JP2003332552A - Reflectivity detecting device, sheet image input unit and sheet image input method - Google Patents
Reflectivity detecting device, sheet image input unit and sheet image input methodInfo
- Publication number
- JP2003332552A JP2003332552A JP2002140097A JP2002140097A JP2003332552A JP 2003332552 A JP2003332552 A JP 2003332552A JP 2002140097 A JP2002140097 A JP 2002140097A JP 2002140097 A JP2002140097 A JP 2002140097A JP 2003332552 A JP2003332552 A JP 2003332552A
- Authority
- JP
- Japan
- Prior art keywords
- organic semiconductor
- image input
- light
- layer
- semiconductor layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 70
- 238000002310 reflectometry Methods 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 claims abstract description 49
- 238000002834 transmittance Methods 0.000 claims abstract description 18
- 239000000463 material Substances 0.000 claims description 23
- 238000001514 detection method Methods 0.000 claims description 12
- 239000004973 liquid crystal related substance Substances 0.000 claims description 9
- 230000000903 blocking effect Effects 0.000 claims description 5
- -1 poly (3-substituted pyrrole Chemical class 0.000 description 37
- 239000010408 film Substances 0.000 description 20
- 238000000576 coating method Methods 0.000 description 19
- 229920005989 resin Polymers 0.000 description 18
- 239000011347 resin Substances 0.000 description 18
- 239000010409 thin film Substances 0.000 description 17
- 239000000969 carrier Substances 0.000 description 14
- 239000002019 doping agent Substances 0.000 description 14
- 239000011248 coating agent Substances 0.000 description 13
- 230000003287 optical effect Effects 0.000 description 10
- 229910052782 aluminium Inorganic materials 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- 239000006185 dispersion Substances 0.000 description 8
- 239000000049 pigment Substances 0.000 description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 8
- 229910052709 silver Inorganic materials 0.000 description 8
- 239000004332 silver Substances 0.000 description 8
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 7
- 239000011230 binding agent Substances 0.000 description 7
- 239000010419 fine particle Substances 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 229910052757 nitrogen Inorganic materials 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 239000000126 substance Substances 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 239000011777 magnesium Substances 0.000 description 6
- 229910052749 magnesium Inorganic materials 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- 238000000926 separation method Methods 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 6
- 229910052738 indium Inorganic materials 0.000 description 5
- 229920000642 polymer Polymers 0.000 description 5
- 238000006116 polymerization reaction Methods 0.000 description 5
- BBEAQIROQSPTKN-UHFFFAOYSA-N pyrene Chemical compound C1=CC=C2C=CC3=CC=CC4=CC=C1C2=C43 BBEAQIROQSPTKN-UHFFFAOYSA-N 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 4
- 239000000370 acceptor Substances 0.000 description 4
- 238000007607 die coating method Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 4
- 229910052809 inorganic oxide Inorganic materials 0.000 description 4
- 229910052744 lithium Inorganic materials 0.000 description 4
- 229910052697 platinum Inorganic materials 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 4
- 229910001887 tin oxide Inorganic materials 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- UJOBWOGCFQCDNV-UHFFFAOYSA-N Carbazole Natural products C1=CC=C2C3=CC=CC=C3NC2=C1 UJOBWOGCFQCDNV-UHFFFAOYSA-N 0.000 description 3
- QGJOPFRUJISHPQ-UHFFFAOYSA-N Carbon disulfide Chemical compound S=C=S QGJOPFRUJISHPQ-UHFFFAOYSA-N 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 239000004793 Polystyrene Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 229920001940 conductive polymer Polymers 0.000 description 3
- 238000003618 dip coating Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 239000000975 dye Substances 0.000 description 3
- 238000004043 dyeing Methods 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- GVEPBJHOBDJJJI-UHFFFAOYSA-N fluoranthrene Natural products C1=CC(C2=CC=CC=C22)=C3C2=CC=CC3=C1 GVEPBJHOBDJJJI-UHFFFAOYSA-N 0.000 description 3
- 125000000524 functional group Chemical group 0.000 description 3
- 229910052741 iridium Inorganic materials 0.000 description 3
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 3
- 239000007791 liquid phase Substances 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 229910052763 palladium Inorganic materials 0.000 description 3
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 3
- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 3
- 229920001197 polyacetylene Polymers 0.000 description 3
- 229920000767 polyaniline Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229920000128 polypyrrole Polymers 0.000 description 3
- 229920000123 polythiophene Polymers 0.000 description 3
- 229910052708 sodium Inorganic materials 0.000 description 3
- 239000011734 sodium Substances 0.000 description 3
- 238000005507 spraying Methods 0.000 description 3
- 150000000000 tetracarboxylic acids Chemical class 0.000 description 3
- FHCPAXDKURNIOZ-UHFFFAOYSA-N tetrathiafulvalene Chemical compound S1C=CSC1=C1SC=CS1 FHCPAXDKURNIOZ-UHFFFAOYSA-N 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- DXBHBZVCASKNBY-UHFFFAOYSA-N 1,2-Benz(a)anthracene Chemical compound C1=CC=C2C3=CC4=CC=CC=C4C=C3C=CC2=C1 DXBHBZVCASKNBY-UHFFFAOYSA-N 0.000 description 2
- 150000004057 1,4-benzoquinones Chemical class 0.000 description 2
- 229920003026 Acene Polymers 0.000 description 2
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 2
- 229920008347 Cellulose acetate propionate Polymers 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- 235000000177 Indigofera tinctoria Nutrition 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- 229910052779 Neodymium Inorganic materials 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 229920000265 Polyparaphenylene Polymers 0.000 description 2
- 239000004734 Polyphenylene sulfide Substances 0.000 description 2
- 229910052777 Praseodymium Inorganic materials 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- VNSWULZVUKFJHK-UHFFFAOYSA-N [Sr].[Bi] Chemical compound [Sr].[Bi] VNSWULZVUKFJHK-UHFFFAOYSA-N 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- 238000007611 bar coating method Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910002115 bismuth titanate Inorganic materials 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- WDECIBYCCFPHNR-UHFFFAOYSA-N chrysene Chemical compound C1=CC=CC2=CC=C3C4=CC=CC=C4C=CC3=C21 WDECIBYCCFPHNR-UHFFFAOYSA-N 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 238000000366 colloid method Methods 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229920000547 conjugated polymer Polymers 0.000 description 2
- VPUGDVKSAQVFFS-UHFFFAOYSA-N coronene Chemical compound C1=C(C2=C34)C=CC3=CC=C(C=C3)C4=C4C3=CC=C(C=C3)C4=C2C3=C1 VPUGDVKSAQVFFS-UHFFFAOYSA-N 0.000 description 2
- 125000004093 cyano group Chemical group *C#N 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005868 electrolysis reaction Methods 0.000 description 2
- 229910003472 fullerene Inorganic materials 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 description 2
- 229940097275 indigo Drugs 0.000 description 2
- COHYTHOBJLSHDF-UHFFFAOYSA-N indigo powder Natural products N1C2=CC=CC=C2C(=O)C1=C1C(=O)C2=CC=CC=C2N1 COHYTHOBJLSHDF-UHFFFAOYSA-N 0.000 description 2
- 239000011630 iodine Substances 0.000 description 2
- 229910052740 iodine Inorganic materials 0.000 description 2
- 238000007733 ion plating Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910052746 lanthanum Inorganic materials 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 2
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 2
- 229920001088 polycarbazole Polymers 0.000 description 2
- 239000004417 polycarbonate Substances 0.000 description 2
- 229920000515 polycarbonate Polymers 0.000 description 2
- 229920000015 polydiacetylene Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 229920000414 polyfuran Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920006254 polymer film Polymers 0.000 description 2
- 229920000069 polyphenylene sulfide Polymers 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 229910052702 rhenium Inorganic materials 0.000 description 2
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- 229910001936 tantalum oxide Inorganic materials 0.000 description 2
- 229910052714 tellurium Inorganic materials 0.000 description 2
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 2
- 229930192474 thiophene Natural products 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- SJHPCNCNNSSLPL-CSKARUKUSA-N (4e)-4-(ethoxymethylidene)-2-phenyl-1,3-oxazol-5-one Chemical class O1C(=O)C(=C/OCC)\N=C1C1=CC=CC=C1 SJHPCNCNNSSLPL-CSKARUKUSA-N 0.000 description 1
- WSLDOOZREJYCGB-UHFFFAOYSA-N 1,2-Dichloroethane Chemical compound ClCCCl WSLDOOZREJYCGB-UHFFFAOYSA-N 0.000 description 1
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- VTQBLFOBTSGUHZ-UHFFFAOYSA-N 1-[[4-(trifluoromethyl)phenyl]methyl]naphthalene Chemical compound C1=CC(C(F)(F)F)=CC=C1CC1=CC=CC2=CC=CC=C12 VTQBLFOBTSGUHZ-UHFFFAOYSA-N 0.000 description 1
- WPMHMYHJGDAHKX-UHFFFAOYSA-N 1-ethenylpyrene Chemical class C1=C2C(C=C)=CC=C(C=C3)C2=C2C3=CC=CC2=C1 WPMHMYHJGDAHKX-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- BIEFDNUEROKZRA-UHFFFAOYSA-N 2-(2-phenylethenyl)aniline Chemical class NC1=CC=CC=C1C=CC1=CC=CC=C1 BIEFDNUEROKZRA-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- POXIZPBFFUKMEQ-UHFFFAOYSA-N 2-cyanoethenylideneazanide Chemical class [N-]=C=[C+]C#N POXIZPBFFUKMEQ-UHFFFAOYSA-N 0.000 description 1
- 125000001731 2-cyanoethyl group Chemical group [H]C([H])(*)C([H])([H])C#N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- KUJYDIFFRDAYDH-UHFFFAOYSA-N 2-thiophen-2-yl-5-[5-[5-(5-thiophen-2-ylthiophen-2-yl)thiophen-2-yl]thiophen-2-yl]thiophene Chemical compound C1=CSC(C=2SC(=CC=2)C=2SC(=CC=2)C=2SC(=CC=2)C=2SC(=CC=2)C=2SC=CC=2)=C1 KUJYDIFFRDAYDH-UHFFFAOYSA-N 0.000 description 1
- HPJFXFRNEJHDFR-UHFFFAOYSA-N 22291-04-9 Chemical class C1=CC(C(N(CCN(C)C)C2=O)=O)=C3C2=CC=C2C(=O)N(CCN(C)C)C(=O)C1=C32 HPJFXFRNEJHDFR-UHFFFAOYSA-N 0.000 description 1
- GSOFREOFMHUMMZ-UHFFFAOYSA-N 3,4-dicarbamoylnaphthalene-1,2-dicarboxylic acid Chemical class C1=CC=CC2=C(C(O)=N)C(C(=N)O)=C(C(O)=O)C(C(O)=O)=C21 GSOFREOFMHUMMZ-UHFFFAOYSA-N 0.000 description 1
- WFFZGYRTVIPBFN-UHFFFAOYSA-N 3h-indene-1,2-dione Chemical class C1=CC=C2C(=O)C(=O)CC2=C1 WFFZGYRTVIPBFN-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- DWLWGAWWEOVHEU-UHFFFAOYSA-N 5,8-bis(octylcarbamoyl)naphthalene-1,4-dicarboxylic acid Chemical class C1=CC(C(O)=O)=C2C(C(O)=NCCCCCCCC)=CC=C(C(O)=NCCCCCCCC)C2=C1C(O)=O DWLWGAWWEOVHEU-UHFFFAOYSA-N 0.000 description 1
- RJCHVBHJXJDUNL-UHFFFAOYSA-N 5,8-dicarbamoylnaphthalene-1,4-dicarboxylic acid Chemical compound C1=CC(C(O)=O)=C2C(C(=N)O)=CC=C(C(O)=N)C2=C1C(O)=O RJCHVBHJXJDUNL-UHFFFAOYSA-N 0.000 description 1
- MSZMWDBZELLPEM-UHFFFAOYSA-N 6,7-dicarbamoylanthracene-2,3-dicarboxylic acid Chemical class OC(=O)C1=C(C(O)=O)C=C2C=C(C=C(C(C(=N)O)=C3)C(O)=N)C3=CC2=C1 MSZMWDBZELLPEM-UHFFFAOYSA-N 0.000 description 1
- SXSMKKHDMTYQSU-UHFFFAOYSA-N 6,7-dicarbamoylnaphthalene-2,3-dicarboxylic acid Chemical class OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=N)C(C(=N)O)=CC2=C1 SXSMKKHDMTYQSU-UHFFFAOYSA-N 0.000 description 1
- OGOYZCQQQFAGRI-UHFFFAOYSA-N 9-ethenylanthracene Chemical class C1=CC=C2C(C=C)=C(C=CC=C3)C3=CC2=C1 OGOYZCQQQFAGRI-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 1
- MKYNTMZXWMDMPY-UHFFFAOYSA-N C1=CC=CC2=CC3=C(C(O)=N)C(C(=N)O)=C(C(O)=O)C(C(O)=O)=C3C=C21 Chemical class C1=CC=CC2=CC3=C(C(O)=N)C(C(=N)O)=C(C(O)=O)C(C(O)=O)=C3C=C21 MKYNTMZXWMDMPY-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 102100033029 Carbonic anhydrase-related protein 11 Human genes 0.000 description 1
- 229920002284 Cellulose triacetate Polymers 0.000 description 1
- 229910020366 ClO 4 Inorganic materials 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- 101000867841 Homo sapiens Carbonic anhydrase-related protein 11 Proteins 0.000 description 1
- 101001075218 Homo sapiens Gastrokine-1 Proteins 0.000 description 1
- 101001099381 Homo sapiens Peroxisomal biogenesis factor 19 Proteins 0.000 description 1
- WZELXJBMMZFDDU-UHFFFAOYSA-N Imidazol-2-one Chemical class O=C1N=CC=N1 WZELXJBMMZFDDU-UHFFFAOYSA-N 0.000 description 1
- 229910000799 K alloy Inorganic materials 0.000 description 1
- 239000002841 Lewis acid Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 1
- 150000001422 N-substituted pyrroles Chemical class 0.000 description 1
- 229930192627 Naphthoquinone Natural products 0.000 description 1
- 229910019800 NbF 5 Inorganic materials 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 102100038883 Peroxisomal biogenesis factor 19 Human genes 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 1
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 1
- 229920001665 Poly-4-vinylphenol Polymers 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004697 Polyetherimide Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 239000004373 Pullulan Substances 0.000 description 1
- 229920001218 Pullulan Polymers 0.000 description 1
- YFPSDOXLHBDCOR-UHFFFAOYSA-N Pyrene-1,6-dione Chemical compound C1=CC(C(=O)C=C2)=C3C2=CC=C2C(=O)C=CC1=C32 YFPSDOXLHBDCOR-UHFFFAOYSA-N 0.000 description 1
- 229910018287 SbF 5 Inorganic materials 0.000 description 1
- 229910018286 SbF 6 Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229920004933 Terylene® Polymers 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 229910007926 ZrCl Inorganic materials 0.000 description 1
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 1
- YVRQEGLKRIHRCH-UHFFFAOYSA-N [1,4]benzothiazino[2,3-b]phenothiazine Chemical compound S1C2=CC=CC=C2N=C2C1=CC1=NC3=CC=CC=C3SC1=C2 YVRQEGLKRIHRCH-UHFFFAOYSA-N 0.000 description 1
- AHWXCYJGJOLNFA-UHFFFAOYSA-N [1,4]benzoxazino[2,3-b]phenoxazine Chemical compound O1C2=CC=CC=C2N=C2C1=CC1=NC3=CC=CC=C3OC1=C2 AHWXCYJGJOLNFA-UHFFFAOYSA-N 0.000 description 1
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- OIPILFWXSMYKGL-UHFFFAOYSA-N acetylcholine Chemical compound CC(=O)OCC[N+](C)(C)C OIPILFWXSMYKGL-UHFFFAOYSA-N 0.000 description 1
- 229960004373 acetylcholine Drugs 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 125000000641 acridinyl group Chemical class C1(=CC=CC2=NC3=CC=CC=C3C=C12)* 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 150000004703 alkoxides Chemical class 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 150000001413 amino acids Chemical class 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- PGEHNUUBUQTUJB-UHFFFAOYSA-N anthanthrone Chemical compound C1=CC=C2C(=O)C3=CC=C4C=CC=C5C(=O)C6=CC=C1C2=C6C3=C54 PGEHNUUBUQTUJB-UHFFFAOYSA-N 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- QQHJESKHUUVSIC-UHFFFAOYSA-N antimony lead Chemical compound [Sb].[Pb] QQHJESKHUUVSIC-UHFFFAOYSA-N 0.000 description 1
- XXLJGBGJDROPKW-UHFFFAOYSA-N antimony;oxotin Chemical compound [Sb].[Sn]=O XXLJGBGJDROPKW-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- 229910052454 barium strontium titanate Inorganic materials 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 229910021523 barium zirconate Inorganic materials 0.000 description 1
- DQBAOWPVHRWLJC-UHFFFAOYSA-N barium(2+);dioxido(oxo)zirconium Chemical compound [Ba+2].[O-][Zr]([O-])=O DQBAOWPVHRWLJC-UHFFFAOYSA-N 0.000 description 1
- IOJUPLGTWVMSFF-UHFFFAOYSA-N benzothiazole Chemical class C1=CC=C2SC=NC2=C1 IOJUPLGTWVMSFF-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- HKQOBOMRSSHSTC-UHFFFAOYSA-N cellulose acetate Chemical compound OC1C(O)C(O)C(CO)OC1OC1C(CO)OC(O)C(O)C1O.CC(=O)OCC1OC(OC(C)=O)C(OC(C)=O)C(OC(C)=O)C1OC1C(OC(C)=O)C(OC(C)=O)C(OC(C)=O)C(COC(C)=O)O1.CCC(=O)OCC1OC(OC(=O)CC)C(OC(=O)CC)C(OC(=O)CC)C1OC1C(OC(=O)CC)C(OC(=O)CC)C(OC(=O)CC)C(COC(=O)CC)O1 HKQOBOMRSSHSTC-UHFFFAOYSA-N 0.000 description 1
- 229920006217 cellulose acetate butyrate Polymers 0.000 description 1
- 238000012824 chemical production Methods 0.000 description 1
- WEDMWEAVHLDAAH-UHFFFAOYSA-N circumanthracene Chemical compound C1=C(C2=C34)C=CC3=CC=C(C=C3C5=C6C=7C8=C9C%10=C6C(=C3)C=CC%10=CC=C9C=CC8=CC(C=73)=C6)C4=C5C3=C2C6=C1 WEDMWEAVHLDAAH-UHFFFAOYSA-N 0.000 description 1
- 229920006026 co-polymeric resin Polymers 0.000 description 1
- 238000000975 co-precipitation Methods 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 150000001907 coumarones Chemical class 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- JMVIPXWCEHBYAH-UHFFFAOYSA-N cyclohexanone;ethyl acetate Chemical compound CCOC(C)=O.O=C1CCCCC1 JMVIPXWCEHBYAH-UHFFFAOYSA-N 0.000 description 1
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical class C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 1
- RAABOESOVLLHRU-UHFFFAOYSA-N diazene Chemical compound N=N RAABOESOVLLHRU-UHFFFAOYSA-N 0.000 description 1
- 229910000071 diazene Inorganic materials 0.000 description 1
- FMULMJRDHBIBNO-UHFFFAOYSA-N dibenzo[a,c]pentacene Chemical compound C1=CC=C2C3=CC4=CC5=CC6=CC=CC=C6C=C5C=C4C=C3C3=CC=CC=C3C2=C1 FMULMJRDHBIBNO-UHFFFAOYSA-N 0.000 description 1
- JNTHRSHGARDABO-UHFFFAOYSA-N dibenzo[a,l]pyrene Chemical compound C1=CC=CC2=C3C4=CC=CC=C4C=C(C=C4)C3=C3C4=CC=CC3=C21 JNTHRSHGARDABO-UHFFFAOYSA-N 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 150000008376 fluorenones Chemical class 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910021397 glassy carbon Inorganic materials 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 150000008282 halocarbons Chemical class 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- KDEZIUOWTXJEJK-UHFFFAOYSA-N heptacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC6=CC7=CC=CC=C7C=C6C=C5C=C4C=C3C=C21 KDEZIUOWTXJEJK-UHFFFAOYSA-N 0.000 description 1
- QSQIGGCOCHABAP-UHFFFAOYSA-N hexacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC6=CC=CC=C6C=C5C=C4C=C3C=C21 QSQIGGCOCHABAP-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-M hexanoate Chemical compound CCCCCC([O-])=O FUZZWVXGSFPDMH-UHFFFAOYSA-M 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- QWPPOHNGKGFGJK-UHFFFAOYSA-N hypochlorous acid Chemical compound ClO QWPPOHNGKGFGJK-UHFFFAOYSA-N 0.000 description 1
- 150000002460 imidazoles Chemical class 0.000 description 1
- 150000002461 imidazolidines Chemical class 0.000 description 1
- 150000002468 indanes Chemical class 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical group [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229940079865 intestinal antiinfectives imidazole derivative Drugs 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 150000007517 lewis acids Chemical class 0.000 description 1
- COQAIRYMVBNUKQ-UHFFFAOYSA-J magnesium;barium(2+);tetrafluoride Chemical compound [F-].[F-].[F-].[F-].[Mg+2].[Ba+2] COQAIRYMVBNUKQ-UHFFFAOYSA-J 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- DZVCFNFOPIZQKX-LTHRDKTGSA-M merocyanine Chemical compound [Na+].O=C1N(CCCC)C(=O)N(CCCC)C(=O)C1=C\C=C\C=C/1N(CCCS([O-])(=O)=O)C2=CC=CC=C2O\1 DZVCFNFOPIZQKX-LTHRDKTGSA-M 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 239000002923 metal particle Substances 0.000 description 1
- 239000000113 methacrylic resin Substances 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 150000002828 nitro derivatives Chemical class 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- 229910017464 nitrogen compound Inorganic materials 0.000 description 1
- 150000002830 nitrogen compounds Chemical class 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 150000004866 oxadiazoles Chemical class 0.000 description 1
- 150000007978 oxazole derivatives Chemical class 0.000 description 1
- RUDFQVOCFDJEEF-UHFFFAOYSA-N oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 1
- SJHHDDDGXWOYOE-UHFFFAOYSA-N oxytitamium phthalocyanine Chemical compound [Ti+2]=O.C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 SJHHDDDGXWOYOE-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Substances OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 description 1
- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 1
- CSHWQDPOILHKBI-UHFFFAOYSA-N peryrene Natural products C1=CC(C2=CC=CC=3C2=C2C=CC=3)=C3C2=CC=CC3=C1 CSHWQDPOILHKBI-UHFFFAOYSA-N 0.000 description 1
- 125000001791 phenazinyl group Chemical class C1(=CC=CC2=NC3=CC=CC=C3N=C12)* 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 229920000548 poly(silane) polymer Polymers 0.000 description 1
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920000323 polyazulene Polymers 0.000 description 1
- 229920005668 polycarbonate resin Polymers 0.000 description 1
- 239000004431 polycarbonate resin Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 239000002952 polymeric resin Substances 0.000 description 1
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- BITYAPCSNKJESK-UHFFFAOYSA-N potassiosodium Chemical compound [Na].[K] BITYAPCSNKJESK-UHFFFAOYSA-N 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 235000019423 pullulan Nutrition 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- 150000003220 pyrenes Chemical class 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007763 reverse roll coating Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 125000005504 styryl group Chemical class 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 229940042055 systemic antimycotics triazole derivative Drugs 0.000 description 1
- 238000010345 tape casting Methods 0.000 description 1
- RIQXSPGGOGYAPV-UHFFFAOYSA-N tetrabenzo(a,c,l,o)pentacene Chemical compound C1=CC=CC2=C(C=C3C(C=C4C=C5C6=CC=CC=C6C=6C(C5=CC4=C3)=CC=CC=6)=C3)C3=C(C=CC=C3)C3=C21 RIQXSPGGOGYAPV-UHFFFAOYSA-N 0.000 description 1
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
- NLDYACGHTUPAQU-UHFFFAOYSA-N tetracyanoethylene Chemical group N#CC(C#N)=C(C#N)C#N NLDYACGHTUPAQU-UHFFFAOYSA-N 0.000 description 1
- PCCVSPMFGIFTHU-UHFFFAOYSA-N tetracyanoquinodimethane Chemical compound N#CC(C#N)=C1C=CC(=C(C#N)C#N)C=C1 PCCVSPMFGIFTHU-UHFFFAOYSA-N 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 150000004867 thiadiazoles Chemical class 0.000 description 1
- 150000007979 thiazole derivatives Chemical class 0.000 description 1
- JOUDBUYBGJYFFP-FOCLMDBBSA-N thioindigo Chemical compound S\1C2=CC=CC=C2C(=O)C/1=C1/C(=O)C2=CC=CC=C2S1 JOUDBUYBGJYFFP-FOCLMDBBSA-N 0.000 description 1
- 150000004882 thiopyrans Chemical class 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- JFLKFZNIIQFQBS-FNCQTZNRSA-N trans,trans-1,4-Diphenyl-1,3-butadiene Chemical group C=1C=CC=CC=1\C=C\C=C\C1=CC=CC=C1 JFLKFZNIIQFQBS-FNCQTZNRSA-N 0.000 description 1
- 150000003623 transition metal compounds Chemical class 0.000 description 1
- ILJSQTXMGCGYMG-UHFFFAOYSA-N triacetic acid Chemical compound CC(=O)CC(=O)CC(O)=O ILJSQTXMGCGYMG-UHFFFAOYSA-N 0.000 description 1
- DQWPFSLDHJDLRL-UHFFFAOYSA-N triethyl phosphate Chemical compound CCOP(=O)(OCC)OCC DQWPFSLDHJDLRL-UHFFFAOYSA-N 0.000 description 1
- 238000001132 ultrasonic dispersion Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 229910001935 vanadium oxide Inorganic materials 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229920003169 water-soluble polymer Polymers 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Landscapes
- Facsimile Heads (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、反射率検出用素
子、シート状画像入力装置及びシート状画像入力方法に
関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a reflectance detecting element, a sheet-shaped image input device and a sheet-shaped image input method.
【0002】[0002]
【従来の技術】近年、ハードコピーに情報をプリントア
ウトして紙を大量に消費することが環境上問題視される
様になったことから、書き換え可能で、表示の保持に多
くのエネルギーを要さず、携帯性に優れる電子ペーパー
という概念の表示媒体が提案されており、薄型の液晶表
示装置、エレクトロクロミックディスプレイ、特開昭5
5−154198号等に記載の、サーマルヘッドで記録
・消去を行う有機低分子・高分子樹脂マトリックス系表
示媒体、米国特許第6,262,833号、特開200
0−171839、同2001−201770等に記載
の電気泳動表示装置等での実用化が検討されている。2. Description of the Related Art In recent years, it has become an environmental problem to print out information on hard copy and consume a large amount of paper. Therefore, it is rewritable and a lot of energy is required to maintain the display. In other words, a display medium having a concept of electronic paper, which is excellent in portability, has been proposed.
Organic low-molecular / high-polymer resin matrix display medium for recording / erasing with a thermal head described in US Pat. No. 6,262,833, JP-A-200-200
Practical application in the electrophoretic display device and the like described in 0-171839 and 2001-201770 is being studied.
【0003】上記の様な電子ペーパーをハードコピーに
代えて用いる場合、表示データはLAN(ローカルネッ
トワーク)等のネットワークやパソコン等の端末、メモ
リなどの媒体を介して伝送された電子データとしてのコ
ンテンツであり、ハードコピーや印刷物の画像や文書を
電子ペーパーに表示するためには、一旦スキャナ等によ
り電子データに変換する必要が有り、手間が掛かって決
して使い勝手が良いわけではない。また、必要部数だけ
電子ペーパーに伝送を繰り返す煩わしさも有るため、そ
れらの問題点の解決が要望されていた。When the electronic paper as described above is used in place of a hard copy, the display data is contents as electronic data transmitted through a network such as a LAN (local network), a terminal such as a personal computer, a medium such as a memory. However, in order to display an image or a document of a hard copy or a printed matter on electronic paper, it is necessary to once convert it into electronic data with a scanner or the like, which is troublesome and is not always convenient. Further, since it is troublesome to repeat transmission to the electronic paper by the required number of copies, it has been demanded to solve those problems.
【0004】[0004]
【発明が解決しようとする課題】本発明の目的は、ハー
ドコピーや印刷物等のアナログ画像データを容易に、且
つ、迅速に電子データに変換し、電子ペーパーとして利
用可能ならしめる、反射率検出用素子、それを用いるシ
ート状画像入力装置及びシート状画像入力方法を提供す
ることである。SUMMARY OF THE INVENTION It is an object of the present invention to easily and quickly convert analog image data such as a hard copy or a printed matter into electronic data for use as electronic paper for reflectance detection. An element, a sheet-shaped image input device using the same, and a sheet-shaped image input method.
【0005】[0005]
【課題を解決するための手段】本発明の上記目的は、下
記の構成1〜8により達成された。The above objects of the present invention have been achieved by the following constitutions 1-8.
【0006】1.透明支持体上に、少なくともゲート電
極、該ゲート電極を被覆しながら該透明支持体上に設け
られた絶縁層、該絶縁層上に、ソース電極、ドレイン電
極、該ソース電極と該ドレインを連結し、且つ、350
nm〜850nmの光透過率が10%以上である有機半
導体層を有し、該有機半導体層上にハーフミラーと光入
射制御手段とがこの順で配設されていることを特徴とす
る反射率検出用素子。1. At least a gate electrode on a transparent support, an insulating layer provided on the transparent support while covering the gate electrode, and a source electrode, a drain electrode, and the source electrode and the drain are connected on the insulating layer. , And 350
nm-850 nm, an organic semiconductor layer having a light transmittance of 10% or more, and a half mirror and a light incidence control unit are arranged in this order on the organic semiconductor layer. Detection element.
【0007】2.有機半導体層とハーフミラーとの間
に、350nm〜850nmの光透過率が10%以上の
光電荷発生層を設けることを特徴とする前記1に記載の
反射率検出用素子。2. The reflectance detecting element as described in 1 above, further comprising: a photocharge generating layer having a light transmittance of 350% to 850 nm of 10% or more between the organic semiconductor layer and the half mirror.
【0008】3.有機半導体層と光電荷発生層との間
に、350nm〜850nmの光透過率が10%以上の
電荷輸送層が設けることを特徴とする前記2に記載の反
射率検出用素子。3. 3. The reflectance detecting element as described in 2 above, wherein a charge transporting layer having a light transmittance of 350 nm to 850 nm and a light transmittance of 10% or more is provided between the organic semiconductor layer and the photocharge generating layer.
【0009】4.有機半導体層がπ共役系材料を含むこ
とを特徴とする前記1〜3のいずれか1項に記載の反射
率検出用素子。4. 4. The reflectance detecting element according to any one of 1 to 3 above, wherein the organic semiconductor layer contains a π-conjugated material.
【0010】5.光入射制御手段として液晶素子を用い
ることを特徴とする前記1〜4のいずれか1項に記載の
反射率検出用素子。5. 5. The reflectance detecting element according to any one of 1 to 4 above, wherein a liquid crystal element is used as the light incidence control means.
【0011】6.光入射制御手段として光遮断層及び発
光素子を用いることを特徴とする前記1〜4のいずれか
1項に記載の反射率検出用素子。6. 5. The reflectance detecting element according to any one of 1 to 4 above, wherein a light blocking layer and a light emitting element are used as the light incidence control means.
【0012】7.前記1〜6のいずれか1項に記載の反
射率検出用素子を有することを特徴とするシート状画像
入力装置。7. A sheet-shaped image input device, comprising the reflectance detecting element according to any one of 1 to 6 above.
【0013】8.前記7に記載のシート状画像入力装置
を用いることを特徴とするシート状画像入力方法。8. 7. A sheet-shaped image input method using the sheet-shaped image input device described in 7 above.
【0014】以下、本発明を詳細に説明する。本発明者
等は、上記記載の問題点を種々検討した結果、請求項1
に記載のように、透明支持体上に、少なくともゲート電
極、該ゲート電極を被覆しながら該透明支持体上に設け
られた絶縁層、該絶縁層上に、ソース電極、ドレイン電
極、該ソース電極と該ドレインを連結している、350
nm〜850nmの光透過率が10%以上である有機半
導体層を有し、該有機半導体層上にハーフミラーと光入
射制御手段とをこの順で配設することにより、ハードコ
ピーや印刷物等のアナログ画像データを容易に、且つ、
迅速に電子データに変換し、電子ペーパーとして利用可
能ならしめる、反射率検出用素子、それを用いるシート
状画像入力装置及びシート状画像入力方法を提供するこ
とができることを見出した。The present invention will be described in detail below. The present inventors have made various studies on the problems described above, and as a result, claim 1
As described in 1 above, at least a gate electrode on a transparent support, an insulating layer provided on the transparent support while covering the gate electrode, a source electrode, a drain electrode, and a source electrode on the insulating layer. Is connected to the drain, 350
nm to 850 nm has an organic semiconductor layer having a light transmittance of 10% or more, and by disposing a half mirror and a light incidence control means in this order on the organic semiconductor layer, a hard copy, a printed matter, or the like can be obtained. Analog image data easily and
It has been found that it is possible to provide a reflectance detecting element, a sheet-shaped image input device and a sheet-shaped image input method using the element, which can be quickly converted into electronic data and can be used as electronic paper.
【0015】[0015]
【発明の実施の形態】以下、本発明について詳しく述べ
る。BEST MODE FOR CARRYING OUT THE INVENTION The present invention will be described in detail below.
【0016】《反射率検出用素子》本発明に係る反射率
検出用素子の構成を図1(a)及び図1(b)を各々用
いて説明する。<< Reflectance Detection Element >> The structure of the reflectance detection element according to the present invention will be described with reference to FIGS. 1 (a) and 1 (b), respectively.
【0017】図1は、本発明の反射率検出用素子の構成
の一例を示す模式図である。尚、図1(a)、(b)に
おいては、電荷発生層、電荷輸送層を有する系で示す
が、該層は無くても本発明の記載の効果を得ることは出
来る。また、素子の形成にあたっては、透明支持体側か
ら順次形成して反射率検出用素子としてもよいし、その
逆として、光入射手段から順次、形成して反射率検出用
素子としてもよい。FIG. 1 is a schematic view showing an example of the structure of the reflectance detecting element of the present invention. 1 (a) and 1 (b), a system having a charge generation layer and a charge transport layer is shown, but the effects described in the present invention can be obtained without the layers. Further, in forming the elements, the reflectance detecting element may be sequentially formed from the transparent support side, or conversely, may be sequentially formed from the light incident means to be the reflectance detecting element.
【0018】図1(a)は、透明支持体1上にゲート電
極8を形成し、絶縁層7で被覆した上にソース電極5及
びドレイン電極6を設け、有機半導体層4で被覆し、電
荷輸送層3及び電荷発生層2をこの順に形成したもので
ある。In FIG. 1A, the gate electrode 8 is formed on the transparent support 1, the source electrode 5 and the drain electrode 6 are provided on the insulating layer 7, and the source electrode 5 and the drain electrode 6 are formed. The transport layer 3 and the charge generation layer 2 are formed in this order.
【0019】ソース電極5とドレイン電極6の形成につ
いては、連続した電極膜を形成し、レーザーアブレーシ
ョン等で切削して間隙を形成し、前記ソース電極5、前
記ドレイン電極6を設ける等の方法が好ましく適用され
る。The source electrode 5 and the drain electrode 6 can be formed by forming a continuous electrode film, cutting by laser ablation or the like to form a gap, and providing the source electrode 5 and the drain electrode 6. It is preferably applied.
【0020】図1(b)は、図1(c)の変更例で、ソ
ース電極5及びドレイン電極6が有機半導体層4にて連
結される形態の他の例を示すものである。この場合、絶
縁層7上にソース電極5を設け、有機半導体層4を塗布
してドレイン電極6を形成する等の作製方法が適用され
る。FIG. 1B is a modification of FIG. 1C and shows another example of a mode in which the source electrode 5 and the drain electrode 6 are connected by the organic semiconductor layer 4. In this case, a manufacturing method such as providing the source electrode 5 on the insulating layer 7 and applying the organic semiconductor layer 4 to form the drain electrode 6 is applied.
【0021】図2は、本発明の反射率検出用素子が光反
射を検出する一態様を示す模式図である。FIG. 2 is a schematic view showing one mode in which the reflectance detecting element of the present invention detects light reflection.
【0022】図2(a)、(b)においては、反射率検
出用素子50が、反射率の測定対象である、記録媒体1
1a上に配置されている。ここで、11bは記録媒体1
1a上に記録された画像11bである。画像11bは、
具体的には、電子写真等のトナー画像や、インクジェッ
ト記録により作製されたインク画像、写真画像等であ
る。ちなみに、記録媒体11aにおいて、画像11bが
存在しない領域は、画像形成が行われていない領域であ
る。In FIGS. 2A and 2B, the recording medium 1 in which the reflectance detecting element 50 is the object of reflectance measurement is shown.
It is arranged on 1a. Here, 11b is the recording medium 1.
It is an image 11b recorded on 1a. Image 11b is
Specifically, it is a toner image such as an electrophotographic image, an ink image produced by inkjet recording, a photographic image, or the like. Incidentally, in the recording medium 11a, the area where the image 11b does not exist is an area where image formation is not performed.
【0023】本発明の反射率検出用素子50を記録媒体
11a上に配置すると、光入射制御手段10及びハーフ
ミラー9を通過した、入射光12a、12b、12c
(ここで、入射光とは、350nm〜850nmの波長
範囲の光を表す)は、電荷発生層2、電荷輸送層3、有
機半導体層4、絶縁層7、透明支持体1を通過し、記録
媒体11a、画像11bに入射される。When the reflectance detecting element 50 of the present invention is arranged on the recording medium 11a, incident light 12a, 12b, 12c which has passed through the light incidence control means 10 and the half mirror 9 is obtained.
(Here, the incident light represents light in the wavelength range of 350 nm to 850 nm) passes through the charge generation layer 2, the charge transport layer 3, the organic semiconductor layer 4, the insulating layer 7 and the transparent support 1 and is recorded. It is incident on the medium 11a and the image 11b.
【0024】反射率の測定対象である、記録媒体11
a、画像11bの各々の、350nm〜850nmの波
長範囲の光に対する反射率に対応して、反射光(図示し
ていない)が生じ、ハーフミラー9との間で複数の反射
(図示していない)が繰り返される。The recording medium 11 whose reflectance is to be measured
a, reflected light (not shown) is generated corresponding to the reflectance of light in the wavelength range of 350 nm to 850 nm of each of the images 11b, and a plurality of reflections (not shown) with the half mirror 9 are generated. ) Is repeated.
【0025】記録媒体11a、画像11bで反射光が発
生し、更に、該反射光が再度、ハーフミラー9で反射を
行うというように、反射が繰り返されることにより、反
射光の強度に応じて、後述するように、光キャリア(図
示していない)が生成し、これを電流値としてモニター
することが出来る。Reflected light is generated on the recording medium 11a and the image 11b, and the reflected light is reflected again by the half mirror 9, so that the reflected light is repeated. As will be described later, an optical carrier (not shown) is generated and can be monitored as a current value.
【0026】記録媒体11aと画像11bとでは、光
(350nm〜850nmの波長範囲の光)に対する反
射率が異なる為、結果として発生する電流値が異なるこ
とから、反射率検出用素子で測定された反射率に対応す
る電流値をデータ変換すると、画像11bはデジタル変
換された電子画像データとして即、利用可能になる。Since the recording medium 11a and the image 11b have different reflectances with respect to light (light in the wavelength range of 350 nm to 850 nm), the resulting current values are different. When the current value corresponding to the reflectance is data-converted, the image 11b can be immediately used as digitally converted electronic image data.
【0027】(光キャリアの生成)上記記載の光キャリ
アの発生について説明する。(Generation of Optical Carrier) Generation of the optical carrier described above will be described.
【0028】ハーフミラー9を通過してきた入射光12
a〜12cは、電荷発生層2、電荷輸送層3、有機半導
体層4、絶縁層7、透明基体1を通過し、記録媒体11
a、画像11bに入射される。Incident light 12 that has passed through the half mirror 9
a to 12c pass through the charge generation layer 2, the charge transport layer 3, the organic semiconductor layer 4, the insulating layer 7 and the transparent substrate 1, and the recording medium 11
a, it is incident on the image 11b.
【0029】光キャリアの発生は、最初、入射光12a
〜12cが電荷発生層2により受光された時に生じ、更
に、入射光12a、12b、12cは、電荷発生層2、
電荷輸送層3、有機半導体層4、絶縁層7、透明基体1
を通過し、記録媒体11a、画像11bに入射され、記
録媒体11aや画像11b上での反射光(図示していな
い)が電荷発生層2により受光される。The generation of photocarriers is initially caused by the incident light 12a.
.About.12c are received by the charge generation layer 2 and the incident light 12a, 12b, 12c is generated by the charge generation layer 2,
Charge transport layer 3, organic semiconductor layer 4, insulating layer 7, transparent substrate 1
After passing through the recording medium 11a and the image 11b, the light (not shown) reflected on the recording medium 11a and the image 11b is received by the charge generation layer 2.
【0030】さらに、前記反射光は、電荷発生層2を部
分的に通過した後、ハーフミラー9により再度反射さ
れ、再度反射された光がまた、電荷発生層2で受光され
るという、反射、吸収のパターンが繰り返され、最終的
に、電荷発生層2の分光感度及び入射した光(入射光、
記録媒体11aや画像11bでの反射光、前記反射光、
前記反射光のハーフミラー9での再反射光等)のスペク
トル分布強度の積に応じた光電荷がソース電極5とドレ
イン電極6との間の有機半導体層4に発生する。Furthermore, after the reflected light partially passes through the charge generation layer 2, it is reflected again by the half mirror 9, and the reflected light is received by the charge generation layer 2 again. The absorption pattern is repeated, and finally, the spectral sensitivity of the charge generation layer 2 and incident light (incident light,
The reflected light from the recording medium 11a and the image 11b, the reflected light,
Photoelectric charges are generated in the organic semiconductor layer 4 between the source electrode 5 and the drain electrode 6 according to the product of the spectral distribution intensities of the reflected light (re-reflected light from the half mirror 9).
【0031】次に、上記で説明した反射率検出用素子の
回路構成を図3を用いて説明する。図3は、本発明の反
射率検出用素子の回路構成の一例を示す模式図である。
この模式図においては、透明支持体、ハーフミラーと光
入射制御手段は省略してある。Next, the circuit configuration of the reflectance detecting element described above will be described with reference to FIG. FIG. 3 is a schematic diagram showing an example of a circuit configuration of the reflectance detecting element of the present invention.
In this schematic diagram, the transparent support, the half mirror and the light incidence control means are omitted.
【0032】図3において、光キャリアがホールである
場合は、ゲート電極に負電圧を印加し、且つソース電極
−ドレイン電極間にバイアス電圧を印加することで、光
電流がモニターできる。素子の構成にもよるが、ゲート
電圧は0V〜−50V、ソース電極−ドレイン電極間の
バイアス電圧は0V〜−50V程度が好ましい。In FIG. 3, when the photo carriers are holes, the photocurrent can be monitored by applying a negative voltage to the gate electrode and a bias voltage between the source electrode and the drain electrode. The gate voltage is preferably 0V to -50V, and the bias voltage between the source electrode and the drain electrode is preferably 0V to -50V, although it depends on the structure of the device.
【0033】尚、主キャリアが電子である場合には極性
を反転させればよく、又、光電流測定後、電荷発生層や
その近傍の残留電荷はディスチャージすることが好まし
い。When the main carrier is an electron, the polarity may be reversed, and after the photocurrent measurement, it is preferable to discharge the residual charge in the charge generation layer or in the vicinity thereof.
【0034】《シート状画像入力装置》次いで、本発明
のシート状画像入力装置について説明する。<< Sheet-Shaped Image Input Device >> Next, the sheet-shaped image input device of the present invention will be described.
【0035】図4は、本発明のシート状画像入力装置の
一態様を示す模式図であり、図2、3で光検出機構を説
明した素子をベースに構成したアクティブ駆動による、
本発明のシート状画像入力装置20をモデル的に示す。
(a)は側断面を示し、(b)が平面図である。FIG. 4 is a schematic view showing one embodiment of the sheet-shaped image input device of the present invention, which is based on active driving which is based on the element whose light detection mechanism is described in FIGS.
The sheet-shaped image input device 20 of the present invention is shown as a model.
(A) shows a side section and (b) is a plan view.
【0036】図において、透明支持体1上に複数のゲー
ト電極8が並行して配置され、該ゲート電極8上に絶縁
層7が形成され、その上に複数のソース電極5及びドレ
イン電極6がゲート電極8に対して直交方向に交互に配
置されてマトリクスを形成し、有機半導体層4にて連結
され、その上に電荷輸送層3と電荷発生層2をこの順に
配設し、更に、図示していない、ハーフミラーと光入射
制御手段をこの順に設けて、本発明の反射率検出用素子
が構成される。In the figure, a plurality of gate electrodes 8 are arranged in parallel on a transparent support 1, an insulating layer 7 is formed on the gate electrodes 8, and a plurality of source electrodes 5 and drain electrodes 6 are formed thereon. The matrix is formed by alternately arranging in a direction orthogonal to the gate electrode 8 and connected by the organic semiconductor layer 4, and the charge transport layer 3 and the charge generating layer 2 are arranged in this order on the matrix, and A reflectance detecting element of the present invention is configured by providing a half mirror and a light incidence control unit (not shown) in this order.
【0037】この構成ではゲート電極8が走査線を兼ね
て、図に示すエリアが単位画素となり、図において列方
向の画素が共通のソース電極5、ドレイン電極6で連結
された配列を採る。In this structure, the gate electrode 8 also serves as a scanning line, and the area shown in the figure serves as a unit pixel, and pixels in the column direction in the figure are connected by a common source electrode 5 and drain electrode 6.
【0038】(ハーフミラー:マジックミラーともい
う)本発明に係るハーフミラーについて説明する。(Half Mirror: Also called Magic Mirror) A half mirror according to the present invention will be described.
【0039】ハーフミラーとは、鏡の一種だが、鏡に当
たった光線の総てを反射せず、その光量の何割かを透過
させる性質を持った半透明鏡のことを言う。本発明で
は、通常、一眼レフの距離計やファインダーに使われも
の、TTL測光の一部やTTL・AF方式にも利用され
ている、市販のハーフミラーを用いることができる。The half mirror is a kind of mirror, but it is a semitransparent mirror that has the property of not reflecting all the rays of light hitting the mirror but of transmitting some of its light quantity. In the present invention, it is possible to use a commercially available half mirror which is usually used for a single-lens reflex rangefinder or finder, a part of TTL metering, and also used for the TTL / AF method.
【0040】本発明に係るハーフミラーの350nm〜
850nmの光の透過率は、本発明に記載の効果を奏す
る観点からは、10%以上であることが必須要件である
が、好ましくは、10%〜40%である。また、ハーフ
ミラーのもう1つの特徴である、350nm〜850n
mの光反射率は20%以上であることが好ましく、S更
に好ましくは、20%〜60%である。350 nm of the half mirror according to the present invention
From the viewpoint of achieving the effects described in the present invention, it is essential that the transmittance of 850 nm light is 10% or more, but it is preferably 10% to 40%. Another characteristic of the half mirror is 350 nm to 850 n.
The light reflectance of m is preferably 20% or more, and S is more preferably 20% to 60%.
【0041】上記記載の光透過率、光反射率を示す、本
発明に係るハーフミラーは、市販品を用いることができ
る。例えば、ニューマジックミラー(保坂ガラス株式会
社製)等を本発明に係るハーフミラーとして使用するこ
とが出来る。As the half mirror according to the present invention, which exhibits the above-mentioned light transmittance and light reflectance, a commercially available product can be used. For example, New Magic Mirror (manufactured by Hosaka Glass Co., Ltd.) can be used as the half mirror according to the present invention.
【0042】(光入射制御手段)本発明に係る光入射制
御手段について説明する。(Light Incidence Control Means) The light incidence control means according to the present invention will be described.
【0043】光入射制御手段としては、ハーフミラーを
介して入射する光のスイッチング(on/off)を制
御するものであれば、特に限定されないが、いわゆる、
光シャッターの機能を有するものを用いることができ、
例えば、液晶シャッター、光遮断層と発光素子の組み合
わせ等が好ましく用いられる。The light incidence control means is not particularly limited as long as it controls the switching (on / off) of the light incident through the half mirror.
The one having the function of the optical shutter can be used,
For example, a liquid crystal shutter, a combination of a light blocking layer and a light emitting element, etc. are preferably used.
【0044】液晶シャッターとしては、市販の液晶シャ
ッターを用いることが出来るが、更に、Polymer
Dispersed Liquid Crysta
l:J.W.Doane,N.A.Vez,B.G.W
u,S.Zumer,Appl.Phys.Let
t.,48,27(1986)や、Polymer N
etwork Liquid Crystal、特開平
2−28284号、同2−55318号等に記載の液晶
/高分子複合系の光シャッター装置、国特許第4,19
3,691号に記載の液晶シャッター等を使用すること
ができる。A commercially available liquid crystal shutter can be used as the liquid crystal shutter.
Dispersed Liquid Crystal
l: J. W. Doane, N.M. A. Vez, B.A. G. W
u, S. Zumer, Appl. Phys. Let
t. , 48, 27 (1986) and Polymer N.
Liquid Liquid Crystal, liquid crystal / polymer composite type optical shutter devices described in JP-A-2-28284 and JP-A-2-55318, and Japanese Patent No. 4,19.
The liquid crystal shutter described in No. 3,691 can be used.
【0045】光遮断層と発光素子の組み合わせた光シャ
ッターとしては、例えば、光遮断層としては、黒色イン
ク等を利用して作製したものが適用でき、発光素子とし
ては、市販の有機EL、無機EL、蛍光チューブ、発光
源と導光板、光散乱板などを組あせた面状発光体等を用
いることが出来る。As a light shutter in which a light blocking layer and a light emitting element are combined, for example, a light blocking layer manufactured by using black ink or the like can be applied, and as the light emitting element, a commercially available organic EL or inorganic material is used. It is possible to use an EL, a fluorescent tube, a planar light-emitting body in which a light-emitting source and a light guide plate, a light-scattering plate, etc. are assembled.
【0046】(アクティブ駆動を行う等価マトリクス回
路)図5は、図4に示した装置でアクティブ駆動を行う
際の等価のマトリックス回路の模式図である。(Equivalent Matrix Circuit for Active Drive) FIG. 5 is a schematic diagram of an equivalent matrix circuit for active drive in the device shown in FIG.
【0047】図5において、100は光検出部で、信号
線5−1〜5−nに、例えばドレイン電極が接続された
初期化用のトランジスタ65−1〜65−nが設けられ
ている。このトランジスタ65−1〜65−nのソース
電極は接地されている。また、ゲート電極はリセット線
651と接続される。In FIG. 5, reference numeral 100 denotes a photodetector, which is provided with initialization transistors 65-1 to 65-n, for example, drain electrodes connected to the signal lines 5-1 to 5-n. The source electrodes of the transistors 65-1 to 65-n are grounded. Further, the gate electrode is connected to the reset line 651.
【0048】走査線8−1〜8−mとリセット線651
は、走査駆動回路20と接続されている。走査駆動回路
20から走査線8−1〜8−mのうちの1つ走査線8−
p(pは1〜mのいずれかの値)に読出信号RSが供給
されると、この走査線8−pに接続されたトランジスタ
4−(p,1)〜4−(p,n)がオン状態とされて、
光照射によって生じたキャリアを反映する光電流が信号
線5−1〜5−nにそれぞれ読み出される。信号線5−
1〜5−nは、信号選択回路30の信号変換器31−1
〜31−nに接続されており、信号変換器31−1〜3
1−nでは信号線5−1〜5−n上に読み出された電流
値に比例する電圧信号SV−1〜SV−nを生成する。
この信号変換器31−1〜31−nから出力された電圧
信号SV−1〜SV−nはレジスタ32に供給される。Scan lines 8-1 to 8-m and reset line 651
Are connected to the scan drive circuit 20. One of the scan lines 8-1 to 8-m from the scan driving circuit 20 to the scan line 8-
When the read signal RS is supplied to p (p is any value from 1 to m), the transistors 4- (p, 1) to 4- (p, n) connected to the scanning line 8-p are turned on. Turned on,
Photocurrents that reflect the carriers generated by the light irradiation are read out to the signal lines 5-1 to 5-n, respectively. Signal line 5-
1 to 5-n are signal converters 31-1 of the signal selection circuit 30.
To 31-n and connected to signal converters 31-1 to 31-n.
1-n generates voltage signals SV-1 to SV-n proportional to the current values read on the signal lines 5-1 to 5-n.
The voltage signals SV-1 to SV-n output from the signal converters 31-1 to 31-n are supplied to the register 32.
【0049】レジスタ32では、供給された電圧信号が
順次選択されて、A/D変換器33で(例えば、12ビ
ットないし14ビットの)1つの走査線に対するディジ
タルの光信号とされ、制御回路40は、走査線8−1〜
8−m各々に、走査駆動回路20を介して読出信号RS
を供給して走査を行い、走査線毎のディジタル信号を取
り込んで、光信号の生成を行う。In the register 32, the supplied voltage signals are sequentially selected, and the A / D converter 33 converts them into digital optical signals for one scanning line (for example, 12 bits to 14 bits), and the control circuit 40. Scan lines 8-1 to
The read signal RS is supplied to each 8-m via the scan drive circuit 20.
Are supplied to perform scanning, and a digital signal for each scanning line is taken in to generate an optical signal.
【0050】この光信号は制御回路40に供給される。
なお、走査駆動回路20からリセット信号RTをリセッ
ト線651に供給してトランジスタ65−1〜65−n
をオン状態とするとともに、走査線8−1〜8−mに読
出信号RSを供給してトランジスタ4−(1,1)〜4
−(m,n)をオン状態とすると、蓄えられたキャリア
がトランジスタ65−1〜65−nを介して放出され、
光検出部100の初期化を行うことができる。This optical signal is supplied to the control circuit 40.
The scan drive circuit 20 supplies the reset signal RT to the reset line 651 to supply the transistors 65-1 to 65-n.
Is turned on and the read signal RS is supplied to the scanning lines 8-1 to 8-m to supply the transistors 4- (1, 1) to 4
When-(m, n) is turned on, the stored carriers are released through the transistors 65-1 to 65-n,
The photodetector 100 can be initialized.
【0051】制御回路40にはメモリ部41や操作部4
2が接続されており、操作部42からの操作信号PSに
基づいて、図4のシート状画像入力装置20の動作が制
御される。また表示部43に制御回路40から光信号デ
ータDSを入力することができる。The control circuit 40 includes a memory section 41 and an operating section 4.
2 are connected, and the operation of the sheet-shaped image input device 20 of FIG. 4 is controlled based on the operation signal PS from the operation unit 42. Further, the optical signal data DS can be input to the display unit 43 from the control circuit 40.
【0052】44は電源部(外部電源)、45はコネク
タで、これを介して図4に示すシート状画像入力装置2
0をその他の装置と一体化して光信号データDFEをや
り取りし、例えば画像形成などを行うことができる。Reference numeral 44 is a power source (external power source), and 45 is a connector, through which the sheet-shaped image input device 2 shown in FIG.
0 can be integrated with other devices to exchange optical signal data DFE, and for example, image formation can be performed.
【0053】(フルカラー画像検出可能なシート状画像
入力装置)図6は、フルカラー画像検出可能なシート状
画像入力装置の一例を示す模式図である。例えば、図4
に示すシート状画像入力装置20の光入射面側に、例え
ば図6に示す様な配列(Rは赤色フィルタ、Gは緑色フ
ィルタ、Bは青色フィルタ)の繰り返しで色分解用フィ
ルタを設けると、フルカラー画像を検出可能なシート状
画像入力装置が構成できる。(Sheet-shaped image input device capable of full-color image detection) FIG. 6 is a schematic view showing an example of a sheet-shaped image input device capable of full-color image detection. For example, in FIG.
When a color separation filter is provided on the light incident surface side of the sheet-shaped image input device 20 shown in FIG. 6 by repeating the arrangement (R for red filter, G for green filter, B for blue filter) as shown in FIG. A sheet-shaped image input device capable of detecting a full-color image can be configured.
【0054】なお色分解フィルタは、3原色に画像情報
を色分解するために設けるものであり、種々の構成を採
ることが可能であり、例えば黄、緑およびシアンのフィ
ルタをモザイク模様あるいはストライプ状に配列する方
法、あるいは赤・緑・青の3色のフィルタをモザイクあ
るいはストライプ状に配列する方法などがある。色分解
フィルタをモザイク状に配列する方法としてはベイヤー
配列に代表される格子状配列の方法や3角形や6角形や
円形を敷き詰める配列などが挙げられる。また各色の配
列は規則的でもよいし、全くランダムに配置しても構わ
ない。The color separation filter is provided for color separation of image information into three primary colors, and various structures can be adopted. For example, yellow, green and cyan filters are mosaic patterns or stripes. Or a method of arranging filters of three colors of red, green and blue in a mosaic or stripe form. As a method of arranging the color separation filters in a mosaic pattern, a grid-shaped array method represented by a Bayer array, an array in which triangles, hexagons, or circles are spread can be cited. The arrangement of each color may be regular or may be arranged at random.
【0055】この色分解フィルタの製造は既知の種々の
方法を用いることができる。代表的な色分解フィルタの
製造方法としては、基板上に顔料を分散した感光性樹脂
層を形成しこれをパターニングすることにより単色のパ
ターンを得る顔料分散法、基板上に染色用の材料である
水溶性高分子材料を塗布しこれをフォトリソグラフィー
工程により所望の形状にパターニングした後得られたパ
ターンを染色浴に浸漬して着色されたパターンを得る染
色法、熱硬化型の樹脂に顔料を分散させ、印刷を3回繰
り返すことによりR、G、Bを塗り分けた後、樹脂を熱
硬化させることにより着色層を形成する印刷法、色素を
含有する着色液をインクジェット方式で光透過性の基板
上に吐出し各着色液を乾燥させて着色画素部を形成する
インクジェット法などがある。Various known methods can be used to manufacture this color separation filter. A typical color separation filter manufacturing method is a pigment dispersion method in which a photosensitive resin layer in which a pigment is dispersed is formed on a substrate and a monochromatic pattern is obtained by patterning this, and a material for dyeing on the substrate. A water-soluble polymer material is applied and patterned by a photolithography process into a desired shape, and then the resulting pattern is immersed in a dyeing bath to obtain a colored pattern. A dyeing method, a pigment is dispersed in a thermosetting resin. Then, printing is repeated three times to apply R, G, and B separately, and then a resin is thermally cured to form a colored layer. A printing method in which a coloring liquid containing a dye is used as an ink-transmissive substrate There is an inkjet method in which a colored pixel portion is formed by discharging the colored liquid onto the surface and drying the colored liquid.
【0056】以下、本発明の反射率検出用素子の構成に
用いる材料について説明する。
《ソース電極、ドレイン電極用の材料》本発明の反射率
検出用素子のソース電極、ドレイン電極等の材料として
は、導電性材料であれば特に限定されず、白金、金、
銀、ニッケル、クロム、銅、鉄、錫、アンチモン鉛、タ
ンタル、インジウム、パラジウム、テルル、レニウム、
イリジウム、アルミニウム、ルテニウム、ゲルマニウ
ム、モリブデン、タングステン、酸化スズ・アンチモ
ン、酸化インジウム・スズ(ITO)、フッ素ドープ酸
化亜鉛、亜鉛、炭素、グラファイト、グラッシーカーボ
ン、銀ペーストおよびカーボンペースト、リチウム、ベ
リリウム、ナトリウム、マグネシウム、カリウム、カル
シウム、スカンジウム、チタン、マンガン、ジルコニウ
ム、ガリウム、ニオブ、ナトリウム、ナトリウム−カリ
ウム合金、マグネシウム、リチウム、アルミニウム、マ
グネシウム/銅混合物、マグネシウム/銀混合物、マグ
ネシウム/アルミニウム混合物、マグネシウム/インジ
ウム混合物、アルミニウム/酸化アルミニウム混合物、
リチウム/アルミニウム混合物等が用いられるが、特
に、白金、金、銀、銅、アルミニウム、インジウム、I
TOおよび炭素が好ましい。あるいはドーピング等で導
電率を向上させた公知の導電性ポリマー、例えば導電性
ポリアニリン、導電性ポリピロール、導電性ポリチオフ
ェン、ポリエチレンジオキシチオフェンとポリスチレン
スルホン酸の錯体なども好適に用いられる。中でも半導
体層との接触面において電気抵抗が少ないものが好まし
い。Materials used for the structure of the reflectance detecting element of the present invention will be described below. << Materials for Source Electrode, Drain Electrode >> Materials for the source electrode, drain electrode, etc. of the reflectance detecting element of the present invention are not particularly limited as long as they are conductive materials, and platinum, gold,
Silver, nickel, chromium, copper, iron, tin, antimony lead, tantalum, indium, palladium, tellurium, rhenium,
Iridium, aluminum, ruthenium, germanium, molybdenum, tungsten, tin antimony oxide, indium tin oxide (ITO), fluorine-doped zinc oxide, zinc, carbon, graphite, glassy carbon, silver paste and carbon paste, lithium, beryllium, sodium , Magnesium, potassium, calcium, scandium, titanium, manganese, zirconium, gallium, niobium, sodium, sodium-potassium alloy, magnesium, lithium, aluminum, magnesium / copper mixture, magnesium / silver mixture, magnesium / aluminum mixture, magnesium / indium. Mixture, aluminum / aluminum oxide mixture,
A lithium / aluminum mixture or the like is used, but in particular platinum, gold, silver, copper, aluminum, indium, I
TO and carbon are preferred. Alternatively, a known conductive polymer whose conductivity is improved by doping or the like, such as conductive polyaniline, conductive polypyrrole, conductive polythiophene, or a complex of polyethylenedioxythiophene and polystyrene sulfonic acid, is also preferably used. Among them, those having a low electric resistance on the contact surface with the semiconductor layer are preferable.
【0057】《ゲート電極用の材料》本発明に係るゲー
ト電極は透明電極であることが好ましい。ここで、透明
とは、350nm〜850nmの光透過率が50%以上
であることが好ましく、更に好ましくは、前記光透過率
が、50%〜99%の範囲である。<< Material for Gate Electrode >> The gate electrode according to the present invention is preferably a transparent electrode. Here, the term "transparent" means that the light transmittance at 350 nm to 850 nm is preferably 50% or more, and more preferably the light transmittance is in the range of 50% to 99%.
【0058】本発明に係るゲート電極用形成材料として
は、ゲート電極を有する側を光入射面とする場合、ゲー
ト電極は酸化インジウム、酸化錫、酸化亜鉛、Fドープ
酸化錫、Alドープ酸化亜鉛、Sbドープ酸化錫、IT
O、In2O3−ZnO系アモルファス透明導電膜等の透
明導電膜を用いることにより、上記の透明電極を構成す
ることができる。As the material for forming a gate electrode according to the present invention, when the side having the gate electrode is the light incident surface, the gate electrode is indium oxide, tin oxide, zinc oxide, F-doped tin oxide, Al-doped zinc oxide, Sb-doped tin oxide, IT
The transparent electrode described above can be formed by using a transparent conductive film such as an O, In 2 O 3 —ZnO-based amorphous transparent conductive film.
【0059】(電極の形成方法)電極の形成方法として
は、上記記載の導電性材料を原料として蒸着やスパッタ
リング等の方法を用いて形成した導電性薄膜を、公知の
フォトリソグラフ法やリフトオフ法を用いて電極形成す
る方法、アルミニウムや銅などの金属箔上に熱転写、イ
ンクジェット等によるレジストを用いてエッチングする
方法がある。(Method of forming electrode) As a method of forming an electrode, a conductive thin film formed by using the above-mentioned conductive material as a raw material by a method such as vapor deposition or sputtering is subjected to a known photolithography method or a lift-off method. There are a method of forming an electrode by using it, a method of thermal transfer on a metal foil such as aluminum or copper, and a method of etching using a resist such as an inkjet.
【0060】また、導電性ポリマーの溶液あるいは分散
液,導電性微粒子分散液を直接インクジェットによりパ
ターニングしてもよいし、塗工膜からリソグラフやレー
ザーアブレーションなどにより形成してもよい。さらに
導電性ポリマーや導電性微粒子を含むインク、導電性ペ
ーストなどを凸版、凹版、平版、スクリーン印刷などの
印刷法でパターニングする方法も用いることができる。The conductive polymer solution or dispersion, or the conductive fine particle dispersion may be directly patterned by ink jet, or may be formed from the coating film by lithographic or laser ablation. Further, a method of patterning an ink containing a conductive polymer or conductive fine particles, a conductive paste or the like by a printing method such as letterpress, intaglio, planographic printing or screen printing can also be used.
【0061】上記導電性微粒子としては、粒子径が1n
m〜50nm好ましくは1nm〜10nmの白金、金、
銀、ニッケル、クロム、銅、鉄、錫、タンタル、インジ
ウム、コバルト、パラジウム、テルル、レニウム、イリ
ジウム、アルミニウム、ルテニウム、ゲルマニウム、モ
リブデン,タングステン、亜鉛、等を用いることができ
るが、特に好ましくは、仕事関数が4.5eV以上の白
金、金、銀、銅、コバルト、クロム、イリジウム、ニッ
ケル、パラジウム、モリブデン、タングステン等の金属
微粒子が挙げられる。The conductive fine particles have a particle size of 1 n.
m-50 nm, preferably 1 nm-10 nm platinum, gold,
Silver, nickel, chromium, copper, iron, tin, tantalum, indium, cobalt, palladium, tellurium, rhenium, iridium, aluminum, ruthenium, germanium, molybdenum, tungsten, zinc, etc. can be used, but particularly preferably, Examples thereof include fine metal particles having a work function of 4.5 eV or more, such as platinum, gold, silver, copper, cobalt, chromium, iridium, nickel, palladium, molybdenum, and tungsten.
【0062】このような金属微粒子分散液の製造方法と
して、ガス中蒸発法、スパッタリング法、金属蒸気合成
法などの物理的生成法や、コロイド法、共沈法などの、
液相で金属イオンを還元して金属微粒子を生成する化学
的生成法が挙げられるが、好ましくは、特開平11−7
6800、同11−80647、同319538、特開
2000−239853などに示されたコロイド法、特
開2001−254185、特開2001−5302
8、特開2001−35814、特開2001−352
55、特開2000−124157、特開2000−1
23634などに記載されたガス中蒸発法により製造さ
れた分散物である。これらの分散物を、塗設し電極パタ
ーン状に成型した後、溶媒を乾燥させ、さらに100℃
〜300℃、好ましくは150℃〜200℃の範囲で熱
処理することにより、金属微粒子を熱融着させることで
電極形成することが出来る。As a method for producing such a metal fine particle dispersion, a physical production method such as a gas evaporation method, a sputtering method, a metal vapor synthesis method, a colloid method, a coprecipitation method, or the like can be used.
A chemical production method of producing metal fine particles by reducing metal ions in a liquid phase can be mentioned, and preferably, JP-A No. 11-7.
No. 6800, No. 11-80647, No. 319538, the colloid method shown in JP-A-2000-239853, JP-A-2001-254185, and JP-A-2001-5302.
8, JP 2001-35814A, JP 2001-352A
55, JP 2000-124157, JP 2000-1.
It is a dispersion produced by the gas evaporation method described in 23634. After coating these dispersions and molding them into an electrode pattern, the solvent is dried and the temperature is raised to 100 ° C.
The electrode can be formed by heat-sealing the metal fine particles by heat treatment in the range of 300 to 300 ° C., preferably 150 to 200 ° C.
【0063】《絶縁層》本発明に係る絶縁層として種々
の絶縁膜を用いることができるが、特に、比誘電率の高
い無機酸化物皮膜が好ましい。無機酸化物としては、酸
化ケイ素、酸化アルミニウム、酸化タンタル、酸化チタ
ン、酸化スズ、酸化バナジウム、チタン酸バリウムスト
ロンチウム、ジルコニウム酸チタン酸バリウム、ジルコ
ニウム酸チタン酸鉛、チタン酸鉛ランタン、チタン酸ス
トロンチウム、チタン酸バリウム、フッ化バリウムマグ
ネシウム、チタン酸ビスマス、チタン酸ストロンチウム
ビスマス、タンタル酸ストロンチウムビスマス、タンタ
ル酸ニオブ酸ビスマス、トリオキサイドイットリウムな
どが挙げられる。それらのうち好ましいのは、酸化ケイ
素、酸化アルミニウム、酸化タンタル、酸化チタンであ
る。但し、窒化珪素、窒化アルミニウム等の窒化物も用
いることが出来る。<< Insulating Layer >> Although various insulating films can be used as the insulating layer according to the present invention, an inorganic oxide film having a high relative dielectric constant is particularly preferable. As the inorganic oxide, silicon oxide, aluminum oxide, tantalum oxide, titanium oxide, tin oxide, vanadium oxide, barium strontium titanate, barium zirconate titanate, lead zirconate titanate, lead lanthanum titanate, strontium titanate, Examples thereof include barium titanate, barium magnesium fluoride, bismuth titanate, strontium bismuth titanate, strontium bismuth tantalate, bismuth tantalate niobate, and yttrium trioxide. Of these, preferred are silicon oxide, aluminum oxide, tantalum oxide, and titanium oxide. However, nitrides such as silicon nitride and aluminum nitride can also be used.
【0064】上記皮膜の形成方法としては、真空蒸着
法、分子線エピタキシャル成長法、イオンクラスタービ
ーム法、低エネルギーイオンビーム法、イオンプレーテ
ィング法、CVD法、スパッタリング法、大気圧プラズ
マ法などのドライプロセスや、スプレーコート法、スピ
ンコート法、ブレードコート法、デイップコート法、キ
ャスト法、ロールコート法、バーコート法、ダイコート
法などの塗布による方法、印刷やインクジェットなどの
パターニングによる方法などのウェットプロセスが挙げ
られ、材料に応じて使用できる。As a method for forming the above-mentioned film, a dry process such as a vacuum vapor deposition method, a molecular beam epitaxial growth method, an ion cluster beam method, a low energy ion beam method, an ion plating method, a CVD method, a sputtering method and an atmospheric pressure plasma method. Wet processes such as spray coating method, spin coating method, blade coating method, dip coating method, casting method, roll coating method, bar coating method, die coating method, etc. And can be used depending on the material.
【0065】ウェットプロセスは、無機酸化物の微粒子
を、任意の有機溶剤あるいは水に必要に応じて界面活性
剤などの分散補助剤を用いて分散した液を塗布、乾燥す
る方法や、酸化物前駆体、例えばアルコキシド体の溶液
を塗布、乾燥する、いわゆるゾルゲル法が用いられる。The wet process is carried out by applying a liquid in which fine particles of an inorganic oxide are dispersed in an arbitrary organic solvent or water using a dispersion aid such as a surfactant, if necessary, or by applying an oxide precursor. A so-called sol-gel method is used in which a solution of a body, for example, an alkoxide body is applied and dried.
【0066】これらのうち好ましいのは、下記の大気圧
プラズマ法とゾルゲル法である。大気圧下でのプラズマ
製膜処理による絶縁膜の形成方法は、大気圧または大気
圧近傍の圧力下で放電し、反応性ガスをプラズマ励起
し、基材上に薄膜を形成する処理で、その方法について
は特開平11−61406号、同11−133205
号、特開2000−121804、同2000−147
209、同2000−185362等に記載されてい
る。これによって高機能性の薄膜を、生産性高く形成す
ることができる。Among these, the atmospheric pressure plasma method and the sol-gel method described below are preferable. The method for forming an insulating film by the plasma film forming process under atmospheric pressure is a process of discharging under atmospheric pressure or a pressure near atmospheric pressure, plasma-exciting a reactive gas, and forming a thin film on a substrate. Regarding the method, JP-A Nos. 11-61406 and 11-133205
No. 2000-121804 and 2000-147.
209, 2000-185362. As a result, a highly functional thin film can be formed with high productivity.
【0067】また有機化合物皮膜としては、ポリイミ
ド、ポリアミド、ポリエステル、ポリアクリレート、光
ラジカル重合系、光カチオン重合系の光硬化性樹脂、あ
るいはアクリロニトリル成分を含有する共重合体、ポリ
ビニルフェノール、ポリビニルアルコール、ノボラック
樹脂、およびシアノエチルプルラン等を用いることもで
きる。有機化合物皮膜の形成法としては、前記ウェット
プロセスが好ましい。As the organic compound film, polyimide, polyamide, polyester, polyacrylate, photoradical polymerization type, photocationic polymerization type photocurable resin, or a copolymer containing an acrylonitrile component, polyvinylphenol, polyvinyl alcohol, It is also possible to use novolac resin, cyanoethyl pullulan, or the like. The wet process is preferable as the method for forming the organic compound film.
【0068】無機酸化物皮膜と有機酸化物皮膜は積層し
て併用することができる。またこれら絶縁膜の膜厚とし
ては、50nm〜3μmの範囲が好ましく、更に好まし
くは、100nm〜1μmの範囲である。The inorganic oxide film and the organic oxide film can be laminated and used together. Further, the film thickness of these insulating films is preferably in the range of 50 nm to 3 μm, and more preferably in the range of 100 nm to 1 μm.
【0069】《有機半導体層》本発明に係る有機半導体
層の形成材料について説明する。<< Organic Semiconductor Layer >> The material for forming the organic semiconductor layer according to the present invention will be described.
【0070】本発明では、有機半導体層に生じた光電荷
(キャリア)をソース電極とドレイン電極の間に流れる
電流値として反映させることが出来るので、キャリアと
しては電子、ホールのいずれでもよいが、有機半導体層
がp型の場合、ソース電極−ドレイン電極間の光電流の
メインキャリア(主キャリアともいう)はホールが好ま
しく、有機半導体層がn型の場合、該メインキャリア
(主キャリアともいう)としては電子が好ましい。In the present invention, since photocharges (carriers) generated in the organic semiconductor layer can be reflected as the value of the current flowing between the source electrode and the drain electrode, the carriers may be either electrons or holes. When the organic semiconductor layer is p-type, holes are preferable as the main carriers (also called main carriers) of the photocurrent between the source electrode and the drain electrode, and when the organic semiconductor layer is n-type, the main carriers (also called main carriers). Of these, electrons are preferred.
【0071】本発明に係る有機半導体層を構成する有機
半導体材料としては、π共役系材料が用いられる。たと
えばポリピロール、ポリ(N−置換ピロール)、ポリ
(3−置換ピロール)、ポリ(3,4−二置換ピロー
ル)などのポリピロール類、ポリチオフェン、ポリ(3
−置換チオフェン)、ポリ(3,4−二置換チオフェ
ン)、ポリベンゾチオフェンなどのポリチオフェン類、
ポリイソチアナフテンなどのポリイソチアナフテン類、
ポリチェニレンビニレンなどのポリチェニレンビニレン
類、ポリ(p−フェニレンビニレン)などのポリ(p−
フェニレンビニレン)類、ポリアニリン、ポリ(N−置
換アニリン)、ポリ(3−置換アニリン)、ポリ(2,
3−置換アニリン)などのポリアニリン類、ポリアセチ
レンなどのポリアセチレン類、ポリジアセチレンなどの
ポリジアセチレン類、ポリアズレンなどのポリアズレン
類、ポリピレンなどのポリピレン類、ポリカルバゾー
ル、ポリ(N−置換カルバゾール)などのポリカルバゾ
ール類、ポリセレノフェンなどのポリセレノフェン類、
ポリフラン、ポリベンゾフランなどのポリフラン類、ポ
リ(p−フェニレン)などのポリ(p−フェニレン)
類、ポリインドールなどのポリインドール類、ポリピリ
ダジンなどのポリピリダジン類、ナフタセン、ペンタセ
ン、ヘキサセン、ヘプタセン、ジベンゾペンタセン、テ
トラベンゾペンタセン、ピレン、ジベンゾピレン、クリ
セン、ペリレン、コロネン、テリレン、オバレン、クオ
テリレン、サーカムアントラセンなどのポリアセン類お
よびポリアセン類の炭素の一部をN、S、Oなどの原
子、カルボニル基などの官能基に置換した誘導体(トリ
フェノジオキサジン、トリフェノジチアジン、ヘキサセ
ン−6,15−キノンなど)、ポリビニルカルバゾー
ル、ポリフエニレンスルフィド、ポリビニレンスルフィ
ドなどのポリマーや特開平11−195790に記載さ
れた多環縮合体などを用いることができる。A π-conjugated material is used as the organic semiconductor material forming the organic semiconductor layer according to the present invention. For example, polypyrroles such as polypyrrole, poly (N-substituted pyrrole), poly (3-substituted pyrrole), poly (3,4-disubstituted pyrrole), polythiophene, poly (3
-Substituted thiophenes), poly (3,4-disubstituted thiophenes), polythiophenes such as polybenzothiophenes,
Polyisothianaphthenes such as polyisothianaphthene,
Poly (phenylene vinylenes) such as poly (phenylene vinylene), poly (p-phenylene vinylenes) such as poly (p-phenylene vinylene)
Phenylene vinylenes), polyaniline, poly (N-substituted aniline), poly (3-substituted aniline), poly (2,2)
3-substituted aniline) and other polyanilines, polyacetylene and other polyacetylenes, polydiacetylene and other polydiacetylenes, polyazulene and other polyazylenes, polypyrene and other polypyrenes, polycarbazole, poly (N-substituted carbazole) and other polycarbazoles. , Polyselenophenes such as polyselenophene,
Polyfurans such as polyfuran and polybenzofuran, poly (p-phenylene) such as poly (p-phenylene)
, Polyindoles such as polyindole, polypyridazines such as polypyridazine, naphthacene, pentacene, hexacene, heptacene, dibenzopentacene, tetrabenzopentacene, pyrene, dibenzopyrene, chrysene, perylene, coronene, terylene, ovaren, quaterylene, Derivatives obtained by substituting a part of carbons of polyacenes such as circumanthracene and polyacenes with atoms such as N, S and O and functional groups such as carbonyl groups (triphenodioxazine, triphenodithiazine, hexacene-6,15- For example, polymers such as quinone), polyvinylcarbazole, polyphenylene sulfide, and polyvinylene sulfide, and polycondensates described in JP-A No. 11-195790 can be used.
【0072】また、これらのポリマーと同じ繰返し単位
を有するたとえばチオフェン6量体であるα−セクシチ
オフェンα,ω−ジヘキシル−α−セクシチオフェン、
α,ω−ジヘキシル−α−キンケチオフェン、α,ω−
ビス(3−ブトキシプロピル)−α−セクシチオフェ
ン、スチリルベンゼン誘導体などのオリゴマーも好適に
用いることができる。Further, α-sexithiophene α, ω-dihexyl-α-sexithiophene, which is a thiophene hexamer, having the same repeating unit as those of these polymers,
α, ω-dihexyl-α-kinkethiophene, α, ω-
Oligomers such as bis (3-butoxypropyl) -α-sexithiophene and styrylbenzene derivatives can also be preferably used.
【0073】さらに銅フタロシアニンや特開平11−2
51601に記載のフッ素置換銅フタロシアニンなどの
金属フタロシアニン類、ナフタレン1,4,5,8−テ
トラカルボン酸ジイミド、N,N’−ビス(4−トリフ
ルオロメチルベンジル)ナフタレン1,4,5,8−テ
トラカルボン酸ジイミドとともに、N,N’−ビス(1
H,1H−ペルフルオロオクチル)、N,N’−ビス
(1H,1H−ペルフルオロブチル)及びN,N’−ジ
オクチルナフタレン1,4,5,8−テトラカルボン酸
ジイミド誘導体、ナフタレン2,3,6,7テトラカル
ボン酸ジイミドなどのナフタレンテトラカルボン酸ジイ
ミド類、及びアントラセン2,3,6,7−テトラカル
ボン酸ジイミドなどのアントラセンテトラカルボン酸ジ
イミド類などの縮合環テトラカルボン酸ジイミド類、C
60、C70、C76、C78、C84等フラーレン類、SWNT
などのカーボンナノチューブ、メロシアニン色素類、ヘ
ミシアニン色素類などの色素などがあげられる。Furthermore, copper phthalocyanine and JP-A-11-2
51601, metal phthalocyanines such as fluorine-substituted copper phthalocyanine, naphthalene 1,4,5,8-tetracarboxylic acid diimide, N, N′-bis (4-trifluoromethylbenzyl) naphthalene 1,4,5,8 -With tetracarboxylic acid diimide, N, N'-bis (1
H, 1H-perfluorooctyl), N, N'-bis (1H, 1H-perfluorobutyl) and N, N'-dioctylnaphthalene 1,4,5,8-tetracarboxylic acid diimide derivative, naphthalene 2,3,6 , 7 Tetracarboxylic acid diimides and other naphthalene tetracarboxylic acid diimides, and anthracene 2,3,6,7-tetracarboxylic acid diimides and other anthracene tetracarboxylic acid diimides and other condensed ring tetracarboxylic acid diimides, C
Fullerenes such as 60 , C 70 , C 76 , C 78 , C 84 , SWNT
Examples thereof include carbon nanotubes, merocyanine dyes, and hemicyanine dyes.
【0074】これらのπ共役系材料のうちでも、チオフ
ェン、ビニレン、チェニレンビニレン、フェニレンビニ
レン、p−フェニレン、これらの置換体またはこれらの
2種以上を繰返し単位とし、かつ該繰返し単位の数nが
4〜10であるオリゴマーもしくは該繰返し単位の数n
が20以上であるポリマー、ペンタセンなどの縮合多環
芳香族化合物、フラーレン類、縮合環テトラカルボン酸
ジイミド類、金属フタロシアニンよりなる群から選ばれ
た少なくとも1種が好ましく、特にπ共役系ポリマーが
好ましい。Among these π-conjugated materials, thiophene, vinylene, phenylene vinylene, phenylene vinylene, p-phenylene, their substitution products or two or more of these repeating units are used, and the number of repeating units is n. Is 4 to 10 and the number of repeating units is n.
Is 20 or more, at least one selected from the group consisting of condensed polycyclic aromatic compounds such as pentacene, fullerenes, condensed ring tetracarboxylic acid diimides, and metal phthalocyanines is preferable, and a π-conjugated polymer is particularly preferable. .
【0075】また、その他の有機半導体材料としては、
テトラチアフルバレン(TTF)−テトラシアノキノジ
メタン(TCNQ)錯体、ビスエチレンテトラチアフル
バレン(BEDTTTF)−過塩素酸錯体、BEDTT
TF−ヨウ素錯体、TCNQ−ヨウ素錯体、などの有機
分子錯体も用いることができる。さらにポリシラン、ポ
リゲルマンなどのσ共役系ポリマーや特開2000−2
60999に記載の有機・無機混成材料も用いることが
できる。As other organic semiconductor materials,
Tetrathiafulvalene (TTF) -Tetracyanoquinodimethane (TCNQ) complex, Bisethylenetetrathiafulvalene (BEDTTTF) -Perchloric acid complex, BEDTT
Organic molecular complexes such as TF-iodine complex and TCNQ-iodine complex can also be used. Further, σ-conjugated polymers such as polysilane and polygermane, and JP-A-2000-2
The organic / inorganic hybrid material described in 60999 can also be used.
【0076】本発明においては、有機半導体層に、たと
えば、アクリル酸、アセトアミド、ジメチルアミノ基、
シアノ基、カルボキシル基、ニトロ基などの官能基を有
する材料や、ベンゾキノン誘導体、テトラシアノエチレ
ンおよびテトラシアノキノジメタンやそれらの誘導体な
どのように電子を受容するアクセプターとなる材料や、
たとえばアミノ基、トリフェニル基、アルキル基、水酸
基、アルコキシ基、フェニル基などの官能基を有する材
料、フェニレンジアミンなどの置換アミン類、アントラ
セン、ベンゾアントラセン、置換ベンゾアントラセン
類、ピレン、置換ピレン、カルバゾールおよびその誘導
体、テトラチアフルバレンとその誘導体などのように電
子の供与体であるドナーとなるような材料を含有させ、
いわゆるドーピング処理を施してもよい。In the present invention, the organic semiconductor layer may include, for example, acrylic acid, acetamide, dimethylamino group,
Materials having functional groups such as cyano group, carboxyl group, and nitro group, and materials serving as acceptors that accept electrons, such as benzoquinone derivatives, tetracyanoethylene and tetracyanoquinodimethane, and their derivatives,
For example, materials having functional groups such as amino groups, triphenyl groups, alkyl groups, hydroxyl groups, alkoxy groups, and phenyl groups, substituted amines such as phenylenediamine, anthracene, benzanthracene, substituted benzanthracenes, pyrene, substituted pyrene, and carbazole. And a derivative thereof, tetrathiafulvalene and a derivative thereof, and the like, containing a material that serves as a donor that is an electron donor,
A so-called doping process may be performed.
【0077】前記ドーピングとは電子授与性分子(アク
セプター)または電子供与性分子(ドナー)をドーパン
トとして該薄膜に導入することを意味する。従って,ド
ーピングが施された薄膜は、前記の縮合多環芳香族化合
物とドーパントを含有する薄膜である。本発明に用いる
ドーパントとしてアクセプター、ドナーのいずれも使用
可能である。The above-mentioned doping means introducing an electron-donating molecule (acceptor) or an electron-donating molecule (donor) into the thin film as a dopant. Therefore, the doped thin film is a thin film containing the condensed polycyclic aromatic compound and the dopant. As the dopant used in the present invention, either an acceptor or a donor can be used.
【0078】このアクセプターとしてCl2、Br2、I
2、ICl、ICl3、IBr、IFなどのハロゲン、P
F5、AsF5、SbF5、BF3、BC13、BBr3、S
O3などのルイス酸、HF、HC1、HNO3、H2S
O4、HClO4、FSO3H、ClSO3H、CF3SO3
Hなどのプロトン酸、酢酸、蟻酸、アミノ酸などの有機
酸、FeCl3、FeOCl、TiCl4、ZrCl4、
HfCl4、NbF5、NbCl5、TaCl5、MoCl
5、WF5、WCl6、UF6、LnCl3(Ln=La、
Ce、Nd、Pr、などのランタノイドとY)などの遷
移金属化合物、Cl-、Br-、I-、ClO4 -、P
F6 -、AsF5 -、SbF6 -、BF4 -、スルホン酸アニオ
ンなどの電解質アニオンなどを挙げることができる。Cl 2 , Br 2 , and I are used as the acceptor.
2 , halogen such as ICl, ICl 3 , IBr, IF, P
F 5 , AsF 5 , SbF 5 , BF 3 , BC1 3 , BBr 3 , S
Lewis acids such as O 3 , HF, HC1, HNO 3 , H 2 S
O 4 , HClO 4 , FSO 3 H, ClSO 3 H, CF 3 SO 3
Protonic acid such as H, acetic acid, formic acid, organic acid such as amino acid, FeCl 3 , FeOCl, TiCl 4 , ZrCl 4 ,
HfCl 4 , NbF 5 , NbCl 5 , TaCl 5 , MoCl
5 , WF 5 , WCl 6 , UF 6 , LnCl 3 (Ln = La,
Ce, Nd, Pr, and other lanthanoids and transition metal compounds such as Y), Cl − , Br − , I − , ClO 4 − , P
Examples thereof include electrolyte anions such as F 6 − , AsF 5 − , SbF 6 − , BF 4 − , and sulfonate anion.
【0079】またドナーとしては、Li、Na、K、R
b、Csなどのアルカリ金属、Ca、Sr、Baなどの
アルカリ土類金属、Y、La、Ce、Pr、Nd、S
m、Eu、Gd、Tb、Dy、Ho、Er、Ybなどの
希土類金属、アンモニウムイオン、R4P+、R4As+、
R3S+、アセチルコリンなどをあげることができる。As donors, Li, Na, K, R
Alkali metals such as b and Cs, alkaline earth metals such as Ca, Sr and Ba, Y, La, Ce, Pr, Nd and S
Rare earth metals such as m, Eu, Gd, Tb, Dy, Ho, Er and Yb, ammonium ion, R 4 P + , R 4 As + ,
Examples thereof include R 3 S + and acetylcholine.
【0080】これらのドーパントのドーピングの方法と
して予め有機半導体の薄膜を作製しておき、ドーパント
を後で導入する方法、有機半導体の薄膜作製時にドーパ
ントを導入する方法のいずれも使用可能である。前者の
方法のドーピングとして、ガス状態のドーパントを用い
る気相ドーピング、溶液あるいは液体のドーパントを該
薄膜に接触させてドーピングする液相ドーピング、個体
状態のドーパントを該薄膜に接触させてドーパントを拡
散ドーピングする固相ドーピングの方法をあげることが
できる。また液相ドーピングにおいては電解を施すこと
によってドーピングの効率を調整することができる。後
者の方法では、有機半導体化合物とドーパントの混合溶
液あるいは分散液を同時に塗布、乾燥してもよい。たと
えば真空蒸着法を用いる場合、有機半導体化合物ととも
にドーパントを共蒸着することによりドーパントを導入
することができる。またスパッタリング法で薄膜を作製
する場合、有機半導体化合物とドーパントの二元ターゲ
ットを用いてスパッタリングして薄膜中にドーパントを
導入させることができる。さらに他の方法として、電気
化学的ドーピング、光開始ドーピング等の化学的ドーピ
ングおよび例えば刊行物「工業材料」34巻、第4号、
55頁(1986年)に示されたイオン注入法等の物理
的ドーピングの何れも使用可能である。As a method of doping these dopants, either a method of previously forming a thin film of an organic semiconductor and introducing the dopant later or a method of introducing the dopant at the time of forming the thin film of the organic semiconductor can be used. As the doping of the former method, vapor phase doping using a gas state dopant, liquid phase doping in which a solution or liquid dopant is brought into contact with the thin film to dope, and solid state dopant is brought into contact with the thin film to perform diffusion doping The solid-state doping method can be used. In liquid phase doping, the efficiency of doping can be adjusted by applying electrolysis. In the latter method, a mixed solution or dispersion of the organic semiconductor compound and the dopant may be simultaneously applied and dried. For example, when using a vacuum evaporation method, a dopant can be introduced by co-evaporating a dopant with an organic semiconductor compound. When the thin film is formed by the sputtering method, the dopant can be introduced into the thin film by sputtering using a binary target of the organic semiconductor compound and the dopant. Still other methods include chemical doping, such as electrochemical doping, photoinitiated doping and the like, eg publication “Industrial Materials” 34, No. 4,
Any of the physical doping methods such as the ion implantation method shown on page 55 (1986) can be used.
【0081】(有機半導体層(有機薄膜)の作製方法)
これら有機半導体層(有機薄膜)の作製法としては、真
空蒸着法、分子線エピタキシャル成長法、イオンクラス
タービーム法、低エネルギーイオンビーム法、イオンプ
レーティング法、CVD法、スパッタリング法、プラズ
マ重合法、電解重合法、化学重合法、スプレーコート
法、スピンコート法、ブレードコート法、デイップコー
ト法、キャスト法、ロールコート法、バーコート法、ダ
イコート法およびLB法等が挙げられ、材料に応じて使
用できる。ただし、この中で生産性の点で、有機半導体
の溶液を用いて簡単かつ精密に薄膜が形成できるスピン
コート法、ブレードコート法、デイップコート法、ロー
ルコート法、バーコート法、ダイコート法等が好まれ
る。(Method for producing organic semiconductor layer (organic thin film))
These organic semiconductor layers (organic thin films) can be produced by vacuum vapor deposition method, molecular beam epitaxial growth method, ion cluster beam method, low energy ion beam method, ion plating method, CVD method, sputtering method, plasma polymerization method, electrolysis. The polymerization method, the chemical polymerization method, the spray coating method, the spin coating method, the blade coating method, the dip coating method, the casting method, the roll coating method, the bar coating method, the die coating method, the LB method and the like can be mentioned, and they can be used depending on the material. . However, among these, from the viewpoint of productivity, spin coating, blade coating, dip coating, roll coating, bar coating, die coating, etc. that can easily and precisely form a thin film using a solution of an organic semiconductor are available. Be preferred.
【0082】(有機半導体層の膜厚)これら有機半導体
からなる薄膜の膜厚としては、特に制限はないが、得ら
れたトランジスタの特性は、有機半導体からなる活性層
の膜厚に大きく左右される場合が多く、その膜厚は、有
機半導体により異なるが、1μm以下が好ましく、更に
好ましくは、10nm〜300nmである。(Film Thickness of Organic Semiconductor Layer) The film thickness of the thin film made of these organic semiconductors is not particularly limited, but the characteristics of the obtained transistor are greatly influenced by the film thickness of the active layer made of the organic semiconductor. In many cases, the film thickness varies depending on the organic semiconductor, but is preferably 1 μm or less, more preferably 10 nm to 300 nm.
【0083】《電荷発生層》本発明に係る電荷発生層に
ついて説明する。<< Charge Generation Layer >> The charge generation layer according to the present invention will be described.
【0084】本発明では、有機半導体層に生じた光電荷
(キャリア)をソース電極とドレイン電極の間に流れる
電流値として反映させるものなので、キャリアとしては
電子、ホールのいずれでもよいが、有機半導体層がp型
の場合、ソース電極−ドレイン電極間の光電流のメイン
キャリアはホールが好ましく、有機半導体層がn型の場
合、該メインキャリアは電子が好ましい。In the present invention, the photocharges (carriers) generated in the organic semiconductor layer are reflected as the value of the current flowing between the source electrode and the drain electrode. Therefore, the carrier may be either an electron or a hole. When the layer is p-type, holes are preferable as the main carriers of photocurrent between the source electrode and the drain electrode, and when the organic semiconductor layer is n-type, the main carriers are preferably electrons.
【0085】また、光入射時の光電荷(キャリア)量を
増大させる観点から、有機半導体層とハーフミラーとの
間に、電荷発生層を設けることが好ましく、更に好まし
くは、350nm〜850nmの光透過率が10%以上
の電荷発生層を設けることがであり、特に好ましくは、
透過率が50%〜90%の電荷発生層を設けることであ
る。From the viewpoint of increasing the amount of photocharges (carriers) upon incidence of light, it is preferable to provide a charge generation layer between the organic semiconductor layer and the half mirror, and more preferably, light of 350 nm to 850 nm is used. A charge generation layer having a transmittance of 10% or more may be provided, and particularly preferably,
This is to provide a charge generation layer having a transmittance of 50% to 90%.
【0086】電荷発生層は、電荷発生物質としてのスー
ダンレッド又はダイアンブルー等のアゾ顔料、ピレンキ
ノン、アントアントロン等のキノン顔料、インジゴ、チ
オインジゴなどのインジゴ顔料、アズレニウム塩顔料、
銅フタロシアニン、無金属フタロシアニン、チタニルフ
タロシアニンなどのフタロシアニン顔料等をバインダー
樹脂であるポリエステル、ポリカーボネート、ポリスチ
レン、ポリビニルブチラール、ポリ酢酸ビニル、アクリ
ル樹脂、ポリビニルピロリドン、エチルセルロース、酢
酸酪酸セルロース等に分散含有させた層として得られ
る。The charge generating layer comprises an azo pigment such as Sudan Red or Diane Blue as a charge generating substance, a quinone pigment such as pyrenequinone or anthanthrone, an indigo pigment such as indigo or thioindigo, an azurenium salt pigment,
Layers in which phthalocyanine pigments such as copper phthalocyanine, metal-free phthalocyanine, and titanyl phthalocyanine are dispersed in binder resins such as polyester, polycarbonate, polystyrene, polyvinyl butyral, polyvinyl acetate, acrylic resin, polyvinylpyrrolidone, ethyl cellulose, and cellulose acetate butyrate. Obtained as.
【0087】即ち、電荷発生物質及びバインダー樹脂を
例えばトルエン、キシレン等の炭化水素類;メチレンク
ロライド、1,2−ジクロルエタン等のハロゲン化炭化
水素;メチルエチルケトン、シクロヘキサノン等のケト
ン類;酢酸エチル、酢酸ブチル等のエステル類;メタノ
ール、エタノール、プロパノール、ブタノール、メチル
セルソルブ、エチルセルソルブ等のアルコール類及びこ
の誘導体;テトラヒドロフラン、1,4−ジオキサン等
のエーテル類;ピリジンやジエチルアミン等のアミン
類;N,N−ジメチルホルムアミド等のアミド類等の窒
素化合物;その他脂肪酸及びフェノール類;二硫化炭素
や燐酸トリエチル等の硫黄、燐化合物等の1種又は2種
以上の溶媒中にボールミル、ホモミキサー、サンドミ
ル、超音波分散等により、溶解、分散して塗布液を作製
し、これをディップ、スプレー、ブレード、ロール等の
塗布方法により塗布、乾燥して形成することができる。That is, the charge generating substance and the binder resin are, for example, hydrocarbons such as toluene and xylene; halogenated hydrocarbons such as methylene chloride and 1,2-dichloroethane; ketones such as methyl ethyl ketone and cyclohexanone; ethyl acetate and butyl acetate. And the like; alcohols such as methanol, ethanol, propanol, butanol, methylcellosolve, ethylcellosolve and the like; ethers such as tetrahydrofuran and 1,4-dioxane; amines such as pyridine and diethylamine; N, Nitrogen compounds such as amides such as N-dimethylformamide; Other fatty acids and phenols; Sulfur such as carbon disulfide and triethyl phosphate; and ball mill, homomixer, sand mill in one or more solvents such as phosphorus compounds. By ultrasonic dispersion , Dissolved, dispersed to prepare a coating solution, which dip, spray, blade, applied by the method of coating a roll or the like can be formed and dried.
【0088】電荷発生層中のバインダー樹脂:電荷発生
物質は質量比で0〜10:1〜50程度、形成される電
荷発生層の膜厚は0.01μm〜10μmの範囲に調整
することが好ましく、更に好ましい膜厚範囲は、0.0
5μm〜1.0μmである。The mass ratio of the binder resin: charge generating substance in the charge generating layer is 0 to 10: 1 to 50, and the thickness of the charge generating layer to be formed is preferably adjusted to 0.01 μm to 10 μm. The more preferable film thickness range is 0.0
It is 5 μm to 1.0 μm.
【0089】尚、電荷発生物質として公知のハロゲン化
銀を用いてもよい。青・緑・赤(BGR)の各光に対す
る感度を有する分光増感されたハロゲン化銀粒子を混合
して電荷発生層に含有させてもよい。Known silver halide may be used as the charge generating substance. Spectrally sensitized silver halide grains having sensitivity to blue, green and red (BGR) light may be mixed and contained in the charge generation layer.
【0090】《電荷輸送層》本発明に係る電荷輸送層に
ついて説明する。<< Charge Transport Layer >> The charge transport layer according to the present invention will be described.
【0091】本発明の反射率検出用素子の構成として
は、入射光により発生した光電荷(キャリア)の移動度
を向上させ、応答速度の高い素子にする観点から、電荷
発生層と有機半導体層との間に電荷輸送層を設けること
が好ましく、更に好ましくは、350nm〜850nm
の光透過率が10%以上の電荷輸送層であり、特に好ま
しくは、350nm〜850nmの波長範囲の光の透過
率が50%〜90%の電荷輸送層を設けることである。As the constitution of the reflectance detecting element of the present invention, from the viewpoint of improving the mobility of the photocharges (carriers) generated by the incident light and making the element a high response speed, the charge generation layer and the organic semiconductor layer. Is preferably provided with a charge transport layer, and more preferably 350 nm to 850 nm.
Is a charge transport layer having a light transmittance of 10% or more, and it is particularly preferable to provide a charge transport layer having a light transmittance of 50% to 90% in the wavelength range of 350 nm to 850 nm.
【0092】電荷発生層に隣接して形成される電荷輸送
層は、電荷輸送物質を適当な溶媒に単独で、あるいはバ
インダー樹脂と共に溶解分散せしめたものをアプリケー
ター、バーコーター、デイップコーター等を用いて塗布
乾燥して得られる。The charge-transporting layer formed adjacent to the charge-generating layer is prepared by dissolving the charge-transporting substance in an appropriate solvent alone or by dissolving and dispersing it together with a binder resin in an applicator, bar coater, dip coater or the like. It is obtained by coating and drying.
【0093】電荷輸送物質としては、オキサゾール誘導
体、オキサジアゾール誘導体、チアゾール誘導体、チア
ジアゾール誘導体、トリアゾール誘導体、イミダゾール
誘導体、イミダゾロン誘導体、イミダゾリジン誘導体、
ビスイミダゾリジン誘導体、スチリル化合物、ヒドラゾ
ン化合物、ピラゾリン誘導体、オキサゾロン誘導体、ベ
ンゾチアゾール誘導体、ベンゾフラン誘導体、アクリジ
ン誘導体、フエナジン誘導体、アミノスチルベン誘導
体、ポリ−N−ビニルカルバゾール、ポリ−1−ビニル
ピレン、ポリ−9−ビニルアントラセン、スチリル化合
物、アミン誘導体、ジスチリル系化合物(以上p型)、
ベンゾキノン系化合物、アントラキノン系化合物、ナフ
トキノン系化合物、ナフタレンジイミド系化合物、フル
オレノン系化合物、チオピラン系化合物、インダン系化
合物、インダンジオン系化合物、シクロペンタジエン系
化合物及びこれらのニトロ誘導体、シアノ誘導体、ジシ
アノメチレン誘導体、マロンサンエステル誘導体、フエ
ニルイミノ誘導体(以上n型)等を挙げることができ
る。Examples of the charge transport material include oxazole derivatives, oxadiazole derivatives, thiazole derivatives, thiadiazole derivatives, triazole derivatives, imidazole derivatives, imidazolone derivatives, imidazolidine derivatives,
Bisimidazolidine derivative, styryl compound, hydrazone compound, pyrazoline derivative, oxazolone derivative, benzothiazole derivative, benzofuran derivative, acridine derivative, phenazine derivative, aminostilbene derivative, poly-N-vinylcarbazole, poly-1-vinylpyrene, poly-9 -Vinylanthracene, styryl compounds, amine derivatives, distyryl compounds (above p-type),
Benzoquinone compounds, anthraquinone compounds, naphthoquinone compounds, naphthalenediimide compounds, fluorenone compounds, thiopyran compounds, indane compounds, indandione compounds, cyclopentadiene compounds and their nitro derivatives, cyano derivatives, dicyanomethylene derivatives , Malonsan ester derivative, phenylimino derivative (above n-type) and the like.
【0094】電荷輸送層を形成するためのバインダー樹
脂としては、例えばポリスチレン、アクリル樹脂、メタ
クリル樹脂、塩化ビニル樹脂、酢酸ビニル樹脂、ポリビ
ニルブチラール樹脂、エポキシ樹脂、ポリウレタン樹
脂、フェノール樹脂、ポリエステル樹脂、アルキッド樹
脂、ポリカーボネート樹脂、シリコン樹脂、メラミン樹
脂ならびに、これらの樹脂の繰り返し単位のうちの2つ
以上を含む共重合体樹脂、又はこれらの絶縁性樹脂の
他、ポリビニルカルバゾール等の高分子有機半導体が挙
げられ、前記電荷輸送物質とバインダー樹脂を溶解、分
散する溶媒は前記電荷発生層形成用の溶媒から選択して
用いることができる。Examples of the binder resin for forming the charge transport layer include polystyrene, acrylic resin, methacrylic resin, vinyl chloride resin, vinyl acetate resin, polyvinyl butyral resin, epoxy resin, polyurethane resin, phenol resin, polyester resin and alkyd. Resins, polycarbonate resins, silicone resins, melamine resins, copolymer resins containing two or more repeating units of these resins, or insulating resins thereof, as well as polymer organic semiconductors such as polyvinylcarbazole. The solvent for dissolving and dispersing the charge transport material and the binder resin can be selected from the solvents for forming the charge generation layer and used.
【0095】電荷輸送物質はバインダー樹脂100質量
部当たり20質量部〜200質量部、好ましくは30質
量部〜150質量部であり、電荷輸送層の膜厚は5μm
〜50μm程度が好ましい。The charge transport material is 20 to 200 parts by weight, preferably 30 to 150 parts by weight, per 100 parts by weight of the binder resin, and the thickness of the charge transport layer is 5 μm.
It is preferably about 50 μm.
【0096】各層の組成物の塗布方法としては、更にデ
ィッピング、スピンコート、ナイフコート、バーコー
ト、ブレードコート、スクイズコート、リバースロール
コート、グラビアロールコート、カーテンコート、スプ
レイコート、ダイコート等の公知の塗布方法を用いるこ
とが出来、連続塗布または薄膜塗布が可能な塗布方法が
好ましく用いられる。As the method for applying the composition of each layer, known methods such as dipping, spin coating, knife coating, bar coating, blade coating, squeeze coating, reverse roll coating, gravure roll coating, curtain coating, spray coating, die coating and the like can be used. A coating method can be used, and a coating method capable of continuous coating or thin film coating is preferably used.
【0097】《透明支持体》本発明に係る透明支持体に
ついて説明する。<< Transparent Support >> The transparent support according to the present invention will be described.
【0098】透明支持体はガラスやフレキシブルな樹脂
製シートで構成され、例えばポリマーフィルムをシート
として用いることができる。前記ポリマーフィルムとし
ては、例えばポリエチレンテレフタレート(PET)、
ポリエチレンナフタレート(PEN)、ポリエーテルス
ルホン(PES)、ポリエーテルイミド、ポリエーテル
エーテルケトン、ポリフェニレンスルフィド、ポリアリ
レート、ポリイミド、ボリカーボネート(PC)、セル
ローストリアセテート(TAC)、セルロースアセテー
トプロピオネート(CAP)等からなるフィルム等が挙
げられる。このような、プラスチックフィルムを用いる
ことで、ガラス基板を用いる場合に比べて軽量化を図る
ことができ、可搬性を高めることができるとともに、衝
撃に対する耐性を向上できる。The transparent support is composed of glass or a flexible resin sheet, and for example, a polymer film can be used as the sheet. Examples of the polymer film include polyethylene terephthalate (PET),
Polyethylene naphthalate (PEN), polyethersulfone (PES), polyetherimide, polyetheretherketone, polyphenylene sulfide, polyarylate, polyimide, polycarbonate (PC), cellulose triacetate (TAC), cellulose acetate propionate (CAP) ) And the like. By using such a plastic film, it is possible to reduce the weight as compared with the case of using a glass substrate, it is possible to enhance the portability, and it is possible to improve the resistance to impact.
【0099】本発明に係る透明支持体は、350nm〜
850nmの光透過率が10%以上であることが好まし
く、更好ましくは、30%以上であり、特に好ましく
は、50以上である。The transparent support according to the present invention has a thickness of 350 nm to
The light transmittance at 850 nm is preferably 10% or more, more preferably 30% or more, and particularly preferably 50 or more.
【0100】[0100]
【発明の効果】本発明により、ハードコピーや印刷物等
のアナログ画像データを容易に、且つ、迅速に電子デー
タに変換し、電子ペーパーとして利用可能ならしめる、
反射率検出用素子、それを用いるシート状画像入力装置
及びシート状画像入力方法を提供することが出来た。According to the present invention, analog image data such as a hard copy or a printed matter can be easily and quickly converted into electronic data so that it can be used as electronic paper.
An element for reflectance detection, a sheet-shaped image input device using the same, and a sheet-shaped image input method can be provided.
【図1】本発明の反射率検出用素子の構成の一例を示す
模式図である。FIG. 1 is a schematic diagram showing an example of the configuration of a reflectance detection element of the present invention.
【図2】本発明の反射率検出用素子が光反射を検出する
一態様を示す模式図である。FIG. 2 is a schematic view showing an aspect in which the reflectance detecting element of the present invention detects light reflection.
【図3】本発明の反射率検出用素子の回路構成の一例を
示す模式図である。FIG. 3 is a schematic diagram showing an example of a circuit configuration of a reflectance detecting element of the present invention.
【図4】図4は、本発明のシート状画像入力装置の一態
様を示す模式図である。FIG. 4 is a schematic view showing one embodiment of a sheet-shaped image input device of the present invention.
【図5】図4に示した装置でアクティブ駆動を行う際の
等価のマトリックス回路の模式図である。5 is a schematic diagram of an equivalent matrix circuit when active driving is performed by the device shown in FIG.
【図6】図6は、フルカラー画像検出可能なシート状画
像入力装置の一例を示す模式図である。FIG. 6 is a schematic view showing an example of a sheet-shaped image input device capable of detecting a full-color image.
1 透明支持体 2 電荷発生層 3 電荷輸送層 4 有機半導体層 5 ソース電極 6 ドレイン電極 7 絶縁層 8 ゲート電極 9 ハーフミラー 10 光入射制御手段 50 反射率検出用素子 1 transparent support 2 Charge generation layer 3 Charge transport layer 4 Organic semiconductor layer 5 Source electrode 6 drain electrode 7 Insulation layer 8 gate electrode 9 Half mirror 10 Light incidence control means 50 Reflectance detection element
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H04N 1/028 H01L 27/14 D 5/335 29/28 Fターム(参考) 2H088 EA33 GA06 GA10 HA02 HA04 HA08 HA12 HA22 KA30 MA20 4M118 AA10 AB01 BA05 CA11 CA17 CB05 FB03 FB09 FB13 FB23 FB25 GA03 GA10 5C024 EX52 GX07 GX20 GY31 5C051 AA01 BA02 DA06 DB01 DB05 DB24 DC07 5F110 AA30 BB01 BB10 CC03 DD01 DD02 EE07 EE41 EE43 EE44 FF01 FF02 FF03 FF09 FF21 FF27 FF28 FF29 GG05 GG24 GG41 GG42 GG43 GG44 HK01 HK02 HK03 HK04 HK06 HK07 HK32 HK33 NN71 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI theme code (reference) H04N 1/028 H01L 27/14 D 5/335 29/28 F term (reference) 2H088 EA33 GA06 GA10 HA02 HA04 HA08 HA12 HA22 KA30 MA20 4M118 AA10 AB01 BA05 CA11 CA17 CB05 FB03 FB09 FB13 FB23 FB25 GA03 GA10 5C024 EX52 GX07 GX20 GY31 5C051 AA01 BA02 DA06 DB01 DB05 DB24 DC07 5FFFFEE21 FFFFEEFFEEFF21 CC02 DDFFDD41 DD02 FFFFEEFFFF FF43 FFFFEEFF FF43 GG05 GG24 GG41 GG42 GG43 GG44 HK01 HK02 HK03 HK04 HK06 HK07 HK32 HK33 NN71
Claims (8)
極、該ゲート電極を被覆しながら該透明支持体上に設け
られた絶縁層、該絶縁層上に、ソース電極、ドレイン電
極、該ソース電極と該ドレインを連結し、且つ、350
nm〜850nmの光透過率が10%以上である有機半
導体層を有し、該有機半導体層上にハーフミラーと光入
射制御手段とがこの順で配設されていることを特徴とす
る反射率検出用素子。1. A transparent support, at least a gate electrode, an insulating layer provided on the transparent support while covering the gate electrode, and a source electrode, a drain electrode, and a source electrode on the insulating layer. Connecting the drains and 350
nm-850 nm, an organic semiconductor layer having a light transmittance of 10% or more, and a half mirror and a light incidence control unit are arranged in this order on the organic semiconductor layer. Detection element.
350nm〜850nmの光透過率が10%以上の光電
荷発生層を設けることを特徴とする請求項1に記載の反
射率検出用素子。2. Between the organic semiconductor layer and the half mirror,
The reflectance detecting element according to claim 1, further comprising a photocharge generating layer having a light transmittance of 350% to 850 nm of 10% or more.
350nm〜850nmの光透過率が10%以上の電荷
輸送層を設けることを特徴とする請求項2に記載の反射
率検出用素子。3. Between the organic semiconductor layer and the photocharge generating layer,
The reflectance detecting element according to claim 2, wherein a charge transport layer having a light transmittance of 350 nm to 850 nm of 10% or more is provided.
を特徴とする請求項1〜3のいずれか1項に記載の反射
率検出用素子。4. The reflectance detecting element according to claim 1, wherein the organic semiconductor layer contains a π-conjugated material.
ことを特徴とする請求項1〜4のいずれか1項に記載の
反射率検出用素子。5. The reflectance detecting element according to claim 1, wherein a liquid crystal element is used as the light incidence control means.
素子を用いることを特徴とする請求項1〜4のいずれか
1項に記載の反射率検出用素子。6. The reflectance detecting element according to claim 1, wherein a light blocking layer and a light emitting element are used as the light incidence control means.
射率検出用素子を有することを特徴とするシート状画像
入力装置。7. A sheet-shaped image input device, comprising the reflectance detection element according to claim 1. Description:
を用いることを特徴とするシート状画像入力方法。8. A sheet-shaped image input method using the sheet-shaped image input device according to claim 7.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002140097A JP4366898B2 (en) | 2002-05-15 | 2002-05-15 | Reflectance detection element, sheet-like image input device, and sheet-like image input method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002140097A JP4366898B2 (en) | 2002-05-15 | 2002-05-15 | Reflectance detection element, sheet-like image input device, and sheet-like image input method |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2003332552A true JP2003332552A (en) | 2003-11-21 |
JP4366898B2 JP4366898B2 (en) | 2009-11-18 |
Family
ID=29701058
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002140097A Expired - Fee Related JP4366898B2 (en) | 2002-05-15 | 2002-05-15 | Reflectance detection element, sheet-like image input device, and sheet-like image input method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4366898B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005327943A (en) * | 2004-05-14 | 2005-11-24 | Nippon Hoso Kyokai <Nhk> | Image input device |
JP2006210920A (en) * | 2005-01-29 | 2006-08-10 | Samsung Sdi Co Ltd | Thin film transistor and plate display comprising it |
JP2006295837A (en) * | 2005-04-14 | 2006-10-26 | Fuji Photo Film Co Ltd | Multiple function electronic sheet |
JP2009296000A (en) * | 2004-01-16 | 2009-12-17 | Semiconductor Energy Lab Co Ltd | Semiconductor device manufacturing method |
JP2014032199A (en) * | 2013-09-02 | 2014-02-20 | Fujifilm Corp | Radiographic imaging device and radiographic imaging system employing the same |
US9006566B2 (en) | 2005-06-29 | 2015-04-14 | Fujifilm Corporation | Organic and inorganic hybrid photoelectric conversion device |
JP2018509768A (en) * | 2015-03-18 | 2018-04-05 | エンベリオン オイEmberion Oy | Device with sensor array and method of manufacturing the same |
-
2002
- 2002-05-15 JP JP2002140097A patent/JP4366898B2/en not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009296000A (en) * | 2004-01-16 | 2009-12-17 | Semiconductor Energy Lab Co Ltd | Semiconductor device manufacturing method |
US8293457B2 (en) | 2004-01-16 | 2012-10-23 | Semiconductor Energy Laboratory Co., Ltd. | Substrate having film pattern and manufacturing method of the same, manufacturing method of semiconductor device, liquid crystal television, and EL television |
US8624252B2 (en) | 2004-01-16 | 2014-01-07 | Semiconductor Energy Laboratory Co., Ltd. | Substrate having film pattern and manufacturing method of the same, manufacturing method of semiconductor device, liquid crystal television, and el television |
JP2005327943A (en) * | 2004-05-14 | 2005-11-24 | Nippon Hoso Kyokai <Nhk> | Image input device |
JP4744097B2 (en) * | 2004-05-14 | 2011-08-10 | 日本放送協会 | Image input device |
JP2006210920A (en) * | 2005-01-29 | 2006-08-10 | Samsung Sdi Co Ltd | Thin film transistor and plate display comprising it |
JP2006295837A (en) * | 2005-04-14 | 2006-10-26 | Fuji Photo Film Co Ltd | Multiple function electronic sheet |
US9006566B2 (en) | 2005-06-29 | 2015-04-14 | Fujifilm Corporation | Organic and inorganic hybrid photoelectric conversion device |
JP2014032199A (en) * | 2013-09-02 | 2014-02-20 | Fujifilm Corp | Radiographic imaging device and radiographic imaging system employing the same |
JP2018509768A (en) * | 2015-03-18 | 2018-04-05 | エンベリオン オイEmberion Oy | Device with sensor array and method of manufacturing the same |
US10566425B2 (en) | 2015-03-18 | 2020-02-18 | Emberion Oy | Apparatus comprising a sensor arrangement and associated fabrication methods |
Also Published As
Publication number | Publication date |
---|---|
JP4366898B2 (en) | 2009-11-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7018872B2 (en) | Organic thin-film transistor, organic thin-film transistor sheet and manufacturing method thereof | |
US6913944B2 (en) | Organic thin-film transistor manufacturing method, organic thin-film transistor, and organic thin-film transistor sheet | |
JP3224829B2 (en) | Organic field effect device | |
JP2004146430A (en) | Organic thin film transistor, organic thin film transistor device, and their manufacturing methods | |
JP2002502129A (en) | Organic diodes with switchable photoelectric sensitivity | |
JP2002502120A (en) | Organic semiconductor image sensor | |
JP4507759B2 (en) | Pattern formation method for organic materials | |
US20110156996A1 (en) | Image input/output device | |
JP4572501B2 (en) | Method for producing organic thin film transistor | |
JP4214706B2 (en) | Optical sensor element, optical sensor device and driving method thereof | |
JP4366898B2 (en) | Reflectance detection element, sheet-like image input device, and sheet-like image input method | |
JPWO2005098927A1 (en) | TFT sheet and manufacturing method thereof | |
JP2004221562A (en) | Process for fabricating organic thin film transistor element, organic thin film transistor element fabricated by that process, and organic thin film transistor element sheet | |
JP4860101B2 (en) | Organic thin film transistor and organic thin film transistor sheet manufacturing method | |
JP4396109B2 (en) | Thin film transistor element manufacturing method, thin film transistor element, and thin film transistor element sheet | |
WO2021149461A1 (en) | Electronic device and method for producing the same, image forming method, and image forming apparatus | |
JP3288472B2 (en) | Photoelectric conversion element and method for manufacturing the same | |
JP2004165978A (en) | Sheet-like image input device and sheet-like display medium having the input device integrated together | |
JP2004253681A (en) | Thin film transistor element and its manufacturing method | |
JP4423870B2 (en) | Image driving element sheet and manufacturing method thereof | |
JP2003280043A (en) | Display element | |
JP3372288B2 (en) | Optical sensor and information recording system | |
US20230125171A1 (en) | Metal oxide particles having p-type semiconductivity, electronic device using the same, method for manufacturing electronic device, and image forming apparatus | |
JP4945899B2 (en) | Organic thin film transistor and manufacturing method thereof | |
JP2004103275A (en) | Photoelectric convesion material and photosensor element |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050421 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090428 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090629 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090804 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20090817 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120904 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130904 Year of fee payment: 4 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |