JP2007251202A - Manufacturing method of semiconductor device - Google Patents

Manufacturing method of semiconductor device Download PDF

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Publication number
JP2007251202A
JP2007251202A JP2007137316A JP2007137316A JP2007251202A JP 2007251202 A JP2007251202 A JP 2007251202A JP 2007137316 A JP2007137316 A JP 2007137316A JP 2007137316 A JP2007137316 A JP 2007137316A JP 2007251202 A JP2007251202 A JP 2007251202A
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Japan
Prior art keywords
semiconductor chip
lead
semiconductor
leads
semiconductor device
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JP2007137316A
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Japanese (ja)
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JP4750076B2 (en
Inventor
Tamaki Wada
環 和田
Masachika Masuda
正親 増田
Takuji Ide
琢二 井手
Shunichiro Fujioka
俊一郎 藤岡
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Renesas Technology Corp
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Renesas Technology Corp
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Priority to JP2007137316A priority Critical patent/JP4750076B2/en
Publication of JP2007251202A publication Critical patent/JP2007251202A/en
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Publication of JP4750076B2 publication Critical patent/JP4750076B2/en
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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To thin a semiconductor device for sealing two laminated semiconductor chips with one resin sealing body, and to improve working efficiency in an assembly process. <P>SOLUTION: In a manufacturing method of a semiconductor device, two chips of first and second semiconductor chips in which a plurality of pads are arranged along the first side of the main surface of a semiconductor substrate are prepared, surfaces (backs) at a side opposite to main surfaces in the first and second chips are allowed to oppose each other so that the first side of the first chip is opposite to the first side of the second chip, and the first and second chips are adhered and fixed in a laminated state while the positions are shifted in a direction orthogonally crossing the arrangement direction of an electrode. A support lead is adhered and fixed onto the main surface of the first chip of the laminate of the adhered and fixed first and second chips. Each pad of the first chip is electrically connected to the inner part of the lead having the surface side identification signal of the lead frame via a conductive wire. Each pad of the second chip is electrically connected to the inner section of the lead having the back side identification signal of the lead frame via a conductive wire. The first and second chips, and the inner sections of the wire and the lead are sealed by resin. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、半導体装置及びその製造方法に関し、特に、二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する半導体装置の製造方法に適用して有効な技術に関するものである。   The present invention relates to a semiconductor device and a method of manufacturing the same, and more particularly, a technique effective when applied to a method of manufacturing a semiconductor device in which two semiconductor chips are stacked and the two semiconductor chips are sealed with a single resin sealing body. It is about.

記憶回路システムの大容量化を図る目的として、記憶回路システムが構成された二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する積層型半導体装置が提案されている。例えば、特開平７−５８２８１号公報にはＬＯＣ（Ｌead Ｏn Ｃhip）構造の積層型半導体装置が開示されている。また、特開平４−３０２１６５号公報にはタブ構造の積層型半導体装置が開示されている。   For the purpose of increasing the capacity of a memory circuit system, a stacked semiconductor device is proposed in which two semiconductor chips configured with a memory circuit system are stacked and the two semiconductor chips are sealed with a single resin sealing body. ing. For example, Japanese Unexamined Patent Publication No. 7-58281 discloses a stacked semiconductor device having a LOC (Lead On Chip) structure. Japanese Laid-Open Patent Publication No. 4-302165 discloses a stacked semiconductor device having a tab structure.

ＬＯＣ構造の積層型半導体装置は、表裏面のうちの表面である回路形成面に複数の外部電極（パッド）が形成された第１半導体チップ及び第２半導体チップと、第１半導体チップの回路形成面に絶縁性フィルムを介在して接着固定されると共に、その回路形成面の外部電極（以下、単に電極と称す）に導電性のワイヤを介して電気的に接続される複数の第１リードと、第２半導体チップの回路形成面（以下、単に主面と称する）に絶縁性フィルムを介在して接着固定されると共に、その主面の電極に導電性のワイヤを介して電気的に接続される複数の第２リードと、第１半導体チップ、第２半導体チップ、第１リードのインナー部、第２リードのインナー部及びワイヤ等を封止する樹脂封止体とを有する構成になっている。第１半導体チップ、第２半導体チップの夫々は、夫々の主面を互いに対向させた状態で積層されている。第１リード、第２リードの夫々は、夫々の接続部を互いに重ね合わせた状態で接合されている。   The stacked semiconductor device having the LOC structure includes a first semiconductor chip and a second semiconductor chip in which a plurality of external electrodes (pads) are formed on a circuit forming surface that is a front surface and a back surface, and circuit formation of the first semiconductor chip. A plurality of first leads that are bonded and fixed to each other with an insulating film interposed therebetween and electrically connected to external electrodes (hereinafter simply referred to as electrodes) on the circuit forming surface via conductive wires; The second semiconductor chip is bonded and fixed to a circuit forming surface (hereinafter simply referred to as a main surface) with an insulating film, and is electrically connected to an electrode on the main surface via a conductive wire. A plurality of second leads, and a first semiconductor chip, a second semiconductor chip, an inner portion of the first lead, an inner portion of the second lead, a resin sealing body for sealing the wire, and the like. . Each of the first semiconductor chip and the second semiconductor chip is stacked with their main surfaces facing each other. Each of the first lead and the second lead is joined in a state where the respective connecting portions are overlapped with each other.

タブ構造の積層型半導体装置は、タブ（ダイパッドとも言う）の表裏面のうちの表面に接着層を介して固定される第１半導体チップと、タブの裏面に接着層を介して固定される第２半導体チップと、第１半導体チップ、第２半導体チップのうち何れか一方の半導体チップの電極に導電性のワイヤを介して電気的に接続される複数の専用リードと、第１半導体チップ、第２半導体チップの夫々の電極に導電性のワイヤを介して電気的に接続される複数の共通リードと、第１半導体チップ、第２半導体チップ、専用リードのインナー部、共通リードのインナー部及びワイヤ等を封止する樹脂封止体とを有する構成になっている。第１半導体チップ、第２半導体チップの夫々の電極は、主面において互いに対向する二つの長辺側に夫々の長辺に沿って形成されている。専用リード、共用リードの夫々は、半導体チップの二つの長辺の夫々の外側に配置されている。   The stacked semiconductor device having a tab structure includes a first semiconductor chip fixed to the front surface of the tab (also referred to as a die pad) via an adhesive layer, and a first semiconductor chip fixed to the back surface of the tab via an adhesive layer. A plurality of dedicated leads electrically connected to the electrodes of one of the two semiconductor chips, the first semiconductor chip, and the second semiconductor chip via conductive wires, the first semiconductor chip, A plurality of common leads electrically connected to respective electrodes of the two semiconductor chips via conductive wires, a first semiconductor chip, a second semiconductor chip, an inner part of a dedicated lead, an inner part of the common lead and a wire; It has the structure which has the resin sealing body which seals etc. Each electrode of the first semiconductor chip and the second semiconductor chip is formed along two long sides on the two long sides facing each other on the main surface. Each of the dedicated lead and the shared lead is disposed outside each of the two long sides of the semiconductor chip.

特開平７−５８２８１号公報JP-A-7-58281 特開平４−３０２１６５号公報JP-A-4-302165

本発明者等は、積層型半導体装置の開発に先立ち、以下の問題点に直面した。
ＬＯＣ構造では二枚のリードフレームを用いて製造するため、製造コストが高くなる。一方、タブ構造では一枚のリードフレームで製造することができるが、ミラー反転回路パターンの半導体チップを用いる必要があるため、タブ構造においても製造コストが高くなる。タブ構造では、タブの表裏面に夫々の裏面が向い合うようにして二つの半導体チップを搭載するため、主面の互いに対向する二つの長辺の夫々の辺側に電極を形成する場合、上側の半導体チップの電極に対して下側の半導体チップの電極が左右逆になる。 Prior to the development of the stacked semiconductor device, the present inventors faced the following problems.
Since the LOC structure is manufactured using two lead frames, the manufacturing cost increases. On the other hand, the tab structure can be manufactured with a single lead frame. However, since it is necessary to use a semiconductor chip having a mirror inversion circuit pattern, the manufacturing cost also increases in the tab structure. In the tab structure, since two semiconductor chips are mounted so that the respective back surfaces face the front and back surfaces of the tab, when the electrodes are formed on the two long sides facing each other on the main surface, the upper side The electrodes of the lower semiconductor chip are opposite to the electrodes of the semiconductor chip.

そこで、一辺側に電極が形成された二つの半導体チップを使用し、一方の半導体チップの一辺側が他方の半導体チップの一辺側に対して反対側に位置するように二つの半導体チップをタブの表裏面に搭載することにより、ミラー反転回路パターンの半導体チップが不要になるので、タブ構造における製造コストの低減化を図ることができる。   Therefore, two semiconductor chips having electrodes formed on one side are used, and the two semiconductor chips are placed on the tab surface so that one side of one semiconductor chip is located opposite to one side of the other semiconductor chip. Mounting on the back surface eliminates the need for a semiconductor chip having a mirror inversion circuit pattern, thereby reducing the manufacturing cost of the tab structure.

しかしながら、タブ構造では樹脂封止体の厚さが厚くなり、樹脂封止体の厚さが１．０〜１．１ｍｍ厚のＴＳＯＰ（Ｔhin Ｓmall Ｏutline Ｐackage）型で積層型半導体装置を構成することが困難である。即ち、タブ構造では、タブの表面及び裏面に半導体チップを搭載する構成になっていることから、上側の半導体チップと下側の半導体チップとの間にタブが存在し、上側の半導体チップの主面から下側の半導体チップの主面までの距離が増加するので、樹脂封止体の厚さが厚くなる。更に、タブの表面及び裏面に半導体チップを搭載する構成になっていることから、上側の半導体チップと下側の半導体チップとの間に二つの接着層が存在し、上側の半導体チップの主面から下側の半導体チップの主面までの距離が増加するので、樹脂封止体の厚さが厚くなる。本発明者等の検討によれば、半導体チップの厚さを０．１７２５〜０．２ｍｍに薄くすることにより、樹脂封止体の厚さを１．０〜１．１ｍｍ以下にすることができるが、このような場合、半導体チップの機械的強度が低下するので、半導体チップに亀裂、破損等の不具合が発生し易くなる。特に、半導体ウエーハを複数のチップに分割するダイシング工程時や、タブに半導体チップを搭載するダイボンディング工程時に多発する。   However, in the tab structure, the thickness of the resin sealing body is increased, and a laminated semiconductor device is configured with a TSOP (Thin Small Outline Package) type in which the thickness of the resin sealing body is 1.0 to 1.1 mm. Is difficult. That is, in the tab structure, since the semiconductor chip is mounted on the front surface and the back surface of the tab, there is a tab between the upper semiconductor chip and the lower semiconductor chip, and the main of the upper semiconductor chip. Since the distance from the surface to the main surface of the lower semiconductor chip is increased, the thickness of the resin sealing body is increased. Furthermore, since the semiconductor chip is mounted on the front and back surfaces of the tab, there are two adhesive layers between the upper semiconductor chip and the lower semiconductor chip, and the main surface of the upper semiconductor chip. Since the distance from the main surface of the lower semiconductor chip increases, the thickness of the resin sealing body increases. According to the study by the present inventors, the thickness of the resin sealing body can be reduced to 1.0 to 1.1 mm or less by reducing the thickness of the semiconductor chip to 0.1725 to 0.2 mm. However, in such a case, since the mechanical strength of the semiconductor chip is reduced, problems such as cracks and breakage are likely to occur in the semiconductor chip. In particular, it frequently occurs during a dicing process in which a semiconductor wafer is divided into a plurality of chips and in a die bonding process in which a semiconductor chip is mounted on a tab.

また、タブ構造では、半導体チップの電極とワイヤとの接続不良が発生し易い。即ち、タブの表面及び裏面に半導体チップを搭載した後ではタブをヒートステージに接触させることが困難であるため、ヒートステージの熱が有効に伝達されず、半導体チップの電極とワイヤとの接続不良が発生し易い。   In the tab structure, a connection failure between the electrode of the semiconductor chip and the wire is likely to occur. That is, after mounting the semiconductor chip on the front and back surfaces of the tab, it is difficult to contact the tab with the heat stage, so the heat of the heat stage is not transmitted effectively, and the connection between the electrode of the semiconductor chip and the wire is poor Is likely to occur.

本発明の目的は、二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する半導体装置の薄型化を図ることが可能な技術を提供することにある。
本発明の他の目的は、二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する半導体装置において、リードフレーム一個で二つの半導体チップに設けられた電極に対応することが可能な技術を提供することにある。
本発明の他の目的は、半導体装置の組立工程における作業性を向上することが可能な技術を提供することにある。
本発明の前記ならびにその他の目的と新規な特徴は、本明細書の記述及び添付図面によって明らかになるであろう。 An object of the present invention is to provide a technique capable of reducing the thickness of a semiconductor device in which two semiconductor chips are stacked and the two semiconductor chips are sealed with one resin sealing body.
Another object of the present invention is to provide a semiconductor device in which two semiconductor chips are stacked and the two semiconductor chips are sealed with a single resin sealing body, and an electrode provided on the two semiconductor chips with a single lead frame. It is to provide a technology that can cope with the problem.
Another object of the present invention is to provide a technique capable of improving workability in an assembly process of a semiconductor device.
The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

本願において開示される発明のうち、代表的なものの概要を簡単に説明すれば、下記のとおりである。
（１）方形状の半導体基板の主面の第一辺に沿って複数の電極（パッド）が配列された第１及び第２の２つの半導体チップを準備する工程と、
前記第１及び第２の半導体チップの夫々を、前記第１半導体チップの第１辺と前記第２半導体チップの第１辺とが反対側になるように、前記主面と反対側の面（裏面）同志を向い合せ、かつ前記電極の配列方向と直交する方向に位置をずらした積層状態で接着固定する工程と、
該接着固定された第１及び第２の半導体チップの積層体の前記第１半導体チップの主面に支持リードを接着固定する工程と、
前記第１半導体チップの各電極と表面識別記号のリードフレームのリードのインナー部とを導電性のワイヤを介して電気的に接続する工程と、
前記第２半導体チップの各電極と裏面識別記号のリードフレームのリードのインナー部とを導電性のワイヤを介して電気的に接続する工程と、
前記第１及び第２の半導体チップ、ワイヤならびにリードのインナー部を樹脂により封止する工程とを備えた半導体装置の製造方法である。 Of the inventions disclosed in this application, the outline of typical ones will be briefly described as follows.
(1) preparing first and second semiconductor chips in which a plurality of electrodes (pads) are arranged along the first side of the main surface of the rectangular semiconductor substrate;
Each of the first and second semiconductor chips is a surface opposite to the main surface (so that the first side of the first semiconductor chip and the first side of the second semiconductor chip are opposite to each other) Back side) facing each other and bonding and fixing in a laminated state in which the position is shifted in a direction perpendicular to the direction of arrangement of the electrodes;
Bonding and fixing a support lead to the main surface of the first semiconductor chip of the laminate of the first and second semiconductor chips bonded and fixed;
Electrically connecting each electrode of the first semiconductor chip and the inner part of the lead of the lead frame of the surface identification symbol via a conductive wire;
Electrically connecting each electrode of the second semiconductor chip and the inner part of the lead of the lead frame of the back surface identification symbol via a conductive wire;
And a step of sealing the inner portions of the first and second semiconductor chips, wires, and leads with a resin.

（２）前記支持リードは、電源リード又はＧＮＤリードと兼用する構造である。
（３）前記支持リードの接着固定位置がリードの高さと同一平面にある。
（４）前記リードのアウタリードは、前記樹脂封止体の厚さ方向において、樹脂封止体の中心線を含む水平平面よりも上方向の位置に設けられている。 (2) The support lead has a structure also used as a power supply lead or a GND lead.
(3) The bonding and fixing position of the support lead is flush with the height of the lead.
(4) The outer lead of the lead is provided at a position above the horizontal plane including the center line of the resin sealing body in the thickness direction of the resin sealing body.

本願において開示される発明のうち代表的なものによって得られる効果を簡単に説明すれば、下記のとおりである。
（１）二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する半導体装置の薄型化を図ることができる。
（２）二つの半導体チップを積層し、この二つの半導体チップを一つの樹脂封止体で封止する半導体装置において、リードフレーム一個で二つの半導体チップに設けられた電極に対応することができる。
（３）半導体装置の組立工程における作業性を向上することができる。
（４）半導体装置の歩留まりを高めることができる。 The effects obtained by the representative ones of the inventions disclosed in the present application will be briefly described as follows.
(1) It is possible to reduce the thickness of a semiconductor device in which two semiconductor chips are stacked and the two semiconductor chips are sealed with one resin sealing body.
(2) In a semiconductor device in which two semiconductor chips are stacked and the two semiconductor chips are sealed with one resin sealing body, one lead frame can correspond to the electrodes provided on the two semiconductor chips. .
(3) The workability in the assembly process of the semiconductor device can be improved.
(4) The yield of semiconductor devices can be increased.

以下、図面を参照して本発明の実施の形態（実施例）を詳細に説明する。なお、発明の実施の形態を説明するための全図において、同一機能を有するものは同一符号を付け、その繰り返しの説明は省略する。   Hereinafter, embodiments (examples) of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiment of the invention, and the repetitive description thereof is omitted.

（実施形態１）
本実施形態では、二方向リード配列構造であるＴＳＯＰ型の半導体装置に本発明を適用した例について説明する。
図１は本発明の実施形態（実施例）１である半導体装置の樹脂封止体の上部を除去した状態の平面図、図２は前記半導体装置の樹脂封止体の下部を除去した状態の底面図、図３は図１のＡ−Ａ線に沿う模式的断面図、図４は図１のＢ−Ｂ線に沿う模式的断面図である。なお、図１及び図２において、図１に示す左側のリード群は図２に示す右側のリード群と対応し、図１に示す右側のリード群は図２に示す左側のリード群と対応する。
図１、図２及び図３に示すように、本実施形態の半導体装置１は、半導体基板の主面（表面）を有する第１半導体チップ４を第２半導体チップ５の上に積層し、この第１半導体チップ４及び第２半導体チップ５を一つの樹脂封止体１２で封止した構成になっている。 (Embodiment 1)
In the present embodiment, an example in which the present invention is applied to a TSOP type semiconductor device having a two-way lead array structure will be described.
FIG. 1 is a plan view showing a state where an upper portion of a resin sealing body of a semiconductor device according to Embodiment 1 of the present invention is removed, and FIG. 2 is a state where a lower portion of the resin sealing body of the semiconductor device is removed. FIG. 3 is a bottom view, FIG. 3 is a schematic sectional view taken along line AA in FIG. 1, and FIG. 4 is a schematic sectional view taken along line BB in FIG. 1 and 2, the left lead group shown in FIG. 1 corresponds to the right lead group shown in FIG. 2, and the right lead group shown in FIG. 1 corresponds to the left lead group shown in FIG. .
As shown in FIGS. 1, 2, and 3, the semiconductor device 1 of the present embodiment has a first semiconductor chip 4 having a main surface (front surface) of a semiconductor substrate stacked on a second semiconductor chip 5. The first semiconductor chip 4 and the second semiconductor chip 5 are sealed with a single resin sealing body 12.

前記第１半導体チップ４及び５は、前記第１半導体チップ４の第１辺と前記第２半導体チップ５の第１辺とが反対側になるように主面（表面）と反対側の面（裏面）同志を向い合せ、かつ前記電極の配列方向と直交する方向に位置をずらした積層状態で接着固定されている。前記第１半導体チップ４及び５の夫々は、同一の外形寸法で形成されている。また、半導体チップ４、５の夫々の平面形状は方形状で形成され、本実施形態においては、例えば長方形で形成されている。   The first semiconductor chips 4 and 5 are opposite to the main surface (front surface) so that the first side of the first semiconductor chip 4 and the first side of the second semiconductor chip 5 are on the opposite side ( The back surface is bonded and fixed in a stacked state in which the opposite sides face each other and are displaced in a direction orthogonal to the arrangement direction of the electrodes. The first semiconductor chips 4 and 5 are formed with the same outer dimensions. The planar shape of each of the semiconductor chips 4 and 5 is formed in a square shape, and in the present embodiment, for example, a rectangular shape is formed.

半導体チップ４、５の夫々は、例えば、単結晶珪素からなる半導体基板及びこの半導体基板上に形成された多層配線層を主体とする構成になっている。この半導体チップ４、５の夫々には、記憶回路システムとして、例えばフラッシュメモリと呼称される６４メガビットのＥＥＰＲＯＭ（Ｅlectrically Ｅrasable Ｐrogrammable Ｒead Ｏnly Ｍemory）が構成されている。   Each of the semiconductor chips 4 and 5 has a configuration mainly including, for example, a semiconductor substrate made of single crystal silicon and a multilayer wiring layer formed on the semiconductor substrate. Each of the semiconductor chips 4 and 5 includes, for example, a 64-megabit EEPROM (Electrically Erasable Programmable Lead Only Memory) called a flash memory as a memory circuit system.

半導体チップ４の表裏面のうちの表面である主面４Ａにおいて、その互いに対向する二つの長辺のうちの一方の長辺４Ａ１側にこの一方の長辺４Ａ１に沿って複数の電極（ボンディングパッド）６が形成されている（図１及び図３参照）。この複数の電極６の夫々は、半導体チップ４の多層配線層のうちの最上層の配線層に形成されている。最上層の配線層はその上層に形成された表面保護膜（最終保護膜）で被覆され、この表面保護膜には電極６の表面を露出するボンディング開口が形成されている。   On the main surface 4A, which is the surface of the front and back surfaces of the semiconductor chip 4, a plurality of electrodes (bonding pads) are provided along one long side 4A1 on one long side 4A1 side of the two long sides facing each other. ) 6 is formed (see FIGS. 1 and 3). Each of the plurality of electrodes 6 is formed in the uppermost wiring layer of the multilayer wiring layers of the semiconductor chip 4. The uppermost wiring layer is covered with a surface protective film (final protective film) formed thereon, and a bonding opening for exposing the surface of the electrode 6 is formed in this surface protective film.

半導体チップ５の表裏面のうちの表面である主面５Ａにおいて、その互いに対向する二つの長辺のうちの一方の長辺５Ａ１側にこの一方の長辺５Ａ１に沿って複数の電極６が形成されている（図２及び図３参照）。この複数の電極６の夫々は、半導体チップ４の多層配線層のうちの最上層の配線層に形成されている。最上層の配線層はその上層に形成された表面保護膜（最終保護膜）で被覆され、この表面保護膜には電極６の表面を露出するボンディング開口が形成されている。   A plurality of electrodes 6 are formed along the one long side 5A1 on one long side 5A1 side of the two long sides facing each other on the main surface 5A which is the surface of the front and back surfaces of the semiconductor chip 5. (See FIGS. 2 and 3). Each of the plurality of electrodes 6 is formed in the uppermost wiring layer of the multilayer wiring layers of the semiconductor chip 4. The uppermost wiring layer is covered with a surface protective film (final protective film) formed thereon, and a bonding opening for exposing the surface of the electrode 6 is formed in this surface protective film.

半導体チップ４に構成されたフラッシュメモリの回路パターンは、半導体チップ５に構成されたフラッシュメモリの回路パターンと同一になっている。また、半導体チップ４の主面４Ａ１に形成された電極６の配置パターンは、半導体チップ５の主面５Ａ１に形成された電極６の配置パターンと同一になっている。即ち、半導体チップ４、半導体チップ５の夫々は、同一構造で構成されている。   The circuit pattern of the flash memory configured on the semiconductor chip 4 is the same as the circuit pattern of the flash memory configured on the semiconductor chip 5. The arrangement pattern of the electrodes 6 formed on the main surface 4A1 of the semiconductor chip 4 is the same as the arrangement pattern of the electrodes 6 formed on the main surface 5A1 of the semiconductor chip 5. That is, each of the semiconductor chip 4 and the semiconductor chip 5 has the same structure.

樹脂封止体１２の平面形状は方形状で形成され、本実施形態１においては例えば長方形で形成されている（図１、図２参照）。この樹脂封止体１２の互いに対向する二つの長辺のうちの一方の長辺側にはこの一方の長辺に沿って複数のリード１０Ａが配列され、他方の長辺側にはこの他方の長辺に沿って複数のリード１０Ｂが配列されている。複数のリード１０Ａの夫々は、樹脂封止体１２の内外に亘って延在し、半導体チップ４の長辺４Ａ１の外側に配置され、かつ半導体チップ４の各電極６に導電性のワイヤ１１を介して電気的に接続されている（図１及び図３参照）。複数のリード１０Ｂの夫々は、樹脂封止体１２の内外に亘って延在し、半導体チップ４の長辺４Ａ１と対向する他の長辺４Ａ２の外側に配置され、かつ半導体チップ５の各電極６に導電性のワイヤ１１を介して電気的に接続されている。   The planar shape of the resin sealing body 12 is formed in a rectangular shape, and in the first embodiment, for example, it is formed in a rectangular shape (see FIGS. 1 and 2). A plurality of leads 10A are arranged along one long side of one of the two long sides facing each other of the resin sealing body 12, and the other long side is the other side. A plurality of leads 10B are arranged along the long side. Each of the plurality of leads 10 </ b> A extends inside and outside the resin sealing body 12, is disposed outside the long side 4 </ b> A <b> 1 of the semiconductor chip 4, and the conductive wire 11 is attached to each electrode 6 of the semiconductor chip 4. Are electrically connected to each other (see FIGS. 1 and 3). Each of the plurality of leads 10B extends over the inside and outside of the resin sealing body 12, is disposed on the outside of the other long side 4A2 facing the long side 4A1 of the semiconductor chip 4, and each electrode of the semiconductor chip 5 6 is electrically connected via a conductive wire 11.

複数のリード１０Ａ、１０Ｂの夫々には端子名が付されている。ＶＣＣ端子は電源電位（例えば５ボルト）に電位固定される電源電位端子である。ＶＳＳ端子は基準電位（例えば０ボルト）に電位固定される基準電位端子である。Ｉ／Ｏの０端子〜７端子はデータ入出力端子である。ＲＥＳ端子はリセット端子である。Ｒ／Ｂ端子はリーディ／ビズィ端子である。ＣＤＥ端子はコマンド・データ・イネーブル端子である。ＯＥ端子は出力イネーブル端子である。ＳＣ端子はシリアル・クロック端子である。ＷＥはライト・イネーブル端子である。ＣＥはチップ・イネーブル端子である。ＮＣ端子は空き端子である。   Each of the leads 10A and 10B is given a terminal name. The VCC terminal is a power supply potential terminal that is fixed at a power supply potential (for example, 5 volts). The VSS terminal is a reference potential terminal whose potential is fixed to a reference potential (for example, 0 volts). Terminals 0 to 7 of I / O are data input / output terminals. The RES terminal is a reset terminal. The R / B terminal is a ready / busy terminal. The CDE terminal is a command / data enable terminal. The OE terminal is an output enable terminal. The SC terminal is a serial clock terminal. WE is a write enable terminal. CE is a chip enable terminal. The NC terminal is an empty terminal.

半導体チップ４、５の夫々は、半導体チップ４の他方の長辺４Ａ２及び半導体チップ５の一方の長辺５Ａ１がリード１０Ｂ側に向く（位置する）ように夫々の裏面同志を向い合わせた状態で接着層７を介在して互いに接着固定されている。即ち、半導体チップ４、５の夫々は、電極６が配列された夫々の辺が反対側に位置するように、夫々の裏面同志を向い合わせた状態で互いに接着固定され、積層構造になっている。また、半導体チップ４、５の積層体は支持リード８に支持されている。支持リード８は、半導体チップ４の主面（表面）４Ａに接着層８を介在して接着固定されている。   Each of the semiconductor chips 4 and 5 is in a state in which the other back side faces each other so that the other long side 4A2 of the semiconductor chip 4 and one long side 5A1 of the semiconductor chip 5 face (position) to the lead 10B side. The adhesive layers 7 are bonded and fixed to each other. That is, the semiconductor chips 4 and 5 are bonded and fixed to each other with their back surfaces facing each other so that the sides on which the electrodes 6 are arranged are located on the opposite side, and have a laminated structure. . The stacked body of the semiconductor chips 4 and 5 is supported by the support leads 8. The support lead 8 is bonded and fixed to the main surface (front surface) 4A of the semiconductor chip 4 with an adhesive layer 8 interposed therebetween.

このことから、半導体チップ４と半導体チップ５との間にはタブが存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａ（表面）までの距離を縮小することができる。また、半導体チップ４と半導体チップ５との間には一つの接着層しか存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。また、支持リード８は半導体チップ４の主面４Ａに接着固定されているので、支持リード８の厚さは半導体チップ４の電極６とリード１０Ａとを電気的に接続するワイヤ１１のループ高さで相殺され、支持リード８による樹脂封止体１２の厚さへの影響はない。   Accordingly, since there is no tab between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A (front surface) of the semiconductor chip 5 can be reduced. Further, since there is only one adhesive layer between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced. Further, since the support lead 8 is bonded and fixed to the main surface 4A of the semiconductor chip 4, the thickness of the support lead 8 is the loop height of the wire 11 that electrically connects the electrode 6 of the semiconductor chip 4 and the lead 10A. The support lead 8 does not affect the thickness of the resin sealing body 12.

半導体チップ４、５の夫々は、半導体チップ４の電極６が半導体チップ５の一方の長辺５Ａ１と対向する他方の長辺５Ａ２よりもその外側に位置し、半導体チップ５の電極６が半導体チップ４の他方の長辺４Ａ２よりもその外側に位置するように夫々の位置をずらした状態で接着固定されている。即ち、半導体チップ４、半導体チップ５の夫々は、電極６の配列方向に対して直行する方向に夫々の位置をずらした状態で接着固定されている。   In each of the semiconductor chips 4 and 5, the electrode 6 of the semiconductor chip 4 is located on the outer side of the other long side 5 A 2 facing the one long side 5 A 1 of the semiconductor chip 5, and the electrode 6 of the semiconductor chip 5 is located on the semiconductor chip. 4 are bonded and fixed with their respective positions shifted so as to be located outside the other long side 4A2. That is, the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed in a state where their positions are shifted in a direction perpendicular to the arrangement direction of the electrodes 6.

リード１０Ａ及びリード１０Ｂは、樹脂封止体１２で封止されるインナー部（内部リード部）と樹脂封止体１２の外部に導出されるアウター部（外部リード部）とで構成され、アウター部は面実装型形状として例えばガルウィング形状に成形されている。   The lead 10 </ b> A and the lead 10 </ b> B are configured by an inner portion (internal lead portion) sealed with the resin sealing body 12 and an outer portion (external lead portion) led out of the resin sealing body 12. Is formed into a gull wing shape, for example, as a surface mount type shape.

導電性のワイヤ１１としては例えば金（Ａｕ）ワイヤが用いられている。ワイヤ１１の接続方法としては、例えば熱圧着に超音波振動を併用したボンディング法を用いている。   For example, a gold (Au) wire is used as the conductive wire 11. As a method for connecting the wires 11, for example, a bonding method using ultrasonic vibration in combination with thermocompression bonding is used.

樹脂封止体１２は、低応力化を図る目的として、例えば、フェノール系硬化剤、シリコーンゴム及びフィラー等が添加されたビフェニール系の樹脂で形成されている。この樹脂封止体１２は、大量生産に好適なトランスファモールディング法で形成されている。トランスファモールディング法は、ポット、ランナー、流入ゲート及びキャビティ等を備えたモールド金型を使用し、ポットからランナー及び流入ゲートを通してキャビティ内に樹脂を加圧注入して樹脂封止体を形成する方法である。   For the purpose of reducing stress, the resin sealing body 12 is formed of, for example, a biphenyl resin to which a phenolic curing agent, silicone rubber, filler, and the like are added. The resin sealing body 12 is formed by a transfer molding method suitable for mass production. The transfer molding method is a method in which a mold mold having a pot, a runner, an inflow gate, a cavity, and the like is used, and a resin is press-injected into the cavity through the runner and the inflow gate to form a resin sealing body. is there.

図３において、半導体チップ４、５の夫々厚さは０．２４ｍｍであり、接着層７の厚さは０．０１ｍｍであり、リード１０Ａ及び１０Ｂの厚さは０．１２５ｍｍであり、半導体チップ４の主面４Ａからこの半導体チップ４の電極６とリード１０Ａとを電気的に接続するワイヤ１１の頂部までの高さ（ループ高さ）は０．１９ｍｍであり、このワイヤ１１の頂部から樹脂封止体１１の上面までの間隔は０．０６５ｍｍであり、樹脂封止体１２の厚さは１．０ｍｍであり、樹脂封止体１２上面からリード（１０Ａ，１０Ｂ）の実装面までの高さは１．２０ｍｍである。なお、図示していないが、半導体チップ５の主面５Ａからこの半導体チップ５の電極６とリード１０Ｂとを電気的に接続するワイヤ１１の頂部までの高さは０．１９ｍｍであり、このワイヤ１１の頂部から樹脂封止体１１の下面までの間隔は０．０６５ｍｍである。   In FIG. 3, the thickness of each of the semiconductor chips 4 and 5 is 0.24 mm, the thickness of the adhesive layer 7 is 0.01 mm, the thickness of the leads 10A and 10B is 0.125 mm, and the semiconductor chip 4 The height (loop height) from the main surface 4A to the top of the wire 11 that electrically connects the electrode 6 of the semiconductor chip 4 and the lead 10A is 0.19 mm. The distance to the upper surface of the stationary body 11 is 0.065 mm, the thickness of the resin sealing body 12 is 1.0 mm, and the height from the upper surface of the resin sealing body 12 to the mounting surface of the leads (10A, 10B) Is 1.20 mm. Although not shown, the height from the main surface 5A of the semiconductor chip 5 to the top of the wire 11 that electrically connects the electrode 6 of the semiconductor chip 5 and the lead 10B is 0.19 mm. The distance from the top of 11 to the lower surface of the resin sealing body 11 is 0.065 mm.

図３に示すように、前記支持リード８の接着固定位置は、リード１０Ａ，１０Ｂのインナー部の高さと同一平面にある。また、支持リード８の上面はワイヤ１１の頂部よりも低くなっている。支持リード８は、図４に示すように、半導体チップ４の互いに対向する二つの短辺４Ａ３及び４Ａ４を横切るように延在している。なお、図４において、符号５Ａ３は半導体チップ５の互いに対向する二つの短辺のうちの一方の短辺であり、符号５Ａ４は他方の短辺である。   As shown in FIG. 3, the bonding and fixing position of the support lead 8 is in the same plane as the height of the inner portions of the leads 10A and 10B. Further, the upper surface of the support lead 8 is lower than the top of the wire 11. As shown in FIG. 4, the support lead 8 extends so as to cross the two short sides 4A3 and 4A4 facing each other of the semiconductor chip 4. In FIG. 4, reference numeral 5A3 is one short side of the two short sides of the semiconductor chip 5 facing each other, and reference numeral 5A4 is the other short side.

また、前記リード１０Ａ，１０Ｂのアウター部は、図３に示すように、前記樹脂封止体１１の厚さ方向において、樹脂封止体１１の中心線を含む水平平面よりも上側の位置に設けられている。このように構成することにより、樹脂封止体１１にかかる応力を緩和することができる。   Further, as shown in FIG. 3, the outer portions of the leads 10 </ b> A and 10 </ b> B are provided at positions above the horizontal plane including the center line of the resin sealing body 11 in the thickness direction of the resin sealing body 11. It has been. By comprising in this way, the stress concerning the resin sealing body 11 can be relieved.

次に、半導体装置１の製造プロセスで用いられるリードフレームについて説明する。
図５に示すように、リードフレームＬＦ１は、枠体１４で規定された領域内に、複数のリード１０Ａ、複数のリード１０Ｂ、支持リード８等を配置した構成になっている。複数のリード１０Ａは、枠体１４の互いに対向する二つの長辺部分のうちの一方の長辺部分に沿って配列され、この一方の長辺部分と一体化されている。複数のリード１０Ｂは、枠体１４の互いに対向する二つの長辺部分のうちの他方の長辺部分に沿って配列され、この他方の長辺部分と一体化されている。支持リード８は、複数のリード１０Ａからなるリード群と、複数のリード１０Ｂからなるリード群との間に配置され、枠体１４と一体化されている。即ち、リードフレームＬＦ１は、二方向リード配列構造になっている。 Next, a lead frame used in the manufacturing process of the semiconductor device 1 will be described.
As shown in FIG. 5, the lead frame LF <b> 1 has a configuration in which a plurality of leads 10 </ b> A, a plurality of leads 10 </ b> B, a support lead 8, and the like are arranged in an area defined by the frame body 14. The plurality of leads 10A are arranged along one long side portion of the two long side portions facing each other of the frame body 14, and are integrated with the one long side portion. The plurality of leads 10B are arranged along the other long side portion of the two long side portions facing each other of the frame body 14, and are integrated with the other long side portion. The support lead 8 is disposed between a lead group composed of a plurality of leads 10A and a lead group composed of a plurality of leads 10B, and is integrated with the frame body 14. That is, the lead frame LF1 has a two-way lead arrangement structure.

複数のリード１０Ａの夫々は、樹脂封止体に封止されるインナー部と樹脂封止体の外部に導出されるアウター部とで構成され、タイバー１３を介して互いに連結されている。複数のリード１０Ｂの夫々は、樹脂封止体に封止されるインナー部と樹脂封止体の外部に導出されるアウター部とで構成され、タイバー１３を介して互いに連結されている。   Each of the plurality of leads 10 </ b> A includes an inner part sealed with a resin sealing body and an outer part led out of the resin sealing body, and is connected to each other via a tie bar 13. Each of the plurality of leads 10 </ b> B includes an inner portion sealed with a resin sealing body and an outer portion led out of the resin sealing body, and is connected to each other via a tie bar 13.

リードフレームＬＦ１は、例えば鉄（Ｆｅ）−ニッケル（Ｎｉ）系の合金又は銅（Ｃｕ）若しくは銅系の合金からなる平板材にエッチング加工又はプレス加工を施して所定のリードパターンを形成することによって形成される。   The lead frame LF1 is formed by etching or pressing a flat plate made of, for example, an iron (Fe) -nickel (Ni) alloy or copper (Cu) or a copper alloy to form a predetermined lead pattern. It is formed.

前記リードフレームＬＦ１は、その両面に半導体チップ４、５を搭載するため、現在使用している面がその表面かあるいは裏面かを明確に認識する必要がある。そこで、その使用されているリードフレームＬＦ１の面が表面かあるいは裏面かを識別する表裏面識別記号１４Ａ、１４ＢがリードレームＬＦ１の枠体１４に設けられている。例えば、図６に示すように、表面側の枠体１４には表面識別記号「ＡＢＣ」１４Ａが、裏面側の枠体１４には裏面識別記号「ＤＥＦ」１４Ｂが設けられている。前記表裏面識別記号１４Ａ、１４Ｂは、例えば、図７及び図８に示すように、表裏面識別用貫通刻印１４Ｃであってもよい。要するに、使用されているリードフレームＬＦ１の面が表面かあるいは裏面かが識別できる記号であればどのようなものであってもよい。   Since the lead frame LF1 has the semiconductor chips 4 and 5 mounted on both surfaces thereof, it is necessary to clearly recognize whether the currently used surface is the front surface or the back surface. Therefore, front and back identification symbols 14A and 14B for identifying whether the surface of the used lead frame LF1 is the front surface or the back surface are provided on the frame body 14 of the lead frame LF1. For example, as shown in FIG. 6, the front side frame 14 is provided with a front surface identification symbol “ABC” 14A, and the rear side frame 14 is provided with a back surface identification symbol “DEF” 14B. The front and rear surface identification symbols 14A and 14B may be front and rear surface identification penetrating marks 14C as shown in FIGS. 7 and 8, for example. In short, any symbol may be used as long as it can identify whether the surface of the lead frame LF1 being used is the front surface or the back surface.

このように構成することにより、フレームの枠体１４の部分でも表裏両面から認識できるので、リードフレームＬＦ１の両面に半導体チップ４、５を搭載する際の不具合を低減することができる。これにより、半導体チップ４、５の固定、リード１０Ａ、１０Ｂの固定、ワイヤ１１のボンディング等の組立工程における作業性を向上することができる。   By configuring in this way, even the frame portion 14 of the frame can be recognized from both the front and back surfaces, so that problems in mounting the semiconductor chips 4 and 5 on both surfaces of the lead frame LF1 can be reduced. Thereby, workability | operativity in assembly processes, such as fixation of the semiconductor chips 4 and 5, fixation of lead 10A, 10B, bonding of the wire 11, can be improved.

次に、半導体装置１の製造方法について、図９乃至図１２（要部断面図）を用いて説明する。
まず、リードフレームＬＦ１に一方の半導体チップ４を接着固定する。リードフレームＬＦ１と半導体チップ４との固定は、図９に示すように、ヒートステージ２０に半導体チップ４を装着し、その後、半導体チップ４の主面４Ａに例えば熱硬化性樹脂からなる接着剤を塗布して接着層９を形成し、その後、半導体チップ４の主面４Ａに支持リード８をボンディングツール２１で圧着することによって行われる。 Next, a method for manufacturing the semiconductor device 1 will be described with reference to FIGS.
First, one semiconductor chip 4 is bonded and fixed to the lead frame LF1. As shown in FIG. 9, the lead frame LF1 and the semiconductor chip 4 are fixed by attaching the semiconductor chip 4 to the heat stage 20, and then applying an adhesive made of, for example, a thermosetting resin to the main surface 4A of the semiconductor chip 4. The adhesive layer 9 is formed by coating, and the support lead 8 is then pressure-bonded to the main surface 4A of the semiconductor chip 4 with the bonding tool 21.

次に、半導体チップ４の電極６とリード１０Ａとを導電性のワイヤ１１で電気的に接続する。半導体チップ４の電極６とリード１０Ａとの接続は、図１０に示すように、ヒートステージ２２に半導体チップ４を装着し、その後、ヒートステージ２２にリード１０Ａ及びリード１０Ｂをフレーム押さえ部材２３で押さえ付けた状態で行なわれる。ワイヤ１１としては例えばＡｕワイヤを用いる。また、ワイヤ１１の接続方法としては例えば熱圧着に超音波振動を併用したボンディング法を用いる。   Next, the electrode 6 of the semiconductor chip 4 and the lead 10 </ b> A are electrically connected by the conductive wire 11. As shown in FIG. 10, the connection between the electrode 6 of the semiconductor chip 4 and the lead 10 </ b> A is performed by mounting the semiconductor chip 4 on the heat stage 22 and then pressing the lead 10 </ b> A and the lead 10 </ b> B on the heat stage 22 with the frame pressing member 23. It is performed in the attached state. For example, an Au wire is used as the wire 11. As a method for connecting the wires 11, for example, a bonding method using ultrasonic vibration in combination with thermocompression bonding is used.

次に、半導体チップ４に半導体チップ５を接着固定する。半導体チップ４と半導体チップ５との固定は、図１１に示すように、ヒートステージ２３に半導体チップ４をその主面４Ａを下にして装着し、その後、半導体チップ４の裏面に例えばＡｇペースト材からなる接着剤を塗布して接着層７を形成し、その後、半導体チップ４の裏面上に半導体チップ５をその裏面を下にして装着することによって行なわれる。この時、半導体チップ４の一方の長辺４Ａ１に対して半導体チップ５の一方の長辺５Ａ１が反対側に位置するように向きを揃えた状態で半導体チップ４、半導体チップ５の夫々の裏面同志を向い合わせて接着固定する。   Next, the semiconductor chip 5 is bonded and fixed to the semiconductor chip 4. As shown in FIG. 11, the semiconductor chip 4 and the semiconductor chip 5 are fixed by mounting the semiconductor chip 4 on the heat stage 23 with its main surface 4A facing down, and then, for example, an Ag paste material on the back surface of the semiconductor chip 4 The adhesive layer 7 is applied to form an adhesive layer 7, and then the semiconductor chip 5 is mounted on the back surface of the semiconductor chip 4 with the back surface facing down. At this time, the back surfaces of each of the semiconductor chip 4 and the semiconductor chip 5 are arranged in a state in which the one long side 4A1 of the semiconductor chip 4 is oriented so that the one long side 5A1 of the semiconductor chip 5 is located on the opposite side. Adhere and fix.

また、半導体チップ４の電極６が半導体チップ５の他方の長辺５Ａ２よりもその外側に位置し、半導体チップ５の電極６が半導体チップ４の他方の長辺４Ａ２よりもその外側に位置するように位置をずらした状態で半導体チップ４、半導体チップ５の夫々の裏面同志を向い合わせて接着固定する。   Further, the electrode 6 of the semiconductor chip 4 is positioned outside the other long side 5A2 of the semiconductor chip 5, and the electrode 6 of the semiconductor chip 5 is positioned outside the other long side 4A2 of the semiconductor chip 4. In a state where the positions are shifted to each other, the back surfaces of the semiconductor chip 4 and the semiconductor chip 5 face each other and are bonded and fixed.

なお、この工程において、半導体チップ４はその主面４Ａを下にした状態でヒートステージ２３に装着されるので、ヒートステージ２３とワイヤ１１との接触を防止するため、ヒートステージ２３には窪み２３Ａが設けられている。   In this step, since the semiconductor chip 4 is mounted on the heat stage 23 with its main surface 4A down, in order to prevent contact between the heat stage 23 and the wire 11, a recess 23A is formed in the heat stage 23. Is provided.

次に、半導体チップ５の電極６とリード１０Ｂとを導電性のワイヤ１１で電気的に接続する。半導体チップ５の電極６とリード１０Ｂとの接続は、図１２に示すように、半導体チップ５の主面５Ａを上向きにしてヒートステージ２４に半導体チップ４及び半導体チップ５を装着し、その後、ヒートステージ２４にリード１０Ａ及びリード１０Ｂをフレーム押さえ部材２５で押えつけた状態で行なわれる。ワイヤ１１としては例えばＡｕワイヤを用いる。   Next, the electrode 6 of the semiconductor chip 5 and the lead 10 </ b> B are electrically connected by the conductive wire 11. As shown in FIG. 12, the connection between the electrode 6 of the semiconductor chip 5 and the lead 10B is performed by attaching the semiconductor chip 4 and the semiconductor chip 5 to the heat stage 24 with the main surface 5A of the semiconductor chip 5 facing upward, This is performed in a state where the lead 10A and the lead 10B are pressed against the stage 24 by the frame pressing member 25. For example, an Au wire is used as the wire 11.

また、ワイヤ１１の接続方法としては例えば熱圧着に超音波振動を併用したボンディング法を用いる。この工程において、半導体チップ５の電極６と対向する裏面の領域が露出しているので、この裏面の領域に接触するように突出部２５Ｂをヒートステージ２４に設けておくことにより、半導体チップ５の電極と対向する裏面の領域をヒートステージ２４に直に接触させることができる。   As a method for connecting the wires 11, for example, a bonding method using ultrasonic vibration in combination with thermocompression bonding is used. In this step, since the back surface region facing the electrode 6 of the semiconductor chip 5 is exposed, the protrusion 25B is provided on the heat stage 24 so as to be in contact with the back surface region. The area of the back surface facing the electrode can be brought into direct contact with the heat stage 24.

即ち、半導体チップ４の電極６が半導体チップ５の他方の長辺５Ａ２よりもその外側に位置し、半導体チップ５の電極６が半導体チップ４の他方の長辺４Ａ２よりもその外側に位置するように位置をずらした状態で半導体チップ４、半導体チップ５の夫々の裏面同志を接着固定することにより、半導体チップ５の電極６と対向する裏面の領域をヒートステージ２４に直に接触させることができ、ヒートステージ２４の熱が半導体チップ５の電極６に有効に伝達されるので、半導体チップ５の電極６とワイヤ１１との接続不良を低減することができる。   That is, the electrode 6 of the semiconductor chip 4 is positioned outside the other long side 5A2 of the semiconductor chip 5, and the electrode 6 of the semiconductor chip 5 is positioned outside the other long side 4A2 of the semiconductor chip 4. By adhering and fixing the back surfaces of the semiconductor chip 4 and the semiconductor chip 5 with their positions shifted to each other, the back surface area facing the electrode 6 of the semiconductor chip 5 can be brought into direct contact with the heat stage 24. Since the heat of the heat stage 24 is effectively transmitted to the electrode 6 of the semiconductor chip 5, the connection failure between the electrode 6 of the semiconductor chip 5 and the wire 11 can be reduced.

なお、この工程において、半導体チップ４はその主面４Ａを下にした状態でヒートステージ２４に装着されるので、ヒートステージ２４とワイヤ１１との接触を防止するため、ヒートステージ２４には窪み２４Ａが設けられている。   In this step, since the semiconductor chip 4 is mounted on the heat stage 24 with its main surface 4A down, in order to prevent contact between the heat stage 24 and the wire 11, a recess 24A is formed in the heat stage 24. Is provided.

次に、半導体チップ４、半導体チップ５、支持リード８、リード１０Ａのインナー部、リード１０Ｂのインナー部及びワイヤ１１等を樹脂で封止して樹脂封止体１２を形成する。樹脂封止体１２の形成はトランスファモールディング法で行う。   Next, the semiconductor chip 4, the semiconductor chip 5, the support lead 8, the inner part of the lead 10 </ b> A, the inner part of the lead 10 </ b> B, the wire 11, and the like are sealed with resin to form the resin sealing body 12. The resin sealing body 12 is formed by a transfer molding method.

次に、リード１０Ａに連結されたタイバー１３及びリード１０Ｂに連結されたタイバー１３を切断し、その後、リード１０Ａ、リード１０Ｂの夫々のアウター部にメッキ処理を施し、その後、リードフレームＬＦ１の枠体１４からリード１０Ａ及び１０Ｂを切断し、その後、リード１０Ａ、１０Ｂの夫々のアウター部を面実装型形状として例えばガルウィング形状に成形し、その後、リードフレームＬＦ１の枠体１４から支持リード８を切断することにより、図１、図２及び図３に示す半導体装置１がほぼ完成する。   Next, the tie bar 13 connected to the lead 10A and the tie bar 13 connected to the lead 10B are cut, and then the outer portions of the leads 10A and 10B are plated, and then the frame of the lead frame LF1. 14, the leads 10 </ b> A and 10 </ b> B are cut, and then the outer portions of the leads 10 </ b> A and 10 </ b> B are formed into, for example, a gull wing shape as a surface mount type shape, and then the support leads 8 are cut from the frame body 14 of the lead frame LF <b> 1. Thus, the semiconductor device 1 shown in FIGS. 1, 2, and 3 is almost completed.

このようにして構成された半導体装置１は、図１３（要部断面図）に示すように、１つの回路システムを構成する電子装置の構成部品として実装基板３０に複数個実装される。半導体装置１は、同一機能のリードが対向して配置されているので、リード１０Ａとリード１０Ｂとを電気的に接続するための配線３１を直線的に引き回すことができる。また、半導体装置１のリード１０Ｂと他の半導体装置１のリード１０Ａとを電気的に接続するための配線３１を直線的に引き回すことができる。従って、実装基板３０の配線層数を低減することができるので、電子装置、例えばメモリーモジュール等の薄型化を図ることができる。   A plurality of semiconductor devices 1 configured as described above are mounted on a mounting substrate 30 as components of an electronic device constituting one circuit system, as shown in FIG. In the semiconductor device 1, the leads having the same function are arranged so as to face each other, so that the wiring 31 for electrically connecting the leads 10 </ b> A and the leads 10 </ b> B can be routed linearly. Also, the wiring 31 for electrically connecting the lead 10B of the semiconductor device 1 and the lead 10A of the other semiconductor device 1 can be routed linearly. Therefore, since the number of wiring layers of the mounting substrate 30 can be reduced, it is possible to reduce the thickness of an electronic device such as a memory module.

以上説明したように、本実施形態１によれば以下の効果が得られる。
（１）半導体チップ４、半導体チップ５の夫々は、半導体チップ４の一方の長辺４Ａ２及び半導体チップ５の一方の長辺５Ａ１がリード１０Ｂ側に向くように夫々の裏面同志を向い合わせた状態で互いに接着固定され、支持リード８は半導体チップ４の主面４Ａ１に接着固定されている。
このことから、半導体チップ４と半導体チップ５との間にはタブが存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。また、半導体チップ４と半導体チップ５との間には一つの接着層しか存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。また、支持リード８は半導体チップ４の主面４Ａに接着固定されているので、支持リード８の厚さはワイヤ１１のループ高さで相殺され、支持リード８による樹脂封止体１２の厚さへの影響はない。この結果、樹脂封止体１２の厚さを薄くすることができるので、半導体装置１の薄型化を図ることができる。 As described above, according to the first embodiment, the following effects can be obtained.
(1) Each of the semiconductor chip 4 and the semiconductor chip 5 is in a state in which the back surfaces of the semiconductor chip 4 face each other so that one long side 4A2 of the semiconductor chip 4 and one long side 5A1 of the semiconductor chip 5 face the lead 10B side. The support leads 8 are bonded and fixed to the main surface 4A1 of the semiconductor chip 4.
From this, since there is no tab between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced. Further, since there is only one adhesive layer between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced. Further, since the support lead 8 is bonded and fixed to the main surface 4 A of the semiconductor chip 4, the thickness of the support lead 8 is offset by the loop height of the wire 11, and the thickness of the resin sealing body 12 by the support lead 8. There is no impact on As a result, since the thickness of the resin sealing body 12 can be reduced, the semiconductor device 1 can be reduced in thickness.

また、半導体チップ（４，５）の厚さを薄くすることなく、樹脂封止体１２の厚さを薄くすることができるので、歩留まりの高い薄型の半導体装置１を提供することができる。   Moreover, since the thickness of the resin sealing body 12 can be reduced without reducing the thickness of the semiconductor chip (4, 5), the thin semiconductor device 1 having a high yield can be provided.

また、樹脂封止体１２の厚さを薄くすることができるので、二つの半導体チップ（４，５）を積層し、この二つの半導体チップを一つの樹脂封止体１２で封止した半導体装置１をＴＳＯＰ型で構成することができる。   Further, since the thickness of the resin sealing body 12 can be reduced, two semiconductor chips (4, 5) are stacked, and the two semiconductor chips are sealed with one resin sealing body 12. 1 can be configured as a TSOP type.

また、二枚のリードフレームを使用する必要がなく、更にミラー反転回路パターンの半導体チップを使用する必要がないので、半導体装置１の低コスト化及び薄型化を図ることができる。   In addition, since it is not necessary to use two lead frames and further to use a semiconductor chip having a mirror inversion circuit pattern, the cost and thickness of the semiconductor device 1 can be reduced.

（２）半導体チップ４、半導体チップ５の夫々は、半導体チップ４の電極６が半導体チップ５の他方の長辺５Ａ２よりもその外側に位置し、半導体チップ５の電極６が半導体チップ４の他方の長辺４Ａ２よりもその外側に位置するように夫々の位置をずらした状態で接着固定されている。
このことから、ワイヤボンディング工程において、半導体チップ５の電極６と対向する裏面の領域をヒートステージ２４に直に接触させることができ、ヒートステージ２４の熱が半導体チップ５の電極６に有効に伝達されるので、半導体チップ５の電極６とワイヤ１１との接続不良を低減することができる。この結果、半導体装置１の製造プロセス（組立プロセス）における歩留まりを高めることができる。 (2) In each of the semiconductor chip 4 and the semiconductor chip 5, the electrode 6 of the semiconductor chip 4 is located outside the other long side 5 </ b> A <b> 2 of the semiconductor chip 5, and the electrode 6 of the semiconductor chip 5 is the other side of the semiconductor chip 4. The long sides 4A2 are fixed to each other with their respective positions shifted so as to be located outside the long sides 4A2.
From this, in the wire bonding process, the area of the back surface facing the electrode 6 of the semiconductor chip 5 can be brought into direct contact with the heat stage 24, and the heat of the heat stage 24 is effectively transmitted to the electrode 6 of the semiconductor chip 5. Therefore, connection failure between the electrode 6 of the semiconductor chip 5 and the wire 11 can be reduced. As a result, the yield in the manufacturing process (assembly process) of the semiconductor device 1 can be increased.

（３）リードフレームＬＦ１は、その両面に半導体チップ４、５を搭載するために、その使用されているリードフレームＬＦ１の面が表面かあるいは裏面かを識別する表裏面識別記号１４Ａ、１４Ｂ、１４ＣをリードフレームＬＦ１の枠体１４に設けることにより、リードフレームＬＦ１の枠体１４の部分であってもその表裏両面を認識できるので、リードフレームＬＦ１の両面に半導体チップ４、５を搭載する際の不具合を低減することができる。これにより、半導体チップ４、５の固定、リード１０Ａ、１０Ｂの固定やワイヤ１１のボンディング等の組立工程における作業性を向上することができる。   (3) In order to mount the semiconductor chips 4 and 5 on both sides of the lead frame LF1, the front and back identification symbols 14A, 14B, and 14C for identifying whether the surface of the lead frame LF1 used is the front side or the back side. Is provided on the frame 14 of the lead frame LF1, so that both the front and back surfaces can be recognized even in the frame 14 portion of the lead frame LF1, and therefore when the semiconductor chips 4 and 5 are mounted on both sides of the lead frame LF1. Problems can be reduced. Thereby, workability | operativity in assembly processes, such as fixation of the semiconductor chips 4 and 5, fixation of lead 10A, 10B, bonding of the wire 11, can be improved.

なお、本実施形態１では、半導体チップ４の主面４Ａに支持リード８を接着固定した例について説明したが、支持リード８は、半導体チップ５の主面５Ａに接着固定してもよい。この場合、支持リード８には、そのチップ固定部を半導体チップ５の主面５Ａ側に位置させるための折り曲げ加工が施される。また、このような場合においても、支持リード８の厚さは、半導体チップ５の電極６とリード１０Ｂとを電気的に接続するワイヤ１１のループ高さで相殺されるので、支持リード８による樹脂封止体１２の厚さへの影響はない。   In the first embodiment, the example in which the support lead 8 is bonded and fixed to the main surface 4 </ b> A of the semiconductor chip 4 has been described. However, the support lead 8 may be bonded and fixed to the main surface 5 </ b> A of the semiconductor chip 5. In this case, the support lead 8 is subjected to a bending process for positioning the chip fixing portion on the main surface 5 </ b> A side of the semiconductor chip 5. Even in such a case, the thickness of the support lead 8 is offset by the loop height of the wire 11 that electrically connects the electrode 6 of the semiconductor chip 5 and the lead 10B. There is no influence on the thickness of the sealing body 12.

（実施形態２）
図１４は本発明の実施形態２である半導体装置の樹脂封止体の上部を除去した状態の平面図であり、図１５は図１４のＣ−Ｃ線に沿う模式的断面図であり、図１６は図１４のＤ−Ｄ線に沿う模式的断面図である。
図１４、図１５及び図１６に示すように、本実施形態２の半導体装置２は、前述の実施形態１と基本的に同様の構成になっており、以下の構成が異なっている。 (Embodiment 2)
14 is a plan view of the semiconductor device according to the second embodiment of the present invention in a state where the upper portion of the resin sealing body is removed, and FIG. 15 is a schematic cross-sectional view taken along the line CC of FIG. 16 is a schematic cross-sectional view taken along the line DD of FIG.
As shown in FIGS. 14, 15, and 16, the semiconductor device 2 of the second embodiment has basically the same configuration as that of the first embodiment described above, and the following configuration is different.

即ち、半導体チップ４、半導体チップ５の夫々は、半導体チップ４の一方の長辺４Ａ１と交わる一方の短辺４Ａ３がこの一方の短辺４Ａ３と同一側であって半導体チップ５の一方の長辺５Ａ１と交わる一方の短辺５Ａ３よりもその外側に位置し、半導体チップ５の一方の短辺５Ａ３と対向する他方の短辺５Ａ４がこの他方の短辺５Ａ４と同一側であって半導体チップ４の一方の短辺４Ａ３と対向する他方の短辺４Ａ４よりも外側に位置するように夫々の位置をずらした状態で接着固定されている。即ち、半導体チップ４、半導体チップ５の夫々は、電極６の配列方向に夫々の位置をずらした状態で接着固定されている。   That is, each of the semiconductor chip 4 and the semiconductor chip 5 has one short side 4A3 intersecting with one long side 4A1 of the semiconductor chip 4 on the same side as the one short side 4A3, and one long side of the semiconductor chip 5 The other short side 5A4 located on the outer side of one short side 5A3 intersecting with 5A1 and facing one short side 5A3 of the semiconductor chip 5 is on the same side as the other short side 5A4 and It is bonded and fixed in a state where the respective positions are shifted so as to be located outside the other short side 4A4 facing the one short side 4A3. That is, the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed in a state where the positions of the semiconductor chip 4 and the semiconductor chip 5 are shifted in the arrangement direction of the electrodes 6.

また、半導体チップ４の一方の短辺４Ａ３及び半導体チップ５の一方の短辺５Ａ３の外側に配置された支持リード８Ａと、半導体チップ４の他方の短辺４Ａ４及び半導体チップ５の他方の短辺５Ａ４の外側に配置された支持リード８Ｂとを有し、支持リード８Ａは、半導体チップ５の他方の短辺５Ａ４の外側において半導体チップ４の裏面に接着層７を介在して接着固定され、支持リード８Ｂは、半導体チップ４の他方の短辺４Ａ４の外側において半導体チップ５の裏面に接着層７を介在して接着固定されている。   Also, the support lead 8A disposed outside one short side 4A3 of the semiconductor chip 4 and one short side 5A3 of the semiconductor chip 5, the other short side 4A4 of the semiconductor chip 4 and the other short side of the semiconductor chip 5 A support lead 8B disposed on the outer side of 5A4, and the support lead 8A is bonded and fixed to the back surface of the semiconductor chip 4 with the adhesive layer 7 outside the other short side 5A4 of the semiconductor chip 5 and supported. The lead 8B is bonded and fixed to the back surface of the semiconductor chip 5 with the adhesive layer 7 interposed outside the other short side 4A4 of the semiconductor chip 4.

支持リード８Ａには、半導体チップ４の裏面側にそのチップ固定部を位置させるための折り曲げ加工が施され、支持リード８Ｂには、半導体チップ５の裏面側にそのチップ固定部を位置させるための折り曲げ加工が施されている。   The support lead 8A is subjected to a bending process for positioning the chip fixing portion on the back surface side of the semiconductor chip 4, and the support lead 8B is provided for positioning the chip fixing portion on the back surface side of the semiconductor chip 5. Bending is applied.

このように構成された半導体装置２は、図１７（平面図）に示すリードフレームＬＦ２を用いた製造プロセスで製造される。本実施形態の半導体装置２の製造は、前述の実施形態１で説明した製造方法と若干異なり、半導体チップ４、半導体チップ５の夫々を夫々の裏面同志を向い合わせた状態で接着固定し、支持リード８Ａ、支持リード８Ｂの夫々に半導体チップ４、半導体チップ５の夫々を接着固定した後、ワイヤボンディングを行う。支持リードと半導体チップとの固定は、支持リード８Ａと支持リード８Ｂとの間に、接着固定された半導体チップ４及び半導体チップ５を傾斜させて挿入することにより行うことができる。   The semiconductor device 2 configured as described above is manufactured by a manufacturing process using the lead frame LF2 shown in FIG. 17 (plan view). The manufacturing of the semiconductor device 2 of the present embodiment is slightly different from the manufacturing method described in the first embodiment, and the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed with the respective back surfaces facing each other. After the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed to the lead 8A and the support lead 8B, respectively, wire bonding is performed. The support lead and the semiconductor chip can be fixed by tilting and inserting the semiconductor chip 4 and the semiconductor chip 5 that are bonded and fixed between the support lead 8A and the support lead 8B.

ワイヤボンディング工程は、半導体チップ４の電極６とリード１０Ａとをワイヤ１１で電気的に接続し、その後、半導体チップ５の電極６とリード１０Ｂとワイヤ１１で電気的に接続することによって行うが、半導体チップ４、半導体チップ５の夫々は、電極６の配列方向に夫々の位置をずらした状態で接着固定されているので、半導体チップ４の電極６とリード１０Ａとをワイヤ１１で接続する時、直ではないが、半導体チップ４の他方の短辺４Ａ３側の領域と対向する裏面の領域に支持リード８Ａを介在してヒートステージを接触させることができる。また、半導体チップ５の電極６とリード１０Ｂとをワイヤ１１で接続する時、直ではないが、半導体チップ５の他方の短辺５Ａ３側の領域と対向する裏面の領域に支持リード８Ｂを介在してヒートステージを接触させることができる。   The wire bonding step is performed by electrically connecting the electrode 6 of the semiconductor chip 4 and the lead 10A with the wire 11, and then electrically connecting the electrode 6 of the semiconductor chip 5 with the lead 10B and the wire 11. Since each of the semiconductor chip 4 and the semiconductor chip 5 is bonded and fixed in a state in which the positions of the electrodes 6 are shifted in the arrangement direction of the electrodes 6, when the electrodes 6 of the semiconductor chip 4 and the leads 10A are connected by the wires 11, Although not straight, the heat stage can be brought into contact with the region of the back surface facing the region on the other short side 4A3 side of the semiconductor chip 4 with the support lead 8A interposed. Further, when the electrode 6 of the semiconductor chip 5 and the lead 10B are connected by the wire 11, the support lead 8B is interposed in the region of the back surface facing the region on the other short side 5A3 side of the semiconductor chip 5 although not straight. The heat stage can be brought into contact.

このように、半導体チップ４、半導体チップ５の夫々は、半導体チップ４の一方の短辺４Ａ３が半導体チップ５の一方の短辺５Ａ３よりもその外側に位置し、半導体チップ５の他方の短辺５Ａ４が半導体チップ４の他方の短辺４Ａ４よりもその外側に位置するように夫々の位置をずらした状態で互いに接着固定され、支持リード８Ａは、半導体チップ５の一方の短辺５Ａ３外側において半導体チップ４の裏面に接着固定され、支持リード８Ｂは、半導体チップ４の他方の短辺４Ａ４の外側において半導体チップ５の裏面に接着固定されていることから、半導体チップ４と半導体チップ５との間にはタブが存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。
また、半導体チップ４と半導体チップ５との間には一つの接着層しか存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。
また、支持リード８Ａは半導体チップ５の一方の短辺５Ａ３よりもその外側に引き出された半導体チップ４の裏面に接着固定され、支持リード８Ｂは半導体チップ４の他方の短辺４Ａ４よりもその外側に引き出された半導体チップ５の裏面に接着固定されているので、支持リード８Ａ、８Ｂの夫々の厚さは半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの厚さで相殺され、支持リード８Ａ、８Ｂによる樹脂封止体１２の厚さへの影響はない。
この結果、前述の実施形態１と同様の効果が得られる。 As described above, each of the semiconductor chip 4 and the semiconductor chip 5 is such that one short side 4A3 of the semiconductor chip 4 is located outside the one short side 5A3 of the semiconductor chip 5 and the other short side of the semiconductor chip 5 is. The supporting leads 8A are bonded and fixed to each other with their positions shifted so that 5A4 is located on the outer side of the other short side 4A4 of the semiconductor chip 4, and the support lead 8A is located outside the short side 5A3 of the semiconductor chip 5 on the semiconductor side. Since the support lead 8B is bonded and fixed to the back surface of the semiconductor chip 5 outside the other short side 4A4 of the semiconductor chip 4 between the semiconductor chip 4 and the semiconductor chip 5. Since there is no tab, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced.
Further, since there is only one adhesive layer between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced.
Further, the support lead 8A is bonded and fixed to the back surface of the semiconductor chip 4 drawn outside the one short side 5A3 of the semiconductor chip 5, and the support lead 8B is outside the other short side 4A4 of the semiconductor chip 4. The thickness of each of the support leads 8A and 8B is offset by the thickness from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 because it is bonded and fixed to the back surface of the semiconductor chip 5 drawn out to The support leads 8A and 8B do not affect the thickness of the resin sealing body 12.
As a result, the same effect as in the first embodiment can be obtained.

また、半導体チップ４、半導体チップ５の夫々は、半導体チップ４の一方の長辺４Ａ１と交わる一方の短辺４Ａ３がこの一方の短辺４Ａ３と同一側であって半導体チップ５の一方の長辺５Ａ１と交わる一方の短辺５Ａ３よりもその外側に位置し、半導体チップ５の一方の短辺５Ａ３と対向する他方の短辺５Ａ４がこの他方の短辺５Ａ４と同一側であって半導体チップ４の一方の短辺４Ａ３と対向する他方の短辺４Ａ４よりも外側に位置するように夫々の位置をずらした状態で接着固定されていることから、ワイヤボンディング工程において、半導体チップ４の裏面とヒートステージ２４との接触面積が増加するので、ワイヤボンディング工程における半導体チップ４の加熱時間を短縮することができる。また、半導体チップ５の裏面とヒートステージ２４との接触面積が増加するので、ワイヤボンディング工程における半導体チップ５の加熱時間を短縮することができる。この結果、半導体装置２の生産効率を高めることができる。   Further, each of the semiconductor chip 4 and the semiconductor chip 5 has one short side 4A3 intersecting with one long side 4A1 of the semiconductor chip 4 on the same side as the one short side 4A3, and one long side of the semiconductor chip 5 The other short side 5A4 located on the outer side of one short side 5A3 intersecting with 5A1 and facing one short side 5A3 of the semiconductor chip 5 is on the same side as the other short side 5A4 and In the wire bonding step, the back surface of the semiconductor chip 4 and the heat stage are bonded and fixed in a state where the respective positions are shifted so as to be positioned outside the other short side 4A4 facing the short side 4A3. Since the contact area with 24 increases, the heating time of the semiconductor chip 4 in the wire bonding process can be shortened. Moreover, since the contact area between the back surface of the semiconductor chip 5 and the heat stage 24 increases, the heating time of the semiconductor chip 5 in the wire bonding process can be shortened. As a result, the production efficiency of the semiconductor device 2 can be increased.

（実施形態３）
図１８は本発明の実施形態３である半導体装置の樹脂封止体の上部を除去した状態の平面図であり、図１９は図１８のＥ−Ｅ線に沿う模式的断面図である。
図１８、図１９に示すように、本実施形態３の半導体装置３は、前述の実施形態２と基本的に同様の構成になっており、以下の構成が異なっている。 (Embodiment 3)
18 is a plan view of the semiconductor device according to the third embodiment of the present invention in a state where the upper portion of the resin sealing body is removed, and FIG. 19 is a schematic cross-sectional view taken along the line EE of FIG.
As shown in FIGS. 18 and 19, the semiconductor device 3 of the third embodiment has basically the same configuration as that of the second embodiment described above, and the following configuration is different.

即ち、支持リード８Ａは、半導体チップ４の主面４Ａにおいてその一方の短辺４Ａ３側に接着固定され、支持リード８Ｂは、半導体チップ５の主面５Ａにおいてその他方の短辺５Ａ４側に接着固定されている。   That is, the support lead 8A is bonded and fixed to one short side 4A3 side of the main surface 4A of the semiconductor chip 4, and the support lead 8B is bonded and fixed to the other short side 5A4 side of the main surface 5A of the semiconductor chip 5. Has been.

支持リード８Ａには折り曲げ加工が施されていないが、支持リード８Ｂには、半導体チップ５の主面５Ａ側にそのチップ固定部を位置させるための折り曲げ加工が施されている。   The support lead 8A is not bent, but the support lead 8B is bent to position the chip fixing portion on the main surface 5A side of the semiconductor chip 5.

このように構成された半導体装置３は、図２０（平面図）に示すリードフレームＬＦ３を用いた製造プロセスで製造される。本実施形態３の半導体装置３の製造は、前述の実施形態２で説明した製造方法と同様に、半導体チップ４、半導体チップ５の夫々を夫々の裏面同志を向い合わせた状態で接着固定し、支持リード８Ａ、支持リード８Ｂの夫々に半導体チップ４、半導体チップ５の夫々を接着固定した後、ワイヤボンディングを行う。支持リードと半導体チップとの固定は、支持リード８Ａと支持リード８Ｂとの間に、接着固定された半導体チップ４及び半導体チップ５を傾斜させて挿入することにより行うことができる。   The semiconductor device 3 configured as described above is manufactured by a manufacturing process using the lead frame LF3 shown in FIG. 20 (plan view). In the manufacture of the semiconductor device 3 of the third embodiment, the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed in a state where the respective back surfaces face each other in the same manner as the manufacturing method described in the second embodiment. After the semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed to the support lead 8A and the support lead 8B, respectively, wire bonding is performed. The support lead and the semiconductor chip can be fixed by tilting and inserting the semiconductor chip 4 and the semiconductor chip 5 that are bonded and fixed between the support lead 8A and the support lead 8B.

ワイヤボンディング工程は、半導体チップ４の電極６とリード１０Ａとをワイヤ１１で電気的に接続し、その後、半導体チップ５の電極６とリード１０Ｂとをワイヤ１１で電気的に接続することによって行うが、半導体チップ４、半導体チップ５の夫々は、電極６の配列方向に夫々の位置をずらした状態で接着固定されており、支持リード８Ａは半導体チップ４の主面４Ａにおいて一方の短辺４Ａ３側に接着固定され、支持リード８Ｂは半導体チップ５の主面５Ａにおいて他方の短辺５Ａ４側に接着固定されているので、半導体チップ４の電極６とリード１０Ａとをワイヤ１１で接続する時、半導体チップ４の一方の短辺４Ａ３側の領域と対向する裏面の領域にヒートステージを直に接触させることができる。また、半導体チップ５の電極６とリード１０Ｂとをワイヤ１１で接続する時、半導体チップ５の他方の短辺５Ａ３側の領域と対向する裏面の領域にヒートステージを直に接触させることができる。   The wire bonding process is performed by electrically connecting the electrode 6 of the semiconductor chip 4 and the lead 10A with the wire 11 and then electrically connecting the electrode 6 of the semiconductor chip 5 and the lead 10B with the wire 11. The semiconductor chip 4 and the semiconductor chip 5 are bonded and fixed in a state where their positions are shifted in the arrangement direction of the electrodes 6, and the support lead 8 A is on the short side 4 A 3 side on the main surface 4 A of the semiconductor chip 4. Since the supporting lead 8B is bonded and fixed to the other short side 5A4 side of the main surface 5A of the semiconductor chip 5, when the electrode 6 of the semiconductor chip 4 and the lead 10A are connected by the wire 11, the semiconductor lead 5 is fixed. The heat stage can be brought into direct contact with the region on the back surface facing the region on the one short side 4A3 side of the chip 4. Further, when the electrode 6 of the semiconductor chip 5 and the lead 10B are connected by the wire 11, the heat stage can be brought into direct contact with the area on the back surface facing the area on the other short side 5A3 side of the semiconductor chip 5.

このように、支持リード８Ａは、半導体チップ４の主面４Ａにおいてその一方の短辺４Ａ３側に接着固定され、支持リード８Ｂは、半導体チップ５の主面５Ａにおいてその他方の短辺５Ａ４側に接着固定されていることから、半導体チップ４と半導体チップ５との間にはタブが存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。
また、半導体チップ４と半導体チップ５との間には一つの接着層しか存在しないので、半導体チップ４の主面４Ａから半導体チップ５の主面５Ａまでの距離を縮小することができる。
また、支持リード８Ａは、半導体チップ４の主面４Ａにおいてその一方の短辺４Ａ３側に接着固定され、支持リード８Ｂは、半導体チップ５の主面５Ａにおいてその他方の短辺５Ａ４側に接着固定されているので、支持リード８Ａの厚さは半導体チップ４の電極６とリード１０Ａとを電気的に接続するワイヤ１１のループ高さで相殺され、支持リード８Ｂの厚さは半導体チップ５の電極６とリード１０Ｂとを電気的に接続するワイヤ１１のループ高さで相殺される。従って、支持リード８Ａ、８Ｂによる樹脂封止体１２の厚さへの影響はない。この結果、前述の実施形態２と同様の効果が得られる。 As described above, the support lead 8A is bonded and fixed to one short side 4A3 side of the main surface 4A of the semiconductor chip 4, and the support lead 8B is set to the other short side 5A4 side of the main surface 5A of the semiconductor chip 5. Since there is no tab between the semiconductor chip 4 and the semiconductor chip 5 because they are bonded and fixed, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced. .
Further, since there is only one adhesive layer between the semiconductor chip 4 and the semiconductor chip 5, the distance from the main surface 4A of the semiconductor chip 4 to the main surface 5A of the semiconductor chip 5 can be reduced.
The support lead 8A is bonded and fixed to one short side 4A3 side of the main surface 4A of the semiconductor chip 4, and the support lead 8B is bonded and fixed to the other short side 5A4 side of the main surface 5A of the semiconductor chip 5. Therefore, the thickness of the support lead 8A is offset by the loop height of the wire 11 that electrically connects the electrode 6 of the semiconductor chip 4 and the lead 10A, and the thickness of the support lead 8B is the electrode of the semiconductor chip 5 6 is offset by the loop height of the wire 11 that electrically connects the lead 10B. Therefore, there is no influence on the thickness of the resin sealing body 12 by the support leads 8A and 8B. As a result, the same effect as in the second embodiment can be obtained.

なお、前述の実施形態１においても、本実施形態３と同様に、電極６の配列方向に位置をずらした状態で半導体チップ４、半導体チップ５の夫々の裏面同志を接着固定してもよい。この場合においても、本実施形態３と同様に、半導体チップ４の裏面とヒートステージとの接触面積が増加するので、ワイヤボンディング工程における半導体チップ４の加熱時間を短縮することができる。また、半導体チップ５の裏面とヒートステージとの接触面積が増加するので、ワイヤボンディング工程における半導体チップ５の加熱時間を短縮することができる。   In the first embodiment, as in the third embodiment, the back surfaces of the semiconductor chip 4 and the semiconductor chip 5 may be bonded and fixed in a state where the positions of the electrodes 6 are shifted in the arrangement direction. Also in this case, as in the third embodiment, the contact area between the back surface of the semiconductor chip 4 and the heat stage is increased, so that the heating time of the semiconductor chip 4 in the wire bonding process can be shortened. Further, since the contact area between the back surface of the semiconductor chip 5 and the heat stage increases, the heating time of the semiconductor chip 5 in the wire bonding process can be shortened.

以上、本発明者によってなされた発明を、前記実施形態に基づき具体的に説明したが、本発明は、前記実施形態に限定されるものではなく、その要旨を逸脱しない範囲において種々変更可能であることは勿論である。   As mentioned above, the invention made by the present inventor has been specifically described based on the embodiment. However, the invention is not limited to the embodiment, and various modifications can be made without departing from the scope of the invention. Of course.

例えば、本発明は、二方向リード配列構造であるＳＯＪ（Ｓmall Ｏutline Ｊ-leaded Ｐackage）型、ＳＯＰ（Ｓmall Ｏutline Ｐackage）型等の半導体装置に適用できる。
また、本発明は、四方向リード配列構造であるＱＦＰ（Ｑuad Ｆlatpack Ｐackage）型、ＱＦＪ（Ｑuad Ｆlatpack Ｊ-leaded Ｐackage）型等の半導体装置に適用できる。 For example, the present invention can be applied to a semiconductor device of a SOJ (Small Outline J-leaded Package) type, a SOP (Small Outline Package) type, or the like having a bidirectional lead array structure.
Further, the present invention can be applied to a semiconductor device such as a QFP (Quad Flatpack Package) type or a QFJ (Quad Flatpack J-leaded Package) type having a four-way lead arrangement structure.

本発明の実施形態１である半導体装置の樹脂封止体の上部を除去した状態の平面図である。It is a top view of the state which removed the upper part of the resin sealing body of the semiconductor device which is Embodiment 1 of this invention. 前記半導体装置の樹脂封止体の下部を除去した状態の底面図である。It is a bottom view of the state which removed the lower part of the resin sealing body of the said semiconductor device. 図１に示すＡ−Ａ線に沿う模式的断面図である。It is typical sectional drawing which follows the AA line shown in FIG. 図１に示すＢ−Ｂ線に沿う模式的断面図である。It is typical sectional drawing which follows the BB line shown in FIG. 前記半導体装置の製造プロセスで用いられるリードフレームの平面図である。It is a top view of the lead frame used in the manufacturing process of the semiconductor device. 前記リードフレームの表裏面識別記号の実施例を説明するための平面図である。It is a top view for demonstrating the Example of the front-back surface identification symbol of the said lead frame. 前記リードフレームの表裏面識別記号の別の実施例を説明するための平面図である。It is a top view for demonstrating another Example of the front-and-back surface identification symbol of the said lead frame. 前記リードフレームの表裏面識別記号の別の実施例を説明するための平面図である。It is a top view for demonstrating another Example of the front-and-back surface identification symbol of the said lead frame. 前記半導体装置の製造方法を説明するための模式的断面図である。It is typical sectional drawing for demonstrating the manufacturing method of the said semiconductor device. 前記半導体装置の製造方法を説明するための模式的断面図である。It is typical sectional drawing for demonstrating the manufacturing method of the said semiconductor device. 前記半導体装置の製造方法を説明するための模式的断面図である。It is typical sectional drawing for demonstrating the manufacturing method of the said semiconductor device. 前記半導体装置の製造方法を説明するための模式的断面図である。It is typical sectional drawing for demonstrating the manufacturing method of the said semiconductor device. 前記半導体装置を実装基板に実装した状態の要部断面図である。It is principal part sectional drawing of the state which mounted the said semiconductor device in the mounting board | substrate. 本発明の実施形態２である半導体装置の樹脂封止体の上部を除去した状態の平面図である。It is a top view of the state which removed the upper part of the resin sealing body of the semiconductor device which is Embodiment 2 of this invention. 図１１に示すＣ−Ｃ線に沿う模式的断面図である。It is typical sectional drawing which follows the CC line shown in FIG. 図１１に示すＤ−Ｄ線に沿う模式的断面図である。It is typical sectional drawing which follows the DD line shown in FIG. 前記半導体装置の製造プロセスで用いられるリードフレームの平面図である。It is a top view of the lead frame used in the manufacturing process of the semiconductor device. 本発明の実施形態３である半導体装置の樹脂封止体の上部を除去した状態の平面図である。It is a top view of the state which removed the upper part of the resin sealing body of the semiconductor device which is Embodiment 3 of this invention. 図１５に示すＥ−Ｅ線に沿う模式的断面図である。It is typical sectional drawing which follows the EE line shown in FIG. 前記半導体装置の製造プロセスで用いられるリードフレームの平面図である。It is a top view of the lead frame used in the manufacturing process of the semiconductor device.

符号の説明Explanation of symbols

１，２，３…半導体装置、４，５…半導体チップ、６…電極、７…接着層、８，８Ａ，８Ｂ…支持リード、９…接着層、１０Ａ，１０Ｂ…リード、１１…ワイヤ、１２…樹脂封止体、ＬＦ１，ＬＦ２，ＬＦ３…リードフレーム、１４…リードフレーム枠体、１４Ａ，１４Ｂ，１４Ｃ…リードフレームの表裏面識別記号。   DESCRIPTION OF SYMBOLS 1, 2, 3 ... Semiconductor device, 4, 5 ... Semiconductor chip, 6 ... Electrode, 7 ... Adhesive layer, 8, 8A, 8B ... Support lead, 9 ... Adhesive layer, 10A, 10B ... Lead, 11 ... Wire, 12 ... resin sealing body, LF1, LF2, LF3 ... lead frame, 14 ... lead frame frame, 14A, 14B, 14C ... front and back identification symbols of the lead frame.

Claims (6)

（ａ）複数の電極が形成された回路形成面を有する半導体チップを準備する工程、
（ｂ）前記半導体チップを支持可能な支持リードと、前記支持リードと並ぶように前記支持リードの周囲に設けられた複数のリードとを有するリードフレームを準備する工程、
（ｃ）前記支持リードに前記半導体チップの回路形成面を接着固定する工程、
（ｄ）前記半導体チップの外形寸法よりも大きい窪みを有するヒートステージを準備し、前記半導体チップが前記窪み内に位置するように、前記半導体チップが接着固定された前記リードフレームを前記ヒートステージ上に配置する工程、
（ｅ）前記半導体チップの複数の電極と前記複数のリードとを複数のワイヤでそれぞれ電気的に接続する工程、
（ｆ）前記半導体チップおよび前記複数のワイヤを封止する封止体を形成する工程、
とを含むことを特徴とする半導体装置の製造方法。 (A) preparing a semiconductor chip having a circuit forming surface on which a plurality of electrodes are formed;
(B) preparing a lead frame having a support lead capable of supporting the semiconductor chip and a plurality of leads provided around the support lead so as to be aligned with the support lead;
(C) a step of bonding and fixing a circuit forming surface of the semiconductor chip to the support lead;
(D) preparing a heat stage having a recess larger than the outer dimension of the semiconductor chip, and placing the lead frame on which the semiconductor chip is bonded and fixed on the heat stage so that the semiconductor chip is positioned in the recess. The step of placing in,
(E) electrically connecting the plurality of electrodes of the semiconductor chip and the plurality of leads with a plurality of wires,
(F) forming a sealing body for sealing the semiconductor chip and the plurality of wires;
A method for manufacturing a semiconductor device, comprising: 前記支持リードは、前記複数のリードのそれぞれの高さと同一平面にあることを特徴とする請求項１記載の半導体装置の製造方法。   The method of manufacturing a semiconductor device according to claim 1, wherein the support lead is flush with a height of each of the plurality of leads. 前記半導体チップの回路形成面の平面形状は四角形から成り、前記複数の電極は前記回路形成面の第１長辺に沿って形成されていることを特徴とする請求項１記載の半導体装置の製造方法。   The semiconductor device manufacturing method according to claim 1, wherein a planar shape of a circuit forming surface of the semiconductor chip is a quadrangle, and the plurality of electrodes are formed along a first long side of the circuit forming surface. Method. 前記（ｃ）工程は、前記ヒートステージに前記半導体チップを搭載し、前記半導体チップの回路形成面に接着剤を塗布し、前記半導体チップの回路形成面に前記支持リードをボンディングツールで圧着することにより行われることを特徴とする請求項１記載の半導体装置の製造方法。   In the step (c), the semiconductor chip is mounted on the heat stage, an adhesive is applied to the circuit formation surface of the semiconductor chip, and the support lead is pressure-bonded to the circuit formation surface of the semiconductor chip with a bonding tool. The method of manufacturing a semiconductor device according to claim 1, wherein: 前記（ｆ）工程の後、前記複数のリードのそれぞれにおいて前記封止体から突出するアウター部にメッキ処理を施し、前記支持リードおよび前記複数のリードのそれぞれに連結された枠体から前記複数のリードを切断し、前記複数のリードのそれぞれのアウター部をガルウィング形状に成形し、前記枠体から前記支持リードを切断することを特徴とする請求項１記載の半導体装置の製造方法。   After the step (f), an outer portion protruding from the sealing body in each of the plurality of leads is plated, and the plurality of leads are connected to each of the support leads and the plurality of leads. 2. The method of manufacturing a semiconductor device according to claim 1, wherein the leads are cut, the outer portions of the plurality of leads are each formed into a gull wing shape, and the support leads are cut from the frame. 前記封止体は、前記リードにおいて前記ワイヤが接続される面側の樹脂厚よりも、前記リードにおいて前記ワイヤが接続される面とは反対側の面側の樹脂厚よりも薄くなるように形成されることを特徴とする請求項１記載の半導体装置の製造方法。   The sealing body is formed so as to be thinner than a resin thickness on a surface side opposite to a surface to which the wire is connected in the lead, than a resin thickness on a surface side to which the wire is connected in the lead. The method of manufacturing a semiconductor device according to claim 1, wherein:
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JPH08264711A (en) * 1995-03-28 1996-10-11 Seiko Epson Corp Semiconductor device
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JPH10303233A (en) * 1997-04-22 1998-11-13 Sanyo Electric Co Ltd Manufacture of semiconductor device
JP2000156464A (en) * 1998-11-20 2000-06-06 Hitachi Ltd Manufacture of semiconductor device

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JPH08264711A (en) * 1995-03-28 1996-10-11 Seiko Epson Corp Semiconductor device
JPH08330508A (en) * 1995-05-30 1996-12-13 Sharp Corp Semiconductor integrated circuit and its manufacturing method
JPH10303233A (en) * 1997-04-22 1998-11-13 Sanyo Electric Co Ltd Manufacture of semiconductor device
JP2000156464A (en) * 1998-11-20 2000-06-06 Hitachi Ltd Manufacture of semiconductor device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018026982A (en) * 2016-08-12 2018-02-15 ミツミ電機株式会社 Battery protection device

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