JP2004352855A5 - Tape with adhesive for semiconductor, substrate for semiconductor connection, and semiconductor device - Google Patents

Tape with adhesive for semiconductor, substrate for semiconductor connection, and semiconductor device Download PDF

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Publication number
JP2004352855A5
JP2004352855A5 JP2003152112A JP2003152112A JP2004352855A5 JP 2004352855 A5 JP2004352855 A5 JP 2004352855A5 JP 2003152112 A JP2003152112 A JP 2003152112A JP 2003152112 A JP2003152112 A JP 2003152112A JP 2004352855 A5 JP2004352855 A5 JP 2004352855A5
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semiconductor
tape
adhesive
semiconductors
substrate
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JP2003152112A
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JP2004352855A (en
JP4547866B2 (en
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Priority claimed from JP2003152112A external-priority patent/JP4547866B2/en
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【特許請求の範囲】
【請求項1】有機絶縁性フィルム上に接着剤層および保護フィルム層を有する半導体用接着剤付きテープにおいて、硬化前の接着剤層の150℃における動的粘弾性の貯蔵弾性率Eが10≦E≦200kPaであり、かつ散逸率Tが0.25≦T≦0.6であり、該接着剤層中に含まれる沸点100〜250℃の溶剤の接着剤層中における総含有率が0.5〜2wt%であることを特徴とする半導体用接着剤付きテープ。
【請求項2】 有機絶縁性フィルム上に接着剤層および保護フィルム層を有する半導体用接着剤付きテープにおいて、硬化前の接着剤層の150℃における動的粘弾性の貯蔵弾性率Eが10≦E≦200kPaであり、かつ散逸率Tが0.25≦T≦0.6であり、該接着剤層が、重量平均分子量(Mw)が10,000未満である少なくとも1種の低分子ポリアミド樹脂と、100,000以上である少なくとも1種の高分子ポリアミド樹脂を含有することを特徴とする半導体用接着剤付きテープ。
【請求項3】接着剤層が、25℃において液体である炭素数12〜50の脂肪酸を含むことを特徴とする請求項1または2記載の半導体用接着剤付きテープ。
【請求項4】接着剤層が、フェノール樹脂を少なくとも1種類以上含むことを特徴とする請求項1〜3のいずれかに記載の半導体用接着剤付きテープ。
【請求項5】接着剤層が、エポキシ樹脂を少なくとも1種類以上含むことを特徴とする請求項1〜4のいずれかに記載の半導体用接着剤付きテープ。
【請求項】請求項1〜のいずれか記載の半導体用接着剤付きテープを用いてなる半導体接続用基板。
【請求項】請求項記載の半導体用接続用基板を用いてなる半導体装置。
[Claims]
    An adhesive tape for a semiconductor having an adhesive layer and a protective film layer on an organic insulating film, wherein the adhesive layer before curing has a storage elastic modulus E of dynamic viscoelasticity at 150 ° C. of 10 ≦ 10. E ≦ 200 kPa and the dissipation rate T is 0.25 ≦ T ≦ 0.6The total content of the solvent having a boiling point of 100 to 250 ° C. contained in the adhesive layer in the adhesive layer is 0.5 to 2 wt%.A tape with an adhesive for semiconductors, characterized in that:
    (2) In an adhesive tape for a semiconductor having an adhesive layer and a protective film layer on an organic insulating film, the storage elastic modulus E of the dynamic viscoelasticity at 150 ° C. of the adhesive layer before curing is 10 ≦ E ≦ 200 kPa. And an adhesive layer having a dissipation factor T of 0.25 ≦ T ≦ 0.6 and at least one low molecular weight polyamide resin having a weight average molecular weight (Mw) of less than 10,000; Characterized by containing at least one kind of high-molecular polyamide resin as described above.Tape with adhesive for semiconductor.
    3. The adhesive tape for a semiconductor according to claim 1, wherein the adhesive layer contains a fatty acid having 12 to 50 carbon atoms, which is a liquid at 25 ° C.
    4. The tape with an adhesive for semiconductors according to claim 1, wherein the adhesive layer contains at least one kind of phenolic resin.
    5. The tape with an adhesive for semiconductors according to claim 1, wherein the adhesive layer contains at least one kind of epoxy resin.
    Claims6Claim 15A substrate for semiconductor connection using the tape with a semiconductor adhesive according to any one of the above.
    Claims7Claims6A semiconductor device using the semiconductor connection substrate according to any one of the preceding claims.

【0001】
【発明の属する技術分野】
本発明は、半導体用接着剤付きテープおよび半導体接続用基板ならびに半導体装置に関するものである。さらに詳しくは、本発明は、半導体集積回路を実装する際に用いられる、テープオートメーテッドボンディング(TAB)方式のパターン加工テープ、ボールグリッドアレイ(BGA)パッケージ用インターポ−ザー等の半導体接続用基板、リードフレーム固定テープ、LOC固定テープ、半導体素子等の電子部品とリードフレームや絶縁性支持基盤等の支持部材との接着、すなわち、ダイボンディング材、ヒートスプレッター、補強板、シールド材の接着剤、ソルダーレジスト、異方導電性フィルム、銅張り積層板およびカバーレイ等を作成するために適した接着剤を用いた半導体用接着剤付きテープおよびそれを用いた半導体接続用基板ならびに半導体装置に関するものである。
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a semiconductor with adhesive tape and semiconductors connecting substrate and a semiconductor device. More specifically, the present invention relates to a semiconductor connection substrate, such as a tape automated bonding (TAB) type pattern processing tape and a ball grid array (BGA) package interposer, which are used when mounting a semiconductor integrated circuit; Adhesion between lead frame fixing tape, LOC fixing tape, electronic components such as semiconductor elements and supporting members such as lead frames and insulating support bases, ie, die bonding materials, heat spreaders, reinforcing plates, adhesives for shielding materials, solders resist, anisotropic conductive film, a semiconductor body connecting substrate and a semiconductor device using the tape and it attached semiconductor adhesive using an adhesive suitable for making copper clad laminates and coverlay etc. Things.

【0023】
【課題を解決するための手段】
上記課題を解決するための本発明の半導体用接着剤付きテープは、有機絶縁性フィルム上に、接着剤層および保護フィルム層を有する半導体用接着剤付きテープにおいて、硬化前の接着剤層の150℃における動的粘弾性の貯蔵弾性率Eが10≦E≦200kPaであり、かつ散逸率Tが0.25≦T≦0.6であり、該接着剤層中に含まれる沸点100〜250℃の溶剤の接着剤層中における総含有率が0.5〜2wt%であることを特徴とする半導体用接着剤付きテープである。あるいは、有機絶縁性フィルム上に接着剤層および保護フィルム層を有する半導体用接着剤付きテープにおいて、硬化前の接着剤層の150℃における動的粘弾性の貯蔵弾性率Eが10≦E≦200kPaであり、かつ散逸率Tが0.25≦T≦0.6であり、該接着剤層が、重量平均分子量(Mw)が10,000未満である少なくとも1種の低分子ポリアミド樹脂と、100,000以上である少なくとも1種の高分子ポリアミド樹脂を含有することを特徴とする半導体用接着剤付きテープである。
[0023]
[Means for Solving the Problems]
The tape with an adhesive for a semiconductor of the present invention for solving the above-mentioned problems is a tape with an adhesive for a semiconductor having an adhesive layer and a protective film layer on an organic insulating film. storage elastic modulus of dynamic viscoelasticity at ° C. E is 10 ≦ E ≦ 200 kPa, and Ri dissipation factor T is 0.25 ≦ T ≦ 0.6 der boiling point 100 to 250 included in the adhesive layer A tape with an adhesive for semiconductors, characterized in that the total content of the solvent at a temperature of 0 ° C in the adhesive layer is 0.5 to 2 wt% . Alternatively, in an adhesive tape for a semiconductor having an adhesive layer and a protective film layer on an organic insulating film, the storage elastic modulus E of the dynamic viscoelasticity at 150 ° C. of the adhesive layer before curing is 10 ≦ E ≦ 200 kPa And the dissipation factor T is 0.25 ≦ T ≦ 0.6, and the adhesive layer comprises at least one low molecular weight polyamide resin having a weight average molecular weight (Mw) of less than 10,000; A tape with an adhesive for semiconductors, characterized by containing at least one kind of high-molecular polyamide resin of 2,000 or more.

また、本発明の半導体用接着剤付きテープは、さらに次の好ましい態様を有するものである
(b) 接着剤層が、25℃において液体である炭素数12〜50の脂肪酸を含むこと。
(c) 接着剤層が、フェノール樹脂を少なくとも1種類以上含むこと。
(d) 接着剤層が、エポキシ樹脂を少なくとも1種類以上含むこと
Further, the adhesive tape for a semiconductor according to the present invention further has the following preferable aspect .
( b) The adhesive layer contains a fatty acid having 12 to 50 carbon atoms which is liquid at 25 ° C.
(c) The adhesive layer contains at least one kind of phenol resin.
(d) The adhesive layer contains at least one type of epoxy resin .

本発明の半導体用接着剤付きテープは、半導体接続用基板ならびにそれを用いた銅張り積層板および半導体装置の製造に好適に用いられる。 Semiconductor adhesive tape with the present invention is suitably used for the production of copper-clad laminates and a semiconductor device using semiconductors contact substrate and it for connection.

本発明の半導体接続用基板は、上記半導体用接着剤付きテープを使用したものであり、また本発明の半導体装置は、上記半導体接続用基板を用いたものである。 Semiconductors connection substrate of the present invention are those described above was used for semiconductor with adhesive tape and the semiconductor device of the present invention using the above-mentioned semiconductors connection substrate.

本発明の半導体用接着剤付きテープをTAB用テープとして用いる場合は、上記半導体用接着剤付きテープを所定のパターンを有するパンチング用金型を設置しているプレス機によってパンチングを行い、保護フィルム層を剥離し銅箔ラミネートを行った後、加熱処理する。銅箔ラミネート条件は、温度100〜160℃、押圧0.1〜0.3MPaが好ましい。また加熱条件は、ステップ加熱していくことが好ましく、50〜90℃の比較的低温領域から除々に昇温しながら最終的には150〜180℃まで昇温していく。次いで、フォトリソグラフィ−により半導体集積回路接続用の導体回路を形成することで半導体接続用基板が得られ、その半導体接続用基板を用いて、好適には400〜500℃、1秒〜1分の条件でインナーリードボンディングを行ない、半導体集積回路を接続し、しかる後に、エポキシ系液状封止剤で樹脂封止を行なうことで半導体装置を製造することができる。 When the tape with an adhesive for semiconductors of the present invention is used as a tape for TAB, the tape with an adhesive for semiconductors is punched by a press machine equipped with a punching die having a predetermined pattern to form a protective film layer. And heat-treated after laminating the copper foil. The copper foil lamination conditions are preferably a temperature of 100 to 160 ° C. and a pressure of 0.1 to 0.3 MPa. As for the heating condition, it is preferable to perform step heating, and gradually raise the temperature to 150 to 180 ° C. while gradually increasing the temperature from a relatively low temperature range of 50 to 90 ° C. Then, photolithography - by semiconductors connection substrate is obtained by forming a conductive circuit for a semiconductor integrated circuit connection, using the semiconductors connection substrate, preferably 400 to 500 ° C., A semiconductor device can be manufactured by performing inner lead bonding under a condition of 1 second to 1 minute, connecting a semiconductor integrated circuit, and thereafter performing resin sealing with an epoxy liquid sealing agent.

(b)半導体接続用基板の作成
上記の手順で得られたTAB用テープを用いて、前述の評価方法(3)と同一の方法で半導体集積回路接続用の導体回路を形成し、図4に示すパターンテープを得た。
Using TAB tape obtained in creating the above procedure (b) semiconductors connection substrate to form a conductive circuit for a semiconductor integrated circuit connected in the same manner as the evaluation method described above (3), The pattern tape shown in FIG. 4 was obtained.

【0093】
【発明の効果】
本発明によれば、低温かつ低圧でのラミネート性に優れた新規な半導体用接着剤付きテープが得られる。この半導体用接着剤付きテープを用いることで高密度実装用の半導体装置ならびに半導体接続用基板を工業的に有利に製造することができ、得られる半導体装置の信頼性を向上させることができる。
[0093]
【The invention's effect】
According to the present invention, a novel for semiconductors adhesive-backed tape having excellent lamination properties at low temperature and low pressure is obtained. This for semiconductors semiconductor device and semiconductors connection substrate for high-density mounting by using the adhesive-backed tape industrially can be advantageously produced, improve the reliability of the semiconductor device obtained be able to.

JP2003152112A 2003-05-29 2003-05-29 Tape with adhesive for semiconductor, substrate for semiconductor connection, and semiconductor device Expired - Fee Related JP4547866B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003152112A JP4547866B2 (en) 2003-05-29 2003-05-29 Tape with adhesive for semiconductor, substrate for semiconductor connection, and semiconductor device

Publications (3)

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JP2004352855A JP2004352855A (en) 2004-12-16
JP2004352855A5 true JP2004352855A5 (en) 2006-06-15
JP4547866B2 JP4547866B2 (en) 2010-09-22

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4691401B2 (en) * 2005-06-22 2011-06-01 株式会社巴川製紙所 Adhesive composition for semiconductor device and adhesive sheet for semiconductor device
JP5406995B2 (en) * 2013-01-31 2014-02-05 リンテック株式会社 Adhesive used in semiconductor device manufacturing method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
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JP3620156B2 (en) * 1996-08-07 2005-02-16 日立化成工業株式会社 Low temperature adhesive film adhesive, lead frame and semiconductor device using the same
JP4607270B2 (en) * 1999-11-24 2011-01-05 日東電工株式会社 Thermosetting adhesive and its adhesive sheets
JP2002100695A (en) * 2000-09-25 2002-04-05 Toray Ind Inc Adhesive sheet for semiconductor device and semiconductor device
JP4075801B2 (en) * 2001-08-27 2008-04-16 日立化成工業株式会社 Adhesive sheet, semiconductor device and manufacturing method thereof

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