JP2009037819A5 - - Google Patents

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Publication number
JP2009037819A5
JP2009037819A5 JP2007200298A JP2007200298A JP2009037819A5 JP 2009037819 A5 JP2009037819 A5 JP 2009037819A5 JP 2007200298 A JP2007200298 A JP 2007200298A JP 2007200298 A JP2007200298 A JP 2007200298A JP 2009037819 A5 JP2009037819 A5 JP 2009037819A5
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JP
Japan
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JP2007200298A
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JP5262010B2 (ja
JP2009037819A (ja
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Priority to JP2007200298A priority Critical patent/JP5262010B2/ja
Priority claimed from JP2007200298A external-priority patent/JP5262010B2/ja
Priority to US12/039,306 priority patent/US8164053B2/en
Publication of JP2009037819A publication Critical patent/JP2009037819A/ja
Publication of JP2009037819A5 publication Critical patent/JP2009037819A5/ja
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Publication of JP5262010B2 publication Critical patent/JP5262010B2/ja
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JP2007200298A 2007-08-01 2007-08-01 質量分析計及び質量分析方法 Expired - Fee Related JP5262010B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007200298A JP5262010B2 (ja) 2007-08-01 2007-08-01 質量分析計及び質量分析方法
US12/039,306 US8164053B2 (en) 2007-08-01 2008-02-28 Mass analyzer and mass analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007200298A JP5262010B2 (ja) 2007-08-01 2007-08-01 質量分析計及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2009037819A JP2009037819A (ja) 2009-02-19
JP2009037819A5 true JP2009037819A5 (ja) 2010-05-20
JP5262010B2 JP5262010B2 (ja) 2013-08-14

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JP2007200298A Expired - Fee Related JP5262010B2 (ja) 2007-08-01 2007-08-01 質量分析計及び質量分析方法

Country Status (2)

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US (1) US8164053B2 (ja)
JP (1) JP5262010B2 (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5124293B2 (ja) * 2008-01-11 2013-01-23 株式会社日立ハイテクノロジーズ 質量分析計および質量分析方法
JP5111123B2 (ja) * 2008-01-16 2012-12-26 株式会社日立製作所 質量分析計及び質量分析方法
US20120305762A1 (en) * 2010-03-24 2012-12-06 Akihito Kaneko Ion isolation method and mass spectrometer
JP5950913B2 (ja) * 2010-08-25 2016-07-13 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 有意な六重極および八重極成分を有する実質的に四重極の電場を提供するための方法およびシステム
JP5675442B2 (ja) * 2011-03-04 2015-02-25 株式会社日立ハイテクノロジーズ 質量分析方法及び質量分析装置
US9443706B2 (en) * 2011-06-24 2016-09-13 Micromass Uk Limited Method and apparatus for generating spectral data
GB201208961D0 (en) * 2012-05-18 2012-07-04 Micromass Ltd 2 dimensional MSMS
US8637816B1 (en) * 2012-07-31 2014-01-28 Agilent Technologies, Inc. Systems and methods for MS-MS-analysis
WO2015036848A1 (en) * 2013-09-13 2015-03-19 Dh Technologies Development Pte. Ltd. Rf-only detection scheme and simultaneous detection of multiple ions
US10008376B2 (en) * 2014-10-30 2018-06-26 Dh Technologies Development Pte. Ltd. Methods and systems for selecting ions for ion fragmentation
US9865446B2 (en) * 2016-05-26 2018-01-09 Thermo Finnigan Llc Systems and methods for reducing the kinetic energy spread of ions radially ejected from a linear ion trap
JP7153658B2 (ja) * 2017-02-22 2022-10-14 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Ｉｄａのための前駆体イオン選択における付加物およびその他の悪化因子の物理的単離
US10128094B2 (en) 2017-03-01 2018-11-13 Thermo Finnigan Llc Optimizing quadrupole collision cell RF amplitude for tandem mass spectrometry

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US5179278A (en) 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5464985A (en) 1993-10-01 1995-11-07 The Johns Hopkins University Non-linear field reflectron
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
JP3509267B2 (ja) 1995-04-03 2004-03-22 株式会社日立製作所 イオントラップ質量分析方法および装置
US5783824A (en) * 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
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US7019289B2 (en) 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
JP5027507B2 (ja) 2003-09-25 2012-09-19 エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス 選択された六重極成分を有する２次元の実質的四重極電場を提供するための方法及び装置
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