JP2008122086A - Turbidity sensor - Google Patents

Turbidity sensor Download PDF

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Publication number
JP2008122086A
JP2008122086A JP2006302822A JP2006302822A JP2008122086A JP 2008122086 A JP2008122086 A JP 2008122086A JP 2006302822 A JP2006302822 A JP 2006302822A JP 2006302822 A JP2006302822 A JP 2006302822A JP 2008122086 A JP2008122086 A JP 2008122086A
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light
light emitting
substrate
emitting element
light receiving
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JP2006302822A
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Japanese (ja)
Inventor
Junji Imai
順二 今井
Hiroshi Inoue
浩 井上
Hitoshi Makinaga
仁 牧永
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Panasonic Electric Works Co Ltd
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Matsushita Electric Works Ltd
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Priority to JP2006302822A priority Critical patent/JP2008122086A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To measure the turbidity of a measuring object stably and accurately. <P>SOLUTION: In this turbidity sensor 1 formed of a three-dimensional circuit substrate comprising two opposite substrate domains 2, 3 and support domains 4, 5, 6 for supporting oppositely the substrate domains 2, 3, a light emitting element 7 is buried with an exposed light emitting surface in an opposite face to the substrate domain 3 of the substrate domain 2, and a plurality of light receiving elements 8 are buried with each exposed light receiving surface in an opposite face to the substrate domain 2 of the substrate domain 3. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、気体や液体等の測定対象物の濁度を測定する濁度センサに関する。   The present invention relates to a turbidity sensor that measures the turbidity of a measurement object such as gas or liquid.

従来より、発光素子と、発光素子から離間配置された受光素子とを備え、空気や水等の測定対象物を通過してきた発光素子の発光光の強度を受光素子において測定することにより、測定対象物の濁度を測定する濁度センサが知られている（特許文献１参照）。
特開２００６−２８４３９８号公報 Conventionally, a light-emitting element and a light-receiving element spaced apart from the light-emitting element are provided, and the light-receiving element measures the intensity of light emitted from the light-emitting element that has passed through the measurement object such as air or water. A turbidity sensor that measures the turbidity of an object is known (see Patent Document 1).
JP 2006-284398 A

従来の濁度センサでは、発光素子と受光素子はそれぞれ別々の基板に実装されているために、発光素子と受光素子間の距離にばらつきが生じることによって、測定対象物の濁度を安定的に精度よく測定することが難しい。このような問題を解決するために、製造された濁度センサ毎に検定を行うことによって濁度の算出式を調整する方法が考えられるが、この方法を用いた場合には濁度センサの調整作業に要する労力が増加する。   In the conventional turbidity sensor, since the light emitting element and the light receiving element are mounted on separate substrates, variation in the distance between the light emitting element and the light receiving element results in stable turbidity of the measurement object. It is difficult to measure accurately. In order to solve such a problem, a method of adjusting the calculation formula of turbidity by performing a test for each manufactured turbidity sensor can be considered, but when this method is used, adjustment of the turbidity sensor is considered. The labor required for work increases.

本発明は、上記課題を解決するためになされたものであり、その目的は、測定対象の濁度を安定的に精度よく測定可能な濁度センサを提供することにある。   The present invention has been made to solve the above problems, and an object of the present invention is to provide a turbidity sensor capable of measuring the turbidity of a measurement object stably and accurately.

本発明に係る濁度センサは、対向する２つの基板領域と２つの基板領域を対向支持する支持領域とを備える立体回路基板と、２つの基板領域表面に対向配置された発光素子及び受光素子と、支持領域に設けられ、受光素子が受光した発光素子の発光光の強度に基づいて発光素子と受光素子間にある測定対象物の濁度を演算する回路部とを備える。   A turbidity sensor according to the present invention includes a three-dimensional circuit board including two opposing substrate regions and a supporting region that supports and supports the two substrate regions, and a light emitting element and a light receiving element that are disposed to face the two substrate region surfaces. And a circuit unit that is provided in the support region and calculates the turbidity of the measurement object between the light emitting element and the light receiving element based on the intensity of the emitted light of the light emitting element received by the light receiving element.

本発明に係る濁度センサによれば、発光素子と受光素子は立体回路基板の対向する２つの基板領域表面に対向配置されているので、発光素子と受光素子間の距離のばらつきが小さくなり、測定対象物の濁度を安定的に精度よく測定することができる。   According to the turbidity sensor according to the present invention, since the light emitting element and the light receiving element are arranged opposite to the surface of the two opposite substrate regions of the three-dimensional circuit board, variation in the distance between the light emitting element and the light receiving element is reduced, The turbidity of the measurement object can be measured stably and accurately.

以下、図１及び図２を参照して、本発明の実施形態となる濁度センサの構成について説明する。なお、図１は本発明の実施形態となる濁度センサの斜視図であり、図２は図１に示す濁度センサの断面図である。   Hereinafter, the configuration of the turbidity sensor according to the embodiment of the present invention will be described with reference to FIGS. 1 and 2. 1 is a perspective view of a turbidity sensor according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view of the turbidity sensor shown in FIG.

本発明の実施形態となる濁度センサ１は、対向する２つの基板領域２，３と、基板領域２，３を対向支持する支持領域４，５，６とからなる立体回路基板により形成され、立体回路基板は、基板領域２，３と支持領域４によりコの字型の断面形状を形成している。なお、基板領域は、耐熱性合成樹脂又はセラミックスにより形成され、射出成形技術により一体成形される。   A turbidity sensor 1 according to an embodiment of the present invention is formed by a three-dimensional circuit board including two opposing substrate regions 2 and 3 and supporting regions 4, 5 and 6 that support and oppose the substrate regions 2 and 3. The three-dimensional circuit board has a U-shaped cross section formed by the substrate regions 2 and 3 and the support region 4. Note that the substrate region is formed of heat-resistant synthetic resin or ceramics, and is integrally formed by an injection molding technique.

基板領域２の基板領域３との対向面には発光素子７が発光面を露出させた状態で埋設され、基板領域３の基板領域２との対向面には複数の受光素子８が受光面を露出させた状態で埋設されている。また、基板領域２の基板領域３との対向面及び基板領域３の基板領域２との対向面には透明樹脂９が形成され、発光素子７と受光素子８はこの透明樹脂８によって封止されている。   A light emitting element 7 is embedded in a surface of the substrate region 2 facing the substrate region 3 with the light emitting surface exposed, and a plurality of light receiving elements 8 are disposed on the surface of the substrate region 3 facing the substrate region 2. It is buried in an exposed state. A transparent resin 9 is formed on the surface of the substrate region 2 facing the substrate region 3 and the surface of the substrate region 3 facing the substrate region 2, and the light emitting element 7 and the light receiving element 8 are sealed with the transparent resin 8. ing.

支持領域４の裏面側には、発光素子７及び受光素子８と電気的に接続された制御用ＩＣ基板１０が実装されている。この制御用ＩＣ基板１０は、発光素子７及び受光素子８の動作を制御すると共に、受光素子８が受光した発光素子７の発光光の強度及びそのばらつきから発光素子７と受光素子８間の測定対象物の濁度を算出する。   A control IC substrate 10 that is electrically connected to the light emitting element 7 and the light receiving element 8 is mounted on the back side of the support region 4. The control IC substrate 10 controls the operations of the light emitting element 7 and the light receiving element 8 and measures between the light emitting element 7 and the light receiving element 8 based on the intensity of light emitted from the light emitting element 7 received by the light receiving element 8 and its variation. Calculate the turbidity of the object.

具体的には、制御用ＩＣ基板１０は、受光素子８が受光した発光素子７の発光光の強度及びそのばらつきから測定対象物中に含まれる発光素子７の発光光を散乱させる粒子量を算出し、算出された粒子量に基づき発光素子７と受光素子８間の測定対象物の濁度を算出する。   Specifically, the control IC substrate 10 calculates the amount of particles that scatter the emitted light of the light emitting element 7 included in the measurement object from the intensity of the emitted light of the light emitting element 7 received by the light receiving element 8 and the variation thereof. Then, the turbidity of the measurement object between the light emitting element 7 and the light receiving element 8 is calculated based on the calculated particle amount.

このように本発明の実施形態となる濁度センサ１では、発光素子７と受光素子８は対向する２つの基板領域２，３表面に対向配置されているので、発光素子７と受光素子８間の距離精度が高くなることにより、発光素子７と受光素子８を別基板に実装した場合と比較して、測定対象物の濁度を安定的に精度よく測定することができる。   As described above, in the turbidity sensor 1 according to the embodiment of the present invention, the light emitting element 7 and the light receiving element 8 are disposed opposite to the surfaces of the two opposing substrate regions 2 and 3. Therefore, the turbidity of the measurement object can be measured stably and accurately as compared with the case where the light emitting element 7 and the light receiving element 8 are mounted on different substrates.

以上、本発明者らによってなされた発明を適用した実施の形態について説明したが、本実施形態による本発明の開示の一部をなす論述及び図面により本発明は限定されることはない。すなわち、上記実施の形態に基づいて当業者等によりなされる他の実施の形態、実施例及び運用技術等は全て本発明の範疇に含まれることは勿論であることを付け加えておく。   As mentioned above, although embodiment which applied the invention made by the present inventors was described, this invention is not limited by the description and drawing which make a part of indication of this invention by this embodiment. That is, it should be added that other embodiments, examples, operation techniques, and the like made by those skilled in the art based on the above embodiments are all included in the scope of the present invention.

本発明の実施形態となる濁度センサの構成を示す斜視図である。It is a perspective view which shows the structure of the turbidity sensor used as embodiment of this invention. 図１に示す濁度センサの断面形状を示す模式図である。It is a schematic diagram which shows the cross-sectional shape of the turbidity sensor shown in FIG.

符号の説明Explanation of symbols

１：濁度センサ
２，３：基板領域
４，５，６：支持領域
７：発光素子
８：受光素子
９：透明樹脂
１０：制御用ＩＣ基板 1: Turbidity sensor 2, 3: Substrate area 4, 5, 6: Support area 7: Light emitting element 8: Light receiving element 9: Transparent resin 10: IC substrate for control

Claims (3)

対向する２つの基板領域と当該２つの基板領域を対向支持する支持領域とを備える立体回路基板と、
前記２つの基板領域表面に対向配置された発光素子及び受光素子と、
前記支持領域に設けられ、前記受光素子が受光した発光素子の発光光の強度に基づいて発光素子と受光素子間に介在する測定対象物の濁度を演算する回路部と
を備えることを特徴とする濁度センサ。 A three-dimensional circuit board comprising two opposing substrate regions and a support region for opposingly supporting the two substrate regions;
A light-emitting element and a light-receiving element disposed opposite to the two substrate region surfaces;
A circuit unit that is provided in the support region and calculates the turbidity of a measurement object interposed between the light emitting element and the light receiving element based on the intensity of light emitted from the light emitting element received by the light receiving element. Turbidity sensor. 請求項１に記載の濁度センサにおいて、前記発光素子及び前記受光素子はそれぞれ発光面及び受光面を露出させた状態で基板領域に埋設されていることを特徴とする濁度センサ。   2. The turbidity sensor according to claim 1, wherein the light emitting element and the light receiving element are embedded in a substrate region with a light emitting surface and a light receiving surface exposed, respectively. 請求項１又は請求項２に記載の濁度センサにおいて、前記発光素子及び前記受光素子は透明樹脂により封止されていることを特徴とする濁度センサ。   The turbidity sensor according to claim 1 or 2, wherein the light emitting element and the light receiving element are sealed with a transparent resin.
JP2006302822A 2006-11-08 2006-11-08 Turbidity sensor Withdrawn JP2008122086A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006302822A JP2008122086A (en) 2006-11-08 2006-11-08 Turbidity sensor

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Application Number Priority Date Filing Date Title
JP2006302822A JP2008122086A (en) 2006-11-08 2006-11-08 Turbidity sensor

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