JP2012228460A5 - - Google Patents

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Publication number
JP2012228460A5
JP2012228460A5 JP2011099890A JP2011099890A JP2012228460A5 JP 2012228460 A5 JP2012228460 A5 JP 2012228460A5 JP 2011099890 A JP2011099890 A JP 2011099890A JP 2011099890 A JP2011099890 A JP 2011099890A JP 2012228460 A5 JP2012228460 A5 JP 2012228460A5
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JP
Japan
Prior art keywords
measurement method
pattern
projection image
light
test object
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JP2011099890A
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Japanese (ja)
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JP6032870B2 (en
JP2012228460A (en
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Publication date
Priority claimed from JP2011099890A external-priority patent/JP6032870B2/en
Priority to JP2011099890A priority Critical patent/JP6032870B2/en
Application filed filed Critical
Priority to PCT/JP2012/060832 priority patent/WO2012147679A1/en
Priority to EP12777405.7A priority patent/EP2689708B1/en
Publication of JP2012228460A publication Critical patent/JP2012228460A/en
Priority to US14/061,530 priority patent/US20140052005A1/en
Publication of JP2012228460A5 publication Critical patent/JP2012228460A5/ja
Publication of JP6032870B2 publication Critical patent/JP6032870B2/en
Application granted granted Critical
Priority to US15/423,043 priority patent/US10342459B2/en
Priority to US16/427,001 priority patent/US10898110B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

上記課題を解決するために、この発明は以下の手段を提案している。
本発明の一実施態様にかかる内視鏡装置は、光の明暗パターンが投影された被検物のパターン投影画像を用いて前記被検物の計測を行う内視鏡装置であって、挿入部と、前記挿入部の先端部に設けられ、前記被検物の画像を取得する撮像部と、前記撮像部の観察視野を照明する照明光を発する照明部と、前記被検物に前記明暗パターンを投影するパターン投影部と、を備え、前記挿入部の先端面には、前記撮像部に前記被検物の像を結像させる対物光学系と、前記照明光を出射する1つ以上の照明窓と、前記パターン投影部から前記被検物へ前記明暗パターンを投影する1つの投影窓と、が設けられ、前記パターン投影部は、前記明暗パターンを生成するパターン生成部を備え、前記明暗パターンは、明部と暗部とが繰り返し交互に配置された分布パターンであることを特徴とする。
In order to solve the above problems, the present invention proposes the following means.
An endoscope apparatus according to an embodiment of the present invention is an endoscope apparatus that performs measurement of the test object using a pattern projection image of the test object on which a bright and dark pattern of light is projected, and includes an insertion unit An imaging unit that is provided at a distal end of the insertion unit and acquires an image of the test object, an illumination unit that emits illumination light that illuminates an observation field of view of the imaging unit, and the light-dark pattern on the test object An objective optical system that forms an image of the test object on the imaging unit, and at least one illumination that emits the illumination light A window and one projection window for projecting the light / dark pattern from the pattern projection unit onto the test object, the pattern projection unit including a pattern generation unit that generates the light / dark pattern, and the light / dark pattern The light and dark areas are arranged alternately and repeatedly. Characterized in that it is a distribution pattern.

Claims (4)

光の明暗パターンが投影された被検物のパターン投影画像を用いて前記被検物の計測を行う計測方法であって、
所定の前記明暗パターンを前記内視鏡装置の1箇所から前記被検物に投影し、
前記被検物において前記明暗パターンが投影された部分を撮像して1枚のパターン投影画像を取得し、
空間的位相シフト法またはフーリエ変換法を用いて前記明暗パターンが投影された部分の三次元形状を前記1枚のパターン投影画像から計測する
ことを特徴とする計測方法。
A measurement method for measuring the test object using a pattern projection image of the test object on which a light-dark pattern is projected,
Projecting the predetermined light-dark pattern from one place of the endoscope apparatus onto the test object,
Capture a portion of the test object on which the light and dark pattern is projected to obtain a single pattern projection image,
A measurement method comprising: measuring a three-dimensional shape of a portion onto which the bright and dark pattern is projected from the one pattern projection image using a spatial phase shift method or a Fourier transform method.
請求項1に記載の計測方法であって、
前記1枚のパターン投影画像を取得する前と後との少なくともいずれかに、前記明暗パターンが投影される部分の明視野画像を少なくとも1枚取得し、
前記1枚のパターン投影画像および前記明視野画像から少なくとも2枚の画像を選択し、
前記2枚の画像において所定量以上の位置ずれがある場合に前記内視鏡装置の位置がずれたことを検出する
ことを特徴とする計測方法。
The measurement method according to claim 1,
Acquiring at least one bright-field image of a portion onto which the light-dark pattern is projected at least one of before and after acquiring the one pattern projection image;
Selecting at least two images from the one pattern projection image and the bright field image;
A measurement method, comprising: detecting that the position of the endoscope apparatus has shifted when there is a position shift of a predetermined amount or more in the two images.
請求項2に記載の計測方法であって
前記1枚のパターン投影画像を取得する前および後に前記明視野画像を少なくとも1枚ずつ取得することを特徴とする計測方法。
The measurement method according to claim 2, wherein at least one bright field image is acquired before and after the one pattern projection image is acquired.
請求項3に記載の計測方法であって、
前記内視鏡装置の位置がずれたことを検出するために選択される少なくとも2枚の画像は、前記明視野画像から選択されることを特徴とする計測方法。
The measurement method according to claim 3,
The measurement method, wherein at least two images selected for detecting that the position of the endoscope apparatus is shifted are selected from the bright field images.
JP2011099890A 2011-04-27 2011-04-27 Measuring method Expired - Fee Related JP6032870B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2011099890A JP6032870B2 (en) 2011-04-27 2011-04-27 Measuring method
PCT/JP2012/060832 WO2012147679A1 (en) 2011-04-27 2012-04-23 Endoscopic device and measurement method
EP12777405.7A EP2689708B1 (en) 2011-04-27 2012-04-23 Endoscopic apparatus and measurement method
US14/061,530 US20140052005A1 (en) 2011-04-27 2013-10-23 Endoscope apparatus and measuring method
US15/423,043 US10342459B2 (en) 2011-04-27 2017-02-02 Endoscope apparatus and measuring method
US16/427,001 US10898110B2 (en) 2011-04-27 2019-05-30 Endoscope apparatus and measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011099890A JP6032870B2 (en) 2011-04-27 2011-04-27 Measuring method

Publications (3)

Publication Number Publication Date
JP2012228460A JP2012228460A (en) 2012-11-22
JP2012228460A5 true JP2012228460A5 (en) 2014-06-05
JP6032870B2 JP6032870B2 (en) 2016-11-30

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JP2011099890A Expired - Fee Related JP6032870B2 (en) 2011-04-27 2011-04-27 Measuring method

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JP (1) JP6032870B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220035957A (en) 2019-09-06 2022-03-22 닛폰 호소 교카이 Organic thin film and manufacturing method of organic thin film, organic electroluminescent device, display device, lighting device, organic thin film solar cell, thin film transistor, photoelectric conversion device, coating composition, material for organic electroluminescence device
WO2021045178A1 (en) 2019-09-06 2021-03-11 日本放送協会 Organic thin film and method for producing organic thin film, organic electroluminescent element, display device, lighting device, organic thin film solar cell, photoelectric conversion element, thin film transistor, coating composition and material for organic electroluminescent elements
KR20230108306A (en) 2020-12-18 2023-07-18 가부시키가이샤 닛폰 쇼쿠바이 Organic electroluminescent device, display device, lighting device, manufacturing method of organic electroluminescent device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3816624B2 (en) * 1997-02-28 2006-08-30 オリンパス株式会社 3D measuring device

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