JP2005291823A - 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 - Google Patents
液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 Download PDFInfo
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- JP2005291823A JP2005291823A JP2004105109A JP2004105109A JP2005291823A JP 2005291823 A JP2005291823 A JP 2005291823A JP 2004105109 A JP2004105109 A JP 2004105109A JP 2004105109 A JP2004105109 A JP 2004105109A JP 2005291823 A JP2005291823 A JP 2005291823A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
- B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
- B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
- B01L3/5088—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above confining liquids at a location by surface tension, e.g. virtual wells on plates, wires
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
- B01L2200/06—Fluid handling related problems
- B01L2200/0678—Facilitating or initiating evaporation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/4022—Concentrating samples by thermal techniques; Phase changes
- G01N2001/4027—Concentrating samples by thermal techniques; Phase changes evaporation leaving a concentrated sample
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
【解決手段】 X線又はレーザーを照射源とする元素分析装置に用いる液体試料Sを濃縮するにあたり、撥水性樹脂の薄膜又は撥水性物質2がコーティングされた有機薄膜3の上に液体試料Sを滴下し、濃縮に伴って結晶が生じやすい液体試料である場合には、予め流動パラフィン又は界面活性剤を添加した液体試料を滴下し、溶媒の蒸発により液体試料Sを濃縮して、液体試料Sに含有される微量元素(目的成分)を一点に凝集濃縮させる。
【選択図】 図4
Description
2 撥水性物質
3 有機薄膜
4 開口部
5 支持部材
6 界面活性剤
S 液体試料
s 凝縮試料
Claims (5)
- 1.24eV以上のエネルギーを照射源とする元素分析装置に用いる液体試料を濃縮するにあたり、撥水性樹脂の薄膜又は撥水性物質がコーティングされた有機薄膜の上に液体試料を滴下し、溶媒の蒸発により液体試料を濃縮することを特徴とする1.24eV以上のエネルギーを照射源とする元素分析装置用液体試料の濃縮方法。
- 流動パラフィン又は界面活性剤を液体試料に添加し、当該液体試料を滴下することを特徴とする請求項1に記載の1.24eV以上のエネルギーを照射源とする元素分析装置用液体試料の濃縮方法。
- 請求項1又は2に記載の濃縮方法に用いる液体試料濃縮用保持台であって、撥水性樹脂の薄膜又は撥水性物質がコーティングされた有機薄膜と、それを開口部に張りわたした状態に支持するための支持部材とから構成された液体試料濃縮用保持台。
- 請求項3に記載された液体試料濃縮用保持台における撥水性樹脂の薄膜又は撥水性物質がコーティングされた有機薄膜の上に液体試料を滴下し、溶媒の蒸発により液体試料を濃縮し、濃縮された試料にX線を照射し、試料から発生した蛍光X線を測定して試料中に含まれる微量元素を分析することを特徴とする蛍光X線分析法。
- 請求項3に記載された液体試料濃縮用保持台における撥水性樹脂の薄膜又は撥水性物質がコーティングされた有機薄膜の上に液体試料を滴下し、溶媒の蒸発により液体試料を濃縮し、濃縮された試料にレーザーを照射し、試料から蒸発したガス成分を測定して試料中に含まれる微量元素を分析することを特徴とするレーザーアブレーション/誘導結合プラズマ質量分析法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004105109A JP4522739B2 (ja) | 2004-03-31 | 2004-03-31 | 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 |
US11/085,365 US20050239211A1 (en) | 2004-03-31 | 2005-03-21 | Concentration method and apparatus of preparing a liquid specimen for a trace element analysis system |
DE602005011696T DE602005011696D1 (de) | 2004-03-31 | 2005-03-30 | Verfahren zur Konzentration einer flüssigen Probe und Verfahren zur Spurenelementanalyse unter Verwendung dieses Verfahrens |
EP05006913A EP1582855B1 (en) | 2004-03-31 | 2005-03-30 | Concentration method of liquid specimen and trace element analysis method using same |
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JP2004105109A JP4522739B2 (ja) | 2004-03-31 | 2004-03-31 | 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 |
Publications (2)
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JP2005291823A true JP2005291823A (ja) | 2005-10-20 |
JP4522739B2 JP4522739B2 (ja) | 2010-08-11 |
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JP2004105109A Expired - Lifetime JP4522739B2 (ja) | 2004-03-31 | 2004-03-31 | 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 |
Country Status (4)
Country | Link |
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US (1) | US20050239211A1 (ja) |
EP (1) | EP1582855B1 (ja) |
JP (1) | JP4522739B2 (ja) |
DE (1) | DE602005011696D1 (ja) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007163360A (ja) * | 2005-12-15 | 2007-06-28 | National Institute Of Advanced Industrial & Technology | 蛍光x線による溶液中元素の高精度分析方法 |
JP2008122144A (ja) * | 2006-11-09 | 2008-05-29 | Rigaku Industrial Co | 全反射蛍光x線分析用試料点滴基板および全反射蛍光x線分析装置ならびに全反射蛍光x線分析方法 |
JP2009082855A (ja) * | 2007-10-01 | 2009-04-23 | Hamamatsu Photonics Kk | 微粒子分散液製造方法および微粒子分散液製造装置 |
JP2009222615A (ja) * | 2008-03-18 | 2009-10-01 | Rigaku Corp | 蛍光x線分析用試料保持具ならびにそれを用いる蛍光x線分析方法および装置 |
DE112010000814T5 (de) | 2009-02-10 | 2012-02-09 | Hitachi High-Technologies Corp. | Immunanalytisches Verfahren und immunanalytisches System mit Verwendung der Massenspektrometertechnologie |
US8445019B2 (en) | 2007-09-26 | 2013-05-21 | Hamamatsu Photonics K.K. | Microparticle dispersion liquid manufacturing method and microparticle dispersion liquid manufacturing apparatus |
JP5870439B1 (ja) * | 2015-04-02 | 2016-03-01 | 株式会社東レリサーチセンター | マイクロ分光分析用試料台の作製方法 |
KR20230088013A (ko) * | 2021-12-10 | 2023-06-19 | 한국세라믹기술원 | 미소 충전 샘플링에 의한 peb 유도 에너지 분석 방법 |
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ATE534893T1 (de) * | 2005-10-06 | 2011-12-15 | Rhodia Operations | Mikrofluidverdampfer und verfahren zur bestimmung physikalischer und/oder chemischer eigenschaften chemischer verbindungen oder von gemischen chemischer verbindungen |
US11786036B2 (en) | 2008-06-27 | 2023-10-17 | Ssw Advanced Technologies, Llc | Spill containing refrigerator shelf assembly |
US8286561B2 (en) | 2008-06-27 | 2012-10-16 | Ssw Holding Company, Inc. | Spill containing refrigerator shelf assembly |
IT1394445B1 (it) * | 2008-08-29 | 2012-06-15 | Calmed S R L | Dispositivo concentratore e localizzatore di un soluto e procedimento per concentrare e localizzare un soluto |
CA2739920C (en) | 2008-10-07 | 2017-12-12 | Ross Technology Corporation | Spill-resistant surfaces having hydrophobic and oleophobic borders |
FR2943785B1 (fr) * | 2009-03-31 | 2012-11-30 | Centre Nat Rech Scient | Procede de detection et de quantification d'analytes d'interet dans un liquide et dispositif de mise en oeuvre. |
WO2011056742A1 (en) | 2009-11-04 | 2011-05-12 | Ssw Holding Company, Inc. | Cooking appliance surfaces having spill containment pattern and methods of making the same |
JP5858441B2 (ja) | 2010-03-15 | 2016-02-10 | ロス テクノロジー コーポレーション.Ross Technology Corporation | プランジャーおよび疎水性表面を得るための方法 |
CN103476898A (zh) | 2011-02-21 | 2013-12-25 | 罗斯科技公司 | 具有低voc粘合剂体系的超疏水性和疏油性涂层 |
DE102011085428A1 (de) | 2011-10-28 | 2013-05-02 | Schott Ag | Einlegeboden |
WO2013090939A1 (en) | 2011-12-15 | 2013-06-20 | Ross Technology Corporation | Composition and coating for superhydrophobic performance |
AU2013281220B2 (en) | 2012-06-25 | 2017-03-16 | Ross Technology Corporation | Elastomeric coatings having hydrophobic and/or oleophobic properties |
US8741232B2 (en) | 2012-09-05 | 2014-06-03 | Faxitron Bioptics, Llc | Specimen imaging device and methods for use thereof |
FR3057354A1 (fr) | 2016-10-07 | 2018-04-13 | Commissariat A L’Energie Atomique Et Aux Energies Alternatives (Cea) | Procede de concentration d’analytes |
EP3721211A4 (en) | 2017-12-06 | 2021-08-18 | California Institute of Technology | SYSTEM FOR ANALYSIS OF A TEST SAMPLE AND PROCEDURE FOR IT |
JP2023120040A (ja) * | 2022-02-17 | 2023-08-29 | 株式会社島津製作所 | 乾燥用保持具、測定用試料の製造方法、および測定方法 |
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2004
- 2004-03-31 JP JP2004105109A patent/JP4522739B2/ja not_active Expired - Lifetime
-
2005
- 2005-03-21 US US11/085,365 patent/US20050239211A1/en not_active Abandoned
- 2005-03-30 EP EP05006913A patent/EP1582855B1/en not_active Expired - Fee Related
- 2005-03-30 DE DE602005011696T patent/DE602005011696D1/de not_active Expired - Fee Related
Patent Citations (5)
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JPH06224275A (ja) * | 1993-01-26 | 1994-08-12 | Toshiba Corp | 分析試料作製装置及びその使用方法 |
JPH06230002A (ja) * | 1993-02-01 | 1994-08-19 | Hitachi Ltd | 金属イオンの濃縮定量方法 |
JPH07297245A (ja) * | 1994-04-27 | 1995-11-10 | Piyuaretsukusu:Kk | 分析用試料板 |
US5544218A (en) * | 1994-10-28 | 1996-08-06 | Moxtek, Inc. | Thin film sample support |
US5958345A (en) * | 1997-03-14 | 1999-09-28 | Moxtek, Inc. | Thin film sample support |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007163360A (ja) * | 2005-12-15 | 2007-06-28 | National Institute Of Advanced Industrial & Technology | 蛍光x線による溶液中元素の高精度分析方法 |
JP2008122144A (ja) * | 2006-11-09 | 2008-05-29 | Rigaku Industrial Co | 全反射蛍光x線分析用試料点滴基板および全反射蛍光x線分析装置ならびに全反射蛍光x線分析方法 |
JP4537367B2 (ja) * | 2006-11-09 | 2010-09-01 | 株式会社リガク | 全反射蛍光x線分析用試料点滴基板および全反射蛍光x線分析装置ならびに全反射蛍光x線分析方法 |
US8445019B2 (en) | 2007-09-26 | 2013-05-21 | Hamamatsu Photonics K.K. | Microparticle dispersion liquid manufacturing method and microparticle dispersion liquid manufacturing apparatus |
US8563044B2 (en) | 2007-09-26 | 2013-10-22 | Hamamatsu Photonics K.K. | Microparticle dispersion liquid manufacturing method and microparticle dispersion liquid manufacturing apparatus |
JP2009082855A (ja) * | 2007-10-01 | 2009-04-23 | Hamamatsu Photonics Kk | 微粒子分散液製造方法および微粒子分散液製造装置 |
JP2009222615A (ja) * | 2008-03-18 | 2009-10-01 | Rigaku Corp | 蛍光x線分析用試料保持具ならびにそれを用いる蛍光x線分析方法および装置 |
DE112010000814T5 (de) | 2009-02-10 | 2012-02-09 | Hitachi High-Technologies Corp. | Immunanalytisches Verfahren und immunanalytisches System mit Verwendung der Massenspektrometertechnologie |
US8865418B2 (en) | 2009-02-10 | 2014-10-21 | Hitachi High-Technologies Corporation | Immunoanalytical method and system using mass spectrometry technology |
DE112010000814B4 (de) | 2009-02-10 | 2021-09-09 | Hitachi High-Tech Corporation | Immunanalytisches Verfahren und immunanalytisches System mit Verwendung der Massenspektrometertechnologie |
JP5870439B1 (ja) * | 2015-04-02 | 2016-03-01 | 株式会社東レリサーチセンター | マイクロ分光分析用試料台の作製方法 |
KR20230088013A (ko) * | 2021-12-10 | 2023-06-19 | 한국세라믹기술원 | 미소 충전 샘플링에 의한 peb 유도 에너지 분석 방법 |
KR102578658B1 (ko) | 2021-12-10 | 2023-09-14 | 한국세라믹기술원 | 미소 충전 샘플링에 의한 peb 유도 에너지 분석 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP1582855A3 (en) | 2006-07-19 |
EP1582855A2 (en) | 2005-10-05 |
EP1582855B1 (en) | 2008-12-17 |
JP4522739B2 (ja) | 2010-08-11 |
DE602005011696D1 (de) | 2009-01-29 |
US20050239211A1 (en) | 2005-10-27 |
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