2y that have passed through the light blocking unit 13 to return to linearly polarized light of the same optical axis, and the x that has passed through the light blocking unit 13 Arranged on the optical axis of the axial component L2x and the y-axis component L2y. In this polarization beam combiner 14, for example, either or both of the x-axis direction component L2x and the y-axis direction component L2y that have passed through the light blocking unit 13 are displaced, or the angle of the optical axis (traveling direction). To change. Thereby, the linearly polarized light L3 having a modulation in which the linearly polarized light in the x-axis direction and the linearly polarized light in the y-axis direction are discretely repeated is obtained.
偏光合成部１４を構成する光学素子としては、前述した偏光分離部１２と同様に、例えば方解石を用いた偏波ビームディスプレーサ（ＰＢＤ）、ウォラストンプリズム、グランテーラープリズム、グランレーザプリズム、ローションプリズム、サヴァール板、偏光ビームスプリッタ（ＰＢＳ）などが挙げられる。なお、偏光合成部１４に用いる光学素子と偏光分離部１２に用いる光学素子は、同種の対をなすものであることが好ましいが、種類の異なる光学素子を組み合わせ使用することもできる。偏光合成部１４に、偏光分離部１２で用いた光学素子と光学特性が同じものを使用することにより、２つに分離させた直線偏光成分を容易に１本のビームに戻すことが可能となる。 As the optical element constituting the polarization combining unit 14, as in the polarization separation unit 12, for example, a polarization beam displacer (PBD) using calcite, a Wollaston prism, a Gran Taylor prism, a Grand laser prism, a lotion prism, Examples include a Savart plate and a polarizing beam splitter (PBS). The optical element used in the polarization combining unit 14 and the optical element used in the polarization separation unit 12 are preferably the same type of pair, but different types of optical elements can be used in combination. By using an optical element having the same optical characteristics as the optical element used in the polarization separating unit 12 for the polarization combining unit 14, the linearly polarized component separated into two can be easily returned to one beam. .
［偏光変換部１５］
偏光変換部１５は、偏光合成部１４から出射された直線偏光Ｌ３を円偏光に変換するものであり、直線偏光Ｌ３の光軸上に配置されている。この偏光変換部１５を構成する光学素子としては、例えば１／４波長板２５、バビネ−ソレイユの補償板、液晶可変リターダなどの液晶偏光素子を用いることができる。ｘ軸方向の直線偏光とｙ軸方向の直線偏光が離散的に繰り返す変調を有する直線偏光Ｌ３を、偏光変換部１５で円偏光に変換することで、直線偏光成分を含まず、左円偏光と右円偏光が離散的に繰り返す変調を有する円偏光Ｌ４が得られる。
[Polarization converter 15]
The polarization conversion unit 15 converts the linearly polarized light L3 emitted from the polarization combining unit 14 into circularly polarized light, and is disposed on the optical axis of the linearly polarized light L3. As an optical element constituting the polarization conversion unit 15, for example, a liquid crystal polarizing element such as a quarter-wave plate 25, a Babinet-Soleil compensation plate, a liquid crystal variable retarder, or the like can be used. The linearly polarized light L3 having a modulation in which the linearly polarized light in the x-axis direction and the linearly polarized light in the y-axis direction are discretely repeated are converted into circularly polarized light by the polarization conversion unit 15, thereby not including the linearly polarized light component and Circularly polarized light L4 having a modulation in which the right circularly polarized light is discretely repeated is obtained.
［その他の光学素子］
光源１０から直線偏光が出射される場合は、偏光子部１１に代えて、光源１０と偏光分離部１２との間に半波長板（図示せず）を配置してもよい。半波長板は、直線偏光の偏光方向を変えるものであり、光源１０から出射された直線偏光を、半波長板により適切な偏光方向に回転させてから偏光分離部１２に入射させることで、左円偏光と右円偏光の強度が一致した円偏光Ｌ４を出射することができる。
[Other optical elements]
When linearly polarized light is emitted from the light source 10, a half-wave plate (not shown) may be disposed between the light source 10 and the polarization separation unit 12 instead of the polarizer unit 11. The half-wave plate changes the polarization direction of the linearly polarized light, and the linearly polarized light emitted from the light source 10 is rotated by the half-wave plate in an appropriate polarization direction and then incident on the polarization separation unit 12. Circularly polarized light L4 having intensities of circularly polarized light and right circularly polarized light can be emitted.
［動作］
次に、本実施形態の円偏光照射器の動作について、図３に示す円偏光照射器２を例に説明する。図３に示す円偏光照射器２は、レーザ光源２０、直線偏光子２１、光軸変位素子２２、光チョッパ２３、光軸変位素子２４、１／４波長板２５がこの順に配置されている。この円偏光照射器２では、先ず、レーザ光源２０から出射された平行光Ｌ１は、偏光を揃えるため、直線偏光子２１に入射される。
[Operation]
Next, the operation of the circularly polarized light irradiator of the present embodiment will be described using the circularly polarized light irradiator 2 shown in FIG. 3 as an example. In the circularly polarized light irradiator 2 shown in FIG. 3, a laser light source 20, a linear polarizer 21, an optical axis displacement element 22, an optical chopper 23, an optical axis displacement element 24, and a quarter wavelength plate 25 are arranged in this order. In this circularly polarized light irradiator 2, first, the parallel light L <b> 1 emitted from the laser light source 20 is incident on the linear polarizer 21 in order to align the polarization.
そして、直線偏光子２１において、ｘ軸又はｙ軸から４５°方向の直線偏光Ｌ２が生成する。この直線偏光Ｌ２は、ｘ軸方向とｙ軸方向に同じ強度をもつ２つの直線偏光状態を合成したものと考えられる。次に、光軸変位素子２２により、直線偏光Ｌ２をｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとに分離し、得られた２本の平行ビーム（ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙ）を、光チョッパ２３などで交互に遮断する。 In the linear polarizer 21, linearly polarized light L2 in the direction of 45 ° from the x-axis or y-axis is generated. The linearly polarized light L2 is considered to be a combination of two linearly polarized light states having the same intensity in the x-axis direction and the y-axis direction. Next, the linearly polarized light L2 is separated into the x-axis direction component L2x and the y-axis direction component L2y by the optical axis displacement element 22, and the obtained two parallel beams (x-axis direction component L2x and y-axis direction component L2y). ) Are alternately blocked by the light chopper 23 or the like.
図４Ａは図３に示す円偏光照射器２の光路例を示す上面図であり、図４Ｂは光チョッパ２３への入射位置を示す模式図である。例えば、光軸変位素子２２として偏波ビームディスプレーサを用いた場合、図４Ａに示すように、直線偏光Ｌ２を光軸変位素子２２に入射させると、ｘ軸方向の直線偏光成分（ｘ軸方向成分Ｌ２ｘ）のみが入射時の光軸に対して光軸を平行に保ったまま変位し、出射される。一方、ｙ軸方向の直線偏光成分（ｙ軸方向成分Ｌ２ｙ）は、光軸変位せず、入射時の光軸のまま出射される。 4A is a top view illustrating an example of an optical path of the circularly polarized irradiator 2 illustrated in FIG. 3, and FIG. 4B is a schematic diagram illustrating an incident position on the optical chopper 23. For example, when a polarization beam displacer is used as the optical axis displacement element 22, as shown in FIG. 4A, when linearly polarized light L2 is incident on the optical axis displacement element 22, a linearly polarized light component in the x-axis direction (x-axis direction component) Only L2x) is displaced while keeping the optical axis parallel to the optical axis at the time of incidence, and is emitted. On the other hand, the linearly polarized light component in the y-axis direction (y-axis direction component L2y) is emitted with the optical axis at the time of incidence without being displaced.
光軸変位素子２２から出射されたｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙは、光チョッパ２３により交互に遮断され、光チョッパ２３からはこれらの成分が離散的に出射される。その際、図４Ｂに示すように、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙは相互に近接した位置に入射するが、デューティ比が１〜４９％程度の光チョッパ２３を用いることで、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとが同時に光チョッパ２３を通過することを防止できる。 The x-axis direction component L2x and the y-axis direction component L2y emitted from the optical axis displacement element 22 are alternately cut off by the optical chopper 23, and these components are discretely emitted from the optical chopper 23. At that time, as shown in FIG. 4B, the x-axis direction component L2x and the y-axis direction component L2y are incident on positions close to each other, but by using an optical chopper 23 having a duty ratio of about 1 to 49%, It is possible to prevent the axial component L2x and the y-axis component L2y from passing through the optical chopper 23 at the same time.
次に、光チョッパ２３を通過したｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙの両方を光軸変位素子２４に入射させ、これら２つの平行ビームを再度同軸に戻す。例えば光軸変位素子２４に偏波ビームディスプレーサを用いた場合、図４Ａに示すように、ｘ軸方向成分Ｌ２ｘは入射時の光軸に対して平行方向に変位し、光軸変位せずに入射時の光軸のまま進行するｙ軸方向成分Ｌ２ｙに合流する。これにより、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとが離散的に繰り返す直線偏光Ｌ３が得られる。 Next, both the x-axis direction component L2x and the y-axis direction component L2y that have passed through the optical chopper 23 are incident on the optical axis displacement element 24, and these two parallel beams are returned to the same axis again. For example, when a polarization beam displacer is used for the optical axis displacement element 24, as shown in FIG. 4A, the x-axis direction component L2x is displaced in a direction parallel to the optical axis at the time of incidence, and is incident without being displaced. It merges with the y-axis direction component L2y that travels with the optical axis at the time. Thereby, linearly polarized light L3 in which the x-axis direction component L2x and the y-axis direction component L2y repeat discretely is obtained.
ここで、光軸変位素子２２，２４に偏波ビームディスプレーサを用いると、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとで素子を通過する時間が異なる場合も考えられるが、その差は、光遮断部１３における遮断時間に比べて極わずかであるため、これらの成分を合成する際は問題にならない。このように、本実施形態の円偏光照射器２では、各成分の光路長を厳密に同一にしなくても、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとが離散的に繰り返す直線偏光Ｌ３を生成することが可能である。 Here, when a polarization beam displacer is used for the optical axis displacement elements 22 and 24, it may be considered that the x-axis direction component L2x and the y-axis direction component L2y have different times for passing through the element. Since it is very short compared with the interruption time in the interruption part 13, it does not become a problem when synthesize | combining these components. As described above, in the circularly polarized light irradiator 2 of the present embodiment, the linearly polarized light L3 in which the x-axis direction component L2x and the y-axis direction component L2y are discretely repeated is obtained even if the optical path lengths of the respective components are not exactly the same. It is possible to generate.
本実施形態の円偏光照射器２では、前述した光軸変換素子２２，２４に代えて光軸角度変更素子を用いることもできる。図５Ａは光軸角度変更素子を用いた場合の光路例を示す上面図であり、図５Ｂは光チョッパ２３への入射位置を示す模式図である。例えば光軸角度変更素子３２としてウォラストンプリズムを用いた場合、図５Ａに示すように、直線偏光Ｌ２を光軸角度変更素子３２に入射させると、ｘ軸方向の直線偏光成分（ｘ軸方向成分Ｌ２ｘ）及びｙ軸方向の直線偏光成分（ｙ軸方向成分Ｌ２ｙ）の両方の光軸が、入射時の光軸に対して角度変化し、即ち進行方向が変更されて、出射される。 In the circularly polarized light irradiator 2 of the present embodiment, an optical axis angle changing element can be used instead of the optical axis converting elements 22 and 24 described above. FIG. 5A is a top view showing an example of an optical path when an optical axis angle changing element is used, and FIG. 5B is a schematic diagram showing an incident position on the optical chopper 23. For example, when a Wollaston prism is used as the optical axis angle changing element 32, as shown in FIG. 5A, when linearly polarized light L2 is incident on the optical axis angle changing element 32, a linearly polarized light component in the x-axis direction (x-axis direction component) The optical axes of both the L2x) and linearly polarized light components in the y-axis direction (y-axis direction component L2y) change with respect to the optical axis at the time of incidence, that is, the traveling direction is changed and emitted.
光軸角度変更素子３２から出射されたｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙは、例えばミラー２６などにより光軸が相互に平行になるように進行方向が変更された後、光チョッパ２３により交互に遮断される。その際、図５Ｂに示すように、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙは、例えば一方の成分が光チョッパ２３の右側、他方の成分が光チョッパ２３の左側のように、比較的離れた位置にそれぞれ入射する。この場合も、光チョッパ２３からはｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙが離散的に出射される。 The x-axis direction component L2x and the y-axis direction component L2y emitted from the optical axis angle changing element 32 are changed by the optical chopper 23 after the traveling direction is changed by the mirror 26 or the like so that the optical axes are parallel to each other. Interleaved alternately. At that time, as shown in FIG. 5B, the x-axis direction component L2x and the y-axis direction component L2y are relatively separated, for example, one component is on the right side of the optical chopper 23 and the other component is on the left side of the optical chopper 23. The incident light enters each position. Also in this case, the x-axis direction component L2x and the y-axis direction component L2y are discretely emitted from the optical chopper 23.
次に、ミラー２６などにより進行方向を変更し、光チョッパ２３を通過したｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙを、光軸角度変更素子３４に入射させる。そして、光軸角度変更素子３４において、ｘ軸方向成分Ｌ２ｘ及びｙ軸方向成分Ｌ２ｙを再度同軸に戻す。これにより、ｘ軸方向成分Ｌ２ｘとｙ軸方向成分Ｌ２ｙとが離散的に繰り返す直線偏光Ｌ３が得られる。 Next, the traveling direction is changed by the mirror 26 or the like, and the x-axis direction component L2x and the y-axis direction component L2y that have passed through the optical chopper 23 are incident on the optical axis angle changing element 34. In the optical axis angle changing element 34, the x-axis direction component L2x and the y-axis direction component L2y are returned to the same axis again. Thereby, linearly polarized light L3 in which the x-axis direction component L2x and the y-axis direction component L2y repeat discretely is obtained.
前述した方法で生成した直線偏光Ｌ３は、１／４波長板２５によって円偏光Ｌ４に変換される。その結果、図４Ａ及び図５Ａに示すように、１／４波長板２５からは、右円偏光ＲＣＰと左円偏光ＬＣＰとが交互にかつ連続的に出射することとなる。 The linearly polarized light L3 generated by the above-described method is converted into circularly polarized light L4 by the quarter wavelength plate 25. As a result, as shown in FIGS. 4A and 5A, the quarter-wave plate 25 emits the right circularly polarized light RCP and the left circularly polarized light LCP alternately and continuously.
本実施形態の円偏光照射器は、ｘ軸方向の直線偏光成分とｙ軸方向の直線偏光成分が離散的に繰り返す直線偏光を生成し、これを円偏光に変換しているため、直線偏光成分の混入を排除し、試料に対して右円偏光と左円偏光を交互にかつ連続的に照射することができる。また、本実施形態の円偏光照射器は、電気的変調を用いていないため、得られる円偏光に非線形性や位相歪みは生じない。 The circularly polarized light irradiator of this embodiment generates linearly polarized light in which the linearly polarized light component in the x-axis direction and the linearly polarized light component in the y-axis direction are discretely repeated, and converts this into circularly polarized light. Thus, right circularly polarized light and left circularly polarized light can be alternately and continuously irradiated on the sample. Moreover, since the circularly polarized light irradiator of this embodiment does not use electrical modulation, nonlinearity and phase distortion do not occur in the obtained circularly polarized light.
前述した特許文献６に記載の技術は、短い時間ゲートをかけることによってなるべく純粋な円偏光を得ようとするものであるため、時間的な光の利用効率が低く、円偏光の純度にも限界がある。これに対して、本実施形態の円偏光照射器は、特許文献６に記載の方法に比べて光の利用効率が高く、また、円偏光の純度も、偏光変換部の特性のみで決まるため、十分に高くすることが可能である。 The technique described in Patent Document 6 described above is intended to obtain as purely circularly polarized light as possible by applying a short time gate, so that temporal light use efficiency is low, and the purity of circularly polarized light is also limited. There is. On the other hand, the circularly polarized irradiator of the present embodiment has higher light utilization efficiency than the method described in Patent Document 6, and the purity of the circularly polarized light is determined only by the characteristics of the polarization conversion unit. It can be made high enough.
以上から、本実施形態の円偏光照射器を用いることにより、従来の方法では実現することができなかった直線偏光成分の混入のない純粋な円偏光を、試料に照射することが可能となる。その結果、異方性を有する試料についてもアーティファクトの影響を抑えた円二色性の測定が可能となる。 As described above, by using the circularly polarized light irradiator of the present embodiment, it is possible to irradiate the sample with pure circularly polarized light that is not mixed with a linearly polarized light component that cannot be realized by the conventional method. As a result, it is possible to measure circular dichroism while suppressing the influence of artifacts even for samples having anisotropy.
（第２の実施形態）
次に、本発明の第２の実施形態に係る分析装置について説明する。本実施形態の分析装置は、前述した第１の実施形態の円偏光照射器１を備え、この円偏光照射器１から出射された円偏光Ｌ４を試料に照射し、試料の光学特性を測定するものである。
(Second Embodiment)
Next, an analysis apparatus according to the second embodiment of the present invention will be described. The analyzer of the present embodiment includes the circularly polarized light irradiator 1 of the first embodiment described above, and irradiates the sample with the circularly polarized light L4 emitted from the circularly polarized light irradiator 1, and measures the optical characteristics of the sample. Is.
本実施形態の分析装置は、透過光、反射光、散乱光又は蛍光などの発光を電気信号として検出する１又は複数の検出器を備えていてもよい。その場合、各検出器は、検出する光に応じて適宜配置することができる。また、検出器の種類も特に限定されるものではないが、例えばＰＭＴ（Photo-Multiplier Tube；光電子増倍管）、ＣＣＤ（Charge Coupled Device；電荷結合素子）やＣＭＯＳ（Complementary Metal Oxide Semiconductor）などの固体撮像素子を用いた光検出器を使用することができる。 The analyzer according to the present embodiment may include one or a plurality of detectors that detect emitted light such as transmitted light, reflected light, scattered light, or fluorescence as an electrical signal. In that case, each detector can be appropriately arranged according to the light to be detected. Also, the type of detector is not particularly limited. For example, PMT (Photo-Multiplier Tube), CCD (Charge Coupled Device), CMOS (Complementary Metal Oxide Semiconductor), etc. A photodetector using a solid-state image sensor can be used.
図６は本実施形態の分析装置の構成例を示す模式図である。例えば本実施形態の分析装置により円二色性を測定する場合は、図６に示すように、試料３を挟んで、円偏光照射器１と、透過光Ｔ１を検出するための光検出器４とを配置する。また、本実施形態の分析装置には、検出器４で検出された光信号Ｓ１と、円偏光照射器１の光遮断部１３からの参照信号Ｓ２に基づき、円二色性信号を生成する円二色性検出部５を設けることもできる。 FIG. 6 is a schematic diagram illustrating a configuration example of the analyzer according to the present embodiment. For example, when the circular dichroism is measured by the analyzer of this embodiment, as shown in FIG. 6, the sample 3 is sandwiched between the circularly polarized irradiator 1 and the photodetector 4 for detecting the transmitted light T1. And place. Further, in the analysis apparatus of the present embodiment, a circular dichroism signal is generated based on the optical signal S1 detected by the detector 4 and the reference signal S2 from the light blocking unit 13 of the circularly polarized illuminator 1. A dichroism detection unit 5 can also be provided.
図７Ａは円偏光に変換する前の直線偏光Ｌ３の光強度を示し、図７Ｂは円偏光照射器１から出射された円偏光Ｌ４の光強度を示し、図７Ｃは試料３が円二色性を有しない場合の検出信号を示し、図７Ｄは試料３が円二色性を有する場合の検出信号を示す図である。円偏光照射器１では、光源から出射された直線偏光又は光源から出射された光から取り出された直線偏光を、直線偏光のｘ軸方向成分とｙ軸方向成分に分離した後、これらの成分を交互に遮断して、離散的に２つの直線偏光の間で変調された光ビームを生成する。図７Ａに示すように、この光ビーム（直線偏光）では、ｘ軸方向成分の光強度ＩＸＬＰと、ｙ軸方向成分の光強度ＩＹＬＰは、同じになっている。 7A shows the light intensity of the linearly polarized light L3 before being converted into circularly polarized light, FIG. 7B shows the light intensity of the circularly polarized light L4 emitted from the circularly polarized light irradiator 1, and FIG. 7C shows that the sample 3 has circular dichroism. FIG. 7D is a diagram showing a detection signal when the sample 3 has circular dichroism. In the circularly polarized light irradiator 1, the linearly polarized light emitted from the light source or the linearly polarized light extracted from the light emitted from the light source is separated into the x-axis direction component and the y-axis direction component of the linearly polarized light, and then these components are converted. Alternately blocking produces a light beam that is discretely modulated between two linear polarizations. As shown in FIG. 7A, in the optical beam (linearly polarized light), and the light intensity I XLP the x-axis direction component, the light intensity I YLP the y-axis direction component is the same.
この直線偏光は、ｘ軸方向成分及びｙ軸方向成分がそれぞれ左円偏光と右円偏光に変換されて、左円偏光と右円偏光が離散的に繰り返す円偏光Ｌ４が生成し、この円偏光Ｌ４が試料３に照射される。このとき、光学素子としてバビネ−ソレイユの補償板を用いると、高精度に左円偏光又は右円偏光に変換することが可能となる。また、図７Ｂに示すように、円偏光Ｌ４では、左円偏光成分の光強度ＩＬＣＰと、右円偏光成分の光強度ＩＲＣＰは、同じである。 This linearly polarized light is converted into a left circularly polarized light and a right circularly polarized light in the x-axis direction component and the y-axis direction component, respectively, and circularly polarized light L4 in which the left circularly polarized light and the right circularly polarized light are discretely generated is generated. The sample 3 is irradiated with L4. At this time, if a Babinet-Soleil compensator is used as the optical element, it can be converted into left circularly polarized light or right circularly polarized light with high accuracy. Further, as shown in FIG. 7B, in the circularly polarized light L4, the light intensity I LCP of the left circularly polarized component and the light intensity I RCP of the right circularly polarized component are the same.
試料３を透過した光Ｔ１は、検出器４で検出される。このとき、試料３が円二色性を有しない場合は、図７Ｃに示すように、左円偏光の検出信号強度ＩＬＣＰと、右円偏光の検出信号強度ＩＲＣＰは同じになる。一方、入射光の波長において、左円偏光と右円偏光とで吸光度に差（円二色性）がある場合は、図７Ｄに示すように、左円偏光の検出信号強度ＩＬＣＰと、右円偏光の検出信号強度ＩＲＣＰに差が生じる。 The light T1 transmitted through the sample 3 is detected by the detector 4. At this time, when the sample 3 does not have circular dichroism, as shown in FIG. 7C, the detection signal intensity I LCP of the left circular polarization and the detection signal intensity I RCP of the right circular polarization are the same. On the other hand, when there is a difference in absorbance (circular dichroism) between the left circularly polarized light and the right circularly polarized light at the wavelength of the incident light, as shown in FIG. 7D, the detection signal intensity I LCP of the left circularly polarized light and the right A difference occurs in the detection signal intensity I RCP of circularly polarized light.
そこで、変調光の位相を予め片方のビームを遮断して決定し、その変調光の位相（参照信号Ｓ２）で光信号Ｓ１をロックイン検出することにより、左円偏光と右円偏光の強度の相対的な光強度差（ＩＬＣＰ−ＩＲＣＰ）を得ることができる。そして、この相対的な光強度差から円二色性信号を見積もることにより、確度の高い円二色性信号を高感度に検出することが可能となる。 Accordingly, the phase of the modulated light is determined in advance by blocking one of the beams, and the optical signal S1 is locked-in by the phase of the modulated light (reference signal S2), whereby the intensity of the left circularly polarized light and the right circularly polarized light can be determined. A relative light intensity difference (I LCP -I RCP ) can be obtained. Then, by estimating the circular dichroism signal from this relative light intensity difference, it is possible to detect a highly accurate circular dichroic signal with high sensitivity.
以上のように、本実施形態の分析装置は、試料に対して直線偏光成分の混入のない円偏光を照射することができるため、異方性を有する試料についてもアーティファクトの影響を抑えた円二色性測定が可能となる。更に、本実施形態の分析装置は、透過光に基づく円二色性測定だけでなく、反射光、散乱光又は発光の測定についても、従来の装置に比べて高精度の検出が可能であり、その結果、特に、固体試料などについては、周期構造の配列に関する情報などのように試料特有の性質を抽出することもできる。 As described above, the analyzer according to the present embodiment can irradiate the sample with circularly polarized light that does not include linearly polarized light components. Color measurement can be performed. Furthermore, the analyzer of this embodiment can detect not only circular dichroism based on transmitted light but also highly accurate detection of reflected light, scattered light, or luminescence compared to conventional devices. As a result, particularly for a solid sample or the like, it is possible to extract sample-specific properties such as information on the arrangement of periodic structures.
（第３の実施形態）
次に、本発明の第３の実施形態に係る顕微鏡について説明する。本実施形態の顕微鏡は、前述した第１の実施形態の円偏光照射器を備え、観察対象の試料に円偏光照射器１から出射された円偏光を照射するものである。図８は本実施形態の顕微鏡の構成例を示す模式図である。
(Third embodiment)
Next, a microscope according to the third embodiment of the present invention will be described. The microscope of this embodiment includes the circularly polarized light irradiator of the first embodiment described above, and irradiates the sample to be observed with circularly polarized light emitted from the circularly polarized light irradiator 1. FIG. 8 is a schematic diagram illustrating a configuration example of the microscope according to the present embodiment.
例えば、本実施形態の顕微鏡が円二色性顕微鏡である場合は、図８に示すように、円偏光照射器１、対物レンズ６、結像レンズ７、光検出器４、円二色性検出部５などを備える。図８に示す顕微鏡により試料３の円二色性像を観察する場合は、円偏光照射器１から出射された円偏光を試料３に照射し、試料３からの透過光を対物レンズ６で捕集した後、結像レンズ７で結像させ、光検出器４で電気信号として検出する。 For example, when the microscope of the present embodiment is a circular dichroism microscope, as shown in FIG. 8, a circularly polarized light irradiator 1, an objective lens 6, an imaging lens 7, a photodetector 4, a circular dichroism detection. Part 5 and the like. When observing a circular dichroism image of the sample 3 with the microscope shown in FIG. 8, the sample 3 is irradiated with circularly polarized light emitted from the circularly polarized irradiator 1, and the transmitted light from the sample 3 is captured by the objective lens 6. After being collected, it is imaged by the imaging lens 7 and detected as an electrical signal by the photodetector 4.
光検出器４で検出された電気信号は円二色性検出部５に送られ、円二色性検出部５において円二色性信号が算出される。具体的には、円二色性検出部５では、ロックインアンプなどを用いて、光検出器４で検出された電気信号を、円偏光における左右円偏光変調の位相でロックイン検出を行い、透過光における左円偏と右円偏光の相対的な強度差（ＩＬＣＰ−ＩＲＣＰ）を求め、円二色性信号を得る。これにより、確度の高い円二色性信号を高感度に検出することが可能となる。 The electrical signal detected by the photodetector 4 is sent to the circular dichroism detection unit 5, and the circular dichroism detection unit 5 calculates a circular dichroism signal. Specifically, the circular dichroism detection unit 5 uses a lock-in amplifier or the like to perform lock-in detection on the electrical signal detected by the photodetector 4 at the phase of left-right circular polarization modulation in circular polarization, A relative intensity difference (I LCP -I RCP ) between the left circular polarization and the right circular polarization in the transmitted light is obtained, and a circular dichroism signal is obtained. This makes it possible to detect a highly accurate circular dichroism signal with high sensitivity.
本実施形態の顕微鏡は、透過光の結像位置にピンホール８が設けられていてもよい。その場合、ピンホール８を通過した光が光検出器４で検出される。このように、対物レンズ６と結像レンズ７で結像させた光学イメージの一部を、ピンホール８で抽出することにより、試料３からの局所的な応答を検出することができる。 In the microscope of this embodiment, the pinhole 8 may be provided at the imaging position of the transmitted light. In that case, the light passing through the pinhole 8 is detected by the photodetector 4. Thus, by extracting a part of the optical image formed by the objective lens 6 and the imaging lens 7 with the pinhole 8, the local response from the sample 3 can be detected.
ただし、この場合、光検出器４で得られる信号は、試料の特定の領域からのものに限定される。そこで、より広範囲な領域を観察する場合は、例えばＸ−Ｙステージ９で試料３を移動させるか、又は、円偏光照射器１からの照射位置を移動させるなどの方法により、試料３に対して円偏光を相対的に走査しながら照射する。これにより、局所的な光学応答の二次元マッピングを行うことができるため、円二色性を表す走査顕微鏡像を得ることができる。 However, in this case, the signal obtained by the photodetector 4 is limited to that from a specific region of the sample. Therefore, when observing a wider area, the sample 3 is moved with respect to the sample 3 by a method such as moving the sample 3 on the XY stage 9 or moving the irradiation position from the circularly polarized irradiator 1. Irradiate while relatively scanning circularly polarized light. Thereby, since two-dimensional mapping of a local optical response can be performed, the scanning microscope image showing circular dichroism can be obtained.
更に、本実施形態の顕微鏡は、光検出器４に高速イメージセンサを用い、それぞれの素子において前述したロックイン検出を行えば、試料３に対して円偏光を相対的に走査しながら照射しなくても、円二色性を表す顕微鏡像を得ることができる。 Furthermore, the microscope of the present embodiment uses a high-speed image sensor for the photodetector 4 and performs the above-described lock-in detection in each element, so that the sample 3 is not irradiated while being scanned with circularly polarized light relatively. However, a microscopic image representing circular dichroism can be obtained.
本実施形態の顕微鏡は、基本的には、円偏光は集光せず、平行ビームの状態で試料に照射するが、例えば試料３に照射する光の偏光特性に擾乱を生じない場合には、円偏光照射器１と試料３との間に集光レンズ（図示せず）などを配置し、円偏光照射器１から出射された円偏光を集光して試料３に照射してもよい。 The microscope of this embodiment basically does not collect circularly polarized light and irradiates the sample in the state of a parallel beam. For example, when there is no disturbance in the polarization characteristics of the light applied to the sample 3, A condensing lens (not shown) or the like may be disposed between the circularly polarized light irradiator 1 and the sample 3 to collect the circularly polarized light emitted from the circularly polarized light irradiator 1 and irradiate the sample 3.
以上のように、本実施形態の顕微鏡は、円偏光照射器により発生した左右円偏光が離散的に繰り返す円偏光変調ビームを、円偏光の特性に擾乱を生じない場合を除き、集光せずに平行ビームの状態で用いるため、光学系による不要な擾乱を受けることなく、高い円偏光純度を保ったまま試料に照射することができる。その結果、従来は観察が難しいとされてきた固体試料の円二色性も、アーティファクトの影響を抑え、高い感度と分解能で観察することが可能となる。 As described above, the microscope according to the present embodiment does not collect the circularly polarized modulated beam in which the left and right circularly polarized light generated by the circularly polarized irradiator is discretely repeated unless the characteristic of the circularly polarized light is not disturbed. Therefore, it is possible to irradiate the sample while maintaining high circular polarization purity without receiving unnecessary disturbance by the optical system. As a result, the circular dichroism of a solid sample that has conventionally been difficult to observe can also be observed with high sensitivity and resolution while suppressing the influence of artifacts.
また、本実施形態の顕微鏡では、左円偏光と右円偏光を単一のビームとして試料に照射し、試料からの局所的な円二色性信号を検出することにより、不均一な試料についても、円二色性の局所分布を高空間分解能で分析することができる。更に、本実施形態の顕微鏡は、試料の円二色性強度の空間分布を得ることが可能であるため、例えば分子単体の光学活性の評価・追跡のみならず、凝集体・集合体生成による光学活性の変化の過程などをライブ観察することも可能である。即ち、本実施形態の顕微鏡は、医療・バイオなど幅広い分野において新しい観察・定量評価手法を提供するものである。 In the microscope of this embodiment, the left circularly polarized light and the right circularly polarized light are irradiated onto the sample as a single beam, and a local circular dichroism signal from the sample is detected, so that even a non-uniform sample can be detected. The local distribution of circular dichroism can be analyzed with high spatial resolution. Furthermore, since the microscope of the present embodiment can obtain a spatial distribution of the circular dichroic intensity of the sample, for example, not only the evaluation and tracking of the optical activity of a single molecule but also the optical by aggregate / aggregate generation. It is also possible to observe the process of activity change live. That is, the microscope of the present embodiment provides a new observation / quantitative evaluation method in a wide range of fields such as medicine and biotechnology.
更にまた、本実施形態の顕微鏡は、生体細胞内における不斉分子の掌性の変換や輸送過程の観察にも有用である。そして、今後、円二色性をプローブ信号にしたイメージ技術が確立されれば、本実施形態の顕微鏡を適用することで、基質染色やラマン散乱による分子イメージ法に続く新しいバイオライブイメージング技術を実現可能となる。 Furthermore, the microscope of the present embodiment is useful for the conversion of the chirality of asymmetric molecules in living cells and the observation of transport processes. In the future, if an image technology using circular dichroism as a probe signal is established, a new bio-live imaging technology following the molecular imaging method using substrate staining and Raman scattering will be realized by applying the microscope of this embodiment. It becomes possible.
なお、本実施形態の顕微鏡における上記以外の構成及び効果は、前述した第２の実施形態と同様である。 The configuration and effects of the microscope of this embodiment other than those described above are the same as those of the second embodiment described above.
以下、本発明の実施例及び比較例を示し、本発明の効果について具体的に説明する。 Examples of the present invention and comparative examples will be shown below, and the effects of the present invention will be specifically described.
＜実施例１＞
先ず、本発明の円偏光照射器を用いて顕微鏡観察を行い、固体試料の円二色性像を得た。試料には、光学不活性である透明ガラス基板上に、厚さ１ｎｍの金属クロム膜を形成したものを用いた。また、測定には直径０．１ｍｍのピンホールを用い、観察波長は７００ｎｍとした。
<Example 1>
First, microscopic observation was performed using the circularly polarized irradiator of the present invention, and a circular dichroism image of a solid sample was obtained. The sample used was a 1 nm thick metal chromium film formed on an optically inactive transparent glass substrate. Further, a pinhole having a diameter of 0.1 mm was used for the measurement, and the observation wavelength was 700 nm.
図９Ａは試料の透過光像であり、図９Ｂは円二色性像であり、図９Ｃは試料中心付近の円二色性信号のラインプロファイルである。図９Ａに示す透過光像では、破線の右側にクロム薄膜が観察された。これに対して、図９Ｂに示すロックインの時定数３００ｍ秒で取得した円二色性像でも、クロム薄膜と基板との境界付近を除き、ほぼ０の円二色性信号が得られた。 9A is a transmitted light image of the sample, FIG. 9B is a circular dichroic image, and FIG. 9C is a line profile of a circular dichroic signal near the center of the sample. In the transmitted light image shown in FIG. 9A, a chromium thin film was observed on the right side of the broken line. On the other hand, even in the circular dichroism image acquired with a lock-in time constant of 300 milliseconds shown in FIG. 9B, a substantially zero circular dichroism signal was obtained except for the vicinity of the boundary between the chromium thin film and the substrate.
図９Ｃに示すその中央付近のラインプロファイルから、０．０００６１Ｏ．Ｄ．という標準偏差の値（楕円率に換算して２０．１ｍｄｅｇに相当）が得られた。この値がこの測定のノイズレベルとなり、０．１４％の光吸収信号の大きさに相当する。以上から、例えば円二色性の値として楕円率約２０ｍｄｅｇ以上の変化がある試料では、本発明の顕微鏡を用いることで、円二色性の分布を画像として得ることができる。なお、本測定では、直径０．１ｍｍのピンホールを用いているが、ピンホールの径を大きくすれば、空間分解能は低下するが、感度限界を大きくすることが可能である。 From the line profile near the center shown in FIG. D. A standard deviation value (corresponding to 20.1 mdeg in terms of ellipticity) was obtained. This value is the noise level of this measurement and corresponds to the magnitude of the light absorption signal of 0.14%. From the above, for example, in a sample having a change in ellipticity of about 20 mdeg or more as the circular dichroism value, the circular dichroism distribution can be obtained as an image by using the microscope of the present invention. In this measurement, a pinhole having a diameter of 0.1 mm is used. However, if the diameter of the pinhole is increased, the spatial resolution is lowered, but the sensitivity limit can be increased.
＜実施例２＞
次に、本発明の顕微鏡の空間分解能を評価した。図１０Ａは二次元金属ナノ構造体の電子顕微鏡写真であり、図１０Ｂは透過光像であり、図１０Ｃは本発明の顕微鏡を用いて撮影した円二色性像である。本実施例では、円二色性信号を、光学顕微鏡として十分な空間分解能を確保しつつ、可視化できるか確認するため、試料には、円二色性の掌性が選択でき、任意の面積領域に試料作成が可能なキラルな形状の二次元金属ナノ構造体を用いた。具体的には、図１０Ａに示すように、ガラス基板上に、風車型の金ナノ構造体を１μｍ間隔で形成したものを試料とした。
<Example 2>
Next, the spatial resolution of the microscope of the present invention was evaluated. FIG. 10A is an electron micrograph of a two-dimensional metal nanostructure, FIG. 10B is a transmitted light image, and FIG. 10C is a circular dichroism image taken using the microscope of the present invention. In this example, in order to confirm whether the circular dichroism signal can be visualized while ensuring sufficient spatial resolution as an optical microscope, the circular dichroic palmarity can be selected for the sample, and an arbitrary area region can be selected. In addition, a two-dimensional metal nanostructure having a chiral shape capable of sample preparation was used. Specifically, as shown in FIG. 10A, a windmill type gold nanostructure formed on a glass substrate at intervals of 1 μm was used as a sample.
図１０Ｂに示す透過光像では、ナノ構造体の配列状態に対応した格子状のパターンが観察された。この透過光像と走査型電子顕微鏡（ＳＥＭ）像を比較したところ、図１０Ｂにおいて強い消光が起きている部位に、ナノ構造体の中心が位置していた。これに対して、図１０Ｃに示す円二色性像では、強い消光が起きていた位置よりも、ナノ構造体の上下左右の４箇所の局所部位において、円二色性の極大値がみられた。この円二色性の極大値を示したスポットの大きさ（ピークの半値幅）は３００〜４００ｎｍであった。 In the transmitted light image shown in FIG. 10B, a lattice-like pattern corresponding to the arrangement state of the nanostructures was observed. When this transmitted light image and a scanning electron microscope (SEM) image were compared, the center of the nanostructure was located at a site where strong quenching occurred in FIG. 10B. On the other hand, in the circular dichroic image shown in FIG. 10C, the local maximum of circular dichroism is observed at the four local parts on the top, bottom, left, and right of the nanostructure rather than the position where strong quenching occurred. It was. The size of the spot showing the maximum value of the circular dichroism (peak half width) was 300 to 400 nm.
また、この試料の隣り合うスポットの間隔は７０７ｎｍと見積もられる。２点間を識別できる光学顕微鏡の分解能はレーリーの基準によると、この測定波長７００ｎｍ及び用いた対物レンズから算出すると５７０ｎｍであるが、この円二色性像では約７００ｎｍ離れたスポットは明瞭に分離しており、空間分解能は３００〜４００ｎｍ程度まで高くなっていると考えられる。図１０Ｃにおけるロックインの時定数は１００ミリ秒であり、縦１００×横１００ピクセルの本観察にはおおよそ２０分程度の時間が必要であった。 The interval between adjacent spots of this sample is estimated to be 707 nm. According to Rayleigh's standard, the resolution of an optical microscope that can distinguish between two points is 570 nm when calculated from this measurement wavelength of 700 nm and the objective lens used. In this circular dichroism image, spots separated by about 700 nm are clearly separated. Therefore, it is considered that the spatial resolution is increased to about 300 to 400 nm. The lock-in time constant in FIG. 10C is 100 milliseconds, and the main observation of 100 pixels in the vertical direction and 100 pixels in the horizontal direction takes about 20 minutes.
また、図１０Ｃの円二色性像では、ΔＡの値の範囲は約０．０６〜０．０７であり、イメージのコントラストが光学密度で０．０１程度に留まるが、明瞭に構造が組織され、空間的に分離できていた。 Further, in the circular dichroic image in FIG. 10C, the range of ΔA is about 0.06 to 0.07, and the contrast of the image remains at about 0.01 in terms of optical density, but the structure is clearly organized. It was separated spatially.
＜実施例３＞
次に、本発明の顕微鏡を用いて、有機物結晶の円二色性像観察を行った。試料には、１，８−Dihydroxyanthraquinone（ＤＨＡ）の結晶を用い、観察波長は６００ｎｍとした。ＤＨＡは、結晶化していない状態ではアキラル分子であり円二色性を示さないが、結晶化するとキラルな結晶構造をとるため、円二色性を発現する。図１１Ａは有機物結晶（１，８−Dihydroxyanthraquinone）の透過像であり、図１１Ｂはその円二色性像である。
<Example 3>
Next, the circular dichroism image observation of the organic crystal | crystallization was performed using the microscope of this invention. As the sample, 1,8-dihydroxyanthraquinone (DHA) crystals were used, and the observation wavelength was 600 nm. DHA is an achiral molecule in a non-crystallized state and does not exhibit circular dichroism. However, DHA exhibits circular dichroism because it has a chiral crystal structure. FIG. 11A is a transmission image of an organic crystal (1,8-Dihydroxyanthraquinone), and FIG. 11B is a circular dichroism image thereof.
図１１Ａ及び図１１Ｂに示すように、本発明の顕微鏡を用いると、有機物結晶についても、明瞭な円二色性像を得ることができた。図１１Ｂは、キラルな構造をとった領域が示す円二色性信号の空間分布を示している。同じ結晶の内部でも正と負の円二色性信号を示す領域がみられるが、これは場所により異なる掌性をもつキラルな結晶構造が現れていることを意味する。 As shown in FIGS. 11A and 11B, a clear circular dichroism image could be obtained for the organic crystal using the microscope of the present invention. FIG. 11B shows the spatial distribution of the circular dichroism signal indicated by the region having the chiral structure. Even within the same crystal, a region showing positive and negative circular dichroism signals can be seen, which means that a chiral crystal structure with different palmality appears depending on the location.
以上の結果から、光学特性の計測や顕微鏡観察を行う際に、本発明の円偏光照明器を用い、ロックイン検出を行うことにより、高分解能と高感度を両立できることが確認された。 From the above results, it was confirmed that high resolution and high sensitivity can be achieved by performing lock-in detection using the circularly polarized illuminator of the present invention when measuring optical characteristics and observing under a microscope.
１、２ 円偏光照射器
３ 試料
４ 光検出器
５ 円二色性検出部
６ 対物レンズ
７ 結像レンズ
８ ピンホール
９ Ｘ−Ｙステージ
１０、１００ 光源
１１ 偏光子部
１２ 偏光分離部
１３ 光遮断部
１４ 偏光合成部
１５ 偏光変換部
２０ レーザ光源
２１、１０１ 直線偏光子
２２、２４ 光軸変位素子
２３ 光チョッパ
２５ １／４波長板
２６ ミラー
３２、３４ 光軸角度変更素子
１０２ 光弾性変調器
Ｌ１ 光
Ｌ２、Ｌ３ 直線偏光
Ｌ２ｘ ｘ軸方向成分
Ｌ２ｙ ｙ軸方向成分
Ｌ４ 円偏光
ＬＣＰ 左円偏光
ＲＣＰ 右円偏光
Ｓ１ 光信号
Ｓ２ 参照信号
Ｔ１ 透過光
DESCRIPTION OF SYMBOLS 1, 2 Circularly polarized light irradiation device 3 Sample 4 Photodetector 5 Circular dichroism detection part 6 Objective lens 7 Imaging lens 8 Pinhole 9 XY stage 10, 100 Light source 11 Polarizer part 12 Polarization separation part 13 Light interruption | blocking Unit 14 Polarization Synthesizer 15 Polarization Conversion Unit 20 Laser Light Source 21, 101 Linear Polarizer 22, 24 Optical Axis Displacement Element 23 Optical Chopper 25 1/4 Wave Plate 26 Mirror 32, 34 Optical Axis Angle Change Element 102 Photoelastic Modulator L1 Light L2, L3 Linearly polarized light L2x x-axis direction component L2y y-axis direction component L4 circularly polarized light LCP left circularly polarized light RCP right circularly polarized light S1 optical signal S2 reference signal T1 transmitted light
Claims (15)
前記光源から出射された直線偏光又は前記光源から出射された光から取り出された直線偏光を、ｘ軸方向成分とｙ軸方向成分とに分ける偏光分離部と、
前記偏光分離部で分離された直線偏光のｘ軸方向成分とｙ軸方向成分とを交互に遮断する光遮断部と、
前記光遮断部を通過した直線偏光のｘ軸方向成分とｙ軸方向成分とを同軸に合成する偏光合成部と、
前記偏光合成部から出射された直線偏光を円偏光に変換する偏光変換部と
を有する円偏光照射器。 A light source;
A polarization separation unit that divides linearly polarized light emitted from the light source or linearly polarized light extracted from the light emitted from the light source into an x-axis direction component and a y-axis direction component;
A light blocking unit that alternately blocks the x-axis direction component and the y-axis direction component of the linearly polarized light separated by the polarization separation unit;
A polarization combining unit that coaxially combines the x-axis direction component and the y-axis direction component of the linearly polarized light that has passed through the light blocking unit;
A circularly polarized light irradiator having a polarization conversion unit that converts linearly polarized light emitted from the polarization combining unit into circularly polarized light.
前記円偏光照射器から出射された円偏光を試料に照射し、前記試料の光学特性を測定する分析装置。 The circularly polarized light irradiator according to any one of claims 1 to 6,
An analyzer that irradiates a sample with circularly polarized light emitted from the circularly polarized irradiator and measures optical characteristics of the sample.
観察対象の試料に、前記円偏光照射器から出射された円偏光を照射する顕微鏡。 The circularly polarized light irradiator according to any one of claims 1 to 6,
A microscope that irradiates a sample to be observed with circularly polarized light emitted from the circularly polarized light irradiator.
前記対物レンズから出射した透過光を結像させる結像レンズと、
前記透過光を電気信号として検出する光検出器と、
前記光検出器で検出された電気信号から円二色性信号を得る円二色性検出部と、
を備える請求項１１に記載の顕微鏡。 An objective lens for collecting transmitted light from the sample;
An imaging lens that forms an image of transmitted light emitted from the objective lens;
A photodetector for detecting the transmitted light as an electrical signal;
A circular dichroism detector for obtaining a circular dichroism signal from the electrical signal detected by the photodetector;
The microscope according to claim 11.
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