JP2012108476A5 - - Google Patents

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JP2012108476A5
JP2012108476A5 JP2011190375A JP2011190375A JP2012108476A5 JP 2012108476 A5 JP2012108476 A5 JP 2012108476A5 JP 2011190375 A JP2011190375 A JP 2011190375A JP 2011190375 A JP2011190375 A JP 2011190375A JP 2012108476 A5 JP2012108476 A5 JP 2012108476A5
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imaging
test object
moving
image
microscope
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JP2011190375A
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JP6071177B2 (en
JP2012108476A (en
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Priority claimed from JP2011190375A external-priority patent/JP6071177B2/en
Priority to JP2011190375A priority Critical patent/JP6071177B2/en
Priority to RU2013124820/28A priority patent/RU2540453C2/en
Priority to BR112013009408A priority patent/BR112013009408A2/en
Priority to EP11779865.2A priority patent/EP2633358A1/en
Priority to CN201180051439.1A priority patent/CN103180769B/en
Priority to PCT/JP2011/073774 priority patent/WO2012056920A1/en
Priority to US13/823,062 priority patent/US20130169788A1/en
Priority to KR1020137012934A priority patent/KR20130083453A/en
Publication of JP2012108476A publication Critical patent/JP2012108476A/en
Publication of JP2012108476A5 publication Critical patent/JP2012108476A5/ja
Publication of JP6071177B2 publication Critical patent/JP6071177B2/en
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Description

本発明の一側面としての顕微鏡は、被検物を結像する結像光学系と、前記結像光学系を介して前記被検物を撮像する複数の撮像部と、を備え、前記複数の撮像部のそれぞれは、撮像素子と、該撮像素子を移動する移動機構と、を含むことを特徴とする。
本発明のその他の側面については、以下で説明する実施の形態で明らかにする。 Microscope according to one aspect of the present invention includes an imaging optical system for imaging the specimen, and a plurality of imaging units for imaging the test object through the imaging optical system, before Symbol plurality Each of the imaging units includes an imaging element and a moving mechanism that moves the imaging element.
Other aspects of the present invention will be clarified in the embodiments described below.

Claims (12)

被検物を結像する結像光学系と、
前記結像光学系を介して前記被検物を撮像する複数の撮像部と、を備え、
前記複数の撮像部のそれぞれは、撮像素子と、該撮像素子を移動する移動機構と、を含むことを特徴とする顕微鏡。 An imaging optical system for imaging the specimen,
A plurality of imaging units that image the test object via the imaging optical system ,
Before SL Each of the plurality of the imaging unit, the microscope which comprises an imaging device, a moving mechanism for moving the imaging element. 前記移動機構は、前記撮像素子の撮像面が前記被検物の像の合焦面に近づくように、該撮像素子を移動することを特徴とする請求項１に記載の顕微鏡。   2. The microscope according to claim 1, wherein the moving mechanism moves the imaging device so that an imaging surface of the imaging device approaches a focusing surface of an image of the test object. 前記移動機構は、前記被検物の表面形状に応じて前記撮像素子を移動することを特徴とする請求項１又は２に記載の顕微鏡。 The moving mechanism, the microscope according to claim 1 or 2, characterized in that to move the pre-Symbol imaging device according to the surface shape of the test object. 前記被検物を保持し移動するステージを備え、前記移動機構は、前記結像光学系の光軸に垂直な方向への前記ステージの移動に応じて前記撮像素子を移動することを特徴とする請求項１乃至３のいずれか１項に記載の顕微鏡。 Wherein a stage that moves holding the specimen, prior Symbol moving mechanism, characterized by moving the front SL imaging device in accordance with the movement of the stage in a direction perpendicular to the optical axis of the imaging optical system The microscope according to any one of claims 1 to 3. 前記複数の撮像部を移動する移動部を有することを特徴とする請求項１乃至４のいずれか１項に記載の顕微鏡。 Microscope according to any one of claims 1 to 4, characterized in that it has a moving portion for moving the front Symbol plurality of imaging units. 前記移動部は、前記被検物の像の合焦面の傾きに応じて前記複数の撮像部を移動することを特徴とする請求項５に記載の顕微鏡。 The mobile unit, microscope according to claim 5, characterized in that moving the previous SL plurality of imaging units in accordance with the tilt of the focusing plane of the image of the test object. 前記被検物を保持し移動するステージを備え、該ステージは、前記被検物の像の合焦面の傾きに応じて、前記被検物を移動することを特徴とする請求項１乃至６のいずれか１項に記載の顕微鏡。 A stage which moves holding the specimen, the stage, the in accordance with the tilt of the focusing plane of the image of the object, claim 1 to 6, characterized in that moving the test object The microscope according to any one of the above. 複数の前記撮像素子は、前記被検物における異なる複数の部分を撮像するように構成されていることを特徴とする請求項１乃至７のいずれか１項に記載の顕微鏡。 The plurality of the imaging device, the microscope according to any one of claims 1 to 7, characterized in that it is configured to capture a plurality of parts component different in specimen. 請求項１乃至８のいずれか１項に記載の顕微鏡と、前記被検物の表面形状を計測する計測装置と、を備えることを特徴とする画像取得装置。 And 請 Motomeko according to any one of 1 to 8 microscopy, image acquisition apparatus characterized by obtaining Preparations and measuring device, the measuring the surface shape of the test object. 前記移動機構は、前記計測装置により計測された前記表面形状に応じて前記撮像素子を移動することを特徴とする請求項９に記載の画像取得装置。The image acquisition apparatus according to claim 9, wherein the moving mechanism moves the imaging element according to the surface shape measured by the measurement apparatus. 前記計測装置は、前記被検物において試料が存在する存在領域を計測し、前記顕微鏡は、前記計測装置により計測された前記表面形状及び前記存在領域に応じて、該存在領域を撮像する前記撮像素子を移動することを特徴とする請求項９又は１０に記載の画像取得装置。 The measuring device measures the existence region of the sample is present in said test object, the microscope, the according to the surface shape and the existence region that has been measured by the measuring device, the imaging for imaging the existence region the image acquisition apparatus according to claim 9 or 10, characterized in that to move the device. 請求項９乃至１１のいずれか１項に記載の画像取得装置と、前記画像取得装置で取得された前記被検物の画像を表示する表示装置と、を備えることを特徴とする画像取得システム。 An image acquisition system comprising: the image acquisition device according to any one of claims 9 to 11; and a display device that displays an image of the test object acquired by the image acquisition device.
JP2011190375A 2010-10-29 2011-09-01 Microscope, image acquisition device, and image acquisition system Expired - Fee Related JP6071177B2 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2011190375A JP6071177B2 (en) 2010-10-29 2011-09-01 Microscope, image acquisition device, and image acquisition system
US13/823,062 US20130169788A1 (en) 2010-10-29 2011-10-11 Microscope, image acquisition apparatus, and image acquisition system
BR112013009408A BR112013009408A2 (en) 2010-10-29 2011-10-11 microscope, imaging device, and imaging system
EP11779865.2A EP2633358A1 (en) 2010-10-29 2011-10-11 Microscope, image acquisition apparatus, and image acquisition system
CN201180051439.1A CN103180769B (en) 2010-10-29 2011-10-11 Microscope, image acquiring device and image-taking system
PCT/JP2011/073774 WO2012056920A1 (en) 2010-10-29 2011-10-11 Microscope, image acquisition apparatus, and image acquisition system
RU2013124820/28A RU2540453C2 (en) 2010-10-29 2011-10-11 Microscope, imaging device and imaging system
KR1020137012934A KR20130083453A (en) 2010-10-29 2011-10-11 Microscope, image acquisition apparatus, and image acquisition system

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010243802 2010-10-29
JP2010243802 2010-10-29
JP2011190375A JP6071177B2 (en) 2010-10-29 2011-09-01 Microscope, image acquisition device, and image acquisition system

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JP2012108476A JP2012108476A (en) 2012-06-07
JP2012108476A5 true JP2012108476A5 (en) 2014-10-16
JP6071177B2 JP6071177B2 (en) 2017-02-01

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US20150192461A1 (en) * 2012-07-05 2015-07-09 National University Of Singapore Light microscope and method of controlling the same
CN104737056B (en) * 2012-10-15 2017-04-26 索尼公司 Image-acquiring device and method for measuring slide inclination
JP2014178403A (en) * 2013-03-14 2014-09-25 Sony Corp Digital microscope system, information processing method and information processing program
CN104777604A (en) * 2015-04-16 2015-07-15 浙江大学 Positionable microscopic imaging system on basis of USB microscopic probe and stepping scanning table
CN105938243B (en) * 2016-06-29 2018-04-13 华南理工大学 More multiplying power microscope quick focusing methods in a kind of TFT LCD detections
CN106291899A (en) * 2016-09-29 2017-01-04 东方晶源微电子科技（北京）有限公司 Lighting module, optical microscope system and Electron-beam measuring device

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JP5073314B2 (en) * 2007-02-26 2012-11-14 大塚電子株式会社 Microscopic measuring device
US8059336B2 (en) * 2007-05-04 2011-11-15 Aperio Technologies, Inc. Rapid microscope scanner for volume image acquisition
JP2010101959A (en) * 2008-10-21 2010-05-06 Olympus Corp Microscope device

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