JP2016145770A - 光学分析装置 - Google Patents
光学分析装置 Download PDFInfo
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- JP2016145770A JP2016145770A JP2015023173A JP2015023173A JP2016145770A JP 2016145770 A JP2016145770 A JP 2016145770A JP 2015023173 A JP2015023173 A JP 2015023173A JP 2015023173 A JP2015023173 A JP 2015023173A JP 2016145770 A JP2016145770 A JP 2016145770A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 67
- 239000004065 semiconductor Substances 0.000 claims description 8
- 238000004458 analytical method Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract description 15
- 238000001514 detection method Methods 0.000 abstract description 8
- 239000000523 sample Substances 0.000 description 33
- 230000001678 irradiating effect Effects 0.000 description 5
- 238000002835 absorbance Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000000870 ultraviolet spectroscopy Methods 0.000 description 3
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 229910052805 deuterium Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 238000004020 luminiscence type Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000012488 sample solution Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/10—Controlling the intensity of the light
- H05B45/12—Controlling the intensity of the light using optical feedback
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
- G01N2201/0621—Supply
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0638—Refractive parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0692—Regulated sources; stabilised supply
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0695—Supply to maintain constant beam intensity
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
a)前記光照射部から前記試料に至る光路上に配置され、受けた光を前記試料に集光しつつ、一部の光を集束させずに非集束光を作る光学部材と、
b)前記光学部材による前記非集束光が到達する位置に配置された第2の光検出器と、
c)前記第2の光検出器による強度信号に基づき、光量が一定になるように前記半導体発光素子に供給する駆動電流を制御する制御部と、
を備えることを特徴としている。
図1は本発明の一実施例である吸光光度計の概略構成図である。
この例では、集束・非集束光学部材2は、同一径の二個のボールレンズ21、22を距離Lだけ離して配置したものである。二個のボールレンズ21、22の中心点を結ぶ線を光軸とし、その延長線上に光照射部1におけるLEDのチップ(発光部)1aが位置するように、光照射部1と集束・非集束光学部材2との位置関係を定める。LEDチップ1aの中心(上記光軸の延長線上の位置)から放射状に広がりつつ発した光は、前段のボールレンズ21で略平行光束になるように屈折され、後段のボールレンズ22で集束するように屈折される。そして集束光Aとして試料セル3(図示せず)に照射される。
1a…LEDチップ
2…集束・非集束光学部材
21、22…ボールレンズ
3…試料セル
4…光検出器
5…第2光検出器
6…駆動電流制御部
7…電流源
8…アナログデジタル変換器
9…データ処理部
A…集束光
B…非集束光
Claims (2)
- 光源として半導体発光素子を用いた光照射部からの光を測定対象である試料に照射し、それに対して該試料から得られる光を光検出器に導入して該試料についての分析を行う光学分析装置において、
a)前記光照射部から前記試料に至る光路上に配置され、受けた光を前記試料に集光しつつ、一部の光を集束させずに非集束光を作る光学部材と、
b)前記光学部材による前記非集束光が到達する位置に配置された第2の光検出器と、
c)前記第2の光検出器による強度信号に基づき、光量が一定になるように前記半導体発光素子に供給する駆動電流を制御する制御部と、
を備えることを特徴とする光学分析装置。 - 請求項1に記載の光学分析装置であって、
前記光学部材は、複数の球面レンズを所定距離離して配置したものであることを特徴とする光学分析装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015023173A JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
US15/015,810 US9877368B2 (en) | 2015-02-09 | 2016-02-04 | Optical analyzer |
CN201610079436.3A CN105866029B (zh) | 2015-02-09 | 2016-02-04 | 光学分析仪 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015023173A JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016145770A true JP2016145770A (ja) | 2016-08-12 |
JP2016145770A5 JP2016145770A5 (ja) | 2017-09-21 |
JP6500474B2 JP6500474B2 (ja) | 2019-04-17 |
Family
ID=56567296
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JP2015023173A Active JP6500474B2 (ja) | 2015-02-09 | 2015-02-09 | 光学分析装置 |
Country Status (3)
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US (1) | US9877368B2 (ja) |
JP (1) | JP6500474B2 (ja) |
CN (1) | CN105866029B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US12019046B2 (en) | 2020-04-30 | 2024-06-25 | Promega Corporation | Laser illumination techniques for capillary electrophoresis |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6500474B2 (ja) * | 2015-02-09 | 2019-04-17 | 株式会社島津製作所 | 光学分析装置 |
CN106251750A (zh) * | 2016-10-08 | 2016-12-21 | 铜仁学院 | 一种开放式光电效应实验仪及其操作方法 |
US10768160B2 (en) * | 2017-01-12 | 2020-09-08 | Regents Of The University Of Minnesota | Artificial gut simulator and method |
US10041914B1 (en) * | 2017-06-02 | 2018-08-07 | Shimadzu Corporation | Degassing device |
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JP2007027523A (ja) * | 2005-07-20 | 2007-02-01 | Fuji Xerox Co Ltd | 発光モジュール |
JP2011237384A (ja) * | 2010-05-13 | 2011-11-24 | Hitachi High-Technologies Corp | 分析用光学系及びその光学系を用いた分析装置 |
US20120104225A1 (en) * | 2010-11-02 | 2012-05-03 | Microsoft Corporation | Detection of configuration changes in an illumination system |
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2015
- 2015-02-09 JP JP2015023173A patent/JP6500474B2/ja active Active
-
2016
- 2016-02-04 US US15/015,810 patent/US9877368B2/en active Active
- 2016-02-04 CN CN201610079436.3A patent/CN105866029B/zh active Active
Patent Citations (4)
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JP2001343563A (ja) * | 2000-03-31 | 2001-12-14 | Oki Electric Ind Co Ltd | モニタ光取出し用光学装置 |
JP2007027523A (ja) * | 2005-07-20 | 2007-02-01 | Fuji Xerox Co Ltd | 発光モジュール |
JP2011237384A (ja) * | 2010-05-13 | 2011-11-24 | Hitachi High-Technologies Corp | 分析用光学系及びその光学系を用いた分析装置 |
US20120104225A1 (en) * | 2010-11-02 | 2012-05-03 | Microsoft Corporation | Detection of configuration changes in an illumination system |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US12019046B2 (en) | 2020-04-30 | 2024-06-25 | Promega Corporation | Laser illumination techniques for capillary electrophoresis |
Also Published As
Publication number | Publication date |
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JP6500474B2 (ja) | 2019-04-17 |
CN105866029B (zh) | 2018-12-07 |
US20160234904A1 (en) | 2016-08-11 |
US9877368B2 (en) | 2018-01-23 |
CN105866029A (zh) | 2016-08-17 |
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