JP2008292192A - Transformer tester - Google Patents
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- 238000005259 measurement Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
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Abstract
Description
本発明は、変成器試験装置に係わり、とくに変流器、変圧器の誤差を測定する装置に関する。 The present invention relates to a transformer testing apparatus, and more particularly to an apparatus for measuring an error of a current transformer and a transformer.
通常の変成器は、変圧器であれば、鉄心に1次巻線および2次巻線が巻装されており、1次巻線に1次電圧を印加すると電磁誘導により2次巻線に2次電圧が誘起される、というものである。変流器も同様に、1次巻線に電流を流すと、電磁誘導によって2次巻線に2次電流が流れる。 If a normal transformer is a transformer, a primary winding and a secondary winding are wound around an iron core. When a primary voltage is applied to the primary winding, 2 is applied to the secondary winding by electromagnetic induction. A secondary voltage is induced. Similarly, when a current flows through the primary winding, a secondary current flows through the secondary winding by electromagnetic induction.
そこで、従来の変成器試験装置は、標準および被試験の両変圧器の2次電圧同士、または変流器の2次電流同士を比較し、その比誤差および位相角を測定する構成となっている(特許文献1参照)。
これに対して、近年、電子式変圧器(EVT)または電子式変流器(ECT)と呼ばれる被測定量を信号化して処理する変成器が登場し、これらの変成器は従来の変成器試験装置では測定することができないことがある。 On the other hand, in recent years, transformers called electronic transformers (EVT) or electronic current transformers (ECT) that convert and process measured quantities have appeared, and these transformers have been tested in conventional transformer tests. The instrument may not be able to measure.
最も端的な例を示せば、電子式変流器の場合、被試験量が電圧であるから標準量も電圧に変換する必要があり、電流出力のままでは比較測定ができない。 In the simplest example, in the case of an electronic current transformer, since the amount to be tested is a voltage, it is necessary to convert the standard amount to a voltage, and comparative measurement cannot be performed with the current output as it is.
また、従来は、標準変成器の2次出力信号と被試験変成器の2次出力信号とをアナログ的な帰還回路を用いて平衡を取っているが、この方法では、平衡を取るのに時間を要する。しかも、帰還回路を用いており、帰還量を増すと発振し易くなり動作が不安定である。 Conventionally, the secondary output signal of the standard transformer and the secondary output signal of the transformer under test are balanced using an analog feedback circuit, but this method requires time to balance. Cost. In addition, a feedback circuit is used, and when the feedback amount is increased, oscillation easily occurs and the operation becomes unstable.
とくに、位相角の誤差測定の原理式が近似式であり、高精度の測定には不向きである。 In particular, the principle formula of phase angle error measurement is an approximate expression and is not suitable for high-precision measurement.
本発明は上述の点を考慮してなされたもので、電子式変成器の位相角誤差を正確かつ迅速に測定することができる変成器試験装置を提供することを目的とする。 The present invention has been made in consideration of the above-described points, and an object of the present invention is to provide a transformer testing apparatus capable of accurately and quickly measuring a phase angle error of an electronic transformer.
上記目的達成のため、本発明では、
電子式変成器として構成された被試験変成器の2次出力を標準変成器の2次出力と比較し、前記被試験変成器の2次出力が前記標準変成器の2次出力に対する位相角誤差を測定する変成器試験装置であって、
前記標準変成器の2次出力を所定範囲の値を持った標準電圧に変換する変換回路と、
前記被試験変成器の出力電圧と前記標準電圧との偏差電圧を取り出す偏差検出回路と、
前記標準電圧と前記偏差電圧とが与えられてディジタル変換し、前記標準電圧に対する前記偏差電圧の比誤差と位相角を算出するディジタル演算回路と
をそなえたことを特徴とする変成器試験装置、
を提供するものである。
In order to achieve the above object, in the present invention,
The secondary output of the transformer under test configured as an electronic transformer is compared with the secondary output of the standard transformer, and the secondary output of the transformer under test is a phase angle error relative to the secondary output of the standard transformer. A transformer testing device for measuring
A conversion circuit for converting the secondary output of the standard transformer into a standard voltage having a value within a predetermined range;
A deviation detection circuit for extracting a deviation voltage between the output voltage of the transformer under test and the standard voltage;
A transformer test apparatus comprising: a digital arithmetic circuit that is provided with the standard voltage and the deviation voltage and performs digital conversion, and calculates a ratio error and a phase angle of the deviation voltage with respect to the standard voltage;
Is to provide.
本発明は上述のように、標準電圧を形成するとともに被試験電圧の標準電圧に対する偏差電圧を検出して両者を用いて演算することにより比誤差と位相角を算出するようにしたため、電子式変成器として構成された被試験変成器の2次出力における位相角誤差を正確かつ迅速に測定することができる。 In the present invention, as described above, since the standard voltage is formed and the deviation voltage of the voltage under test with respect to the standard voltage is detected and calculated using both, the ratio error and the phase angle are calculated. The phase angle error at the secondary output of the transformer under test configured as a transformer can be measured accurately and quickly.
以下、添付図面を参照して本発明の実施例を説明する。 Embodiments of the present invention will be described below with reference to the accompanying drawings.
図1は、被試験変成器がECTである、本発明の一実施例の構成を示している。この場合、被試験変流器ECTxから2次出力電流に対応した被試験電圧Vxが与えられる。また、巻数比n11:n12の標準変流器CTから取り出され、この標準変流器CTの2次電圧が演算増幅器OP1に与えられて得られた出力である標準電圧vsが、偏差検出用の変圧器VTの1次巻線の一端、およびディジタル演算部AUの1次巻線に設けられた2つの入力端子の一方に与えられる。
FIG. 1 shows the configuration of an embodiment of the present invention in which the transformer under test is an ECT. In this case, a voltage under test Vx corresponding to the secondary output current is given from the current transformer ECTx under test. The turns ratio n11: taken from the standard current transformer CT of n12,
一方、被試験電圧Vxは、偏差検出用の変圧器VTの2つの入力端子の他方に与えられる。これにより、偏差検出用の変圧器VTの2次側出力端子には、演算増幅器OP2が接続され、偏差電圧Δvが取り出されてディジタル演算部AUに与えられる。 On the other hand, the voltage under test Vx is applied to the other of the two input terminals of the deviation detecting transformer VT. As a result, the operational amplifier OP2 is connected to the secondary output terminal of the transformer VT for detecting the deviation, and the deviation voltage Δv is taken out and applied to the digital operation unit AU.
ここで、上記標準電圧vsおよび偏差電圧Δvは、下式(a1),(a2)の通り表わすことができる。
ディジタル演算部AUは、2つの入力つまり標準電圧としてのvsと偏差電圧としてのΔvとから、詳細は図3を用いて後述するように、比誤差εおよび位相角θを算出する。 Digital processing unit AU from the Δv as v s and the deviation voltage as the two input words standard voltage, as will be described later in detail with reference to FIG. 3, calculates a ratio error ε and the phase angle theta.
図2は、被試験変成器がEVTである本発明の他の実施例の構成を示している。この場合、被試験電圧Vxは実施例1と同様であるが、標準電圧vsは、巻数比がn11対n12である誘導分圧器IVDから与えられる。 FIG. 2 shows a configuration of another embodiment of the present invention in which the transformer under test is an EVT. In this case, although the test voltage Vx are the same as in Example 1, the standard voltage v s is given from the inductive divider IVD turns ratio is n11 vs. n12.
ここで、上記標準電圧vsおよび偏差電圧Δvは、下式(b1),(b2)の通り表わすことができる。
図3は、実施例1,2に示したディジタル演算部AUにより具体的な回路構成を示すブロック線図である。この演算部AUは、標準電圧vs、偏差電圧Δvをディジタル変換するA/D変換器ADC1,ADC2の出力電圧vs(t),Δv(t)を得て、3つの乗算回路MP1ないしMP3および移相メモリーMにより下記信号A,B,Cを形成し、更にこれら信号A,B,Cを中央処理装置CPUに与えて下式(1),(2)により比誤差εおよび位相角θを算出させる。
これらの数式3および数式4に示すように、比誤差εおよび位相角θの算出は、ディジタル方式での信号A,BおよびCに基く演算によりなされており、アナログ回路における問題、すなわち帰還回路を用いた構成に起因する発振等の問題を生じない。したがって、常に安定的に測定を行うことができる。
As shown in these
しかも、算出式は、従来の位相角θの算出に用いていた近似方式によるものではないから位相角θの測定精度を向上することができる。 Moreover, since the calculation formula is not based on the approximation method used for calculating the conventional phase angle θ, the measurement accuracy of the phase angle θ can be improved.
CT 変流器、VT 変圧器、OP 演算増幅器、AU ディジタル演算部、
IVD 誘導分圧器、ADC A/D変換器、M メモリー、
MP 乗算回路、CPU 中央演算処理装置。
Vs,vs 標準電圧、Vx 被試験電圧、Δv 偏差電圧。
ε 比誤差、θ 位相角。
CT current transformer, VT transformer, OP operational amplifier, AU digital arithmetic unit,
IVD induction voltage divider, ADC A / D converter, M memory,
MP multiplier circuit, CPU central processing unit.
Vs, v s standard voltage, Vx under test voltage, Δv deviation voltage.
ε Ratio error, θ phase angle.
Claims (5)
前記標準変成器の2次出力を所定範囲の値を持った標準電圧に変換する変換回路と、
前記被試験変成器の出力電圧と前記標準電圧との偏差電圧を取り出す偏差検出回路と、
前記標準電圧と前記偏差電圧とが与えられてディジタル変換し、前記標準電圧に対する前記偏差電圧の比誤差と位相角を算出するディジタル演算回路と
をそなえたことを特徴とする変成器試験装置。 The secondary output of the transformer under test configured as an electronic transformer is compared with the secondary output of the standard transformer, and the secondary output of the transformer under test is a phase angle error relative to the secondary output of the standard transformer. A transformer testing device for measuring
A conversion circuit for converting the secondary output of the standard transformer into a standard voltage having a value within a predetermined range;
A deviation detection circuit for extracting a deviation voltage between the output voltage of the transformer under test and the standard voltage;
A transformer testing apparatus, comprising: a digital arithmetic circuit which receives the standard voltage and the deviation voltage and performs digital conversion and calculates a ratio error and a phase angle of the deviation voltage with respect to the standard voltage.
前記変換回路は、変流器と演算増幅器とにより構成されたことを特徴とする変成器試験装置。 The transformer test device of claim 1,
The transformer circuit comprises a current transformer and an operational amplifier.
前記変換回路は、変圧器として構成されたことを特徴とする変成器試験装置。 The transformer test device of claim 1,
The transformer testing device, wherein the conversion circuit is configured as a transformer.
前記偏差検出回路は、1次巻線に前記標準電圧および前記被試験変成器の出力電圧が与えられ、2次巻線に前記標準電圧と前記被試験変成器の出力電圧との偏差電圧を取り出すようにしたことを特徴とする変成器試験装置。 The transformer test device of claim 1,
The deviation detection circuit receives the standard voltage and the output voltage of the transformer under test in a primary winding, and takes out a deviation voltage between the standard voltage and the output voltage of the transformer under test in a secondary winding. A transformer testing device characterized by that.
前記ディジタル演算回路は、下記式(1)および(2)に示す演算を行う回路およびメモリーMを有することを特徴とする変成器試験装置。
The digital arithmetic circuit has a circuit for performing arithmetic operations shown in the following formulas (1) and (2) and a memory M, and is a transformer testing device.
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