JP2015195315A - metal substrate - Google Patents

metal substrate Download PDF

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Publication number
JP2015195315A
JP2015195315A JP2014073359A JP2014073359A JP2015195315A JP 2015195315 A JP2015195315 A JP 2015195315A JP 2014073359 A JP2014073359 A JP 2014073359A JP 2014073359 A JP2014073359 A JP 2014073359A JP 2015195315 A JP2015195315 A JP 2015195315A
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Prior art keywords
film
adhesive
metal substrate
metal plate
substrate
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JP2014073359A
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JP6510760B2 (en
Inventor
平野 康雄
Yasuo Hirano
康雄 平野
辰彦 岩
Tatsuhiko Iwa
辰彦 岩
渡瀬 岳史
Takeshi Watase
岳史 渡瀬
水野 雅夫
Masao Mizuno
雅夫 水野
陽子 志田
Yoko Shida
陽子 志田
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Kobe Steel Ltd
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Kobe Steel Ltd
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Priority to JP2014073359A priority Critical patent/JP6510760B2/en
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to MYPI2016703535A priority patent/MY181305A/en
Priority to PCT/JP2015/057684 priority patent/WO2015151773A1/en
Priority to CN201580016824.0A priority patent/CN106165112B/en
Priority to KR1020187036144A priority patent/KR20180135122A/en
Priority to KR1020167027058A priority patent/KR20160129870A/en
Priority to TW104109762A priority patent/TWI598464B/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K77/00Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
    • H10K77/10Substrates, e.g. flexible substrates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • B32B15/09Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin comprising polyesters
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/036Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
    • H01L31/0392Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/036Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
    • H01L31/0392Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
    • H01L31/03923Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIBIIICVI compound materials, e.g. CIS, CIGS
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K30/00Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
    • H10K30/80Constructional details
    • H10K30/88Passivation; Containers; Encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80Constructional details
    • H10K59/87Passivation; Containers; Encapsulations
    • H10K59/873Encapsulations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/40Properties of the layers or laminate having particular optical properties
    • B32B2307/402Coloured
    • B32B2307/4026Coloured within the layer by addition of a colorant, e.g. pigments, dyes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/12Photovoltaic modules
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/541CuInSe2 material PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/549Organic PV cells

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Laminated Bodies (AREA)
  • Electroluminescent Light Sources (AREA)
  • Photovoltaic Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a metal substrate in which a surface of a skin film becomes smooth by stacking a predetermined skin film on a metal plate, with the skin film having insulation nature.SOLUTION: On a surface of a metal plate, a single layer of thermoplastic resin film is stacked with an adhesive in between. The film is obtained from a composition in which a volume fraction of solid pigment is 20% or less. The metal substrate is used for a substrate type thin film solar battery or a top emission type organic EL element which is characterized in that film thickness is 12-250 μm, and surface roughness Ra of the film surface after stacking is 30nm or less.

Description

本発明は、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられる金属基板であって、皮膜の表面を平滑にすると共に、皮膜の表面が絶縁性を有する金属基板に関するものである。   The present invention relates to a metal substrate used for a substrate-type thin film solar cell or a top emission type organic EL element, and relates to a metal substrate having a smooth surface and an insulating surface.

アモルファスシリコンや、CdS・CuInSe2等の化合物半導体を用いた、いわゆる薄膜半導体太陽電池(以下、薄膜太陽電池という。)として、スーパーストレート型薄膜太陽電池とサブストレート型薄膜太陽電池の2種類の構造が知られている。 Or amorphous silicon, using a compound semiconductor such as CdS · CuInSe 2, so-called thin film semiconductor solar cell as a (hereinafter, referred to. Thin-film solar cells), 2 types of structures of a superstrate type thin film solar cell and a substrate type thin film solar cell It has been known.

スーパーストレート型薄膜太陽電池では、通常、基板、透明電極、光電変換層、裏面電極の順に積層された構造であり、基板側から光を入射させている。一方、サブストレート型薄膜太陽電池では、通常、基板、裏面電極、光電変換層、透明電極の順に積層された構造であり、透明電極側から光を入射させている。   In a super straight type thin film solar cell, it is the structure laminated | stacked in order of the board | substrate, the transparent electrode, the photoelectric converting layer, and the back electrode normally, and the light is entered from the board | substrate side. On the other hand, a substrate-type thin film solar cell usually has a structure in which a substrate, a back electrode, a photoelectric conversion layer, and a transparent electrode are laminated in this order, and light is incident from the transparent electrode side.

従来、薄膜太陽電池の基板として、透光性のガラスやプラスチック等が用いられてきた。しかし、ガラスは、割れやすい上に加工性に乏しく、重くてコストが高い等の問題があり、また、プラスチックは透湿性があるため、ガスバリア層を設ける必要があり、コストが割高になってしまうことに加え、熱を加えずに加工することは難しい。   Conventionally, translucent glass, plastic, or the like has been used as a substrate for a thin film solar cell. However, glass is easy to break and has problems such as poor workability, heavy and high cost, and plastic is moisture permeable, so it is necessary to provide a gas barrier layer, which increases the cost. In addition, it is difficult to process without applying heat.

ところで、サブストレート型薄膜太陽電池は透明電極側から光を入射させているため、サブストレート型薄膜太陽電池の基板には透光性が求められない。そのため、ガラスやプラスチックのような基板ではなく、金属板のような透光性を有さないが加工性に優れた基板を用いることができる。ただし、薄膜太陽電池として機能するためには、基板の表面が平滑であり、かつこの表面が絶縁性を有する必要があるが、金属板自身の表面は通常1μm程度以上の凹凸を有し、また導電性があるため、そのままでは基板として用いることができない。そこで、上記の条件を満たすように金属板上にフィルムを形成すれば、金属板を基板として用いることができるようになると考えられる。以下の特許文献1や2でこのような基板が提案されている。   By the way, since the substrate type thin film solar cell makes light incident from the transparent electrode side, the substrate of the substrate type thin film solar cell is not required to have translucency. Therefore, it is not possible to use a substrate such as glass or plastic but a substrate that does not have translucency such as a metal plate but has excellent workability. However, in order to function as a thin film solar cell, the surface of the substrate must be smooth and the surface needs to have insulating properties, but the surface of the metal plate itself usually has irregularities of about 1 μm or more, Since it has conductivity, it cannot be used as it is as a substrate. Therefore, it is considered that if a film is formed on a metal plate so as to satisfy the above conditions, the metal plate can be used as a substrate. Patent Documents 1 and 2 below propose such a substrate.

特許文献1には、フィルム表面の高さ400nm以上の突起が150個/mm2以下であり、フィルムの3次元表面粗さが8nm〜25nmであることを特徴とする金属板ラミネート用ポリエステルフィルムが記載されている。しかし、この特許文献1では、上記フィルムを加熱した金属板にラミネートして金属基板としており接着剤を用いていないため、この金属基板をサブストレート型薄膜太陽光発電・有機EL照明として用いる場合にはフィルムと金属板との接着性が不十分なおそれがある。 Patent Document 1 discloses a polyester film for laminating a metal plate, characterized in that the protrusion on the film surface has a height of 400 nm or more is 150 pieces / mm 2 or less, and the three-dimensional surface roughness of the film is 8 nm to 25 nm. Have been described. However, in this patent document 1, since the film is laminated on a heated metal plate to form a metal substrate and no adhesive is used, this metal substrate is used as a substrate type thin-film photovoltaic power generation and organic EL lighting. May have insufficient adhesion between the film and the metal plate.

特許文献2には、基材層と、その少なくとも一方の面に形成された平滑層とからなるフィルムであって、平滑層の表面における表面粗さRaが5.0nm以下である有機エレクトロルミネッセンス照明基板用ポリエステルフィルムが記載されている。しかし、特許文献2では、基材層の上に表面が平滑な平滑層を設けて複数層のフィルムとすることによってフィルム表面を平滑にしており、コスト面での問題が生じてしまう。   Patent Document 2 discloses an organic electroluminescence illumination that is a film including a base layer and a smooth layer formed on at least one surface thereof, and the surface roughness Ra on the surface of the smooth layer is 5.0 nm or less. A polyester film for a substrate is described. However, in patent document 2, the film surface is smoothed by providing a smooth layer having a smooth surface on the base material layer to form a film having a plurality of layers, resulting in a cost problem.

特開平11−10724号公報Japanese Patent Laid-Open No. 11-10724 特開2012−146413号公報JP 2012-146413 A

本発明は、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられる金属基板であって、熱を加えずに加工可能で、かつ低いコストで作製可能であるにもかかわらず、金属板の表面の平滑性に優れると共に、絶縁性にも優れた金属基板の提供を課題として掲げた。   The present invention relates to a metal substrate used for a substrate-type thin film solar cell or a top emission type organic EL device, which can be processed without applying heat and can be manufactured at a low cost. The problem was to provide a metal substrate with excellent surface smoothness and excellent insulation.

本発明者等は、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられる金属基板であって、金属板に積層した皮膜の表面を平滑にすると共に、皮膜の表面が絶縁性を有する金属基板を完成するに至った。   The present inventors are a metal substrate used in a substrate type thin film solar cell or a top emission type organic EL device, and smoothes the surface of the film laminated on the metal plate and has an insulating property on the surface of the film. The metal substrate was completed.

すなわち、本発明は、金属板の表面に、接着剤を介して1層の熱可塑性樹脂フィルムが積層されており、上記フィルムは、固体顔料の体積分率が20%以下である組成物から得られたものであり、膜厚が12μm以上250μm以下、積層後の上記フィルム表面の表面粗さRaが30nm以下であることを特徴とする金属基板であり、上記金属基板は、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられる。   That is, in the present invention, a thermoplastic resin film of one layer is laminated on the surface of a metal plate via an adhesive, and the film is obtained from a composition having a solid pigment volume fraction of 20% or less. A metal substrate characterized in that the film thickness is 12 μm or more and 250 μm or less, and the surface roughness Ra of the film surface after lamination is 30 nm or less. Used for batteries or top emission organic EL elements.

上記熱可塑性樹脂は、ポリエステル樹脂であることが好ましい。   The thermoplastic resin is preferably a polyester resin.

上記積層後のフィルム表面の表面粗さRaは10nm以下であることが好ましい。   The surface roughness Ra of the film surface after lamination is preferably 10 nm or less.

本発明に係る金属基板は、金属板に所定のフィルムを積層することによって、金属基板の表面が平滑になり、さらに金属基板が絶縁性を有するものとなった。この加工性に優れた金属基板を用いることによって、低コストで薄膜太陽電池や有機EL素子を得ることが可能となった。   In the metal substrate according to the present invention, by laminating a predetermined film on the metal plate, the surface of the metal substrate becomes smooth, and the metal substrate has insulating properties. By using a metal substrate excellent in workability, it has become possible to obtain a thin film solar cell and an organic EL element at low cost.

本発明の金属基板は、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられるものであり、金属板の少なくとも一方の面に接着剤を介して1層の熱可塑性樹脂フィルムが積層されたものである。   The metal substrate of the present invention is used for a substrate type thin film solar cell or a top emission type organic EL element, and a single layer of a thermoplastic resin film is laminated on at least one surface of a metal plate via an adhesive. It is a thing.

[金属板]
本発明の金属基板に用いる金属板は、冷延鋼板、溶融純亜鉛めっき鋼板(GI)、または合金化溶融Zn−Feめっき鋼板(GA)、合金化溶融Zn−5%Alめっき鋼板(GF)、電気純亜鉛めっき鋼板(EG)、電気Zn−Niめっき鋼板、アルミニウム板、チタン板、ガルバリウム鋼板等であり、ノンクロメートのものが好ましいが、クロメート処理あるいは無処理のものも使用可能である。金属板の厚みは特に限定されないが、0.3〜2.5mm程度のものを適宜使用することができる。
[Metal plate]
The metal plate used for the metal substrate of the present invention is a cold-rolled steel plate, a hot-dip galvanized steel plate (GI), an alloyed hot-dip Zn-Fe-plated steel plate (GA), an alloyed hot-dip Zn-5% Al-plated steel plate (GF). Electropure galvanized steel plate (EG), electroplated Zn—Ni plated steel plate, aluminum plate, titanium plate, galvalume steel plate and the like, preferably non-chromate, but chromate-treated or untreated can also be used. Although the thickness of a metal plate is not specifically limited, The thing of about 0.3-2.5 mm can be used suitably.

[接着剤]
本発明に用いる接着剤には、樹脂が含有されている。樹脂は特に限定されないが、ポリオレフィン樹脂、ポリエステル樹脂、ポリスチレン樹脂、ポリウレタン樹脂、などが挙げられ、ポリオレフィン樹脂又はポリエステル樹脂であることが好ましい。接着剤形成用組成物中の固形分は15〜35質量%であることが好ましく、より好ましくは20〜30質量%である。
[adhesive]
The adhesive used in the present invention contains a resin. Although resin is not specifically limited, A polyolefin resin, a polyester resin, a polystyrene resin, a polyurethane resin, etc. are mentioned, A polyolefin resin or a polyester resin is preferable. The solid content in the adhesive forming composition is preferably 15 to 35% by mass, more preferably 20 to 30% by mass.

ポリエステル樹脂は、二塩基酸等の多塩基酸と多価アルコール類との縮合反応によって得られるものである。   The polyester resin is obtained by a condensation reaction between a polybasic acid such as a dibasic acid and a polyhydric alcohol.

ポリエステル樹脂の原料として用いられる多塩基酸としては、例えば、マレイン酸、無水マレイン酸、フマル酸、イタコン酸、無水イタコン酸等のα,β−不飽和二塩基酸;フタル酸、無水フタル酸、ハロゲン化無水フタル酸、イソフタル酸、テレフタル酸、テトラヒドロフタル酸、テトラヒドロ無水フタル酸、ヘキサヒドロフタル酸、ヘキサヒドロイソフタル酸、ヘキサヒドロテレフタル酸、シクロペンタジエン−無水マレイン酸付加物、コハク酸、マロン酸、グルタル酸、アジピン酸、セバシン酸、1,10−デカンジカルボン酸、2,6−ナフタレンジカルボン酸、2,7−ナフタレンジカルボン酸、2,3−ナフタレンジカルボン酸、2,3−ナフタレンジカルボン酸無水物、4,4’−ビフェニルジカルボン酸、および、これらのジアルキルエステル等の飽和二塩基酸等が挙げられるが、特に限定されるものではない。多塩基酸は、一種類のみを用いてもよいし、適宜、二種類以上を混合して用いてもよい。   Examples of the polybasic acid used as a raw material for the polyester resin include α, β-unsaturated dibasic acids such as maleic acid, maleic anhydride, fumaric acid, itaconic acid, itaconic anhydride; phthalic acid, phthalic anhydride, Halogenated phthalic anhydride, isophthalic acid, terephthalic acid, tetrahydrophthalic acid, tetrahydrophthalic anhydride, hexahydrophthalic acid, hexahydroisophthalic acid, hexahydroterephthalic acid, cyclopentadiene-maleic anhydride adduct, succinic acid, malonic acid , Glutaric acid, adipic acid, sebacic acid, 1,10-decanedicarboxylic acid, 2,6-naphthalenedicarboxylic acid, 2,7-naphthalenedicarboxylic acid, 2,3-naphthalenedicarboxylic acid, 2,3-naphthalenedicarboxylic anhydride , 4,4′-biphenyldicarboxylic acid, and their di Saturated dibasic acids such as alkyl esters are exemplified, but are not particularly limited. Only one type of polybasic acid may be used, or two or more types may be appropriately mixed and used.

ポリエステル樹脂の原料として用いられる多価アルコール類としては、例えばエチレングリコール、ジエチレングリコール、ポリエチレングリコール等のエチレングリコール類、プロピレングリコール、ジプロピレングリコール、ポリプロピレングリコール等のプロピレングリコール類、2−メチル−1,3−プロパンジオール、1,3−ブタンジオール、ビスフェノールAとプロピレンオキシドまたはエチレンオキシドとの付加物、グリセリン、トリメチロールプロパン、1,3−プロパンジオール、1,2−シクロヘキサングリコール、1,3−シクロヘキサングリコール、1,4−シクロヘキサングリコール、パラキシレングリコール、ビシクロヘキシル−4,4’−ジオール、2,6−デカリングリコール、トリス(2−ヒドロキシエチル)イソシアヌレート等が挙げられるが、特に限定されるものではない。また、エタノールアミン等のアミノアルコール類を用いてもよい。これら多価アルコール類は、一種類のみを用いてもよいし、適宜、二種類以上を混合してもよい。また、必要によりエポキシ樹脂、ジイソシアナート、ジシクロペンタジエン等による変性を行ってもよい。   Examples of the polyhydric alcohol used as a raw material for the polyester resin include ethylene glycols such as ethylene glycol, diethylene glycol, and polyethylene glycol, propylene glycols such as propylene glycol, dipropylene glycol, and polypropylene glycol, and 2-methyl-1,3. -Propanediol, 1,3-butanediol, adduct of bisphenol A and propylene oxide or ethylene oxide, glycerin, trimethylolpropane, 1,3-propanediol, 1,2-cyclohexane glycol, 1,3-cyclohexane glycol, 1,4-cyclohexane glycol, para-xylene glycol, bicyclohexyl-4,4′-diol, 2,6-decalin glycol, tris (2-hydroxy Chill) isocyanurate, but not particularly limited. In addition, amino alcohols such as ethanolamine may be used. Only one kind of these polyhydric alcohols may be used, or two or more kinds may be appropriately mixed. If necessary, modification with epoxy resin, diisocyanate, dicyclopentadiene or the like may be performed.

本発明で用いられる接着剤としては、種々の市販品を好適に用いることができる。特に接着剤の市販品としては、例えば、熱可塑性ポリエステル系ホットメルト接着剤である東亞合成社製アロンメルト(登録商標)PESシリーズ、変性オレフィンを主成分としたホットメルト接着剤である東亞合成社製アロンメルト(登録商標)PPETシリーズ、東亞合成社製アロンマイティ(登録商標)FS−175SV10、東亞合成社製アロンマイティ(登録商標)AS−60等を挙げることができる。   As the adhesive used in the present invention, various commercially available products can be suitably used. In particular, commercially available adhesives include, for example, Aronmelt (registered trademark) PES series manufactured by Toagosei Co., Ltd., which is a thermoplastic polyester-based hot melt adhesive, and manufactured by Toagosei Co., Ltd., which is a hot melt adhesive mainly composed of a modified olefin. Aronmelt (registered trademark) PPET series, Toagosei Co., Ltd. Aronmighty (registered trademark) FS-175SV10, Toagosei Co., Ltd. Aronmite (registered trademark) AS-60, and the like can be mentioned.

上記市販品を接着剤として用いる場合、これらの市販品をメチルエチルケトン、メチルイソブチルケトン、トルエン、キシレンなどの希釈剤で希釈したものを金属板に塗布する。   When using the above-mentioned commercial products as adhesives, those commercial products diluted with diluents such as methyl ethyl ketone, methyl isobutyl ketone, toluene and xylene are applied to the metal plate.

[熱可塑性樹脂フィルム]
本発明で用いられる熱可塑性樹脂フィルムとしては、特に限定はないが、ポリエステルフィルム、ポリエチレンフィルム、ポリプロピレンフィルム、ポリスチレンフィルム、ポリビニルアルコール系フィルム、ポリ塩化ビニルフィルム、ポリ塩化ビニリデンフィルム、フッ素樹脂フィルム、セルロース系フィルム、ポリカーボネートフィルム、ポリアミドフィルムなどを挙げることができる。これらの中でも好適に使用できるのは、ポリエステルフィルムであり、より好ましいのはポリエチレンテレフタレート(PET)フィルム又はポリエチレンナフタレート(PEN)フィルムであり、さらに好ましいのはPENフィルムである。ポリエステルフィルム作製に用いられるポリエステル樹脂は上述の接着剤に用いられるポリエステル樹脂の製法と同様の製法で作製することができる。
[Thermoplastic resin film]
The thermoplastic resin film used in the present invention is not particularly limited, but polyester film, polyethylene film, polypropylene film, polystyrene film, polyvinyl alcohol film, polyvinyl chloride film, polyvinylidene chloride film, fluororesin film, cellulose Examples thereof include a system film, a polycarbonate film, and a polyamide film. Among these, a polyester film can be preferably used, a polyethylene terephthalate (PET) film or a polyethylene naphthalate (PEN) film is more preferable, and a PEN film is more preferable. The polyester resin used for producing the polyester film can be produced by the same production method as that of the polyester resin used for the above-mentioned adhesive.

本発明で用いられる熱可塑性樹脂フィルムは、フィルム単体(金属板に接着する前の状態でのフィルム)の表面粗さRaが30nm以下であることが好ましく、より好ましくはフィルム単体の表面粗さRaが10nm以下である。フィルム単体の表面粗さRaが30nmを超えたフィルムを用いて金属基板を作製すると、金属基板の表面粗さRaが大きくなってしまい、金属基板にフィルムを接着した状態におけるフィルム表面の凹凸が原因となって、電極間のショートによる動作不良を招くおそれがある。   The thermoplastic resin film used in the present invention preferably has a surface roughness Ra of a single film (film in a state before being bonded to a metal plate) of 30 nm or less, and more preferably a surface roughness Ra of the single film. Is 10 nm or less. When a metal substrate is produced using a film having a surface roughness Ra of more than 30 nm as a single film, the surface roughness Ra of the metal substrate is increased, which is caused by unevenness of the film surface when the film is adhered to the metal substrate. This may cause a malfunction due to a short circuit between the electrodes.

本発明で用いられる熱可塑性樹脂フィルムとしては、種々の市販品を好適に用いることができる。特にポリエステル樹脂の市販品としては、例えば、ユニチカ社製エンブレット(登録商標)P652、帝人デュポンフィルム社製テオネックス(登録商標)Q65FA等を挙げることができる。   Various commercially available products can be suitably used as the thermoplastic resin film used in the present invention. In particular, commercially available polyester resins include, for example, Emblet (registered trademark) P652 manufactured by Unitika, and Teonex (registered trademark) Q65FA manufactured by Teijin DuPont Films.

積層する熱可塑性樹脂フィルムの膜厚は12μm以上250μm以下である。膜厚が12μm未満であると、熱可塑性樹脂フィルムに欠陥部が存在するおそれがあり、金属基板の耐電圧が0.1kV未満となってしまい、耐電圧(絶縁耐性)を確保できないおそれがある。また、膜厚が250μmを超えると、金属基板を切断加工する際にフィルムの切断かすが発生しやすくなり、金属基板の製造ラインの生産効率が低下するおそれがある。   The thickness of the thermoplastic resin film to be laminated is 12 μm or more and 250 μm or less. If the film thickness is less than 12 μm, there may be a defect in the thermoplastic resin film, and the withstand voltage of the metal substrate becomes less than 0.1 kV, and the withstand voltage (insulation resistance) may not be ensured. . On the other hand, if the film thickness exceeds 250 μm, film cutting debris is likely to occur when the metal substrate is cut, and the production efficiency of the metal substrate production line may be reduced.

[フィルム表面の平滑性]
本発明の金属基板では、フィルム表面が平滑である必要がある。具体的には、金属基板に接着されたフィルム(積層後のフィルム)の表面粗さRaが30nm以下であり、好ましくは金属基板に接着されたフィルムの表面粗さRaが10nm以下である。金属基板に接着されたフィルムの表面粗さRaが30nmを超えると、フィルム表面の凹凸が原因となって、電極間のショートによる動作不良を招くおそれがある。なお、ほこりやゴミ等の粒子が付着することによって生じた表面の凹凸については、ほこりやゴミ等の粒子は30nm程度より遙かに大きいため、研磨等の平滑化によって容易に除去できる。そのため、ほこりやゴミ等の粒子による凹凸は、動作不良につながるおそれは極めて低い。金属基板に接着されたフィルムの表面粗さRaについては、後述の測定方法により測定することができる。
[Smoothness of film surface]
In the metal substrate of the present invention, the film surface needs to be smooth. Specifically, the surface roughness Ra of the film adhered to the metal substrate (film after lamination) is 30 nm or less, and preferably the surface roughness Ra of the film adhered to the metal substrate is 10 nm or less. When the surface roughness Ra of the film bonded to the metal substrate exceeds 30 nm, the film surface may be uneven, which may cause a malfunction due to a short circuit between the electrodes. Note that the irregularities on the surface caused by the attachment of particles such as dust and dust can be easily removed by smoothing such as polishing because the particles of dust and dust are much larger than about 30 nm. Therefore, unevenness due to particles such as dust and dust is very unlikely to lead to malfunction. About the surface roughness Ra of the film adhere | attached on the metal substrate, it can measure with the below-mentioned measuring method.

[顔料]
フィルム表面を平滑にする、具体的にはフィルム表面の表面粗さRaを30nm以下にするためには、フィルムには固体顔料が含有されていないのが好ましい。但し、着色フィルムを用いる必要がある場合は、フィルム形成用組成物中の固体顔料の体積分率を20%以下とするのが好ましい。固体顔料の粒径は通常30nmよりもかなり大きいため、フィルム形成用組成物中の固体顔料の体積分率が20%を超えると、フィルム表面の表面粗さRaを30nm以下とするのが困難になる。
[Pigment]
In order to smooth the film surface, specifically, to make the surface roughness Ra of the film surface 30 nm or less, it is preferable that the film does not contain a solid pigment. However, when it is necessary to use a colored film, the volume fraction of the solid pigment in the film-forming composition is preferably 20% or less. Since the particle size of the solid pigment is usually much larger than 30 nm, if the volume fraction of the solid pigment in the film-forming composition exceeds 20%, it is difficult to reduce the surface roughness Ra of the film surface to 30 nm or less. Become.

下記のそれぞれの色に着色するための顔料種類の例としては、白色:酸化チタン、炭酸カルシウム、酸化亜鉛、硫酸バリウム、リトポン、鉛白等の無機系顔料、黒色:アニリンブラック、ニグロシン等の有機系顔料、カーボンブラック、鉄黒等の無機系顔料、赤色:不溶性アゾ系(ナフトール系およびアニライド系)または溶性アゾ系等の有機系顔料や、べんがら、カドミウムレッド、鉛丹等の無機系顔料、黄色:不溶性アゾ系(ナフトール系およびアニライド系)、溶性アゾ系、キナクリドン系等の有機系顔料や、クロムエロー、カドミウムイエロー、ニッケルチタンイエロー、黄丹、ストロンチウムクロメート等の無機系顔料、緑色:有機フタロシアニン系顔料、青色:有機フタロシアニン系顔料、ジオキサジン系顔料、紺青、群青、コバルト青、エメラルドグリーン等の無機系顔料、橙色:ベンズイミダゾロン系、ピラゾロン系等の有機系顔料等が挙げられる。上記着色顔料のうち、同色でも化学構造の異なるもの、あるいは異なる色の着色顔料を2種類以上適当な配合比で混合することにより、灰色、茶色、紫色、赤紫色、青紫色、橙色、黄金色等所望の色に着色することができる。   Examples of pigment types for coloring each of the following colors include: white: inorganic pigments such as titanium oxide, calcium carbonate, zinc oxide, barium sulfate, lithopone, and lead white; black: organic such as aniline black and nigrosine Pigments, inorganic pigments such as carbon black and iron black, red: organic pigments such as insoluble azo (naphthol and anilide) or soluble azo pigments, inorganic pigments such as bengara, cadmium red and red lead, Yellow: Organic pigments such as insoluble azo (naphthol and anilide), soluble azo, and quinacridone, inorganic pigments such as chrome yellow, cadmium yellow, nickel titanium yellow, tan and strontium chromate, green: organic phthalocyanine Pigments, blue: organic phthalocyanine pigments, dioxazine pigments, bitumen, ultramarine, co Belt blue, inorganic pigments such as emerald green, orange: benzimidazolone, organic pigments such pyrazolone and the like. Of the above color pigments, those with the same color but different chemical structures, or by mixing two or more color pigments of different colors at an appropriate blending ratio, gray, brown, purple, red purple, blue purple, orange, golden color It can be colored to a desired color.

例えば、酸化チタンにおいては、平均粒径は、例えば粒状の場合は概ね0.1〜0.5μm、好ましくは0.2μm以上、0.4μm以下、更に好ましくは0.3μm以下とすることが推奨される。平均粒径が0.5μmを超えると、酸化チタンを含むフィルム形成用組成物より形成されたフィルム表面の表面粗さRaを30nm以下とするのが困難になる。   For example, in the case of titanium oxide, it is recommended that the average particle diameter is, for example, about 0.1 to 0.5 μm, preferably 0.2 μm or more, 0.4 μm or less, and more preferably 0.3 μm or less when granular. Is done. When the average particle size exceeds 0.5 μm, it becomes difficult to make the surface roughness Ra of the film surface formed from the film-forming composition containing titanium oxide 30 nm or less.

ここで、上記酸化チタンの平均粒径は、一般的な粒度分布計によって分級後の酸化チタン粒子の粒度分布を測定し、その測定結果に基づいて算出される小粒径側からの積算値50%の粒度(D50)を意味する。斯かる粒度分布は、粒子に光を当てることにより生じる回折や散乱の強度パターンによって測定することができ、この様な粒度分布計としては、例えば、日機装社製のマイクロトラック9220FRAやマイクロトラックHRA等が例示される。   Here, the average particle size of the titanium oxide is obtained by measuring the particle size distribution of the titanium oxide particles after classification with a general particle size distribution meter, and calculating an integrated value 50 from the small particle size side calculated based on the measurement result. % Particle size (D50). Such a particle size distribution can be measured by a diffraction or scattering intensity pattern generated by applying light to the particles. Examples of such a particle size distribution meter include Microtrac 9220FRA and Microtrac HRA manufactured by Nikkiso Co., Ltd. Is exemplified.

なお、上述した好ましい平均粒径を満足する酸化チタンは、市販品を使用しても良く、例えば、テイカ社製のTITANIX(登録商標)JR−301(平均粒径0.30μm)、JR−603(平均粒径0.28μm)、JR−806(平均粒径0.25μm)、JRNC(平均粒径0.37μm)等が挙げられる。   In addition, the titanium oxide which satisfies the preferable average particle diameter mentioned above may use a commercial item, for example, TITANIX (registered trademark) JR-301 (average particle diameter 0.30 μm), JR-603 manufactured by Teika Corporation. (Average particle size 0.28 μm), JR-806 (average particle size 0.25 μm), JRNC (average particle size 0.37 μm) and the like.

なお、顔料の偏析を抑制するために、フィルム形成用組成物には顔料分散剤を添加してもよい。好適な顔料分散剤は、水溶性アクリル樹脂、水溶性スチレンアクリル樹脂およびノニオン系界面活性剤よりなる群から選択される1種以上である。これらを用いた場合、着色塗膜には顔料分散剤が残存することになる。   In order to suppress the segregation of the pigment, a pigment dispersant may be added to the film forming composition. A suitable pigment dispersant is at least one selected from the group consisting of a water-soluble acrylic resin, a water-soluble styrene acrylic resin, and a nonionic surfactant. When these are used, the pigment dispersant remains in the colored coating film.

[耐電圧]
耐電圧は後述の方法で測定されており、0.1kV以上が好ましい。より好ましくは0.3kV以上であり、さらに好ましくは1.0kV以上である。耐電圧が0.1kV未満であると、電極間のショートによる動作不良を招くおそれがある。
[Withstand voltage]
The withstand voltage is measured by the method described later, and is preferably 0.1 kV or more. More preferably, it is 0.3 kV or more, More preferably, it is 1.0 kV or more. If the withstand voltage is less than 0.1 kV, there is a risk of causing a malfunction due to a short circuit between the electrodes.

[製造方法]
金属板上に接着剤を塗布し、その後焼付けを行い、接着剤の上にフィルムを接着することによって、本発明に係る金属基板を作製することができる。
[Production method]
A metal substrate according to the present invention can be produced by applying an adhesive on a metal plate, then baking, and bonding a film on the adhesive.

金属板上への接着剤の塗布は、特に制限されず、既知の方法を適宜採用することができる。組成物の塗布方法としては、例えばバーコーター法、ロールコーター法、カーテンフローコーター法、スプレー法、スプレーリンガー法等を挙げることができ、これらの中でも、コスト等の観点からバーコーター法、ロールコーター法、スプレーリンガー法が好ましい。   Application | coating of the adhesive agent on a metal plate is not restrict | limited in particular, A well-known method can be employ | adopted suitably. Examples of the method for applying the composition include a bar coater method, a roll coater method, a curtain flow coater method, a spray method, a spray ringer method, and the like. Among these, a bar coater method, a roll coater from the viewpoint of cost and the like. The spray ringer method is preferable.

接着剤を塗布後、焼付けを行う。接着剤の焼付け温度としては、例えば、80℃以上200℃以下が好ましく、より好ましくは100℃以上180℃以下である。この焼付けにより、金属板上に接着剤が塗装された接着剤塗装金属板が作製される。なお、焼付け温度は、到達板温(Peak Metal Temperature:PMT)である。   After the adhesive is applied, baking is performed. As a baking temperature of an adhesive agent, 80 to 200 degreeC is preferable, for example, More preferably, it is 100 to 180 degreeC. By this baking, an adhesive-coated metal plate in which an adhesive is coated on the metal plate is produced. Note that the baking temperature is a peak metal temperature (PMT).

次に、接着剤塗装金属板の接着剤塗布面上にフィルムを接着する。接着剤塗装金属板へのフィルムの接着方法としては、特に制限されず、既知の方法を適宜採用することができるが、加圧接着法が好ましい。加圧接着法は、所定の時間、所定の温度にした状態で所定の圧力に加圧して接着を行う方法であるが、加圧接着法は、80℃以上200℃以下で行うことが好ましく、より好ましくは100℃以上180℃以下である。また、加圧接着法は5分以下で行うことが好ましく、より好ましくは3分以下である。加圧接着法は0.5kgf/cm2以上100kgf/cm2以下の圧力で行うことが好ましく、より好ましくは1kgf/cm2以上50kgf/cm2以下である。 Next, a film is adhere | attached on the adhesive agent coating surface of an adhesive coating metal plate. The method for adhering the film to the adhesive-coated metal plate is not particularly limited, and a known method can be appropriately employed, but the pressure bonding method is preferable. The pressure bonding method is a method in which the pressure is applied to a predetermined pressure at a predetermined temperature for a predetermined time, and the pressure bonding method is preferably performed at 80 ° C. or higher and 200 ° C. or lower, More preferably, it is 100 degreeC or more and 180 degrees C or less. Moreover, it is preferable to perform a pressure bonding method in 5 minutes or less, More preferably, it is 3 minutes or less. The pressure bonding method is preferably performed at a pressure of 0.5 kgf / cm 2 or more and 100 kgf / cm 2 or less, more preferably 1 kgf / cm 2 or more and 50 kgf / cm 2 or less.

[サブストレート型薄膜太陽電池]
本発明に係る金属基板を備えたサブストレート型薄膜太陽電池について説明する。サブストレート型太陽電池は、本発明に係る金属基板を備えたものであれば、公知のいずれの構造でもよく、例えば、基本的には本発明に係る金属基板のフィルム上に、裏面電極、光電変換層、透明電極がこの順で積層された構造である。光電変換層は、透明電極を通過して到達した光を吸収して電流が発生する層であり、裏面電極および透明電極は、いずれも光電変換層で発生した電流を取り出すためのものであり、いずれも導電性材料からなる。光入射側の透明電極は透光性を有する必要がある。裏面電極、光電変換層、透明電極については、公知のサブストレート型薄膜太陽電池と同様の材料を用いることができる。
[Substrate type thin film solar cell]
A substrate type thin film solar cell provided with a metal substrate according to the present invention will be described. The substrate type solar cell may have any known structure as long as it has the metal substrate according to the present invention. For example, the substrate type solar cell basically has a back electrode, photoelectric layer on the film of the metal substrate according to the present invention. The conversion layer and the transparent electrode are stacked in this order. The photoelectric conversion layer is a layer that generates current by absorbing light that has passed through the transparent electrode, and the back electrode and the transparent electrode are both for taking out the current generated in the photoelectric conversion layer, Both are made of a conductive material. The transparent electrode on the light incident side needs to have translucency. About a back surface electrode, a photoelectric converting layer, and a transparent electrode, the material similar to a well-known substrate type thin film solar cell can be used.

裏面電極は、特に制限されるものではなく、例えば、Mo、Cr、W等の金属、およびこれらの金属を組み合わせたものを用いることができる。裏面電極は、単層構造でもよいし、2層構造等の積層構造でもよい。裏面電極の厚さは、特に制限されるものではないが、厚さが0.1μm以上であることが好ましく、0.45〜1.0μmであることがより好ましい。   The back electrode is not particularly limited, and for example, a metal such as Mo, Cr, W, or a combination of these metals can be used. The back electrode may have a single layer structure or a laminated structure such as a two-layer structure. The thickness of the back electrode is not particularly limited, but the thickness is preferably 0.1 μm or more, and more preferably 0.45 to 1.0 μm.

光電変換層の構成は、特に制限されるものではなく、例えば、少なくとも1種のカルコパイライト構造の化合物半導体である。また、光電変換層は、Ib族元素とIIIb族元素とVIb族元素とからなる少なくとも1種の化合物半導体であってもよい。   The configuration of the photoelectric conversion layer is not particularly limited, and is, for example, at least one compound semiconductor having a chalcopyrite structure. The photoelectric conversion layer may be at least one compound semiconductor composed of a group Ib element, a group IIIb element, and a group VIb element.

さらに光吸収率が高く、高い光電変換効率が得られることから、光電変換層は、CuおよびAgからなる群より選択された少なくとも1種のIb族元素と、Al、GaおよびInからなる群より選択された少なくとも1種のIIIb族元素と、S、Se、およびTeからなる群から選択された少なくとも1種のVIb族元素とからなる少なくとも1種の化合物半導体であることが好ましい。この化合物半導体としては、CuAlS2、CuGaS2、CuInS2、CuAlSe2、CuGaSe2、CuInSe2(CIS)、AgAlS2、AgGaS2、AgInS2、AgAlSe2、AgGaSe2、AgInSe2、AgAlTe2、AgGaTe2、AgInTe2、Cu(In1-xGax)Se2(CIGS)、Cu(In1-xAlx)Se2、Cu(In1-xGax)(S、Se)2、Ag(In1-xGax)Se2、およびAg(In1-xGax)(S、Se)2等が挙げられる。 Furthermore, since the light absorption rate is high and high photoelectric conversion efficiency is obtained, the photoelectric conversion layer is composed of at least one type Ib element selected from the group consisting of Cu and Ag, and a group consisting of Al, Ga, and In. It is preferably at least one compound semiconductor composed of at least one selected group IIIb element and at least one group VIb element selected from the group consisting of S, Se, and Te. As the compound semiconductor, CuAlS 2, CuGaS 2, CuInS 2, CuAlSe 2, CuGaSe 2, CuInSe 2 (CIS), AgAlS 2, AgGaS 2, AgInS 2, AgAlSe 2, AgGaSe 2, AgInSe 2, AgAlTe 2, AgGaTe 2 , AgInTe 2 , Cu (In 1-x Ga x ) Se 2 (CIGS), Cu (In 1-x Al x ) Se 2 , Cu (In 1-x Ga x ) (S, Se) 2 , Ag (In 1 -x Ga x) Se 2, and Ag (In 1-x Ga x ) (S, Se) 2 , and the like.

透明電極は、例えば、Al、B、Ga、Sb等が添加されたZnO、ITO(インジウム−錫酸化物)、またはSnO2およびこれらを組み合わせたものにより構成される。透明電極は、単層構造でもよいし、2層構造等の積層構造でもよい。また、透明電極の厚さは、特に制限されるものではないが、0.3〜1μmが好ましい。 The transparent electrode is made of, for example, ZnO to which Al, B, Ga, Sb or the like is added, ITO (indium-tin oxide), SnO 2 or a combination thereof. The transparent electrode may have a single layer structure or a laminated structure such as a two-layer structure. The thickness of the transparent electrode is not particularly limited, but is preferably 0.3 to 1 μm.

サブストレート型薄膜太陽電池は公知の方法で作製することができ、例えば、以下の製造方法でサブストレート型薄膜太陽電池を作製することができる。まず、本発明に係る金属基板の上に、スパッタ法、真空蒸着法、熱CVD法、湿式塗工法等の従来から知られている方法により裏面電極を形成する。次いで、裏面電極の上にスパッタ法、真空蒸着法、熱CVD法、湿式塗工法等の従来から知られている方法により光電変換層を形成する。続いて、光電変換層の上にスパッタ法、真空蒸着法、熱CVD法、湿式塗工法等の従来から知られている方法により透明電極を形成する。   A substrate type thin film solar cell can be produced by a known method. For example, a substrate type thin film solar cell can be produced by the following production method. First, a back electrode is formed on a metal substrate according to the present invention by a conventionally known method such as sputtering, vacuum deposition, thermal CVD, or wet coating. Next, a photoelectric conversion layer is formed on the back electrode by a conventionally known method such as sputtering, vacuum deposition, thermal CVD, or wet coating. Subsequently, a transparent electrode is formed on the photoelectric conversion layer by a conventionally known method such as a sputtering method, a vacuum deposition method, a thermal CVD method, or a wet coating method.

なお、透明電極の形成時に光電変換層を保護するために、光電変換層と透明電極との間にバッファ層を設けてもよい。また、透明電極の上に封止材を設けてもよい。   In addition, in order to protect a photoelectric converting layer at the time of formation of a transparent electrode, you may provide a buffer layer between a photoelectric converting layer and a transparent electrode. Moreover, you may provide a sealing material on a transparent electrode.

[トップエミッション型有機EL素子]
本発明に係る金属基板は、トップエミッション型有機EL素子にも適用可能である。このようなトップエミッション型有機EL素子は、本発明に係る金属基板を備えたものであれば、公知のいずれの構造でもよく、例えば、基本的には本発明に係る金属基板のフィルム上に、電極、有機層、透明導電膜がこの順に積層されたものである。電極、有機層、透明導電膜については、公知のトップエミッション型薄膜太陽電池と同様の材料を用いることができる。トップエミッション型有機EL素子では、光は透明導電性膜を透過して(基板を透過することなく)取り出されるため、基板として透明でない金属板を用いることができる。
[Top emission type organic EL element]
The metal substrate according to the present invention is also applicable to a top emission type organic EL element. Such a top emission type organic EL element may have any known structure as long as it includes the metal substrate according to the present invention. For example, basically, on the film of the metal substrate according to the present invention, An electrode, an organic layer, and a transparent conductive film are laminated in this order. About an electrode, an organic layer, and a transparent conductive film, the material similar to a well-known top emission type thin film solar cell can be used. In the top emission type organic EL element, since light is extracted through the transparent conductive film (without passing through the substrate), a non-transparent metal plate can be used as the substrate.

電極は、例えば、インジウム−錫酸化物(ITO)、インジウム−亜鉛酸化物(IZO)、錫酸化物、Au等の金属の極薄膜、導電性高分子、導電性の有機材料、ドーパント(ドナー又はアクセプタ)含有有機層、導電体と導電性有機材料(高分子含む)の混合物、又はこれらの積層体等が材料として用いられる。電極は、これら材料をスパッタ法やイオンプレーティング法等の気相成長法を用いて成膜することができる。   The electrode may be, for example, an indium-tin oxide (ITO), indium-zinc oxide (IZO), tin oxide, an ultrathin metal such as Au, a conductive polymer, a conductive organic material, a dopant (donor or An acceptor) -containing organic layer, a mixture of a conductor and a conductive organic material (including a polymer), or a laminate of these is used as the material. The electrodes can be formed using these materials by vapor phase growth methods such as sputtering and ion plating.

有機層の有機発光層は、例えば、アントラセン、ナフタレン、ピレン、テトラセン、コロネン、ペリレン、フタロペリレン、ナフタロペリレン、ジフェニルブタジエン、テトラフェニルブタジエン、クマリン、オキサジアゾール、ビスベンゾキサゾリン、ビススチリル、シクロペンタジエン、キノリン金属錯体、トリス(8−ヒドロキシキノリナート)アルミニウム錯体、トリス(4−メチル−8−キノリナート)アルミニウム錯体、トリス(5−フェニル−8−キノリナート)アルミニウム錯体、アミノキノリン金属錯体、ベンゾキノリン金属錯体、トリ−(p−ターフェニル−4−イル)アミン、ピラン、キナクリドン、ルブレン、及びこれらの誘導体、あるいは、1−アリール−2,5−ジ(2−チエニル)ピロール誘導体、ジスチリルベンゼン誘導体、スチリルアリーレン誘導体、スチリルアミン誘導体、及びこれらの発光性化合物からなる基を分子の一部分に有する化合物あるいは高分子等が材料として用いられる。さらに、上記化合物に代表される蛍光色素由来の化合物のみならず、いわゆる燐光発光材料、例えば、Ir錯体、Os錯体、Pt錯体、ユーロピウム錯体等の発光材料、若しくはそれらを分子内に有する化合物又は高分子も用いられる。有機層は、スパッタ法、真空蒸着法等の従来から知られている方法により形成することができる。なお、有機層は、有機発光層の他にも正孔注入層、正孔輸送層、電子輸送層、電子注入層等を含んでいてもよい。   The organic light-emitting layer is, for example, anthracene, naphthalene, pyrene, tetracene, coronene, perylene, phthaloperylene, naphthaloperylene, diphenylbutadiene, tetraphenylbutadiene, coumarin, oxadiazole, bisbenzoxazoline, bisstyryl, cyclopentadiene, quinoline Metal complex, tris (8-hydroxyquinolinato) aluminum complex, tris (4-methyl-8-quinolinato) aluminum complex, tris (5-phenyl-8-quinolinato) aluminum complex, aminoquinoline metal complex, benzoquinoline metal complex , Tri- (p-terphenyl-4-yl) amine, pyran, quinacridone, rubrene, and derivatives thereof, or 1-aryl-2,5-di (2-thienyl) pyrrole derivative, distili Benzene derivatives, styryl arylene derivatives, styrylamine derivatives, and compounds or polymers such having a group consisting of luminescent compounds in a part of the molecule is used as a material. In addition to compounds derived from fluorescent dyes typified by the above compounds, so-called phosphorescent materials, for example, luminescent materials such as Ir complexes, Os complexes, Pt complexes, and europium complexes, or compounds having these in the molecule or Molecules are also used. The organic layer can be formed by a conventionally known method such as sputtering or vacuum deposition. The organic layer may include a hole injection layer, a hole transport layer, an electron transport layer, an electron injection layer, and the like in addition to the organic light emitting layer.

透明導電膜は、Alや銀等の単体、又はAlや銀等と他の電極材料を組み合わせて積層構造に構成されたものが材料として用いられる。電極材料の組み合わせは、アルカリ金属とAlの積層体、アルカリ金属と銀の積層体、アルカリ金属のハロゲン化物とAlの積層体、アルカリ金属の酸化物とAlの積層体、アルカリ土類金属や希土類金属とAlの積層体、これらの金属種と他の金属の合金等が挙げられる。具体的には、例えば、ナトリウム、ナトリウム−カリウム合金、リチウム、マグネシウム等とAlの積層体、マグネシウム−銀混合物、マグネシウム−インジウム混合物、アルミニウム−リチウム合金、LiFとAlの混合物、AlとAl23の混合物等が挙げられる。透明導電膜は、スパッタ法、真空蒸着法等の従来から知られている方法により形成することができる。 As the transparent conductive film, a material composed of a single layer of Al, silver, or the like, or a layered structure obtained by combining Al, silver, or the like with another electrode material is used. Combinations of electrode materials include alkali metal and Al laminates, alkali metal and silver laminates, alkali metal halides and Al laminates, alkali metal oxides and Al laminates, alkaline earth metals and rare earths. A laminated body of metal and Al, alloys of these metal species and other metals, and the like can be given. Specifically, for example, sodium, sodium-potassium alloy, lithium, magnesium, etc. and Al laminate, magnesium-silver mixture, magnesium-indium mixture, aluminum-lithium alloy, mixture of LiF and Al, Al and Al 2 O And the like. The transparent conductive film can be formed by a conventionally known method such as sputtering or vacuum deposition.

以下に実施例を挙げて本発明をより具体的に説明するが、本発明は、下記実施例によって限定されるものではなく、前・後記の趣旨に適合しうる範囲で適宜変更して実施することも可能であり、それらはいずれも本発明の技術的範囲に包含される。また、実施例で用いた評価方法は、以下の通りである。   The present invention will be described more specifically with reference to the following examples. However, the present invention is not limited to the following examples, and may be appropriately modified and implemented within a range that can meet the purpose described above and below. All of which are within the scope of the present invention. Moreover, the evaluation method used in the Example is as follows.

<耐電圧(絶縁耐性)>
後述の作製方法で寸法50mm×50mm×0.8mmの供試材を作製した後、JIS規格C2110−1に準拠して、供試材の一方の面に外径20mmの球形電極を荷重500gfで接触させた状態で、絶縁破壊試験装置を用いて、20〜40秒程度で絶縁破壊が起こるような一定速度で厚み方向に直流電圧を印加し、絶縁破壊を生じたときの電圧を測定した。上記電圧測定を5回行い、その平均値を耐電圧とした。
<Withstand voltage (insulation resistance)>
After preparing a test material having dimensions of 50 mm × 50 mm × 0.8 mm by the manufacturing method described later, a spherical electrode having an outer diameter of 20 mm is applied to one surface of the test material with a load of 500 gf in accordance with JIS standard C2110-1. In the contacted state, using a dielectric breakdown test apparatus, a DC voltage was applied in the thickness direction at a constant speed such that dielectric breakdown occurred in about 20 to 40 seconds, and the voltage when dielectric breakdown occurred was measured. The voltage measurement was performed 5 times, and the average value was taken as the withstand voltage.

<平均表面粗さRa>
後述の作製方法で得られた供試材について、原子間力顕微鏡(Atomic Force Microscope、AFM)(セイコー電子工業製SPI3800N)を用いて、供試材のフィルムが積層された側の表面について10μm×10μmのエリアの任意の3箇所の表面粗さを測定し、その平均値を平均表面粗さRaとした。
<Average surface roughness Ra>
About the test material obtained by the production method described later, using an atomic force microscope (AFM) (SPI3800N manufactured by Seiko Denshi Kogyo), the surface on the side on which the film of the test material is laminated is 10 μm × The surface roughness at any three locations in the 10 μm area was measured, and the average value was defined as the average surface roughness Ra.

(接着剤塗装金属板1の作製方法)
電気亜鉛めっき鋼板(板厚0.8mm)を金属板として、金属板の表面に、オレフィン樹脂を主成分とする熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PPET(登録商標)1505SG28)70質量%とメチルエチルケトン30質量%とを混合した分散液を安田精機製作所社製バーコーター番手60を用いて塗布し、到達板温(Peak Metal Temperature:PMT)が100℃となるように2分間焼付け・乾燥させ、接着剤の膜厚が5.7μmである接着剤塗装金属板1を得た。接着剤塗装金属板1の作製条件・物性等を表1に示す。
(Production method of adhesive-coated metal plate 1)
An electrogalvanized steel sheet (plate thickness 0.8 mm) as a metal plate, a thermoplastic adhesive mainly composed of an olefin resin on the surface of the metal plate (Aronmelt (registered trademark) PPET (registered trademark) 1505SG28 manufactured by Toa Gosei Co., Ltd.) A dispersion obtained by mixing 70% by mass and 30% by mass of methyl ethyl ketone was applied using a bar coater count 60 manufactured by Yasuda Seiki Seisakusho Co., Ltd. and baked for 2 minutes so that the ultimate plate temperature (PMT) was 100 ° C. -It dried and the adhesive coating metal plate 1 whose film thickness of an adhesive agent is 5.7 micrometers was obtained. The production conditions and physical properties of the adhesive-coated metal plate 1 are shown in Table 1.

(接着剤塗装金属板2の作製方法)
電気亜鉛めっき鋼板(板厚0.8mm)を金属板として、金属板の表面に、ポリエステル樹脂を主成分とする熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PES(登録商標)360HVXM30)90質量%とメチルエチルケトン10質量%とを混合した分散液を安田精機製作所社製バーコーター番手60を用いて塗布し、到達板温(Peak Metal Temperature:PMT)が100℃となるように2分間焼付け・乾燥させ、接着剤の膜厚が12.4μmである接着剤塗装金属板2を得た。接着剤塗装金属板2の作製条件・物性等を表1に示す。
(Method for producing adhesive-coated metal plate 2)
An electrogalvanized steel sheet (thickness 0.8 mm) as a metal plate, a thermoplastic adhesive mainly composed of a polyester resin on the surface of the metal plate (Aronmelt (registered trademark) PES (registered trademark) 360HVXM30 manufactured by Toa Gosei Co., Ltd.) A dispersion obtained by mixing 90% by mass and 10% by mass of methyl ethyl ketone was applied using a bar coater count 60 manufactured by Yasuda Seiki Seisakusho Co., Ltd., and baked for 2 minutes so that the ultimate plate temperature (PMT) was 100 ° C. -It dried and the adhesive coating metal plate 2 whose film thickness of an adhesive agent is 12.4 micrometers was obtained. The production conditions and physical properties of the adhesive-coated metal plate 2 are shown in Table 1.

(接着剤塗装金属板3の作製方法)
接着剤塗装金属板2において、分散液を熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PES(登録商標)360HVXM30)50質量%とメチルエチルケトン50質量%とを混合した分散液とした点以外は、接着剤塗装金属板2と同様にして接着剤の膜厚が7.0μmである接着剤塗装金属板3を得た。接着剤塗装金属板3の作製条件・物性等を表1に示す。
(Method for producing adhesive-coated metal plate 3)
In the adhesive-coated metal plate 2, except that the dispersion was a dispersion obtained by mixing 50% by mass of thermoplastic adhesive (Aronmelt (registered trademark) PES (registered trademark) 360HVXM30 manufactured by Toa Gosei Co., Ltd.) and 50% by mass of methyl ethyl ketone. Obtained an adhesive-coated metal plate 3 having an adhesive film thickness of 7.0 μm in the same manner as the adhesive-coated metal plate 2. The production conditions and physical properties of the adhesive-coated metal plate 3 are shown in Table 1.

(接着剤塗装金属板4の作製方法)
接着剤塗装金属板2において、分散液を熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PES(登録商標)360HVXM30)70質量%とメチルエチルケトン30質量%とを混合した分散液とし、バーコーター番手30を用いた点以外は、接着剤塗装金属板2と同様にして接着剤の膜厚が4.9μmである接着剤塗装金属板4を得た。接着剤塗装金属板4の作製条件・物性等を表1に示す。
(Method for producing adhesive-coated metal plate 4)
In the adhesive-coated metal plate 2, the dispersion is a dispersion in which 70% by mass of a thermoplastic adhesive (Aronmelt (registered trademark) PES (registered trademark) 360HVXM30 manufactured by Toa Gosei Co., Ltd.) and 30% by mass of methyl ethyl ketone are mixed. Except for using the count 30, the adhesive-coated metal plate 4 having an adhesive film thickness of 4.9 μm was obtained in the same manner as the adhesive-coated metal plate 2. The production conditions and physical properties of the adhesive-coated metal plate 4 are shown in Table 1.

(接着剤塗装金属板5の作製方法)
接着剤塗装金属板2において、分散液を熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PES(登録商標)360HVXM30)70質量%とメチルエチルケトン30質量%とを混合した分散液とし、バーコーター番手20を用いた点以外は、接着剤塗装金属板2と同様にして接着剤の膜厚が3.2μmである接着剤塗装金属板5を得た。接着剤塗装金属板5の作製条件・物性等を表1に示す。
(Method for producing adhesive-coated metal plate 5)
In the adhesive-coated metal plate 2, the dispersion is a dispersion in which 70% by mass of a thermoplastic adhesive (Aronmelt (registered trademark) PES (registered trademark) 360HVXM30 manufactured by Toa Gosei Co., Ltd.) and 30% by mass of methyl ethyl ketone are mixed. An adhesive coated metal plate 5 having an adhesive film thickness of 3.2 μm was obtained in the same manner as the adhesive coated metal plate 2 except that the count 20 was used. The production conditions and physical properties of the adhesive-coated metal plate 5 are shown in Table 1.

(接着剤塗装金属板6の作製方法)
接着剤塗装金属板2において、分散液を熱可塑性接着剤(東亜合成社製アロンメルト(登録商標)PES(登録商標)360HVXM30)70質量%とメチルエチルケトン30質量%とを混合した分散液とし、バーコーター番手10を用いた点以外は、接着剤塗装金属板2と同様にして接着剤の膜厚が1.6μmである接着剤塗装金属板6を得た。接着剤塗装金属板6の作製条件・物性等を表1に示す。
(Method for producing adhesive-coated metal plate 6)
In the adhesive-coated metal plate 2, the dispersion is a dispersion in which 70% by mass of a thermoplastic adhesive (Aronmelt (registered trademark) PES (registered trademark) 360HVXM30 manufactured by Toa Gosei Co., Ltd.) and 30% by mass of methyl ethyl ketone are mixed. An adhesive coated metal plate 6 having an adhesive film thickness of 1.6 μm was obtained in the same manner as the adhesive coated metal plate 2 except that the count 10 was used. The production conditions and physical properties of the adhesive-coated metal plate 6 are shown in Table 1.

Figure 2015195315
Figure 2015195315

(実施例1)
接着剤塗装金属板1の接着剤塗布面上に25μmのPETフィルム1(ユニチカ社製エンブレット(登録商標)P652:表面粗さRa20nm)を載せ、温度180℃、圧力10kgf/cm2の条件下、1分間加圧接着することにより、接着剤塗装金属板1とPETフィルムとを接着させて金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Example 1)
A 25 μm PET film 1 (Embret (registered trademark) P652: surface roughness Ra 20 nm, manufactured by Unitika Co., Ltd.) is placed on the adhesive-coated surface of the adhesive-coated metal plate 1, and the temperature is 180 ° C. and the pressure is 10 kgf / cm 2 . By pressure-bonding for 1 minute, the adhesive-coated metal plate 1 and the PET film were bonded to obtain a metal substrate. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例2)
実施例1において、接着剤塗装金属板1の代わりに接着剤塗装金属板2を用いたこと以外は、実施例1と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Example 2)
In Example 1, the metal substrate was obtained like Example 1 except having used the adhesive coating metal plate 2 instead of the adhesive coating metal plate 1. FIG. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例3)
接着剤塗装金属板1の接着剤塗布面上に100μmのPENフィルム(帝人デュポンフィルム社製テオネックス(登録商標)Q65FA:表面粗さRa1.2nm)を載せ、温度180℃、圧力50kgf/cm2の条件下、1分間加圧接着することにより、接着剤塗装金属板1とPETフィルムとを接着させて金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Example 3)
A 100 μm PEN film (Teonex (registered trademark) Q65FA manufactured by Teijin DuPont Films Co., Ltd .: surface roughness Ra 1.2 nm) is placed on the adhesive-coated surface of the adhesive-coated metal plate 1 at a temperature of 180 ° C. and a pressure of 50 kgf / cm 2 . Under the condition, pressure-bonding was performed for 1 minute to bond the adhesive-coated metal plate 1 and the PET film to obtain a metal substrate. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例4)
実施例3において、接着剤塗装金属板1の代わりに接着剤塗装金属板2を用いたこと以外は、実施例3と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
Example 4
In Example 3, a metal substrate was obtained in the same manner as in Example 3 except that the adhesive-coated metal plate 2 was used instead of the adhesive-coated metal plate 1. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例5)
接着剤塗装金属板3の接着剤塗布面上に100μmのPENフィルム(Q65FA)を載せ、温度100℃、圧力1kgf/cm2の条件下、1分間加圧接着することにより、接着剤塗装金属板3とPETフィルムとを接着させて金属基板を得た。得られた金属基板の物性、評価結果を表2に示す。
(Example 5)
An adhesive-coated metal plate is mounted by placing a 100 μm PEN film (Q65FA) on the adhesive-coated metal plate 3 on the adhesive-coated surface and pressurizing and bonding for 1 minute at a temperature of 100 ° C. and a pressure of 1 kgf / cm 2. 3 and a PET film were adhered to obtain a metal substrate. Table 2 shows the physical properties and evaluation results of the obtained metal substrate.

(実施例6・7)
実施例5において、加圧接着時の温度を120℃、140℃とした点以外は、実施例5と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Examples 6 and 7)
In Example 5, a metal substrate was obtained in the same manner as in Example 5 except that the temperature during pressure bonding was 120 ° C. and 140 ° C. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例8〜16)
表2に記載のとおり、実施例5において、接着剤塗装金属板、加圧接着時の温度の少なくとも一方を変更した以外は、実施例5と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Examples 8 to 16)
As shown in Table 2, a metal substrate was obtained in the same manner as in Example 5 except that in Example 5, at least one of the adhesive-coated metal plate and the temperature during pressure bonding was changed. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(実施例17〜19)
実施例4において、加圧接着時の温度を100℃、120℃、140℃とし、加圧接着時の圧力を1kgf/cm2とした点以外は、実施例4と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Examples 17 to 19)
In Example 4, a metal substrate was obtained in the same manner as in Example 4 except that the temperature during pressure bonding was 100 ° C., 120 ° C., and 140 ° C., and the pressure during pressure bonding was 1 kgf / cm 2. It was. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(比較例1)
実施例1において、25μmのPETフィルム1に代えて50μmのPETフィルム2(ユニチカ社製E5101:表面粗さRa50nm)を用いた点以外は、実施例1と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Comparative Example 1)
In Example 1, a metal substrate was obtained in the same manner as in Example 1 except that 50 μm PET film 2 (E5101: Surface roughness Ra 50 nm manufactured by Unitika Co., Ltd.) was used instead of 25 μm PET film 1. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

(比較例2)
実施例2において、25μmのPETフィルム1に代えて50μmのPETフィルム2(E5101)を用いた点以外は、実施例2と同様にして金属基板を得た。金属基板の作製条件、得られた金属基板の物性、評価結果を表2に示す。
(Comparative Example 2)
In Example 2, a metal substrate was obtained in the same manner as in Example 2 except that instead of the 25 μm PET film 1, a 50 μm PET film 2 (E5101) was used. Table 2 shows conditions for producing the metal substrate, physical properties of the obtained metal substrate, and evaluation results.

Figure 2015195315
Figure 2015195315

金属板に所定の皮膜を積層することによって、皮膜の表面を平滑にすると共に、皮膜が絶縁性を有する金属基板となり、サブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いることが可能となる。   By laminating a predetermined film on a metal plate, the surface of the film is smoothed and the film becomes an insulating metal substrate, which can be used for a substrate type thin film solar cell or a top emission type organic EL element. Become.

Claims (3)

金属板の表面に、接着剤を介して1層の熱可塑性樹脂フィルムが積層されており、
上記フィルムは、固体顔料の体積分率が20%以下である組成物から得られたものであり、膜厚が12μm以上250μm以下、積層後の上記フィルム表面の表面粗さRaが30nm以下である
ことを特徴とするサブストレート型薄膜太陽電池又はトップエミッション型有機EL素子に用いられる金属基板。
One layer of a thermoplastic resin film is laminated on the surface of the metal plate via an adhesive,
The film is obtained from a composition having a solid pigment volume fraction of 20% or less, the film thickness is 12 μm or more and 250 μm or less, and the surface roughness Ra of the film surface after lamination is 30 nm or less. A metal substrate used for a substrate type thin film solar cell or a top emission type organic EL element.
上記熱可塑性樹脂は、ポリエステル樹脂である請求項1に記載の金属基板。   The metal substrate according to claim 1, wherein the thermoplastic resin is a polyester resin. 上記積層後のフィルムの表面粗さRaは10nm以下である請求項1又は2に記載の金属基板。   The metal substrate according to claim 1 or 2, wherein a surface roughness Ra of the laminated film is 10 nm or less.
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5946578B1 (en) * 2015-12-09 2016-07-06 尾池工業株式会社 Method for producing surface smooth laminate
JP2018172551A (en) * 2017-03-31 2018-11-08 富士フイルム株式会社 Method of producing thermoplastic resin film, method of producing electrically conductive film, thermoplastic resin film, and electrically conductive film
WO2020137783A1 (en) 2018-12-28 2020-07-02 Jfeスチール株式会社 Film laminate metal sheet, substrate for flexible devices, and substrate for organic el devices
WO2022202771A1 (en) 2021-03-23 2022-09-29 Jfeスチール株式会社 Film-laminated metal sheet, method for manufacturing same, substrate for flexible electronics, and organic el substrate
JP2023503151A (en) * 2019-11-29 2023-01-26 宝山鋼鉄股▲分▼有限公司 Thermoformed parts with excellent paint film adhesion and method for producing same
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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2812800T3 (en) 2014-07-02 2021-03-18 Inflectis Bioscience New therapeutic uses of benzylidenguanidine derivatives for the treatment of proteopathies

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002025763A (en) * 2000-07-11 2002-01-25 Nisshin Steel Co Ltd Insulating board for organic el element
JP2003282258A (en) * 2002-03-25 2003-10-03 Fuji Photo Film Co Ltd Light emitting element
JP2011108883A (en) * 2009-11-18 2011-06-02 Mitsubishi Chemicals Corp Solar cell
JP2011222779A (en) * 2010-04-09 2011-11-04 Dainippon Printing Co Ltd Method of manufacturing substrate for thin film element, method of manufacturing thin film element, method for thin film transistor
WO2012048888A1 (en) * 2010-10-14 2012-04-19 Tata Steel Nederland Technology B.V. Preparation of a polyetherimide intermediate and its application on metal substrates
JP2013084461A (en) * 2011-10-11 2013-05-09 Nisshin Steel Co Ltd Substrate for organic el element, method for manufacturing the same, and organic el element
JP2013520001A (en) * 2010-02-10 2013-05-30 タタ、スティール、ネダーランド、テクノロジー、ベスローテン、フェンノートシャップ Lamination system for producing solar cells on a metal substrate, and method for producing the lamination system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1110724A (en) 1997-06-25 1999-01-19 Toray Ind Inc Polyester film for laminating metal plate
CN101805578B (en) * 2010-03-19 2012-07-25 苏州赛伍应用技术有限公司 Back protection film of solar cell
JP2012146413A (en) 2011-01-07 2012-08-02 Teijin Dupont Films Japan Ltd Polyester film for organic electroluminescent illumination substrate
KR101821872B1 (en) * 2013-03-28 2018-01-24 가부시키가이샤 고베 세이코쇼 Metal board, and substrate-type thin-film solar cell and top-emission-type organic el element using same
CN103522658B (en) * 2013-09-18 2017-02-15 东莞市安派电子有限公司 Backboard for metal perforation type solar battery and preparation method of backboard

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002025763A (en) * 2000-07-11 2002-01-25 Nisshin Steel Co Ltd Insulating board for organic el element
JP2003282258A (en) * 2002-03-25 2003-10-03 Fuji Photo Film Co Ltd Light emitting element
JP2011108883A (en) * 2009-11-18 2011-06-02 Mitsubishi Chemicals Corp Solar cell
JP2013520001A (en) * 2010-02-10 2013-05-30 タタ、スティール、ネダーランド、テクノロジー、ベスローテン、フェンノートシャップ Lamination system for producing solar cells on a metal substrate, and method for producing the lamination system
JP2011222779A (en) * 2010-04-09 2011-11-04 Dainippon Printing Co Ltd Method of manufacturing substrate for thin film element, method of manufacturing thin film element, method for thin film transistor
WO2012048888A1 (en) * 2010-10-14 2012-04-19 Tata Steel Nederland Technology B.V. Preparation of a polyetherimide intermediate and its application on metal substrates
JP2013084461A (en) * 2011-10-11 2013-05-09 Nisshin Steel Co Ltd Substrate for organic el element, method for manufacturing the same, and organic el element

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5946578B1 (en) * 2015-12-09 2016-07-06 尾池工業株式会社 Method for producing surface smooth laminate
JP2018172551A (en) * 2017-03-31 2018-11-08 富士フイルム株式会社 Method of producing thermoplastic resin film, method of producing electrically conductive film, thermoplastic resin film, and electrically conductive film
WO2020137783A1 (en) 2018-12-28 2020-07-02 Jfeスチール株式会社 Film laminate metal sheet, substrate for flexible devices, and substrate for organic el devices
KR20210107801A (en) 2018-12-28 2021-09-01 제이에프이 스틸 가부시키가이샤 Film laminated metal plate, substrate for flexible device, and substrate for organic EL device
JP2023503151A (en) * 2019-11-29 2023-01-26 宝山鋼鉄股▲分▼有限公司 Thermoformed parts with excellent paint film adhesion and method for producing same
JP7326612B2 (en) 2019-11-29 2023-08-15 宝山鋼鉄股▲分▼有限公司 Thermoformed parts with excellent paint film adhesion and method for producing same
WO2022202771A1 (en) 2021-03-23 2022-09-29 Jfeスチール株式会社 Film-laminated metal sheet, method for manufacturing same, substrate for flexible electronics, and organic el substrate
JP7435802B2 (en) 2021-03-23 2024-02-21 Jfeスチール株式会社 Film laminated metal plate and its manufacturing method, flexible electronics substrate and organic EL substrate
WO2024075738A1 (en) * 2022-10-03 2024-04-11 東洋紡株式会社 Long laminate, photovoltaic device, and method for producing photovoltaic device

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