JP2011082634A5 - Imaging device, storage device, and control method - Google Patents

Imaging device, storage device, and control method Download PDF

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JP2011082634A5
JP2011082634A5 JP2009231011A JP2009231011A JP2011082634A5 JP 2011082634 A5 JP2011082634 A5 JP 2011082634A5 JP 2009231011 A JP2009231011 A JP 2009231011A JP 2009231011 A JP2009231011 A JP 2009231011A JP 2011082634 A5 JP2011082634 A5 JP 2011082634A5
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本発明は、撮像装置、記憶装置、及び制御方法に関する。 The present invention relates to an imaging device , a storage device, and a control method .

本発明の１つの側面に係る撮像装置は、光電変換部をそれぞれ含む複数の画素が２次元的に配列された画素配列を有し、前記画素配列の各画素で光電変換された信号を転送順に従って順次転送する撮像手段と、前記画素配列における第１の種類の欠陥画素の位置を特定する情報であり、前記第１の種類の欠陥画素の各々について、前記転送順において前記第１の種類の欠陥画素間に信号が転送される画素数を示す相対位置を第１の欠陥情報として記憶する第１の記憶手段と、前記撮像手段から転送された信号について、前記第１の種類とは異なる第２の種類の欠陥画素の前記画素配列における絶対位置を検出する検出手段と、前記検出手段により検出された前記第２の種類の欠陥画素の各々について、該画素の絶対位置を第２の欠陥情報として記憶する第２の記憶手段とを備えたことを特徴とする。 An imaging apparatus according to one aspect of the present invention has a pixel array in which a plurality of pixels each including a photoelectric conversion unit are two-dimensionally arrayed, and a signal photoelectrically converted by each pixel of the pixel array is transferred in the order of transfer. Imaging means for sequentially transferring according to the information, and information for specifying the position of the first type of defective pixels in the pixel array, and for each of the first type of defective pixels, the first type A first storage means for storing a relative position indicating the number of pixels to which signals are transferred between defective pixels as first defect information, and a signal transferred from the imaging means is different from the first type. Detection means for detecting an absolute position of the two types of defective pixels in the pixel array, and for each of the second type of defective pixels detected by the detection means, the absolute position of the pixel is determined as second defect information. age Characterized in that a second storage means for storing.

Claims (12)

光電変換部をそれぞれ含む複数の画素が２次元的に配列された画素配列を有し、前記画素配列の各画素で光電変換された信号を転送順に従って順次転送する撮像手段と、
前記画素配列における第１の種類の欠陥画素の位置を特定する情報であり、前記第１の種類の欠陥画素の各々について、前記転送順において前記第１の種類の欠陥画素間に信号が転送される画素数を示す相対位置を第１の欠陥情報として記憶する第１の記憶手段と、
前記撮像手段から転送された信号に基づいて、前記第１の種類とは異なる第２の種類の欠陥画素の前記画素配列における座標を示す絶対位置を検出する検出手段と、
前記検出手段により検出された前記第２の種類の欠陥画素の各々について、該画素の絶対位置を第２の欠陥情報として記憶する第２の記憶手段と、
を備えたことを特徴とする撮像装置。 An imaging unit in which a plurality of pixels including a photoelectric conversion unit, each having a two-dimensionally arrayed pixels arranged sequentially transferred in accordance with the transferring order of the signal photoelectrically converted by each pixel of the pixel array,
Information specifying the position of the first type of defective pixel in the pixel array, and a signal is transferred between the first type of defective pixels in the transfer order for each of the first type of defective pixels. First storage means for storing a relative position indicating the number of pixels to be stored as first defect information;
Detecting means for detecting an absolute position indicating coordinates in the pixel array of a defective pixel of a second type different from the first type based on a signal transferred from the imaging unit;
Second storage means for storing the absolute position of the second type of defective pixels detected by the detection means as second defect information ;
An imaging apparatus comprising: 前記第１の記憶手段に記憶された前記第１の欠陥情報を絶対位置に変換し、前記第２の記憶手段に記憶された前記第２の欠陥情報と結合することで、前記画素配列における欠陥画素の絶対位置を特定する生成手段をさらに備えたことを特徴とした請求項１に記載の撮像装置。 The first defect information stored in the first storage means is converted into an absolute position and combined with the second defect information stored in the second storage means, so that defects in the pixel array are obtained. The imaging apparatus according to claim 1, further comprising generation means for specifying an absolute position of a pixel . 前記生成手段は、さらに、特定した前記画素配列における欠陥画素の絶対位置を変換することで、各欠陥画素について、前記転送順において欠陥画素間に信号が転送される画素数を示す相対位置を第３の欠陥情報として生成することを特徴とした請求項２に記載の撮像装置。 The generating means further converts the absolute position of the defective pixel in the specified pixel array to obtain a relative position indicating the number of pixels to which a signal is transferred between the defective pixels in the transfer order for each defective pixel. The imaging device according to claim 2, wherein the imaging device is generated as defect information 3 . 前記生成手段により生成された前記第３の欠陥情報を記憶する第３の記憶手段をさらに備えたことを特徴とした請求項３に記載の撮像装置。 The imaging apparatus according to claim 3, further comprising a third storage unit that stores the third defect information generated by the generation unit. 前記撮像手段から転送された信号のうち、前記第３の欠陥情報により特定される位置の画素に対応する信号を、該画素の周囲の画素に対応する信号を用いて補間する補間手段をさらに備えたことを特徴とする請求項３又は４に記載の撮像装置。 Interpolation means for interpolating a signal corresponding to a pixel at a position specified by the third defect information among signals transferred from the imaging means using a signal corresponding to pixels around the pixel is further provided. The imaging apparatus according to claim 3 or 4, wherein 前記第１の種類の欠陥画素は、工場出荷前に予め判明している欠陥画素であることを特徴とする請求項１乃至５のいずれか１項に記載の撮像装置。The imaging apparatus according to claim 1, wherein the first type of defective pixel is a defective pixel that has been identified in advance before shipping from a factory. 光電変換部をそれぞれ含む複数の画素が２次元的に配列された画素配列について、該画素配列における欠陥画素の位置を特定する位置情報を記憶する記憶装置であって、A storage device that stores position information for specifying a position of a defective pixel in a pixel array in which a plurality of pixels each including a photoelectric conversion unit are two-dimensionally arranged,
第１の種類の欠陥画素の位置情報であって、前記第１の種類の欠陥画素の各々について、前記画素配列の各画素で光電変換された信号の転送順において前記第１の種類の欠陥画素間に転送される画素数を示す相対位置を特定する位置情報を第１の欠陥情報として記憶する第１の記憶手段と、  Position information of a first type of defective pixel, and for each of the first type of defective pixel, the first type of defective pixel in the order of transfer of signals photoelectrically converted by each pixel of the pixel array. First storage means for storing position information for specifying a relative position indicating the number of pixels transferred between the first defect information;
前記第１の種類の欠陥画素とは検出時期が異なる第２の種類の欠陥画素の位置情報であって、前記第２の種類の欠陥画素の各々について、前記画素配列における絶対位置を特定する位置情報を第２の欠陥情報として記憶する第２の記憶手段と、  Position information of a second type of defective pixel having a detection time different from that of the first type of defective pixel, and a position for specifying an absolute position in the pixel array for each of the second type of defective pixels Second storage means for storing information as second defect information;
を備えたことを特徴とする記憶装置。A storage device comprising: 前記画素配列から転送された信号に基づいて、前記第２の種類の欠陥画素を検出する検出手段をさらに備えたことを特徴とする請求項７に記載の記憶装置。8. The storage device according to claim 7, further comprising detection means for detecting the second type of defective pixels based on a signal transferred from the pixel array. 前記第１の欠陥情報と前記第２の欠陥情報とを結合し、前記画素配列に含まれる各欠陥画素について、前記転送順において欠陥画素間に信号が転送される画素を示す相対位置を特定する第３の欠陥情報を生成する生成手段と、The first defect information and the second defect information are combined, and for each defective pixel included in the pixel array, a relative position indicating a pixel to which a signal is transferred between the defective pixels in the transfer order is specified. Generating means for generating third defect information;
前記画素配列から転送された信号のうち、前記第３の欠陥情報により特定される位置の画素に対応する信号を、該画素の周囲の画素に対応する信号を用いて補間する補間手段と、  Interpolation means for interpolating a signal corresponding to a pixel at a position specified by the third defect information among signals transferred from the pixel array, using a signal corresponding to a pixel around the pixel;
をさらに備えたことを特徴とする請求項７または８に記載の記憶装置。The storage device according to claim 7 or 8, further comprising: 前記第１の種類の欠陥画素は、工場出荷前に予め判明している欠陥画素であることを特徴とする請求項７乃至９のいずれか１項に記載の記憶装置。10. The storage device according to claim 7, wherein the first type of defective pixel is a defective pixel that is known in advance before shipping from a factory. 光電変換部をそれぞれ含む複数の画素が２次元的に配列された画素配列を有し、前記画素配列の各画素で光電変換された信号を転送順に従って順次転送する撮像手段を備える撮像装置の制御方法であって、Control of an imaging apparatus having a pixel array in which a plurality of pixels each including a photoelectric conversion unit are two-dimensionally arranged and sequentially transferring signals photoelectrically converted by each pixel of the pixel array according to a transfer order A method,
前記撮像装置の制御手段が、前記画素配列における第１の種類の欠陥画素の位置を特定する情報であり、前記第１の種類の欠陥画素の各々について、前記転送順において前記第１の種類の欠陥画素間に信号が転送される画素数を示す相対位置を第１の欠陥情報として記憶する第１の記憶工程と、  The control means of the imaging device is information for specifying a position of a first type of defective pixel in the pixel array, and for each of the first type of defective pixels, the first type of pixels in the transfer order. A first storage step of storing, as first defect information, a relative position indicating the number of pixels to which signals are transferred between defective pixels;
前記撮像装置の検出手段が、前記撮像手段から転送された信号について、前記第１の種類とは異なる第２の種類の欠陥画素の前記画素配列における絶対位置を検出する検出工程と、  A detection step in which the detection unit of the imaging apparatus detects an absolute position in the pixel array of a defective pixel of a second type different from the first type for the signal transferred from the imaging unit;
前記制御手段が、前記検出工程において検出された前記第２の種類の欠陥画素の各々について、該画素の絶対位置を第２の欠陥情報として記憶する第２の記憶工程と、  A second storage step in which the control means stores the absolute position of the pixel as second defect information for each of the second type of defective pixels detected in the detection step;
を備えたことを特徴とする撮像装置の制御方法。An image pickup apparatus control method comprising: 光電変換部をそれぞれ含む複数の画素が２次元的に配列された画素配列について、該画素配列における欠陥画素の位置を特定する位置情報を記憶する記憶装置の制御方法であって、前記記憶装置は第１の種類の欠陥画素の位置情報であって、前記第１の種類の欠陥画素の各々について、前記画素配列の各画素で光電変換された信号の転送順において前記第１の種類の欠陥画素間に転送される画素数を示す相対位置を特定する位置情報を第１の位置情報として記憶する第１の記憶手段を有し、A storage device control method for storing position information for specifying a position of a defective pixel in a pixel array in which a plurality of pixels each including a photoelectric conversion unit are two-dimensionally arrayed, wherein the storage device includes: Position information of a first type of defective pixel, and for each of the first type of defective pixel, the first type of defective pixel in the order of transfer of signals photoelectrically converted by each pixel of the pixel array. First storage means for storing position information for specifying a relative position indicating the number of pixels transferred between the first position information;
前記記憶装置の制御手段が、前記第１の種類とは検出時期が異なる第２の種類の欠陥画素の位置情報であって、前記第２の種類の欠陥画素の各々について、前記画素配列における絶対位置を特定する位置情報を第２の位置情報として記憶する第２の記憶工程  The control means of the storage device is position information of a second type of defective pixel having a detection time different from that of the first type, and for each of the second type of defective pixels, an absolute value in the pixel array Second storage step of storing position information for specifying a position as second position information
を備えることを特徴とする記憶装置の制御方法。A method for controlling a storage device, comprising:
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