JP2011198777A - Solder bonding method and solder joint - Google Patents

Solder bonding method and solder joint Download PDF

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Publication number
JP2011198777A
JP2011198777A JP2008153860A JP2008153860A JP2011198777A JP 2011198777 A JP2011198777 A JP 2011198777A JP 2008153860 A JP2008153860 A JP 2008153860A JP 2008153860 A JP2008153860 A JP 2008153860A JP 2011198777 A JP2011198777 A JP 2011198777A
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Prior art keywords
solder
cream
alloy
ball
bga ball
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Japanese (ja)
Inventor
Tetsuo Nishimura
哲郎 西村
Masuo Koshi
益雄 古志
Junya Masuda
純也 増田
Koji Yamamoto
浩司 山本
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Nihon Superior Sha Co Ltd
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Nihon Superior Sha Co Ltd
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Priority to JP2008153860A priority Critical patent/JP2011198777A/en
Priority to PCT/JP2008/070217 priority patent/WO2009150759A1/en
Priority to TW097147425A priority patent/TW200952587A/en
Publication of JP2011198777A publication Critical patent/JP2011198777A/en
Pending legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
    • B23K3/06—Solder feeding devices; Solder melting pans
    • B23K3/0607—Solder feeding devices
    • B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • B23K35/24—Selection of soldering or welding materials proper
    • B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
    • B23K35/262—Sn as the principal constituent
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341—Surface mounted components
    • H05K3/3431—Leadless components
    • H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457—Solder materials or compositions; Methods of application thereof
    • H05K3/3463—Solder compositions in relation to features of the printed circuit board or the mounting process
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • B23K2101/40—Semiconductor devices
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621—Components characterised by their electrical contacts
    • H05K2201/10734—Ball grid array [BGA]; Bump grid array
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10954—Other details of electrical connections
    • H05K2201/10992—Using different connection materials, e.g. different solders, for the same connection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457—Solder materials or compositions; Methods of application thereof
    • H05K3/3485—Applying solder paste, slurry or powder
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mechanical Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To suppress generation of voids by means of a conventional apparatus without using attached apparatuses such as a pressure reducing apparatus, in solder bonding which uses a BGA ball solder and a cream solder.SOLUTION: The ball solder and the cream solder, which have a relationship where a liquidus temperature of a ball solder alloy is lower than a solidus temperature of a solder alloy in the cream solder, are bonded by a reflow method. The liquidus temperature of the ball solder alloy and the solidus temperature of the solder alloy in the cream solder is at least 1°C or higher. The ball solder and the solder alloy used for the cream solder have a eutectic composition.

Description

本発明は、プリント基板の表面に電子部品を実装する際のボールはんだ及びクリームはんだを用いたはんだ接合方法、及びはんだ接合構造に関する。   The present invention relates to a solder joint method using ball solder and cream solder when mounting an electronic component on the surface of a printed circuit board, and a solder joint structure.

従来、プリント基板の表面に電子部品を実装する際のはんだ付け方法は、長いリード線を有するアキシャル部品が多く用いられてきたが、電子機器の小型化や多機能化に伴い、高集積化された電子部品ＳＩＰやＤＩＰ、ＱＦＰ等が用いられるようになっている。また、近年、多機能化が更に進み、高密度実装対応のため、ＢＡＧパッケージやＣＳＰパッケージが用いられるようになっている。   Conventionally, as the soldering method for mounting electronic components on the surface of a printed circuit board, axial components having long lead wires have been used in many cases. However, as electronic devices are miniaturized and multi-functionalized, they are highly integrated. Electronic parts SIP, DIP, QFP, etc. are used. In recent years, the number of functions has further increased, and BAG packages and CSP packages have been used for high-density mounting.

このようなＢＡＧパッケージやＣＳＰパッケージでは、プリント基板上に配置するためにはんだ接合には小さなボールはんだが用いられる。この手法としては、プリント基板やＢＧＡボールはんだにクリームはんだを塗布した後にＢＡＧパッケージやＣＳＰパッケージをセットして、リフロー処理によってはんだ接合する方法が公知である。   In such a BAG package and a CSP package, small ball solder is used for solder bonding in order to arrange on a printed circuit board. As this method, a method is known in which cream solder is applied to a printed circuit board or BGA ball solder, and then a BAG package or CSP package is set and soldered by reflow processing.

ところで、上記手法によって接合されるＢＧＡパッケージやＣＳＰパッケージでは、種々の接合不良が発生している。この接合不良の中でとりわけ接合信頼性に大きく影響を及ぼしているのが、ボイドと呼ばれるはんだ接合内部に形成される小さな空洞である。ボイドが発生するとはんだ接合強度が低下し、クラックの原因ともなるため、ボイド発生の抑制方法が種々検討されている。また、ＢＧＡパッケージ等のはんだ接合において、ＢＧＡパッケージ基板に実装後のＢＧＡボールはんだの高さにバラツキが発生するため、ミクロン単位が要求されるプリント基板実装工程においては、ＢＧＡボールはんだとクリームはんだが相溶せずに接合不良を発生することも問題となっている。   By the way, in the BGA package and the CSP package joined by the above method, various joining failures occur. Among the poor joints, a small cavity formed inside the solder joint called a void has a great influence on the joint reliability. When voids are generated, the solder joint strength is reduced and causes cracks. Therefore, various methods for suppressing the generation of voids have been studied. In addition, since the height of the BGA ball solder after being mounted on the BGA package substrate varies in the solder bonding of the BGA package or the like, BGA ball solder and cream solder are used in a printed circuit board mounting process that requires micron units. It is also a problem that bonding failure occurs without being compatible.

特開２００６−２７２３９７号公報JP 2006-272397 A 国際公開第２００５／０３５１８０号パンフレットInternational Publication No. 2005/035180 Pamphlet 特開２００５−２０５４１８号公報JP-A-2005-205418 特開２００６−１５９２６６号公報JP 2006-159266 A 特開平８−２９３６７０号公報JP-A-8-293670

ボイドの発生を抑制する方法として、特許文献１では、接続部におけるはんだ溶融の時間を長くしてはんだ内から発生するガスが外気に抜ける時間を確保するために二種の異なる熱容量を備えたはんだ粉末を含むクリームはんだに関する提案が行われている。特許文献２では、微小サイズのＢＧＡボールはんだを用いた際のボイド発生抑制のための合金組成に関する提案行われている。さらに、特許文献３では、はんだ接合時に接合部を減圧状態の圧力に調整する減圧装置の提案が行われており、特許文献４では、高温はんだ接合におけるボイド発生抑制のためのはんだ合金組成の提案が行われている。特許文献５では、２種類の融点の異なるはんだ合金を用いてボイドの発生を抑制する提案が行われている。   As a method for suppressing the generation of voids, Patent Document 1 discloses a solder having two different heat capacities in order to ensure the time for the gas generated from the solder to escape to the outside air by increasing the time for melting the solder in the connection portion. Proposals have been made regarding cream solder containing powder. Patent Document 2 proposes an alloy composition for suppressing the generation of voids when a BGA ball solder having a very small size is used. Further, Patent Document 3 proposes a decompression device that adjusts the joint to a decompressed pressure during solder joining, and Patent Document 4 proposes a solder alloy composition for suppressing void generation in high-temperature solder joining. Has been done. In patent document 5, the proposal which suppresses generation | occurrence | production of a void using two types of solder alloys from which melting | fusing point differs is performed.

ＢＧＡボールはんだとクリームはんだを用いたはんだ接合では、接合部にあるＢＧＡボールはんだとクリームはんだがリフロー炉の加熱により、それぞれ溶融する。この場合、クリームはんだ中や接合界面等で発生したガスは、溶融したＢＧＡボールはんだが遮蔽してしまい、ガスが外気へ放出することが妨げられることになり、そのガスは凝固したはんだ接合部に封じ込められてボイドになることが、ボイド発生の原因の一つと考えられている。ところが、特許文献１はクリームはんだのみに関する提案であり、特許文献２はＢＧＡボールはんだのみに関する提案であり、特許文献４は高温はんだに関する組成の提案であり、さらに特許文献５は２種類のはんだ合金を用いる提案であるため、それぞれの場合はともかくとして、ＢＧＡボールはんだとクリームはんだの組み合わせにおいてボイド発生を抑制することについては、有効ではない。また、特許文献３の減圧装置を用いた提案は、リフロー炉に別途装置を取り付ける必要があると同時に、はんだペレットの形状や温度プロファイルの工夫も必要になるという問題がある。また、ＢＧＡパッケージ基板に実装後のＢＧＡボールはんだの高さを精密にコントロールするという技術については、実装技術の向上により改良されつつあるものの、いまだに実用レベルでは接合不良が発生している。   In solder joining using BGA ball solder and cream solder, the BGA ball solder and cream solder in the joint are melted by heating in the reflow furnace. In this case, the gas generated in the cream solder or at the joint interface is blocked by the melted BGA ball solder, preventing the gas from being released to the outside air, and the gas is applied to the solidified solder joint. It is considered that one of the causes of void generation is to contain the void. However, Patent Document 1 is a proposal related to cream solder only, Patent Document 2 is a proposal related to BGA ball solder only, Patent Document 4 is a proposal of a composition related to high-temperature solder, and Patent Document 5 is two kinds of solder alloys. In any case, it is not effective to suppress the generation of voids in the combination of BGA ball solder and cream solder. Further, the proposal using the decompression device of Patent Document 3 has a problem that it is necessary to separately attach a device to the reflow furnace, and at the same time, it is necessary to devise the shape of the solder pellet and the temperature profile. Further, although the technology for precisely controlling the height of the BGA ball solder after being mounted on the BGA package substrate is being improved by improving the mounting technology, a bonding failure still occurs at a practical level.

本発明は、上述した従来の課題を解決しようとするもので、ＢＧＡボールはんだとクリームはんだを用いたはんだ接合において、減圧装置等の付属設備を使用せずに従来設備にてボイドの発生を抑制する発明を開示することを目的とする。   The present invention is intended to solve the above-described conventional problems, and suppresses the generation of voids in conventional equipment without using accessory equipment such as a decompression device in solder joints using BGA ball solder and cream solder. It is an object of the present invention to disclose an invention.

本発明者らは、上記目的を達成する基本的なアプローチとして、ボイド発生のメカニズムに着目し、ＢＧＡボールはんだとクリームはんだの溶融状態の変化や相対的な溶融温度の違いに着目した。すなわち、ＢＧＡボールはんだの液相線温度が該クリームはんだの固相線温度よりも低いという関係を持つ合金を選択してリフローすることによって、ボイドの発生を飛躍的に減少させたものである。   As a basic approach for achieving the above object, the present inventors focused on the void generation mechanism, and focused on the change in the melting state of BGA ball solder and cream solder and the difference in relative melting temperature. That is, the generation of voids is drastically reduced by selecting and reflowing an alloy having a relationship that the liquidus temperature of the BGA ball solder is lower than the solidus temperature of the cream solder.

また、ＢＧＡボールはんだ合金の液相線温度と、クリームはんだ中のはんだ合金の固相線温度が、少なくとも１℃以上の関係にあることを選択的に採用した。ＢＧＡボールはんだの液相線温度と、クリームはんだ中のはんだ合金の固相線温度は、ある程度離れているほうが好ましいが、１℃の相違があれば、リフロー法の一般的な温度プログラムで加熱しても、先にＢＧＡボールはんだを液体化させることができる。   Further, it was selectively adopted that the liquidus temperature of the BGA ball solder alloy and the solidus temperature of the solder alloy in the cream solder have a relationship of at least 1 ° C. or more. The liquidus temperature of the BGA ball solder and the solidus temperature of the solder alloy in the cream solder are preferably separated from each other to some extent, but if there is a difference of 1 ° C, the temperature is heated by a general temperature program of the reflow method. However, the BGA ball solder can be liquefied first.

さらに、ＢＧＡボールはんだ及びクリームはんだに用いるはんだ合金が共晶組成であることを採用する。共晶の場合には液相線温度と固相線温度が一致するので、それぞれのはんだの溶融が速く、ボイド発生の原因であるガスをはんだ内部から押し出し、ボイドの発生を減少できる。   Further, it is adopted that the solder alloy used for BGA ball solder and cream solder has a eutectic composition. In the case of eutectic, since the liquidus temperature and the solidus temperature coincide with each other, the melting of each solder is fast, and the gas that causes the generation of voids can be pushed out from the inside of the solder to reduce the generation of voids.

さらにまた、ＢＧＡボールはんだとして、Ｓｎ−Ａｇ−Ｃｕを主成分とするはんだ合金を一例として採用し、クリームはんだ中のはんだ合金の一例としてＳｎ−Ｃｕ−Ｎｉを主成分とするはんだ合金を採用した。両者共に広く用いられている無鉛はんだ合金であり、はんだの特性面においても信頼性が高い。   Furthermore, as a BGA ball solder, a solder alloy mainly composed of Sn—Ag—Cu was adopted as an example, and a solder alloy mainly composed of Sn—Cu—Ni was adopted as an example of a solder alloy in cream solder. . Both are lead-free solder alloys that are widely used and have high reliability in terms of solder characteristics.

周知のように、合金は共晶点でない場合には合金が完全に液体になる液相線温度と、完全に固体になる固相線温度を持つ。上記のような関係を持つＢＧＡボールはんだに採用するはんだ合金と、クリームはんだに採用するはんだ合金の場合には、プリント基板と半導体パッケージ間に挟まれて接触するクリームはんだとＢＧＡボールはんだを、リフロー炉中の高温に曝露すると、先ず、液相線温度が低いＢＧＡボールはんだが溶融して液体になり、表面張力によって表面が曲面を維持する。続いて、ＢＧＡボールはんだの液相線温度よりも高い固相線温度を持つクリームはんだ中のはんだ粒に対しては、プリント基板からの熱エネルギーと共にＢＧＡボールはんだが接触している箇所からも熱エネルギーが供給され、ＢＧＡボールはんだに接触している付近においてもフラックスの蒸発が始まりガスを発生させる。この発生したガスは溶融したＢＧＡボールはんだの表面張力によって、ＢＧＡボールはんだの内部に侵入することが妨げられ、大部分は外気中に放出される。   As is well known, when an alloy is not the eutectic point, it has a liquidus temperature at which the alloy becomes completely liquid and a solidus temperature at which it becomes completely solid. In the case of the solder alloy used for the BGA ball solder having the relationship as described above and the solder alloy used for the cream solder, the cream solder and the BGA ball solder that are sandwiched between the printed circuit board and the semiconductor package are reflowed. When exposed to a high temperature in the furnace, first, the BGA ball solder having a low liquidus temperature melts to become a liquid, and the surface maintains a curved surface due to surface tension. Subsequently, for the solder grains in the cream solder having a solidus temperature higher than the liquidus temperature of the BGA ball solder, the heat energy from the printed circuit board and the heat from the place where the BGA ball solder is in contact are also heated. Even in the vicinity where energy is supplied and in contact with the BGA ball solder, evaporation of the flux starts and gas is generated. The generated gas is prevented from entering the inside of the BGA ball solder by the surface tension of the melted BGA ball solder, and most of it is released into the outside air.

一方、クリームはんだ中のはんだ粒は、ＢＧＡボールはんだの質量と比較すると極めて小さい単位あたりの質量であり、大きな熱量を有している液体状のＢＧＡボールはんだに接触すると極めて短時間で溶融し、ＢＧＡボールはんだの一部としてとり込まれることになる。   On the other hand, the solder particles in the cream solder have a very small mass per unit compared to the mass of the BGA ball solder, and melt in a very short time when contacting the liquid BGA ball solder having a large amount of heat. It will be taken in as part of the BGA ball solder.

このように、本発明では、ＢＧＡボールはんだを先に溶融させて表面張力で形状を維持する液体状態を完成させ、続いてＢＧＡボールはんだの熱量によって質量の極めて小さいクリームはんだ中のはんだ粒を溶融させてＢＧＡボールはんだ中にとり込むものである。一方、クリームはんだのクリーム成分については、フラックス機能を発揮させる必要があるために、その蒸発温度ははんだ合金の溶融温度よりも相当低いことは周知であり、その成分によって接合物表面を効果的にぬらすものの、発生したガスがＢＧＡボールはんだ内部に取り込まれることはない。   As described above, in the present invention, the BGA ball solder is first melted to complete a liquid state in which the shape is maintained by surface tension, and then the solder particles in the cream solder having a very small mass are melted by the heat amount of the BGA ball solder. To be taken into the BGA ball solder. On the other hand, it is well known that the cream component of cream solder needs to exhibit a flux function, so that its evaporation temperature is well lower than the melting temperature of the solder alloy. Although wetted, the generated gas is not taken into the BGA ball solder.

上記、本発明の作用の理解をより高めるために、本発明の関係とは逆の、クリームはんだ中のはんだ合金の液相線温度が、ＢＧＡボールはんだの固相線温度よりも低い関係について説明する。この場合には、先ずクリームはんだ中のクリーム成分の蒸発に続いて、クリームはんだ中のはんだ粒の溶融が始まる。その溶融したクリームはんだとＢＧＡボールはんだの接触部分からＢＧＡボールはんだの溶融が始まる。その一方でクリームはんだ中で発生した泡状のガスはクリームはんだの中央部分に集中しながら浮上する。そうすると、ＢＧＡボールはんだの溶融に伴って、先に溶融しているクリームはんだ中のはんだ粒がＢＧＡボールはんだと一体化するのと同時に、泡状のガスも浮力によってＢＧＡボールはんだ中に取り込まれることになり、ボイドが発生する。この一連のプロセスが、２種類のはんだの溶融に焦点をあてたボイド発生のメカニズムである。なお、このような関係では、最初に一部のクリームはんだが溶融した時、その溶融したクリームはんだの表面張力でＢＧＡボールはんだが持ち上げられ、他の箇所の未溶融クリームはんだとＢＧＡボールはんだが離れて非接触になる。非接触になった箇所のクリームはんだとＢＧＡボールはんだが溶融した後に接触しても、互いに相溶することは困難であり接合不良を生じる。   In order to further improve the understanding of the operation of the present invention, the relationship between the liquidus temperature of the solder alloy in the cream solder and the solidus temperature of the BGA ball solder, which is opposite to the relationship of the present invention, will be described. To do. In this case, melting of the solder grains in the cream solder starts following the evaporation of the cream component in the cream solder. The melting of the BGA ball solder starts from the contact portion between the melted cream solder and the BGA ball solder. On the other hand, the foamy gas generated in the cream solder rises while concentrating on the central part of the cream solder. Then, as the BGA ball solder melts, the solder particles in the cream solder previously melted are integrated with the BGA ball solder, and at the same time, bubble gas is also taken into the BGA ball solder by buoyancy. And voids occur. This series of processes is a void generation mechanism focusing on melting of two types of solder. In such a relationship, when some cream solder is melted for the first time, the BGA ball solder is lifted by the surface tension of the melted cream solder, and the unmelted cream solder and BGA ball solder in other places are separated. Become contactless. Even if the cream solder and the BGA ball solder in the non-contacted portion are melted and then contacted with each other, it is difficult to make them compatible with each other, resulting in poor bonding.

本発明のはんだ接合方法、及びこの方法によって完成したはんだ継手は、従来のリフロー設備も用いることができ、しかも従来のはんだ接合に比べ、ボイドの発生が極度に抑制される。   The solder joint method of the present invention and the solder joint completed by this method can also use a conventional reflow facility, and the generation of voids is extremely suppressed as compared with the conventional solder joint.

以下に、本発明の好ましい実施の形態を図面とともに、かつ、実施例に基づいて説明する。
一般にプリント基板の表面に電子部品を実装する場合、リフロー炉にて加熱して接合される前は、図１に示すようにＢＧＡボールはんだとクリームはんだが装着されている。ここで、１はＢＧＡパッケージ基板、２はＢＧＡボールはんだ、３はクリームはんだ、４はプリント基板である。この図では、クリームはんだ３は、プリント基板４に予め印刷することを前提としているが、ＢＧＡボールはんだ２の下端にクリームはんだ３を付着させ、この状態でクリームはんだ３をプリント基板４に接触させる組み合わせを採用しても、本発明が達成する作用効果は同様である。 Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings and examples.
In general, when electronic components are mounted on the surface of a printed circuit board, BGA ball solder and cream solder are attached as shown in FIG. 1 before being heated and joined in a reflow furnace. Here, 1 is a BGA package substrate, 2 is a BGA ball solder, 3 is a cream solder, and 4 is a printed circuit board. In this figure, the cream solder 3 is preliminarily printed on the printed circuit board 4, but the cream solder 3 is attached to the lower end of the BGA ball solder 2, and the cream solder 3 is brought into contact with the printed circuit board 4 in this state. Even if the combination is adopted, the effect achieved by the present invention is the same.

ＢＧＡボールはんだ２の組成は、特に制限はなく、例えば鉛フリーはんだ合金として公知のＳｎ−Ａｇ合金や、Ｓｎ−Ｃｕ合金、あるいは、Ｓｎ−Ｉｎ合金、Ｓｎ−Ｂｉ合金、Ｓｎ−Ｚｎ合金、Ｓｎ−Ａｇ−Ｃｕ合金、Ｓｎ−Ｃｕ−Ｎｉ合金等を採用することが可能である。また、有鉛はんだ合金のＳｎ−Ｐｂ合金をＢＧＡボールはんだとして採用することについても、本発明は排除しない。そして、ＢＧＡボールはんだのサイズ、形状に関しても、特に制限はなく、市販されているものであっても、図１の構造に採用するものは広く本発明におけるＢＧＡボールはんだの概念に含む。   The composition of the BGA ball solder 2 is not particularly limited. For example, a known Sn-Ag alloy, Sn-Cu alloy, Sn-In alloy, Sn-Bi alloy, Sn-Zn alloy, or Sn as a lead-free solder alloy -Ag-Cu alloy, Sn-Cu-Ni alloy, etc. can be employed. Further, the present invention does not exclude the use of a leaded solder alloy Sn—Pb alloy as the BGA ball solder. The size and shape of the BGA ball solder are not particularly limited, and those which are commercially available are widely included in the concept of BGA ball solder in the present invention.

本発明に用いられるクリームはんだについても、組成及び組成の配合量等に特に制限はなく、一般的には、はんだ粉末と樹脂成分、活性剤、チキソ剤、溶剤等より構成されるフラックスからなるペースト状のはんだ組成物を指す。   The cream solder used in the present invention is also not particularly limited in composition and blending amount of the composition, and is generally a paste made of a solder powder and a flux composed of a resin component, an activator, a thixotropic agent, a solvent, and the like. Refers to a solder composition in the form of a solid.

本発明のクリームはんだに用いられるはんだ粉末は、無鉛はんだの世界的傾向に鑑みると、一般的には鉛の成分を含有しない無鉛はんだ粉末が好ましいが、本発明が達成する作用効果にはそれに限定する必要はない。具体的には、Ｓｎ、Ａｇ、Ｃｕ、Ｂｉ、Ｉｎ、Ｚｎ、Ａｌ、Ｓｂ、Ｎｉ、Ａｕ、Ｐｔ、Ｇａ、Ｇｅ、Ｃｏ、Ｆｅ、Ｐ、Ｓｉ、Ｍｎ、Ｔｅ等が挙げられる。また、はんだ粉末の含有量についても、特に限定する必要はないが、はんだペースト中に７０〜９５重量％程度含有されるのが一般的であろう。はんだ粒の形状についても、球形、不定形等特に限定する必要はないが、熱を均一に供給することなどから球形が好適に用いることができ、その粒子径は、粒子範囲が０．１〜１００μｍの粉体を一例として用いる。   The solder powder used in the cream solder of the present invention is preferably a lead-free solder powder that generally does not contain a lead component in view of the global trend of lead-free solder, but the effects achieved by the present invention are limited thereto. do not have to. Specific examples include Sn, Ag, Cu, Bi, In, Zn, Al, Sb, Ni, Au, Pt, Ga, Ge, Co, Fe, P, Si, Mn, and Te. Further, the content of the solder powder is not particularly limited, but it is generally contained in the solder paste by about 70 to 95% by weight. The shape of the solder grains is not particularly limited, such as a spherical shape or an indeterminate shape, but a spherical shape can be suitably used because the heat is uniformly supplied. A 100 μm powder is used as an example.

次に、クリームはんだに用いられる樹脂成分を例示すると、ロジン系樹脂等が挙げられる。ロジン系樹脂とはロジン及びその変性ロジン等の誘導体が挙げられ、これらは併用することもできる。具体的には例えばガムロジン、ウッドロジン、重合ロジン、フェノール変性ロジンやこれらの誘導体が挙げられるが、アクリル系樹脂を併用することも可能である。また、樹脂の含有量は、フラックス中に２５〜７５重量％程度含有されているのが一般的であるが、限定されるものではない。   Next, when the resin component used for cream solder is illustrated, rosin resin etc. are mentioned. Examples of the rosin resin include rosin and derivatives thereof such as modified rosin, and these may be used in combination. Specific examples include gum rosin, wood rosin, polymerized rosin, phenol-modified rosin, and derivatives thereof, but acrylic resins can also be used in combination. The resin content is generally about 25 to 75% by weight in the flux, but is not limited.

実施形態におけるクリームはんだに用いられる活性剤を例示すると、有機アミンのハロゲン化水素酸塩として、ジフェニルグアニジン臭化水素酸塩、シクロヘキシルアミン臭化水素酸塩、ジエチルアミン塩酸塩、トリエタノールアミン臭化水素酸塩、モノエタノールアミン臭化水素酸塩が挙げられ、また、有機酸としては、マロン酸、コハク酸、マレイン酸、グルタル酸、スベリン酸、アジピン酸、セバシン酸等が挙げられる。また、活性剤の含有量は、フラックス中に０．０１〜３０重量％程度含有されているのが一般的であるが、限定されるものではない。   Examples of the activator used for the cream solder in the embodiment include diphenylguanidine hydrobromide, cyclohexylamine hydrobromide, diethylamine hydrochloride, triethanolamine hydrogen bromide as the organic amine hydrohalide. Examples of the acid include malonic acid, succinic acid, maleic acid, glutaric acid, suberic acid, adipic acid, and sebacic acid. Further, the content of the activator is generally about 0.01 to 30% by weight in the flux, but is not limited.

また、クリームはんだに用いられるチキソ剤を例示すると、水素添加ヒマシ油、脂肪酸アマイド類、オキシ脂肪酸類、カスターワックス等が挙げられる。また、チキソ剤の含有量は、特に制限はされないが、フラックス中に０．０１〜１５％程度含有されているのが一般的であるが、限定されるものではない。   Examples of thixotropic agents used for cream solder include hydrogenated castor oil, fatty acid amides, oxy fatty acids, and castor wax. Further, the content of the thixotropic agent is not particularly limited, but is generally about 0.01 to 15% contained in the flux, but is not limited.

本発明のクリームはんだに用いられる溶剤は、ヘキシルカルビトール、ブチルカルビトール、エチレングリコールモノブチルエーテル等が挙げられる。また、溶剤の含有量は、特に制限はされないが、フラックス中２０〜８０重量％程度含有されているのが一般的であるが、限定されるものではない。   Examples of the solvent used in the cream solder of the present invention include hexyl carbitol, butyl carbitol, and ethylene glycol monobutyl ether. Further, the content of the solvent is not particularly limited, but is generally about 20 to 80% by weight in the flux, but is not limited.

本実施形態において、ＢＧＡボールはんだと、クリームはんだの組成を上記のとおり具体的に開示したが、本発明において必要なことは、物性として、ＢＧＡボールはんだ合金の液相線温度が、クリームはんだに含まれるはんだ粒としてのはんだ合金の固相線温度よりも低いことであり、これを達成することができる合金の組み合わせは全て本発明の範囲に含まれる。   In the present embodiment, the composition of the BGA ball solder and the cream solder is specifically disclosed as described above. However, what is necessary in the present invention is that the liquidus temperature of the BGA ball solder alloy is the same as that of the cream solder. It is lower than the solidus temperature of the solder alloy as the contained solder grains, and all combinations of alloys that can achieve this are included in the scope of the present invention.

以下に、実施例を説明する。
〔試料〕
試験に使用したボールはんだ及びクリームはんだの組成等の条件を表１に示す。 Examples will be described below.
〔sample〕
Table 1 shows conditions such as the composition of ball solder and cream solder used in the test.

試験に使用したプリント基板モデル及びＢＧＡパッケージモデルの条件を表２に示す。   Table 2 shows the conditions of the printed circuit board model and the BGA package model used in the test.

〔試験装置〕
・リフロー炉：株式会社タムラ製作所製 ＴＮＰ２５−５３８ＥＭ
・Ｘ線透過型検査装置：株式会社島津製作所製 ＳＭＸ−１６０ＣＴ [Test equipment]
・ Reflow furnace: TNP25-538EM manufactured by Tamura Corporation
-X-ray transmission type inspection device: SMX-160CT manufactured by Shimadzu Corporation

〔試験方法〕
１．表２に示すＢＧＡパッケージに表１に示すボールはんだを実装し、リフロー炉で加熱後、メチレンクロライドを用いて洗浄した。
２．表２に示すプリント基板に表１に示すクリームはんだをそれぞれ印刷して、ボールはんだ実装ＢＧＡパッケージを実装し、リフロー炉で表３に示す条件にてはんだ接合させて表４に示すボールはんだとクリームはんだの組合せの実施例及び比較例を作成した。
３．上記２で得られた継手を、Ｘ線透過型検査装置を用いてボイド発生状況を評価した。 〔Test method〕
1. The ball solder shown in Table 1 was mounted on the BGA package shown in Table 2, heated in a reflow furnace, and then washed with methylene chloride.
2. Each of the solder pastes shown in Table 1 is printed on the printed board shown in Table 2 to mount a BGA package mounted with a ball solder and soldered under the conditions shown in Table 3 in a reflow oven, and then the ball solder and cream shown in Table 4 Examples of solder combinations and comparative examples were prepared.
3. The joints obtained in 2 above were evaluated for the occurrence of voids using an X-ray transmission inspection apparatus.

上記各サンプルの組み合わせにおいて、それぞれの液相線温度及び固相線温度から明らかなように、ボールはんだＡとクリームはんだＣの組み合わせのみが、ボールはんだ合金の液相線温度がクリームはんだ合金の固相線温度よりも低い関係である。
〔試験結果〕
試験結果を表４及び図２に示す。 As is clear from the liquidus temperature and solidus temperature of each of the above combinations of samples, only the combination of the ball solder A and the cream solder C has a liquidus temperature of the ball solder alloy that is the same as that of the cream solder alloy. The relationship is lower than the phase line temperature.
〔Test results〕
The test results are shown in Table 4 and FIG.

表４より、本発明の実施例１は比較例１及び比較例２と比べると、明らかにボイドの発生率が低い。また、図２のようにＸ線で内部を透過すれば白点のボイド部分が確認でき、ボイドの発生が少ないことが明らかである。このことから、上記実施例の関係では、はんだ継手内部のボイドの発生が減少していることがわかる。即ち、ボールはんだの液相線温度がクリームはんだの固相線温度に比べて低い実施例１のみがボイドの発生が減少しているのに対して、ボールはんだの液相線温度がクリームはんだの固相線温度よりも高い比較例２については、液相線温度と固相線温度が同じである比較例１よりもボイドが多く発生している。この３者の関係からも、ＢＧＡボールはんだの液相線温度をクリームはんだに用いたはんだ粒の固相線温度よりも低い関係を採用することによって、ボイドの発生が減少するという結論を導き出すことができる。   From Table 4, Example 1 of the present invention clearly has a lower void generation rate than Comparative Example 1 and Comparative Example 2. In addition, as shown in FIG. 2, if the X-ray is transmitted through the inside, a white spot void portion can be confirmed, and it is clear that the generation of voids is small. From this, it can be seen that the occurrence of voids in the solder joint is reduced in the relationship of the above-described embodiment. That is, only in Example 1 where the liquidus temperature of the ball solder is lower than the solidus temperature of the cream solder, the occurrence of voids is reduced, whereas the liquidus temperature of the ball solder is lower than that of the cream solder. In Comparative Example 2, which is higher than the solidus temperature, more voids are generated than in Comparative Example 1, where the liquidus temperature and the solidus temperature are the same. From these three relationships, the conclusion that the generation of voids is reduced by adopting the relationship where the liquidus temperature of the BGA ball solder is lower than the solidus temperature of the solder grains used in the cream solder is derived. Can do.

また、前述の試験において、ＢＧＡボールはんだ及びクリームはんだがそれぞれ溶融していく状況を観察していると、リフロー炉で加熱後、本発明の実施例は先ずＢＧＡボールはんだ２が溶融し、次にクリームはんだ３が溶融する経緯を経るが、クリームはんだ３が溶融する際に、先に開示したようにガスが中央付近に集中して浮上することがないので、溶融したＢＧＡボールはんだ２を一瞬持上げる作用は働かず、それぞれのはんだが溶け込み合いながらはんだ接合部を形成していく過程が解明された。そして、１００個のはんだ全てに接合不良がないことも確認された。このことによりＢＧＡパッケージ基板１に実装したＢＧＡボールはんだの高さに多少のバラツキが生じたものが含まれていたとしても、はんだ接合終了時にはＢＧＡパッケージとプリント基板双方にしっかりとしたはんだ接合部が形成される。従って、本発明を採用することにより、従来から問題とされていた、ＢＧＡボールはんだの高さバラツキによる接合不良の防止効果も発揮することになる。   Moreover, in the above-mentioned test, when the situation where the BGA ball solder and the cream solder are melted is observed, after heating in the reflow furnace, the BGA ball solder 2 is melted first in the embodiment of the present invention, and then The cream solder 3 is melted, but when the cream solder 3 is melted, the gas does not concentrate and float near the center as disclosed above, so the melted BGA ball solder 2 is held for a moment. The process of forming solder joints as each solder melts has been elucidated. It was also confirmed that all 100 solders had no bonding failure. As a result, even if the height of the BGA ball solder mounted on the BGA package substrate 1 includes some variation, a solid solder joint is formed on both the BGA package and the printed circuit board at the end of the solder joint. It is formed. Therefore, by adopting the present invention, the effect of preventing poor bonding due to the height variation of the BGA ball solder, which has been a problem in the past, is also exhibited.

本発明のはんだ接合方法は、ボイドの発生を著しく抑制するばかりでなく、はんだ接合不良をも防止する効果を有するため、特に信頼性を必要とするＢＧＡパッケージやＣＳＰパッケージ等の電子部品接合に広く応用が期待できる。   The solder bonding method of the present invention not only significantly suppresses the generation of voids, but also has an effect of preventing poor solder bonding. Therefore, it is widely used for bonding electronic components such as BGA packages and CSP packages that particularly require reliability. Application can be expected.

本発明に係るクリームはんだ及びＢＧＡボールはんだのはんだ溶融前の状態を表した概略図。Schematic showing the state before the solder melting of the cream solder and BGA ball solder according to the present invention. はんだ接合後のボイド発生状態をＸ線透過型検査装置にて撮影した写真。（黒円がはんだ断面で、その中の白い斑点状の模様が発生したボイド。）A photograph taken with an X-ray transmission inspection device of the state of void generation after soldering. (A black circle is a cross section of a solder, and a white spotted pattern is generated in it.)

符号の説明Explanation of symbols

１ ＢＧＡパッケージ基板
２ ＢＧＡボールはんだ
３ クリームはんだ
４ プリント基板 1 BGA package substrate 2 BGA ball solder 3 Cream solder 4 Printed circuit board

Claims (5)

プリント基板の表面に電子部品を実装する際において、ボールはんだとクリームはんだを用いるはんだ接合方法であって、該ボールはんだ合金の液相線温度が該クリームはんだ中のはんだ合金の固相線温度よりも低い関係にあるボールはんだとクリームはんだをリフロー法によって接合することを特徴とするはんだ接合方法。 When mounting electronic components on the surface of a printed circuit board, a solder joining method using ball solder and cream solder, wherein the liquidus temperature of the ball solder alloy is higher than the solidus temperature of the solder alloy in the cream solder A solder joining method characterized by joining a ball solder and a cream solder having a low relationship by a reflow method. ボールはんだ合金の液相線温度と、クリームはんだ中のはんだ合金の固相線温度が、少なくとも１℃以上である請求項１記載のはんだ接合方法。 The solder joining method according to claim 1, wherein the liquidus temperature of the ball solder alloy and the solidus temperature of the solder alloy in the cream solder are at least 1 ° C or higher. ボールはんだ及びクリームはんだに用いるはんだ合金が共晶組成を有していることを特徴とする請求項１乃至請求項２記載のはんだ接合方法。 3. The solder joining method according to claim 1, wherein a solder alloy used for ball solder and cream solder has a eutectic composition. ボールはんだは、Ｓｎ−Ａｇ−Ｃｕを主成分とするはんだ合金であり、クリームはんだ中のはんだ合金は、Ｓｎ−Ｃｕ−Ｎｉを主成分とするはんだ合金である請求項１〜３のいずれか記載のはんだ接合方法。 The ball solder is a solder alloy mainly composed of Sn-Ag-Cu, and the solder alloy in the cream solder is a solder alloy mainly composed of Sn-Cu-Ni. Soldering method. 請求項１〜４のいずれかの方法を用いて得られたはんだ継手。 The solder joint obtained using the method in any one of Claims 1-4.
JP2008153860A 2008-06-12 2008-06-12 Solder bonding method and solder joint Pending JP2011198777A (en)

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EP2834037A4 (en) * 2012-03-20 2016-03-16 Alpha Metals Solder preforms and solder alloy assembly methods

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JPH1126931A (en) * 1997-07-03 1999-01-29 Fuji Xerox Co Ltd Electronic part mounting substrate and method for checking connection
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* Cited by examiner, † Cited by third party
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JP2014151367A (en) * 2013-02-04 2014-08-25 General Electric Co <Ge> Brazing process, braze arrangement and brazed article

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