JP2006332391A - Method and device for imprinting by back pressurization - Google Patents

Method and device for imprinting by back pressurization Download PDF

Info

Publication number
JP2006332391A
JP2006332391A JP2005154854A JP2005154854A JP2006332391A JP 2006332391 A JP2006332391 A JP 2006332391A JP 2005154854 A JP2005154854 A JP 2005154854A JP 2005154854 A JP2005154854 A JP 2005154854A JP 2006332391 A JP2006332391 A JP 2006332391A
Authority
JP
Japan
Prior art keywords
substrate
mold
pressing
imprint
imprinting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005154854A
Other languages
Japanese (ja)
Other versions
JP4595120B2 (en
Inventor
Hiroshi Hiroshima
洋 廣島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Priority to JP2005154854A priority Critical patent/JP4595120B2/en
Publication of JP2006332391A publication Critical patent/JP2006332391A/en
Application granted granted Critical
Publication of JP4595120B2 publication Critical patent/JP4595120B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To perform accurate imprinting even when a mold and a sample are somewhat bad in flatness, to suppress formation of an isolated noncontact area when the mold and sample come into contact with each other, and to make a pressure distribution on a contact plane between the mold and sample uniform in an easy method. <P>SOLUTION: A substrate holding member 2 holds a circumference of a thin substrate 1, a structure 7 for pressurization is arranged below the substrate 1 to freely move up and down, and the mold 4 is arranged above the substrate 1 opposite to the structure 7 for pressurization; and the structure 7 for pressurization is elevated to press the reverse surface 6 of the substrate 1, and the top surface 3 of the substrate 1 is pressed against the mold 4 above the holding position (a) of the substrate 1 for imprinting. The structure 7 for pressurization is made of a substance which is more flexible than the substrate 1 and mold 4 to achieve more uniform imprinting. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は半導体等のリソグラフィー手法の一つであるインプリントリソグラフィー装置のパターン転写機構において、裏面を加圧することによりインプリントを行う裏面加圧によるインプリント方法及びその方法実施するインプリント装置に関する。   The present invention relates to an imprint method by back surface pressurization that performs imprinting by pressurizing the back surface in a pattern transfer mechanism of an imprint lithography apparatus that is one of lithography techniques for semiconductors and the like, and an imprint apparatus that performs the method.

近年、高密度メモリやシステムLSIに代表される超LSIデバイスのダウンサイジングが進展し、より微細化を行うことができる技術が要求されており、そのため半導体製造プロセスの中でリソグラフィー(転写)技術の重要性が増大している。その中でインプリントリソグラフィーは所定の回路パターンを形成したモールドを、表面にレジストが塗布された試料基板に対して押しつけ、パターンを転写する技術であって、種々の方式が提案されており、例えば図9に示されるように行われる。   In recent years, downsizing of VLSI devices represented by high-density memories and system LSIs has progressed, and a technology capable of further miniaturization has been demanded. Therefore, in the semiconductor manufacturing process, lithography (transfer) technology is required. The importance is increasing. Among them, imprint lithography is a technique for transferring a pattern by pressing a mold having a predetermined circuit pattern against a sample substrate coated with a resist on its surface, and various methods have been proposed. This is done as shown in FIG.

図9において、最初同図(a)に示すようにモールド材料30の表面に、転写すべきパターンの鏡像に対応する反転パターンを電子ビームリソグラフィー等により形成することにより、表面に所定の凹凸形状31を有するモールド32を作成する。一方、同図(b)に示すように、パターンを形成しようとするシリコン基板33上にPMMAなどのレジスト材料を塗布し硬化させて、レジスト層34を形成する。   In FIG. 9, a reverse pattern corresponding to a mirror image of the pattern to be transferred is first formed on the surface of the mold material 30 as shown in FIG. A mold 32 having On the other hand, as shown in FIG. 5B, a resist material such as PMMA is applied on the silicon substrate 33 on which a pattern is to be formed and cured to form a resist layer 34.

次いでこのレジスト層34備えたシリコン基板33全体を約200度C程度に加熱し、レジスト層34を若干軟化させる。この状態で図9(c)に示すように、前記モールド32の凹凸形状31を前記レジスト層34の所定位置に配置し、凹凸形状31をレジスト層34に対して押しつける。このときレジスト層34は軟化しているので、レジスト層34は凹凸形状31の凹部に入り込み、レジスト層34は凹凸形状31とほぼ同一形状となる。この状態で全体の温度を105度C程度に降下させることによりレジスト層34を硬化させ、その後モールド32を取り去る。このようにしてレジスト層34には、所定形状の凹凸パターンが形成される。   Next, the entire silicon substrate 33 provided with the resist layer 34 is heated to about 200 ° C., and the resist layer 34 is slightly softened. In this state, as shown in FIG. 9C, the uneven shape 31 of the mold 32 is arranged at a predetermined position of the resist layer 34, and the uneven shape 31 is pressed against the resist layer 34. At this time, since the resist layer 34 is softened, the resist layer 34 enters the concave portion of the concavo-convex shape 31, and the resist layer 34 has substantially the same shape as the concavo-convex shape 31. In this state, the resist layer 34 is cured by lowering the entire temperature to about 105 ° C., and then the mold 32 is removed. In this manner, a concavo-convex pattern having a predetermined shape is formed on the resist layer 34.

なお、インプリントリソグラフィー方式においては、上記のようなものの他、例えばモールドを石英基板等の透明材料で作成し、転写される基板上には液体状の光硬化性樹脂を塗布し、その上にモールドの凹凸を押しつけ、凹凸内に液体状の光硬化性樹脂を流入させ、この状態で透明なモールドの裏側から紫外線等を照射して樹脂を硬化させ、その後モールドを取り去ることにより所定形状の凹凸パターンを形成する方式も提案されている。   In the imprint lithography method, in addition to the above, for example, a mold is made of a transparent material such as a quartz substrate, and a liquid photo-curing resin is applied onto the substrate to be transferred. Press the mold irregularities, let the liquid photo-curing resin flow into the irregularities, and in this state, irradiate ultraviolet rays etc. from the back side of the transparent mold to cure the resin, and then remove the mold to form the irregularities of the predetermined shape A method of forming a pattern has also been proposed.

上記のようなインプリントリソグラフィー方式においては、モールドを試料基板に押しつける際の押しつけ面内の圧力分布を一様にする必要がある。面内の圧力分布を一様にするにはモールドと試料基板の平行度を高める必要があり、両者が平行ではない場合はモールド側もしくは試料側で相互の傾斜が調整されなければならない。   In the imprint lithography system as described above, it is necessary to make the pressure distribution in the pressing surface uniform when pressing the mold against the sample substrate. In order to make the in-plane pressure distribution uniform, it is necessary to increase the parallelism of the mold and the sample substrate. When the two are not parallel, the mutual inclination must be adjusted on the mold side or the sample side.

上記のようにモールドを試料基板に対して押しつけるに際して、面内の圧力分布を一様にするには、従来から、弾性体や支点を有し、支点まわりに傾斜を変える傾斜調整機構を利用することが行われている。モールド側に傾斜調整機構を使用した場合を図10、図11の模式図に示す。図10においては、試料台35にレジスト36が塗布されたシリコン基板37が置かれ、モールド38が加圧機構40によってシリコン基板37上のレジスト36に押しつけられる。図10は傾斜調整機構としてピボット構造41を利用した場合を示しており、例えば試料台35が加圧機構40に対して相対的に傾斜している場合、加圧機構40によってモールド38をレジスト36に押しつけるとき、ピボット構造41がこの傾きを吸収し、モールド38はレジスト36に対して均等な力で押圧される。図11は前記図10の傾斜調整機構として弾性体42を用いたものであり、弾性体42が傾きを吸収することができ、図10に示すものと同様に、モールド38はレジスト36に対して均等な力で押圧される。   In order to make the in-plane pressure distribution uniform when pressing the mold against the sample substrate as described above, conventionally, an inclination adjusting mechanism having an elastic body and a fulcrum and changing the inclination around the fulcrum is used. Things have been done. The case where an inclination adjusting mechanism is used on the mold side is shown in the schematic diagrams of FIGS. In FIG. 10, a silicon substrate 37 coated with a resist 36 is placed on a sample stage 35, and a mold 38 is pressed against the resist 36 on the silicon substrate 37 by a pressing mechanism 40. FIG. 10 shows a case where the pivot structure 41 is used as the tilt adjusting mechanism. For example, when the sample stage 35 is tilted relative to the pressurizing mechanism 40, the mold 38 is moved to the resist 36 by the pressurizing mechanism 40. The pivot structure 41 absorbs this inclination when pressed against the resist 36, and the mold 38 is pressed against the resist 36 with an equal force. 11 uses an elastic body 42 as the tilt adjustment mechanism of FIG. 10, and the elastic body 42 can absorb the tilt. As in the case shown in FIG. Pressed with equal force.

前記の例は加圧側に傾斜調整機構を使用した例を示したが、試料側に傾斜調整機構を使用しても同様の作用を行うことができ、その例を図12(a)、(b)、(c)の模式図に示している。同図(a)は試料台35をピボット構造43により支持した例を示し、(b)は試料台35の底面に弾性体44を、また(c)は試料台35とシリコン基板37の間に弾性体44を設けた例を示している。これらの各方式のいずれにおいても、試料を移動させない場合は期待通りに傾斜調整機構が機能する。   Although the above example shows an example in which the tilt adjustment mechanism is used on the pressure side, the same action can be performed even if the tilt adjustment mechanism is used on the sample side, and examples thereof are shown in FIGS. ) And (c) are schematic views. 4A shows an example in which the sample stage 35 is supported by the pivot structure 43, FIG. 5B shows an elastic body 44 on the bottom surface of the sample stage 35, and FIG. 5C shows between the sample stage 35 and the silicon substrate 37. The example which provided the elastic body 44 is shown. In any of these methods, the tilt adjustment mechanism functions as expected when the sample is not moved.

上記のように、モールドをレジストに対して均等な力で押圧するため、ピボットや弾性体からなる傾斜調整機構を、加圧側や加圧される側に設けるものにおいて、広い面のレジストに対してモールドを複数の箇所に押しつける際には、傾斜調整機構が図10及び図11に示すように加圧側に設けている場合は全面に対して傾斜調整機構が作用するが、傾斜調整機構が図12に示すように加圧される側に設けている場合には全面に対して機能させることができない。   As described above, in order to press the mold against the resist with an equal force, a tilt adjusting mechanism made of a pivot or an elastic body is provided on the pressure side or the pressure side. When the mold is pressed against a plurality of locations, if the tilt adjusting mechanism is provided on the pressure side as shown in FIGS. 10 and 11, the tilt adjusting mechanism acts on the entire surface. If it is provided on the pressurized side, it cannot function on the entire surface.

前記のように、パターンのついたモールドを基板上に塗布された熱可塑性樹脂を加熱し押し付け、冷却後離型する熱ナノインプリントや、パターンのついた透明のモールドを基板上に滴下または塗布された液状の光硬化樹脂に押し付け、モールドを透過させて光を照射し樹脂を固化させて離型しパターンを形成する光ナノインプリントの手法において、均一なインプリント実現するために、従来は、型となるモールド側や試料基板側の傾斜を調整する機構を用意する手法が用いられている(特許文献1、2)。
特許公表2003−517727号公報 特許公開2003−77867号公報
As described above, a thermal mold was applied to a patterned mold by heating or pressing the thermoplastic resin applied on the substrate, and then releasing the mold after cooling, or a patterned transparent mold was dropped or applied on the substrate. In order to achieve uniform imprinting in the technique of optical nanoimprinting, which is pressed against a liquid photo-curing resin, irradiated through the mold and irradiated with light to solidify the resin, and then released to form a pattern, it is conventionally a mold. A method of preparing a mechanism for adjusting the inclination on the mold side or the sample substrate side is used (Patent Documents 1 and 2).
Patent publication 2003-517727 Japanese Patent Publication No. 2003-77867

傾斜調整機構はモールドと試料の平坦性がきわめて良好でなければ機能しない。また、モールドと試料の接触面での圧力分布を設計する自由度が少ない。更に、モールドと試料が接触する際に接触領域内部に孤立した非接触領域が生じる場合があり、この場合大気中のインプリントでは大気がその部分に密閉されその部分で正常なインプリントが行えない、等の問題があった。   The tilt adjustment mechanism will not work unless the mold and sample are very flat. In addition, the degree of freedom in designing the pressure distribution at the contact surface between the mold and the sample is small. Furthermore, when the mold and the sample come into contact with each other, an isolated non-contact area may be generated inside the contact area. In this case, in the atmospheric imprint, the atmosphere is sealed in that area and normal imprint cannot be performed in that area. There was a problem such as.

したがって本発明は、モールドと試料の平坦性が少々悪くても正確なインプリントを行うことができ、モールドと試料との接触時に孤立した非接触領域が生じるのを抑制し、またモールドと試料の接触面での圧力分布を簡単な手法により、且つ各種の手法によって均一化することができ、それにより試料の平坦性、傾斜に対応して精密なインプリントを行うことができるようにすることを目的とする。   Therefore, the present invention enables accurate imprinting even if the flatness of the mold and the sample is slightly worse, suppresses the formation of an isolated non-contact region when the mold and the sample are in contact, The pressure distribution on the contact surface can be made uniform by a simple method and various methods, thereby making it possible to perform a precise imprint corresponding to the flatness and inclination of the sample. Objective.

本発明は上記課題を解決するため、試料周辺を保持し試料裏面を局所的に押し上げることで試料の湾曲量を制御し、接触時に孤立した非接触領域が生じるのを抑制し、押し上げる部材の構造を工夫することで試料裏面の圧力分布を設計し、モールドと試料の接触面での圧力分布に反映させ、結果的に均一なインプリントを実現するものである。   In order to solve the above problems, the present invention controls the amount of bending of the sample by holding the periphery of the sample and locally pushing up the back surface of the sample, suppressing the occurrence of an isolated non-contact region at the time of contact, and the structure of the member to be pushed up By designing the pressure distribution on the back side of the sample, it is reflected in the pressure distribution on the contact surface between the mold and the sample, and as a result, a uniform imprint is realized.

本発明に係る裏面加圧によるインプリント方法は、より具体的には、薄い基板の周囲を保持し、前記基板の下方には上下動自在に加圧用構造体を配置し、前記基板の上方には前記加圧用構造体に対向してモールドを配置し、前記加圧用構造体を上昇させて前記基板の裏面を押圧し、基板の自由保持位置より上方で基板表面を前記モールドに押圧しインプリントすることを特徴とする。   More specifically, the imprint method by backside pressurization according to the present invention holds a periphery of a thin substrate, and a pressurizing structure is arranged below the substrate so as to be movable up and down, and above the substrate. Arranges a mold facing the pressing structure, raises the pressing structure to press the back surface of the substrate, presses the substrate surface above the free holding position of the substrate to the mold, and imprints It is characterized by doing.

また、本発明に係る他の裏面加圧によるインプリント方法は、前記裏面加圧によるインプリント方法において、前記加圧用構造体が、モールド及び基板よりも柔軟な物質からなることを特徴とする。   According to another imprint method by backside pressurization according to the present invention, in the imprint method by backside pressurization, the structure for pressurization is made of a material more flexible than a mold and a substrate.

また、本発明に係る裏面加圧によるインプリント装置は、表面にインプリントする薄い基板と、前記基板の周囲を保持する基板保持部材と、前記基板の下方に上下動自在に配置した加圧用構造体と、前記基板の上方に前記加圧用構造体に対向して配置したモールドと、前記加圧用構造体を上昇させて前記基板の裏面を押圧し、基板の自由保持位置より情報で基板表面を前記モールドに押圧してインプリントする押圧手段とを備えたことを特徴とする。   Further, the imprint apparatus by backside pressure according to the present invention includes a thin substrate that is imprinted on the front surface, a substrate holding member that holds the periphery of the substrate, and a pressurizing structure that is arranged below the substrate so as to freely move up and down. A body, a mold disposed above the substrate and facing the pressing structure, and the pressing structure is raised to press the back surface of the substrate, and the substrate surface is moved by information from a free holding position of the substrate. And pressing means for imprinting by pressing the mold.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体が、モールド及び基板よりも柔軟な物質からなることを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is characterized in that in the imprint apparatus by backside pressurization, the pressing structure is made of a material that is more flexible than the mold and the substrate.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体が、頂面部分を薄く形成した弾性押圧部材の内部に、液体、気体、ゲル、エラストマーのいずれかの物質からなる変形材を収容したことを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is the imprint apparatus by backside pressurization, wherein the pressurizing structure has a liquid, gas, gel, It is characterized by containing a deformable material made of any material of elastomer.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体が、前記柔軟性部材を下面から押圧する押し棒を備え、前記押し棒は押圧先端部が凸状曲面をなすことを特徴とする。   The imprint apparatus by back surface pressing according to the present invention is the imprint apparatus by back surface pressing, wherein the pressing structure includes a pressing bar that presses the flexible member from the bottom surface, and the pressing bar is a pressing tip. The portion has a convex curved surface.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体が、リニアアクチュエータ、モータ、ボイスコイル、ピエゾ素子等の電動アクチュエータ、気体圧力や液体圧力等の流体アクチュエータのいずれかにより移動することを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is the imprint apparatus by backside pressurization, wherein the pressurizing structure is an electric actuator such as a linear actuator, a motor, a voice coil, a piezo element, a gas pressure or a liquid pressure. It moves by either of fluid actuators, such as.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、作動時における前記加圧用構造体と基板間の荷重を計測する荷重計測装置を備えることを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is characterized in that in the imprint apparatus by backside pressurization, a load measuring device for measuring a load between the pressing structure and the substrate during operation is provided.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体の加圧部分の位置を計測する位置計測装置を備えたことを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is characterized in that in the imprint apparatus by backside pressurization, a position measuring device for measuring the position of the pressurizing portion of the pressurizing structure is provided.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体の基板を加圧する面に圧力分布を変化させる手段を備えたことを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is characterized in that in the imprint apparatus by backside pressurization, there is provided means for changing the pressure distribution on the surface of the pressurizing structure that presses the substrate.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体の基板を加圧する面に圧力分布を変化させる手段が、該加圧する面の表面または裏面に形成した凹凸であることを特徴とする。   The imprinting device by backside pressure according to the present invention is the imprinting device by backside pressing, wherein the means for changing the pressure distribution on the surface of the pressing structure that presses the substrate is the surface of the pressing surface or It is characterized by unevenness formed on the back surface.

本発明に係る裏面加圧によるインプリント装置は、前記裏面加圧によるインプリント装置において、前記加圧用構造体の基板を加圧する面が、微小な力により傾斜が可変となるように設定していることを特徴とする。   The imprint apparatus by backside pressurization according to the present invention is such that, in the imprint apparatus by backside pressurization, the surface of the pressurizing structure that presses the substrate is set so that the inclination is variable by a minute force. It is characterized by being.

本発明によると、モールドと試料の平坦性が少々悪くても正確なインプリントを行うことができ、モールドと試料との接触時に孤立した非接触領域が生じるのを抑制し、またモールドと試料の接触面での圧力分布を簡単な手法により、且つ各種の手法によって均一化することができ、それにより試料の平坦性、傾斜に対応して精密なインプリントを行うことができるようにすることができる。また、モールド側には均一インプリントするための機構を用意する必要がないために、アライメント等の他の機能をモールド側に容易に設計・構築することが可能となる。また、モールド側の傾斜調整が1mrad程度で良いために、簡単な半固定の傾斜調整機構を用意するか、場合によっては傾斜調整機構が全く不要となり、モールドを単に昇降させる機能だけを用意すれば良くなるため、モールド側の機構の単純化を図ることができる。   According to the present invention, accurate imprinting can be performed even if the flatness of the mold and the sample is slightly worse, and it is possible to suppress the occurrence of an isolated non-contact region when the mold and the sample are in contact with each other. The pressure distribution on the contact surface can be made uniform by simple methods and various methods, thereby enabling precise imprinting corresponding to the flatness and inclination of the sample. it can. Further, since there is no need to prepare a mechanism for uniform imprinting on the mold side, other functions such as alignment can be easily designed and constructed on the mold side. In addition, since the mold side tilt adjustment may be about 1 mrad, a simple semi-fixed tilt adjustment mechanism is prepared, or in some cases, the tilt adjustment mechanism is not required at all, and only a function for raising and lowering the mold is prepared. Therefore, the mold side mechanism can be simplified.

また、裏面加圧構造体の材料選択や構造の微少変更によりインプリント時の圧力分布設計を行なうことができ、使用する基板が理想的な平坦性を有していなくても均一な加圧が可能となる。更に、基板を湾曲する際の湾曲量により最終的な圧力分布を調整することも可能であり、大気中インプリントの場合、湾曲により大気の挟み込みを回避でき、欠陥のないインプリントが実現可能となる。また、液状の樹脂を利用したインプリントの場合、湾曲により液状の樹脂の効果的な外方への排出が起こり、基板とモールドを全面にわたり近接させることができるため、均一なインプリントが実現可能になる。   In addition, pressure distribution design during imprinting can be performed by selecting the material of the back surface pressurization structure and making minor structural changes, and even if the substrate used does not have ideal flatness, uniform pressurization can be achieved. It becomes possible. Furthermore, it is possible to adjust the final pressure distribution by the amount of bending when the substrate is bent. In the case of atmospheric imprinting, it is possible to avoid the trapping of the atmosphere by bending and to realize imprints without defects. Become. In addition, in the case of imprinting using liquid resin, the liquid resin is effectively discharged outward due to bending, and the substrate and mold can be brought close to each other, so that uniform imprinting can be realized. become.

本発明は、広範な条件で均一なインプリントを可能とするため、薄い基板の周囲を保持し、前記基板の下方には上下動自在に加圧用構造体を配置し、前記基板の上方には前記加圧用構造体に対向してモールドを配置し、前記加圧用構造体を上昇させて前記基板の裏面を押圧し、基板の保持位置より上方で基板表面を前記モールドに押圧しインプリントすることによって実現する。   In the present invention, in order to enable uniform imprinting over a wide range of conditions, a periphery of a thin substrate is held, and a pressurizing structure is arranged below the substrate so as to be movable up and down, and above the substrate. A mold is disposed opposite to the pressing structure, the pressing structure is raised and the back surface of the substrate is pressed, and the substrate surface is pressed onto the mold and imprinted above the holding position of the substrate. Realized by.

図1(b)は本発明の基本構成とインプリント作動時の作用を示した模式断面図であり、基板1の周囲を基板保持部材2によって保持し、基板1の表面3にはモールド4のパターン形成面5を当設させる。また基板1の裏面6には、前記モールド4の基板1に対する当設部分に対向して加圧構造体7の押圧面9を押しつける。モールド4は前記加圧構造体7とは独立して上下動可能な可動部材8の下面に固定される。   FIG. 1B is a schematic cross-sectional view showing the basic configuration of the present invention and the operation during imprint operation. The periphery of the substrate 1 is held by a substrate holding member 2, and the surface 3 of the substrate 1 has a mold 4. The pattern forming surface 5 is provided. Further, the pressing surface 9 of the pressing structure 7 is pressed against the back surface 6 of the substrate 1 so as to face the portion of the mold 4 that is in contact with the substrate 1. The mold 4 is fixed to the lower surface of the movable member 8 that can move up and down independently of the pressure structure 7.

本発明は上記のような構成を採用することにより、例えば図1(a)に示すように、最初に基板1を支持していたときの基板1の自由保持状態での支持線aが水平であって、その垂直の作用線がcであるとき、基板1の表面3にインプリントするモールド4の加圧軸線bが、図1(a)に示すように垂直作用線cに対して角度αだけ傾いていたとき、基板1に対して押圧する加圧構造体7の押圧力によって、加圧構造体7とモールド4に挟持された基板部分は、図1(a)に示すように基板の弾性変形により同じ角度だけ傾斜して追従した状態でインプリントされる。   In the present invention, by adopting the above-described configuration, for example, as shown in FIG. 1A, when the substrate 1 is first supported, the support line a in the free holding state of the substrate 1 is horizontal. When the vertical action line is c, the pressing axis b of the mold 4 imprinted on the surface 3 of the substrate 1 has an angle α with respect to the vertical action line c as shown in FIG. The substrate portion sandwiched between the pressing structure 7 and the mold 4 by the pressing force of the pressing structure 7 that presses against the substrate 1 when tilted only as shown in FIG. Imprinting is performed in the state of following the same angle with an elastic deformation.

上記のような基板1の周辺支持を行い、基板1の表面3側では可動部材8とともにモールド4が降下し、基板1の裏面6側では加圧構造体7が上昇してその間で基板1を挟んでインプリントを行う作動によって、基板1の支持線aに対して直角な作用線cに対してα傾斜しているときでも、基板1の弾性によってその傾斜に追従することができ、同様の原理によって図1(c)に示すように、同図(a)とは逆方向に加圧軸線bが−αだけ相対的に傾斜しているときも、基板1がその傾斜に追従できるため、正確なインプリントを行うことができる。   The periphery of the substrate 1 is supported as described above, and the mold 4 is lowered together with the movable member 8 on the front surface 3 side of the substrate 1, and the pressing structure 7 is raised on the back surface 6 side of the substrate 1. By the operation of performing imprinting while sandwiching, even when the α is inclined with respect to the action line c perpendicular to the support line a of the substrate 1, the inclination can be followed by the elasticity of the substrate 1. As shown in FIG. 1C according to the principle, the substrate 1 can follow the inclination even when the pressing axis b is inclined relative to −α in the opposite direction to that shown in FIG. Accurate imprinting can be performed.

上記実施例においては加圧構造体7がほとんど弾性変形を行わない材質であっても、基板1の表面3側に固定して配置されるモールド4と、裏面6側に上下動自在に配置されて基板1を局所的に加圧する加圧構造体7とを正確に同一加圧軸線b上に配置しておくことにより、例え基板1の支持線aに対して直角に配置されていない場合でも、基板1の裏面6側から加圧構造体7を押し上げて、モールド4と加圧構造体7間で基板1を挟み込むことによって正確なインプリントを行うことができる。   In the above embodiment, even if the pressurizing structure 7 is made of a material that hardly undergoes elastic deformation, it is disposed so as to be movable up and down on the mold 4 fixed on the front surface 3 side of the substrate 1 and on the back surface 6 side. By arranging the pressurizing structure 7 that pressurizes the substrate 1 locally on the same pressurizing axis b, even if it is not arranged at right angles to the support line a of the substrate 1 By pressing up the pressure structure 7 from the back surface 6 side of the substrate 1 and sandwiching the substrate 1 between the mold 4 and the pressure structure 7, accurate imprinting can be performed.

但し、基板1がほぼ均一な平板状であるときには、加圧構造体7がほとんど弾性変形を行わない材質であっても上記作動によって正確なインプリントを行うことができるが、例えば図2(b)に示すように基板1の一部が突出した略かまぼこ状に変形しているときには、図1に示す態様でインプリントを行っても、例えば図2(a)のモールドを透明平板として実験を行った例で示されるように、突出部の先端のみが接触し均一なインプリントを行うことができない。このような基板の場合は、例えば図2(c)に示すように、加圧構造体7を傾斜可能に支持して押圧を行っても、突出部のみが接触する状態には変わりなく、上記問題を解決することができない。このような問題はモールドやほとんど弾性変形を行わない材質の構造体の表面が平坦でない場合も起こりうる。   However, when the substrate 1 has a substantially uniform flat plate shape, even if the pressing structure 7 is made of a material that hardly undergoes elastic deformation, accurate imprinting can be performed by the above operation. For example, FIG. 2), when the imprinting is performed in the form shown in FIG. 1, for example, the mold shown in FIG. 2A is used as a transparent flat plate. As shown in the performed example, only the tip of the projecting portion is in contact, and uniform imprinting cannot be performed. In the case of such a substrate, for example, as shown in FIG. 2 (c), even if the pressing structure 7 is supported so as to be tilted and pressed, only the projecting portions are in contact with each other. The problem cannot be solved. Such a problem can also occur when the surface of the mold or a structure made of a material that hardly undergoes elastic deformation is not flat.

それに対して、図2(d)に示すように加圧構造体7を弾性体で形成するときには、基板1の前記突出部がモールド4によって加圧構造体7側に押圧される結果、基板1の変形によって突出部が弾性を有する加圧構造体7側に膨出し、モールド4側はほぼ平坦面となる。それにより基板1の表面3に対して正確なインプリントを行うことができる。なお、上記の実験はモールドを平板とし、また基板も1枚の板で形成した状態を示したが、実際のインプリント時には図2(e)に示すように、モールド下面にパターン9が形成され、基板1の表面には液体または固体の樹脂10が塗布されるが、上記態様は同様である。   On the other hand, when the pressurizing structure 7 is formed of an elastic body as shown in FIG. 2 (d), the projecting portion of the substrate 1 is pressed toward the pressurizing structure 7 by the mold 4. Due to this deformation, the protruding portion bulges toward the pressure structure 7 having elasticity, and the mold 4 side becomes a substantially flat surface. As a result, accurate imprinting can be performed on the surface 3 of the substrate 1. Although the above experiment shows a state in which the mold is a flat plate and the substrate is formed of a single plate, a pattern 9 is formed on the lower surface of the mold as shown in FIG. A liquid or solid resin 10 is applied to the surface of the substrate 1, and the above-described aspect is the same.

前記のように、周囲を固定した基板1の上下を挟むように、上方からモールド4を、下方から加圧構造体7を移動させるとき、モールド4の下面と加圧構造体7の上面とが平行でないときの上記のような問題を解決するためには、例えば図3(a)に示すように、加圧構造体7を押し棒11と押圧部材12の2部材で形成し、押圧部材12は柔軟性のある樹脂やゴム等の所定の弾性力を備えた部材で形成する。図3(a)に示す例においては押し棒11の先端を平坦にした例を示したが、この部分を例えば図3(b)に示すように例えば球面等の凸状曲面をなすように形成し、傾斜面への対応をより柔軟に行うことができる。前記押し棒の押圧先端部は前記柔軟性部材との接触ないし接続部分において微少移動や変形等により前記柔軟性部材の傾斜を可能ならしめる構造であれば、種々の形状にすることができる。   As described above, when the mold 4 is moved from above and the pressurizing structure 7 is moved from below so as to sandwich the upper and lower sides of the substrate 1 whose periphery is fixed, the lower surface of the mold 4 and the upper surface of the pressurizing structure 7 are In order to solve the above-mentioned problem when not parallel, for example, as shown in FIG. 3A, the pressing structure 7 is formed by two members of the pressing rod 11 and the pressing member 12, and the pressing member 12. Is formed of a member having a predetermined elastic force such as a flexible resin or rubber. In the example shown in FIG. 3A, an example in which the tip of the push rod 11 is flattened is shown, but this portion is formed so as to form a convex curved surface such as a spherical surface as shown in FIG. 3B, for example. In addition, it is possible to flexibly cope with the inclined surface. The pressing tip of the push rod can be formed in various shapes as long as the structure allows the flexible member to be inclined by slight movement or deformation at the contact or connection portion with the flexible member.

図3(b)に示した加圧構造体7を用いてインプリントを行うときには、同図(c)に示すようになされる。即ち、周囲を基板保持部材2で固定した基板1に対して上側にモールド4、下側に前記弾性材料からなる押圧部材12を配置したとき、例えばモールド4が加圧構造体7及び基板1に対して傾いていたときにおいて、その状態で加圧構造体7及びモールド4を基板1側に移動させてインプリントを行うと、押圧部材12の弾性によってモールド及び基板の傾斜やうねりが吸収され、基板1の表面3に対してモールド4のパターン形成面5が全面にわたって均等な力で押圧されるため、正確なインプリントを行うことができる。   When imprinting is performed using the pressurizing structure 7 shown in FIG. 3B, the printing is performed as shown in FIG. That is, when the mold 4 is arranged on the upper side and the pressing member 12 made of the elastic material is arranged on the lower side with respect to the substrate 1 whose periphery is fixed by the substrate holding member 2, for example, the mold 4 is attached to the pressing structure 7 and the substrate 1. When the pressure structure 7 and the mold 4 are moved to the substrate 1 side in this state and the imprint is performed, the mold and the substrate are inclined and waved by the elasticity of the pressing member 12, Since the pattern forming surface 5 of the mold 4 is pressed against the surface 3 of the substrate 1 over the entire surface with uniform force, accurate imprinting can be performed.

上記のような加圧構造体7の弾性材料からなる押圧部材12は、前記のような押圧部材12全体を弾性材料で形成する以外に、例えば図4に示すように形成しても良い。即ち図4(a)に示す加圧構造体7においては、内部に押圧室14を備えた押圧部材12を、少なくともその頂面部分15では、その部分を薄く形成する等によって弾性を有するように作製する。押圧室14内には例えば液体、気体、ゲル、エラストマー等の物質のように、前記頂面部分15よりも柔らかい材料からなる変形材16を、硬質の蓋部材17で閉鎖した状態とし、蓋部材17の下面に前記図3(a)と同様の押し棒11を当接して下方からこの押圧部材12を基板1に対して押圧可能とする。   The pressing member 12 made of the elastic material of the pressurizing structure 7 as described above may be formed as shown in FIG. 4, for example, in addition to forming the entire pressing member 12 as described above with an elastic material. That is, in the pressurizing structure 7 shown in FIG. 4A, the pressing member 12 provided with the pressing chamber 14 is provided with elasticity at least at the top surface portion 15 by forming the portion thinly. Make it. In the pressing chamber 14, a deformable material 16 made of a material softer than the top surface portion 15, such as a substance such as liquid, gas, gel, or elastomer, is closed with a hard lid member 17, and the lid member A pressing rod 11 similar to that shown in FIG. 3A is brought into contact with the lower surface of 17 so that the pressing member 12 can be pressed against the substrate 1 from below.

このような加圧構造体7を用いる場合においても前記図3(b)と同様に、例えば図4(b)に示すようにその先端を球面とした押し棒13とすることにより、傾斜面への対応をより柔軟に行うことができるようになる。この加圧構造体7を用いてインプリントするときにおいて、前記図3(c)と同様の状態の図4(c)に示すようにモールド4が基板1に対して傾斜しているとき、同図(d)に示すように基板1をモールド4と押圧部材12で挟むように加圧構造体7を基板1の裏面から押し上げるとき、モールド4の傾斜に対応して変形材16が変形するため頂面が傾き、基板1の表面3とモールド4のパターン形成面5とは密着し、正確なインプリント行うことができる。なお、変形材16としては種々の物質を用いることができ、前記ゲル状物資の他、柔軟性袋等に収納した液体、気体等も用いることができる。なお、上記のような加圧構造体については、その接触面の形状をモールドの形状に適合するように設定するほか、更にはモールド間での圧力分布に適合するようにモールドとは異なった種々の形状に設定することができる。   Even in the case where such a pressure structure 7 is used, as shown in FIG. 3B, for example, as shown in FIG. Can be handled more flexibly. When imprinting using the pressure structure 7, when the mold 4 is inclined with respect to the substrate 1 as shown in FIG. 4C in the same state as FIG. When the pressurizing structure 7 is pushed up from the back surface of the substrate 1 so that the substrate 1 is sandwiched between the mold 4 and the pressing member 12 as shown in FIG. The top surface is inclined, the surface 3 of the substrate 1 and the pattern forming surface 5 of the mold 4 are in close contact, and accurate imprinting can be performed. Note that various materials can be used as the deformable material 16, and in addition to the gel-like material, a liquid, a gas, or the like stored in a flexible bag or the like can also be used. For the pressure structure as described above, the shape of the contact surface is set so as to be adapted to the shape of the mold, and further, various types different from the mold so as to be adapted to the pressure distribution between the molds. It can be set to the shape.

また、前記図4に示すような加圧構造体7における押圧部材12の頂面部分15を、モールドのパターンの状態、押圧条件等によって押圧面の周辺の圧力が弱くなる傾向、或いは逆に強くなる傾向が生じるので、その特性に合わせて例えば図5(a)に示すように周辺部分に突起22を形成してこの部分の基板を他の部分より強くモールドに当接するようにし、或いは図5(b)に示すように周辺部分の内側を薄く、中心側を厚く形成して、予め頂面部分の周辺領域の弾性特性及び押圧面全体における圧力分布状態を変化させるようにしても良い。その他、加圧用構造体の基板を、加圧する面上で圧力分布を変化させるには、例えば頂面の中心部分に突起を設け、或いは裏面に薄い部分を形成する等、更に種々の態様で実施することができる。   Further, the pressure on the top surface portion 15 of the pressing member 12 in the pressurizing structure 7 as shown in FIG. 4 tends to weaken the pressure around the pressing surface depending on the state of the mold pattern, pressing conditions, or the like. According to the characteristics, for example, as shown in FIG. 5A, a protrusion 22 is formed in the peripheral portion so that the substrate of this portion is in contact with the mold more strongly than the other portion, or FIG. As shown in (b), the inner side of the peripheral portion may be made thinner and the center side thicker, so that the elastic characteristics of the peripheral region of the top surface portion and the pressure distribution state in the entire pressing surface may be changed in advance. In addition, in order to change the pressure distribution on the surface to be pressurized of the substrate of the structure for pressurization, for example, a protrusion is provided at the central portion of the top surface, or a thin portion is formed on the back surface. can do.

本発明は前記のように、加圧構造体7を基板1の裏面側に配置し、基板1を押し上げて基板1の上方に配置しているモールド4に基板1を押し付けるようにしてインプリントを行うようにしたものであるが、その際に裏面側に配置する加圧構造体7の少なくとも押圧面部分を柔らかい材料で形成すると、以下に述べるような作用効果を奏する。即ち、例えば図6(a)に示すようにモールド4は通常堅い材料で形成されており、一方加圧構造体7の表面部分が堅い材料で形成されているときにおいて、基板1の製作誤差等により表面及び裏面が平坦ではないとき、加圧構造体7が基板1の裏面に当接すると基板1の裏面の凸部分にのみ接触し、他の部分に接触しないため、図示実施例では基板の中心部分が主として押圧され、特に図示実施例では基板1の表面側も中心部分が凸状となっていることもあり、モールド4の周辺部分Aが接触しないかインプリントの圧力が小さく、中心部分のみ、或いは中心部分が過剰な圧力でインプリントがなされることとなる。   In the present invention, as described above, the pressure structure 7 is disposed on the back side of the substrate 1, and the substrate 1 is pushed up to press the substrate 1 against the mold 4 disposed above the substrate 1. In this case, if at least the pressing surface portion of the pressurizing structure 7 disposed on the back surface side is formed of a soft material, the following effects can be obtained. That is, for example, as shown in FIG. 6 (a), the mold 4 is usually formed of a hard material. On the other hand, when the surface portion of the pressure structure 7 is formed of a hard material, the manufacturing error of the substrate 1 and the like. When the pressure structure 7 is in contact with the back surface of the substrate 1 when the front surface and the back surface are not flat, only the convex portion on the back surface of the substrate 1 is contacted and not the other portion. The central portion is mainly pressed, and in particular, in the illustrated embodiment, the central portion may be convex on the surface side of the substrate 1 so that the peripheral portion A of the mold 4 does not contact or the imprinting pressure is small, and the central portion Or the central portion is imprinted with excessive pressure.

それに対して、例えば図6(b)に示すように加圧構造体7が柔らかい材料であるときには、加圧構造体7の表面が基板1裏面の凹凸に沿って変形し、それにより加圧構造体7が基板1を押し上げる力が基板1の裏面に均等に作用する。そのため、同図(c)に示すようなインプリント時には、加圧構造体7が強い力で基板をモールド4側に押し上げ、またモールドもそれに対向して相対的に基板1を下方に押圧するので、図示するように加圧構造体7が基板1を変形させてモールド1に対して均等な力でインプリントすることとなる。したがって基板の変形にかかわらず、均等なインプリントが可能となる。   On the other hand, for example, as shown in FIG. 6B, when the pressure structure 7 is a soft material, the surface of the pressure structure 7 is deformed along the unevenness of the back surface of the substrate 1, thereby The force by which the body 7 pushes up the substrate 1 acts evenly on the back surface of the substrate 1. Therefore, at the time of imprinting as shown in FIG. 5C, the pressing structure 7 pushes the substrate toward the mold 4 with a strong force, and the mold also presses the substrate 1 relatively opposite to the mold. As shown in the figure, the pressing structure 7 deforms the substrate 1 and imprints the mold 1 with an equal force. Therefore, even imprinting is possible regardless of the deformation of the substrate.

本発明は、特に加圧構造体を基板の裏面から基板を押し上げるようにしてモールド1に押圧し、インプリントを行うようにしたものであるが、基板を押し上げることにより次のような作用をなす。即ち、インプリント作業を大気中で行おうとしたとき、図7(a)に示すように基板1の周囲に強い拘束力が無くほぼ自由支持されており、且つ基板1が波打つように形成されていて、特に中心部分が窪んでいる状態の時には、加圧構造体7が前記のように柔らかい材料であって基板1の裏面に密着していても、加圧構造体7によって基板1をモールド4側に押し上げてインプリントしようとしたときには、図中破線楕円形で囲んでいる中心部分Bに大気が挟まれて密閉され、この部分のインプリントに欠陥が発生する。   In the present invention, the pressurizing structure is pressed against the mold 1 so as to push up the substrate from the back surface of the substrate and imprinting is performed. . That is, when the imprint operation is performed in the atmosphere, as shown in FIG. 7 (a), there is no strong restraining force around the substrate 1, and the substrate 1 is formed to wave. In particular, when the central portion is depressed, even if the pressure structure 7 is a soft material as described above and is in close contact with the back surface of the substrate 1, the substrate 1 is molded into the mold 4 by the pressure structure 7. When imprinting is performed by pushing up to the side, the air is sandwiched and sealed in the central portion B surrounded by a broken-line ellipse in the drawing, and a defect occurs in the imprint of this portion.

それに対して、図7(b)に示すように、基板1の周囲を基板保持部材2で保持し、柔らかい材料からなる加圧構造体7を基板1の裏面から基板の自由保持状態よりも上方に押し上げると、基板の波打ち状態が解消して加圧構造体7の中心部分が最も高い凸状となって、その表面が上方のモールド4に押し付けられるため、その過程で前記のような同図(a)に示す中心部分の密封空間が形成されることが無くなり、前記のようなインプリントにおける欠陥の発生を防止することができる。   On the other hand, as shown in FIG. 7B, the periphery of the substrate 1 is held by the substrate holding member 2, and the pressurizing structure 7 made of a soft material is placed above the free holding state of the substrate from the back surface of the substrate 1. When the substrate is pushed up, the corrugated state of the substrate is eliminated and the central portion of the pressure structure 7 becomes the highest convex shape, and the surface thereof is pressed against the upper mold 4. The sealed space in the central portion shown in (a) is not formed, and the occurrence of defects in the imprint as described above can be prevented.

また、図7に示すようなインプリントを液状の樹脂を用いて行うときには、図7(a)に対応する図8(a)のように中心部分Bに液状の樹脂が挟まれて密封されることとなり、基板とモールドが近接できなくなるためこの部分の膜厚が極端に大きくなってしまう。それに対して前記図7(b)に対応する図8(b)に示すように、基板1の周囲を基板保持部材2で保持し、柔らかい材料からなる加圧構造体7を基板1の裏面から押し上げると、基板の波打ち状態が解消して加圧構造体7の中心部分が最も高い凸状となることは前記と同様であり、この状態で基板1の表面が上方のモールド4に押し付けられるため、その過程で中心部の液状の樹脂は周囲に押し出され、最終的に前記のような液状の樹脂の密封が無い状態でモールド1に押し当てられてインプリントがなされる。   Further, when imprinting as shown in FIG. 7 is performed using a liquid resin, the liquid resin is sandwiched and sealed in the central portion B as shown in FIG. 8A corresponding to FIG. 7A. In other words, since the substrate and the mold cannot be brought close to each other, the film thickness of this portion becomes extremely large. On the other hand, as shown in FIG. 8B corresponding to FIG. 7B, the periphery of the substrate 1 is held by the substrate holding member 2, and the pressurizing structure 7 made of a soft material is removed from the back surface of the substrate 1. When pushed up, the undulating state of the substrate is eliminated and the central portion of the pressure structure 7 becomes the highest convex shape, as described above. In this state, the surface of the substrate 1 is pressed against the upper mold 4. In the process, the liquid resin at the center is pushed out to the periphery, and finally pressed against the mold 1 without sealing the liquid resin as described above, and imprinting is performed.

上記のような本発明について、故意にモールドと基板の平行性を悪くして均一インプリントを阻害する状況でインプリントのテストを行なったところ、1mrad程度の平行性が確保されるだけでも均一な加圧が可能なことが確かめられた。また、加圧構造体にゲルを封入することにより、単一材料の加圧構造体よりも均一性が良好な加圧が可能となることを確認した。   Regarding the present invention as described above, when imprinting was performed in a situation where the imprinting was intentionally deteriorated and the uniform imprinting was inhibited, it was uniform even if the parallelism of about 1 mrad was ensured. It was confirmed that pressurization was possible. Moreover, it was confirmed that by applying the gel to the pressurizing structure, pressurization having better uniformity than the pressurizing structure of a single material can be performed.

また、上記のような加圧構造体7を上方に移動し基板をモールドに加圧するに際しては種々の手法を採用することができるが、例えばリニアアクチュエータ、モータ、ボイスコイル、ピエゾ素子等の電動アクチュエータ、更には気体圧力や液体圧力等の流体アクチュエータ等を利用することができる。更に、インプリントの作動に際しては、基板を裏面から加圧する加圧構造体の機構と試料間の荷重を計測するための荷重計測装置を設けると、より正確なインプリントを行うことができる。また、裏面加圧機構の加圧部分の位置を計測するための位置計測装置を用いると、更に正確なインプリント制御が可能となる。   In addition, various methods can be employed for moving the pressurizing structure 7 as described above to pressurize the substrate to the mold. For example, an electric actuator such as a linear actuator, a motor, a voice coil, or a piezoelectric element. Furthermore, fluid actuators such as gas pressure and liquid pressure can be used. Further, when imprinting is performed, more accurate imprinting can be performed by providing a mechanism of a pressure structure that pressurizes the substrate from the back surface and a load measuring device for measuring the load between the samples. Further, when a position measuring device for measuring the position of the pressing portion of the back surface pressing mechanism is used, more accurate imprint control can be performed.

本発明の実施例の説明図である。It is explanatory drawing of the Example of this invention. インプリントの各種態様を示す図である。It is a figure which shows the various aspects of imprint. 本発明の他の実施例の説明図である。It is explanatory drawing of the other Example of this invention. 本発明の更に他の実施例の説明図である。It is explanatory drawing of other Example of this invention. 本発明の更に各種の実施の態様を示す図である。It is a figure which shows the various various embodiment of this invention. 本発明による作用を示す図である。It is a figure which shows the effect | action by this invention. 本発明によるインプリントを大気中で行うときに作用を示す図である。It is a figure which shows an effect | action when imprinting by this invention is performed in air | atmosphere. 本発明によるインプリントを液体中で行うときに作用を示す図である。It is a figure which shows an effect | action when performing the imprint by this invention in a liquid. 従来から行われているインプリントの説明図である。It is explanatory drawing of the imprint conventionally performed. 従来例のインプリント時の説明図である。It is explanatory drawing at the time of the imprint of a prior art example. 他の従来例のインプリント時の説明図である。It is explanatory drawing at the time of the imprint of another prior art example. 更に他の従来例のインプリント時の説明図である。It is explanatory drawing at the time of the imprint of another prior art example.

符号の説明Explanation of symbols

1 基板
2 基板保持部材
3 表面
4 モールド
5 パターン形成面
6 裏面
7 加圧構造体
8 可動部材
9 押圧面
DESCRIPTION OF SYMBOLS 1 Substrate 2 Substrate holding member 3 Front surface 4 Mold 5 Pattern formation surface 6 Back surface 7 Pressure structure 8 Movable member 9 Press surface

Claims (12)

薄い基板の周囲を保持し、
前記基板の下方には上下動自在に加圧用構造体を配置し、
前記基板の上方には前記加圧用構造体に対向してモールドを配置し、
前記加圧用構造体を上昇させて前記基板の裏面を押圧し、基板の自由保持位置より上方で基板表面を前記モールドに押圧しインプリントすることを特徴とする裏面加圧によるインプリント方法。
Hold around the thin substrate,
A pressurizing structure is arranged below the substrate so as to be movable up and down,
A mold is disposed above the substrate so as to face the pressing structure,
An imprinting method by backside pressing, wherein the pressing structure is raised to press the backside of the substrate, and the substrate surface is pressed against the mold above the free holding position of the substrate for imprinting.
前記加圧用構造体は、モールド及び基板よりも柔軟な物質からなることを特徴とする請求項1記載の裏面加圧によるインプリント方法。   2. The imprint method according to claim 1, wherein the pressing structure is made of a material that is more flexible than the mold and the substrate. 表面にインプリントする薄い基板と、
前記基板の周囲を保持する基板保持部材と、
前記基板の下方に上下動自在に配置した加圧用構造体と、
前記基板の上方に前記加圧用構造体に対向して配置したモールドと、
前記加圧用構造体を上昇させて前記基板の裏面を押圧し、基板の自由保持位置より上方で基板表面を前記モールドに押圧してインプリントする押圧手段とを備えたことを特徴とする裏面加圧によるインプリント装置。
A thin substrate imprinted on the surface;
A substrate holding member for holding the periphery of the substrate;
A pressurizing structure disposed below the substrate so as to be movable up and down;
A mold disposed above the substrate and facing the structure for pressurization;
And a pressing means for pressing the back surface of the substrate by raising the pressing structure and pressing the substrate surface against the mold above the free holding position of the substrate for imprinting. Imprint device by pressure.
前記加圧用構造体は、モールド及び基板よりも柔軟な物質からなることを特徴とする請求項3記載の裏面加圧によるインプリント装置。   4. The imprint apparatus according to claim 3, wherein the pressing structure is made of a material that is more flexible than the mold and the substrate. 前記加圧用構造体は、頂面部分を薄く形成した弾性押圧部材の内部に、液体、気体、ゲル、エラストマーのいずれかの物質からなる変形材を収容したことを特徴とする請求項3記載の裏面加圧によるインプリント装置。   The said structure for pressurization has accommodated the deformation material which consists of a substance of either a liquid, gas, a gel, and an elastomer in the inside of the elastic press member which formed the top part thinly. Imprint device by backside pressure. 前記加圧用構造体は、前記柔軟性部材を下面から押圧する押し棒を備え、
前記押し棒は押圧先端部が凸状曲面をなすことを特徴とする請求項4記載の裏面加圧によるインプリント装置。
The structure for pressurization includes a push bar that presses the flexible member from the lower surface,
5. The imprint apparatus according to claim 4, wherein the push rod has a convex curved surface at a pressing tip.
前記加圧用構造体は、リニアアクチュエータ、モータ、ボイスコイル、ピエゾ素子等の電動アクチュエータ、気体圧力や液体圧力等の流体アクチュエータのいずれかにより移動することを特徴とする請求項3記載の裏面加圧によるインプリント装置。   4. The back surface pressurization according to claim 3, wherein the pressurizing structure is moved by any one of a linear actuator, an electric actuator such as a motor, a voice coil, and a piezo element, and a fluid actuator such as a gas pressure and a liquid pressure. By imprint device. インプリント作動時における前記加圧用構造体と基板間の荷重を計測する荷重計測装置を備えることを特徴とする請求項3記載の裏面加圧によるインプリント装置。   4. The imprint apparatus according to claim 3, further comprising a load measuring device that measures a load between the pressing structure and the substrate during the imprint operation. 前記加圧用構造体の加圧部分の位置を計測する位置計測装置を備えたことを特徴とする請求項3記載の裏面加圧によるインプリント装置。   The imprint apparatus according to claim 3, further comprising a position measuring device that measures a position of a pressing portion of the pressing structure. 前記加圧用構造体の基板を加圧する面に圧力分布を変化させる手段を備えたことを特徴とする請求項3記載の裏面加圧によるインプリント装置。   4. The imprint apparatus according to claim 3, further comprising means for changing a pressure distribution on a surface of the pressing structure that presses the substrate. 前記加圧用構造体の基板を加圧する面に圧力分布を変化させる手段は、該加圧する面の表面または裏面に形成した凹凸であることを特徴とする請求項11記載の裏面加圧によるインプリント装置。   12. The imprint by back surface pressurization according to claim 11, wherein the means for changing the pressure distribution on the surface of the pressing structure for pressing the substrate is unevenness formed on the front surface or the back surface of the pressing surface. apparatus. 前記加圧用構造体の基板を加圧する面が、微小な力により傾斜が可変となるように設定していることを特徴とする請求項3記載の裏面加圧によるインプリント装置。   4. The imprint apparatus according to claim 3, wherein the surface of the pressing structure that presses the substrate is set so that the inclination is variable by a minute force.
JP2005154854A 2005-05-27 2005-05-27 Imprint method and apparatus by back surface pressurization Active JP4595120B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005154854A JP4595120B2 (en) 2005-05-27 2005-05-27 Imprint method and apparatus by back surface pressurization

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005154854A JP4595120B2 (en) 2005-05-27 2005-05-27 Imprint method and apparatus by back surface pressurization

Publications (2)

Publication Number Publication Date
JP2006332391A true JP2006332391A (en) 2006-12-07
JP4595120B2 JP4595120B2 (en) 2010-12-08

Family

ID=37553756

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005154854A Active JP4595120B2 (en) 2005-05-27 2005-05-27 Imprint method and apparatus by back surface pressurization

Country Status (1)

Country Link
JP (1) JP4595120B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009248503A (en) * 2008-04-09 2009-10-29 Hitachi High-Technologies Corp Microstructure transfer device
JP2010089136A (en) * 2008-10-09 2010-04-22 Hitachi Industrial Equipment Systems Co Ltd Precision press device
JP2014043104A (en) * 2013-09-30 2014-03-13 Toshiba Mach Co Ltd Sheet-like member holder, sheet-like member installation apparatus and sheet-like member installation method
KR101624635B1 (en) * 2015-04-06 2016-05-27 주식회사 휴템 Apparatus for manufacturing replica stamp and method for manufacturing replica stamp

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4584157A (en) * 1983-04-25 1986-04-22 Arrem Plastics, Inc. Method for double-side thermoforming
JP2003077867A (en) * 2001-09-04 2003-03-14 National Institute Of Advanced Industrial & Technology Moving stage for imprint lithography
JP2003517727A (en) * 1999-10-29 2003-05-27 ボード・オブ・リージエンツ,ザ・ユニバーシテイ・オブ・テキサス・システム High precision orientation alignment and gap control devices for imprint lithography
JP2004146601A (en) * 2002-10-24 2004-05-20 National Institute Of Advanced Industrial & Technology Active double joint pressing mechanism
JP2004288804A (en) * 2003-03-20 2004-10-14 Hitachi Ltd Nano-printer and microstructure transfer method
JP2005101201A (en) * 2003-09-24 2005-04-14 Canon Inc Nano-imprint system
JP2006212859A (en) * 2005-02-02 2006-08-17 Matsushita Electric Ind Co Ltd Molding method and molding machine
JP2006229232A (en) * 2005-02-17 2006-08-31 Asml Netherlands Bv Imprint lithography
JP2006527677A (en) * 2003-06-19 2006-12-07 エナージー コンバーション デバイセス インコーポレイテッド Method for melt-molding optical disk substrate
JP2008524854A (en) * 2004-12-16 2008-07-10 エーエスエムエル ホールディング エヌ.ブイ. System and method for forming nanodisks used in imprint lithography and nanodisks and memory disks formed thereby

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4584157A (en) * 1983-04-25 1986-04-22 Arrem Plastics, Inc. Method for double-side thermoforming
JP2003517727A (en) * 1999-10-29 2003-05-27 ボード・オブ・リージエンツ,ザ・ユニバーシテイ・オブ・テキサス・システム High precision orientation alignment and gap control devices for imprint lithography
JP2003077867A (en) * 2001-09-04 2003-03-14 National Institute Of Advanced Industrial & Technology Moving stage for imprint lithography
JP2004146601A (en) * 2002-10-24 2004-05-20 National Institute Of Advanced Industrial & Technology Active double joint pressing mechanism
JP2004288804A (en) * 2003-03-20 2004-10-14 Hitachi Ltd Nano-printer and microstructure transfer method
JP2006527677A (en) * 2003-06-19 2006-12-07 エナージー コンバーション デバイセス インコーポレイテッド Method for melt-molding optical disk substrate
JP2005101201A (en) * 2003-09-24 2005-04-14 Canon Inc Nano-imprint system
JP2008524854A (en) * 2004-12-16 2008-07-10 エーエスエムエル ホールディング エヌ.ブイ. System and method for forming nanodisks used in imprint lithography and nanodisks and memory disks formed thereby
JP2006212859A (en) * 2005-02-02 2006-08-17 Matsushita Electric Ind Co Ltd Molding method and molding machine
JP2006229232A (en) * 2005-02-17 2006-08-31 Asml Netherlands Bv Imprint lithography

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009248503A (en) * 2008-04-09 2009-10-29 Hitachi High-Technologies Corp Microstructure transfer device
JP2010089136A (en) * 2008-10-09 2010-04-22 Hitachi Industrial Equipment Systems Co Ltd Precision press device
JP2014043104A (en) * 2013-09-30 2014-03-13 Toshiba Mach Co Ltd Sheet-like member holder, sheet-like member installation apparatus and sheet-like member installation method
KR101624635B1 (en) * 2015-04-06 2016-05-27 주식회사 휴템 Apparatus for manufacturing replica stamp and method for manufacturing replica stamp

Also Published As

Publication number Publication date
JP4595120B2 (en) 2010-12-08

Similar Documents

Publication Publication Date Title
USRE47483E1 (en) Template having a varying thickness to facilitate expelling a gas positioned between a substrate and the template
JP3588633B2 (en) Moving stage for imprint lithography
JP3958344B2 (en) Imprint apparatus, imprint method, and chip manufacturing method
KR101679464B1 (en) Imprint apparatus and method of manufacturing article
US6980282B2 (en) Method for modulating shapes of substrates
JP5117318B2 (en) Nanoimprinting stamper and fine structure transfer apparatus using the stamper
US7803308B2 (en) Technique for separating a mold from solidified imprinting material
TWI336422B (en) Method for expelling gas positioned between a substrate and a mold
JP5411557B2 (en) Microstructure transfer device
JP5232077B2 (en) Microstructure transfer device
US20070126150A1 (en) Bifurcated contact printing technique
US7547205B2 (en) Microimprint/nanoimprint uniform pressing apparatus
CN106030756B (en) Asymmetric template shape adjustment for local area imprinting
US8603383B2 (en) Original and article manufacturing method using same
JP2004504714A (en) Automatic liquid dispensing method and system for transfer lithography process
JPWO2008126312A1 (en) Thermal imprint apparatus and thermal imprint method
KR20130073890A (en) Separation control substrate/template for nanoimprint lithography
JP4595120B2 (en) Imprint method and apparatus by back surface pressurization
JP2018092996A (en) Imprint method, imprint device, mold, and method of manufacturing article
JP6592659B2 (en) ROLLER PRESSURE DEVICE, IMPRINT DEVICE, AND ROLLER PRESSURE METHOD
JP5355614B2 (en) Sheet-like device manufacturing apparatus and sheet-like device manufacturing method
JP5822597B2 (en) Imprint apparatus and article manufacturing method using the same
TWI654060B (en) Imprinting device, imprinting method and article manufacturing method
JP5380032B2 (en) Sheet-shaped member holder, sheet-shaped member installation device, and sheet-shaped member installation method
JP2019220526A (en) Molding apparatus for molding composition on substrate using mold, molding method, and method of manufacturing article

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070314

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20091210

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20091215

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100114

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100831

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100901

R150 Certificate of patent or registration of utility model

Ref document number: 4595120

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131001

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131001

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250