JP2007281342A - Substrate processing apparatus and substrate processing method - Google Patents

Substrate processing apparatus and substrate processing method Download PDF

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JP2007281342A
JP2007281342A JP2006108597A JP2006108597A JP2007281342A JP 2007281342 A JP2007281342 A JP 2007281342A JP 2006108597 A JP2006108597 A JP 2006108597A JP 2006108597 A JP2006108597 A JP 2006108597A JP 2007281342 A JP2007281342 A JP 2007281342A
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substrate
processing
storage container
substrates
support
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JP4634333B2 (en
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Masatoshi Takahashi
正俊 高橋
Kazuo Hara
一雄 原
Hiroyuki Otsuka
寛之 大塚
Naoki Ishikawa
直揮 石川
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Shin Etsu Chemical Co Ltd
Shin Etsu Handotai Co Ltd
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Shin Etsu Chemical Co Ltd
Shin Etsu Handotai Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate processing apparatus and a substrate processing method capable of preventing substrates contained in a substrate container from being sucked each other in the case of lifting up the substrate container from a processing tank. <P>SOLUTION: In the substrate processing apparatus including: the substrate containers each having a plurality of support grooves at the inside of its opposed side parts and an opening at its bottom; the processing tank for storing its inside a processing liquid, wherein the substrate containers each supporting a plurality of substrates to the support grooves longitudinally in parallel are immersed into the processing liquid stored in the processing tank to process the substrates at the same time, the processing tank includes at its bottom one ore more support fixtures each upwards convex and whose lower ends of the substrates at the lower ends of the substrates, the opening at the bottom of each substrate container is inserted to the support fixture so that the substrates supported by each substrate container can be lifted up and supported at the same time. The technology above includes the substrate processing method using the substrate processing apparatus. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、基板処理装置及び基板処理方法に関し、特に、半導体基板やガラス基板等の薄板状の基板を処理液に浸漬して処理するための基板処理装置及び基板処理方法に関する。   The present invention relates to a substrate processing apparatus and a substrate processing method, and more particularly to a substrate processing apparatus and a substrate processing method for processing a thin plate substrate such as a semiconductor substrate or a glass substrate by immersing it in a processing solution.

半導体基板やガラス基板等の基板を用いて、半導体デバイスを製造する工程においては、通常、エッチングや洗浄、めっき、表面改質等の処理液に基板を浸漬して処理する表面処理工程が含まれている。このような工程においては、図6に示すように、複数枚の基板16をキャリアまたはカセットと呼ばれる基板収納容器14に同時に収納し、エッチング液や洗浄液、めっき浴や表面処理液等を保持した処理槽11に、基板収納容器14を基板ごと浸漬することが一般的である。
この基板収納容器14は、上記のような表面処理工程の前後の工程、例えば熱処理工程、印刷工程、膜堆積工程やフォトリソグラフィー工程等との基板の受け渡しにも兼用される。
The process of manufacturing a semiconductor device using a substrate such as a semiconductor substrate or a glass substrate usually includes a surface treatment step of immersing the substrate in a treatment solution such as etching, cleaning, plating, or surface modification. ing. In such a process, as shown in FIG. 6, a plurality of substrates 16 are simultaneously stored in a substrate storage container 14 called a carrier or a cassette, and an etching solution, a cleaning solution, a plating bath, a surface treatment solution, etc. are held. In general, the substrate storage container 14 is immersed in the tank 11 together with the substrate.
This substrate storage container 14 is also used for transferring the substrate to the steps before and after the surface treatment step as described above, for example, a heat treatment step, a printing step, a film deposition step, a photolithography step and the like.

基板収納容器14の側部の内側には、基板16を保持する保持溝15が通常、一定間隔で複数設けられており、図7に示すように、保持溝15の下部を側壁から連続して基板収納容器14の下部内側にせり出して支持部14aを形成するか、もしくは図6に示すように、基板下端部に当接するように支持棒23を基板収納容器14に設けること等により、複数枚の基板を略平行に配置させて処理するようになっている。また、基板収納容器14の下部には開口部14bを有し、基板を保持した収納容器を処理液中に浸漬する際に、処理液が容易に収納容器内に流入して、基板が均一に処理されるようにするとともに、導入管18から処理槽の底板17に開口した孔を通って処理槽に導入される処理液が基板に当たりやすいようになっている。   Inside the side portion of the substrate storage container 14, a plurality of holding grooves 15 for holding the substrate 16 are usually provided at regular intervals, and as shown in FIG. A plurality of sheets are formed by protruding the bottom inside of the substrate storage container 14 to form a support portion 14a, or by providing a support rod 23 on the substrate storage container 14 so as to contact the lower end of the substrate as shown in FIG. These substrates are arranged in parallel and processed. In addition, the lower portion of the substrate storage container 14 has an opening 14b, and when the storage container holding the substrate is immersed in the processing liquid, the processing liquid easily flows into the storage container so that the substrate becomes uniform. While being processed, the processing liquid introduced into the processing tank through the hole opened from the introduction pipe 18 to the bottom plate 17 of the processing tank is likely to hit the substrate.

ところが、上記のような基板収納容器を用いて薄型の基板を処理する場合、基板収納容器14を処理槽から引き上げる際に処理液の表面張力によって隣接する基板同士が吸着することがたびたびあった。また、このような問題は、保持溝15の間隔が狭い場合は、隣接する基板同士が接触しやすいため、特に顕著であった。   However, when processing a thin substrate using the substrate storage container as described above, when the substrate storage container 14 is pulled up from the processing tank, adjacent substrates are often adsorbed by the surface tension of the processing liquid. Further, such a problem is particularly remarkable when the interval between the holding grooves 15 is narrow because adjacent substrates are likely to contact each other.

このような吸着現象が生じると、吸着面に処理液が残留し好ましくない。特に吸着がある処理槽で発生した場合には、次の工程にも処理液に浸漬して行なう処理工程があれば、次の処理工程の処理槽内で基板収納容器14を揺動したり、細かい泡状にした気体を処理槽底部から導入したりすることなどによって基板を微妙に動かし、吸着した基板同士を再度引きはがすことができる。
しかし、最後の処理を行う処理槽から引き上げる際に上記のような吸着現象が生じると、もはや吸着した基板同士を引きはがすことはできず、基板間に残留する処理液を乾燥して除去する際に、乾燥むらが発生する不具合があった。
When such an adsorption phenomenon occurs, the treatment liquid remains on the adsorption surface, which is not preferable. In particular, when the adsorption occurs in a treatment tank, if there is a treatment step performed by immersing in the treatment liquid in the next step, the substrate storage container 14 is swung in the treatment vessel of the next treatment step, Substrates can be moved delicately by, for example, introducing a gas in the form of fine bubbles from the bottom of the processing tank, and the adsorbed substrates can be peeled off again.
However, when the above-mentioned adsorption phenomenon occurs when pulling up from the treatment tank for performing the last treatment, the adsorbed substrates can no longer be peeled apart, and the treatment liquid remaining between the substrates can be removed by drying. In addition, there was a problem that uneven drying occurred.

このような基板同士が吸着するという問題に対し、基板収納容器から洗浄装置に備えられた基板保持具に基板を移載して基板洗浄を行う洗浄装置については、保持具及び保持具に形成された保持溝の形状によって基板の揺れや傾きを防ぎ、基板同士の吸着を防ぐ方法が開示されている(特許文献1参照)。   With respect to such a problem that the substrates are attracted to each other, the cleaning device that performs substrate cleaning by transferring the substrate from the substrate storage container to the substrate holder provided in the cleaning device is formed on the holder and the holder. In addition, a method for preventing the substrate from shaking and tilting by the shape of the holding groove and preventing the substrates from adsorbing to each other is disclosed (see Patent Document 1).

しかしながら、このような方法によっても、基板を保持具に移載するために保持具の配置が制約されているため、基板同士の吸着を十分に防ぐことができない。また、洗浄装置に備えられた基板保持具に基板を移載するため洗浄工程で2回の移載が必要となり、その際に基板にダメージを与えてしまい基板が、時には割れることがあるという問題点があった。   However, even with such a method, the placement of the holders is restricted in order to transfer the substrates to the holders, so that adsorption between the substrates cannot be sufficiently prevented. In addition, in order to transfer the substrate to the substrate holder provided in the cleaning apparatus, it is necessary to transfer the substrate twice in the cleaning process, and the substrate may be damaged at that time, and the substrate sometimes breaks. There was a point.

特開平8−195431号公報JP-A-8-195431

本発明はこのような問題に鑑みてなされたもので、処理槽から基板収納容器を引き上げる際に、基板収納容器に収納された基板同士が吸着することを防止することができる基板処理装置及び基板処理方法を提供することを目的とする。   The present invention has been made in view of such problems, and a substrate processing apparatus and a substrate capable of preventing the substrates stored in the substrate storage container from being adsorbed when the substrate storage container is pulled up from the processing tank. An object is to provide a processing method.

本発明は、上記課題を解決するためになされたもので、少なくとも、対向する側部の内側に夫々複数の保持溝を有し、底部に開口部を有する基板収納容器と、内部に処理液を保持する処理槽とを具備し、前記保持溝に複数の基板を各々縦向きで並列に保持した基板収納容器を前記処理槽に保持された前記処理液に浸漬して前記複数の基板を同時に処理する基板処理装置であって、前記処理槽は、その底部に、上に凸形状であり、上端部で前記基板の下端部を支持する支持具を1つ以上具備するものであり、前記基板収納容器の底部の開口部を、前記支持具に挿入することによって、前記基板収納容器に保持された複数の基板を同時に持ち上げて保持して処理することができるものであることを特徴とする基板処理装置を提供する(請求項1)。   The present invention has been made to solve the above problems, and at least a substrate storage container having a plurality of holding grooves on the inner side of the opposing side portions and having an opening at the bottom, and a processing liquid inside. A substrate storage container that holds the plurality of substrates in the holding groove in parallel in the holding groove, and immerses the substrate in the processing solution held in the processing tank, thereby simultaneously processing the plurality of substrates. A substrate processing apparatus, wherein the processing tank has a convex shape at the bottom, and includes at least one support that supports the lower end of the substrate at the upper end, and the substrate storage A substrate process characterized by being able to simultaneously lift and hold a plurality of substrates held in the substrate storage container by inserting an opening at the bottom of the container into the support. An apparatus is provided (Claim 1).

このように構成された基板処理装置であれば、処理槽内に備えられた支持具によって、基板収納容器に収納された複数の基板を基板収納容器の保持溝内で上方へ動かし、保持溝に固定されている基板を一旦解放することができるため、基板を保持溝の間隔に再配置することができる。その結果、簡単な構造の基板処理装置であっても、複数の基板を収納した基板収納容器を処理槽に保持された処理液内から引き上げる際に隣り合った基板同士が吸着することを防止することができる基板処理装置とすることができる。   In the case of the substrate processing apparatus configured as described above, the plurality of substrates stored in the substrate storage container are moved upward in the holding grooves of the substrate storage container by the support provided in the processing tank, Since the fixed board | substrate can be once released, a board | substrate can be rearranged to the space | interval of a holding groove. As a result, even in a substrate processing apparatus having a simple structure, adjacent substrates are prevented from being adsorbed when a substrate storage container storing a plurality of substrates is pulled up from the processing liquid held in the processing tank. The substrate processing apparatus can be provided.

この場合、前記基板下端部を支持する支持具の上端部は棒状または線状であることが好ましい(請求項2)。   In this case, it is preferable that the upper end portion of the support that supports the lower end portion of the substrate is rod-shaped or linear.

このように、基板下端部を支持する支持具の上端部が棒状または線状であれば、基板の下部が支持具によって持ち上げられた際に、基板が支持具によって自由度を失うことがなく、より効果的に基板の再配置を行なうことができる。   Thus, if the upper end of the support that supports the lower end of the substrate is rod-shaped or linear, when the lower portion of the substrate is lifted by the support, the substrate does not lose flexibility by the support, The substrate can be rearranged more effectively.

また、前記支持具は、該支持具内部を通って処理液を噴出する孔を有するものであることが好ましい(請求項3)。   Moreover, it is preferable that the said support tool has a hole which ejects a process liquid through this support tool inside (Claim 3).

このように、支持具が支持具内部を通って処理液を噴出する孔を有するものであれば、支持具から処理液を噴出することができ、基板収納容器の保持溝に固定された基板の解放を促し、より効果的に基板同士の吸着を防ぐことができる。   Thus, if the support has a hole for ejecting the processing liquid through the inside of the support, the processing liquid can be ejected from the support, and the substrate fixed to the holding groove of the substrate storage container can be ejected. Release is promoted, and adsorption between the substrates can be prevented more effectively.

また、前記処理槽は、超音波振動子を具備するものであることが好ましい(請求項4)。
また、前記処理槽は、前記基板収納容器を揺動させる手段を具備するものであることが好ましい(請求項5)。
Moreover, it is preferable that the said processing tank comprises an ultrasonic transducer | vibrator (Claim 4).
Moreover, it is preferable that the said processing tank is equipped with the means to rock | fluctuate the said substrate storage container (Claim 5).

このように、処理槽が超音波振動子を具備するものであったり、基板収納容器を揺動させる手段を具備するものであれば、目的とする処理が効率よく行われるとともに、基板収納容器の保持溝に固定された基板の解放を促し、より効果的に基板同士の吸着を防ぐことができる。   As described above, if the processing tank includes an ultrasonic transducer or includes a means for swinging the substrate storage container, the target processing can be efficiently performed and the substrate storage container The release of the substrates fixed in the holding grooves can be promoted, and the adsorption between the substrates can be prevented more effectively.

また、本発明は、上記の基板処理装置を用いて基板の処理を行なう基板処理方法であって、前記基板収納容器の底部の開口部を、前記支持具に挿入することによって、前記基板収納容器に保持された複数の基板を前記基板収納容器の底部から同時に持ち上げて処理をした後に、前記基板収納容器を前記処理槽から引き上げることを特徴とする基板処理方法を提供する(請求項6)。   The present invention is also a substrate processing method for processing a substrate using the substrate processing apparatus described above, wherein an opening at the bottom of the substrate storage container is inserted into the support, thereby the substrate storage container. A substrate processing method is provided, wherein the plurality of substrates held in the substrate are simultaneously lifted from the bottom of the substrate storage container and processed, and then the substrate storage container is lifted from the processing tank.

このように、上記の基板処理装置を用いて、基板収納容器の底部の開口部を、支持具に挿入することによって、基板収納容器に保持された複数の基板を基板収納容器の底部から同時に持ち上げて処理をした後に、基板収納容器を処理槽から引き上げる基板処理方法であれば、処理槽内に備えられた支持具によって、基板収納容器に収納された複数の基板を基板収納容器の保持溝内で上方へ動かし、保持溝に固定されている基板を一旦解放することができるため、基板を保持溝の間隔に再配置することができる。その結果、複数の基板を収納した基板収納容器を処理槽に保持された処理液内から引き上げる際に隣り合った基板同士が吸着しにくくすることができる。   Thus, by using the substrate processing apparatus described above, the plurality of substrates held in the substrate storage container are simultaneously lifted from the bottom of the substrate storage container by inserting the opening at the bottom of the substrate storage container into the support. If the substrate processing method is to lift the substrate storage container from the processing tank after processing, a plurality of substrates stored in the substrate storage container are placed in the holding grooves of the substrate storage container by the support provided in the processing tank. Then, the substrate fixed to the holding groove can be once released, and thus the substrate can be rearranged at the interval of the holding groove. As a result, adjacent substrates can be made difficult to adsorb when the substrate storage container storing a plurality of substrates is pulled up from the processing liquid held in the processing tank.

本発明によれば、処理槽の底部に支持具を具備することによって、基板収納容器の保持溝に固定されている基板を一旦解放して、保持溝の間隔に再配置することにより、簡単な構造の基板処理装置で基板収納容器の引き上げ時に基板同士の吸着を防止することができる。   According to the present invention, by providing a support at the bottom of the processing tank, the substrate fixed in the holding groove of the substrate storage container is once released and rearranged at intervals of the holding groove, thereby simplifying the process. The substrate processing apparatus having the structure can prevent the substrates from being adsorbed when the substrate storage container is pulled up.

以下、本発明についてさらに詳細に説明するが、本発明はこれに限定されるものではない。
前述のように、薄型の基板を基板収納容器に収納し、処理槽に保持された処理液によって基板を処理する場合、基板収納容器を処理槽から引き上げる際に処理液の表面張力によって隣接する基板同士が吸着してしまうことがあるという問題があった。特に、このような吸着が最後の処理槽で発生すると、残留した処理液が乾燥して、基板にステインを発生させるという問題が生じる。
Hereinafter, the present invention will be described in more detail, but the present invention is not limited thereto.
As described above, when a thin substrate is stored in a substrate storage container and the substrate is processed with the processing liquid held in the processing tank, the substrate adjacent to the substrate by the surface tension of the processing liquid when the substrate storage container is pulled up from the processing tank. There was a problem that they might adsorb each other. In particular, when such adsorption occurs in the last processing tank, there arises a problem that the remaining processing liquid dries and stains are generated on the substrate.

そこで、本研究者らは、まず、基板収納容器内で隣接する基板同士が吸着する原因を詳細に検討した。
そして、基板収納容器の保持溝の内側は、通常、表面研磨などの処理はなされておらず、金型から成形したときに生じた表面粗さが存在することに着目した。このような表面粗さのため、基板収納容器に収納された基板は、収納時又は処理時に基板が保持溝に固定されることがあり、保持溝が一定間隔で設けられている場合であっても、隣接する基板同士の間隔は正確には一定でないか、互いに平行ではない状態で基板が基板収納容器内に固定されてしまうことがあることがわかった。特に、矩形等の円形以外の形状を有する基板においては、基板収納容器内で基板が自由に回転できないことから、基板が基板収納容器内に不均一に配置されやすいことがあることがわかった。
Therefore, first, the researchers examined in detail the cause of adsorbing adjacent substrates in the substrate storage container.
Then, attention has been paid to the fact that the inside of the holding groove of the substrate storage container is usually not subjected to processing such as surface polishing, and there is surface roughness generated when molding from a mold. Due to such surface roughness, the substrate stored in the substrate storage container may be fixed to the holding groove during storage or processing, and the holding grooves are provided at regular intervals. However, it has been found that the distance between adjacent substrates is not exactly constant or the substrates may be fixed in the substrate storage container in a state where they are not parallel to each other. In particular, in the case of a substrate having a shape other than a circle such as a rectangle, the substrate cannot be freely rotated in the substrate storage container, and thus it has been found that the substrate is likely to be unevenly disposed in the substrate storage container.

本発明者らは、上記のように、基板が基板収納容器内に不均一に配置されている場合、例えば、ある2枚の基板の間隔がそれらの外側の基板との間隔よりも狭い場合は、処理液から引き上げる際に2枚の基板間と外側で圧力差が生じるため、2枚の基板が互いに接近し吸着するものと考えた。そこで、基板の間隔が一定となるように、上記のような保持溝による基板の固定を解消し、基板を保持溝の間隔に再配置することが、基板同士の吸着を防止する一つの手段であることを見出し、本発明を完成させた。   As described above, when the substrates are non-uniformly arranged in the substrate storage container, for example, when the interval between two substrates is narrower than the interval between the substrates on the outside, Since the pressure difference is generated between the two substrates and the outside when the processing liquid is pulled up, it was considered that the two substrates approach each other and adsorb. Therefore, in order to prevent the adsorption of the substrates, the fixing of the substrate by the holding grooves as described above is canceled and the substrates are rearranged at the intervals of the holding grooves so that the intervals between the substrates are constant. As a result, the present invention was completed.

以下、添付の図面を参照して本発明をより具体的に説明するが、本発明はこれに限定されるものではない。
図1に本発明に係る基板処理装置の概略図を示す。また、図4Aに本発明に係る基板処理装置を並列した基板の主面方向から見た図を示す。
Hereinafter, the present invention will be described more specifically with reference to the accompanying drawings, but the present invention is not limited thereto.
FIG. 1 shows a schematic view of a substrate processing apparatus according to the present invention. FIG. 4A shows a view of the substrate processing apparatus according to the present invention as viewed from the principal surface direction of the substrates arranged in parallel.

図1および図4Aに示したように、本発明に係る基板処理装置の処理槽11はその底部に支持具12を具備している。この場合、導入管18を通って処理槽11に供給される処理液10を供給しやすくするように処理液10を通す孔等が形成されている底板17を設け、底板17上に支持具12を設けてもよい。この処理槽11は処理目的に応じてポリ塩化ビニル、アクリル樹脂、ポリカーボネートやフッ素樹脂などの有機樹脂、ステンレス鋼板等を材料とすることができ、上部は基板収納容器14を浸漬できるように開放されており、基板16が処理液10に完全に浸漬される深さで作製されている。また、本発明にかかる基板処理装置の基板収納容器14は、対向する側部の内側に基板16を保持する複数の保持溝15を具備しており、その保持溝15の下には基板16を下方から支持する支持部14aが形成されていてもよい。また、基板収納容器14の底部には開口部14bが形成されており、処理液10が流入できるようになっている。   As shown in FIGS. 1 and 4A, the processing tank 11 of the substrate processing apparatus according to the present invention includes a support 12 at the bottom thereof. In this case, a bottom plate 17 in which a hole or the like for passing the processing liquid 10 is provided so as to facilitate the supply of the processing liquid 10 supplied to the processing tank 11 through the introduction pipe 18 is provided, and the support 12 is provided on the bottom plate 17. May be provided. This processing tank 11 can be made of polyvinyl chloride, acrylic resin, organic resin such as polycarbonate or fluororesin, stainless steel plate, etc. depending on the purpose of processing, and the upper part is opened so that the substrate storage container 14 can be immersed. The substrate 16 is fabricated to a depth that allows the substrate 16 to be completely immersed in the processing liquid 10. Further, the substrate storage container 14 of the substrate processing apparatus according to the present invention includes a plurality of holding grooves 15 that hold the substrate 16 inside the opposing side portions, and the substrate 16 is placed under the holding grooves 15. The support part 14a supported from the lower part may be formed. An opening 14b is formed at the bottom of the substrate storage container 14 so that the processing liquid 10 can flow in.

そして、図4Bに示したように、この支持具12に基板収納容器14の開口部14bが挿入されることによって基板収納容器14に収納された複数の基板16が一定の高さ(H)で上方へ同時に持ち上げられて保持され、基板収納容器14の支持部14aから離れ、保持溝15から一旦解放される構成となっている。   As shown in FIG. 4B, by inserting the opening 14b of the substrate storage container 14 into the support 12, the plurality of substrates 16 stored in the substrate storage container 14 have a certain height (H). It is configured to be simultaneously lifted and held upward, separated from the support portion 14 a of the substrate storage container 14, and once released from the holding groove 15.

また、処理槽11は、ヒーター(不図示)や温度計(不図示)などを備えていてもよい。
基板の処理に用いられる処理液10は、所望の処理を行なうのに適した液体を適宜選択することができ、例えば、半導体ウエーハなどの洗浄装置であれば、最終段の処理槽の処理液はそれまでの処理液を洗い落とすために純水が用いられることが多く、有機物の除去を目的とする基板洗浄装置であれば、代表的にはアルコール系の有機溶剤などが処理液として使用されることもある。
Moreover, the processing tank 11 may be provided with a heater (not shown), a thermometer (not shown), or the like.
As the processing liquid 10 used for processing the substrate, a liquid suitable for performing a desired processing can be appropriately selected. For example, in the case of a cleaning device such as a semiconductor wafer, the processing liquid in the final processing tank is Pure water is often used to wash off the previous processing solution, and alcohol-based organic solvents are typically used as the processing solution for substrate cleaning devices intended to remove organic substances. There is also.

基板16の形状は、円形、正方形、矩形など、目的に応じ種々の形状が採用される。例えば、半導体ウエーハなどであれば円形、太陽電池やマスク基板などであれば正方形や矩形であるのが一般的である。基板収納容器14は基板形状に適合する形状に作製されればよい。   As the shape of the substrate 16, various shapes such as a circle, a square, and a rectangle are adopted depending on the purpose. For example, a semiconductor wafer or the like is generally a circle, and a solar cell or a mask substrate is generally a square or a rectangle. The substrate storage container 14 may be manufactured in a shape that matches the shape of the substrate.

本発明の本質的な要素を構成する支持具12の形状は、基板収納容器14に収納された基板16を、一定の高さ(H)で保持することができればどのようなものでもよく、図1に示されている形状のほか、例えば支持具12の上端の断面が半円形、矩形、円形であるものでもよく、これらを総称して棒状と表現する。また、図3に示すような線状の材料19の両端を処理槽11の底部に所定の高さで固定したものなどでもよい。   The shape of the support 12 constituting the essential element of the present invention may be any shape as long as the substrate 16 stored in the substrate storage container 14 can be held at a certain height (H). In addition to the shape shown in FIG. 1, for example, the upper end of the support 12 may be semicircular, rectangular, or circular in cross section, and these are generically expressed as a bar shape. Moreover, what fixed both ends of the linear material 19 as shown in FIG. 3 to the bottom part of the processing tank 11 by predetermined | prescribed height may be sufficient.

支持具12によって保持される基板16が保持される高さ(H)については、基板16を保持溝15の下端から持ち上げて解放するのに必要な移動量が確保されればよく、基板16の直径または長辺1に対してHが0.05以上あれば好ましい。但し、持ち上げられた基板16は基板収納容器14の側部に設けられた保持溝15によっても支持される必要があるため、Hは基板収納容器14と基板16の形状によって決まる所定の値以下である必要がある。図1に示したように、保持溝15を基板保持容器3の側壁と平行な平面に射影した長さをLとすると、H<Lの関係を満たす必要があり、隣接する基板の接触を回避するためには基板16の直径または長辺1に対してH<0.25×Lであれば、保持溝15によって基板16が十分に保持されるので、好ましい。   With respect to the height (H) at which the substrate 16 held by the support 12 is held, it is sufficient that the amount of movement necessary to lift and release the substrate 16 from the lower end of the holding groove 15 is secured. It is preferable that H is 0.05 or more with respect to the diameter or long side 1. However, since the lifted substrate 16 needs to be supported also by the holding groove 15 provided in the side portion of the substrate storage container 14, H is not more than a predetermined value determined by the shapes of the substrate storage container 14 and the substrate 16. There must be. As shown in FIG. 1, when the length obtained by projecting the holding groove 15 onto a plane parallel to the side wall of the substrate holding container 3 is L, it is necessary to satisfy the relationship of H <L and avoid contact between adjacent substrates. In order to do this, it is preferable that H <0.25 × L with respect to the diameter or long side 1 of the substrate 16 because the substrate 16 is sufficiently held by the holding grooves 15.

また、本発明における支持具には、各々の基板の位置を固定するための支持溝などの表面構造がなく、支持具の基板と当接する部分が、点接触、あるいは基板の厚さ方向に線接触であることが好ましい。
ここで、「点接触、あるいは基板の厚さ方向に線接触」との意味であるが、厳密には、現実に発明を実施する場合は接触箇所がある程度の面積を有する面接触となるため、本発明の支持具においては、基板の配列方向に対していくらかの幅を有していてもよい。具体的には、基板16の直径または長辺1に対して、当接する部分の幅は0.1以下であれば、十分に基板16が支持具12から自由であるので好ましい。
また、特に、割れやすい薄型基板を洗浄する等の場合、処理液に耐性のある緩衝材料が支持具12の、基板16に当接する部分に取り付けてあってもよい。
Further, the support in the present invention does not have a surface structure such as a support groove for fixing the position of each substrate, and the portion of the support that contacts the substrate is point-contacted or linear in the thickness direction of the substrate. Contact is preferred.
Here, it means `` point contact, or line contact in the thickness direction of the substrate '', but strictly speaking, when actually carrying out the invention, the contact location is a surface contact having a certain area, The support of the present invention may have some width with respect to the arrangement direction of the substrates. Specifically, it is preferable that the width of the abutting portion with respect to the diameter or long side 1 of the substrate 16 is 0.1 or less because the substrate 16 is sufficiently free from the support 12.
In particular, in the case of cleaning a thin substrate that is easily broken, a buffer material that is resistant to the processing liquid may be attached to a portion of the support 12 that contacts the substrate 16.

尚、支持具の表面の形状としては、基板収納容器の保持溝15の間隔と対応しない微少な凹凸、例えば支持具の加工時に伴う支持具表面の荒さや、加工精度による支持具の湾曲などがあっても本発明の実施に支障はない。
支持具12の上端部の稜線は処理槽11の底面と平行、すなわち直線になっているのが通常の形態であるが、例えば図5に示すように支持具12の上端部の稜線30が底面に対して一方向に傾斜していたり(図5(a))、支持具12の中央に向かって両端から傾斜していてもよい(図5(b))。または、図5(c)に示すように周期的に高低のある凹凸形状を有していてもよい。この場合、支持具12の凹凸形状の周期は基板16が支持具12の凹凸に嵌込まれて固定されないように、基板間隔よりも広い必要がある。なお、図5の各図には、処理槽11の底面の基準線31を示してある。
The shape of the surface of the support tool includes minute irregularities that do not correspond to the interval between the holding grooves 15 of the substrate storage container, for example, the roughness of the surface of the support tool when processing the support tool, and the curvature of the support tool due to processing accuracy. Even if there is, there is no problem in the implementation of the present invention.
The ridgeline at the upper end of the support tool 12 is generally parallel to the bottom surface of the treatment tank 11, that is, is a straight line. For example, as shown in FIG. May be inclined in one direction (FIG. 5A), or may be inclined from both ends toward the center of the support 12 (FIG. 5B). Or you may have an uneven | corrugated shape with height periodically as shown in FIG.5 (c). In this case, the period of the concavo-convex shape of the support 12 needs to be wider than the distance between the substrates so that the substrate 16 is not fitted and fixed to the concavo-convex of the support 12. In addition, in each figure of FIG. 5, the reference line 31 of the bottom face of the processing tank 11 is shown.

このような形状を有する支持具12を使用すると、隣接する基板同士の支持高さが異なることにより、基板収納容器14の側壁のうち、基板の整列方向の側面から見たときに、基板同士が重なり合う面積が減少する。先にも記したように、基板収納容器14を垂直方向に引き上げる過程で基板が吸着することから、静置時に隣接する基板同士の重なり合う面積を減らしておくことにより、引き上げ動作初期の基板同士の吸着する機会を減らすことができる。   When the support tool 12 having such a shape is used, when the support heights of adjacent substrates are different, the substrates are not aligned when viewed from the side surface of the substrate storage container 14 in the alignment direction of the substrates. The overlapping area is reduced. As described above, since the substrate is adsorbed in the process of pulling up the substrate storage container 14 in the vertical direction, by reducing the overlapping area between the adjacent substrates at the time of standing, The opportunity to adsorb can be reduced.

隣接する基板同士の支持高さの違いは、基板16の直径または長辺1に対して、0.01以上が好ましく、さらに好ましくは0.02以上である。このような基板同士の支持高さの違いがあれば、十分に基板同士の吸着機会を減少させることができる。
また、洗浄等の処理の効果が損なわれないように、処理槽の液面から基板が露出しないことが好ましい。
支持具12の材質は、処理液に耐性のあるものであれば、処理槽11に使用されるものと同じ材質であっても、違う材質であってもよく、先に挙げたポリ塩化ビニル、アクリル樹脂、ポリカーボネートやフッ素樹脂、ステンレス鋼板などを加工したものが例として挙げられる。また、図3に示す線状の支持具19であれば、ステンレスワイヤーにフッ素樹脂等を被覆したものが例として挙げられる。
The difference in support height between adjacent substrates is preferably 0.01 or more, more preferably 0.02 or more, with respect to the diameter or long side 1 of the substrate 16. If there is such a difference in the support height between the substrates, the adsorption opportunities between the substrates can be sufficiently reduced.
Moreover, it is preferable that a board | substrate is not exposed from the liquid level of a processing tank so that the effect of processes, such as washing | cleaning, may not be impaired.
As long as the material of the support 12 is resistant to the treatment liquid, it may be the same material as that used in the treatment tank 11 or a different material. Examples of the processed material include acrylic resin, polycarbonate, fluororesin, and stainless steel plate. Further, in the case of the linear support tool 19 shown in FIG. 3, a stainless steel wire coated with a fluororesin or the like can be cited as an example.

支持具12の取り付け位置は、基板16の重心から垂直方向に下ろした延長線上で基板16を支持することができるように取り付けてあればよい。角基板の場合は支持位置が大きくずれると、支持具12で基板16を支持している状態において基板16が保持溝15に対して平行にならず、基板収納容器14の引き上げ時に基板16が保持溝15に再度強く固定されやすくなるため、取り付け位置に十分配慮する必要がある。   The attachment position of the support tool 12 should just be attached so that the board | substrate 16 can be supported on the extension line dropped in the perpendicular direction from the gravity center of the board | substrate 16. As shown in FIG. In the case of a square substrate, when the support position is greatly shifted, the substrate 16 is not parallel to the holding groove 15 in a state where the substrate 16 is supported by the support tool 12, and the substrate 16 is held when the substrate storage container 14 is pulled up. Since it becomes easy to be strongly fixed to the groove 15 again, it is necessary to give sufficient consideration to the mounting position.

また、支持具12は複数が略平行に備え付けられていてもよく、形状の異なるものが複数取り付けられていてもよい。この場合も、複数の支持具12が基板16を支持する位置の重心が基板の重心よりも大きくずれると、やはり基板収納容器14の引き上げ時に基板16が保持溝15に再度強く固定されやすくなるため、取り付け位置に十分配慮する必要がある。   Further, a plurality of support tools 12 may be provided substantially in parallel, or a plurality of support tools 12 having different shapes may be attached. In this case as well, if the center of gravity of the position where the plurality of supporters 12 support the substrate 16 is greatly deviated from the center of gravity of the substrate, the substrate 16 is likely to be strongly fixed again to the holding groove 15 when the substrate storage container 14 is pulled up. It is necessary to pay careful attention to the mounting position.

また、図2に示すように、支持具12の内部が空洞であり、該支持具12の表面には孔13が複数形成されており、処理液を内部に導入することによって、支持具12の表面から処理液が噴出するような構造であってもよい。これにより、処理槽11に浸漬した時点で吸着していた基板16を、噴出した処理液が与える外力によって振動させ、吸着した基板同士を引き剥がして再配置を促すことができる。   Further, as shown in FIG. 2, the inside of the support tool 12 is hollow, and a plurality of holes 13 are formed on the surface of the support tool 12, and by introducing the treatment liquid into the interior of the support tool 12, The structure may be such that the treatment liquid is ejected from the surface. Thereby, the substrate 16 that has been adsorbed when immersed in the treatment tank 11 can be vibrated by the external force applied by the ejected treatment liquid, and the adsorbed substrates can be peeled off to facilitate rearrangement.

これと同じ効果を期待するものとして、図4A、図4Bに示したように、処理槽11に超音波振動子21を取り付け、基板処理装置内もしくは装置外に設置した超音波発振機(図示せず)と接続し、処理槽11内に超音波を伝搬させ、処理液10を介して処理槽11内に浸漬した基板16の再配置を促進してもよい。   As shown in FIGS. 4A and 4B, an ultrasonic oscillator (not shown) is installed in the processing tank 11 and installed in or outside the substrate processing apparatus, as expected for the same effect. And the ultrasonic wave may be propagated in the processing tank 11 to promote the rearrangement of the substrate 16 immersed in the processing tank 11 through the processing liquid 10.

また、基板処理装置の基板収納容器14の搬送手段、あるいは処理槽11の内部に、基板収納容器14を揺動する手段22を有していてもよい。
例えば搬送手段であれば、基板収納容器14を処理槽11に移送した後、基板収納容器14を把持したまま上下動するなどして、基板16を支持具12に複数回離合させることで、保持溝15に固定されている基板16を保持溝15から効果的に解放することができる。
また、処理槽11の内部に基板収納容器14を揺動する手段、例えば基板収納容器14の下部を支持するアームなどを有する場合は、アームを上下あるいはスイングして揺動を繰り返すことにより、同様の効果を得ることができる。
In addition, the substrate storage container 14 of the substrate processing apparatus may be provided with a means for moving the substrate storage container 14 or inside the processing tank 11.
For example, in the case of a transport means, after the substrate storage container 14 is transferred to the processing tank 11, the substrate 16 is moved up and down while holding the substrate storage container 14, so that the substrate 16 is separated from the support tool 12 multiple times. The substrate 16 fixed to the groove 15 can be effectively released from the holding groove 15.
Further, when the processing tank 11 has a means for swinging the substrate storage container 14, for example, an arm for supporting the lower part of the substrate storage container 14, the arm is moved up and down or swinged repeatedly to repeat the same. The effect of can be obtained.

以下、本発明の実施例及び比較例を示して本発明をより具体的に説明するが、本発明はこれらに限定されるものではない。
(実施例)
図1に示すような、支持具12を具備した処理槽11及び基板収納容器14を用いて、太陽電池基板50枚を同時に純水で洗浄した。この操作を10回繰り返した。この場合、支持具での持ち上げ高さは20mmであった。太陽電池基板は、縦×横が15cm×15cm、厚さが200μmのものを用いた。基板収納容器14は、保持溝15の幅は2mm、保持溝間の距離は4mmのものを用いた。
EXAMPLES Hereinafter, the present invention will be described more specifically with reference to examples and comparative examples of the present invention, but the present invention is not limited to these.
(Example)
As shown in FIG. 1, 50 solar cell substrates were simultaneously washed with pure water using the processing tank 11 and the substrate storage container 14 provided with the support 12. This operation was repeated 10 times. In this case, the lifting height with the support was 20 mm. A solar cell substrate having a length × width of 15 cm × 15 cm and a thickness of 200 μm was used. As the substrate storage container 14, a holding groove 15 having a width of 2 mm and a distance between the holding grooves of 4 mm was used.

その結果、隣接する太陽電池基板が吸着した箇所は1箇所もなく、洗浄後にステインは一切検出されず、明らかに本発明の効果が得られた。   As a result, there was no place where the adjacent solar cell substrate was adsorbed, and no stain was detected after washing, and the effects of the present invention were clearly obtained.

(比較例)
図6に示すような、支持棒23を底部に具備した基板収納容器14、及び、支持具12を具備しない処理槽11を用いて、実施例と同様の条件で太陽電池基板50枚の洗浄を10回行なった。
(Comparative example)
As shown in FIG. 6, using the substrate storage container 14 having the support rod 23 at the bottom and the processing tank 11 not having the support 12, 50 solar cell substrates are cleaned under the same conditions as in the example. 10 times.

その結果、1回の洗浄につき平均3箇所の太陽電池基板の吸着があった。   As a result, there was an average of 3 solar cell substrate adsorptions per wash.

なお、本発明は、上記実施形態に限定されるものではない。上記実施形態は例示であり、本発明の特許請求の範囲に記載された技術的思想と実質的に同一な構成を有し、同様な作用効果を奏するものは、いかなるものであっても本発明の技術的範囲に包含される。   The present invention is not limited to the above embodiment. The above-described embodiment is an exemplification, and the present invention has any configuration that has substantially the same configuration as the technical idea described in the claims of the present invention and that exhibits the same effects. Are included in the technical scope.

例えば、上記実施形態においては、処理液に浸漬することによる一連の基板処理工程の中で最後の工程となる洗浄工程について主に述べたが、本発明は、後にさらに処理液による基板処理工程が続く場合であっても適用できることは言うまでもない。この場合は、次工程に前工程の処理液をできるだけ持ち込まないという利点を有する。   For example, in the above-described embodiment, the cleaning process which is the last step in a series of substrate processing steps by immersing in a processing solution has been mainly described. However, the present invention further includes a substrate processing step using a processing solution later. Needless to say, this is applicable even in the following case. In this case, there is an advantage that the processing liquid of the previous process is not brought into the next process as much as possible.

本発明に係る基板処理装置の一例を示す概略図である。It is the schematic which shows an example of the substrate processing apparatus which concerns on this invention. 本発明に係る支持具の例を示す概略図である。It is the schematic which shows the example of the support tool which concerns on this invention. 本発明に係る支持具の別の例を示す概略図である。It is the schematic which shows another example of the support tool which concerns on this invention. 本発明に係る基板処理装置の一例を並列した基板の主面方向から見た概略図であり、基板収納容器の開口部を支持具に挿入していない状態を示す図である。It is the schematic which looked at the example of the substrate processing apparatus which concerns on this invention from the main surface direction of the board | substrate in parallel, and is a figure which shows the state which has not inserted the opening part of the substrate storage container into the support tool. 本発明に係る基板処理装置の一例を並列した基板の主面方向から見た概略図であり、基板収納容器の開口部を支持具に挿入している状態を示す図である。It is the schematic which looked at the example of the substrate processing apparatus which concerns on this invention from the main surface direction of the board | substrate in parallel, and is a figure which shows the state which has inserted the opening part of the substrate storage container into the support tool. 本発明に係る支持具の形状の例を示す概略図である。It is the schematic which shows the example of the shape of the support tool which concerns on this invention. 従来の基板処理装置の一例を示す概略図である。It is the schematic which shows an example of the conventional substrate processing apparatus. 基板処理容器の一例を基板の主面方向から見た概略図である。It is the schematic which looked at an example of the substrate processing container from the principal surface direction of the substrate.

符号の説明Explanation of symbols

10…処理液、 11…処理槽、 12…支持具、 13…噴出孔、
14…基板収納容器、 14a…支持部、 14b…開口部、 15…保持溝、
16…基板、 17…底板、 18…導入管、 19…線状の支持具、
21…超音波振動子、 22…揺動手段、
23…支持棒、
30…稜線、 31…底面の基準線、
L…保持溝の高さ、 H…支持具によって基板が保持される高さ。
DESCRIPTION OF SYMBOLS 10 ... Processing liquid, 11 ... Processing tank, 12 ... Support tool, 13 ... Ejection hole,
14 ... Substrate storage container, 14a ... Supporting part, 14b ... Opening part, 15 ... Holding groove,
16 ... Substrate, 17 ... Bottom plate, 18 ... Introduction pipe, 19 ... Linear support,
21 ... Ultrasonic vibrator, 22 ... Swing means,
23 ... support rod,
30 ... Ridge line, 31 ... Base line on the bottom,
L: height of the holding groove, H: height at which the substrate is held by the support.

Claims (6)

少なくとも、対向する側部の内側に夫々複数の保持溝を有し、底部に開口部を有する基板収納容器と、内部に処理液を保持する処理槽とを具備し、前記保持溝に複数の基板を各々縦向きで並列に保持した基板収納容器を前記処理槽に保持された前記処理液に浸漬して前記複数の基板を同時に処理する基板処理装置であって、前記処理槽は、その底部に、上に凸形状であり、上端部で前記基板の下端部を支持する支持具を1つ以上具備するものであり、前記基板収納容器の底部の開口部を、前記支持具に挿入することによって、前記基板収納容器に保持された複数の基板を同時に持ち上げて保持して処理することができるものであることを特徴とする基板処理装置。   At least a substrate storage container having a plurality of holding grooves on the inner side of the opposing side portions and having an opening at the bottom, and a processing tank for holding a processing solution therein, and a plurality of substrates in the holding grooves. Is a substrate processing apparatus for simultaneously processing the plurality of substrates by immersing the substrate storage containers, each of which is held in parallel in the vertical direction, in the processing liquid held in the processing tank, the processing tank at the bottom thereof , Having one or more supports that are convex upward and support the lower end of the substrate at the upper end, and by inserting the opening at the bottom of the substrate storage container into the support A substrate processing apparatus capable of simultaneously lifting and processing a plurality of substrates held in the substrate storage container. 前記基板下端部を支持する支持具の上端部は棒状または線状であることを特徴とする請求項1に記載の基板処理装置。   The substrate processing apparatus according to claim 1, wherein an upper end portion of a support that supports the lower end portion of the substrate is rod-shaped or linear. 前記支持具は、該支持具内部を通って処理液を噴出する孔を有するものであることを特徴とする請求項1または請求項2に記載の基板処理装置。   The substrate processing apparatus according to claim 1, wherein the support has a hole through which the processing liquid is ejected through the support. 前記処理槽は、超音波振動子を具備するものであることを特徴とする請求項1ないし請求項3のいずれか一項に記載の基板処理装置。   The substrate processing apparatus according to any one of claims 1 to 3, wherein the processing tank includes an ultrasonic vibrator. 前記処理槽は、前記基板収納容器を揺動させる手段を具備するものであることを特徴とする請求項1ないし請求項4のいずれか一項に記載の基板処理装置。   5. The substrate processing apparatus according to claim 1, wherein the processing tank includes means for swinging the substrate storage container. 6. 請求項1ないし請求項5のいずれか一項に記載の基板処理装置を用いて基板の処理を行なう基板処理方法であって、前記基板収納容器の底部の開口部を、前記支持具に挿入することによって、前記基板収納容器に保持された複数の基板を前記基板収納容器の底部から同時に持ち上げて処理をした後に、前記基板収納容器を前記処理槽から引き上げることを特徴とする基板処理方法。   6. A substrate processing method for processing a substrate using the substrate processing apparatus according to claim 1, wherein an opening at a bottom portion of the substrate storage container is inserted into the support. Thus, after the plurality of substrates held in the substrate storage container are simultaneously lifted and processed from the bottom of the substrate storage container, the substrate storage container is lifted from the processing tank.
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JP2009141035A (en) * 2007-12-05 2009-06-25 Casio Comput Co Ltd Resist-exfoliating method and its device
KR200457216Y1 (en) 2009-12-24 2011-12-08 주식회사 케이씨텍 Wafer processing apparatus
JP2013155057A (en) * 2012-01-26 2013-08-15 Sanwa Frost Industry Co Ltd Method for etching lcd glass substrate and apparatus therefor
JP2015035502A (en) * 2013-08-09 2015-02-19 三洋電機株式会社 Method for etching silicon substrate
CN106001037A (en) * 2016-07-20 2016-10-12 张小云 Glass machining cleaning frame
CN111570391A (en) * 2020-05-20 2020-08-25 嘉兴学院 Machine part belt cleaning device
CN111921945A (en) * 2020-07-14 2020-11-13 海盐得胜化工设备有限公司 Cleaning process for polycrystalline silicon structured packing
CN113896427A (en) * 2021-09-30 2022-01-07 浙江同芯祺科技有限公司 Pendulum type substrate etching device and etching process
CN113896427B (en) * 2021-09-30 2023-11-21 浙江同芯祺科技有限公司 Pendulum type substrate etching device and etching process

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